JP2013108833A5 - - Google Patents

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Publication number
JP2013108833A5
JP2013108833A5 JP2011253736A JP2011253736A JP2013108833A5 JP 2013108833 A5 JP2013108833 A5 JP 2013108833A5 JP 2011253736 A JP2011253736 A JP 2011253736A JP 2011253736 A JP2011253736 A JP 2011253736A JP 2013108833 A5 JP2013108833 A5 JP 2013108833A5
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JP
Japan
Prior art keywords
light
unit
gas cell
irradiation
magnetic field
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JP2011253736A
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English (en)
Japanese (ja)
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JP5849640B2 (ja
JP2013108833A (ja
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Priority to JP2011253736A priority Critical patent/JP5849640B2/ja
Priority claimed from JP2011253736A external-priority patent/JP5849640B2/ja
Publication of JP2013108833A publication Critical patent/JP2013108833A/ja
Publication of JP2013108833A5 publication Critical patent/JP2013108833A5/ja
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Publication of JP5849640B2 publication Critical patent/JP5849640B2/ja
Expired - Fee Related legal-status Critical Current
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JP2011253736A 2011-11-21 2011-11-21 磁場測定装置 Expired - Fee Related JP5849640B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011253736A JP5849640B2 (ja) 2011-11-21 2011-11-21 磁場測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011253736A JP5849640B2 (ja) 2011-11-21 2011-11-21 磁場測定装置

Publications (3)

Publication Number Publication Date
JP2013108833A JP2013108833A (ja) 2013-06-06
JP2013108833A5 true JP2013108833A5 (https=) 2014-12-25
JP5849640B2 JP5849640B2 (ja) 2016-01-27

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ID=48705734

Family Applications (1)

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JP2011253736A Expired - Fee Related JP5849640B2 (ja) 2011-11-21 2011-11-21 磁場測定装置

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JP (1) JP5849640B2 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6459167B2 (ja) * 2013-11-27 2019-01-30 セイコーエプソン株式会社 磁場測定装置および磁場測定方法
US9964604B2 (en) 2014-11-12 2018-05-08 Seiko Epson Corporation Magnetic field measurement method and magnetic field measurement device for measuring and offsetting original magnetic field
JP6550925B2 (ja) * 2014-11-12 2019-07-31 セイコーエプソン株式会社 磁場計測方法及び磁場計測装置
US10254356B2 (en) 2014-12-02 2019-04-09 Seiko Epson Corporation Magnetic field measurement method and magnetic field measurement apparatus
JP6597034B2 (ja) * 2014-12-02 2019-10-30 セイコーエプソン株式会社 磁場計測方法及び磁場計測装置
US10024931B2 (en) 2014-12-02 2018-07-17 Seiko Epson Corporation Magnetic field measurement method and magnetic field measurement apparatus
JP6825241B2 (ja) 2016-06-21 2021-02-03 セイコーエプソン株式会社 磁場計測装置、磁場計測装置の製造方法
KR20230048372A (ko) 2020-08-04 2023-04-11 유니버시티 오브 매릴랜드, 칼리지 파크 전체-필드 브릴루앙 현미경 시스템 및 방법

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5005256B2 (ja) * 2005-11-28 2012-08-22 株式会社日立ハイテクノロジーズ 磁場計測システム及び光ポンピング磁束計
JP5707021B2 (ja) * 2008-09-30 2015-04-22 株式会社日立ハイテクノロジーズ 磁場計測装置
JP5640335B2 (ja) * 2009-06-26 2014-12-17 セイコーエプソン株式会社 磁気センサー

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