JP2013076670A - ゼータ電位測定方法及びゼータ電位測定システム - Google Patents
ゼータ電位測定方法及びゼータ電位測定システム Download PDFInfo
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Abstract
【解決手段】実施形態に係るゼータ電位測定方法は、粒子を含む懸濁液に電界を印加しながら、懸濁液中の位置における圧力に関連するパラメータの経時変化を測定するステップと、パラメータの経時変化と粒子の粒度分布とを用いて、粒子の粒径ごとのゼータ電位を算出するステップとを含む。
【選択図】図1
Description
図1は、第1実施形態に係るゼータ電位測定システムを模式的に示す図である。図2は、図1の一部を拡大した図である。図1に示されるゼータ電位測定システム10では沈降天秤法が用いられている。ゼータ電位測定システム10は、電極44,46と、測定装置36と、演算装置38とを備える。ゼータ電位測定システム10は、必要に応じて電荷付与装置12を備えてもよい。
ζ=aDp 2+bDp+c (3)
図9は、第2実施形態に係るゼータ電位測定システムを模式的に示す図である。図9に示されるゼータ電位測定システム10Aは、検出容器32、支持ワイヤ34及び測定装置36に代えて圧力検知部54、支持部材52及び測定装置50を備えること以外は、図1に示されるゼータ電位測定システム10と同一の構成を備えている。よって、ゼータ電位測定システム10Aは、検出容器32、支持ワイヤ34及び測定装置36を除くゼータ電位測定システム10の構成に基づく作用効果と同様の作用効果を少なくとも奏する。
Claims (8)
- 粒子を含む懸濁液に電界を印加しながら、前記懸濁液中の位置における圧力に関連するパラメータの経時変化を測定するステップと、
前記パラメータの経時変化と前記粒子の粒度分布とを用いて、前記粒子の粒径ごとのゼータ電位を算出するステップと、
を含む、ゼータ電位測定方法。 - 前記パラメータの経時変化を測定する前に、前記懸濁液中の前記粒子に電荷を付与するステップを更に含む、請求項1に記載のゼータ電位測定方法。
- 前記パラメータが、前記懸濁液中の位置に配置された物体の重量である、請求項1又は2に記載のゼータ電位測定方法。
- 前記パラメータが、前記懸濁液中の位置における圧力である、請求項1又は2に記載のゼータ電位測定方法。
- 粒子を含む懸濁液に電界を印加するための電極と、
前記懸濁液中の位置における圧力に関連するパラメータの経時変化を測定する測定装置と、
前記パラメータの経時変化と前記粒子の粒度分布とを用いて、前記粒子の粒径ごとのゼータ電位を算出する演算装置と、
を備える、ゼータ電位測定システム。 - 前記懸濁液中の前記粒子に電荷を付与する電荷付与装置を更に備える、請求項5に記載のゼータ電位測定システム。
- 前記測定装置が、前記懸濁液中の位置に配置された物体の重量を測定する秤である、請求項5又は6に記載のゼータ電位測定システム。
- 前記測定装置が、前記懸濁液中の位置において圧力の経時変化を測定する圧力センサである、請求項5又は6に記載のゼータ電位測定システム。
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DE102014001759A1 (de) * | 2014-02-10 | 2015-08-13 | Particle Metrix Gmbh | Verfahren und Vorrichtung zur schnellen Analyse der Ladungscharakteristik und der Größenverteilung von Partikeln |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH07128215A (ja) * | 1993-10-29 | 1995-05-19 | Shimadzu Corp | 懸濁粒子分析方法および装置 |
JP2002236088A (ja) * | 2001-02-08 | 2002-08-23 | Univ Hiroshima | 粉体粒子の粒度分布測定装置 |
JP2009014548A (ja) * | 2007-07-05 | 2009-01-22 | Nsk Ltd | ゼータ電位の測定方法、グリースの調製方法および軸受の製造方法 |
JP2011125801A (ja) * | 2009-12-18 | 2011-06-30 | Denki Kagaku Kogyo Kk | 湿式分級装置及びその湿式分級方法 |
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Publication number | Priority date | Publication date | Assignee | Title |
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JPH07128215A (ja) * | 1993-10-29 | 1995-05-19 | Shimadzu Corp | 懸濁粒子分析方法および装置 |
JP2002236088A (ja) * | 2001-02-08 | 2002-08-23 | Univ Hiroshima | 粉体粒子の粒度分布測定装置 |
JP2009014548A (ja) * | 2007-07-05 | 2009-01-22 | Nsk Ltd | ゼータ電位の測定方法、グリースの調製方法および軸受の製造方法 |
JP2011125801A (ja) * | 2009-12-18 | 2011-06-30 | Denki Kagaku Kogyo Kk | 湿式分級装置及びその湿式分級方法 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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DE102014001759A1 (de) * | 2014-02-10 | 2015-08-13 | Particle Metrix Gmbh | Verfahren und Vorrichtung zur schnellen Analyse der Ladungscharakteristik und der Größenverteilung von Partikeln |
DE102014001759B4 (de) * | 2014-02-10 | 2016-01-07 | Particle Metrix Gmbh | Verfahren und Vorrichtung zur schnellen Analyse der Ladungscharakteristik und der Größenverteilung von Partikeln |
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