JP2013113583A5 - - Google Patents
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- JP2013113583A5 JP2013113583A5 JP2011256775A JP2011256775A JP2013113583A5 JP 2013113583 A5 JP2013113583 A5 JP 2013113583A5 JP 2011256775 A JP2011256775 A JP 2011256775A JP 2011256775 A JP2011256775 A JP 2011256775A JP 2013113583 A5 JP2013113583 A5 JP 2013113583A5
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- JP
- Japan
- Prior art keywords
- light
- slit
- slit portion
- spectroscopic
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- Prior art date
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- 230000003595 spectral effect Effects 0.000 claims 2
- 239000006185 dispersion Substances 0.000 claims 1
- 230000007935 neutral effect Effects 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011256775A JP2013113583A (ja) | 2011-11-24 | 2011-11-24 | 分光器 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011256775A JP2013113583A (ja) | 2011-11-24 | 2011-11-24 | 分光器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013113583A JP2013113583A (ja) | 2013-06-10 |
| JP2013113583A5 true JP2013113583A5 (enExample) | 2014-07-03 |
Family
ID=48709264
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011256775A Pending JP2013113583A (ja) | 2011-11-24 | 2011-11-24 | 分光器 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2013113583A (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105938013B (zh) * | 2016-04-20 | 2019-12-17 | 杭州远方光电信息股份有限公司 | 一种光谱仪及其校正方法 |
| CN112213272B (zh) * | 2019-07-10 | 2024-01-12 | 中微半导体设备(上海)股份有限公司 | 一种光谱检测设备、终点检测系统和方法 |
| CN118882818A (zh) * | 2024-07-16 | 2024-11-01 | 广东中科谛听科技有限公司 | 一种用于光谱仪的光学强度监测与校正装置 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58190731A (ja) * | 1982-04-30 | 1983-11-07 | Shimadzu Corp | パツシエンルンゲ形分光器 |
| JP3035388B2 (ja) * | 1991-09-02 | 2000-04-24 | オリンパス光学工業株式会社 | プラズマエッチャーのエンドポイント検出装置 |
| JP3043129B2 (ja) * | 1991-09-05 | 2000-05-22 | オリンパス光学工業株式会社 | プラズマエッチャーのエンドポイント検出装置 |
| JPH06109538A (ja) * | 1992-09-30 | 1994-04-19 | Shimadzu Corp | 分光分析装置 |
| JP3912801B2 (ja) * | 1994-06-27 | 2007-05-09 | 横河電機株式会社 | 光スペクトル測定装置 |
| JP3193265B2 (ja) * | 1995-05-20 | 2001-07-30 | 東京エレクトロン株式会社 | プラズマエッチング装置 |
| JP2003214951A (ja) * | 2002-01-28 | 2003-07-30 | Matsushita Electric Works Ltd | 分光計測装置及び分光計測方法 |
| JP2006201127A (ja) * | 2005-01-24 | 2006-08-03 | Maki Mfg Co Ltd | 分光装置 |
-
2011
- 2011-11-24 JP JP2011256775A patent/JP2013113583A/ja active Pending
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