JP2014153413A5 - - Google Patents

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Publication number
JP2014153413A5
JP2014153413A5 JP2013020510A JP2013020510A JP2014153413A5 JP 2014153413 A5 JP2014153413 A5 JP 2014153413A5 JP 2013020510 A JP2013020510 A JP 2013020510A JP 2013020510 A JP2013020510 A JP 2013020510A JP 2014153413 A5 JP2014153413 A5 JP 2014153413A5
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JP
Japan
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value
pixel
correction value
correction
pixels
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JP2013020510A
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English (en)
Japanese (ja)
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JP6188341B2 (ja
JP2014153413A (ja
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Priority claimed from JP2013020510A external-priority patent/JP6188341B2/ja
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Publication of JP2014153413A5 publication Critical patent/JP2014153413A5/ja
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Publication of JP6188341B2 publication Critical patent/JP6188341B2/ja
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JP2013020510A 2013-02-05 2013-02-05 補正値生成装置及びその制御方法 Expired - Fee Related JP6188341B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013020510A JP6188341B2 (ja) 2013-02-05 2013-02-05 補正値生成装置及びその制御方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013020510A JP6188341B2 (ja) 2013-02-05 2013-02-05 補正値生成装置及びその制御方法

Publications (3)

Publication Number Publication Date
JP2014153413A JP2014153413A (ja) 2014-08-25
JP2014153413A5 true JP2014153413A5 (enExample) 2016-03-17
JP6188341B2 JP6188341B2 (ja) 2017-08-30

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JP2013020510A Expired - Fee Related JP6188341B2 (ja) 2013-02-05 2013-02-05 補正値生成装置及びその制御方法

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JP (1) JP6188341B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108172150B (zh) * 2017-12-14 2021-01-26 京东方科技集团股份有限公司 显示屏的检测方法及装置
CN116017182B (zh) * 2022-12-27 2025-09-12 凌云光技术股份有限公司 坏点校正方法、装置、终端设备及存储介质

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007072455A (ja) * 2005-08-12 2007-03-22 Semiconductor Energy Lab Co Ltd 表示装置
JP2007140325A (ja) * 2005-11-22 2007-06-07 Seiko Epson Corp 発光制御装置、表示装置、電子機器、および発光装置の制御方法
JP2010134169A (ja) * 2008-12-04 2010-06-17 Panasonic Corp アクティブマトリクス型表示装置及びそのような表示装置の検査方法並びに製造方法

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