JP2013041946A5 - - Google Patents

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Publication number
JP2013041946A5
JP2013041946A5 JP2011177251A JP2011177251A JP2013041946A5 JP 2013041946 A5 JP2013041946 A5 JP 2013041946A5 JP 2011177251 A JP2011177251 A JP 2011177251A JP 2011177251 A JP2011177251 A JP 2011177251A JP 2013041946 A5 JP2013041946 A5 JP 2013041946A5
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JP
Japan
Prior art keywords
openings
charged particle
substrate
particle beams
electrode plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2011177251A
Other languages
English (en)
Japanese (ja)
Other versions
JP5777445B2 (ja
JP2013041946A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2011177251A priority Critical patent/JP5777445B2/ja
Priority claimed from JP2011177251A external-priority patent/JP5777445B2/ja
Priority to US13/550,702 priority patent/US8686378B2/en
Priority to KR1020120085129A priority patent/KR20130018134A/ko
Publication of JP2013041946A publication Critical patent/JP2013041946A/ja
Publication of JP2013041946A5 publication Critical patent/JP2013041946A5/ja
Application granted granted Critical
Publication of JP5777445B2 publication Critical patent/JP5777445B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2011177251A 2011-08-12 2011-08-12 荷電粒子線描画装置及び物品の製造方法 Expired - Fee Related JP5777445B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011177251A JP5777445B2 (ja) 2011-08-12 2011-08-12 荷電粒子線描画装置及び物品の製造方法
US13/550,702 US8686378B2 (en) 2011-08-12 2012-07-17 Charged particle beam drawing apparatus, and method of manufacturing article
KR1020120085129A KR20130018134A (ko) 2011-08-12 2012-08-03 하전 입자 빔 묘화 장치 및 물품 제조 방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011177251A JP5777445B2 (ja) 2011-08-12 2011-08-12 荷電粒子線描画装置及び物品の製造方法

Publications (3)

Publication Number Publication Date
JP2013041946A JP2013041946A (ja) 2013-02-28
JP2013041946A5 true JP2013041946A5 (cg-RX-API-DMAC7.html) 2014-09-25
JP5777445B2 JP5777445B2 (ja) 2015-09-09

Family

ID=47677740

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011177251A Expired - Fee Related JP5777445B2 (ja) 2011-08-12 2011-08-12 荷電粒子線描画装置及び物品の製造方法

Country Status (3)

Country Link
US (1) US8686378B2 (cg-RX-API-DMAC7.html)
JP (1) JP5777445B2 (cg-RX-API-DMAC7.html)
KR (1) KR20130018134A (cg-RX-API-DMAC7.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013008878A (ja) * 2011-06-24 2013-01-10 Canon Inc 描画装置、物品の製造方法、及び処理装置
JP2014140009A (ja) * 2012-12-19 2014-07-31 Canon Inc 描画装置、及び物品の製造方法
US9981293B2 (en) 2016-04-21 2018-05-29 Mapper Lithography Ip B.V. Method and system for the removal and/or avoidance of contamination in charged particle beam systems

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001144000A (ja) * 1999-11-16 2001-05-25 Nikon Corp 荷電粒子線転写装置及びそのクリーニング方法並びにそれを用いるデバイス製造方法
JP2001283756A (ja) * 2000-03-31 2001-10-12 Canon Inc 電子光学系アレイ、これを用いた荷電粒子線露光装置ならびにデバイス製造方法
KR20030028461A (ko) * 2000-04-04 2003-04-08 주식회사 아도반테스토 다축전자렌즈를 이용한 멀티빔 노광장치, 반도체소자제조방법
JP3728217B2 (ja) 2000-04-27 2005-12-21 キヤノン株式会社 荷電粒子線露光装置およびデバイス製造方法
US7049585B2 (en) * 2000-07-27 2006-05-23 Ebara Corporation Sheet beam-type testing apparatus
JP4459568B2 (ja) * 2003-08-06 2010-04-28 キヤノン株式会社 マルチ荷電ビームレンズおよびそれを用いた荷電ビーム露光装置
KR101481950B1 (ko) * 2008-02-26 2015-01-14 마퍼 리쏘그라피 아이피 비.브이. 투사 렌즈 배열체

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