JP2014178264A5 - - Google Patents
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- JP2014178264A5 JP2014178264A5 JP2013053530A JP2013053530A JP2014178264A5 JP 2014178264 A5 JP2014178264 A5 JP 2014178264A5 JP 2013053530 A JP2013053530 A JP 2013053530A JP 2013053530 A JP2013053530 A JP 2013053530A JP 2014178264 A5 JP2014178264 A5 JP 2014178264A5
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- 230000006866 deterioration Effects 0.000 claims description 6
- 238000003745 diagnosis Methods 0.000 claims description 2
- 230000001186 cumulative effect Effects 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- 230000015556 catabolic process Effects 0.000 description 3
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013053530A JP5959457B2 (ja) | 2013-03-15 | 2013-03-15 | パワーモジュール |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013053530A JP5959457B2 (ja) | 2013-03-15 | 2013-03-15 | パワーモジュール |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014178264A JP2014178264A (ja) | 2014-09-25 |
| JP2014178264A5 true JP2014178264A5 (https=) | 2014-12-11 |
| JP5959457B2 JP5959457B2 (ja) | 2016-08-02 |
Family
ID=51698351
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013053530A Active JP5959457B2 (ja) | 2013-03-15 | 2013-03-15 | パワーモジュール |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5959457B2 (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7018790B2 (ja) * | 2018-03-15 | 2022-02-14 | 三菱電機株式会社 | パワーデバイスの余寿命診断装置および余寿命診断方法 |
| JP7094177B2 (ja) * | 2018-08-22 | 2022-07-01 | 三菱電機株式会社 | 電力用半導体素子の寿命推定装置 |
| JP7118019B2 (ja) * | 2019-02-05 | 2022-08-15 | 三菱電機株式会社 | 半導体モジュール、および半導体モジュールの寿命予測システム |
| JP7200822B2 (ja) * | 2019-05-14 | 2023-01-10 | 株式会社デンソー | 電力変換装置の劣化を監視する装置 |
| JP2021125547A (ja) * | 2020-02-05 | 2021-08-30 | 富士電機株式会社 | 電力用半導体モジュール |
| JP7619051B2 (ja) * | 2021-01-20 | 2025-01-22 | 富士電機株式会社 | 寿命診断装置、半導体装置、寿命診断方法、 |
| JP7793405B2 (ja) | 2022-02-08 | 2026-01-05 | 株式会社東芝 | 電力変換器の診断装置、診断システム、診断方法、及び、診断プログラム |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3361017B2 (ja) * | 1996-09-11 | 2003-01-07 | 株式会社東芝 | 快適性指標ｐｍｖ学習装置 |
| JP5175911B2 (ja) * | 2010-09-16 | 2013-04-03 | 株式会社東芝 | はんだ接合部の寿命予測方法、はんだ接合部の寿命予測装置 |
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2013
- 2013-03-15 JP JP2013053530A patent/JP5959457B2/ja active Active
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