JP2014153413A5 - - Google Patents
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- JP2014153413A5 JP2014153413A5 JP2013020510A JP2013020510A JP2014153413A5 JP 2014153413 A5 JP2014153413 A5 JP 2014153413A5 JP 2013020510 A JP2013020510 A JP 2013020510A JP 2013020510 A JP2013020510 A JP 2013020510A JP 2014153413 A5 JP2014153413 A5 JP 2014153413A5
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013020510A JP6188341B2 (ja) | 2013-02-05 | 2013-02-05 | 補正値生成装置及びその制御方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013020510A JP6188341B2 (ja) | 2013-02-05 | 2013-02-05 | 補正値生成装置及びその制御方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014153413A JP2014153413A (ja) | 2014-08-25 |
| JP2014153413A5 true JP2014153413A5 (https=) | 2016-03-17 |
| JP6188341B2 JP6188341B2 (ja) | 2017-08-30 |
Family
ID=51575360
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013020510A Expired - Fee Related JP6188341B2 (ja) | 2013-02-05 | 2013-02-05 | 補正値生成装置及びその制御方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP6188341B2 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108172150B (zh) * | 2017-12-14 | 2021-01-26 | 京东方科技集团股份有限公司 | 显示屏的检测方法及装置 |
| CN116017182B (zh) * | 2022-12-27 | 2025-09-12 | 凌云光技术股份有限公司 | 坏点校正方法、装置、终端设备及存储介质 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007072455A (ja) * | 2005-08-12 | 2007-03-22 | Semiconductor Energy Lab Co Ltd | 表示装置 |
| JP2007140325A (ja) * | 2005-11-22 | 2007-06-07 | Seiko Epson Corp | 発光制御装置、表示装置、電子機器、および発光装置の制御方法 |
| JP2010134169A (ja) * | 2008-12-04 | 2010-06-17 | Panasonic Corp | アクティブマトリクス型表示装置及びそのような表示装置の検査方法並びに製造方法 |
-
2013
- 2013-02-05 JP JP2013020510A patent/JP6188341B2/ja not_active Expired - Fee Related
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