CN103201639B - 使用连续扫描频率的系统频率响应测试 - Google Patents

使用连续扫描频率的系统频率响应测试 Download PDF

Info

Publication number
CN103201639B
CN103201639B CN201180053547.2A CN201180053547A CN103201639B CN 103201639 B CN103201639 B CN 103201639B CN 201180053547 A CN201180053547 A CN 201180053547A CN 103201639 B CN103201639 B CN 103201639B
Authority
CN
China
Prior art keywords
test
output
frequency
fourier transform
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201180053547.2A
Other languages
English (en)
Chinese (zh)
Other versions
CN103201639A (zh
Inventor
T·J·探戈
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of CN103201639A publication Critical patent/CN103201639A/zh
Application granted granted Critical
Publication of CN103201639B publication Critical patent/CN103201639B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2837—Characterising or performance testing, e.g. of frequency response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
  • Tests Of Electronic Circuits (AREA)
CN201180053547.2A 2010-11-30 2011-11-30 使用连续扫描频率的系统频率响应测试 Active CN103201639B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/956,372 US9081053B2 (en) 2010-11-30 2010-11-30 Using continuous sweep frequencies in a system frequency response test
US12/956,372 2010-11-30
PCT/US2011/062614 WO2012075123A2 (en) 2010-11-30 2011-11-30 System frequency response test using continuous sweep frequencies

Publications (2)

Publication Number Publication Date
CN103201639A CN103201639A (zh) 2013-07-10
CN103201639B true CN103201639B (zh) 2015-07-08

Family

ID=46127194

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201180053547.2A Active CN103201639B (zh) 2010-11-30 2011-11-30 使用连续扫描频率的系统频率响应测试

Country Status (4)

Country Link
US (1) US9081053B2 (enExample)
JP (1) JP2013544369A (enExample)
CN (1) CN103201639B (enExample)
WO (1) WO2012075123A2 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9304148B2 (en) * 2012-10-23 2016-04-05 Tektronix, Inc. Internal chirp generator with time aligned acquisition in a mixed-domain oscilloscope
CN104007317A (zh) * 2014-06-04 2014-08-27 哈尔滨工业大学 一种获取伺服系统频率特性的方法及装置
US20180238836A1 (en) * 2017-02-23 2018-08-23 Southern Research Institute Ultrasonic Inspection System With Rf Amplifier to Drive Ultrasonic Transducer
CN112162144B (zh) * 2020-08-19 2023-07-21 国网江西省电力有限公司供电服务管理中心 一种基于卷积增益的电网频率快速测量方法及装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4652816A (en) * 1984-12-07 1987-03-24 Hughes Aircraft Company Calibrated radio frequency analog spectrum analyzer
US5591913A (en) * 1994-05-12 1997-01-07 Southern Research Institute Apparatus and method for ultrasonic spectroscopy testing of materials
US6236371B1 (en) * 1999-07-26 2001-05-22 Harris Corporation System and method for testing antenna frequency response

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4878984A (enExample) * 1972-01-22 1973-10-23
US4244037A (en) * 1979-05-21 1981-01-06 The United States Of America As Represented By The Secretary Of The Navy Two dimensional imaging using surface wave acoustic devices
JPS5660360A (en) * 1979-10-22 1981-05-25 Fujitsu Ltd Circuit characteristic direct viewing system
JPH07104378B2 (ja) * 1989-07-27 1995-11-13 アンリツ株式会社 ネットワークアナライザ
US5177709A (en) * 1989-09-19 1993-01-05 Baziw Erick J Method for determining velocity and confidence level of acoustic waves in penetrable ground
JPH07225273A (ja) * 1994-02-15 1995-08-22 Nec Eng Ltd ソーナーの送受信装置
GB0307415D0 (en) * 2003-03-31 2003-05-07 British Telecomm Matched filtering
WO2006012503A2 (en) 2004-07-22 2006-02-02 Auburn University Automatic analog test & compensation with built-in pattern generator & analyzer
JP4542935B2 (ja) * 2005-03-29 2010-09-15 アンリツ株式会社 Ａ／ｄ変換装置
US7415372B2 (en) * 2005-08-26 2008-08-19 Step Communications Corporation Method and apparatus for improving noise discrimination in multiple sensor pairs
JP5071197B2 (ja) * 2008-03-28 2012-11-14 富士電機株式会社 減衰特性測定方法および減衰特性測定装置
JP2010117349A (ja) * 2008-10-16 2010-05-27 Advantest Corp 試験装置、パフォーマンスボード、および、キャリブレーション用ボード

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4652816A (en) * 1984-12-07 1987-03-24 Hughes Aircraft Company Calibrated radio frequency analog spectrum analyzer
US5591913A (en) * 1994-05-12 1997-01-07 Southern Research Institute Apparatus and method for ultrasonic spectroscopy testing of materials
US6236371B1 (en) * 1999-07-26 2001-05-22 Harris Corporation System and method for testing antenna frequency response

Also Published As

Publication number Publication date
US20120136600A1 (en) 2012-05-31
WO2012075123A3 (en) 2012-08-23
JP2013544369A (ja) 2013-12-12
WO2012075123A2 (en) 2012-06-07
US9081053B2 (en) 2015-07-14
CN103201639A (zh) 2013-07-10

Similar Documents

Publication Publication Date Title
RU2470280C2 (ru) Способ обнаружения и автоматической идентификации повреждения подшипников качения
EP0759166B1 (en) Apparatus and method for ultrasonic spectroscopy testing of materials
JP2017026503A (ja) 振動分布測定方法及び振動分布測定装置
CN103201639B (zh) 使用连续扫描频率的系统频率响应测试
US6882947B2 (en) Discrete fourier transform (DFT) leakage removal
CN110297126A (zh) 仪器放大器频响特性的频谱倍频分析测试法
JP4870939B2 (ja) ケーブル障害測定の減衰および散乱歪補正方法
EP2183608B2 (en) Instrument and a method for detecting partial electrical discharges occurring in an electric apparatus
US10509064B2 (en) Impedance measurement through waveform monitoring
KR102036790B1 (ko) 계단-주파수 반사파 계측법을 이용하는 케이블 결함 평가 시스템 및 방법
Aiello et al. A PC-based instrument for harmonics and interharmonics measurement in power supply systems
US8886486B2 (en) Device and method for testing APD measuring device
US20150260878A1 (en) Hydrophone Response Compensation Filter Derivation, Design and Application
KR101832190B1 (ko) 보정 기능을 가지는 부분 방전 진단 장치 및 방법
JP7586337B2 (ja) 光パルス試験方法及び光パルス試験装置
KR100475739B1 (ko) 필터 특성 측정 장치
D'Elia et al. Software customization to provide digital oscilloscope with enhanced period-measurement features
JP4164041B2 (ja) 地上デジタルｓｆｎ波測定装置
US20240369625A1 (en) Method for separating and modeling n-ui jitter based on spectrum
CN116015428B (zh) 基于dvs的光纤长度确定方法、装置及系统
CN119246997B (zh) 一种基于梳状信号的测试方法及装置
KR20210090370A (ko) 광 선로의 경로식별장치 및 경로식별방법
US9170290B1 (en) Method for asynchronous impulse response measurement between separately clocked systems
Aiello et al. A new instrument for harmonics and interharmonics measurement for power supply systems and equipment connected thereto
Larsson et al. Crack detection using non-linear wave modulation spectroscopy

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant