JP2014182115A5 - - Google Patents

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Publication number
JP2014182115A5
JP2014182115A5 JP2013058692A JP2013058692A JP2014182115A5 JP 2014182115 A5 JP2014182115 A5 JP 2014182115A5 JP 2013058692 A JP2013058692 A JP 2013058692A JP 2013058692 A JP2013058692 A JP 2013058692A JP 2014182115 A5 JP2014182115 A5 JP 2014182115A5
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JP
Japan
Prior art keywords
measurement
light
dimensional
measuring
irradiation
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Pending
Application number
JP2013058692A
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English (en)
Japanese (ja)
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JP2014182115A (ja
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Priority to JP2013058692A priority Critical patent/JP2014182115A/ja
Priority claimed from JP2013058692A external-priority patent/JP2014182115A/ja
Publication of JP2014182115A publication Critical patent/JP2014182115A/ja
Publication of JP2014182115A5 publication Critical patent/JP2014182115A5/ja
Pending legal-status Critical Current

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JP2013058692A 2013-03-21 2013-03-21 三次元計測装置、制御方法、プログラム、及び記憶媒体 Pending JP2014182115A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013058692A JP2014182115A (ja) 2013-03-21 2013-03-21 三次元計測装置、制御方法、プログラム、及び記憶媒体

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013058692A JP2014182115A (ja) 2013-03-21 2013-03-21 三次元計測装置、制御方法、プログラム、及び記憶媒体

Publications (2)

Publication Number Publication Date
JP2014182115A JP2014182115A (ja) 2014-09-29
JP2014182115A5 true JP2014182115A5 (enExample) 2016-04-14

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ID=51700948

Family Applications (1)

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JP2013058692A Pending JP2014182115A (ja) 2013-03-21 2013-03-21 三次元計測装置、制御方法、プログラム、及び記憶媒体

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JP (1) JP2014182115A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017029887A1 (ja) * 2015-08-19 2017-02-23 ソニー株式会社 情報処理装置、情報処理方法及びプログラム
US10935376B2 (en) * 2018-03-30 2021-03-02 Koninklijke Philips N.V. System and method for 3D scanning

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3530972B2 (ja) * 1995-11-28 2004-05-24 独立行政法人産業技術総合研究所 形状測定装置
JP2002288645A (ja) * 2001-03-26 2002-10-04 Minolta Co Ltd ３次元入力のための撮影システム
JP3974375B2 (ja) * 2001-10-31 2007-09-12 株式会社東芝 人物認識装置、人物認識方法および通行制御装置
JP2005310103A (ja) * 2004-03-24 2005-11-04 Fuji Photo Film Co Ltd 認証システム、認証方法、認証プログラム、証明写真撮影装置、及び証明写真撮影方法
JP2008232776A (ja) * 2007-03-20 2008-10-02 Fujifilm Corp ３次元形状計測装置および方法並びにプログラム
JP2009014520A (ja) * 2007-07-05 2009-01-22 Space Vision:Kk 顔計測システム
JP2009211166A (ja) * 2008-02-29 2009-09-17 Toshiba Corp 認証装置、認証方法及び認証プログラム
JP5559749B2 (ja) * 2011-07-08 2014-07-23 日本電信電話株式会社 位置検出装置、位置検出方法及びコンピュータプログラム

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