JP2013186007A5 - - Google Patents

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Publication number
JP2013186007A5
JP2013186007A5 JP2012052311A JP2012052311A JP2013186007A5 JP 2013186007 A5 JP2013186007 A5 JP 2013186007A5 JP 2012052311 A JP2012052311 A JP 2012052311A JP 2012052311 A JP2012052311 A JP 2012052311A JP 2013186007 A5 JP2013186007 A5 JP 2013186007A5
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JP
Japan
Prior art keywords
reliability determination
output
spot
result
determination unit
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JP2012052311A
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English (en)
Japanese (ja)
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JP5895613B2 (ja
JP2013186007A (ja
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Priority claimed from JP2012052311A external-priority patent/JP5895613B2/ja
Priority to JP2012052311A priority Critical patent/JP5895613B2/ja
Priority to CN201380012447.4A priority patent/CN104160265B/zh
Priority to KR1020147023805A priority patent/KR102048599B1/ko
Priority to BR112014021383-6A priority patent/BR112014021383A2/pt
Priority to US14/383,601 priority patent/US9519822B2/en
Priority to EP13758079.1A priority patent/EP2824444B1/en
Priority to PCT/JP2013/056020 priority patent/WO2013133283A1/ja
Publication of JP2013186007A publication Critical patent/JP2013186007A/ja
Publication of JP2013186007A5 publication Critical patent/JP2013186007A5/ja
Publication of JP5895613B2 publication Critical patent/JP5895613B2/ja
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JP2012052311A 2012-03-08 2012-03-08 判定方法、判定装置、判定システム、および、プログラム Active JP5895613B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2012052311A JP5895613B2 (ja) 2012-03-08 2012-03-08 判定方法、判定装置、判定システム、および、プログラム
US14/383,601 US9519822B2 (en) 2012-03-08 2013-03-05 Determination method, determination device, determination system, and computer program
KR1020147023805A KR102048599B1 (ko) 2012-03-08 2013-03-05 판정 방법, 판정 장치, 판정 시스템 및 프로그램
BR112014021383-6A BR112014021383A2 (pt) 2012-03-08 2013-03-05 método, dispositivo e sistema de determinação e programa de computador
CN201380012447.4A CN104160265B (zh) 2012-03-08 2013-03-05 判定方法、判定装置、判定系统及程序
EP13758079.1A EP2824444B1 (en) 2012-03-08 2013-03-05 Determination method, determination device, determination system, and program
PCT/JP2013/056020 WO2013133283A1 (ja) 2012-03-08 2013-03-05 判定方法、判定装置、判定システム、および、プログラム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012052311A JP5895613B2 (ja) 2012-03-08 2012-03-08 判定方法、判定装置、判定システム、および、プログラム

Publications (3)

Publication Number Publication Date
JP2013186007A JP2013186007A (ja) 2013-09-19
JP2013186007A5 true JP2013186007A5 (enExample) 2015-04-16
JP5895613B2 JP5895613B2 (ja) 2016-03-30

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ID=49116758

Family Applications (1)

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JP2012052311A Active JP5895613B2 (ja) 2012-03-08 2012-03-08 判定方法、判定装置、判定システム、および、プログラム

Country Status (7)

Country Link
US (1) US9519822B2 (enExample)
EP (1) EP2824444B1 (enExample)
JP (1) JP5895613B2 (enExample)
KR (1) KR102048599B1 (enExample)
CN (1) CN104160265B (enExample)
BR (1) BR112014021383A2 (enExample)
WO (1) WO2013133283A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3023912B1 (fr) * 2014-07-18 2020-05-08 Thales Calcul de performance pour aeronef
JP6492501B2 (ja) * 2014-10-03 2019-04-03 ニプロ株式会社 判定装置、判定方法及びコンピュータプログラム
JP6609954B2 (ja) * 2015-03-26 2019-11-27 東洋製罐グループホールディングス株式会社 Ｄｎａチップ画像のスポット有効性判定装置、ｄｎａチップ画像のスポット有効性判定方法、及びｄｎａチップ画像のスポット有効性判定プログラ
CN110443787B (zh) * 2019-07-30 2023-05-26 云谷（固安）科技有限公司 矫正装置和矫正方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6251601B1 (en) * 1999-02-02 2001-06-26 Vysis, Inc. Simultaneous measurement of gene expression and genomic abnormalities using nucleic acid microarrays
US7130458B2 (en) * 2000-10-24 2006-10-31 Affymetrix, Inc. Computer software system, method, and product for scanned image alignment
JP4356270B2 (ja) * 2001-07-31 2009-11-04 東亞合成株式会社 アレイにおけるスポットの均一性評価方法
US7031844B2 (en) 2002-03-18 2006-04-18 The Board Of Regents Of The University Of Nebraska Cluster analysis of genetic microarray images
JP4244788B2 (ja) 2002-11-22 2009-03-25 東レ株式会社 選択結合性物質が固定化された基材
JP2006084281A (ja) * 2004-09-15 2006-03-30 Hitachi Software Eng Co Ltd スポット画像認識方法及びスポット画像認識システム
JP4984729B2 (ja) * 2006-08-07 2012-07-25 東レ株式会社 帯電防止性カバーを有するマイクロアレイ
US7796804B2 (en) * 2007-07-20 2010-09-14 Kla-Tencor Corp. Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer
JP4979516B2 (ja) * 2007-08-31 2012-07-18 三菱レイヨン株式会社 画像読み取り方法および装置
JP5433159B2 (ja) * 2008-03-26 2014-03-05 東洋鋼鈑株式会社 マイクロアレイの測定方法
WO2010043348A2 (en) * 2008-10-13 2010-04-22 Roche Diagnostics Gmbh Algorithms for classification of disease subtypes and for prognosis with gene expression profiling
US20100304997A1 (en) * 2009-05-27 2010-12-02 Fujifilm Corporation Method for detecting abnormal spots of nucleic acid microarray
JP5765841B2 (ja) * 2009-05-27 2015-08-19 富士フイルム株式会社 核酸マイクロアレイの品質検査方法
US20140307931A1 (en) * 2013-04-15 2014-10-16 Massachusetts Institute Of Technology Fully automated system and method for image segmentation and quality control of protein microarrays

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