JP2002213931A - Instrument and method for measuring three-dimensional shape - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a three-dimensional shape measuring instrument to efficiently execute a distance-calculating processing based on pattern irradiation images photographed with a plurality of cameras. SOLUTION: A measuring object is irradiated with light different in patterns, or the patterned light and irradiation light of no pattern as different polarized lights, to be selectively photographed separately with the plurality of cameras, and differential data are obtained based on the photographed images to generate a parallax image. By this constitution, influence of color, reflection difference, a pattern and the like of the measuring object is canceled by one projection and photographing to generate the accurate parallax image, and precise measurement free from the influence of a change is allowed even when the subject has a complicated pattern, even when the subject is a moving body, even when a measuring instrument is moved, and even when an illumination or a projected light is changed with time.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to a three-dimensional shape measuring apparatus and a three-dimensional shape measuring method for measuring a three-dimensional shape from luminance information and distance information. In particular, the present invention, when the subject has a pattern, such as a portion of different reflectance,
The present invention relates to a three-dimensional shape measuring apparatus and a three-dimensional shape measuring method that can accurately measure the shape of a subject even when the subject or the measuring device moves.

[0002]

2. Description of the Related Art A technique for acquiring a three-dimensional shape includes an active technique (Active vision) and a passive technique (Passive v).
ision). The active method uses (1) a method that emits laser light or ultrasonic waves to measure the amount of light reflected from an object and the arrival time to extract depth information, and (2) a special pattern light source such as slit light. A pattern projection method for estimating a target shape from image information such as a geometric deformation of a target surface pattern, and (3) a method of obtaining three-dimensional information by forming contour lines by moiré fringes by optical processing. is there. On the other hand, the passive method is based on
There are monocular stereoscopic vision in which three-dimensional information is estimated from one image using knowledge about illumination, shadow information, and the like, and stereoscopic vision in which depth information of each pixel is estimated based on the principle of triangulation.

[0003] In the stereo vision method, a parallax is calculated from a difference between captured images from two viewpoints, and the position of each point on the image is calculated by triangulation based on the parallax. It is necessary to search for a corresponding region in two images based on pattern (texture) information of a subject, and there is a problem that a processing load is large.

Further, the active stereo method (pattern projection method) reduces the processing load by replacing the texture of a subject with a known simple pattern, as compared with the stereo vision method. Using one camera and one pattern projector instead of two cameras, the parallax is calculated from the difference between the projected two-dimensional projection pattern and the imaging pattern.

[0005] As a problem of the active stereo method, there is a problem that, when comparing an imaging pattern with a projection pattern, the imaging pattern changes with respect to the projection pattern due to factors such as influence of shape, reflectance, and effect of pattern. When the subject is white on the entire surface, the pattern to be imaged changes with respect to the projection pattern only by the influence of the shape. However, when the subject has a pattern, if the change due to the effect of the pattern is calculated as the effect of the shape, it becomes an error factor. Therefore, the subject must be limited to one without a pattern.

In order to measure an object having a difference in reflectance and a pattern, a plurality of images are taken while changing the projection pattern, and the difference is taken, thereby canceling the pattern change due to the effect of the pattern and the effect of the shape. A technique of extracting only a component of a pattern change is often used.

[0007]

However, in the method of performing measurement by projecting / imaging a plurality of times while changing the projection pattern, it is difficult to perform accurate measurement when the subject moves or when the measuring device moves. There is.

In addition, the flickering and temporal change of the projection light and the environment light when performing the image pickup a plurality of times remain without being canceled by extracting the difference between the images, and become an error factor.

SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems, and it is possible to cancel a pattern change due to a difference in reflectance of a subject to be measured and a pattern by a single projection / imaging operation, It is an object of the present invention to provide a three-dimensional shape measuring apparatus and a three-dimensional shape measuring method capable of extracting only a component of a change in a pattern due to the influence of the above and measuring an accurate subject shape.

[0010]

SUMMARY OF THE INVENTION A first aspect of the present invention is as follows.
In a three-dimensional shape measuring apparatus that acquires distance information of a measurement target based on a pattern image obtained by projecting a two-dimensional pattern onto the measurement target, a plurality of irradiation lights including at least one two-dimensional pattern are respectively irradiated with different polarization angles A light projecting unit that irradiates the measurement target with polarized irradiation light, and an imaging unit that captures an image of the measurement target irradiated with the plurality of irradiation lights, and selectively captures each of the polarized light. Imaging means for acquiring a plurality of captured images, and image processing means for generating a parallax image based on the plurality of images captured by the imaging means, and obtaining distance information of the measurement target based on the parallax images, A three-dimensional shape measuring apparatus characterized by having

Further, in one embodiment of the three-dimensional shape measuring apparatus according to the present invention, the light projecting means converts a single two-dimensional pattern and a uniform irradiation light having no pattern into polarized irradiation light having different polarization angles. It is characterized in that the measurement target is irradiated.

Further, in one embodiment of the three-dimensional shape measuring apparatus according to the present invention, the light projecting means irradiates each of the plurality of different two-dimensional patterns to the object to be measured as polarized light having different polarization angles. It is characterized by having a configuration.

Further, in one embodiment of the three-dimensional shape measuring apparatus of the present invention, the image processing means calculates difference data of a plurality of images photographed by each of the plurality of imaging means, and calculates the difference data based on the difference data. And generating a parallax image.

Further, in one embodiment of the three-dimensional shape measuring apparatus of the present invention, the image processing means calculates addition data of a plurality of images taken by each of the plurality of imaging means, and based on the addition data. And generates a luminance image.

Further, in one embodiment of the three-dimensional shape measuring apparatus according to the present invention, the light projecting means includes a plurality of light sources and output lights having different polarization angles respectively set corresponding to the plurality of light sources. It is characterized by having a configuration having a plurality of polarizing filters for outputting.

Further, in one embodiment of the three-dimensional shape measuring apparatus according to the present invention, the light projecting means is configured to have a plurality of polarized light sources each outputting output light having a different polarization angle. .

Further, in one embodiment of the three-dimensional shape measuring apparatus according to the present invention, the image pickup means includes a plurality of image pickup means and light beams having different polarization angles respectively set corresponding to the plurality of image pickup means. It is characterized by having a configuration having a plurality of polarizing filters that pass therethrough.

Further, in one embodiment of the three-dimensional shape measuring apparatus according to the present invention, the image pickup means has a configuration including a plurality of image pickup means and a beam splitter for separating lights having different polarization angles. I do.

According to a second aspect of the present invention, there is provided a three-dimensional shape measuring method for acquiring distance information of a measurement target based on a pattern image obtained by projecting a two-dimensional pattern onto the measurement target. A pattern light projection step of irradiating a plurality of irradiation lights including a pattern to the measurement target as polarized light irradiation lights each having a different polarization angle,
An imaging step of capturing an image of a measurement target irradiated with the plurality of irradiation lights, an imaging step of selectively capturing each of the polarized irradiation lights to obtain a plurality of captured images, and an image captured in the imaging step. An image processing step of generating a parallax image based on a plurality of images and obtaining distance information of the measurement target based on the parallax image.

Further, in one embodiment of the three-dimensional shape measuring method according to the present invention, the pattern projecting step includes the step of irradiating one two-dimensional pattern and uniform irradiation light having no pattern with polarized light having different polarization angles. It is characterized by irradiating the object to be measured as light.

Further, in one embodiment of the three-dimensional shape measuring method according to the present invention, the pattern projecting step includes irradiating each of the plurality of different two-dimensional patterns to the object to be measured as polarized irradiation light having a different polarization angle. It is characterized by doing.

Further, in one embodiment of the three-dimensional shape measuring method according to the present invention, the image processing step calculates difference data of a plurality of images taken by each of the plurality of imaging means, and calculates the difference data based on the difference data. And generating a parallax image.

Further, in one embodiment of the three-dimensional shape measuring method of the present invention, the image processing step calculates addition data of a plurality of images taken by each of the plurality of image pickup means, and calculates the addition data based on the addition data. And generating a luminance image.

[0024]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of a three-dimensional shape measuring apparatus and a three-dimensional shape measuring method according to the present invention will be described below in detail with reference to the drawings.

[First Embodiment] FIG. 1 is a diagram for explaining the outline of the configuration according to an embodiment of the three-dimensional shape measuring apparatus of the present invention. The three-dimensional shape measuring apparatus irradiates the measurement target 10 with a plurality of different projection pattern lights coded with respect to intensity or wavelength, and each projection pattern image selected from the plurality of projection patterns in each of the plurality of cameras. Is what you get.

In the configuration shown in FIG. 1, a first light source 111 and a first light source 111 are provided on a measuring object 10 whose three-dimensional shape is to be measured.
The first projection pattern supplied from the projection units 1 and 110 is applied via the polarizing plate 112 and the first half mirror 131. The first projection pattern is, for example, as shown in FIG.
This is a stripe pattern shown in FIG. Further, a second projection pattern supplied from the projection units 2 and 120 is emitted through the second light source 121, the second polarizing plate 122, and the first half mirror 131. The second projection pattern is, for example, a uniform pattern (no pattern) shown in FIG.

As a first embodiment, a configuration example will be described in which a first projection pattern is a stripe pattern, and a second projection pattern is a uniform irradiation light having no pattern. As a second embodiment, a description will be given of an example in which a stripe pattern A is used as a first projection pattern and a different stripe pattern B is used as a second projection pattern.

In the configuration shown in FIG. 1, the first projection pattern supplied from the projection units 1 and 110 via the first light source 111, the first polarizing plate 112, and the first half mirror 131 is irradiated, The second projection pattern supplied from the projection units 2 and 120 is emitted via the two light sources 121, the second polarizing plate 122, and the first half mirror 131.

The first half mirror 131 is provided for the first light source 1.
11, reflected light of the first projection pattern radiated through the first polarizing plate 112, and transmitted light of the second projection pattern radiated through the second light source 121 and the second polarizing plate 122 Are provided so as to overlap the same optical axis.

A first polarizing plate 112 provided on a projection optical path for irradiating a first projection pattern, and a second polarizing plate 12 provided on a projection optical path for irradiating a second projection pattern
The angle of polarization is different from that of 2. For example, the first polarizing plate 112
And the second polarizing plate 122 output polarized component light that differs by 90 degrees. The first projection pattern is a polarization pattern composed of a polarization component of the first
0, and the second projected pattern is the second polarizing plate 1
The object to be measured 10 is radiated as a polarization pattern composed of a polarization component by 22.

An image of the measurement object 10 irradiated with a plurality of different polarization projection patterns is obtained by two cameras 151 and 16.
1 is taken.

The image of the measurement object 10 passes through the second half mirror 171 and passes through the third polarizing plate 152 to the first half mirror 171.
The first photographed image is photographed by the camera 151.
At the same time, the light is reflected by the second half mirror 171 and passes through the fourth polarizing plate 162 to the second camera 1.
The second photographed image is photographed by 61. The first captured image captured by the first camera 151 is output to and stored in the image processing unit 200 via the capturing units 1 and 150, and the second captured image captured by the second camera 161 is Are output to and stored in the image processing unit 200 via the imaging units 2 and 160.

The second half mirror 171 is provided so that the first camera 151 for photographing the first photographed image and the second camera 161 for photographing the second photographed image are overlapped on the same optical axis. .

First camera 15 for photographing a first photographed image
The third polarizing plate 152 provided on the first imaging optical path and the fourth polarizing plate 162 provided on the imaging optical path of the second camera 161 that captures the second captured image have an angle of polarization. different.

The third polarizing plate 152 is connected to the first light source 11
1. Pass the polarized component image of the first projection pattern irradiated through the first polarizing plate 112, and do not pass the polarized component image of the second projection pattern. Therefore, the first camera 151 captures the first projection pattern irradiation image. Specifically, for example, the first projection pattern is shown in FIG.
In the case of a stripe pattern as shown in FIG. 2A and the object to be measured is an object as shown in FIG.
The image captured by the first camera 151 is the image shown in FIG.

On the other hand, the fourth polarizing plate 162 allows the polarization component image of the second projection pattern radiated through the second light source 121 and the second polarizing plate 122 to pass therethrough, and Do not pass the polarization component image. Therefore, the second camera 161 captures the second projection pattern irradiation image. Specifically, for example, the second projection pattern is a pattern as shown in FIG. 2B (no pattern)
In the case where the measurement target is an object shown in FIG. 2C, the image captured by the second camera 161 is the image shown in FIG.

The first projection pattern images captured by the first camera 151 are
The second projection pattern image output and stored in the image processing unit 200 via the image capturing unit 0 is output and stored in the image processing unit 200 via the capturing units 2 and 160. You. Based on these images, the image processing unit 200 does not perform measurement processing of the shape of the measurement target, and a three-dimensional image based on the measured shape data is displayed on the display unit 300.

FIG. 3 is a block diagram illustrating the configuration of the image processing section 200. The image processing unit 200 includes a first projection pattern memory 20 for storing first projection pattern information.
1. It has a second projection pattern memory 202 for storing second projection pattern information. The first projection pattern memory 201 stores, for example, the stripe pattern data shown in FIG. 2A, and supplies the first pattern data to the projection units 1 and 101. 2B is stored in the second projection pattern memory 202, and the second pattern data is supplied to the projection units 2 and 120, for example.

The first projection pattern image captured by the first camera 151 is stored in the first image memory 203 of the image processing unit 200 via the capturing units 1 and 150. Further, the second projection pattern image captured by the second camera 161 is stored in the second image memory 204 of the image processing unit 200 via the capturing units 2 and 160.

Specifically, for example, the first projection pattern is a stripe pattern as shown in FIG.
When the measurement object is an object as shown in FIG. 2C, the first camera 151 takes an image and the first image memory 20
The image stored in No. 3 is the image shown in FIG. When the second projection pattern is a pattern as shown in FIG. 2B (no pattern), the image captured by the second camera 161 and stored in the second image memory 204 is The image shown in FIG.

The captured image processing unit 205 compares the images stored in these two image memories 203 and 204,
A luminance image having reflectance information of the measurement object and a parallax pattern image as a difference image from which the reflectance information has been removed are generated.

Image processing in the case where the first projection pattern is a stripe pattern as shown in FIG. 2A and the second projection pattern is a pattern as shown in FIG. 2B (no pattern). The processing in the unit 205 will be described according to the flow of FIG.

The captured image processing unit 205 inputs the image data stored in the two image memories 203 and 204, and calculates the difference between the corresponding pixel values (S101). This difference calculation process is executed for all pixels (Yes in S102).
Then, the difference image data is output to the parallax pattern image memory 206 as a parallax image.

FIG. 5 shows an example of a parallax pattern image generated based on the difference between two pattern images in the captured image processing unit 205. In the parallax pattern image of FIG. 5, a stripe pattern shown in FIG. 2A as a first projection pattern and a pattern (no pattern) as shown in FIG. 2) are illuminated as different polarized light components, and an image shown in FIG. 2 (d) and an image shown in FIG. 2 (e) are taken by two cameras, and the difference between these image data is obtained. Is a parallax image generated by.

As shown in FIG. 5, by taking the difference between the two image pickup patterns, it is possible to cancel the influence of the object reflectance. In the example of FIG. 2C, the measurement object has the coloring region 11 or the constituent 12 having different reflectances. From the image of FIG. 2D which is a captured image of the first projection pattern, By taking a difference between the pixels of the image of FIG. 2E, which is a captured image of the second projection pattern, it is possible to remove the influence of the colored region 11 or the component 12. As a result, a pure parallax image can be generated as shown in FIG.

The shape calculation processing unit 207 calculates the shape of the object to be measured based on the parallax pattern image stored in the parallax pattern image memory 206.

The shape calculation processing executed in the shape calculation processing unit 207 will be described with reference to FIG. The shape calculation processing unit 207 extracts a stripe pattern from the parallax pattern image, detects color and luminance information in each stripe, and stores the detected information in the projection pattern memory 2.
01 and the slit angle θ from the projector in comparison with the color and luminance of the stripe pattern in the projection pattern stored in
Is calculated. As shown in FIG. 6, a slit angle θ of each stripe, an x coordinate on an image captured on an image plane of a camera, a focal length F which is a camera parameter, and a base length (distance) L
Then, the distance Z to the measurement point A is calculated by the following equation (1).

[0048]

Z = (F × L) / (x + F × tan θ) (1)

Based on the above equation, distance data of the object to be measured, that is, shape data is calculated, and a distance image as the calculated shape data is stored in the shape data memory 208.

The irradiation image without a pattern is stored in the luminance image memory 209. In this case, the image in the second image memory 204 can be used as it is as a luminance image.

The distance image generated by the shape calculation processing unit 207 and stored in the shape data memory 208 is integrated with the integrated processing unit 2.
In step 10, a three-dimensional image is generated by forming a polygon, texture-mapping the luminance image stored in the luminance image memory 209, and outputting the three-dimensional image to the display unit 300 to display the three-dimensional shape of the measurement target.

FIG. 7 shows an example of (a) a luminance image and (b) a distance image when a person is imaged. This distance image is
The distance from the light receiving portion of the camera to each point of the object is defined as each pixel value and is arranged two-dimensionally. As a method of displaying these on the screen, for example, the brightness can be expressed by the magnitude of the brightness, and the brightness may be increased in the area on the near side of the paper and decreased in the depth direction of the paper.

In the integration processing unit 210, polygonization is performed based on the distance image as shown in FIG. 7B, and the generated polygon data is texture-mapped with the luminance image stored in the luminance image memory 209. The three-dimensional data is generated and output to the display output unit.

As described above, according to the three-dimensional shape measuring apparatus of the present invention, it is possible to obtain accurate distance information based on data captured by two cameras at the same time. Time can be reduced. Further, since special equipment for removing the difference in the reflectance of the measurement object is not required, the cost can be reduced.

[Embodiment 2] Next, as a second embodiment,
An example in which a stripe pattern A is used as one projection pattern and a different stripe pattern B is used as a second projection pattern will be described.

FIG. 8 shows an example of two different projection patterns, an object to be measured, and two photographed images. The two different projection patterns applied to the measurement object are, for example, a stripe pattern shown in FIG. 8A and a stripe pattern shown in FIG. Numerical values above the patterns are codes assigned to each pattern, and show examples using eight different codes. The codes may be assigned different codes, for example with different brightness, or different colors may be assigned as different codes.

Each of the stripe pattern shown in FIG. 8A and the stripe pattern shown in FIG. 8B has the same sum of all the patterns. Here, the sum of the code values is all “9”. It is made to become. This is because the generation of the luminance image is easily obtained by the addition processing of the two pattern photographed images. This processing will be described later.

In the configuration similar to that of FIG. 1 described in the first embodiment, FIG. 8 is supplied from the projection units 1 and 110 via the first light source 111, the first polarizing plate 112, and the first half mirror 131. The first projection pattern shown in (a) is irradiated,
A second projection pattern shown in FIG. 8B supplied from the projection units 2 and 120 is emitted through the second light source 121, the second polarizing plate 122, and the first half mirror 131.

The image of the measuring object 10 passes through the second half mirror 171 and passes through the third polarizer 152 to the first half mirror 171.
The first photographed image is photographed by the camera 151.
At the same time, the light is reflected by the second half mirror 171 and passes through the fourth polarizing plate 162 to the second camera 1.
The second photographed image is photographed by 61. When the measurement target is an object as illustrated in FIG. 8C, the image captured by the first camera 151 is an image illustrated in FIG. 8D. The image captured by the second camera 161 is the image shown in FIG.

The two image memories 20 of the image processing section 200
The image data shown in FIGS. 8D and 8E is stored in each of 3 and 204. The captured image processing unit 205 compares the images stored in the two image memories 203 and 204, and compares the image with the luminance image having the reflectance information of the measurement target object and the parallax pattern as the difference image from which the reflectance information has been removed. Generate an image.

The processing in the picked-up image processing unit 205 will be described with reference to the flow of FIG. FIG. 9 shows (a) a generation processing flow of a difference image (parallax image) and (b) a generation processing flow of a sum image (luminance image).

First, (a) a process of generating a difference image (parallax image) will be described. The captured image processing unit 205 inputs the image data stored in the two image memories 203 and 204, calculates the difference between the corresponding pixel values in step S201, and further includes, in step S202, a code having two pattern data in advance. The total value (here, 9) is added, and a process of dividing by 2 is executed in step S203, and these processes are executed for all pixels (S20).
4 until the answer is Yes). As a result, FIG.
Is generated.

Here, the process of subtracting the code of the image of FIG. 8D from the image of FIG. 8E will be described. For example,
The reflectance differs depending on the colored region 11 or the component 12 as shown in FIG. 8C, and when the pattern of the code in these regions is irradiated, the colored region 11: + α, the component 12: Suppose that the effect of + β is caused.

In this case, in the image of FIG. 8D obtained as a photographed image of the irradiation image of the first projection pattern of FIG. However, the code 2 + α is obtained in the colored region 11. In the second area from the left, data of code 4 is originally obtained.
In the area of, the code 4 + β is obtained. In the image of FIG. 8E acquired as a captured image of the irradiation image of the second projection pattern of FIG. 8B, the data of the code 7 is originally obtained in the third region from the right. In the area of the colored area 11, code 7 + α is obtained. In the second area from the left, data of code 5 is originally obtained, but in the area of the component 12, code 5 + β is obtained.

As described above, each of the images shown in FIGS. 8D and 8E is an image affected by the colored region 11 or the component 12.

First, a difference is calculated from these two images.
FIG. 10A shows an example of calculation processing for the third pattern from the right. In a portion other than the colored region 11 below the measurement object, “7-2” is calculated, and
In the colored region 11 above the measurement object, “(7+
α) − (2 + α) ”is calculated. Further, a process of adding the total code values (here, 9) of the two pattern data and dividing this value by 2 is executed. As a result, “7−2 + 9 = 7” is calculated for the portion other than the lower colored region 11 of the third pattern from the right, and “｛(7 + α)” is calculated for the upper colored region 11 of the measurement target. )-
(2 + α) + 9 ° / 2 = 7 ”is calculated. As a result, the influence of the colored area is canceled.

This is the same for the component 12.
The effect value: β on the code of the constituent 12 is canceled. As a result, the influence of the coloring region 11 or the constituent 12 is removed, and a pure parallax image as shown in FIG. 10A is generated.

On the other hand, the generation of the luminance image is executed by the processing of generating a sum image (luminance image) shown in FIG. First,
The captured image processing unit 205 includes two image memories 203 and 2
04, the image data stored in step S30 is input.
In step 1, the sum of the corresponding pixel values is calculated, and in step S302, a process of dividing by 2 is performed, and if necessary, uniform brightness adjustment is performed on the entire image. Execute these processes for all pixels (Yes in S303)
Until it becomes). As a result, luminance image data shown in FIG. 10B is generated.

FIG. 10B shows an example of calculation processing for the third pattern from the right. In the portion other than the colored region 11 below the measurement object, “(7 + 2) / 2
= 4.5 ”, and in the colored region 11 above the measurement object,“ {(7 + α) + (2 + α)} =
α + 4.5 ”is calculated. 4.5 is a uniform code value in all areas, and if this code value is unnecessary as luminance data, uniform luminance adjustment is performed on the entire image in order to cancel 4.5. The brightness adjustment can be omitted by setting a pattern as a value that does not need to be adjusted in advance.

As described above, the captured image processing unit 205 generates a parallax image and a luminance image, and stores them in the parallax pattern image memory 206 and the luminance image memory 209, respectively. The shape calculation processing unit 207 performs a shape calculation of the measurement target based on the parallax pattern image stored in the parallax pattern image memory 206 to generate a distance image. The shape calculation is realized by the distance (shape) calculation theory of FIG. 6 described in the first embodiment.

The distance image generated by the shape calculation processing unit 207 and stored in the shape data memory 208 is integrated with the integrated processing unit 2.
In step 10, a three-dimensional image is generated by forming a polygon, texture-mapping the luminance image stored in the luminance image memory 209, and outputting the three-dimensional image to the display unit 300 to display the three-dimensional shape of the measurement target.

As described above, according to the three-dimensional shape measuring apparatus of the present invention, it is possible to obtain accurate distance information based on data captured simultaneously by two cameras, and it is possible to obtain more accurate distance information than a conventional measuring method. Time can be reduced. Further, since special equipment for removing the difference in the reflectance of the measurement object is not required, the cost can be reduced.

[Other Embodiments] In the above embodiment,
As described with reference to FIG. 1, two polarizers that output polarized light of different angles are used for projecting two different patterns, and two polarizers that transmit polarized light of different angles also to the photographing unit. An example of the configuration using the above is shown. In addition, some configuration examples are applicable, and a typical configuration example thereof will be described with reference to FIG.

FIGS. 11 (a) and 11 (b) show a configuration for realizing a plurality of different pattern irradiations, and FIGS.
The configuration of a photographing means for selectively photographing each pattern image is shown.

(A) shows a multiple pattern irradiation configuration using a polarized light source and a half mirror configuration. Polarized light source 511,
Numerals 512 denote light sources that output polarized light having different angles, and irradiate different patterns to the object to be measured from these light sources. The patterns from the polarized light sources 511 and 512 are provided on the half mirror 513 so that the reflected light of the polarized light source 511 and the transmitted light of the polarized light source 512 overlap on the same optical axis.

(B) shows a configuration in which a light source, a polarizing filter, and a half mirror are provided. Pattern light is emitted from the light source 521, and different pattern light is emitted from the light source 522. Each pattern light is supplied to a polarizing filter 524,5.
25 allows the half mirror 52 to be polarized at a specific angle.
3 or reflected by a half mirror to irradiate the object to be measured.

(C) shows a configuration for photographing an object to be measured irradiated with different pattern lights, in which a polarizing beam splitter 533 is provided in front of cameras 531 and 532 for selectively photographing different pattern images. is there. The plurality of patterns can be obtained from the embodiment described above or from FIG.
The object to be measured is irradiated as a pattern light composed of different polarization components by the configuration as shown in (b), and these pattern lights are separated by the polarization beam splitter 533, pass through one side, and reflect the other side, and are separated by different cameras. Each pattern image is photographed.

(D) is a photographing configuration of an object to be measured provided with a camera, a polarizing filter, and a half mirror. Cameras 541 and 541 selectively photograph different pattern images.
Polarizing filters 544 and 545 are provided in front of 542, and a pattern image that has passed through the polarizing filters 544 and 545 from the reflected light and transmitted light of the half mirror 543 is captured. The plurality of patterns are the same as in the above-described embodiment or FIG.
(A) and (b) are irradiated on the measurement object as pattern light composed of different polarization components depending on the configuration,
The polarizing filters 544 and 545 are configured to pass different pattern light components of these pattern lights, respectively. As described above, various modes can be applied to different pattern light irradiation configurations and imaging configurations.

In the above-described embodiments, the canceling effect such as the pattern of the object to be measured and the difference in the reflectance has been mainly described. However, the structure of the present invention is such that the parallax image is generated by one photographing. Therefore, for example, even when the measurement target is a moving subject, accurate distance information can be obtained based on a plurality of images obtained at one shooting timing without being affected by movement. This has the effect. Even if the measuring device is moving, good measurement can be performed for the same reason. Further, even if the illumination or projection light changes with time, the effect of the change can be eliminated and high-precision measurement can be performed.

The present invention has been described in detail with reference to the specific embodiments. However, it is obvious that those skilled in the art can modify or substitute the embodiment without departing from the spirit of the present invention. That is, the present invention has been disclosed by way of example, and should not be construed as limiting. In order to determine the gist of the present invention, the claims described at the beginning should be considered.

[0081]

As described above, according to the three-dimensional shape measuring apparatus and the three-dimensional shape measuring method of the present invention, the influence of the difference in the reflectance of the object to be measured, the pattern, etc. can be obtained by one projection / imaging. Since the shape can be canceled and the shape can be measured, it is possible to measure well even if the subject has a complicated pattern, is a moving subject, or the measuring device is moving. Also,
Even if the illumination or projection light changes with time, the influence of the change can be canceled, and efficient and highly accurate shape measurement can be performed.

[Brief description of the drawings]

FIG. 1 is a block diagram illustrating a schematic configuration of a three-dimensional shape measuring apparatus according to the present invention.

FIG. 2 is a diagram illustrating an irradiation pattern, an example of an object to be measured, and an example of a captured image applied by the three-dimensional image shape measuring apparatus of the present invention.

FIG. 3 is a block diagram illustrating a configuration of an image processing unit of the three-dimensional shape measuring apparatus according to the present invention.

FIG. 4 is a diagram illustrating a parallax image generation processing flow in a captured image processing unit of the three-dimensional shape measurement apparatus of the present invention.

FIG. 5 is a diagram illustrating an example of a parallax image generated in a captured image processing unit of the three-dimensional shape measurement device of the present invention.

FIG. 6 is a diagram showing a distance calculation method by a space coding method applicable to the three-dimensional shape measuring apparatus of the present invention.

FIG. 7 is a diagram showing an example of a luminance image and a distance image generated by the three-dimensional shape measuring apparatus of the present invention.

FIG. 8 is a diagram illustrating an irradiation pattern, an example of a measurement target object, and an example of a captured image applied by the three-dimensional image shape measuring apparatus of the present invention.

FIG. 9 is a diagram illustrating a parallax image generation processing flow and a luminance image generation processing flow in a captured image processing unit of the three-dimensional shape measurement apparatus of the present invention.

FIG. 10 is a diagram illustrating an example of a parallax image and a luminance image generated in a captured image processing unit of the three-dimensional shape measurement device of the present invention.

FIG. 11 is a diagram showing an example of a pattern projection configuration and a pattern imaging configuration of the three-dimensional shape measuring apparatus of the present invention.

[Explanation of symbols]

 Reference Signs List 10 Measurement target 110, 120 Projecting unit 111, 121 Light source 112, 122 Polarizing plate 131 Half mirror 150, 160 Image capturing unit 151, 161 Camera 152, 162 Polarizing plate 171 Half mirror 200 Image processing unit 300 Display unit 201, 202 Projection Pattern memory 203, 204 Image memory 205 Captured image processing unit 206 Parallax pattern image memory 207 Shape calculation processing unit 208 Shape data memory 209 Luminance image memory 210 Integration processing unit 511, 512 Polarized light source 513 Half mirror 521, 522 Light source 523 Half mirror 524 , 525 Polarizing filter 531, 532 Camera 533 Half mirror 541, 542 Camera 543 Half mirror 544, 545 Polarizing filter

Continuation of the front page F term (reference) 2F065 AA06 AA53 BB05 CC16 DD06 EE04 FF08 FF09 FF42 FF49 HH06 HH07 JJ03 JJ05 LL00 LL28 LL33 LL41 QQ03 QQ24 QQ25 QQ27 SS02 SS13 5B057 BA02 DB15 CB08 DB16

Claims (14)

[Claims] 1. A three-dimensional shape measuring apparatus for acquiring distance information of a measurement target based on a pattern image obtained by projecting a two-dimensional pattern onto the measurement target, wherein a plurality of irradiation lights including at least one two-dimensional pattern are provided. Light projection means for irradiating the measurement target with polarized light having different polarization angles, and imaging means for capturing an image of the measurement target irradiated with the plurality of irradiation lights, each of the polarized light An imaging unit that selectively captures images to obtain a plurality of captured images, an image that generates a parallax image based on the plurality of images captured by the imaging unit, and obtains distance information of the measurement target based on the parallax images. A three-dimensional shape measuring apparatus, comprising: processing means. 2. The apparatus according to claim 1, wherein the light projecting means irradiates the object to be measured with one two-dimensional pattern and uniform irradiation light having no pattern as polarized irradiation light having different polarization angles. The three-dimensional shape measuring apparatus according to claim 1. 3. The apparatus according to claim 1, wherein said light projecting means irradiates each of a plurality of different two-dimensional patterns onto a measurement object as polarized light having different polarization angles. 3D shape measuring device. 4. The image processing means is configured to calculate difference data of a plurality of images taken by each of the plurality of imaging means, and generate a parallax image based on the difference data. The three-dimensional shape measuring device according to claim 1. 5. The image processing means is configured to calculate addition data of a plurality of images taken by each of the plurality of imaging means, and to generate a luminance image based on the addition data. The three-dimensional shape measuring device according to claim 1. 6. A light-emitting device according to claim 1, wherein said light projecting means has a plurality of light sources and a plurality of polarization filters set corresponding to said plurality of light sources, each of which outputs output light having a different polarization angle. The method according to any one of claims 1 to 5, wherein
Dimensional shape measuring device. 7. The three-dimensional shape measurement according to claim 1, wherein said light projecting means has a plurality of polarized light sources each of which outputs output light having a different polarization angle. apparatus. 8. The image pickup device according to claim 1, wherein the image pickup device has a plurality of photographing devices, and a plurality of polarizing filters set corresponding to the plurality of photographing devices, each of which transmits light having a different polarization angle. The three-dimensional shape measuring apparatus according to any one of claims 1 to 7, wherein: 9. The three-dimensional shape according to claim 1, wherein said image pickup means has a plurality of image pickup means and a beam splitter for separating light having different polarization angles. Measuring device. 10. A three-dimensional shape measurement method for acquiring distance information of a measurement target based on a pattern image obtained by projecting a two-dimensional pattern onto the measurement target, wherein a plurality of irradiation lights including at least one two-dimensional pattern are provided. A pattern projection step of irradiating the measurement target as polarized irradiation light each having a different polarization angle, and an imaging step of capturing an image of the measurement target irradiated with the plurality of irradiation lights, An imaging step of selectively imaging each to obtain a plurality of captured images; generating a parallax image based on the plurality of images captured in the imaging step; and obtaining distance information of the measurement target based on the parallax images. An image processing step, comprising the steps of: 11. The pattern projecting step includes:
The three-dimensional shape measurement method according to claim 10, wherein the three-dimensional shape and the uniform irradiation light having no pattern are each irradiated on the measurement target as polarized irradiation light having a different polarization angle. 12. The three-dimensional pattern according to claim 10, wherein the pattern projecting step irradiates each of the plurality of different two-dimensional patterns as polarized light having different polarization angles to the object to be measured. Shape measurement method. 13. The method according to claim 10, wherein the image processing step calculates difference data of a plurality of images taken by each of the plurality of imaging means, and generates a parallax image based on the difference data. 13. The three-dimensional shape measurement method according to any one of claims 12 to 12. 14. An image processing method according to claim 10, wherein said image processing step calculates sum data of a plurality of images taken by each of said plurality of image pickup means, and generates a luminance image based on said sum data. 14. The method for measuring a three-dimensional shape according to any one of claims 13 to 13.