JP2014004663A - Processing method for workpiece - Google Patents

Processing method for workpiece Download PDF

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JP2014004663A
JP2014004663A JP2012143018A JP2012143018A JP2014004663A JP 2014004663 A JP2014004663 A JP 2014004663A JP 2012143018 A JP2012143018 A JP 2012143018A JP 2012143018 A JP2012143018 A JP 2012143018A JP 2014004663 A JP2014004663 A JP 2014004663A
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holding
processing
workpiece
workpieces
holding table
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Yo Chin
曄 陳
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Disco Corp
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Disco Abrasive Systems Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a processing method capable of flattening a plurality of sheets of workpieces after grinding with high accuracy even if the sheets of workpieces are simultaneously ground or polished.SOLUTION: A processing method includes a holding step for holding a plurality of sheets of workpieces 1 having a smaller size than that of a holding surface 11 via a support member 4 covering a suction area of a holding table 10 in the holding table 10 sucking and holding the workpiece 1 and including the holding surface 11 having the whole surface on the same surface, and a processing step for arranging an outer peripheral edge 24b of a processing wheel 23 or an outer peripheral edge 35b of a polishing pad 35 to always pass a center portion 13 of the holding surface 11 of the holding table 10, making the outer peripheral edge 24b or the outer peripheral edge 35b abut on the plurality of sheets of workpieces 1 and executing processing for the workpieces 1. Accordingly, the lengths of processing points 5 in the workpieces 1 become substantially same. As a result, the workpieces 1 after the processing can be flattened with high accuracy.

Description

本発明は、被加工物を研削または研磨する加工方法に関する。   The present invention relates to a processing method for grinding or polishing a workpiece.

サファイアウェーハやSiCウェーハ等において、そのサイズが小さい(例えば、φ3インチ)場合、個々に研削や研磨等の加工を施していては加工時間がかかってしまい、生産効率が低くなる。そこで、製品の生産能率向上のため、サファイアウェーハやSicウェーハ等の被加工物を保持テーブルにおいて複数個保持し、一度の加工ステップで研削や研磨を施すことが行われている(例えば、下記の特許文献1を参照)。   In the case of a sapphire wafer, SiC wafer, or the like having a small size (for example, φ3 inches), if processing such as grinding or polishing is performed individually, processing time is required, resulting in low production efficiency. Therefore, in order to improve the production efficiency of products, a plurality of workpieces such as sapphire wafers and Sic wafers are held on a holding table, and grinding and polishing are performed in one processing step (for example, the following) (See Patent Document 1).

加工装置に備える保持テーブルとしては、例えば、図10に示す回転可能な保持テーブル40がある。この保持テーブル40の保持面41は、中心軸42が通る保持面41の中央部を頂点として半径方向外側に向けて降下する円錐面となっている。この保持テーブル40に保持された被加工物を研削加工する際は、加工手段50の下部に固着された砥石51の加工面が保持面41と平行となるように位置合わせしてから研削を実施する。また、被加工物を円錐形の保持テーブルに保持させて研磨加工を施す方法に関しては、下記の特許文献2に示すものがある。   An example of a holding table provided in the processing apparatus is a rotatable holding table 40 shown in FIG. The holding surface 41 of the holding table 40 is a conical surface that descends radially outward with the central portion of the holding surface 41 through which the central axis 42 passes as a vertex. When grinding the workpiece held on the holding table 40, grinding is performed after aligning the processing surface of the grindstone 51 fixed to the lower part of the processing means 50 so as to be parallel to the holding surface 41. To do. Further, regarding a method of polishing by holding a workpiece on a conical holding table, there is one shown in Patent Document 2 below.

特開2010−247311号公報Japanese Patent Application Laid-Open No. 2010-247311 特開2000−288881号公報JP 2000-288888 A

しかしながら、保持面が円錐面であると、保持面の半径部分のみにおいて研削砥石等の工具が被加工物に当接して加工が行われるため、被加工物に対して工具が当接する位置(以下、「加工点」という。)の軌跡は、被加工物の部位によってその長さが大きく異なってしまう。このように、加工点の長さが長い部分と短い部分とがあると、研削される度合いが異なるため、研削後の被加工物が平坦に仕上がらないという問題がある。   However, if the holding surface is a conical surface, a tool such as a grinding wheel is in contact with the workpiece only at the radius portion of the holding surface, and the machining is performed. The length of the trajectory of “working point”) varies greatly depending on the part of the workpiece. As described above, when there are a long portion and a short portion of the processing point, the degree of grinding is different, so that there is a problem that the workpiece after grinding is not finished flat.

本発明は、上記の事情にかんがみてなされたものであり、複数枚の被加工物を研削または研磨しても研削後の被加工物を高精度に平坦化することができる加工方法に発明の解決すべき課題がある。   The present invention has been made in view of the above circumstances, and the present invention is directed to a processing method capable of flattening a workpiece after grinding with high accuracy even if a plurality of workpieces are ground or polished. There are issues to be solved.

本発明は、被加工物を研削又は研磨する被加工物の加工方法であって、被加工物を吸引保持し全面が同一面上にある保持面と該保持面の中央で該保持面に直交した回転軸とを有する保持テーブルによって、該保持面のサイズより小さいサイズの被加工物を該保持テーブルの吸引領域を覆う支持部材を介して保持する保持ステップと、該保持ステップを実施した後、該保持面に対して平行な加工面と該加工面に直交した回転軸とを有する加工ホイールの外周縁が該保持テーブルの該保持面の中央を通過するように該加工ホイールの該加工面を該保持テーブルで保持された被加工物に当接させ、該保持テーブルと該加工ホイールとを回転させて複数の被加工物を該加工ホイールで研削または研磨する加工ステップと、を備え、該保持ステップでは、3以上の被加工物が正多角形中に隣接して配設されるとともに、該正多角形の中心と該保持面の中央とが一致した状態で保持される。   The present invention relates to a workpiece processing method for grinding or polishing a workpiece, wherein the workpiece is sucked and held, and a holding surface whose entire surface is on the same plane and a center of the holding surface are orthogonal to the holding surface Holding a workpiece having a size smaller than the size of the holding surface with a holding table having a rotating shaft, via a support member that covers a suction area of the holding table, and after performing the holding step, The processing surface of the processing wheel is set so that an outer peripheral edge of a processing wheel having a processing surface parallel to the holding surface and a rotation axis orthogonal to the processing surface passes through the center of the holding surface of the holding table. And a processing step of contacting a workpiece held by the holding table and rotating the holding table and the processing wheel to grind or polish a plurality of workpieces by the processing wheel. In step With 3 or more workpieces are disposed adjacent in the regular polygon, the center of the center and the holding surface of the regular polygon is held in the matched state.

本発明では、保持ステップにおいて、全面が同一面上にある保持面において、3以上の被加工物が正多角形中に隣接して配設され、正多角形の中心と保持面の中央とが一致した状態で3以上の被加工物が保持されるため、加工ステップにおいて、加工ホイールの外周縁が保持テーブルの該保持面の中央部を常に通過するように加工ホイールの加工面を複数枚の被加工物に当接させて加工を行うと、加工面の当接部位にかかわらず、加工点の長さが略同一となる。したがって、加工後の被加工物を高精度に平坦化することが可能となる。   In the present invention, in the holding step, three or more workpieces are arranged adjacent to each other in the regular polygon on the holding surface whose entire surface is on the same plane, and the center of the regular polygon and the center of the holding surface are Since three or more workpieces are held in a matched state, in the machining step, a plurality of machining surfaces of the machining wheel are arranged so that the outer peripheral edge of the machining wheel always passes through the central portion of the holding surface of the holding table. When processing is performed by contacting the workpiece, the lengths of the processing points are substantially the same regardless of the contact portion of the processing surface. Therefore, it becomes possible to planarize the workpiece after processing with high accuracy.

保持テーブル及び研削手段の構成を示す断面図である。It is sectional drawing which shows the structure of a holding table and a grinding means. 複数の被加工物を保持テーブルに保持する保持ステップを示す断面図である。It is sectional drawing which shows the holding | maintenance step which hold | maintains a some workpiece to a holding table. 保持テーブル上において正三角形内部に複数の被加工物が保持された状態を示す平面図である。It is a top view which shows the state by which the several to-be-processed object was hold | maintained inside the equilateral triangle on a holding table. 保持テーブルに保持された複数の被加工物に対し研削を実施する加工ステップを示す断面図である。It is sectional drawing which shows the process step which implements grinding with respect to several workpieces hold | maintained at the holding table. 加工ホイールの加工点を部分的に示す平面図である。It is a top view which shows the processing point of a processing wheel partially. 複数の被加工物についての加工ホイールの加工点を示す平面図である。It is a top view which shows the processing point of the processing wheel about a some workpiece. 保持テーブルに保持された複数の被加工物に対し研磨を実施する加工ステップを示す断面図である。It is sectional drawing which shows the process step which implements grinding | polishing with respect to several workpieces hold | maintained at the holding table. 保持テーブル上において正三角形内部に複数の被加工物が配置変更されて保持された状態を示す平面図である。It is a top view which shows the state by which the several to-be-processed object was rearranged and hold | maintained inside the equilateral triangle on the holding table. 保持テーブル上において正六角形内部に複数の被加工物が保持された状態を示す平面図である。It is a top view which shows the state by which the some workpiece was hold | maintained inside the regular hexagon on the holding table. 保持面が円錐面の保持テーブル及び研削手段の構成を示す断面図である。It is sectional drawing which shows the structure of the holding table and grinding | polishing means whose holding surface is a conical surface. 保持面が円錐面の保持テーブルに保持されたサファイアウェーハを研削したときの1枚のサファイアウェーハの加工点を示す比較例である。It is a comparative example which shows the processing point of one sapphire wafer when the sapphire wafer held by the holding table of which the holding surface is a conical surface is ground. 保持面が円錐面の保持テーブルに保持されたサファイアウェーハを研削したときの3枚のサファイアウェーハの加工点を示す比較例である。It is a comparative example which shows the processing point of three sapphire wafers when grinding the sapphire wafer hold | maintained on the holding table of a conical surface.

1 第1の実施形態
図1に示す保持テーブル10は、円形の被加工物を回転可能に保持する保持テーブルである。保持テーブル10は、被加工物を吸引保持する面である保持面11を有している。保持面11は、その全面が同一面上にあり平坦面となっている。保持面11の中央部分には、保持面11に直交した回転軸12を有しており、回転軸12を回転中心として保持テーブル10が回転できる構成となっている。
1 First Embodiment A holding table 10 shown in FIG. 1 is a holding table that rotatably holds a circular workpiece. The holding table 10 has a holding surface 11 that is a surface for sucking and holding a workpiece. The holding surface 11 is entirely flat on the same surface. A central portion of the holding surface 11 has a rotating shaft 12 orthogonal to the holding surface 11, and the holding table 10 can be rotated about the rotating shaft 12 as a rotation center.

保持テーブル10の外周側には、被加工物を保持面11上に固定するためのクランプ手段14が配設されている。クランプ手段14は、上下に移動可能な支持部15と、支持部15に連結された載置台16と、載置台16に被加工物をクランプするクランプ部17とを備えている。   On the outer peripheral side of the holding table 10, clamping means 14 for fixing the workpiece on the holding surface 11 is disposed. The clamp means 14 includes a support portion 15 that can move up and down, a mounting table 16 connected to the support portion 15, and a clamp portion 17 that clamps a workpiece on the mounting table 16.

図1に示す研削手段20は、鉛直方向の軸心を有するスピンドル21と、スピンドル21の下部にマウンタ22を介して装着された加工ホイール23と、加工ホイール23の下部に環状に固着された研削砥石24と、を備えている。研削手段20は、加工ホイール23を回転させつつ、昇降することができる。   A grinding means 20 shown in FIG. 1 includes a spindle 21 having a vertical axis, a processing wheel 23 mounted on a lower portion of the spindle 21 via a mounter 22, and a grinding fixed to the lower portion of the processing wheel 23 in an annular shape. And a grindstone 24. The grinding means 20 can move up and down while rotating the processing wheel 23.

以下に、上記のように構成される研削手段20により被加工物を研削加工する方法について説明する。   Below, the method to grind a workpiece by the grinding means 20 comprised as mentioned above is demonstrated.

(1)保持ステップ
図2に示す円形の被加工物1は、例えば、サファイア、シリコンカーバイトなどにより形成されている。図2及び図3に示すように、被加工物1のサイズは、保持面11のサイズより小さく、保持面11に複数枚配置しても保持面11におさまる程度である。図3の例における被加工物1は、例えばφ3インチの円形に形成されている。
(1) Holding Step The circular workpiece 1 shown in FIG. 2 is formed of, for example, sapphire or silicon carbide. As shown in FIGS. 2 and 3, the size of the workpiece 1 is smaller than the size of the holding surface 11, and even if a plurality of the workpieces 1 are arranged on the holding surface 11, the workpiece 1 fits the holding surface 11. The workpiece 1 in the example of FIG. 3 is formed in a circular shape of φ3 inches, for example.

まず、図2に示すように、中央が開口された環状のフレーム4の下部に保持テーブル10の保持面11を覆う支持部材3を貼着する。次いで、フレーム4の中央部分から露出した支持部材3に被加工物1を貼着する。支持部材3は、伸張可能な粘着素材により形成されており、被加工物1を支持部材3に貼着することにより、被加工物1は、支持部材3を介してフレーム4と一体となった状態となる。被加工物1は、支持部材3の中央部に寄せ合って貼着する。   First, as shown in FIG. 2, the support member 3 that covers the holding surface 11 of the holding table 10 is attached to the lower part of the annular frame 4 whose center is opened. Next, the workpiece 1 is attached to the support member 3 exposed from the central portion of the frame 4. The support member 3 is formed of an extensible adhesive material, and the workpiece 1 is integrated with the frame 4 via the support member 3 by sticking the workpiece 1 to the support member 3. It becomes a state. The workpiece 1 is attached to the center portion of the support member 3 in close contact.

次に、被加工物1が貼着された支持部材3側を保持テーブル10の保持面11に載置して保持するとともに、フレーム4を載置台16に載置し、クランプ部17がフレーム4の上部を押さえて固定する。こうして、支持部材3が保持面11を覆い、被加工物1とともに保持テーブル10に保持される。   Next, the support member 3 side to which the workpiece 1 is attached is placed and held on the holding surface 11 of the holding table 10, the frame 4 is placed on the placing table 16, and the clamp portion 17 is placed on the frame 4. Hold the top of to secure. Thus, the support member 3 covers the holding surface 11 and is held on the holding table 10 together with the workpiece 1.

保持ステップでは、図3に示すように、3つの被加工物1が相互に隣接して配設されるとともに、すべての被加工物1が保持面11の内部の正三角形2Aの内側に配置される。また、正三角形2Aの中心部と、保持面11の中央部13とが一致した状態となるように、3つの被加工物1が保持される。   In the holding step, as shown in FIG. 3, three workpieces 1 are arranged adjacent to each other, and all the workpieces 1 are arranged inside an equilateral triangle 2 </ b> A inside the holding surface 11. The Further, the three workpieces 1 are held so that the center portion of the equilateral triangle 2 </ b> A and the center portion 13 of the holding surface 11 coincide with each other.

(2)加工ステップ
保持ステップを実施した後、図4に示すように、研削手段20によって被加工物1に研削加工を施す。研削手段20の下方に保持テーブル10を移動した後、保持テーブル10が、例えば矢印A方向に回転し、スピンドル21を例えば矢印B方向に回転させつつ、加工ホイール23の加工面24aを保持面11と平行な状態にしたまま被加工物1に向けて下降させる。そして、加工ホイール23の加工面24aが複数の被加工物1を押圧しながら研削する。ここで、加工面24aとは、被加工物1に接触する研削砥石24の下面を意味している。
(2) Processing Step After performing the holding step, the workpiece 1 is ground by the grinding means 20 as shown in FIG. After the holding table 10 is moved below the grinding means 20, the holding table 10 rotates in the direction of arrow A, for example, and the spindle 21 rotates in the direction of arrow B, for example, while the processing surface 24 a of the processing wheel 23 is held on the holding surface 11. The workpiece 1 is lowered toward the workpiece 1 while being in a state parallel to the workpiece 1. Then, the processing surface 24 a of the processing wheel 23 is ground while pressing the plurality of workpieces 1. Here, the processing surface 24 a means the lower surface of the grinding wheel 24 that contacts the workpiece 1.

被加工物1の研削中、研削手段20は、常に加工ホイール23の外周縁24bが図5に示す保持テーブル10の保持面11の中央部13を通過するように円弧状に回転させる。これにより、加工面24aが当接した加工点5の長さが略同一となる。したがって、複数枚の被加工物1に対して短い加工点と長い加工点とが混在することはない。   During grinding of the workpiece 1, the grinding means 20 always rotates in an arc shape so that the outer peripheral edge 24b of the processing wheel 23 passes through the central portion 13 of the holding surface 11 of the holding table 10 shown in FIG. Thereby, the length of the processing point 5 with which the processing surface 24a abuts is substantially the same. Therefore, short processing points and long processing points are not mixed for a plurality of workpieces 1.

このようにして、加工点5の長さにばらつきがない状態で、加工ホイール23により所定の厚みに達するまで複数枚の被加工物1に研削を施す。そうすると、図6に示すように、保持面11において隣接して配置された3つの被加工物1のそれぞれの加工点5は、その長さが略同一であるため、研削後の3つの被加工物1を、いずれも高精度な平坦面に仕上げることができる。   In this manner, a plurality of workpieces 1 are ground by the processing wheel 23 until a predetermined thickness is reached with no variation in the length of the processing point 5. Then, as shown in FIG. 6, since the processing points 5 of the three workpieces 1 arranged adjacent to each other on the holding surface 11 have substantially the same length, the three workpieces after grinding are processed. All of the objects 1 can be finished to a highly accurate flat surface.

2 第2の実施形態
図7に示す研磨手段30は、鉛直方向の軸心を有するスピンドル31と、スピンドル31の下部にマウンタ32を介して装着された加工ホイール33と、を備えている。加工ホイール33は、基台34と、基台34の下部に装着された研磨パッド35とから構成されている。研磨手段30は、加工ホイール33を回転させつつ、加工ホイール33を鉛直方向に昇降させることができる。以下に、研磨手段30により被加工物を研磨加工する方法について説明する。
2 Second Embodiment The polishing means 30 shown in FIG. 7 includes a spindle 31 having a vertical axis, and a processing wheel 33 attached to the lower part of the spindle 31 via a mounter 32. The processing wheel 33 includes a base 34 and a polishing pad 35 attached to the lower part of the base 34. The polishing means 30 can raise and lower the processing wheel 33 in the vertical direction while rotating the processing wheel 33. Hereinafter, a method for polishing a workpiece by the polishing means 30 will be described.

(1)保持ステップ
図7に示す研磨加工の際においても、第1の実施形態の保持ステップで示したのと同様の手順により、複数の被加工物1を保持テーブル10に保持させる。すなわち、支持部材3側を保持面10の保持面11に載置して保持し、フレーム4を載置台16に載置する。このようにして、フレーム4の下部に貼着された支持部材3が、保持面11を覆うようにして被加工物1とともに保持テーブル10に保持される。
(1) Holding Step In the polishing process shown in FIG. 7, the plurality of workpieces 1 are held on the holding table 10 by the same procedure as that shown in the holding step of the first embodiment. That is, the support member 3 side is placed and held on the holding surface 11 of the holding surface 10, and the frame 4 is placed on the mounting table 16. In this way, the support member 3 adhered to the lower part of the frame 4 is held on the holding table 10 together with the workpiece 1 so as to cover the holding surface 11.

(2)加工ステップ
保持ステップを実施した後、図7に示すように、研磨手段30によって被加工物1に研磨加工を施す。研磨手段30の下方に保持テーブル10を移動した後、保持テーブル10が、例えば矢印A方向に回転し、保持テーブル10を回転させる。研磨手段30は、スピンドル31を例えば矢印B方向に回転させつつ、研磨パッド35の下面の加工面35aを保持面11と平行にした状態のまま被加工物1にむけて下降させる。
(2) Processing Step After performing the holding step, the workpiece 1 is polished by the polishing means 30 as shown in FIG. After moving the holding table 10 below the polishing means 30, the holding table 10 rotates in the direction of arrow A, for example, and rotates the holding table 10. The polishing means 30 lowers the workpiece 31 toward the workpiece 1 while rotating the spindle 31 in the direction of the arrow B, for example, while keeping the processing surface 35a on the lower surface of the polishing pad 35 parallel to the holding surface 11.

そして、研磨パッド35と保持テーブル10とを相対的に回転させながら、研磨パッド35の加工面35aと被加工物1とを摺動させる。被加工物1の研磨中は、回転する研磨パッド35の外周縁35bが、図5に示す保持テーブル10の保持面11の中央部13を常に通過するように回転させる。そうすると、互いに隣接する各被加工物の加工点は、略同一の長さとなる。したがって、複数枚の被加工物1に対して短い加工点と長い加工点とが混在することはない。   Then, the processing surface 35a of the polishing pad 35 and the workpiece 1 are slid while the polishing pad 35 and the holding table 10 are relatively rotated. During polishing of the workpiece 1, the outer peripheral edge 35 b of the rotating polishing pad 35 is rotated so as to always pass through the central portion 13 of the holding surface 11 of the holding table 10 shown in FIG. 5. Then, the processing points of the workpieces adjacent to each other have substantially the same length. Therefore, short processing points and long processing points are not mixed for a plurality of workpieces 1.

図7に示した研磨パッド35により、所定の平坦度に達するまで複数の被加工物1を研磨する。そうすると、図6に示すように、保持面11において隣接して配置された3つの被加工物1のそれぞれの加工点5は、その長さが略同一であるため、研磨後の3つの被加工物1を、いずれも高精度な平坦面に仕上げることができる。   The plurality of workpieces 1 are polished by the polishing pad 35 shown in FIG. 7 until a predetermined flatness is reached. Then, as shown in FIG. 6, since the processing points 5 of the three workpieces 1 arranged adjacent to each other on the holding surface 11 have substantially the same length, the three workpieces after polishing are processed. All of the objects 1 can be finished to a highly accurate flat surface.

いずれの実施形態においても、保持テーブル10に被加工物1を保持する態様としてクランプ手段14によって被加工物1と一体となったフレーム5を固定する例を説明したが、他の例としては、例えば、被加工物の大きさに対応した吸引面を有する保持テーブルを使用するようにしてもよい。この保持テーブルで被加工物を保持する際は、被加工物に保護テープまたはサブストレートを貼着し、保持テーブルの吸引面において保護テープ側またはサブストレート側を吸引して被加工物を吸引保持する。   In any of the embodiments, the example in which the frame 5 integrated with the workpiece 1 is fixed by the clamping means 14 as an aspect of holding the workpiece 1 on the holding table 10, but as another example, For example, a holding table having a suction surface corresponding to the size of the workpiece may be used. When holding a work piece with this holding table, attach a protective tape or substrate to the work piece, and suck and hold the work piece by sucking the protective tape or substrate side on the suction surface of the holding table. To do.

上記第1、第2の実施形態に示した以外に、他の配置例として、図8に示すように、円形の保持面11の内部の正三角形2Bの内部に6つの被加工物1aを隣接して配設するようにしてもよい。この場合は、6つの被加工物1aの中心を結んだ線が正三角形となるようにすればよい。また、図9に示すように、円形の保持面11の内部の正六角形2Cの内部において、中央に1つの被加工物1aを配置し、当該被加工物1aの周囲に6つの被加工物1aを配置するようにしてもよい。   In addition to those shown in the first and second embodiments, as another arrangement example, as shown in FIG. 8, six workpieces 1a are adjacent to each other inside an equilateral triangle 2B inside a circular holding surface 11. You may make it arrange | position. In this case, the line connecting the centers of the six workpieces 1a may be an equilateral triangle. In addition, as shown in FIG. 9, inside the regular hexagon 2 </ b> C inside the circular holding surface 11, one workpiece 1 a is arranged at the center, and six workpieces 1 a around the workpiece 1 a. May be arranged.

以上のように、本発明に係る被加工物の加工方法では、保持ステップでは、保持テーブル10の保持面11内の正多角形の内部において3以上の被加工物1が隣接し、正多角形の中心と保持面11の中央とが一致した状態で保持面11に被加工物1を保持するため、保持ステップを実施した後の加工ステップにおいて、研削砥石24の外周縁24bまたは研磨パッド35の外周縁35bが保持テーブル10の保持面11の中央部13を常に通過するようにして複数枚の被加工物1に当接させると、被加工物1の加工点5の長さが略同一となる。したがって、加工後の被加工物1を高精度に平坦化することが可能となる。   As described above, in the workpiece processing method according to the present invention, in the holding step, three or more workpieces 1 are adjacent to each other inside the regular polygon in the holding surface 11 of the holding table 10, and the regular polygon is formed. In order that the workpiece 1 is held on the holding surface 11 in a state where the center of the holding surface 11 coincides with the center of the holding surface 11, in the processing step after the holding step is performed, the outer peripheral edge 24b of the grinding wheel 24 or the polishing pad 35 When the outer peripheral edge 35b is brought into contact with a plurality of workpieces 1 so as to always pass through the central portion 13 of the holding surface 11 of the holding table 10, the lengths of the processing points 5 of the workpiece 1 are substantially the same. Become. Therefore, the processed workpiece 1 can be flattened with high accuracy.

保持面が円錐面である保持テーブルと保持面が平坦面である保持テーブルとを使用し、それぞれの保持テーブルにおいて、図3に示したように、正三角形2Aの内部に隣接して配置した被加工物1を保持し、研削を実施した。被加工物としては、φ3インチのサファイアウェーハを使用し、いずれの保持テーブルもφ8インチサイズのものを使用した。   A holding table having a conical surface as a holding surface and a holding table having a flat holding surface are used. In each holding table, as shown in FIG. The workpiece 1 was held and grinding was performed. As a workpiece, a sapphire wafer having a diameter of 3 inches was used, and any holding table having a size of 8 inches was used.

図10に示した保持面41が円錐面の保持テーブル40に3枚のサファイアウェーハを保持し、研削砥石24の外周縁24bが保持面11の中央を通るように研削したところ、研削後におけるサファイアウェーハの面のTTV(Total Thickness Variation)は、8μmであった。一方、図1−9に示した保持面11が平坦面の保持テーブル10にサファイアウェーハを保持し、研削砥石24の外周縁24bが保持面11の中央を通るように研削したところ、研削後におけるサファイアウェーハの面のTTVは、3μmであった。したがって、保持面が円錐面の保持テーブルを使用してサファイアウェーハを研削する場合と比較して、保持面が平坦面の保持テーブルを使用してサファイアウェーハを研削する方が、サファイアウェーハを高精度に平坦化することができることが確認された。これは、図10に示した保持面41が円錐面の保持テーブル40にサファイアウェーハ6を保持した場合は、ある一時点においては図11に示す加工点7において研削が行われ、図12に示すように、複数枚のサファイアウェーハ6については加工点7a、7bにおいて研削が行われるが、加工点7aは加工点7bよりも長くなっているため、研削される度合いに差が生じているからであると考えられる。   The holding surface 41 shown in FIG. 10 holds three sapphire wafers on a conical holding table 40 and is ground so that the outer peripheral edge 24 b of the grinding wheel 24 passes through the center of the holding surface 11. The TTV (Total Thickness Variation) on the wafer surface was 8 μm. On the other hand, when the holding surface 11 shown in FIG. 1-9 holds the sapphire wafer on the holding table 10 having a flat surface and is ground so that the outer peripheral edge 24b of the grinding wheel 24 passes through the center of the holding surface 11, The TTV on the surface of the sapphire wafer was 3 μm. Therefore, compared to grinding a sapphire wafer using a conical holding table, it is more accurate to grind the sapphire wafer using a flat holding table. It was confirmed that it can be flattened. This is because when the holding surface 41 shown in FIG. 10 holds the sapphire wafer 6 on the conical holding table 40, the grinding is performed at the processing point 7 shown in FIG. As described above, the sapphire wafers 6 are ground at the processing points 7a and 7b. However, since the processing point 7a is longer than the processing point 7b, there is a difference in the degree of grinding. It is believed that there is.

1,1a:被加工物 2A:正三角形 2B:正三角形 2C:正六角形
3:保護テープ 4:フレーム 5:加工点
6:被加工物 7,7a,7b:加工点
10:保持テーブル 11:保持面 12:回転軸 13:中央部
14:クランプ手段 15:支持部 16:載置台 17:クランプ部
20:研削手段 21:回転軸 22:マウンタ 23:加工ホイール
24:研削砥石 24a:加工面 24b:外周縁
30:研磨手段 31:回転軸 32:マウンタ 33:加工ホイール
34:基台 35:研磨パッド 35a:加工面 35b:外周縁
40:保持テーブル 41:保持面 42:中心軸
50:研削手段 51:研削砥石
1, 1a: Workpiece 2A: Regular triangle 2B: Regular triangle 2C: Regular hexagon 3: Protection tape 4: Frame 5: Machining point 6: Workpiece 7, 7a, 7b: Machining point 10: Holding table 11: Holding Surface 12: Rotating shaft 13: Central portion 14: Clamping means 15: Supporting portion 16: Mounting table 17: Clamping portion 20: Grinding means 21: Rotating shaft 22: Mounter 23: Processing wheel 24: Grinding wheel 24a: Processing surface 24b: Outer peripheral edge 30: Polishing means 31: Rotating shaft 32: Mounter 33: Processing wheel 34: Base 35: Polishing pad 35a: Processing surface 35b: Outer peripheral edge 40: Holding table 41: Holding surface 42: Central shaft 50: Grinding means 51 : Grinding wheel

Claims (1)

被加工物を研削又は研磨する被加工物の加工方法であって、
被加工物を吸引保持し全面が同一面上にある保持面と該保持面の中央で該保持面に直交した回転軸とを有する保持テーブルによって、該保持面のサイズより小さいサイズの被加工物を該保持テーブルの吸引領域を覆う支持部材を介して保持する保持ステップと、
該保持ステップを実施した後、該保持面に対して平行な加工面と該加工面に直交した回転軸とを有する加工ホイールの外周縁が該保持テーブルの該保持面の中央を通過するように該加工ホイールの該加工面を該保持テーブルで保持された被加工物に当接させ、該保持テーブルと該加工ホイールとを回転させて複数の被加工物を該加工ホイールで研削または研磨する加工ステップと、を備え、
該保持ステップでは、3以上の被加工物が正多角形中に隣接して配設されるとともに、該正多角形の中心と該保持面の中央とが一致した状態で保持される、被加工物の加工方法。
A method of processing a workpiece for grinding or polishing the workpiece,
A workpiece having a size smaller than the size of the holding surface by a holding table having a holding surface that sucks and holds the workpiece and the entire surface is on the same plane and a rotation axis that is orthogonal to the holding surface at the center of the holding surface. Holding step through a support member that covers the suction area of the holding table;
After performing the holding step, an outer peripheral edge of a processing wheel having a processing surface parallel to the holding surface and a rotation axis orthogonal to the processing surface passes through the center of the holding surface of the holding table. Processing in which the processing surface of the processing wheel is brought into contact with the workpiece held by the holding table, and the holding table and the processing wheel are rotated to grind or polish a plurality of workpieces by the processing wheel. And comprising steps
In the holding step, three or more workpieces are arranged adjacent to each other in the regular polygon, and the workpiece is held in a state where the center of the regular polygon coincides with the center of the holding surface. Processing method of things.
JP2012143018A 2012-06-26 2012-06-26 Processing method for workpiece Pending JP2014004663A (en)

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