JP2014119435A - Probe pin unit and IC socket - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a probe pin unit that determines a buckling direction of a compression coil spring with respect to a second plunger and a buckling angle thereof, makes contact pressures of a contact part of the second plunger and a contact part of the compression coil spring smaller than a conventional example, secures a smooth and sure operation of the probe pin, and can improve durability of the probe pin.SOLUTION: Supposing that a virtual plane orthogonal to a central axis 44 of a compression coil spring 18 is viewed in a plain view, when a lower end of a coil 43 is ridden on a second plunger 20, at a second quadrant, a tip 43a of the coil hits a side surface 40a of a protrusion 40 of the second plunger and an end surface 38 of the second plunger, and thus, the compression coil spring 18 is positioned, and at a first quadrant, an outside surface of the coil abuts against a tip surface 40b of the protrusion. A gap of an angle θ is provided so that the outside surface of the coil does not abut against the tip surface thereof within a range from a third quadrant to a fourth quadrant, and thereby the buckling direction and the buckling angle (θ) are determined.

Description

The present invention relates to a probe pin unit containing a probe pin used for an electrical test of an IC package, and an IC socket provided with the probe pin unit.

Conventionally, an IC socket used to conduct an electrical test of an IC package is to press a terminal of the IC package against one end side of a plurality of probe pins accommodated in the socket body,
The IC package and an external electrical test circuit are electrically connected via probe pins.

FIG. 13 shows a probe pin 101 used for such an IC socket 100. A probe pin 101 shown in FIG. 13 includes a bottomed cylindrical body 102 formed of a conductive metal member, and a compression coil spring formed of a conductive metal member housed in the bottomed cylindrical body 102. 103, and a plunger 104 that is slidably accommodated in the bottomed cylindrical body 102 and is constantly urged outward by the compression coil spring 103. I have.

In the probe pin 101 shown in FIG. 13, the plunger 104 has a small-diameter portion 108 formed integrally with one end of the large-diameter portion 105, and the small-diameter portion 108 is outward from the opening 106 of the bottomed cylindrical body 102. It is designed to protrude. Further, the plunger 104 has a large diameter portion 105.
An inclined surface 111 in which the surface on the other end side obliquely intersects the central axis 110 of the probe pin 101.
Since the inclined surface 111 is constantly pressed by the spring force of the compression coil spring 103, the outer peripheral surface of the large-diameter portion 105 is pressed against the inner surface of the bottomed cylindrical body 102 and one end of the large-diameter portion 105. Edge (stopper) of opening 106 whose side is reduced in diameter of bottomed cylindrical body 102
107 is pressed. A structure having the same structure as the probe pin 101 is disclosed in Patent Document 1.

As shown in FIG. 13, the probe pin 101 is accommodated in, for example, a socket body 112, the projection 113 of the bottomed cylindrical body 102 contacts the current-carrying electrode 115 of the substrate 114, and the small-diameter portion 108 of the plunger 104 When the terminal 117 of the IC package 116 is pressed against the tip, the plunger 104 presses and compresses the compression coil spring 103 and is pushed into the bottomed cylindrical body 102. At this time, the compression coil spring 103 is pressed and buckled by the plunger 104, and the tip end of the compression coil spring 103 presses the inclined surface 111 of the plunger 104, and the outer peripheral surface of the large-diameter portion 105 of the plunger 104 is covered with the bottomed cylindrical body 102. It is designed to be pressed against the inner surface. As a result, the terminal 117 of the IC package 116 and the energization electrode 115 (external electrical test circuit) of the substrate 114 are electrically connected via the plunger 104 and the bottomed cylindrical body 102.

Japanese Patent No. 3195295

However, in the conventional probe pin 101 shown in FIG. 13, when the plunger 104 is pushed into the bottomed cylindrical body 102, the plunger 104 slips at the contact portion with the compression coil spring 103, and the plunger 104 In order to move the plunger 104 until it comes into contact with the inner surface of the bottomed cylindrical body 102 and the plunger 104 is pressed against the inner surface of the bottomed cylindrical body 102 by the spring force of the compression coil spring 103, the inclination angle α of the inclined surface 111 is set. It is set to 10 ° to 30 °. In this conventional probe pin 101, the compression coil spring 103 is provided with a coil 11.
Only one side of the end portion 8 is pushed by the plunger 104 and is buckled in the bottomed cylindrical body 102. As a result, the conventional probe pin 101 shown in FIG. 13 has a large frictional force at the contact portion between the plunger 104 and the bottomed cylindrical body 102 and at the contact portion between the compression coil spring 103 and the bottomed cylindrical body 102. Too much, the friction caused by the friction of these contact parts,
This causes a problem that durability is lowered. In addition, when the buckling angle of the compression coil spring 103 becomes too large, the conventional probe pin 101 cannot slide in the contact portion between the buckled compression coil spring 103 and the bottomed cylindrical body 102 (stack). This causes a problem that the plunger 104 cannot be smoothly operated.

In order to solve such a problem, the buckling angle of the compression coil spring 103 is reduced, the contact pressure between the plunger 104 and the bottomed cylindrical body 102, and the compression coil spring 103 and the bottomed cylindrical body 102.
It is necessary to ensure that the plunger 104 and the bottomed cylindrical body 102 are in contact with each other in a state where the contact pressure with the bottom is kept as small as possible.

However, since the conventional probe pin 101 shown in FIG. 13 has no means (positioning means) for determining the contact position between the end of the compression coil spring 103 and the inclined surface 111 of the plunger 104, the end of the compression coil spring 103 is used. And the contact position between the inclined surface 111 of the plunger 104 vary from product to product. As a result, it is assumed that the conventional probe pin 101 shown in FIG. 13 is a plan view of a virtual plane orthogonal to the central axis 110 of the compression coil spring 103. For example, FIG.
As shown in FIG. 15, the tip 118a of the coil 118 of the compression coil spring 103 is in the first quadrant, and the tip 118a of the coil 118 of the compression coil spring 103 is third as shown in FIG.
Comparing with the case in the quadrant (when the tip 118a of the coil 118 of the compression coil spring 103 is 180 ° different from the tip 118a of the coil 118 of the compression coil spring 103 in FIG. 14),
The initial contact position 120 of the plunger 104 and the compression coil spring 103 is different, and the amount (δ) of the compression coil spring 103 being compressed in the bottomed cylindrical body 102 is different (FIG. 16).
reference). 14 to 16 show a state in which the plunger 104 is simply put on the end of the compression coil spring 103 (only the weight of the plunger 104 is acting), and the compression coil spring 103 is not compressed. Indicates the state. In FIG. 16, the compression coil spring 103 indicated by a solid line corresponds to the compression coil spring 103 of FIG. 14, and the compression coil spring 103 indicated by a virtual line corresponds to the compression coil spring 103 of FIG. 15.

Further, in the conventional probe pin 101 shown in FIG. 13, the contact state between the compression coil spring 103 and the plunger 104 is set to the pushing amount of the plunger 104 (the amount by which the compression coil spring 103 is compressed) as shown in FIG. Will change accordingly.

That is, as shown in FIGS. 17A-1 and 17A-2, the conventional probe pin 101 has a plunger 104 and a compression coil spring in a state where the plunger 104 rides on the end of the compression coil spring 103 only with its own weight. 103 is in contact at one location S10. Next, FIG.
1, b-2), the plunger 104 and the compression coil spring 103 are in two locations S10, S in a state where the plunger 104 is pushed in a little to compress and compress the compression coil spring 103.
11 is in contact. Next, as shown in FIG. 17 (c-1, c-2), the plunger 104
Is further pushed (the plunger 104 is pushed further from the state shown in FIG. 17B-1) and the compression coil spring 103 is pushed and contracted.
3 is in contact at two locations S10 and S11, but the second contact location S11 in FIG. 17 (b-2) is moving so as to approach the first contact location S10 side. As a result, FIG.
1, c-2) is different from the buckling direction of the compression coil spring 103 of FIG. 17 (b-1, b-2). In addition, when the buckling direction of the compression coil spring 103 with respect to the plunger 104 is different, the contact state between the inclined surface 111 of the plunger 104 and the compression coil spring 103 is different, and the buckling angle is different.

Moreover, as the compression coil spring 103, for example, a closed end (non-ground) one is a ground angle at the end of the coil 118 (an angle formed between the outer surface of the coil 118 and the virtual horizontal plane H).
β is about 5 ° (see FIGS. 14 and 15). Therefore, the conventional probe pin 101 shown in FIG. 13 has a contact position 1 between the inclined surface 111 of the plunger 104 and the compression coil spring 103.
14 and FIG. 15 are compared, the angle θ formed between the end of the coil 118 of the compression coil spring 103 and the inclined surface 111 of the plunger 104 in the case of FIG.
Is α + β, and the angle θ between the end of the coil 118 of the compression coil spring 103 and the inclined surface 111 of the plunger 104 in the case of FIG. 15 is α−β, and the case of FIG.
The angle θ is larger than in the case of 5. As a result, the conventional probe pin 101 is, for example,
Contact position 1 between the inclined surface 111 of the plunger 104 and the compression coil spring 103 in FIG.
Even if the inclination angle α and angle θ of the inclined surface 111 of the plunger 104 are designed with reference to 20, the contact position 120 between the inclined surface 111 of the plunger 104 and the compression coil spring 103 in FIG. If changed, the angle θ formed between the end of the coil 118 of the compression coil spring 103 and the inclined surface 111 of the plunger 104 becomes too small, and the plunger 104
However, the end of the coil 118 of the compression coil spring 103 cannot slide, and the outer surface of the plunger 104 and the inner surface of the bottomed cylindrical body 102 may be poorly contacted. On the other hand, the conventional probe pin 101 is, for example, the inclined surface 1 of the plunger 104 in FIG.
11 and the inclined surface 11 of the plunger 104 with reference to the contact position 120 between the compression coil spring 103 and
Even when the inclination angle α and angle θ of 1 are designed, if the position changes to the contact position 120 between the inclined surface 111 of the plunger 104 and the compression coil spring 103 in FIG. The angle θ formed between the end of 118 and the inclined surface 111 of the plunger 104 becomes too large (the buckling angle of the compression coil spring 103 becomes too large), and the contact portion between the plunger 104 and the bottomed cylindrical body 102 And the compression coil spring 103 and the bottomed cylindrical body 1
The frictional force of the contact portion with 02 becomes excessively large, and abrasion occurs due to the friction of these contact portions, the durability is lowered, or the compression coil spring 103 is stuck at the contact portion with the inner surface of the bottomed cylindrical body 102. Cause problems. Since the buckling of the compression coil spring 103 is determined by the angle θ formed between the end of the coil 118 of the compression coil spring 103 and the inclined surface 111 of the plunger 104, the angle θ is referred to as a buckling angle.

Thus, it is difficult for the conventional probe pin 101 shown in FIG. 13 to design the buckling angle θ of the compression coil spring 103 to a desired angle, and the plunger 104 and the bottomed cylindrical body 10 are difficult to design.
It is difficult to design the contact pressure at the contact portion with 2 and the contact pressure at the contact portion between the compression coil spring 103 and the bottomed cylindrical body 102 within a desired numerical range.

Therefore, the present invention makes it possible to determine the buckling direction and the buckling angle of the compression coil spring with respect to the plunger, make the contact pressure of the contact portion of the plunger smaller than that of the conventional example, and An object of the present invention is to improve the durability of the probe pin while ensuring a smooth and reliable operation of the probe pin by making the contact pressure smaller than that of the conventional example.

As shown in FIGS. 1 to 12, the present invention provides (1). One end side contacts the terminal 24 of the IC package 23, and the other end side contacts the current-carrying electrode 35 of the substrate 34.
A probe pin 3 capable of energizing the terminal 24 and the energizing electrode 35 of the substrate 34; and (2). The present invention relates to a probe pin unit 1 including a probe pin housing 2 made of an insulating resin material in which a probe pin housing hole 4 for housing the probe pin 3 is formed.

In this invention,
(A). The probe pin 3 is
A first plunger 17 that contacts the terminal 24 of the IC package 23;
A second plunger 20 that contacts the energizing electrode 35 of the substrate 34;
The first plunger 17 is pressed against the terminal 24 of the IC package 23, and the second plunger 17
A compression coil spring 18 that presses the plunger 20 against the current-carrying electrode 35 of the substrate 34.

(B). The first plunger 17 is
The probe pin accommodation hole 4 is slidably accommodated in the probe pin accommodation hole 4 and the probe pin accommodation hole 4
A large-diameter portion 21 whose movement toward the terminal 24 side of the IC package 23 is restricted by a first retaining portion 26 formed on one end side of
It is formed on one end side of the large-diameter portion 21 so as to protrude outward from the probe pin receiving hole 4 through the opening on one end side of the probe pin receiving hole 4 so as to contact the terminal 24 of the IC package 23. A small-diameter portion 22 which is
A guide rod 28 formed on the other end side of the large-diameter portion 21 and penetrating the compression coil spring 18 along the central axis 16 of the probe pin receiving hole 4;
An end surface 27 formed on the other end side of the large diameter portion 21 and in contact with one end side of the compression coil spring 18.

(C). The second plunger 20 is
The probe pin accommodation hole 4 is slidably accommodated in the probe pin accommodation hole 4 and the probe pin accommodation hole 4
A large-diameter portion 32 in which movement of the substrate 34 to the energizing electrode 35 side is restricted by a second retaining portion 37 formed on the other end side of
Formed on the other end side of the large-diameter portion 32 and projecting outward from the probe pin receiving hole 4 from the opening on the other end side of the probe pin receiving hole 4 to the energizing electrode 35 of the substrate 34 A small-diameter portion 33 adapted to come into contact;
A guide hole 31 for slidably receiving the guide rod 28 of the first plunger 17;
An end surface 38 formed on one end side of the large diameter portion 32 and facing the other end side of the compression coil spring 18;
A projection 40 that is formed on one end side of the large-diameter portion 32 and protrudes inward of the probe pin accommodation hole 4 from the end surface 38.

(D). The compression coil spring 18 is
Assuming that a virtual plane orthogonal to the central axis 44 of the compression coil spring 18 is viewed in plan view,
In the process in which the first plunger 17 and the second plunger 20 are housed in the probe pin housing hole 4 in a state in which the compression coil spring 18 is compressed, the center axis 44 of the compression coil spring 18 is the center. In either the first quadrant or the second quadrant of the first quadrant to the fourth quadrant, the tip 43a of the coil 43 is connected to the side surface 40a of the projection 40 and the end surface 38.
The outer surface of the coil 43 abuts on the tip surface 40b of the projection 40 in one of the first quadrant and the second quadrant, and the first quadrant to the fourth quadrant In the third quadrant to the fourth quadrant, there is a state in which the outer surface of the coil 43 does not contact the end face 38,
At least after the first plunger 17 and the second plunger 20 are accommodated in the probe pin accommodation hole 4 in a state where the compression coil spring 18 is compressed, the central axis 44 of the compression coil spring 18 is centered. The first quadrant and the second quadrant of the first to fourth quadrants
In one of the quadrants, the tip 43a of the coil 43 is positioned against the side surface 40a and the end surface 38 of the projection 40, and in either one of the first quadrant or the second quadrant, The surface abuts on the tip surface 40b of the protrusion 40, and the first quadrant to the fourth quadrant.
Within the range of the third quadrant to the fourth quadrant of the quadrant, the outer surface of the coil 43 is the end face 38.
By abutting on
A buckling direction and a buckling angle inside the probe pin receiving hole 4 are determined.

In the present invention,
(E). When the compression coil spring 18 is buckled and abuts on the guide rod 28 of the first plunger 17, the guide rod 28 is moved in the guide hole 31 formed in the second plunger 20, and the guide The guide rod 28 is pressed against the inner surface of the hole 31.

The present invention makes it possible to determine the buckling direction and the buckling angle of the compression coil spring with respect to the second plunger, to make the contact pressure of the contact portion of the second plunger smaller than that of the conventional example, and to contact the compression coil spring. It is possible to improve the durability of the probe pin while ensuring a smooth and reliable operation of the probe pin by making the contact pressure of the portion smaller than that of the conventional example.

It is a partially expanded sectional view of the probe pin unit which expands and shows a part of probe pin unit which concerns on embodiment of this invention, and fractures | ruptures and shows a probe pin accommodating body. FIG. 2 is a partially enlarged cross-sectional view of the probe pin unit shown in the probe pin unit shown in FIG. It is a figure which shows the edge part shape of a 2nd plunger, FIG. 3 (a) is a top view of a 2nd plunger, FIG.3 (b) is an edge part side front view of a plunger. It is a figure which shows the state in which the other end part of the compression coil spring was put on the 2nd plunger, and Fig.5 (a) is a front view which shows the relationship between a 2nd plunger and the other end part of a compression coil spring, FIG. 5B is a plan view showing the relationship between the second plunger and the other end of the compression coil spring. 5A and 5B are diagrams illustrating an assembly process of the probe pin unit according to the embodiment of the present invention, in which FIG. 5A is a first assembly process of the probe pin unit, FIG. 5B is a second assembly process of the probe pin unit, and FIG. FIG. 5C is a diagram showing a third assembly process of the probe pin unit. FIG. 6A is a front view showing the relationship between the second plunger and the other end of the compression coil spring in the probe pin of FIG. FIG. 6B is a plan view showing the relationship between the second plunger and the other end of the compression coil spring in the probe pin of FIG. Fig.7 (a) is a figure which shows the state which the micro clearance gap produced between the front end surface of the processus | protrusion of a 2nd plunger, and the outer surface of the coil of a compression coil spring. FIG.7 (b) is a figure which shows the state which the micro clearance gap produced between the end surface of a 2nd plunger, and the front-end | tip of the coil of a compression coil spring. It is a figure which shows the 1st modification of the end surface side shape in a 2nd plunger, Fig.8 (a) is a top view of the end surface side shape in a 2nd plunger, FIG.8 (b) is the end surface side in a 2nd plunger. It is a front view of a shape, and FIG.8 (c) is a figure which shows the modification of the end surface side shape shown in FIG.8 (b). It is a figure which shows the 2nd modification of the end surface side shape in a 2nd plunger, FIG. 9 (a) is a top view of the end surface side shape in a 2nd plunger, FIG.9 (b) is the end surface side in a 2nd plunger. It is a front view of a shape, and FIG.9 (c) is a figure which shows the modification of the end surface side shape shown in FIG.9 (b). It is a figure which shows the 3rd modification of the end surface side shape in a 2nd plunger, Fig.10 (a) is a top view of the end surface side shape in a 2nd plunger, FIG.10 (b) is the end surface side in a 2nd plunger. It is a front view of a shape. It is a figure which shows the modification of the end surface side shape in a 1st plunger, Fig.11 (a) is a front view of the end surface side shape in a 1st plunger, FIG.11 (b) is the lower surface of the end surface side shape in a 1st plunger. FIG. FIG. 3 is a diagram showing an IC socket including a probe pin unit according to an embodiment of the present invention (a schematic cross-sectional view of the main part of the IC socket). It is a figure which shows the conventional probe pin (structure figure which fractures | ruptures and shows a bottomed cylindrical body). It is a figure which shows the 1st state of the plunger and compression coil spring in the conventional probe pin, FIG.14 (a) is a front view which shows the 1st state of a plunger and compression coil spring, FIG.14 (b) ) Is a plan view showing a first state of the plunger and the compression coil spring (however, the plan view showing the plunger in phantom lines). It is a figure which shows the 2nd state of the plunger and compression coil spring in the conventional probe pin, FIG.15 (a) is a front view which shows the 2nd state of a plunger and compression coil spring, FIG.15 (b) ) Is a plan view showing a second state of the plunger and the compression coil spring (however, the plan view showing the plunger in phantom lines). FIG. 14A is a diagram showing a first state of the plunger and the compression coil spring in FIG. 14A (shown by a solid line). FIG. 15A is a diagram showing a second state of the plunger and the compression coil spring in FIG. It is a figure which overlaps and shows the tip position of the coil of a compression coil spring so that it may correspond. It is a figure which shows the contact state of the plunger and compression coil spring in the conventional probe pin. FIG. 17A-1 is a front view showing a state in which the plunger is in contact with the compression coil spring only by its own weight. FIG. 17A-2 is a diagram illustrating a state in which the compression coil spring of FIG. 17A-1 is viewed in plan, and is a diagram illustrating a contact point with the plunger. FIG. 17 (b-1) is a front view showing a state where the plunger is pushed in and the compression coil spring is pushed and shrunk. Fig. 17 (b-2) is a diagram showing a state in plan view of the compression coil spring of Fig. 17 (b-1), and is a diagram showing a contact point with the plunger. FIG. 17 (c-1) is a front view showing a state where the plunger is further pushed in and the compression coil spring is further compressed. FIG. 17 (c-2) is a diagram illustrating a state in which the compression coil spring of FIG. 17 (c-1) is viewed in plan, and is a diagram illustrating a contact point with the plunger.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

(Structure of probe pin unit)
1 and 2 show a probe pin unit 1 according to the present embodiment. In addition,
FIG. 1 is a structural diagram of a probe pin unit 1 shown by cutting a probe pin housing 2.
FIG. 2 is a diagram showing the probe pin 3 of the probe pin unit 1 shown in FIG.

As shown in these drawings, the probe pin unit 1 includes a probe pin housing 2 made of an insulating resin material and a probe pin 3 housed in a probe pin housing hole 4 of the probe pin housing 2. Yes.

As shown in FIGS. 1 and 2, the probe pin container 2 has a first block 5 located on the lower side.
And a second block 6 disposed on the first block 5 in an overlapping manner. And
A probe pin accommodation hole 4 penetrating vertically through the first block 5 and the second block 6 is formed. The probe pin accommodation hole 4 on the first block 5 side has a first hole 8 that opens to the lower surface 7 of the first block 5, and a second hole that communicates with the first hole 8 and opens to the upper surface 10 of the first block 5. Hole 11
It consists of. Further, the probe pin accommodation hole 4 on the second block 6 side has a third hole 13 that opens to the lower surface 12 side of the second block 6 and communicates with the second hole 11 of the first block 5, and the third hole 13. And a fourth hole 15 that opens to the upper surface 14 of the second block 6. The first to fourth holes 8, 11, 13, 15 are round holes formed so as to be concentric with the central axis 16 of the probe pin accommodation hole 4. The second hole 11 of the first block 5 and the third hole 13 of the second block 6 are formed to have the same inner diameter. Further, the first hole 8 is formed with a smaller diameter than the second hole 11, and the fourth hole 15 is formed with a smaller diameter than the third hole 13.

As shown in FIGS. 1 and 2, the probe pin 3 includes a first plunger 17, a compression coil spring 18, and a second plunger 20.

As shown in FIGS. 1 and 2, the first plunger 17 is formed of a round bar-like conductive metal material, and has a large diameter portion 21 and a small diameter portion 22. In the first plunger 17, the large diameter portion 21 is slidably accommodated in the third hole 13 of the second block 6, and the small diameter portion 22 is opened to the fourth hole 15 of the second block 6 (on one end side). The second block 6 protrudes outward (upward) from the opening). Further, the tip of the small diameter portion 22 of the first plunger 17 is formed in a crown shape with a plurality of protrusions in order to make sure that it contacts the terminal 24 of the IC package 23 (see FIG. 12). The first plunger 17 has a flange-shaped flat surface 25 at one end (small-diameter portion 22 side end) of the large-diameter portion 21, and the flange-shaped flat surface 25 corresponds to the third hole 13 of the second block 6. By striking against the bottom surface (first retaining portion) 26, it is possible to prevent the probe pin housing hole 4 from slipping out. The first plunger 17 has a flat end surface 27 (an end surface 27 facing the compression coil spring 18) on the other end side of the large diameter portion 21, and a guide rod 28 is integrated with the center of the end surface 27. Is formed. This guide rod 28 is
It extends along the central axis 30 of the first plunger 17, passes through the compression coil spring 18 along the central axis 16 of the probe pin receiving hole 4, and can slide into a guide hole 31 of the second plunger 20 described later. Is to be housed. The end surface 27 of the first plunger 17 is placed on one end side (upper end side) of the compression coil spring 18 and functions as a seating surface of the compression coil spring 18.

As shown in FIGS. 1 and 2, the second plunger 20 is made of a round bar-like conductive metal material and has a large diameter portion 32 and a small diameter portion 33. In the second plunger 20, the large diameter portion 32 is slidably accommodated in the second hole 11 of the first block 5, and the small diameter portion 33 is the opening portion (the other end side) of the first hole 8 of the first block 5. Projecting outward (downward) from the first block 5. Further, the distal end side of the small diameter portion 33 of the second plunger 20 is connected to the substrate 26.
In order to ensure contact with the current-carrying electrode 27, it is formed in a tapered substantially truncated cone shape (FIG. 1).
2). The second plunger 20 has a flange-like flat surface 36 at the other end (the small-diameter portion 33 side end) of the large-diameter portion 32, and the flange-shaped flat surface 36 is the second hole 11 of the first block 5. Probe pin receiving hole 4 by abutting against the bottom surface (second retaining portion) 37 of
It is prevented from exiting. The second plunger 20 has an end face 38 of the large diameter portion 32.
A protrusion 40 is integrally formed on the end surface 38 on the side facing the compression coil spring 18. Further, the second plunger 20 is formed with a guide hole 31 penetrating from the end surface 38 of the large diameter portion 32 to the tip of the small diameter portion 33 along the central axis 41. A guide rod 28 of the first plunger 17 is slidably accommodated in the guide hole 31 of the second plunger 20.

As shown in FIGS. 2 and 3, the protrusion 40 extends from the end surface 38 to the central axis 4 of the second plunger 20.
1 is projected along the central axis 16 of the probe pin receiving hole 4 and the end surface 38 is viewed in plan (when viewed from the upper side in FIG. 2 toward the −Z axis direction), the X axis direction A chord 42 parallel to the center line C1 along the chord and positioned so as to bisect the radius of the large-diameter portion 32 of the second plunger 20 along the + Y-axis direction (the edge of the protrusion 40) 42 divides it from the end face 38. Further, when the compression coil spring 18 has a closed end (no grinding), the projection 40 has a tip (lower end) 43a of the coil 43 of the compression coil spring 18 that abuts against the side surface 40a of the projection 40 and the coil 43 of the compression coil spring 18. The end of the compression coil spring 18 is placed on the second plunger 20 so that the outer surface on the front end side contacts the end surface 38, and the central axis 41 of the second plunger 20 and the central axis 44 of the compression coil spring 18 are connected. When aligned so as to be concentric, the tip end surface 40b of the protrusion 40 is formed at a protruding height that abuts against the outer surface of the coil 43 of the compression coil spring 18 (see FIG. 4). The second plunger 20 and the compression coil spring 1 at this time
As shown in FIG. 4, the contact state 8 is a compression coil spring in the second quadrant centered on the central axis 44 assuming that a virtual plane orthogonal to the central axis 44 of the compression coil spring 18 is viewed in plan view. In the first quadrant centered on the central axis 44, the outer surface of the coil 43 of the compression coil spring 18 is the second surface of the tip 43 a of the 18 coil 43 in contact with the side surface 40 a and the end surface 38 of the projection 40 of the second plunger 20. The second plunger 20 and the compression coil spring 18 are not in contact with each other in the third and fourth quadrants, which are in contact with the distal end surface 40b of the protrusion 40 of the plunger 20 and have the center axis 44 as the center. In other words, in the third and fourth quadrants centered on the central axis 44, a gap is generated between the end surface 38 of the second plunger 20 and the outer surface of the coil 43 of the compression coil spring 18. Thereby, the buckling direction of the compression coil spring 18 with respect to the second plunger 20 is determined. Then, the compression coil spring 1 according to the gap of the angle θ between the end surface 38 of the second plunger 20 and the outer surface of the coil 43 of the compression coil spring 18.
A buckling angle of 8 is determined (see FIG. 4A). The buckling direction is the direction of the line segment Fa connecting the middle of the imaginary straight line connecting the contact points S1, S2 between the compression coil spring 18 and the second plunger 20 and the central axis 44 of the compression coil spring 18. (See Fig. 4 (b))
.

The compression coil spring 18 is formed of a conductive metal material in a right-handed manner, and a closed end (non-ground) type is used.

The compression coil spring 18 may be an open end (no grinding). However, in this case (when the compression coil spring 18 is open-ended (unground)), the height of the protrusion 40 of the second plunger 20 (height along the central axis 41 from the end surface 38) and the shape of the end surface 38 are It is necessary to determine according to the end shape of the compression coil spring 18.

The compression coil spring 18 may be a left-handed one. However, in this case (when the compression coil spring 18 is left-handed), the contact position between the tip 43a side of the coil 43 of the compression coil spring 18 and the second plunger 20 is in the first quadrant with the center axis 41 (44) as the center. It is. The contact position between the tip surface 40b of the protrusion 40 of the second plunger 20 and the outer surface of the coil 43 of the compression coil spring 18 is in the second quadrant centered on the central axis 41 (44).

(Assembly process of probe pin)
With reference to FIG. 5, an example of the assembly process of the probe pin unit 1 is shown.

First, as shown in FIG. 5A, the small diameter portion 33 of the second plunger 20 is inserted into the first hole 8 formed in the first block 5 of the probe pin housing 2, and the probe pin housing 2 is The large diameter portion 32 of the second plunger 20 is inserted into the second hole 11 formed in the first block 5.
At this time, the second plunger 20 is seated by its own weight on the bottom surface 37 of the second hole 11 whose large diameter portion 32 functions as a second retaining portion. Further, the small diameter portion 33 of the second plunger 20 protrudes from the lower surface 7 side of the first block 5 to the lower side (−Z direction) of the first block 5.

5A, the compression coil spring 18 is inserted into the second hole 11 formed in the first block 5, and the other end side (lower end side) of the compression coil spring 18 is the second plunger. 2
Put it on the top of 0. At this time, the compression coil spring 18 is connected to the tip 43a of the coil 43 on the other end side.
Is placed on the end surface 38 of the large-diameter portion 32 of the second plunger 20 and abuts against the side surface 40 a of the protrusion 40 of the second plunger 20. Accordingly, the compression coil spring 18 is positioned with respect to the second plunger 20 (see FIG. 4). Further, in the compression coil spring 18, the outer surface of the coil 43 is in contact with the tip surface 40b of the protrusion 40 (see FIG. 4).

Further, as shown in FIG. 5A, the large diameter portion 21 of the first plunger 17 is turned down, and the guide rod 28 of the first plunger 17 is inserted along the center of the compression coil spring 18, and the first plunger The 17 guide rods 28 are inserted into the guide holes 31 of the second plunger 20.
Then, the end surface 27 of the large diameter portion 21 of the first plunger 17 is seated on one end side (upper end side) of the compression coil spring 18.

Next, as shown in FIGS. 5B to 5C, the second block 6 is assembled from above the probe pin 3 accommodated in the first hole 8 and the second hole 11 of the first block 5. That is, FIG.
), The third hole 13 of the second block 6 so that the small diameter portion 22 of the first plunger 17 protrudes outward (upward) from the fourth hole 15 of the second block 6. The large diameter portion 21 of the first plunger 17 and the compression coil spring 18 are inserted into the first plunger 17. Then, the bottom surface (first retaining portion) 26 of the third hole 13 of the second block 6 is brought into contact with the flange-shaped flat surface 25 of the large-diameter portion 21 of the first plunger 17. Thereafter, as shown in FIG. 5C, the second block 6 is pushed down while compressing and compressing the compression coil spring 18 until the lower surface 12 thereof is in close contact with the upper surface 10 of the first block 5. It is fixed to the first block 5 by means (see FIGS. 1 and 2). In this way, the assembly work of the probe pin unit 1 is completed. In the probe pin unit 1, as shown in FIG. 12, the probe pins 3 are respectively accommodated in the probe pin accommodation holes 4 formed in the probe pin accommodation body 2.

As shown in FIG. 6, in the stage where the assembly work of the probe pin unit 1 is completed, the second
Assuming that the contact state between the plunger 20 and the compression coil spring 18 is a plan view of a virtual plane orthogonal to the center axis 44 of the compression coil spring 18, the compression coil spring 18 is in the second quadrant centered on the center axis 44. The tip 43a of the coil 43 on the other end side of the second plunger 2
The outer surface of the coil 43 of the compression coil spring 18 is in contact with the front end surface 40b of the projection 40 of the second plunger 20 in the first quadrant centering on the central axis 44. A range extending from the second quadrant to the fourth quadrant with the central axis 44 as the center (FIG. 6B
The outer surface of the coil 43 of the compression coil spring 18 is in linear contact with the end surface 38 of the second plunger 20 within the range indicated by the arc-shaped dotted line 45). As a result, the compression coil spring 18
The buckling angle of the second plunger 20 is limited to a predetermined angle (θ). And FIG.
As shown in FIG. 5C, the buckled compression coil spring 18 abuts on the guide rod 28 at a position away from the other end side toward the one end side, and the guide rod 28 is moved to the guide hole 31.
Within the gap between the guide rod 28 and the guide rod 28 (moving in a direction perpendicular to the central axis 16)
Then, the inner surface of the guide hole 31 of the second plunger 20 is pressed against the guide rod 28, and the first plunger 17 and the second plunger 20 are brought into contact with each other (see FIGS. 2 and 5C).

4A, due to manufacturing errors of the second plunger 17 and the compression coil spring 18, etc., as shown in FIG. 7A, the distal end surface 40b of the protrusion 40 of the second plunger 20 and the compression coil spring 18 are used. A minute gap δ1 is formed between the outer surface of the coil 43 and the end surface 38 of the second plunger 20 and the tip 4 of the coil 43 of the compression coil spring 18 as shown in FIG.
There may be a case where a minute gap δ2 is formed between 3a and 3a. However, in the assembly process of the probe pin unit 1 shown in FIGS. 5B to 5C, the compression coil spring 18 is compressed by the second block 6 and the first plunger 17, so that it is shown in FIG. Minute gap δ1,
Alternatively, the minute gap δ2 shown in FIG. 7B disappears and the state shown in FIG.

(Function and effect of probe pin unit)
As described above, the probe pin unit 1 according to the present embodiment can position the contact point (contact point) between the tip 43a of the coil 43 and the second plunger 20 on the other end side of the compression coil spring 18, and Since the buckling direction with respect to the second plunger 20 can be determined, the buckling angle of the compression coil spring 18 can be set to a predetermined angle (θ). Therefore, the probe pin unit 1 according to the present embodiment reduces the buckling angle of the compression coil spring 18 compared to the conventional example, and the guide rod 28 of the first plunger 17 and the guide hole 31 of the second plunger 20 are reduced. Even if the contact pressure with the inner surface and the contact pressure between the compression coil spring 18 and the guide rod 28 are reduced, the guide rod 28 of the first plunger 17 and the inner surface of the guide hole 31 of the second plunger 20 are reliably contacted. be able to.

As a result, the probe pin unit 1 according to the present embodiment can reduce wear at the contact portion between the first plunger 17 and the second plunger 20 (the contact portion between the guide rod 28 and the inner surface of the guide hole 31). 3 can be ensured for a long time, and the durability of the probe pin 3 can be improved.

In addition, since the probe pin unit 1 according to the present embodiment can reduce variations in the spring force with which the compression coil spring 18 biases the first plunger 17 and the second plunger 20 as compared with the conventional example, The contact pressure between the terminal 24 of the IC package 23 and the first plunger 17 can be made constant, and the contact pressure between the current-carrying electrode 35 of the substrate 34 and the second plunger 20 can be made constant. The test can be performed with high accuracy and stability.

(Modification of second plunger)
8 to 10 show modified examples of the shape of the second plunger 20 on the end face 38 side.

That is, as shown in FIGS. 8A to 8B and FIGS. 9A to 9B, the second plunger 20 has a portion of the end face 38 adjacent to the protrusion 40 as a string 42 of the protrusion 40. The contact area between the end face 38 and the compression coil spring 18 is narrowed so that the recess 46 is recessed in parallel to prevent the recess 46 from contacting the buckled compression coil spring 18 (see FIG. 6A). ). The probe pin 3 using the second plunger 20 according to this modified example is formed of the compression coil spring 18.
And the end surface 38 are limited to a part of the fourth quadrant and the third quadrant (see FIG. 6B).
. As shown in FIGS. 8C and 9C, the second plunger 20 has a front end surface 40b of the projection 40 cut out along the chord 42, and the front end surface 40b has a substantially linear micro tip. The end face 38 may be cut out along a chord 47 parallel to the chord 42, and the end face 38 may be a substantially linear minute end face.

Further, as shown in FIG. 10, the second plunger 20 has the coil 43 of the compression coil spring 18 buckled from the contact position between the tip 43 a of the coil 43 of the buckled compression coil spring 18 and the side surface 40 a of the protrusion 40. In the entire region (part of the first quadrant, part of the second quadrant, entire region of the third and fourth quadrants) up to the contact position between the outer surface and the tip surface 40b of the protrusion 40, the buckled compression coil spring 18 The outer surface of the coil 43 is supported by the end face 38 (see FIG. 6).
.

(Modification of the first plunger)
FIG. 11 is a view showing a modified example of the first plunger 17. As shown in FIG. 11, in the first plunger 17, the shape of the end surface 27 that becomes the seating surface of the compression coil spring 18 is a conical surface. The first plunger 17 has a guide rod 28 formed at the center of the end surface 27. The first plunger 17 according to such a modification can be used in place of the first plunger 17 of the above-described embodiment (see FIG. 2) in which the end surface 27 is a flat surface.

(IC socket with probe pin unit)
FIG. 12 shows an IC socket 4 incorporating the probe pin unit 1 according to this embodiment.
8 is shown.

As shown in FIG. 12, in the probe pin unit 1, a plurality of probe pin accommodation holes 4 are formed at a predetermined pitch in a probe pin accommodation body 2 formed of an insulating resin material, and the probe pins 3 are connected to each probe pin. Each can be accommodated in the accommodation hole 4. The probe pin 3 housed in the probe pin housing hole 4 of the probe pin housing body 2 has a small diameter portion 22 of the first plunger 17 from the fourth hole 15 of the probe pin housing hole 4 outward (upward). )
The small-diameter portion 33 of the second plunger 20 projects from the first hole 8 of the probe pin housing hole 4 outward (downward) of the probe pin housing 2.

As shown in FIG. 12, the IC socket 48 has the probe pin unit 1 accommodated in the probe pin unit accommodation portion 51 of the socket body 50. The probe pin 3 of the probe pin unit 1 accommodated in the IC socket 48 is connected to the second plunger 20.
The tip of the small-diameter portion 33 is pressed against the current-carrying electrode 35 on the substrate 34, and the terminal 24 of the IC package 23 is pressed against the tip of the small-diameter portion 22 of the first plunger 17 by the IC package pressing means 52. . At this time, the first plunger 17 of the probe pin 3 is I
The second plunger 20 is pushed by the C package 23 and pushed into the probe pin accommodation hole 4.
Is pushed by the substrate 34 and pushed into the probe pin accommodation hole 4, and the compression coil spring 18 is compressed in the probe pin accommodation hole 4. The inner surface of the guide hole 31 of the second plunger 20 is pressed against the outer surface of the guide rod 28 of the first plunger 17 by the spring force of the compression coil spring 18 buckled in the probe pin accommodation hole 4. ing. In such a state, in the IC socket 48, the terminal 24 of the IC package 23 and the current-carrying electrode 35 of the substrate 34 are electrically connected via the first plunger 17 and the second plunger 20 of the probe pin 3, and the IC socket 48 The electrical test of the package 23 can be performed reliably over a long period of time.

1 ... probe pin unit, 2 ... probe pin housing, 3 ... probe pin, 4 ...
... probe pin receiving hole, 16, 44 ... center axis, 17 ... first plunger, 21, 32 ...
... large diameter part, 22, 33 ... small diameter part, 23 ... IC package, 24 ... terminal, 26 ... bottom face (first retaining part), 27, 38 ... end face, 28 ... guide rod, ... ... guide holes, 3
4 ... Substrate, 35 ... Electrode for energization, 37 ... Bottom (second retaining part), 40 ... Projection, 4
0a: Side, 40b ... Tip, 43 ... Coil, 43a ... Tip, 48 ... IC socket, 50 ... Socket body, 52 ... IC package pressing means

Claims (2)

One end side contacts the terminal of the IC package, the other end side contacts the electrode for energization of the substrate, and a probe pin configured to energize the terminal of the IC package and the electrode for energization of the substrate,
A probe pin housing made of an insulating resin material in which a probe pin housing hole for housing the probe pin is formed;
In the probe pin unit with
(A). The probe pin is
A first plunger that contacts a terminal of the IC package;
A second plunger that contacts the energizing electrode of the substrate;
A compression coil spring that presses the first plunger against a terminal of the IC package and presses the second plunger against the energization electrode of the substrate;
(B). The first plunger is
A large-diameter portion that is slidably accommodated in the probe pin accommodation hole and is restricted from moving to the terminal side of the IC package by a first retaining portion formed on one end side of the probe pin accommodation hole;
A small diameter formed on one end side of the large diameter portion so as to protrude outward from the probe pin accommodation hole from the opening on one end side of the probe pin accommodation hole and to contact the terminal of the IC package. And
A guide rod formed on the other end side of the large-diameter portion and penetrating the compression coil spring along the central axis of the probe pin receiving hole;
An end surface that is formed on the other end side of the large-diameter portion and contacts one end side of the compression coil spring;
Have
(C). The second plunger is
A large-diameter portion that is slidably accommodated in the probe pin accommodation hole and is restricted from moving to the energization electrode side of the substrate by a second retaining portion formed on the other end side of the probe pin accommodation hole; ,
-It is formed on the other end side of the large-diameter portion, and protrudes outward from the probe pin accommodation hole from the opening on the other end side of the probe pin accommodation hole, so that it can come into contact with the energization electrode of the substrate. A small diameter part,
A guide hole for slidably receiving the guide rod of the first plunger;
An end surface formed on one end side of the large diameter portion and facing the other end side of the compression coil spring;
A projection formed on one end side of the large diameter portion and projecting inward of the probe pin receiving hole from the end surface;
(D). The compression coil spring is
When assuming that the virtual plane orthogonal to the central axis of the compression coil spring is viewed in plan,
In the process in which the first plunger and the second plunger are housed in the probe pin housing hole in a state where the compression coil spring is compressed, the first quadrant to the second quadrant centering on the central axis of the compression coil spring. In one of the four quadrants, one of the first quadrant and the second quadrant, the tip of the coil is positioned against the side surface of the protrusion and the end surface, and in either one of the first quadrant or the second quadrant The outer surface of the coil is in contact with the tip surface of the protrusion, and the outer surface of the coil is in contact with the end surface within the range of the third to fourth quadrants of the first to fourth quadrants. There is a state that does not
At least the first quadrant or the second plunger centered on the central axis of the compression coil spring after the first plunger and the second plunger are accommodated inside the probe pin accommodation hole in a state where the compression coil spring is compressed. Either the first quadrant or the second quadrant of the fourth quadrant,
The coil tip is positioned against the side surface and the end surface of the projection, and the outer surface of the coil is in contact with the tip surface of the projection in one of the first quadrant and the second quadrant, and
The outer surface of the coil is in contact with the end face within the range of the third quadrant to the fourth quadrant of the first quadrant to the fourth quadrant,
The buckling direction and the buckling angle inside the probe pin receiving hole are determined,
(E). When the compression coil spring is buckled and abuts against the guide rod of the first plunger, the guide rod is moved within the guide hole formed in the second plunger, and the guide rod is moved to the inner surface of the guide hole. Can be pressed,
A probe pin unit characterized by that. A socket body installed on the board;
The probe pin unit according to claim 1 accommodated in the socket body,
The terminal of the IC package is pressed against the first plunger of the probe pin housed in the probe pin housing hole of the probe pin unit, and the terminal of the IC package and the energizing electrode of the substrate are connected to the probe pin. IC package pressing means for enabling electrical connection via
An IC socket characterized by comprising:

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