JP2014153287A - Shape measurement device and shape measurement method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a downsized shape measurement unit, a shape measurement device including the shape measurement unit, and a three-dimensional shape measurement method for a relatively moving object that can measure a processed shape without detaching a process tool from a process part, and to provide a three-dimensional shape measurement device for the object.SOLUTION: A shape measurement unit 8 is configured to have: a projector section 9 that has an LED light source, a transparency member in which a grating pattern to be irradiated with emitting light from the LED light source is formed, and an image-forming lens forming the grating pattern on a surface of a measurement object; and a camera section 10 that has a lens for image-formation, and imaging means for photographing an image of the surface of the measurement object having the grating pattern projected by the projector section 9 via the lens for image-formation. A phase analysis process is performed to the image photographed by the shape measurement unit 8 and thereby, a three-dimensional shape can be measured. Further, a shape under processing can be measured on a machine by attaching the shape measurement unit 8 to a process head.

Description

  The present invention relates to a shape measuring apparatus and a shape measuring method for measuring a three-dimensional shape of a measurement object in a non-contact manner.

Currently, non-contact 3D shape measurement technology is gaining importance in a wide range of fields such as commerce, industry, educational and learning support. In the industrial field, an apparatus for inspecting while processing is expected to be applied to processing equipment for precision parts.
In Patent Document 1, an equally spaced grid is projected on a continuously moving object in a direction inclined by a predetermined angle from the vertical direction with respect to the moving direction of the object, and a plurality of objects on which the grid is projected are arranged in parallel. With the line sensor, the object was photographed at a photographing timing according to the moving time when the object moves the distance between the line sensors from an angle direction different from the angle at which the grating was projected, and a plurality of phases were shifted through the line image. A technique for obtaining a height distribution of an object by analyzing a phase of a line image by a phase shift method is disclosed.
Patent Document 2 discloses a technique for measuring the shape of a measurement object at a time from a plurality of directions by arranging a mirror around the measurement object.

JP 2002-286433 A JP 2012-127704 A

  For long seamless pipes with more than 400 types of materials, diameters, and thicknesses used in petrochemical plants and nuclear power plants, safety is emphasized, and companies that supply pipes strictly demand quality assurance. It has been. In particular, scratch inspection is important, and there is a need for a test pipe in which precise fine grooves are machined.

  For example, as shown in FIG. 1, in a processing machine that performs groove processing on the inner peripheral surface of a pipe with an end mill, there has conventionally been no method for accurately inspecting the depth of the groove. This is because an operator's hand does not enter in order to process the depth of the pipe. It is possible to take out the end mill once from the pipe and place the measuring device in the pipe for measurement. However, it is difficult to rework the end mill once separated from the groove and removed from the pipe into the same groove. This is because the end mill is attached to the tip of the arm, so that there is a deviation. Therefore, even if measurement is possible, it is difficult to perform additional machining.

  Currently, a system capable of measuring in real time while processing uses a laser scan sensor or the like. The laser scan sensor uses a laser beam cutting method to measure the shape based on the principle of non-contact triangulation. It is difficult to attach a shape measuring device to a processing machine that actually processes grooves in a pipe. Furthermore, there is a problem that the side surface of the groove on the inner peripheral surface of the pipe cannot be measured. In order to realize a highly accurate product in machining, it is necessary to measure the shape of the workpiece during machining. When using a commercially available three-dimensional coordinate measuring machine, the work piece (pipe) must be removed from the processing machine as described above, and this is returned to its original state with a precision of μm when reworking. Is very difficult.

  Moreover, there are many problems in incorporating the conventional technology described in the background art into an actual production line. The main reason is that high-speed and high-precision shape measurement is required for use in a production line. For example, in the technique disclosed in Patent Document 1, it is difficult to measure the wall surface of the processed surface when performing grooving in order to photograph from above the measurement object. In addition, the technique disclosed in Patent Document 2 has a problem that a reference point projecting laser is required because the reference lattice plane two-dimensional lattice is not marked, and the apparatus is complicated and expensive.

  In view of the above-described problems of the prior art, an object of the present invention is to measure a machining shape without removing a miniaturized measurement unit, a shape measuring device including the measurement unit, and a machining tool from a machining site. It is to provide a method and apparatus for measuring a three-dimensional shape that can be used, and a method of machining while measuring the shape of a workpiece during machining using the apparatus.

  The invention according to claim 1 of the present application includes a light source, a transparent member on which a lattice pattern irradiated with light from the light source is formed, and an imaging lens that forms an image of the lattice pattern on the surface of a measurement object. A projector unit; and an imaging unit that captures an image of the surface of the measurement object on which the lattice pattern is projected by the projector unit, so that at least a part of the imaging region overlaps the image of the surface of the measurement object. A first measurement unit and a second measurement unit arranged to pick up an image, projection of a lattice pattern by the first measurement unit, photographing of the surface of the measurement object, and projection of a lattice pattern by the second measurement unit And a control means for switching and photographing the surface of the measurement object.

  The invention according to claim 2 is a transparent in which a light source, a slit arranged in front of the light source, and a lattice pattern irradiated with light from the light source that has passed through the slit and projected onto the surface of the measurement object are formed. A projector unit having a radiating member; and an imaging unit that images the surface of the measurement object on which the grid pattern is projected by the projector unit, and the width of the slit is less than half of the pitch of the grid. The slit direction and the grid direction of the transparent member on which the grid pattern is formed coincide with each other, and an image of the surface of the measurement object is captured so that at least a part of the imaging area overlaps. The first measurement unit and the second measurement unit, the projection of the lattice pattern by the first measurement unit, the photographing of the surface of the measurement object, and the second measurement unit. An imaging surface of the projection and the measurement object child pattern, a second shape measuring head, characterized in that and a control means for causing switch.

The invention according to claim 3 includes any one of the first shape measurement head according to claim 1 or the second shape measurement head according to claim 2, and is phase-shifted with respect to the image of the imaged measurement object. The shape measuring apparatus is characterized in that the shape of the measurement object is calculated by performing an analysis process.
The invention according to claim 4 is the shape measurement device according to claim 3, wherein the shape measurement device performs a composition process of images captured by the respective measurement units using a phase evaluation value as an index. .
According to a fifth aspect of the present invention, while processing a workpiece by a processing device having a processing head, the shape measuring device according to any one of the third or fourth aspect measures the shape of the processing portion of the workpiece. This is an on-machine measurement method.

  According to the present invention, a miniaturized measuring unit, a shape measuring device provided with the measuring unit, a three-dimensional shape measuring method and apparatus capable of measuring a processing shape without removing a processing tool from a processing part, And the method of processing can be provided, measuring the shape of a workpiece | work during a process using the apparatus.

It is a figure explaining the groove processing of a pipe. It is a figure explaining the mode of the groove processing of the pipe by the apparatus which attached the shape measurement head. It is a figure explaining the phase shift method using four images. It is a figure explaining the calculation method of the phase using a phase analysis method. It is a z direction reference plane imaging drawing. FIG. 6 is a relationship diagram between a phase and a height obtained by reference plane imaging. It is a creation figure of a table element. It is a figure explaining the table showing the relationship of the produced phase and height, and its reference. It is a figure explaining a Fourier-transform lattice method. It is a figure explaining brightness and phase distribution. It is a figure explaining phase connection. FIG. 6 is a relationship diagram between a phase and x-coordinate obtained by reference plane imaging. It is a creation figure of a table element. It is a figure explaining the table showing the relationship of the produced phase and x coordinate, and its reference. It is a conceptual diagram of the conversion table of a phase and a coordinate. It is a figure explaining the glass lattice currently used for the reference plane. It is a two-dimensional lattice image. It is a principle diagram of a reference point search. The corrected two-dimensional lattice image and phase distribution. It is a figure explaining correction | amendment of a two-dimensional lattice image. It is a figure explaining correction | amendment of a two-dimensional lattice image. It is a resampling principle figure. It is a figure explaining the measurement principle which raises accuracy. It is a measurement principle figure which raises accuracy. It is a three-dimensional view of a groove. It is a figure explaining the method of solving the problem which the side surface data of a groove | channel disappears. It is a principle figure which converts from polar coordinates to Cartesian coordinates. It is a figure explaining the internal structure of a reference plane unit. It is an enlarged view of a two-dimensional lattice pattern. FIG. 3 is a schematic structural diagram of a reference surface unit. It is a picked-up image of a 1st camera. It is an xy coordinate image. It is a picked-up image of a 2nd camera. It is an xy coordinate image. It is a general view of a shape measuring device. It is a general view of a shape measuring head. It is a figure explaining a shape measuring device. It is an internal structure image of a measurement unit. It is a figure explaining the shape measuring system concerning the present invention which performs calibration. It is a figure explaining a measurement sample. It is a photographed image. It is a figure explaining phase distribution. It is a figure explaining height distribution. It is a figure explaining the height of one line. It is a figure explaining a test piece processing machine. It is a graph explaining the vibration experiment result of a processing machine. It is a figure explaining a level | step difference measurement sample. It is a photographed image. It is a height image. 3D display image. It is a two-dimensional lattice image. It is a principle figure of a reference point search (the 1). It is a principle figure of a reference point search (the 2). It is a measurement sample. It is a photographed image. It is a partial photographed image. It is an x coordinate image. It is a y-coordinate image. It is a z coordinate image. It is a three-dimensional image. It is an image after resampling. It is an image after composition. It is a three-dimensional image. It is an image after composition. It is an image after composition. It is an image after composition. It is sectional drawing. It is principle explanatory drawing of a noise removal process. It is a figure explaining a measurement sample. It is a photographed image. It is an image after noise removal. It is a photographed image and a measurement result. It is a figure explaining a measurement result. It is an interface screen of analysis software. It is a figure explaining the flow of a process. It is a photographed image. It is a photographed image. It is a phase distribution image. It is a height distribution image. It is a part of height distribution image. It is a height distribution image. It is sectional drawing. It is an image of a shape measuring device. It is a figure explaining the shape measurement head attached to the process head. It is a figure explaining the structure of a shape measuring device. It is a principle figure of the pitch change of the grating | lattice using a lens. It is a figure explaining the mode of experiment. It is a photographed image. It is a height image. It is a three-dimensional image. It is a two-dimensional lattice image. It is a two-dimensional lattice image. It is a measurement sample. It is a photographed image. It is a partial photographed image. It is an x coordinate image. It is a y-coordinate image. It is a z coordinate image. It is a three-dimensional image. It is an image after resampling. It is an image after composition. It is a three-dimensional image. It is an image after composition. It is an image after composition. It is an image after composition. It is sectional drawing. It is a photographed image. A photographed image and a height image (No. 1). A captured image and a height image (part 2). This is the height data of one line.

Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 2 is a diagram for explaining a state of the groove processing of the pipe 2 by the apparatus to which the shape measuring head is attached. In the present invention, the processing machine including the shape measuring head shown in FIG. 2 can measure the shape of the groove while processing the groove. The shape measuring apparatus of the present invention applies a sampling moire method as a phase analysis method that can obtain a phase distribution quickly and accurately. This method can accurately perform the phase analysis of the two-dimensional grating. Since a phase shift mechanism is unnecessary, it is suitable for miniaturization. Then, an all-space table forming method capable of high-speed phase analysis is used.

2. Principle 2-1 Phase Analysis Method 2-1-1 Principle of Phase Shift Method Here, the phase analysis method will be described.
The present invention uses a phase shift method as a method of analyzing a projection grating and deriving a phase. In this method, a grating pattern of a cosine wave is projected onto the surface of a measurement object using a projector or a grating projection device, and this is imaged a plurality of times while being phase-shifted. At this time, the phase of the projected grating can be obtained from the luminance change of the image captured by the camera.

An example of the phase shift method using four images is shown below. FIG. 3 is a diagram for explaining a phase shift method using four images. As shown in FIG. 3, the luminance at each pixel (i, j) photographed when the lattice is shifted four times by π / 2 is respectively expressed as I ₀ (i, j), I ₁ (i, j), When I ₂ (i, j) and I ₃ (i, j) are set, I _a (i, j) is a luminance amplitude, and I _b (i, j) is a bias, each luminance is expressed by Equations 1 to 4. Can be expressed as Note that θ (i, j) is a phase value in the pixel of (i, j).

  From these four luminances, the phase value θ (i, j) is expressed by Equation 5.

Further, the influence of noise can be further reduced by increasing the number of phase shifts. If the number of phase shifts is n and the luminance when the phase shift amount is 2πk / N is I _k , Equation 6 is derived, and the phase value θ can be obtained from this relational expression.

2-1-2 Principle of Sampling Moire Method The procedure for generating moire fringes is shown in FIG. When a lattice pattern as shown in FIG. 4A is photographed with a camera, a photographed image as shown in FIG. 4B is obtained. The brightness value of this photographed image is generally expressed by Equation 7.

Here, I _a (x, y) and I _b (x, y) are the amplitude and background luminance of the grating, and φ (x, y) is the phase of the grating.

  As shown in FIG. 4B, gray data exists in addition to white and black. In this state, moire fringes cannot be observed. Therefore, sampling (decimation processing) is performed while changing the starting point for every N pixels at equal intervals. FIG. 4 shows a state when N = 4 (pixel). When the thinning process is performed, when N = 4 (pixel), four images having data every four pixels can be obtained as shown in FIG. 4C. This is thinned out every four pixels from the first, second, third, and fourth pixels from the left. In this manner, changing the sampling point for each pixel corresponds to the phase shift method because the phase is shifted by π / 2 in terms of the phase.

  However, since there is no data in the three pixels in the same state, the luminance value data at each sampling point is interpolated into the pixels having no data. Then, four moire images as shown in FIG. 4D are obtained.

  If it is assumed that the phase-shifted moire fringe has a luminance distribution of a cosine wave approximately, it is expressed by the following equations (8) to (11).

Here, I _am (x, y) is the amplitude of moire fringes, and I _bm (x, y) is the background luminance. Also, θ (x, y) is the phase of moire fringes at N = 0. _Assuming that I _H and I _L are the maximum value and the minimum value of luminance, respectively, I _am and I _bm are expressed by Equation 12.

  The phase θ of the moiré fringes can be obtained from the above-described Fourier transform phase shift method using Equation (13).

  When the phase shift method is applied from the obtained four moire images, the moire phase distribution image of FIG. 4E is obtained. In order to obtain the phase distribution of the projection grating, the moire phase distribution of FIG. 4E and the reference grating of FIG. 4F are subtracted. Finally, the phase distribution of the projected grating as shown in FIG.

  If these operations are also performed in the y direction, a moire pattern phase distribution in the y direction can be obtained. By performing smoothing in the vertical direction and the horizontal direction on a single two-dimensional lattice image, it is possible to obtain moire pattern phase distributions in the x and y directions.

2-2 Principle of All-Space Table Method 2-2-1 Reference Surface Imaging FIG. 5 is a diagram for explaining z-direction reference surface imaging. First, a reference plane is photographed in the z direction, and coordinates are calculated from this image. As shown in FIG. 5A, a lattice is projected from a lattice projection device onto a reference plane, and this is photographed with a camera. At that time, the phase of the projection grating is shifted by equal intervals, and a shifted image for one period is taken. The phase distribution of the reference plane at the initial point z ₀ is obtained by applying the phase shift method to the shift image for one period thus obtained.

Further, the position of the reference plane is moved by Δz as shown in FIG. 5B, and the phase distribution on the reference plane at each z coordinate position is similarly obtained. At this time, the z coordinate is set to z _i (j = 0, 1, 2,..., N−1) from the lower reference surface height. Here, n is the number of times the reference plane is moved. Note that the solid line and the broken line in the figure indicate the high and low luminance portions of the projection grid, respectively.

  By the work so far, the phase value at each z coordinate can be obtained for each pixel of the captured image. This relationship is shown in FIG. As a result, a table representing the relationship between the phase and height in all pixels can be created. Note that the elements from 0 to k in FIG. 5 are used to create the table. Here, k is an element number that first exceeds the phase value of the 0th element.

  Here, FIG. 5 will be supplementarily described. “Camera” is an imaging camera, “Projector” is a grating projection device, “Projected grating” is a projection grating, and “Reference plane” is a reference plane.

2-2-2 Creation of Table Next, a conversion table between the z coordinate and the phase is created. This outline is shown in FIG. At this time, the table element interval Δθ is kept constant. Elements are numbered 0, 1, 2,..., I−1, m−1 from the smallest phase value, and each phase value is θ _i (i = 0, 1, 2,..., M−1). far. Here, m is the total number of elements of the table to be created. It should be noted that there is the following relationship between m and Δθ in Expression 14:

The height of the j-th element existing between each element obtained by photographing is obtained by linear approximation from the photographing element adjacent to θ _i in FIG. However, there is a case where there is no imaging element at both ends and the phase is broken, as in θ ₀ in FIG. In this case, first, a photographing element having a phase value closest to 2π is searched for. Then, a provisional imaging element is created by subtracting 2π from the phase value of this element, and the height of the table element is obtained from this provisional element. In order to obtain Z _j , values of photographing elements before and after θ _j are used. Equation 15 shows a calculation formula when the phase values of the imaging elements around θ _j are θ _k and θ _{k + 1} and the corresponding z coordinate values are Z _k and Z _{k + 1} .

2-2-3 Referencing Tables When performing shape measurement, the created phase / height relationship table is referenced to obtain a height distribution. FIG. 8 shows the created phase-height relationship table for one pixel. Here, the phase θ to be measured is obtained in the same manner as when the phase of the reference plane is obtained. As shown in Equation 16, since the quotient n obtained by dividing θ by Δθ matches the number of the table element to be referred to, the z coordinate z _{θn at} that pixel is obtained. If this is performed for all pixels, the height distribution of the measurement object can be calculated.

  As described above, in this method, the height distribution of the measurement target is calculated based on the phase value distribution of the reference plane obtained in advance. Therefore, it is possible to avoid errors due to the fact that the projection grating is not a perfect sine wave and errors due to the distortion of the camera lens. Furthermore, since the processing is based on table reference, it is not necessary to calculate the height for each pixel, and high-speed analysis is possible.

2-3 Table creation principle between phase and x, y coordinates 2-3-1 Reference plane imaging In the x and y directions, coordinates are calculated from the reference plane imaging. A two-dimensional lattice is projected from the back surface of the reference surface, and this is photographed with a camera. The phase is obtained by using the Fourier transform lattice method for the captured lattice image as shown in FIG. In the Fourier transform lattice method, Fourier transform is performed on the obtained two-dimensional lattice to obtain an image of a power spectrum as shown in FIG. From this, a primary harmonic wave in each of the x and y directions is extracted and subjected to inverse Fourier transform to obtain a phase distribution image in each of the x and y directions as shown in FIGS. 9 (c) and 9 (d). Is the method.

  Further, the obtained phase distribution becomes a phase distribution of −π to π as shown in FIG. 10A every time the brightness of the lattice image makes one period. Since this phase distribution repeats from −π to π, a specific phase value cannot be determined. Therefore, when the number of periods is n, and when the phase value of the grating exceeds the range of −π to π, a continuous phase as shown in FIG. 10B is obtained by adding the number of periods of 2πn. This is called phase connection. The phase φ connected in phase and continuous is obtained as shown in Equation 17.

  This phase connection makes it possible to determine a specific phase value and obtain xy coordinates as shown in FIGS. 11 (a) and 11 (b).

  Next, the position of the reference plane is moved little by little at equal intervals, and the display grid image photographed at each position is analyzed to obtain the x coordinate for each pixel. From the above operation, the correspondence between the z coordinate and the x coordinate can be obtained for each pixel of the camera. This is shown in FIG. A table of phase and x coordinates is created from this correspondence and the correspondence between the phase and z coordinate obtained earlier.

2-3-2 Creation of Table FIG. 13 shows an outline of the relation table creation between the phase and the x coordinate, where m is the number of table elements and is equal to m in the previous section. As the height of the table element to be created, the height of the table element of the phase and z coordinate obtained previously is used. For the x-coordinate of the j-th element existing between each element obtained by photographing, first, an element obtained by photographing adjacent to θ _j in FIG. 13 is searched. Then, the phase interval of the actual imaging element is (θ _{k + 1} −θ _k ), the values of the preceding and following x coordinates are x _k and x _{k + 1} , and the phase value corresponding to x _j is θ _j It is obtained by linear approximation from equation (18).

2-3-3 Referencing Table The x coordinate value is obtained by referring to the phase and x coordinate table. FIG. 14 shows a table representing the relationship between the created phase and x coordinate in one pixel. As in the case of referring to the table in the previous section, the x coordinate can be calculated by obtaining the phase θ of the measurement target and obtaining the quotient obtained by dividing it by Δθ.

  When creating the x coordinate table, the relationship between the phase and the x coordinate was converted from the relationship between the height and the x coordinate obtained first by using the phase / z coordinate relationship table. This eliminates the need to calculate the z coordinate for calculating the x coordinate. Further, a table for obtaining the y coordinate from the phase can be created by the same method for the y coordinate.

2-3-4 Referencing Each Coordinate From Phase In the preceding sections, the creation and reference method of the conversion table from phase θ to z coordinate and phase θ to x, y coordinate have been described. Here, a method actually used for the conversion from the phase to the x, y, z coordinates will be described.
FIG. 15 shows a conceptual diagram of a conversion table of phase θ and x, y, z coordinates having m number of table elements in a certain pixel. The index number in the figure is the value of the reference table element number n obtained from equation (16). These are all stored in the memory in the arrangement order on the memory in units of pixels, and the result is obtained by reading the data stored in the nth place at the time of reference.

2-4 Principle of Synthesis 2-4-1 Reference Point Search Method The glass lattice used in the embodiment of the present invention is shown in FIG. As a whole, a 24 mm square two-dimensional lattice is drawn on a 25 mm square glass as shown in FIG. In this device, 0.2 mm pitch lattice glass is used.

  On the two-dimensional lattice glass, there are white portions as shown in FIG. 16 (c) in four circled areas shown in FIG. 16 (b). Used as a reference point. First, the reference point searching method will be described.

  At the time of calibration, imaging is performed for the number of reference planes in which an xy-axis grid (two-dimensional grid) image is moved on the Z-axis moving stage in the same manner as the z-axis grid projection image by using the entire space table method. FIG. 17 is an image diagram of a single two-dimensional grid reference plane photographed by a camera. A black circle portion of the reference point can be confirmed. An area is determined in advance when searching for a reference point. This time, a reference point search was performed in the dotted line area as shown in FIG.

  As a method for searching for the reference point, Fourier transform and inverse Fourier transform are used. What is needed here is power calculated by Fourier transform, and a reference point is searched for by checking a portion with weak power. At the time of inverse Fourier transform, x-axis data is extracted using the lattice pitch in the x-axis direction.

  FIG. 18A is an image of the reference plane in FIG. After the Fourier transform of this figure, a diagram as shown in FIG. 18B is obtained. The dotted line area shown in FIG. 18B is extracted. The area region is determined so that the first order component in the xy direction in the figure after Fourier transform is included.

  A power diagram after the inverse Fourier transform is shown in FIG. FIG. 18E is obtained by performing binarization on FIG. Here, the threshold value for binarization is increased from 100 to 300, and while 20 is increased, it is determined whether or not there is one block at the masked location in the masked image. If there is one, binarization is performed with the threshold. And the power data of one line of the broken line shown in FIG.18 (c) is in FIG.18 (d). As can be seen, in the portion where the reference point exists, the grid of the designated pitch is not drawn, so that the power is calculated to be lower than the surrounding area. Thereby, the reference point position can be searched. However, since the power is calculated to be low even for the position where the screen edge portion is out of focus, the low power region only of the reference point in FIG. get. A pixel having the lowest power in this region is set as a reference point.

  FIG. 19A is a two-dimensional lattice image in which the reference point is corrected. As described in 2-3-1, the phase is obtained by using the Fourier transform lattice method for this two-dimensional lattice image. FIG. 19B shows an x-axis phase distribution image. Similarly, FIG. 19C shows a y-axis phase distribution image. FIG. 19D is an x-direction phase connection image. FIG. 19E is a y-direction phase connection image.

2-4-2 Correction of Two-dimensional Grid Image As described above, a white reference point is drawn on the two-dimensional grid glass of the present apparatus, but this is an obstacle in calculating the phase of the xy axis. FIG. 20 shows image data of the φ200 shape measuring apparatus. FIG. 21 shows image data of the φ70 shape measuring apparatus. For this reason, it is necessary to correct the reference point positions of the two-dimensional grid images as shown in FIGS. 20 (a) and 21 (a). Correction of the lattice image is performed by filling the photographed image at the white reference point position with the luminance of the surrounding lattice portion, whereby images as shown in FIGS. 20B and 21B can be obtained.

2-4-3 Re-sampling Three-dimensional shape measurement with one image became possible by the principle so far. However, since the shape measurement result is obtained as a coordinate distribution of points taken by the pixels of the camera, the shape measurement result is obtained as coordinates that are not equally spaced with respect to the xy plane as shown in FIG. However, when synthesizing data, it is necessary to obtain spatial coordinates that are equally spaced with respect to the xy coordinates as shown in FIG. For this purpose, three points including the xy coordinates to be known are searched for. In FIG. 22A, the coordinates of the point Ps are obtained by using the points Pa, Pb, and Pc around which the spatial coordinates are obtained. The spatial coordinates of the point Ps can be obtained as a point having coordinates (x, y) on a plane passing through the points Pa, Pb, and Pc.

2-4-4 Phase evaluation value For an object that causes halation such as stainless steel, measurement using a phase evaluation value and pixel selection is effective. The phase evaluation value is obtained by performing Fourier transform on the change of the luminance value in each pixel, obtaining the ratio of the sum of the power spectrum of frequency 1 and the power spectrum of higher order frequency as shown in Equation 19, This is a value defined as E (i, j) in i, j). Here, | F (n) | represents the magnitude of the power spectrum of frequency n, and N represents the highest frequency.

  In the phase evaluation value, when the luminance amplitude is large, the value is high, and the value is low for luminance saturation or data with small luminance amplitude. In the case of random noise, higher-order frequency components increase and the phase evaluation value decreases. Therefore, by using the phase evaluation value as an index for the synthesis processing of a plurality of shape measurement results, a more reliable value can be selected, which is effective in improving the accuracy of the measurement result.

2-4-5 Composition A characteristic of this apparatus is that measurement is performed from two directions by two cameras and a z-axis projector. One of the purposes is to obtain one highly accurate measurement result by a synthesis process such as averaging the measurement results.

  Since the results obtained by the re-sampling process described above are arranged at the same interval on the xy plane, the pixels corresponding to the respective measurement results can be determined by using the reference point pixels obtained as described above. it can. For an object that easily causes halation, the above-described phase evaluation value can be used to perform highly accurate synthesis processing. The composition processing is mainly processing for averaging z-axis data on the same pixel. By performing this process, highly accurate z-axis data can be obtained.

2-4-6 Method for improving accuracy by photographing from different directions Since metal halation and processing flaws reduce the influence on measurement results, shape measurement is performed with a measurement principle that increases accuracy. FIG. 23 shows the same location (point P) of the groove as viewed from the camera at a different angle while the camera is moving. FIG. 23B shows a state of measurement as seen from the three eyes of A, B, and C of the camera. The measured data of A, B, and C of the entire image is recorded while the camera moves at regular intervals.

The actual data processing flow will be described below.
(1) Method using x, y, z coordinates Data measured by A, B, C are shown in FIG. FIG. 24A shows the correspondence between the x, y coordinates and z coordinates of A, B, and C. There are z _A , z _B , and z _C coordinates at the same x and y coordinate locations. The influence of random noise is reduced using the phase evaluation value described in 2-4-4.

FIG. 24B shows the correspondence between the x, y coordinates of A, B, and C and the phase evaluation value e. There are e _A , e _B and e _C data at the same x and y coordinates. Thereafter, a threshold value in the phase evaluation value is designated, and data less than the threshold value is masked. On the other hand, if there is data above the threshold, the mask is not applied. There is mask data A, B, and C shown in FIG.

Similarly, m _A , m _B , and m _C data are entered at the same x and y coordinate locations. Finally, data after synthesis of A, B, and C as shown in FIG.

Phase evaluation value m _A
If the data is below the threshold, the mask data is set to zero. When the phase evaluation value is equal to or greater than the threshold value, the mask data is set to 1. The synthesized z-coordinate is obtained using the height data of the data that is not the mask. The result is obtained by z = (m _A · z _A + m _B · z _B + m _C · z _C ) / (m _A + m _B + m _C ). Furthermore, since the phase evaluation value is a number from 0 to 1, the synthesized z coordinate is z = (m _A · e _A · z _A + m _B · e _B · z _B + m _C · e _C · z _C ) / It can also be obtained by (m _A · e _A + m _B · e _B + m _C · e _C ).

  FIG. 25 is a stereoscopic display of the result after synthesis shown in FIG. By averaging the image data taken at different angles, the influence of halation on the image taken of the groove can be reduced. By integrating the averaged results for each time, a groove shape is obtained as shown in FIG.

(2) Method Using Polar Coordinates The problem of erasing data on the side surface of the groove can be solved by a method as shown in FIG. In FIG. 26, the data of the side surface of the groove can be measured by two cameras. Then, (x, z) coordinates and (θ, r) coordinates are converted by a calculation formula. By using polar coordinates, the data on the side of the groove can be used without disappearing.

  The measured data of A, B, and C are shown in FIG. FIG. 27A shows the correspondence between θ, y coordinates and r coordinates of A, B, and C. FIG. 27B shows the correspondence between the θ, y coordinates of A, B, and C and the phase evaluation value e. By using the phase evaluation value, mask data A, B, and C shown in FIG. 27C can be created. Then, by averaging the effective coordinates, post-combination data of A, B, and C as shown in FIG. 27 (d) is created. Finally, the (θ, r) coordinates can be converted into (x, z) coordinates to return to the groove shape.

3. Reference plane for experiment Next, the reference plane will be described. First, in 3-1, the structure and mechanism of the reference plane and the equipment used will be described. Next, in 3-2, the principle and improvements of the reference surface will be described. In 3-3, the conversion accuracy of the reference plane xy axis will be described.

3-1 Outline and Principle of Reference Surface FIG. 28 is a diagram for explaining the internal structure of the reference surface unit. FIG. 28A is a view of the reference surface looking down from above. FIG. 28B is a schematic view of the reference plane unit viewed from the lateral direction. FIG. 29 is an enlarged view of a two-dimensional lattice pattern. There is a diffusion sheet on the upper surface, and a two-dimensional lattice glass substrate is attached below the diffusion sheet. Below a known two-dimensional lattice glass substrate having a 0.2 mm pitch at regular intervals, there is a C-mount lens having a focal length of 35 mm for producing parallel light, and the size of the hole at the focal length position of the lens. There is a pinhole of 600 μm. A 4 W LED for a light source is attached to the lower part of the pinhole.

  When the light source is turned on, the light emitted from the light source passes through the pinhole, so that the pinhole becomes a pseudo point light source. Since the pinhole is placed at the focal point of the lens, it becomes parallel light after passing through the lens. When the parallel light enters the two-dimensional lattice glass substrate, the shadow is projected onto the diffusion sheet. The shape measuring unit attached above the diffusion sheet can photograph a two-dimensional lattice pattern projected from the back onto the surface of the diffusion sheet.

  When the light source is turned off, there is no projection of the two-dimensional lattice pattern from the back surface of the diffusion sheet, and therefore the shape measurement unit captures a simple diffusion sheet. At this time, if the shape measurement unit performs the grid projection, the projected grid pattern can be photographed.

  As shown in FIG. 29, since the two-dimensional lattice has a known equally spaced pitch, this is a scale for determining the x coordinate and the y coordinate. The two-dimensional lattice pattern is partially marked with reference point marks as shown in FIG. The two-dimensional grid can be numbered by photographing the mark simultaneously with the two-dimensional grid pattern by the shape measuring unit.

3-2 Improvement of Reference Surface Before the reference surface described in 3-1, the LED light source portion was improved. In addition, in order to obtain a clearer projection grating, parallel light was made using a lens. First, the brightness of the LED light source was examined in an experiment in order to obtain a projection grating that can be analyzed sufficiently.

  The grating was projected using a 1 W (watt) LED light source and a 4 W LED light source. As a result, it was found that the projected grid looks better with the 4 W LED light source. It was determined that a sufficiently bright projection grid could be projected with a 4W LED light source.

  In order to increase the luminance value of the light source, it is necessary to create parallel light. Therefore, using the light source portion, as shown in FIG. 30, the point light source emitted from the pinhole can be made parallel light by successfully using the optical principle of the C-mount lens. An experiment was conducted by placing a diffusion sheet as shown in FIG. 30 on the lens and confirming the state of the light source.

  In addition, the light emitting pattern of the light emitting element of the LED light source is well projected, and the problem is that the middle is brighter. The brightness of the light source can be made uniform.

3-3 Accuracy Evaluation of XY Axis of Reference Surface As described in 3-1, a grid having a pitch of 0.2 mm is projected on the diffusion sheet. The projected grating is photographed by the camera of the shape measuring apparatus according to the present invention, and converted into xy coordinates by using a phase analysis process or the like. The accuracy of the conversion was investigated.

  In the shape measuring apparatus described in 4-5 described later, the camera includes two sets of cameras. FIG. 31 is an image of a two-dimensional lattice taken by the first camera. On the image, there are four marks, 0, 1, 2, and 3. The 0th mark and the 1st mark indicate a range of 1 mm in 5 horizontal pitches. Similarly, the 2nd mark and the 3rd mark indicate a range of 5 mm in length and 1 mm.

  As described in 2-3-1, by using the Fourier transform lattice method, the inverse Fourier transform, and the phase connection for the captured lattice image as shown in FIG. 31, FIG. 32 (a) and FIG. 32 (b). Get such xy coordinates.

  Further, in FIGS. 32A and 32B, there are marks at the same positions as in FIG. In FIG. 32 (a), the coordinates of the mark are 0-1.593 mm, 1-0.594 mm, and the obtained x-direction lattice pitch is 0.999 / 5 = 0.200 mm. In FIG. 32B, the coordinates of the mark are No. 2 1.091 mm, No. 3 0.089 mm, and the obtained y-direction lattice pitch is: 1.002 / 5 = 0.200 mm. The xy direction lattice pitch was the same as the actual lattice pitch of 0.2 mm.

  Similarly, FIG. 33 is an image of a two-dimensional lattice taken by the second mela. On the image, there are four marks, 0, 1, 2, 3, and 4. The 0th mark and the 1st mark indicate a range of 1 mm in 5 horizontal pitches. Similarly, the 2nd mark and the 3rd mark indicate a range of 5 mm in length and 1 mm. 34 (a) and 34 (b) show xy coordinates. Further, in FIGS. 34 (a) and 34 (b), there is a mark at the same position as FIG. In FIG. 34A, the coordinates of the mark are 0-0.392 mm, 0.603 mm, and the obtained x-direction lattice pitch is 0.995 / 5 = 0.199 mm. In FIG. 34B, the coordinates of the mark are No. 2 0.293 mm, No. 3 -0.707 mm, and the obtained y-direction lattice pitch is: 1/5 = 0.200 mm. The x-direction lattice pitch was 0.001 mm different from the actual lattice pitch. The y-direction lattice pitch was the same as the actual lattice pitch.

4). Shape Measuring Device According to the Present Invention Here, an outline of the shape measuring device will be described. A shape measuring device capable of supporting pipes having a major axis of 200 mm or more depending on the size of the major axis of the pipe was named φ200. Similarly, a shape measuring device capable of accommodating pipes having a major axis of 70 mm to 200 mm is named φ70. First, in 4-1, the structure and structure of the shape measuring apparatus and the devices used are described. In 4-2, a three-dimensional shape measurement method will be described. 4-3 demonstrates the apparatus which processes a groove | channel. 4-4 shows a vibration experiment of the shape measuring apparatus. In 4-5, the measurement accuracy evaluation of the shape measuring apparatus will be described. Finally, 4-6 shows a measurement experiment of a shape measuring apparatus for a groove.

4-1 Outline of shape measuring device In order to make the same conditions as actually mounting the shape measuring device on the groove processing device, this shape measuring system made the same end mill as the groove processing device. Also, the reference plane part is 3. As explained in.

  FIG. 35 shows the shape measuring head attached to the machining head. FIG. 36 shows an overall image of the shape measuring apparatus. An end mill 4 for processing a workpiece is disposed at the tip of the processing head 6. A shape measuring head 12 is attached to the machining head 6. The shape measuring head 12 includes two measuring units 8A and 8B and a measuring unit controller 13. The measurement units 8A and 8B each incorporate a camera unit and a projector unit, and project a lattice pattern near the tip of the end mill 4 so that the camera unit can shoot. Each of the measurement units 8A and 8B is connected to a measurement unit controller 13 disposed above the measurement units 8A and 8B through signal lines. The measurement unit controller 13 controls grid projection in the projector unit and shooting in the camera unit in accordance with commands from the external computer 14, receives captured images from the cameras in the measurement units 8 A and 8 B, and receives them from the external computer 14. Send to.

  FIG. 37 shows the internal structure of the measurement units 8A and 8B. Since the measurement units 8A and 8B have the same configuration, they will be described as a common configuration. The measurement unit 8 includes a projector unit 9 and a camera unit 10 in a casing (see FIG. 2). The projector unit 9 forms an image on a glass lattice substrate with a lens using an LED light source, and performs lattice projection on the surface of the measurement object. The measurement unit controller 13 turns on / off the LED of the light source. The camera unit 10 includes an image sensor and a lens, and the image sensor is controlled by the measurement unit controller 13. In response to a command from the computer 14, the measurement unit controller 13 performs lattice projection by the projector unit 9 (LED light source, mirror, lens, glass lattice substrate), and captures an image of the measurement object on which the lattice pattern is projected by the camera unit 10. To do. The projected lattice image passes through the glass window and is projected onto the surface of the measurement object, and the projected lattice image is taken by the camera unit 10 through the glass window. The measuring unit 8 is downsized by bending the optical path of light from the light source using a mirror. The captured image signal is transmitted to the computer 14 via the measurement unit controller 13. FIG. 38 is an image of the internal structure of one measurement unit.

  The shape measuring apparatus including the two measurement units 8A and 8B controls so that the grid projection and imaging by the measurement unit 8A and the grid projection and imaging by the measurement unit 8B are performed alternately. In this way, it is possible to prevent the grid images taken by the measurement unit 8A and the measurement unit 8B from interfering with each other. In addition, it is good also as a structure which performs grating | lattice projection and imaging | photography of a grating | lattice image simultaneously from the measurement unit 8A and the measurement unit 8B by using structures, such as a wavelength of different light sources, a filter. Further, the light source is not limited to the LED, and semiconductor laser light or light guided by an optical fiber may be used as the light source.

  As shown in FIG. 39, the shape measuring head 12 is calibrated by attaching the shape measuring head 12 to a dedicated reference plane unit. FIG. 39 shows a schematic diagram when the shape measuring system according to the present invention for executing calibration is viewed from the side. As shown in FIG. 39, the operation of the stage 15 that moves up and down from a personal computer (Computer) 13 through a driver (Driver) 14 is controlled. The operation of the moving stage can also be confirmed from the personal computer 13 through the driver 14. Similarly, the personal computer 13 controls blinking of the LED light source through the microcomputer 16. The operation of the camera and LED light source inside the shape measuring head 12 is also controlled from the personal computer 13 through the controller. Image data captured by the camera can be confirmed by the personal computer 13. The dotted line portion in the figure is the lattice projection portion described in 3-1.

  The reference plane unit is attached to a stage 15 that moves up and down, and is configured to be able to capture a lattice projection and a projected lattice image from the shape measurement head 12 attached to the upper portion. The stage 15 that moves up and down moves up and down by a command from the personal computer 13 as described above.

  The reference plane unit and the reference point mark have been described with reference to FIGS. 28 and 29, but will be described again. There is a diffusion sheet on the upper surface, and a two-dimensional lattice glass substrate is attached below the diffusion sheet. Below the two-dimensional lattice glass substrate having a known equally spaced pitch is a lens for producing parallel light, and a pinhole is located at the focal length of the lens. An LED for a light source is attached to the lower part of the pinhole.

  When the light source is turned on, the light emitted from the light source passes through the pinhole, so that the pinhole becomes a pseudo point light source. Since the pinhole is placed at the focal point of the lens, it becomes parallel light after passing through the lens. When the parallel light enters the two-dimensional lattice glass substrate, the shadow is projected onto the diffusion sheet. The shape measuring unit attached above the diffusion sheet can photograph a two-dimensional lattice pattern projected from the back onto the surface of the diffusion sheet.

  When the light source is turned off, since the two-dimensional lattice pattern is not projected from the back surface of the diffusion sheet, the shape measurement unit captures a simple diffusion sheet. At this time, if the shape measurement unit performs the grid projection, the projected grid pattern can be photographed.

  FIG. 29 is an enlarged view of a two-dimensional pattern. Since the two-dimensional lattice has a known equidistant pitch, this is a scale for determining the x coordinate and the y coordinate. The two-dimensional lattice pattern is partially marked with a reference point as shown in FIG. By photographing this mark simultaneously with the two-dimensional lattice pattern by the measurement unit, the two-dimensional lattice can be numbered.

4-2 Shape Measurement Method of the Present Invention and Confirmation of Effectiveness The present invention relates to a lattice projection method, a sampling moire method capable of high-speed phase analysis, and an all-space table forming method capable of obtaining coordinates at high speed with high accuracy. It is a shape measurement method using Here, the shape measurement experiment result in the height direction is shown. The number of reference planes at the time of calibration is 5, the number of tables in the total space table method is 1000, the measurement range in the height direction is 0.8 mm, and the thinning interval in the sampling moire method is 43 pixels, with a pitch of 0.5 mm Project the grid.

  FIG. 40 shows a stainless steel sample to be measured. The groove in the center of the sample has a width of 1.0 mm and a depth of 0.51 mm. Other sizes are as described in the figure. The figure on the right is an enlarged view of the groove in the figure on the left. FIG. 41 is an image of a grid projected on the sample. 42 is a phase distribution diagram obtained by the sampling moire method with respect to FIG. 41, and FIG. 43 is a height distribution diagram obtained by the total space table method based on the phase of the chain line portion of FIG. 44 shows the height distribution of the cross section of the chain line portion z of the measurement result shown in FIG. When the average value at the bottom and top of the groove is calculated, the top is 0.64 mm, the bottom is 0.15 mm, and the difference is 0.49 mm. Judging from the results, the difference was 0.02 mm compared to the actual depth of the groove. Therefore, it was found that the shape measuring method of the present invention is sufficiently effective.

4-3 Processing Machine for Processing Grooves A conventionally known test piece processing machine (see FIG. 45) manufactures test pieces used for quality inspection of seamless steel pipes. High quality test pieces are indispensable for maintaining the quality of seamless steel pipes. Welding can be performed to regenerate hot tools and to harden and mold molds. The test piece processing machine controls the operation of the end mill and the device with a controller. When processing the groove, the end mill can be put into the pipe and processed at an appropriate place. As introduced in 4-1, the shape measuring device is actually mounted on the test piece processing machine, and the shape of the groove is measured while processing the groove.

4-4 Vibration test of shape measuring device In order to investigate the effect of the vibration of the processing machine that processes grooves on the camera, the camera is mounted on the test piece processing machine, the end mill and the shape measuring device are placed in the pipe, The experiment was conducted while processing the grooves.

  Experiments were performed with the test piece processing machine operating in the following five states.

State 1: Stationary State 2: Empty (5000 RPM)
State 3: idle (6000 RPM)
State 4: Cutting (cutting speed 0.01 mm / min, cutting depth 0.1 mm, feed speed 15 mm / min)
State 5: Cutting (cutting speed 0.05 mm / min, cutting depth 0.2 mm, feed speed 15 mm / min)
FIG. 46 shows a change in the phase value at one point in the image. From the experimental results, it was found that the vibration of the processing machine had little effect on the camera.

4-5 Measurement Accuracy of Shape Measuring Device Before measuring the shape of a groove that is an object to be evaluated, it is necessary to check the measurement accuracy of the φ200 shape measuring device itself. For this purpose, a measurement accuracy confirmation experiment of the φ200 shape measurement device was performed using a step measurement sample (see FIG. 47) with good accuracy. First, the step measurement sample was measured with a high-precision non-contact level difference measuring machine (high-precision non-contact level difference measuring machine DH2 manufactured by Union Optical Co., Ltd.). Three measuring lenses are attached. The lens information is shown in Table 1.

  Table 2 shows the data of the step measurement sample with good accuracy.

  The first and second stages were used in this experiment. As described in 4-1, since two sets of the camera and the lattice projection portion are attached (see FIG. 35), they are called the first camera and the second camera. The actual photograph and result of the first camera and the second camera are shown respectively. For example, the measurement unit 8A corresponds to a first camera, and the measurement unit 8B corresponds to a second camera.

  FIG. 48A shows a photographed image of the first camera. FIG. 48B is a photographed image of the second camera. The size of the captured image is 1280 * 1024 pixels. The height distribution image of FIG. 48A is FIG. 49A. Similarly, the height distribution image of FIG. 48B is FIG. 49B. FIG. 50 is a three-dimensional image of a region surrounded by a white line of a photographed image.

As a result, as shown in FIG. 49A, a difference of 0.480 mm was observed from the height distribution image of the first camera. The result of measurement with a non-contact measuring device was 0.499 mm, and it was found that there was a difference of 0.019 mm. As shown in FIG. 49B, a difference of 0.481 mm was observed from the height distribution image of the second camera. It was found that there was a difference of 0.018 mm from the measurement result of the non-contact measuring device.
From the above experiment, the measurement accuracy of the first camera is 0.019 mm. The measurement accuracy of the second camera was found to be 0.018 mm.

4-6 Measurement Experiment of Shape Measuring Device Targeting Grooves Before performing shape measurement of groove samples, an xyz table must be created. First, the reference point search before creating the table of the φ200 shape measuring apparatus will be described. An image result of the reference point search described in 2-4-1 is shown.

  FIG. 51 is a two-dimensional lattice reference plane image taken by a camera. In addition, the white portion of the reference point can be confirmed within the circle surrounded by the broken line. An area is determined in advance when searching for a reference point. This time, a reference point search was performed within the white line area (640 * 480 pixels) as shown in FIG. 52A and 52B (hereinafter, both are referred to as FIG. 52) show the data of the area area within the white line.

  FIG. 52A is a reference plane image of FIG. After Fourier transform of this image, an image as shown in FIG. 52 (b) is obtained. The broken line area shown in the image of FIG. 52 (b) is extracted. The area region is determined so that the xy component of the image after Fourier transform is included. The area area this time is 52 * 52 pixels.

  The power image after the inverse Fourier transform is shown in FIG. By performing binarization on FIG. 52C, the image of FIG. 52E is obtained. The solid line power data shown in FIG. 52 (c) is shown in FIG. 52 (d). The threshold for binarization this time was 180. The low power region of only the reference point shown in FIG. 52 (f) is acquired through the process of excluding the low power portion at the end portion. A pixel having the lowest power in this region is set as a reference point. FIG. 52G shows a two-dimensional lattice image with the reference point corrected. As described in 2-4-1, the phase is obtained by using the Fourier transform lattice method for the two-dimensional lattice image. FIG. 52 (h) shows an x-axis phase distribution image. Similarly, FIG. 52 (i) shows a y-axis phase distribution image. FIG. 52J is an x-direction phase connection image. Similarly, FIG. 52 (k) is a y-direction phase connection image. An xyz table is created using the searched reference points.

Next, the shape measurement experiment of the groove sample will be described.
Using a φ200 shape measuring device, a measurement experiment of a shape measuring device for a groove was conducted. A processed metal sample is used as a measurement target. FIG. 53 shows a stainless steel sample to be measured. The width of the groove at the center of the sample is 0.8 mm and the depth is 0.479 mm. Other sizes are as described in the figure. In this experiment, the imaging range is a region including a groove as indicated by a broken line in FIG.

The individual 3D shape measurement results from the two cameras are shown below.
FIG. 54A shows a photographed image of the first camera. FIG. 54B is a captured image of the second camera. The size of the captured image is 1280 * 1024 pixels. An area (670 * 300 pixels) including a groove in the photographed image is shown in FIG. FIG. 56 is an x-coordinate image of FIG. FIG. 57 is the y target image of FIG. FIG. 58 is a z-coordinate image of FIG. FIG. 59 is the 3D image of FIG. Further, the z-coordinate image shown in FIG. 58 is resampled, and the result is shown in FIG. The xy coordinate of one pixel after resampling is 10 μm. FIG. 61 shows composite data of the two cameras shown in FIG. FIG. 62 shows the 3D image of FIG. Below, it shows about evaluation of the data after a synthesis | combination of FIG.

  First, the width of the groove after synthesis was evaluated. As shown in FIG. 63, the arrow data is shown in Table 3.

  It was found that the distance between the grooves was measured at 0.83 mm under the above conditions. Since the actual groove distance was 0.8 mm as described above, it was found that there was a measurement error of 0.03 mm.

  The depth of the groove after synthesis was also evaluated. As shown in FIG. 64, the depth of the groove is confirmed from the average value of the height information of the regions A and C and the average value of the height information of the region B. In addition, since the synthesis process is not complete, the data near the ridge of the groove is avoided and confirmed. Table 4 shows the pixel position of each region.

  As a result, the average height of A and C was 0.645 mm, the average height of B was 0.184 mm, and the difference was 0.463 mm. As described above, the depth of the groove is 0.479 mm. It was found that there was a measurement error of 0.016 mm.

  Finally, the height of one line of the groove after synthesis was also evaluated. As shown in FIG. 65, the height information of the arrow portion is represented as a cross-sectional view of FIG. The position of the arrow is the position of 105 pixels on the y-axis, and data for 480 pixels is displayed in the x-axis direction.

5. Shape measurement software This section outlines improvements to the shape measurement software in this study. First, the noise removal will be described in 5-1. Next, shape measurement software is introduced in 5-2.

5-1 Noise removal Metals are prone to halation. In particular, in the measurement object of the present invention, when a groove is machined, a facet coming out of the groove may damage the metal surface. Moreover, it is necessary to reduce the influence of halation in order to measure the groove. Explain these measures.

  Hereinafter, the flow of noise removal will be described. As shown in FIG. 67, the difference between the luminance value of the central pixel and the luminance values of the surrounding eight pixels is obtained. The number of pixels whose absolute value of the difference is greater than a set value A (here, 150) is greater than or equal to a set value B (here, 3) set separately, and the pixel is regarded as noise and masked. Then, the entire image is scanned. An average value of luminance values of pixels that are not masks around the central pixel is obtained. A program with these functions was created and the effectiveness of noise removal was confirmed.

A groove having a length of 30 mm, a width of 1.0 mm, and a depth of 0.51 mm was processed on the outer surface of a stainless steel pipe having a diameter of 350 mm and a thickness of 15 mm. The part with the groove was cut out. As shown in FIG. 68, the size is 70 mm in length and 50 mm in width. The effectiveness of noise removal was shown using the measurement sample of FIG.
FIG. 69 is an image taken by the first camera of the shape measuring apparatus described in 4-1. The size of the image is 1280 * 1024 pixels. FIG. 70 shows the result obtained by the noise removal described earlier with reference to FIG.

  Image processing was performed on the captured image and the image after noise removal. FIG. 71 shows the measurement results. 71A and 71B are images cut out from FIGS. 69 and 70. FIG. Its size is 600 * 400 pixels. 71 (c) and 71 (d) are phase distributions calculated by the sampling moire method.

  72 (a) and 72 (b) are height distribution images calculated by the total space table method. The real number data of one line is called at the same place in the height distribution of FIG. 72 (a) and FIG. 72 (b). The data is shown in FIGS. 72 (c) and 72 (d). For the measurement results in FIG. 72 (c) and FIG. 72 (d), the average value of the real number data above and below the groove was obtained. As a result, the average value above the groove of the original image is 0.60 mm, and the average value below is 0.24 mm. The difference is 0.36 mm. There is a difference of 0.15 mm compared to the actual depth of the groove. In the image from which noise has been removed, the top is 0.60 mm, the bottom is 0.16 mm, and the difference is 0.44 mm. Compared to the actual depth of the groove, there is a difference of 0.07 mm. The value after noise removal was closer to the actual groove depth.

5-2 Process Flow FIG. 73 shows an interface screen of analysis software used in the embodiment of the present invention. The leftmost part of the figure is an image display part. In the middle is the part for setting the number of samples, the synthesis parameters, and the output parameters when actually measuring. The rightmost part is for setting camera parameters and parameters for shooting the reference plane. Next, the flow of processing when measuring the actual shape will be described (see FIG. 74).

5-2-1 Reference plane imaging and table formation Coordinates are calculated from the reference plane imaging in the xy directions. A two-dimensional lattice is projected from the back surface of the reference surface, and this is photographed with a camera. The xy coordinates are obtained by performing the Fourier transform lattice method, the inverse Fourier transform, and the phase connection on the captured lattice image as shown in FIGS. 75 (a) and 75 (b). Create table data using the whole space table method.

  When measuring a shape, first, a measurement sample is photographed with a shape measuring device. The captured images are shown in FIGS. 76 (a) and 76 (b). Then, by using the sampling moire method for the captured image, a phase distribution image as shown in FIGS. 77 (a) and 77 (b) is obtained. By referring to the calculated phase distribution in the table created earlier, a height distribution as shown in FIGS. 78 (a) and 78 (b) is obtained. Since such processing is performed while moving the measurement sample, synthesis processing and averaging processing are performed on the left and right moved data and output. The output data is shown in FIG. By integrating the height measurement results in FIG. 79, height data as shown in FIG. 80 is obtained. FIG. 80 shows composite data of the photographed image shown in FIG. Finally, as shown in FIG. 80, the height information of the arrow portion is represented as a cross-sectional view of FIG.

6). Downsizing of shape measuring apparatus and measurement experiment The downsizing of the shape measuring apparatus according to the present invention and the measurement experiment of the downsized shape measuring apparatus (φ70) will be described. First, the reason for downsizing the shape measuring apparatus will be described in 6-1. The principle of micrograting projection for miniaturization will be described in 6-2. 6-3 explains the evaluation of the projection grating of the miniaturized shape measuring apparatus. In 6-4, the measurement accuracy evaluation of the shape measuring apparatus will be described. 6-5 shows the measurement experiment of the shape measuring apparatus for the groove. Finally, 6-6 shows the confirmation experiment of the measurement principle to improve accuracy and the result.

6-1 About the size reduction of a shape measuring device The pipe as a measuring object of the present invention has various sizes. The shape measuring apparatus of φ200 described in 4-1, was designed to be compatible with pipes having a major axis of 200 mm or more. A shape measuring device that can accommodate pipes having a long diameter of 70 mm to 200 mm is required. FIG. 82 shows images of a φ200 shape measuring device and a miniaturized φ70 shape measuring device. The size of the φ200 shape measuring device is 150 * 150 mm, and the size of the φ70 shape measuring device is 50 * 60 mm.

  FIG. 83 shows the shape measuring head attached to the machining head. The shape measuring head is composed of two measuring units and a controller. The measurement unit incorporates a camera and a grid projection part so that a grid pattern can be projected and photographed with the camera. Each measurement unit is connected to a measurement unit controller. The measurement unit controller controls each measurement unit for lattice projection and photographing in response to a command from an external computer, receives a photographed image from a camera in the measurement unit, and transmits it to the external computer.

  FIG. 84 shows the internal structure of the φ70 measuring unit. The inside of the measurement unit is composed of a projector unit and a camera unit. The projector unit performs grid projection by causing the light from the LED light source to form an image with a lens through a slit having a width of 0.12 mm and hit the glass grid substrate. The LED of the light source is turned on / off from the measurement unit controller. The camera unit includes an image sensor and a lens, and the image sensor is an OV6930CMOS (400 * 400 pixel) manufactured by Omnivision. The image sensor is controlled by the measurement unit controller. In response to a command from the computer, the measurement unit controller performs lattice projection by the projector unit, and immediately after that, captures an image of the measurement object onto which the lattice pattern is projected by the camera unit, and transmits the image to the computer.

  As shown in FIG. C, the second shape measuring head according to claim 2 is irradiated and measured by a light source (LED), a slit disposed in front of the light source, and light from the light source that has passed through the slit. A projector unit having a transparent member on which a lattice pattern projected on the surface of the object is formed; and an imaging unit that images the surface of the measurement object on which the lattice pattern is projected by the projector unit. , The width of the slit is less than half of the pitch of the lattice, the direction of the slit and the direction of the lattice of the transparent member on which the lattice pattern is formed, and at least an image of the surface of the measurement object A first measurement unit and a second measurement unit which are arranged so as to capture images so that a part of the imaging regions overlap; projection of a lattice pattern by the first measurement unit; And photographing the surface of the object, an imaging surface of the projection and the measurement object tessellated by the second measuring unit, characterized by comprising a control means for causing switch.

6-2 Micro-grid projection An image of the shape measuring apparatus reduced in size in 6-1 is shown. The most difficult point in downsizing the shape measuring apparatus is downsizing of the portion that projects the grating. The present invention realizes miniaturization of a portion for projecting a lattice by performing micro lattice projection. The micro grid projection can project a micro grid by using the focal length and geometry of the lens. FIG. 85 shows that the pitch of the grating using the lens can be changed.

The distances between the lens and the glass grating, the lens and the LED, and the lens and the reference surface are as follows.
f: Focal length of lens
a _G : Distance between lens and glass lattice a _L : Distance between lens and LED
b _L : Distance between lens and mirror image LED c _R : Distance between lens and reference plane
p ′: pitch of the glass grating p: pitch of the projection grating The pitch p of the projection grating can be calculated by the following formulas (20) to (21) using the relational expression between the focal length of the lens and the geometry.

B _L is obtained from the above equation (20). By substituting the obtained b _L into Equation 21, the pitch p of the projection grating can be obtained as shown in Equation 22.

Next, a proof experiment was conducted on the above principle.
Experimental conditions:
Lens focal length: f = 40mm
Distance between lens and LED: aL = 30mm
Distance between lens and glass grating: aG = 10mm
Distance between lens and reference plane: cR = 20mm
The pitch of the glass lattice: p ′ = 0.2 mm
The pitch of the projection grating obtained from the calculation formula (Formula 22) under the above experimental conditions is: p = 0.215 mm.

  The distance between the lens and LED, the lens and glass lattice, the lens and the reference plane, and the distances were set as described in the experimental conditions. The difference between the theoretical value and the value obtained from the experiment is 0.006 mm. The effectiveness of the obtained calculation formulas (Formula 20, Formula 21, Formula 22) could be experimentally proved.

6-3 Evaluation of Projection Grating of Miniaturized Shape Measurement Device The shape measurement device was miniaturized using the principle of micrograting projection of 6-2, and the projection grating of the miniaturized shape measurement device is We verified whether it was in accordance with the micro-grid projection principle. As a result of the verification, the effectiveness was confirmed. The experimental conditions are as follows.

Experimental conditions:
Lens focal length: f = 10 mm
Distance between lens and LED: aL = 9.38 mm
Distance between lens and glass grating: aG = 2.4 mm
Distance between lens and reference surface: cR = 12.4 mm
Glass lattice pitch: p ′ = 0.375 mm
Using the above experimental conditions, the pitch of the projection grating obtained by the formulas 20 to 22 described in 6-2 is: p = 0.399 mm.

  The projected grating pitch is 3.5 / 9 = 0.389 mm. The same results were obtained in all three experiments. Since the pitch of the projection grating obtained from the calculation formula (Formula 20 to Formula 22) described in 6-2 is 0.399 mm, there is only a difference of 0.010 mm from the actual experimental result.

6-4 Evaluation of Projection Grating of Miniaturized Shape Measuring Device Before measuring the shape of the groove that is the measurement object, it is necessary to check the measurement accuracy of the φ70 shape measuring device itself. Therefore, as described in 4-5, the measurement accuracy confirmation experiment of the φ70 shape measurement apparatus was performed using the step measurement sample having the same accuracy as that of FIG. The object to be photographed was the first and second steps of the step measurement sample.

  FIG. 86 shows the state of the experiment. FIG. 87 (a) is a photographed image of the first camera. FIG. 87 (b) is a captured image of the second camera. The size of the captured image is 400 * 400 pixels. FIG. 89 shows a 3D image of a white area (350 * 100 pixels) in the captured image. Also, the height distribution image of FIG. 87 (a) is FIG. 88 (a). Similarly, the height distribution image of FIG. 87 (b) is FIG. 88 (b).

  As a result, as shown in FIG. 88 (a), a difference of 0.515 mm was observed from the height distribution image of the first camera. The result measured with a non-contact step system was 0.499 mm, and it was found that there was a difference of 0.016 mm. As shown in FIG. 88 (b), a difference of 0.517 mm was observed from the height distribution image of the second camera. It was found that there was a difference of 0.018 mm from the measurement result of the non-contact step system. From the above experiment, the measurement accuracy of the first camera is 0.016 mm. The measurement accuracy of the second camera was found to be 0.018 mm.

6-5 Measurement accuracy evaluation of shape measuring device Before measuring the shape of a groove sample, it is necessary to create an xyz table. The principle of the reference point search described in 2-4-1 needs to correspond to both the φ200 shape measurement device and the φ70 shape measurement device. The process flow is the same. However, since the captured image of the φ70 shape measuring apparatus is considerably small, it is necessary to change the search area. The data is shown below.

FIG. 90A shows a captured image of the reference plane. In the case of a φ70 shape measuring apparatus, a reference point search was performed in a white area (280 * 100 pixels) as shown in FIG. 90A. After Fourier transform of this image, an image as shown in FIG. Can be obtained. The yellow area shown in the image of FIG. 90 (b) is extracted. The area area this time is 16 * 16 pixels. The reference point search is performed as described in 2-4-1. FIG. 90C is a power image after the inverse Fourier transform. 90 is binarized to obtain the image of FIG. 90 (e). The red line power data shown in FIG. 90 (c) is shown in FIG. 90 (d). The threshold for binarization this time was 220. The low power region of only the reference point in FIG. 90 (f) is acquired. A pixel having the lowest power in this region is set as a reference point. FIG. 90 (g) shows a two-dimensional lattice image with the reference point corrected. As described in 2-4-1, the phase is obtained by using the Fourier transform lattice method for this two-dimensional lattice image. FIG. 90 (h) shows an x-axis phase distribution image. Similarly, FIG. 90 (i) shows a y-axis phase distribution image. FIG. 90 (j) is an x-direction phase connection image. Similarly, FIG. 90 (k) is a y-direction phase connection image. (Note that FIGS. 90-1 and 90-2 are collectively referred to as FIG. 90.)
An xyz table is created using the searched reference points. Next, the shape measurement experiment of the groove sample will be described. Using a φ70 shape measurement device, a measurement experiment of a shape measurement device for a groove was performed. A processed metal sample is used as a measurement target.

  FIG. 91 shows a stainless steel sample to be measured. The width of the groove at the center of the sample is 0.5 mm and the depth is 0.463 mm. Other sizes are as described in the figure. In this experiment, the shooting range is a solid circle as shown in FIG. Hereinafter, individual three-dimensional shape measurement results obtained by two cameras are shown.

  FIG. 92A shows a photographed image of the first camera. FIG. 92B is a photographed image of the second camera. The size of the captured image is 400 * 400 pixels. A white area (350 * 50 pixels) in the captured image is shown in FIG. FIG. 94 is the x coordinate image of FIG. FIG. 95 is the y target image of FIG. FIG. 96 is the z coordinate image of FIG. FIG. 97 is the 3D image of FIG. Also, the z-coordinate image shown in FIG. 96 is resampled, and the result is shown in FIG. The xy coordinate of one pixel after resampling is 10 μm. FIG. 99 shows the combined data of the two cameras shown in FIG. FIG. 100 shows the 3D image of FIG.

The evaluation of the post-synthesis data in FIG. 99 is shown below.
First, the width of the groove after synthesis was evaluated. As shown in FIG. 101, the arrow data is shown in Table 5. It was found that the distance between the grooves was measured at 0.50 mm under the conditions in Table 5. Since the actual groove distance was 0.8 mm as described above, the measurement error was found to be 0 mm.

  After the synthesis, the depth of the groove was also evaluated. As shown in FIG. 102, the depth of the groove is confirmed from the average value of the height information of the regions A and C and the average value of the height information of the region B. It should be noted that since the compositing process is not complete, data near the ridge of the groove is avoided and confirmed. The pixel positions in each region are as shown in Table 6.

  As a result, the average height of A and C was 0.756 mm, the average height of B was 0.311 mm, and the difference was 0.445 mm. As described above, the depth of the groove is 0.463 mm. It was found that there was a measurement error of 0.018 mm.

  Finally, the height of one line of the groove after synthesis was also evaluated. As shown in FIG. 103, the height information of the arrow portion is represented as a cross-sectional view of FIG. In FIG. 104, the position of the arrow is 42 pixels on the y-axis, and data for 186 pixels is displayed in the x-axis direction.

6-6 Confirmation Experiment of Measurement Principle to Increase Accuracy Using the φ70 shape measurement device, a confirmation experiment of the measurement principle to increase the accuracy described in 2-4-6 was performed. The results are described below. FIG. 105 (a) is an image (400 * 400 pixel) recorded while processing a groove at an actual site. There is a scratch in the dotted circle in FIG. 105 (b). An experiment was conducted based on the movement of the wound. As shown in FIG. 105A, the groove portion of the photographed groove image is inclined at a considerable angle. In order to obtain a better groove height, the captured image was rotated so that the groove was straight and data processing was performed. The rotated image is shown in FIG. In this case, it rotated by 18.63 degrees. In addition, when the reference plane is photographed, the same image rotation is performed, so that the three-dimensional coordinates can be correctly obtained even for the rotated image.
The results are shown below.

  FIG. 106 shows three rotated images and their height images. The height result of FIG. 106 (a) is shown in FIG. 106 (b). The height result of FIG. 106 (c) is shown in FIG. 106 (d). The height result of FIG. 106 (e) is shown in FIG. 106 (f).

  There is a red line in the image in FIG. One line height data where there is a scratch in the groove of the three photographed images was taken out. The result will be described. FIG. 107 shows the height data of one line in FIG. FIG. 107 (a) is one-line height data of FIG. 106 (b). FIG. 107 (b) shows one line height data of FIG. 106 (d). FIG. 107 (c) is one line height data of FIG. 106 (f). FIG. 106 (d) shows the average data of three lines in FIGS. 106 (a), (b) and (c). Since the depth of the groove is 0.7 mm, the averaged data is the closest to the actual groove depth as shown in FIG. 107 (d).

  FIG. 107 shows the height data of one line in FIG. FIG. 107A shows line A height data of DK (b). FIG. 107 (b) shows the line B height data of FIG. 106 (d). FIG. 107 (c) is line C height data of FIG. 106 (f). FIG. 107 (d) shows the combined data of the lines A, B, and C shown in FIGS. 107 (a), (b), and (c). Further, since the depth of the groove is 0.7 mm, as shown in FIG. 107 (d), the averaged data is the closest to the actual groove depth.

2 pipe 3 arm 4 end mill 5 moving direction 6 machining head 7 machining groove 8 measuring unit 9 projector unit
DESCRIPTION OF SYMBOLS 10 Camera part 11 Measurement area 12 Shape measurement head 13 Measurement unit controller 14 Computer

Claims (5)

A projector unit including a light source, a transparent member on which a lattice pattern irradiated with light from the light source is formed, and an imaging lens that forms an image of the lattice pattern on a surface of a measurement object; Imaging means for photographing the surface of the measurement object on which a pattern is projected, and is arranged to take an image of the surface of the measurement object so that at least a part of the imaging regions overlap. A measurement unit and a second measurement unit;
Control means for switching between projection of the lattice pattern by the first measurement unit and photographing of the surface of the measurement object, and projection of the lattice pattern by the second measurement unit and photographing of the surface of the measurement object. ,
A first shape measuring head comprising: A projector unit having a light source, a slit disposed in front of the light source, and a transparent member formed with a lattice pattern that is irradiated with light from the light source that has passed through the slit and projected onto the surface of the measurement object; Imaging means for photographing the surface of the measurement object onto which the lattice pattern is projected by the projector unit, and the width of the slit is not more than half of the pitch of the lattice, and the direction of the slit and the The first measurement unit and the first measurement unit arranged so as to capture the image of the surface of the measurement object so that at least a part of the imaging regions overlap with each other, with the lattice directions of the transparent member on which the lattice pattern is formed coincide. Two measuring units;
Control means for switching between projection of the lattice pattern by the first measurement unit and photographing of the surface of the measurement object, and projection of the lattice pattern by the second measurement unit and photographing of the surface of the measurement object. ,
A second shape measuring head comprising: Comprising either the first shape measuring head according to claim 1 or the second shape measuring head according to claim 2;
A shape measuring apparatus that performs a phase analysis process on the captured image of the measurement object to calculate the shape of the measurement object.   The shape measurement apparatus according to claim 3, wherein the shape measurement apparatus performs synthesis processing of images captured by the measurement units using a phase evaluation value as an index.   The on-machine measuring method which measures the shape of the process location of a workpiece | work with the said shape measuring device as described in any one of Claim 3 or 4, processing a workpiece | work with the processing apparatus provided with the processing head.