JP2013251475A - Calibration value obtaining method in electronic component mounting line and electronic component mounting method on electronic component mounting line - Google Patents

Calibration value obtaining method in electronic component mounting line and electronic component mounting method on electronic component mounting line Download PDF

Info

Publication number
JP2013251475A
JP2013251475A JP2012126774A JP2012126774A JP2013251475A JP 2013251475 A JP2013251475 A JP 2013251475A JP 2012126774 A JP2012126774 A JP 2012126774A JP 2012126774 A JP2012126774 A JP 2012126774A JP 2013251475 A JP2013251475 A JP 2013251475A
Authority
JP
Japan
Prior art keywords
electronic component
component mounting
calibration
target
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2012126774A
Other languages
Japanese (ja)
Inventor
Kenichiro Ishimoto
憲一郎 石本
Toshihiko Nagaya
利彦 永冶
Masahiro Kihara
正宏 木原
Hiroshi Okamura
浩志 岡村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Original Assignee
Panasonic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp filed Critical Panasonic Corp
Priority to JP2012126774A priority Critical patent/JP2013251475A/en
Priority to CN201310219004.4A priority patent/CN103458672B/en
Publication of JP2013251475A publication Critical patent/JP2013251475A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Supply And Installment Of Electrical Components (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a calibration value obtaining method in an electronic component mounting line and an electronic component mounting method on an electronic component mounting line capable of simply performing a calibration value obtaining operation for each electronic components mounting device constituting an electronic component mounting line in a short time.SOLUTION: After mounting plural samples C4 to plural target points C2H on a calibration substrate C2 in the order from an electronic component mounting device 12 at the upstream side to an electronic component mounting device 12 at the downstream side, images of the calibration substrate C2 mounted with the samples C4 are taken using a camera (substrate camera 30) positioned at the downstream side of the plural electronic component mounting devices 12. Calibration values of control data for the electronic component mounting devices 12 which performs mounting operation on the samples C4 are calculated from a positional relationship between the a position of the target points C2H on the calibration substrate C2 and an actual mounting positions of the samples C4 mounted using the target point C2H as the target on the basis of the image of the calibration substrate C2 obtained by the imaging.

Description

本発明は、基板への電子部品搭載作業を行う電子部品実装装置を複数台含んで構成される電子部品実装ラインにおける校正値取得方法及び電子部品実装ラインによる電子部品実装方法に関するものである。   The present invention relates to a calibration value acquisition method in an electronic component mounting line configured to include a plurality of electronic component mounting apparatuses that perform an electronic component mounting operation on a board, and an electronic component mounting method using an electronic component mounting line.

電子部品実装ラインは複数の電子部品実装装置を含んで構成され、各電子部品実装装置は、上流工程側から送られてきた基板を搬入して位置決めし、搭載ヘッドによりピックアップした電子部品を制御データに基づいて基板に搭載した後、その基板を下流工程側に搬出するようになっている。このような電子部品実装ラインにおいて、各電子部品実装装置は基板に搭載した各電子部品の実際の搭載位置が制御データ上の搭載位置とできる限り一致するようにするため、基板の実生産作業開始前には、搭載ヘッドの(詳細には搭載ヘッドが備える各吸着ノズルの)制御データ上の位置と実際の位置との位置ずれ量を求め、その求めた位置ずれ量に基づいて、実際の搭載位置が制御データ上の搭載位置に近づくように制御データを校正する校正値を取得するようにしている。   The electronic component mounting line is configured to include a plurality of electronic component mounting devices. Each electronic component mounting device carries in and positions the board sent from the upstream process side, and controls the electronic components picked up by the mounting head. After being mounted on the substrate based on the above, the substrate is carried out to the downstream process side. In such an electronic component mounting line, each electronic component mounting device starts actual production work of the substrate so that the actual mounting position of each electronic component mounted on the substrate matches the mounting position on the control data as much as possible. Before, the amount of positional deviation between the position on the control data of the mounting head (specifically, each suction nozzle included in the mounting head) and the actual position is obtained, and the actual mounting is performed based on the obtained positional deviation amount. A calibration value for calibrating the control data is acquired so that the position approaches the mounting position on the control data.

各電子部品実装装置において上記制御データの校正値を取得する作業では、一般には、基準となるマーク(基準マーク)及びこの基準マークを基準としてマトリクス状に配置された多数の標点を備えた校正用基板を用意してこれを電子部品実装装置の所定位置に設置し、その設置した校正用基板上の各標点に標体(校正用電子部品)が搭載されるように搭載ヘッドを制御データに基づいて作動させた後、校正用基板上に実際に搭載された各標体を搭載ヘッドに固定されたカメラによって撮像し、得られた画像から各標点の位置とカメラの撮像中心の位置(すなわち制御データ上の標点の位置)との位置ずれを求める。そして、求めた位置ずれが一定の範囲(許容ばらつき範囲)内に収まるように制御データをオフセットさせるオフセットデータ値を算出し、その算出したオフセットデータを各電子部品実装装置における制御データの校正値として取得する(例えば、特許文献1)。   In the operation of obtaining the calibration value of the control data in each electronic component mounting apparatus, in general, calibration including a reference mark (reference mark) and a number of reference points arranged in a matrix with the reference mark as a reference. Prepare a circuit board and place it at a predetermined position on the electronic component mounting device, and control the mounting head so that the target (calibration electronic component) is mounted on each target point on the installed calibration board. Then, each target actually mounted on the calibration board is imaged by a camera fixed to the mounting head, and the position of each target point and the position of the imaging center of the camera are obtained from the obtained image. That is, the positional deviation from (ie, the position of the mark on the control data) is obtained. Then, an offset data value for offsetting the control data is calculated so that the obtained positional deviation is within a certain range (allowable variation range), and the calculated offset data is used as a calibration value for the control data in each electronic component mounting apparatus. Obtain (for example, Patent Document 1).

ここで、電子部品実装ラインでは、個々の電子部品実装装置における実際の電子部品の搭載位置と制御データ上での搭載位置との差(位置ずれ量)のばらつきがその電子部品実装装置を基準とした許容ばらつき範囲内に収まるようにするだけでは足りず、電子部品実装ライン全体としての精度を保証する必要から、上記ばらつきの範囲が電子部品実装ライン全体として定めた許容ばらつき範囲内に収まるようにする必要がある。このため、校正用基板を全ての電子部品実装装置について共通のものとしたうえで、その校正用基板に対して各電子部品実装装置に制御データに従った標体の搭載を行わせ、標体が搭載された校正用基板を別途設けた検査用のカメラを備えた検査装置に移送してそこで得られる各標体の画像から各電子部品実装装置における制御データの校正値を求める一方、全ての標体の標点からの位置ずれ量の平均値を算出し、その算出した位置ずれ量の平均値を再校正値として各電子部品実装装置における制御データの校正値を再校正するようにしている。   Here, in the electronic component mounting line, the variation in the difference (position shift amount) between the actual electronic component mounting position in each electronic component mounting apparatus and the mounting position on the control data is based on the electronic component mounting apparatus. It is not enough to be within the allowable variation range, and it is necessary to guarantee the accuracy of the entire electronic component mounting line, so that the above variation range is within the allowable variation range determined for the entire electronic component mounting line. There is a need to. For this reason, after making the calibration board common to all electronic component mounting apparatuses, each electronic component mounting apparatus is mounted on the calibration board according to the control data, Is transferred to an inspection apparatus equipped with a camera for inspection separately provided with a calibration board, and the calibration value of the control data in each electronic component mounting apparatus is obtained from the image of each target obtained there, The average value of the amount of misalignment from the target point of the target is calculated, and the calibration value of the control data in each electronic component mounting apparatus is recalibrated using the calculated average value of the amount of misalignment as the recalibration value. .

特開2005−121478号公報JP 2005-121478 A

しかしながら、上記従来の方法によって電子部品実装ラインを構成する各電子部品実装装置の校正値(各電子部品実装装置における制御データの校正値及びこの校正値を再校正する再校正値)を求める方法では、各電子部品実装装置への校正用基板の設置と取り出し及び各電子部品実装装置から取り出した校正用基板(標体が搭載された校正用基板)の検査装置への設置と取り出しを繰り返し実行する必要があり、作業が面倒で多大な時間を要するという問題点があった。   However, in the method of obtaining the calibration value (the calibration value of the control data in each electronic component mounting apparatus and the recalibration value for recalibrating this calibration value) of each electronic component mounting apparatus constituting the electronic component mounting line by the conventional method described above. , Repeatedly installing and removing the calibration substrate from each electronic component mounting apparatus and installing and removing the calibration substrate (calibration substrate on which the target is mounted) taken out from each electronic component mounting apparatus. There was a problem that it was necessary and the work was troublesome and took a lot of time.

そこで本発明は、電子部品実装ラインを構成する各電子部品実装装置の校正値の取得作業を簡単かつ短時間で行うことができる電子部品実装ラインにおける校正値取得方法及び電子部品実装ラインによる電子部品実装方法を提供することを目的とする。   Accordingly, the present invention provides a calibration value acquisition method in an electronic component mounting line, and an electronic component using the electronic component mounting line, which can easily and quickly perform a calibration value acquisition operation of each electronic component mounting apparatus constituting the electronic component mounting line. The purpose is to provide an implementation method.

請求項1に記載の電子部品実装ラインにおける校正値取得方法は、上流工程側から送られてきた基板を搬入して位置決めし、搭載ヘッドによりピックアップした電子部品を制御データに基づいて前記基板に搭載した後、その基板を下流工程側に搬出する電子部品搭載作業を行う電子部品実装装置を複数台含んで構成された電子部品実装ラインにおける校正値取得方法であって、前記電子部品実装ラインの上流工程側の電子部品実装装置から下流工程側の電子部品実装装置の順で校正用基板上の複数の標点に対する複数個ずつの標体の搭載を行う標体搭載工程と、前記電子部品実装ラインの前記複数台の電子部品実装装置の下流工程側に位置するカメラを用いて前記標体の搭載が終了した前記校正用基板の撮像を行う校正用基板撮像工程と、前記校正用基板撮像工程で得られた前記校正用基板の画像に基づいて、前記校正用基板上の前記標点の位置とその標点を目標として搭載した前記各標体の実際の搭載位置との位置関係から前記標体搭載工程を行った各電子部品実装装置の制御データの校正値を算出する校正値算出工程とを含む。   The calibration value acquisition method for an electronic component mounting line according to claim 1 is a method of carrying in and positioning a substrate sent from an upstream process side and mounting the electronic component picked up by a mounting head on the substrate based on control data. Then, a calibration value acquisition method in an electronic component mounting line configured to include a plurality of electronic component mounting apparatuses for performing an electronic component mounting operation for unloading the substrate to the downstream process side, the upstream of the electronic component mounting line A target mounting process for mounting a plurality of targets on a plurality of target points on a calibration substrate in the order of an electronic component mounting apparatus on the process side to an electronic component mounting apparatus on the downstream process side, and the electronic component mounting line A calibration board imaging step for imaging the calibration board after mounting the target using a camera located on the downstream side of the plurality of electronic component mounting apparatuses; Based on the image of the calibration substrate obtained in the calibration substrate imaging step, the position of the target on the calibration substrate and the actual mounting position of each target mounted with the target as the target A calibration value calculation step of calculating a calibration value of control data of each electronic component mounting apparatus that has performed the target mounting step from the positional relationship.

請求項2に記載の電子部品実装ラインによる電子部品実装方法は、上流工程側から送られてきた基板を搬入して位置決めし、搭載ヘッドによりピックアップした電子部品を制御データに基づいて前記基板に搭載した後、その基板を下流工程側に搬出する電子部品搭載作業を行う電子部品実装装置を複数台含んで構成された電子部品実装ラインによる電子部品実装方法であって、前記電子部品実装ラインの上流工程側の電子部品実装装置から下流工程側の電子部品実装装置の順で校正用基板上の複数の標点に対する複数個ずつの標体の搭載を行う標体搭載工程と、前記電子部品実装ラインの前記複数台の電子部品実装装置の下流工程側に位置するカメラを用いて前記標体の搭載が終了した前記校正用基板の撮像を行う校正用基板撮像工程と、前記校正用基板撮像工程で得られた前記校正用基板の画像に基づいて、前記校正用基板上の前記標点の位置とその標点を目標として搭載した前記各標体の実際の搭載位置との位置関係から前記標体搭載工程を行った各電子部品実装装置の制御データの校正値を算出する校正値算出工程とを含み、前記校正値算出工程で算出した前記校正値を対応する電子部品実装装置に設定し、前記電子部品実装ラインにおいて前記電子部品実装装置による前記電子部品搭載作業を行って前記基板に電子部品を搭載する。   The electronic component mounting method using the electronic component mounting line according to claim 2 carries in and positions the substrate sent from the upstream process side, and mounts the electronic component picked up by the mounting head on the substrate based on the control data. Then, an electronic component mounting method using an electronic component mounting line configured to include a plurality of electronic component mounting apparatuses for carrying out an electronic component mounting operation for unloading the board to the downstream process side, upstream of the electronic component mounting line A target mounting process for mounting a plurality of targets on a plurality of target points on a calibration substrate in the order of an electronic component mounting apparatus on the process side to an electronic component mounting apparatus on the downstream process side, and the electronic component mounting line A calibration board imaging step for imaging the calibration board after mounting the target using a camera located on the downstream side of the plurality of electronic component mounting apparatuses; Based on the image of the calibration substrate obtained in the calibration substrate imaging step, the position of the target on the calibration substrate and the actual mounting position of each target mounted with the target as the target A calibration value calculation step of calculating a calibration value of control data of each electronic component mounting apparatus that has performed the target mounting step from a positional relationship, and the electronic component mounting corresponding to the calibration value calculated in the calibration value calculation step The electronic component is mounted on the board by performing the electronic component mounting operation by the electronic component mounting apparatus in the electronic component mounting line.

本発明では、電子部品実装ラインを構成する各電子部品実装装置に電子部品搭載作業を行わせるときと同様に電子部品実装ラインに校正用基板を投入して各電子部品実装装置に校正用基板に対する複数個ずつの標体の搭載を行わせた後、電子部品実装ラインを構成する全ての電子部品実装装置による標体の搭載が終了した校正用基板の撮像を行い、この撮像により得られた校正用基板の画像に基づいて、校正用基板上の標点の位置とその標点を目標として搭載した各標体の実際の搭載位置との位置関係から電子部品実装ラインを構成する各電子部品実装装置の制御データの校正値を取得するようにしており、従来のように、各電子部品実装装置への校正用基板の設置と取り出し及び各電子部品実装装置から取り出した校正用基板(標体が搭載された校正用基板)の検査装置への設置と取り出しを繰り返し実行する必要がないので、電子部品実装ラインを構成する各電子部品実装装置の校正値を簡単かつ短時間で取得することができる。   In the present invention, the calibration substrate is inserted into the electronic component mounting line and the calibration substrate is mounted on each electronic component mounting device in the same manner as when the electronic component mounting device constituting the electronic component mounting line is caused to perform the electronic component mounting operation. After mounting multiple specimens, image the calibration board after mounting the specimens by all the electronic component mounting devices that make up the electronic component mounting line. Each electronic component mounting that constitutes the electronic component mounting line based on the positional relationship between the position of the target on the calibration substrate and the actual mounting position of each target mounted with the target as the target The calibration value of the control data of the apparatus is acquired. As in the past, the calibration board taken out from each electronic component mounting apparatus (the target is installed) powered by Since the there is no need to install a repeated extraction execution of the calibration substrate) of the inspection apparatus, it is possible to obtain a calibration value easily and in a short time of each electronic component mounting apparatus constituting the electronic component mounting line.

本発明の一実施の形態における電子部品実装ラインの簡略全体構成図Simplified overall configuration diagram of an electronic component mounting line in an embodiment of the present invention 本発明の一実施の形態における電子部品実装ラインを構成する電子部品実装装置の平面図The top view of the electronic component mounting apparatus which comprises the electronic component mounting line in one embodiment of this invention 本発明の一実施の形態における電子部品実装装置の側面図The side view of the electronic component mounting apparatus in one embodiment of this invention 本発明の一実施の形態における電子部品実装装置の制御系統を示すブロック図The block diagram which shows the control system of the electronic component mounting apparatus in one embodiment of this invention 本発明の一実施の形態における電子部品実装装置が実行する電子部品搭載作業の手順を示すフローチャートThe flowchart which shows the procedure of the electronic component mounting operation which the electronic component mounting apparatus in one embodiment of this invention performs 本発明の一実施の形態における電子部品実装ラインにおいて制御データの校正値の取得作業を行っている状態を示す図The figure which shows the state which is performing the acquisition operation of the calibration value of control data in the electronic component mounting line in one embodiment of this invention 本発明の一実施の形態における電子部品実装ラインが実行する制御データの校正値取得作業において使用される校正用基板の斜視図The perspective view of the board | substrate for a calibration used in the calibration value acquisition operation | work of the control data which the electronic component mounting line in one embodiment of this invention performs 本発明の一実施の形態における電子部品実装ラインが実行する制御データの校正値取得作業の手順を示すフローチャートThe flowchart which shows the procedure of the calibration value acquisition operation | work of the control data which the electronic component mounting line in one embodiment of this invention performs 本発明の一実施の形態における電子部品実装ラインが実行する制御データの校正値取得作業において各電子部品実装装置が行う校正用基板に対する標体の搭載作業の実行手順を示すフローチャートThe flowchart which shows the execution procedure of the mounting operation | work of the target with respect to the board | substrate for a calibration which each electronic component mounting apparatus performs in the calibration value acquisition operation of the control data which the electronic component mounting line in one embodiment of this invention performs

以下、図面を参照して本発明の実施の形態を説明する。図1に示す本発明の一実施の形態における電子部品実装ライン1は、基板2の電極部3に電子部品4を搭載して電子回路形成基板2Sを生産するものであり、スクリーン印刷機11、複数台(ここでは3台)の電子部品実装装置12(上流工程側から順に第1の電子部品実装装置12a、第2の電子部品実装装置12b、第3の電子部品実装装置12c)及びリフロー炉13がこの順で並べられて成る。   Embodiments of the present invention will be described below with reference to the drawings. An electronic component mounting line 1 according to an embodiment of the present invention shown in FIG. 1 is for producing an electronic circuit forming substrate 2S by mounting an electronic component 4 on an electrode part 3 of a substrate 2, and a screen printing machine 11, Multiple (here, three) electronic component mounting apparatuses 12 (first electronic component mounting apparatus 12a, second electronic component mounting apparatus 12b, and third electronic component mounting apparatus 12c in this order from the upstream process side) and a reflow furnace 13 are arranged in this order.

スクリーン印刷機11は基板2の電極部3に半田(図示せず)をスクリーン印刷し、3台の電子部品実装装置12のうち最も上流工程側(図1では紙面左側)に位置する第1の電子部品実装装置12aに基板2を受け渡す。   The screen printing machine 11 screen-prints solder (not shown) on the electrode part 3 of the substrate 2, and among the three electronic component mounting apparatuses 12, the first one located on the most upstream process side (left side in FIG. 1). The board 2 is delivered to the electronic component mounting apparatus 12a.

第1の電子部品実装装置12aは、スクリーン印刷機11から送られてきた基板2の電極部3上に電子部品4を搭載して下流工程側の電子部品実装装置12に基板2を受け渡し、第2の電子部品実装装置12bは、第1の電子部品実装装置12aから送られてきた基板2の電極部3上に電子部品4を搭載して下流工程側の第3の電子部品実装装置12cに基板2を受け渡す。第3の電子部品実装装置12cは、第2の電子部品実装装置12bから送られてきた基板2の電極部3上に電子部品4を搭載して下流工程側のリフロー炉13に基板2を受け渡し、リフロー炉13は3台の電子部品実装装置12によって電子部品4の搭載がなされた基板2を搬送しながら加熱して半田を溶かし(半田リフロー)、電子部品4を基板2の電極部3上に固定させて完成した電子回路形成基板2Sを搬出する。   The first electronic component mounting apparatus 12a mounts the electronic component 4 on the electrode part 3 of the substrate 2 sent from the screen printing machine 11, and delivers the substrate 2 to the electronic component mounting apparatus 12 on the downstream process side. The second electronic component mounting apparatus 12b mounts the electronic component 4 on the electrode part 3 of the substrate 2 sent from the first electronic component mounting apparatus 12a, and passes it to the third electronic component mounting apparatus 12c on the downstream process side. Deliver the substrate 2. The third electronic component mounting apparatus 12c mounts the electronic component 4 on the electrode part 3 of the substrate 2 sent from the second electronic component mounting apparatus 12b, and delivers the substrate 2 to the reflow furnace 13 on the downstream process side. The reflow furnace 13 heats the substrate 2 on which the electronic component 4 is mounted by the three electronic component mounting apparatuses 12 while heating the substrate 2 to melt the solder (solder reflow), and the electronic component 4 is placed on the electrode portion 3 of the substrate 2. The electronic circuit forming substrate 2S completed by being fixed to is carried out.

図2及び図3において、3台の電子部品実装装置12は同一の構成を有しており、それぞれ基台21の中央部に基板2を水平方向(この基板2の搬送方向をX軸方向(オペレータOPから見た左右方向)とする)に搬送する基板搬送コンベア22を備えている。基台21のX軸方向と直交する水平面内方向(Y軸方向(オペレータOPから見た前後方向)とする)の端部には複数のパーツフィーダ23がX軸方向に並んで取り付けられており、各パーツフィーダ23は電子部品供給口23aに電子部品4を連続的に供給するようになっている。   2 and 3, the three electronic component mounting apparatuses 12 have the same configuration, and the substrate 2 is placed in the horizontal direction at the center of the base 21 (the transport direction of the substrate 2 is the X-axis direction ( A board transfer conveyor 22 is provided for transferring the left and right directions as viewed from the operator OP). A plurality of parts feeders 23 are mounted side by side in the X-axis direction at the end in the horizontal plane direction (Y-axis direction (front-rear direction viewed from the operator OP)) orthogonal to the X-axis direction of the base 21. Each of the parts feeders 23 continuously supplies the electronic component 4 to the electronic component supply port 23a.

基台21上には前後2基のヘッド移動機構24(前方ヘッド移動機構24F及び後方ヘッド移動機構24R)が設けられている。前方ヘッド移動機構24F及び後方ヘッド移動機構24Rはそれぞれ基台21の右方の上方をY軸方向に延びて設けられたY軸テーブル24a、Y軸テーブル24aに一端側が支持されてX軸方向に延びたX軸テーブル24b及びX軸テーブル24bに沿って移動自在に設けられた移動ステージ24cから成り、各移動ステージ24cには搭載ヘッド25が取り付けられている。ここでは2基のヘッド移動機構24(前方ヘッド移動機構24F及び後方ヘッド移動機構24R)はY軸テーブル24aを共有した構成となっており、Y軸テーブル24aに対するX軸テーブル24bのY軸方向への移動とX軸テーブル24bに対する移動ステージ24cのX軸方向への移動を組み合わせることによって、各搭載ヘッド25を水平面内で独立して移動させることができるようになっている。   On the base 21, two front and rear head moving mechanisms 24 (a front head moving mechanism 24F and a rear head moving mechanism 24R) are provided. The front head moving mechanism 24F and the rear head moving mechanism 24R are respectively supported at one end side by a Y-axis table 24a and a Y-axis table 24a provided on the right side of the base 21 so as to extend in the Y-axis direction. The extended X-axis table 24b and a movable stage 24c provided so as to be movable along the X-axis table 24b include a mounting head 25 attached to each movable stage 24c. Here, the two head moving mechanisms 24 (the front head moving mechanism 24F and the rear head moving mechanism 24R) share the Y-axis table 24a, and the Y-axis direction of the X-axis table 24b with respect to the Y-axis table 24a is the same. By combining this movement and the movement of the moving stage 24c in the X-axis direction with respect to the X-axis table 24b, each mounting head 25 can be moved independently in the horizontal plane.

図3において、各搭載ヘッド25には複数のシャフト部材26が下方(上下方向をZ軸方向とする)に延びて設けられており、各シャフト部材26の下端には電子部品4を吸着するための吸着ノズル27が着脱自在に取り付けられている。各シャフト部材26は各搭載ヘッド25に設けられたシャフト駆動機構28(図2)に駆動されて搭載ヘッド25に対する上下動とZ軸回りの回転動作を行う。また、各搭載ヘッド25内には吸着ノズル27に電子部品4の吸着動作を行わせる吸着機構29(図2)が設けられている。   In FIG. 3, each mounting head 25 is provided with a plurality of shaft members 26 extending downward (the vertical direction is the Z-axis direction), and the electronic component 4 is attracted to the lower end of each shaft member 26. The suction nozzle 27 is detachably attached. Each shaft member 26 is driven by a shaft drive mechanism 28 (FIG. 2) provided in each mounting head 25 to perform vertical movement with respect to the mounting head 25 and rotation around the Z axis. Each mounting head 25 is provided with a suction mechanism 29 (FIG. 2) that causes the suction nozzle 27 to perform a suction operation of the electronic component 4.

図2及び図3において、搭載ヘッド25には撮像視野を下方に向けた基板カメラ30が取り付けられており、基台21上の基板搬送コンベア22とパーツフィーダ23との間の領域には撮像視野を上方に向けた部品カメラ31が設けられている。   In FIG. 2 and FIG. 3, the mounting head 25 is attached with a substrate camera 30 with the imaging field of view facing downward, and an imaging field of view is located in the region between the substrate transport conveyor 22 and the parts feeder 23 on the base 21. A component camera 31 is provided with the facing upward.

図4において、基板搬送コンベア22による基板2の搬送及び位置決め動作、各パーツフィーダ23による電子部品4の供給動作、2基のヘッド移動機構24(前方ヘッド移動機構24F及び後方ヘッド移動機構24R)による2つの搭載ヘッド25の移動動作、シャフト駆動機構28による各シャフト部材26の上下移動及び上下軸(Z軸)回りの回転の各動作の制御は電子部品実装装置12が備える制御装置40によってなされる。また、各シャフト部材26による吸着ノズル27を介した吸着動作は、制御装置40が前述の吸着機構29の作動制御を行うことによってなされる。   In FIG. 4, the substrate 2 is transported and positioned by the substrate transport conveyor 22, the electronic component 4 is supplied by each parts feeder 23, and the two head moving mechanisms 24 (the front head moving mechanism 24F and the rear head moving mechanism 24R) are used. Control of the movement operation of the two mounting heads 25, the vertical movement of each shaft member 26 by the shaft drive mechanism 28, and the rotation around the vertical axis (Z axis) is performed by the control device 40 provided in the electronic component mounting apparatus 12. . Further, the suction operation through the suction nozzle 27 by each shaft member 26 is performed by the control device 40 controlling the operation of the suction mechanism 29 described above.

基板カメラ30による撮像動作制御及び部品カメラ31による撮像動作制御は制御装置40によってなされ、基板カメラ30の撮像動作によって得られた画像データ及び部品カメラ31の撮像動作によって得られた各画像データは制御装置40に送信され、制御装置40の画像認識部40a(図4)において画像認識がなされる。   The image capturing operation control by the substrate camera 30 and the image capturing operation control by the component camera 31 are performed by the control device 40, and the image data obtained by the image capturing operation of the substrate camera 30 and each image data obtained by the image capturing operation of the component camera 31 are controlled. The image is transmitted to the device 40, and image recognition is performed in the image recognition unit 40a (FIG. 4) of the control device 40.

図4において、制御装置40に繋がる記憶装置41には、その電子部品実装装置12が基板2に電子部品4を搭載する電子部品搭載作業を行うときの動作手順を規定した電子部品実装プログラムPG1のほか、各電子部品実装装置12の制御データの校正値を取得する校正値取得作業を行うときの動作手順を規定した校正値取得プログラムPG2が記憶されている。   4, the storage device 41 connected to the control device 40 includes an electronic component mounting program PG1 that defines an operation procedure when the electronic component mounting apparatus 12 performs an electronic component mounting operation for mounting the electronic component 4 on the board 2. In addition, a calibration value acquisition program PG2 that defines an operation procedure for performing a calibration value acquisition operation for acquiring a calibration value of control data of each electronic component mounting apparatus 12 is stored.

また、記憶装置41には、電子部品4と基板2の最終的な位置合わせを補償するための制御データ(オフセットデータ)も格納されている。制御データは前方ヘッド移動機構24F及び後方ヘッド移動機構24Rそれぞれに固有のデータであり、本実施の形態の電子部品実装装置12では前方ヘッド移動機構24Fと後方ヘッド移動機構24Rそれぞれの制御データが記憶されている。更に記憶装置41には、前述の制御データの校正値(以下、校正値)も記憶されている。この校正値も前方ヘッド移動機構24F及び後方ヘッド移動機構24Rそれぞれに固有のデータであり、校正値取得プログラムPG2を実行することによって取得される。   The storage device 41 also stores control data (offset data) for compensating the final alignment between the electronic component 4 and the substrate 2. The control data is unique to each of the front head moving mechanism 24F and the rear head moving mechanism 24R. In the electronic component mounting apparatus 12 of the present embodiment, the control data of the front head moving mechanism 24F and the rear head moving mechanism 24R is stored. Has been. Further, the storage device 41 also stores a calibration value of the control data (hereinafter referred to as a calibration value). This calibration value is also unique to each of the front head moving mechanism 24F and the rear head moving mechanism 24R, and is acquired by executing the calibration value acquisition program PG2.

電子部品実装ライン1による電子回路形成基板2Sの製造では、先ず、スクリーン印刷機11による基板2への半田のスクリーン印刷が行われ、次いで第1の電子部品実装装置12a、第2の電子部品実装装置12b、第3の電子部品実装装置12cの順で基板2への電子部品4の搭載が行われる。   In the production of the electronic circuit forming substrate 2S by the electronic component mounting line 1, first, screen printing of the solder on the substrate 2 is performed by the screen printer 11, and then the first electronic component mounting apparatus 12a and the second electronic component mounting are performed. The electronic component 4 is mounted on the substrate 2 in the order of the device 12b and the third electronic component mounting device 12c.

各電子部品実装装置12における基板2への電子部品4の搭載作業(電子部品搭載作業)では、各電子部品実装装置12の制御装置40は上述の電子部品実装プログラムPG1に従って動作し、先ず、基板搬送コンベア22を作動させて上流工程側から受け取った基板2を搬入して所定の作業位置に位置決めする(図5のフローチャートに示すステップST1)。そして、各搭載ヘッド25を移動させて基板カメラ30を基板2の上方に移動させ、基板カメラ30に基板2の隅に設けられた一対の基準マーク2m(図2)の撮像を行わせて画像認識し、基板2の基準の位置からの位置ずれ(基板位置ずれ)を算出する(ステップST2)。   In the mounting operation (electronic component mounting operation) of the electronic component 4 on the board 2 in each electronic component mounting apparatus 12, the control device 40 of each electronic component mounting apparatus 12 operates according to the above-described electronic component mounting program PG1. The transport conveyor 22 is operated to load the substrate 2 received from the upstream process side and position it at a predetermined work position (step ST1 shown in the flowchart of FIG. 5). Then, each mounting head 25 is moved to move the substrate camera 30 above the substrate 2, and the substrate camera 30 performs imaging of a pair of reference marks 2 m (FIG. 2) provided at the corners of the substrate 2. Recognizing and calculating the positional deviation (substrate positional deviation) from the reference position of the substrate 2 (step ST2).

制御装置40は、基板2の基準の位置からの位置ずれを算出したら、パーツフィーダ23の作動制御を行って電子部品供給口23aに電子部品4を供給させつつ、各搭載ヘッド25をパーツフィーダ23の上方に位置させて、各吸着ノズル27に電子部品4をピックアップ(吸着)させる(ステップST3)。そして、各吸着ノズル27にピックアップさせた電子部品4が2つの部品カメラ31のうちの一方の上方を通過するように搭載ヘッド25を移動させ、部品カメラ31に各電子部品4の撮像を行わせて画像認識し(ステップST4)、各電子部品4の吸着ノズル27に対する位置ずれ(部品吸着ずれ)を算出する(ステップST5)。   When the control device 40 calculates the displacement of the substrate 2 from the reference position, the control device 40 controls the operation of the parts feeder 23 to supply the electronic component 4 to the electronic component supply port 23a, and each mounting head 25 is moved to the parts feeder 23. The electronic component 4 is picked up (sucked) by each suction nozzle 27 (step ST3). Then, the mounting head 25 is moved so that the electronic component 4 picked up by each suction nozzle 27 passes over one of the two component cameras 31, and the component camera 31 performs imaging of each electronic component 4. The image is recognized (step ST4), and the positional deviation (component adsorption deviation) of each electronic component 4 with respect to the suction nozzle 27 is calculated (step ST5).

制御装置40は、各電子部品4の吸着ノズル27に対する位置ずれを算出したら、搭載ヘッド25を基板2の上方に位置させ、吸着ノズル27に吸着させた各電子部品4を基板2上の目標搭載位置に接触させたうえで各吸着ノズル27への真空圧の供給を解除して、吸着した電子部品4を基板2に搭載する(ステップST6)。このステップST6では、制御装置40は、ステップST2で求めた基板位置ずれと、ステップST5で求めた部品吸着ずれと、当該搭載ヘッド25を移動させるヘッド移動機構24(前方ヘッド移動機構24F又は後方ヘッド移動機構24R)の制御データと校正値に基づいて、ヘッド移動機構24による最終的な搭載ヘッド25の停止位置を算出し、ヘッド移動機構24によって搭載ヘッド25を算出した停止位置に移動する。これにより吸着ノズル27の位置補正が行われて電子部品4は基板2上の目標搭載位置に正確に位置決めされる。   After calculating the positional deviation of each electronic component 4 with respect to the suction nozzle 27, the control device 40 positions the mounting head 25 above the substrate 2 and mounts each electronic component 4 sucked by the suction nozzle 27 on the target 2. After contacting the position, the supply of the vacuum pressure to each suction nozzle 27 is released, and the sucked electronic component 4 is mounted on the substrate 2 (step ST6). In step ST6, the control device 40 detects the substrate position deviation obtained in step ST2, the component adsorption deviation obtained in step ST5, and the head moving mechanism 24 (the front head moving mechanism 24F or the rear head) that moves the mounting head 25. Based on the control data and the calibration value of the moving mechanism 24R), the final stop position of the mounting head 25 by the head moving mechanism 24 is calculated, and the mounting head 25 is moved by the head moving mechanism 24 to the calculated stop position. As a result, the position of the suction nozzle 27 is corrected and the electronic component 4 is accurately positioned at the target mounting position on the substrate 2.

制御装置40は、基板2に対する電子部品4の搭載を行ったら、基板2に搭載すべき全ての電子部品4の搭載が終了したか否かの判断を行う(ステップST7)。そして、基板2に搭載すべき全ての電子部品4の搭載が終了していなかったときにはステップST3に戻り、基板2に搭載すべき全ての電子部品4の搭載が終了していたときには、基板搬送コンベア22を作動させて基板2を電子部品実装装置12から搬出する(ステップST8)。   When the electronic component 4 is mounted on the substrate 2, the control device 40 determines whether or not the mounting of all the electronic components 4 to be mounted on the substrate 2 has been completed (step ST7). When the mounting of all the electronic components 4 to be mounted on the substrate 2 has not been completed, the process returns to step ST3, and when the mounting of all the electronic components 4 to be mounted on the substrate 2 has been completed, the substrate transfer conveyor. 22 is operated and the board | substrate 2 is carried out from the electronic component mounting apparatus 12 (step ST8).

3台の電子部品実装装置12が上記手順により基板2に対する電子部品4の搭載作業を実行し、第3の電子部品実装装置12cから基板2が搬出されたら、リフロー炉13がその基板2に対する半田リフローを実行して搬出する。   When the three electronic component mounting apparatuses 12 perform the mounting operation of the electronic component 4 on the substrate 2 according to the above procedure and the substrate 2 is unloaded from the third electronic component mounting apparatus 12c, the reflow furnace 13 is soldered to the substrate 2 Execute reflow and carry out.

電子部品実装ライン1による電子回路形成基板2Sの製造は上述の手順によりなされるが、各電子部品実装装置12の稼働時間が累積するに従い、搭載ヘッド25の移動機構(ここではヘッド移動機構24)の組み付け誤差の増加や劣化等の経時変化は避けられず、制御装置40は運転開始時に記憶装置41に記憶した制御データだけでは経時変化による電子部品4の搭載精度の悪化を適切に防止することはできない。このため、各電子部品実装ライン1による電子部品4の搭載作業を実行する前には各電子部品実装装置12の制御データの校正値を取得してこれを用いた制御データの校正を行うようにしている。   The electronic circuit board 2S is manufactured by the electronic component mounting line 1 according to the above-described procedure. As the operating time of each electronic component mounting apparatus 12 accumulates, the moving mechanism of the mounting head 25 (here, the head moving mechanism 24). The control device 40 can appropriately prevent deterioration of the mounting accuracy of the electronic component 4 due to the change with time only by the control data stored in the storage device 41 at the start of operation. I can't. For this reason, before performing the mounting operation of the electronic component 4 by each electronic component mounting line 1, the calibration value of the control data of each electronic component mounting apparatus 12 is acquired and the control data is calibrated using the calibration value. ing.

電子部品実装ライン1により各電子部品実装装置12の制御データの校正値を取得する校正値取得作業は、図6に示すように、電子部品実装ライン1を構成する3台の電子部品実装装置12(第1の電子部品実装装置12a、第2の電子部品実装装置12b及び第3の電子部品実装装置12c)に対し、図7に示す校正用基板C2とこの校正用基板C2に搭載する標体C4を使用して行う。   As shown in FIG. 6, the calibration value acquisition operation for acquiring the calibration value of the control data of each electronic component mounting apparatus 12 by the electronic component mounting line 1 includes three electronic component mounting apparatuses 12 constituting the electronic component mounting line 1. For the (first electronic component mounting apparatus 12a, second electronic component mounting apparatus 12b, and third electronic component mounting apparatus 12c), the calibration substrate C2 shown in FIG. 7 and the target mounted on the calibration substrate C2 Use C4.

図7に示すように、校正用基板C2は、精密な表面加工ができるガラス等を材料として製作された基板2とほぼ同じ大きさの平板形状の部材をベースとしており、その上面には一対の基準マークC2mとこれら一対の基準マークC2mを基準としてマトリクス状に配置された多数の標点C2Hが形成されている。   As shown in FIG. 7, the calibration substrate C2 is based on a flat plate-shaped member having the same size as the substrate 2 made of glass or the like capable of precise surface processing, and has a pair of upper surfaces. A large number of reference points C2H arranged in a matrix with respect to the reference mark C2m and the pair of reference marks C2m are formed.

標体C4は基板2に搭載される電子部品4と同程度の大きさを有しており、校正用基板C2上のひとつの標点C2Hを目標として搭載される。また、校正用基板C2上に搭載された状態で上方から撮像されたときにその中心位置が認識され易いようにするため、中心位置に相当する上面位置には所定形状のマークMが施されている。   The target C4 has the same size as the electronic component 4 mounted on the substrate 2, and is mounted with the target C2H on the calibration substrate C2 as a target. In addition, a mark M having a predetermined shape is applied to the upper surface position corresponding to the center position so that the center position can be easily recognized when the image is taken from above while mounted on the calibration substrate C2. Yes.

電子部品実装ライン1における校正値取得作業では、先ず、第1の電子部品実装装置12aによる校正用基板C2の搬入を行い(図8のフローチャートに示すステップST11)、第1の電子部品実装装置12aの制御装置40が前述の校正値取得プログラムPG2に従って校正用基板C2に対する標体C4の搭載作業を実行する(ステップST12)。   In the calibration value acquisition work in the electronic component mounting line 1, first, the calibration substrate C2 is carried in by the first electronic component mounting apparatus 12a (step ST11 shown in the flowchart of FIG. 8), and the first electronic component mounting apparatus 12a. The control device 40 executes the mounting operation of the specimen C4 on the calibration substrate C2 in accordance with the calibration value acquisition program PG2 (step ST12).

校正値取得プログラムPG2に従った校正用基板C2に対する標体C4の搭載作業では、制御装置40は先ず、基板搬送コンベア22によって搬入した校正用基板C2を所定位置に位置決めした後(図9のフローチャートに示すステップST31)、基板カメラ30を校正用基板C2の上方に移動させて校正用基板C2の隅に設けられた基準マークC2mの撮像を行わせて画像認識し、校正用基板C2の基準の位置からの位置ずれを算出する(ステップST32)。   In the mounting operation of the specimen C4 on the calibration substrate C2 according to the calibration value acquisition program PG2, the control device 40 first positions the calibration substrate C2 carried by the substrate transport conveyor 22 at a predetermined position (the flowchart in FIG. 9). Step ST31), the substrate camera 30 is moved above the calibration substrate C2, the reference mark C2m provided at the corner of the calibration substrate C2 is imaged, image recognition is performed, and the reference of the calibration substrate C2 is determined. A positional deviation from the position is calculated (step ST32).

ここで、各標体C4を装着するときの校正用基板C2上の標点C2Hの位置座標は、その標体C4を装着する電子部品実装装置12に固有の座標系で規定されている必要があるが、これは、ステップST32において電子部品実装装置12に固有の座標系で取得した校正用基板C2上の一対の基準マークC2mの位置座標と、これら一対の基準マークC2mを基準として定められる校正用基板C2に固有の座標系(図7で示すεη座標系)での各標点C2Hの位置座標のデータから算出することができる。なお、各標点C2Hの校正用基板C2に固有の座標系での位置座標のデータ、すなわち標体C4を装着すべき位置の座標データは、例えば、制御装置40の記憶装置41に書き込んでおくようにする。   Here, the position coordinates of the target point C2H on the calibration substrate C2 when each target C4 is mounted must be defined in a coordinate system unique to the electronic component mounting apparatus 12 that mounts the target C4. However, this is because the position coordinates of the pair of reference marks C2m on the calibration board C2 acquired in step ST32 in the coordinate system unique to the electronic component mounting apparatus 12 and the calibration determined with reference to the pair of reference marks C2m. It can be calculated from the data of the position coordinates of each target point C2H in the coordinate system (εη coordinate system shown in FIG. 7) unique to the substrate C2. Note that the position coordinate data in the coordinate system unique to the calibration board C2 of each calibration point C2H, that is, the coordinate data of the position where the target C4 is to be mounted is written in the storage device 41 of the control device 40, for example. Like that.

制御装置40は、校正用基板C2の位置ずれの算出を行ったら、搭載ヘッド25を移動させて、標体C4の供給用に用意されたパーツフィーダ23(図6において符号23Cで表す)が供給する標体C4を各搭載ヘッド25の各吸着ノズル27にピックアップさせる(ステップST33)。そして、各搭載ヘッド25を移動させ、各吸着ノズル27にピックアップさせた標体C4が2つの部品カメラ31のうちの一方の上方を通過するようにして部品カメラ31に標体C4の撮像を行わせて画像認識し(ステップST34)、各吸着ノズル27に対する標体C4の吸着ずれを検出したうえで(ステップST35)、その標体C4を校正用基板C2上の標点C2Hの位置に(標点C2Hの位置を目標として)搭載する(ステップST36)。このとき制御装置40は、ステップST32において検出した校正用基板C2の位置ずれとステップST35において検出した標体C4の吸着ずれと、当該搭載ヘッド25を移動させているヘッド移動機構24(前方ヘッド移動機構24F又は後方ヘッド移動機構24R)の制御データに基づいて、ヘッド移動機構24による最終的な搭載ヘッド25の停止位置を算出し、ヘッド移動機構24によって搭載ヘッド25を算出した停止位置に移動する。これにより吸着ノズル27の位置補正が行われて標体C4は標点C2Hの位置に位置決めされるはずであるが、実際には上述の経時変化による位置ずれが発生する。   After calculating the positional deviation of the calibration substrate C2, the control device 40 moves the mounting head 25 and supplies the parts feeder 23 (denoted by reference numeral 23C in FIG. 6) prepared for supplying the specimen C4. The target C4 to be picked up is picked up by each suction nozzle 27 of each mounting head 25 (step ST33). Then, each mounting head 25 is moved so that the target C4 picked up by each suction nozzle 27 passes over one of the two component cameras 31, and the component C31 is imaged of the target C4. Then, the image is recognized (step ST34), and the suction displacement of the target C4 with respect to each suction nozzle 27 is detected (step ST35), and then the target C4 is placed at the position of the reference point C2H on the calibration substrate C2 (standard mark). It is mounted (with the position of the point C2H as a target) (step ST36). At this time, the control device 40 detects the positional deviation of the calibration substrate C2 detected in step ST32, the adsorption deviation of the target C4 detected in step ST35, and the head moving mechanism 24 (forward head movement) that moves the mounting head 25. The final stop position of the mounting head 25 by the head moving mechanism 24 is calculated based on the control data of the mechanism 24F or the rear head moving mechanism 24R), and the mounting head 25 is moved to the calculated stop position by the head moving mechanism 24. . Thus, the position of the suction nozzle 27 is corrected and the target C4 should be positioned at the position of the target C2H. However, in actuality, the above-described positional deviation occurs.

制御装置40は、校正用基板C2に対する標体C4の搭載を行ったら、その電子部品実装装置12が搭載すべき全ての標体C4の搭載(校正用基板C2上に割り当てられた全ての領域への標体C4の搭載)が終了したか否かの判断を行う(ステップST37)。そして、校正用基板C2に搭載すべき全ての標体C4の搭載が終了していなかったときにはステップST33に戻り、校正用基板C2に搭載すべき全ての標体C4の搭載が終了していたときには、校正用基板C2に対する標体C4の搭載作業を終了する。この校正用基板C2に対する標体C4の搭載作業が終了した時点で、校正用基板C2上には第1の電子部品実装装置12aが備える複数の吸着ノズル27によって数個〜数十個の標体C4が校正用基板C2の全域に平均的に(偏りなく)搭載された状態となっている。   After mounting the target C4 on the calibration substrate C2, the control device 40 mounts all the targets C4 to be mounted on the electronic component mounting apparatus 12 (to all areas allocated on the calibration substrate C2). It is determined whether or not the mounting of the target C4 is completed (step ST37). When the mounting of all the targets C4 to be mounted on the calibration substrate C2 has not been completed, the process returns to step ST33, and when the mounting of all the targets C4 to be mounted on the calibration substrate C2 has been completed. Then, the mounting operation of the specimen C4 on the calibration substrate C2 is completed. When the mounting operation of the specimen C4 on the calibration substrate C2 is completed, several to several tens of specimens are placed on the calibration board C2 by the plurality of suction nozzles 27 included in the first electronic component mounting apparatus 12a. C4 is mounted on the entire area of the calibration substrate C2 on an average (with no bias).

上記のようにして校正用基板C2に対する1の電子部品実装装置12aによる標体C4の搭載工程が終了したら、第1の電子部品実装装置12aからの校正用基板C2の搬出を行い(図8のフローチャートに示すステップST13)、次いで第2の電子部品実装装置12bによる校正用基板C2の搬入を行った後(ステップST14)、上述の第1の電子部品実装装置12aよる標体C4の搭載と同様の要領で第2の電子部品実装装置12bによる校正用基板C2に対する標体C4の搭載を行う(ステップST15)。そして、第2の電子部品実装装置12bによる標体C4の搭載が終了したら、第2の電子部品実装装置12bからの校正用基板C2の搬出を行い(ステップST16)、次いで第3の電子部品実装装置12cによる校正用基板C2の搬入を行った後(ステップST17)、上述の第1の電子部品実装装置12aによる校正用基板C2に対する標体C4の搭載と同様の要領で第3の電子部品実装装置12cによる標体C4の搭載を行う(ステップST18)。   When the mounting process of the specimen C4 by the one electronic component mounting apparatus 12a on the calibration board C2 is completed as described above, the calibration board C2 is unloaded from the first electronic component mounting apparatus 12a (FIG. 8). Step ST13 shown in the flowchart, and then the calibration board C2 is carried in by the second electronic component mounting apparatus 12b (step ST14), and then similar to the mounting of the target C4 by the first electronic component mounting apparatus 12a described above. In this manner, the specimen C4 is mounted on the calibration substrate C2 by the second electronic component mounting apparatus 12b (step ST15). When the mounting of the specimen C4 by the second electronic component mounting apparatus 12b is completed, the calibration board C2 is unloaded from the second electronic component mounting apparatus 12b (step ST16), and then the third electronic component mounting is performed. After carrying in the calibration substrate C2 by the apparatus 12c (step ST17), the third electronic component mounting is performed in the same manner as the mounting of the target C4 on the calibration substrate C2 by the first electronic component mounting apparatus 12a described above. The target C4 is mounted by the device 12c (step ST18).

第3の電子部品実装装置12cによる校正用基板C2に対する標体C4の搭載を行ったら、第3の電子部品実装装置12cの制御装置40は、第3の電子部品実装装置12が備える2つの基板カメラ30のうちの一方によって、校正用基板C2の撮像を行う(ステップST19)。この校正用基板C2の撮像では、校正用基板C2上の各標点C2Hを含む領域が撮像されるようにする。   When the target C4 is mounted on the calibration substrate C2 by the third electronic component mounting apparatus 12c, the control device 40 of the third electronic component mounting apparatus 12c includes two substrates included in the third electronic component mounting apparatus 12 The calibration substrate C2 is imaged by one of the cameras 30 (step ST19). In the imaging of the calibration substrate C2, an area including each reference point C2H on the calibration substrate C2 is imaged.

第3の電子部品実装装置12cの制御装置40は、校正用基板C2の撮像を行ったら、得られた校正用基板C2の画像に基づいて、校正用基板C2上の標点C2Hの位置と、その標点C2Hを目標として搭載された各標体C4の実際の搭載位置(標体C4の中心位置)との位置ずれ量を求め、標体C4の搭載に関わったヘッド移動機構24ごとに位置ずれ量をグループ分けし、グループごとに統計処理を行ってヘッド移動機構24ごとの制御データの校正値を算出する。具体的には、グループにおける位置ずれ量の平均値を校正値として採用する。制御装置40は、算出した校正値を記憶装置41に記憶するとともに、制御装置40に繋がるディスプレイ装置50(図4)に校正値をヘッド移動機構24と対応させて表示する(ステップST20)。   When the control device 40 of the third electronic component mounting apparatus 12c images the calibration substrate C2, based on the obtained image of the calibration substrate C2, the position of the reference point C2H on the calibration substrate C2; A positional deviation amount from the actual mounting position (center position of the target C4) of each target C4 mounted with the target C2H as a target is obtained, and the position is determined for each head moving mechanism 24 involved in mounting the target C4. The deviation amount is divided into groups, statistical processing is performed for each group, and the calibration value of the control data for each head moving mechanism 24 is calculated. Specifically, the average value of the positional deviation amounts in the group is adopted as the calibration value. The control device 40 stores the calculated calibration value in the storage device 41, and displays the calibration value in association with the head moving mechanism 24 on the display device 50 (FIG. 4) connected to the control device 40 (step ST20).

第3の電子部品実装装置12cの制御装置40は、ステップST20で校正値の算出と表示を行ったら、校正用基板C2の搬出を行い(ステップST21)、これにより制御データの校正値の取得作業が終了する。   After calculating and displaying the calibration value in step ST20, the control device 40 of the third electronic component mounting apparatus 12c carries out the calibration substrate C2 (step ST21), thereby obtaining the calibration value of the control data. Ends.

このようにして取得した各電子部品実装装置12についての校正値はそれぞれ対応する電子部品実装装置12の制御装置40の記憶装置41に記憶され、これにより各ヘッド移動機構24の制御データの校正がなされる。なお、記憶装置41への校正値の記憶は、各電子部品実装装置12に接続する通信手段を介して自動で行われるようにしてもよいし、各電子部品実装装置12よりオペレータが手動で入力するようにしてもよい。   The calibration values for each electronic component mounting apparatus 12 obtained in this way are stored in the storage device 41 of the control device 40 of the corresponding electronic component mounting apparatus 12, whereby the control data of each head moving mechanism 24 is calibrated. Made. The storage of the calibration value in the storage device 41 may be automatically performed via a communication unit connected to each electronic component mounting device 12 or may be manually input by the operator from each electronic component mounting device 12. You may make it do.

ここで、ステップST19の工程及びステップST20の工程は第1の電子部品実装装置12aと第2の電子部品実装装置12bは行わず、第3の電子部品実装装置12cのみが行うようになっているが、これは、第3の電子部品実装装置12cが記憶する校正値取得プログラムPG2のみにステップST19の工程及びステップST20の工程の内容が記載されているのであってもよいし、3台の電子部品実装装置12ともステップST19の工程及びステップST20の工程の内容が記載されている共通の校正値取得プログラムPG2を記憶しているが、第1の電子部品実装装置12a及び第2の電子部品実装装置12bではステップST19の工程及びステップST20の工程を実行しない(或いは第3の電子部品実装装置12cのみがステップST19の工程及びステップST20の工程を実行する)ように校正値取得プログラムPG2の実行パターンを変えるようにしているのであってもよい。   Here, the process of step ST19 and the process of step ST20 are not performed by the first electronic component mounting apparatus 12a and the second electronic component mounting apparatus 12b, but only by the third electronic component mounting apparatus 12c. However, the content of the process of step ST19 and the process of step ST20 may be described only in the calibration value acquisition program PG2 stored in the third electronic component mounting apparatus 12c. Both the component mounting apparatus 12 stores a common calibration value acquisition program PG2 in which the contents of the process of step ST19 and the process of step ST20 are described, but the first electronic component mounting apparatus 12a and the second electronic component mounting are stored. The apparatus 12b does not execute the process of step ST19 and the process of step ST20 (or only the third electronic component mounting apparatus 12c). Step ST19 steps to the execution of step and step ST20) may be of so that changing the execution pattern of the calibration value acquisition program PG2 as.

以上説明したように、本実施の形態における電子部品実装ライン1は、上流工程側から送られてきた基板2を搬入して位置決めし、搭載ヘッド25によりピックアップした電子部品4を制御データに基づいて基板2に搭載した後、その基板2を下流工程側に搬出する電子部品搭載作業を行う電子部品実装装置12を複数台(ここでは3台)含んで構成されたものであり、その電子部品実装ライン1における校正値取得方法は、電子部品実装ライン1の上流工程側の電子部品実装装置12から下流工程側の電子部品実装装置12の順で校正用基板C2上の複数の標点C2Hに対する複数個ずつの標体C4の搭載を行う標体搭載工程(ステップST12、ステップST15及びステップST18)、電子部品実装ライン1の複数台の電子部品実装装置12の下流工程側に位置するカメラ(第3の電子部品実装装置12cが備える基板カメラ30)を用いて標体C4の搭載が終了した校正用基板C2の撮像を行う校正用基板撮像工程(ステップST19)及び校正用基板撮像工程で得られた校正用基板C2の画像に基づいて、校正用基板C2上の標点C2Hの位置とその標点C2Hを目標として搭載した各標体C4の実際の搭載位置との位置関係から標体搭載工程を行った各電子部品実装装置12の制御データの校正値を算出する校正値算出工程(ステップST20)を含むものとなっている。   As described above, the electronic component mounting line 1 in the present embodiment carries in and positions the substrate 2 sent from the upstream process side, and the electronic component 4 picked up by the mounting head 25 is based on the control data. The electronic component mounting apparatus 12 includes a plurality (three in this case) of electronic component mounting apparatuses 12 for performing an electronic component mounting operation for unloading the substrate 2 to the downstream process side after mounting on the substrate 2. The calibration value acquisition method in the line 1 includes a plurality of calibration points C2H on the calibration substrate C2 in order from the electronic component mounting apparatus 12 on the upstream process side to the electronic component mounting apparatus 12 on the downstream process side. A target mounting step (step ST12, step ST15 and step ST18) for mounting each target C4, mounting a plurality of electronic components on the electronic component mounting line 1 A calibration substrate imaging step (for imaging the calibration substrate C2 on which the target C4 has been mounted) using a camera (substrate camera 30 provided in the third electronic component mounting apparatus 12c) located on the downstream process side of the device 12 Based on the image of the calibration substrate C2 obtained in step ST19) and the calibration substrate imaging step, the position of the target C2H on the calibration substrate C2 and the actual of each target C4 mounted with the target C2H as a target. This includes a calibration value calculation step (step ST20) for calculating a calibration value of the control data of each electronic component mounting apparatus 12 that has performed the target mounting step from the positional relationship with the mounting position.

また、本実施の形態における電子部品実装ライン1における電子部品実装方法は、上記校正値取得方法の各工程(標体搭載工程、校正用基板撮像工程及び校正値算出工程)を含み、校正値算出工程で算出した校正値を対応する電子部品実装装置12に設定し、電子部品実装ライン1において電子部品実装装置12による電子部品搭載作業(ステップST1〜ステップST8)を行って基板2に電子部品4を搭載するものとなっている。   In addition, the electronic component mounting method in the electronic component mounting line 1 according to the present embodiment includes each step of the calibration value acquisition method (a specimen mounting step, a calibration board imaging step, and a calibration value calculation step), and calculates a calibration value. The calibration value calculated in the process is set in the corresponding electronic component mounting apparatus 12 and the electronic component mounting operation (step ST1 to step ST8) by the electronic component mounting apparatus 12 is performed on the electronic component mounting line 1 to mount the electronic component 4 on the board 2. Is supposed to be installed.

本実施の形態における校正値取得方法(電子部品実装方法)では、電子部品実装ライン1を構成する各電子部品実装装置12に電子部品搭載作業(ステップST1〜ステップST8)を行わせるときと同様に電子部品実装ライン1に校正用基板C2を投入して各電子部品実装装置12に校正用基板C2に対する複数個ずつの標体C4の搭載を行わせた後、3台の電子部品実装装置12の下流工程側に位置する基板カメラ30(最も下流工程側に位置する基板カメラ30)によって電子部品実装ライン1を構成する全ての電子部品実装装置12による標体C4の搭載が終了した校正用基板C2の撮像を行い、この撮像により得られた校正用基板C2の画像に基づいて、校正用基板C2上の標点C2Hの位置とその標点C2Hを目標として搭載した各標体C4の実際の搭載位置と校正用基板C2を基準とした各標体C4の目標搭載位置との位置関係から電子部品実装ライン1を構成する各電子部品実装装置12の制御データの校正値を取得するようにしており、従来のように、各電子部品実装装置12への校正用基板C2の設置と取り出し及び各電子部品実装装置12から取り出した校正用基板C2(標体C4が搭載された校正用基板C2)の検査装置への設置と取り出しを繰り返し実行する必要がないので、電子部品実装ライン1を構成する各電子部品実装装置12の校正値を簡単かつ短時間で取得することができる。   In the calibration value acquisition method (electronic component mounting method) in the present embodiment, each electronic component mounting apparatus 12 constituting the electronic component mounting line 1 performs the electronic component mounting work (step ST1 to step ST8). After the calibration board C2 is inserted into the electronic component mounting line 1 and each electronic component mounting apparatus 12 is loaded with a plurality of specimens C4 on the calibration board C2, the three electronic component mounting apparatuses 12 are connected. The calibration substrate C2 in which the mounting of the target C4 by all the electronic component mounting apparatuses 12 constituting the electronic component mounting line 1 is completed by the substrate camera 30 positioned on the downstream process side (the substrate camera 30 positioned on the most downstream process side). Based on the image of the calibration substrate C2 obtained by this imaging, the position of the reference point C2H on the calibration substrate C2 and the reference point C2H are mounted as targets. Calibration of control data of each electronic component mounting apparatus 12 constituting the electronic component mounting line 1 from the positional relationship between the actual mounting position of each target C4 and the target mounting position of each target C4 with reference to the calibration substrate C2. The value is acquired, and the calibration board C2 taken out from each electronic component mounting apparatus 12 (the target C4 is mounted) is installed and removed from each electronic component mounting apparatus 12 as in the prior art. Since it is not necessary to repeatedly perform installation and removal of the calibration board C2) on the inspection apparatus, the calibration values of the electronic component mounting apparatuses 12 constituting the electronic component mounting line 1 can be obtained easily and in a short time. Can do.

なお、上述の実施の形態では、電子部品実装装置12の下流工程側に位置するカメラとして電子部品実装装置12の基板カメラ30を使用した例で説明を行っているが、電子部品実装装置12の下流工程側に位置するカメラとして基板2上の電子部品4の搭載状態を検査する検査装置のカメラ等を使用するものであってもよい。   In the above-described embodiment, an example in which the board camera 30 of the electronic component mounting apparatus 12 is used as a camera located on the downstream process side of the electronic component mounting apparatus 12 is described. As a camera located on the downstream process side, a camera of an inspection apparatus that inspects the mounting state of the electronic component 4 on the substrate 2 may be used.

電子部品実装ラインを構成する各電子部品実装装置の校正値の取得作業を簡単かつ短時間で行うことができる電子部品実装ラインにおける校正値取得方法及び電子部品実装ラインによる電子部品実装方法を提供する。   Provided are a calibration value acquisition method in an electronic component mounting line and an electronic component mounting method by an electronic component mounting line, which can easily and quickly acquire a calibration value of each electronic component mounting apparatus constituting the electronic component mounting line. .

1 電子部品実装ライン
2 基板
4 電子部品
12 電子部品実装装置
25 搭載ヘッド
30 基板カメラ(カメラ)
C2 校正用基板
C2H 標点
C4 標体
DESCRIPTION OF SYMBOLS 1 Electronic component mounting line 2 Board | substrate 4 Electronic component 12 Electronic component mounting apparatus 25 Mounting head 30 Board | substrate camera (camera)
C2 Calibration board C2H Mark C4 Target

Claims (2)

上流工程側から送られてきた基板を搬入して位置決めし、搭載ヘッドによりピックアップした電子部品を制御データに基づいて前記基板に搭載した後、その基板を下流工程側に搬出する電子部品搭載作業を行う電子部品実装装置を複数台含んで構成された電子部品実装ラインにおける校正値取得方法であって、
前記電子部品実装ラインの上流工程側の電子部品実装装置から下流工程側の電子部品実装装置の順で校正用基板上の複数の標点に対する複数個ずつの標体の搭載を行う標体搭載工程と、
前記電子部品実装ラインの前記複数台の電子部品実装装置の下流工程側に位置するカメラを用いて前記標体の搭載が終了した前記校正用基板の撮像を行う校正用基板撮像工程と、
前記校正用基板撮像工程で得られた前記校正用基板の画像に基づいて、前記校正用基板上の前記標点の位置とその標点を目標として搭載した前記各標体の実際の搭載位置との位置関係から前記標体搭載工程を行った各電子部品実装装置の制御データの校正値を算出する校正値算出工程とを含むことを特徴とする電子部品実装ラインにおける校正値取得方法。
After loading and positioning the board sent from the upstream process side and mounting the electronic component picked up by the mounting head on the board based on the control data, the electronic component mounting work for unloading the board to the downstream process side is performed. A calibration value acquisition method in an electronic component mounting line configured to include a plurality of electronic component mounting devices to perform,
A target mounting process for mounting a plurality of targets on a plurality of target points on a calibration board in the order of an electronic component mounting apparatus on the upstream process side of the electronic component mounting line and an electronic component mounting apparatus on the downstream process side. When,
A calibration board imaging step for imaging the calibration board after the mounting of the target using a camera located on the downstream side of the plurality of electronic component mounting apparatuses in the electronic component mounting line;
Based on the image of the calibration substrate obtained in the calibration substrate imaging step, the position of the target on the calibration substrate and the actual mounting position of each target mounted with the target as a target; And a calibration value calculation step of calculating a calibration value of control data of each electronic component mounting apparatus that has performed the target mounting step based on the positional relationship between the electronic component mounting line and the electronic component mounting line.
上流工程側から送られてきた基板を搬入して位置決めし、搭載ヘッドによりピックアップした電子部品を制御データに基づいて前記基板に搭載した後、その基板を下流工程側に搬出する電子部品搭載作業を行う電子部品実装装置を複数台含んで構成された電子部品実装ラインによる電子部品実装方法であって、
前記電子部品実装ラインの上流工程側の電子部品実装装置から下流工程側の電子部品実装装置の順で校正用基板上の複数の標点に対する複数個ずつの標体の搭載を行う標体搭載工程と、
前記電子部品実装ラインの前記複数台の電子部品実装装置の下流工程側に位置するカメラを用いて前記標体の搭載が終了した前記校正用基板の撮像を行う校正用基板撮像工程と、
前記校正用基板撮像工程で得られた前記校正用基板の画像に基づいて、前記校正用基板上の前記標点の位置とその標点を目標として搭載した前記各標体の実際の搭載位置との位置関係から前記標体搭載工程を行った各電子部品実装装置の制御データの校正値を算出する校正値算出工程とを含み、
前記校正値算出工程で算出した前記校正値を対応する電子部品実装装置に設定し、前記電子部品実装ラインにおいて前記電子部品実装装置による前記電子部品搭載作業を行って前記基板に電子部品を搭載することを特徴とする電子部品実装ラインによる電子部品実装方法。
After loading and positioning the board sent from the upstream process side and mounting the electronic component picked up by the mounting head on the board based on the control data, the electronic component mounting work for unloading the board to the downstream process side is performed. An electronic component mounting method by an electronic component mounting line configured to include a plurality of electronic component mounting apparatuses to be performed,
A target mounting process for mounting a plurality of targets on a plurality of target points on a calibration board in the order of an electronic component mounting apparatus on the upstream process side of the electronic component mounting line and an electronic component mounting apparatus on the downstream process side. When,
A calibration board imaging step for imaging the calibration board after the mounting of the target using a camera located on the downstream side of the plurality of electronic component mounting apparatuses in the electronic component mounting line;
Based on the image of the calibration substrate obtained in the calibration substrate imaging step, the position of the target on the calibration substrate and the actual mounting position of each target mounted with the target as a target; A calibration value calculation step of calculating a calibration value of control data of each electronic component mounting apparatus that has performed the target mounting step from the positional relationship of,
The calibration value calculated in the calibration value calculation step is set in the corresponding electronic component mounting apparatus, and the electronic component mounting operation is performed by the electronic component mounting apparatus in the electronic component mounting line to mount the electronic component on the substrate. An electronic component mounting method using an electronic component mounting line.
JP2012126774A 2012-06-04 2012-06-04 Calibration value obtaining method in electronic component mounting line and electronic component mounting method on electronic component mounting line Pending JP2013251475A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012126774A JP2013251475A (en) 2012-06-04 2012-06-04 Calibration value obtaining method in electronic component mounting line and electronic component mounting method on electronic component mounting line
CN201310219004.4A CN103458672B (en) 2012-06-04 2013-06-04 Method of obtaining correction value and electronic component mounting method in electronic component installation line

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012126774A JP2013251475A (en) 2012-06-04 2012-06-04 Calibration value obtaining method in electronic component mounting line and electronic component mounting method on electronic component mounting line

Publications (1)

Publication Number Publication Date
JP2013251475A true JP2013251475A (en) 2013-12-12

Family

ID=49740481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012126774A Pending JP2013251475A (en) 2012-06-04 2012-06-04 Calibration value obtaining method in electronic component mounting line and electronic component mounting method on electronic component mounting line

Country Status (2)

Country Link
JP (1) JP2013251475A (en)
CN (1) CN103458672B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113811178A (en) * 2020-06-12 2021-12-17 先进装配系统有限责任两合公司 Recalibrating a pick-and-place machine in an actual pick-and-place operation

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3125663B1 (en) * 2014-03-28 2020-04-22 FUJI Corporation Cut-and-clinch apparatus and substrate work machine
JP5830637B1 (en) * 2014-04-28 2015-12-09 株式会社小滝電機製作所 Manufacturing method and manufacturing apparatus for substrate with positioning hole
CN111801993B (en) * 2018-03-13 2021-10-15 株式会社富士 Mounting device and mounting method
DE102019111580A1 (en) * 2018-05-28 2019-11-28 Besi Switzerland Ag Method for calibrating a device for mounting components

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002134899A (en) * 2000-10-25 2002-05-10 Matsushita Electric Ind Co Ltd Electronic component mounting system and method therefor
JP2005121478A (en) * 2003-10-16 2005-05-12 Hitachi High-Tech Instruments Co Ltd Method and apparatus for inspecting mounted component, and fixture substrate therefor
JP2005150378A (en) * 2003-11-14 2005-06-09 Ricoh Co Ltd Component-mounting apparatus
JP2006108457A (en) * 2004-10-07 2006-04-20 Juki Corp Mounting error detection method and device of electronic part mounting device
US7040137B1 (en) * 2001-09-05 2006-05-09 Universal Instruments Corporation Method for improving pick reliability in a component placement machine

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4326641B2 (en) * 1999-11-05 2009-09-09 富士機械製造株式会社 Mounting device, mounting accuracy detection jig set, and mounting accuracy detection method
WO2009041005A1 (en) * 2007-09-28 2009-04-02 Panasonic Corporation Inspection device and inspection method
JP2010251415A (en) * 2009-04-13 2010-11-04 Hitachi High-Technologies Corp Operation processor, or line or method for assembling display board module

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002134899A (en) * 2000-10-25 2002-05-10 Matsushita Electric Ind Co Ltd Electronic component mounting system and method therefor
US7040137B1 (en) * 2001-09-05 2006-05-09 Universal Instruments Corporation Method for improving pick reliability in a component placement machine
JP2005121478A (en) * 2003-10-16 2005-05-12 Hitachi High-Tech Instruments Co Ltd Method and apparatus for inspecting mounted component, and fixture substrate therefor
JP2005150378A (en) * 2003-11-14 2005-06-09 Ricoh Co Ltd Component-mounting apparatus
JP2006108457A (en) * 2004-10-07 2006-04-20 Juki Corp Mounting error detection method and device of electronic part mounting device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113811178A (en) * 2020-06-12 2021-12-17 先进装配系统有限责任两合公司 Recalibrating a pick-and-place machine in an actual pick-and-place operation

Also Published As

Publication number Publication date
CN103458672A (en) 2013-12-18
CN103458672B (en) 2017-11-03

Similar Documents

Publication Publication Date Title
JP5747164B2 (en) Electronic component mounting system
JP2007173552A (en) Electronic component packaging system and method therefor
JP2013251475A (en) Calibration value obtaining method in electronic component mounting line and electronic component mounting method on electronic component mounting line
JP5857190B2 (en) Electronic component mounting system
JP7129619B2 (en) COMPONENT MOUNTING SYSTEM, COMPONENT MOUNTING METHOD, AND CORRECTION VALUE CALCULATION DEVICE
JP2011124463A (en) Method of mounting component, and component mounter
WO2014119304A1 (en) Device for assisting determination of support pin positioning, and method for assisting determination of support pin positioning
JP5903588B2 (en) Arrangement decision support device and arrangement decision support method for receiving pin
JP5338767B2 (en) Calibration method for electronic component mounting apparatus
JP4810586B2 (en) Mounting machine
JP2013222920A (en) Position teaching device and position teaching method
JP5533550B2 (en) Component mounting apparatus and component mounting method
JP5861037B2 (en) Component mounting apparatus and component mounting method
JP2017092175A (en) Component mounter, component suction method
JP6735435B2 (en) Component mounting device and component mounting method
JP2013182969A (en) Component mounting system and component mounting method
JP2016001668A (en) Component mounting apparatus
JP6064168B2 (en) Mark imaging method and component mounting line
JP6334544B2 (en) Mounting line
JP2012199476A (en) Adhesive coating device
JP2012164908A (en) Component mounting apparatus and method, and method for teaching suction position for component mounting apparatus
JP5476610B2 (en) Component mounting system
JP2023066458A (en) Component mounting system, component mounting device, and component mounting method
JP2018018957A (en) Component mounting device and component mounting method
JP2023068698A (en) Component mounting system, component mounting device, and component mounting method

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20140807

RD01 Notification of change of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7421

Effective date: 20140912

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20141007

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20150522

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20150602

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150728

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20150825