JP2013544369A5 - - Google Patents

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Publication number
JP2013544369A5
JP2013544369A5 JP2013542132A JP2013542132A JP2013544369A5 JP 2013544369 A5 JP2013544369 A5 JP 2013544369A5 JP 2013542132 A JP2013542132 A JP 2013542132A JP 2013542132 A JP2013542132 A JP 2013542132A JP 2013544369 A5 JP2013544369 A5 JP 2013544369A5
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JP
Japan
Prior art keywords
test
output
fourier transform
calibration
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013542132A
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English (en)
Japanese (ja)
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JP2013544369A (ja
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Publication date
Priority claimed from US12/956,372 external-priority patent/US9081053B2/en
Application filed filed Critical
Publication of JP2013544369A publication Critical patent/JP2013544369A/ja
Publication of JP2013544369A5 publication Critical patent/JP2013544369A5/ja
Pending legal-status Critical Current

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JP2013542132A 2010-11-30 2011-11-30 継続的掃引周波数を用いるシステム周波数応答テスト Pending JP2013544369A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/956,372 US9081053B2 (en) 2010-11-30 2010-11-30 Using continuous sweep frequencies in a system frequency response test
US12/956,372 2010-11-30
PCT/US2011/062614 WO2012075123A2 (en) 2010-11-30 2011-11-30 System frequency response test using continuous sweep frequencies

Publications (2)

Publication Number Publication Date
JP2013544369A JP2013544369A (ja) 2013-12-12
JP2013544369A5 true JP2013544369A5 (enExample) 2015-01-22

Family

ID=46127194

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013542132A Pending JP2013544369A (ja) 2010-11-30 2011-11-30 継続的掃引周波数を用いるシステム周波数応答テスト

Country Status (4)

Country Link
US (1) US9081053B2 (enExample)
JP (1) JP2013544369A (enExample)
CN (1) CN103201639B (enExample)
WO (1) WO2012075123A2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9304148B2 (en) * 2012-10-23 2016-04-05 Tektronix, Inc. Internal chirp generator with time aligned acquisition in a mixed-domain oscilloscope
CN104007317A (zh) * 2014-06-04 2014-08-27 哈尔滨工业大学 一种获取伺服系统频率特性的方法及装置
US20180238836A1 (en) * 2017-02-23 2018-08-23 Southern Research Institute Ultrasonic Inspection System With Rf Amplifier to Drive Ultrasonic Transducer
CN112162144B (zh) * 2020-08-19 2023-07-21 国网江西省电力有限公司供电服务管理中心 一种基于卷积增益的电网频率快速测量方法及装置

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4878984A (enExample) * 1972-01-22 1973-10-23
US4244037A (en) * 1979-05-21 1981-01-06 The United States Of America As Represented By The Secretary Of The Navy Two dimensional imaging using surface wave acoustic devices
JPS5660360A (en) * 1979-10-22 1981-05-25 Fujitsu Ltd Circuit characteristic direct viewing system
US4652816A (en) 1984-12-07 1987-03-24 Hughes Aircraft Company Calibrated radio frequency analog spectrum analyzer
JPH07104378B2 (ja) * 1989-07-27 1995-11-13 アンリツ株式会社 ネットワークアナライザ
US5177709A (en) * 1989-09-19 1993-01-05 Baziw Erick J Method for determining velocity and confidence level of acoustic waves in penetrable ground
JPH07225273A (ja) * 1994-02-15 1995-08-22 Nec Eng Ltd ソーナーの送受信装置
US5591913A (en) 1994-05-12 1997-01-07 Southern Research Institute Apparatus and method for ultrasonic spectroscopy testing of materials
US6236371B1 (en) 1999-07-26 2001-05-22 Harris Corporation System and method for testing antenna frequency response
GB0307415D0 (en) * 2003-03-31 2003-05-07 British Telecomm Matched filtering
WO2006012503A2 (en) 2004-07-22 2006-02-02 Auburn University Automatic analog test & compensation with built-in pattern generator & analyzer
JP4542935B2 (ja) * 2005-03-29 2010-09-15 アンリツ株式会社 Ａ／ｄ変換装置
US7415372B2 (en) * 2005-08-26 2008-08-19 Step Communications Corporation Method and apparatus for improving noise discrimination in multiple sensor pairs
JP5071197B2 (ja) * 2008-03-28 2012-11-14 富士電機株式会社 減衰特性測定方法および減衰特性測定装置
JP2010117349A (ja) * 2008-10-16 2010-05-27 Advantest Corp 試験装置、パフォーマンスボード、および、キャリブレーション用ボード

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