JP2013004798A - Circuit board - Google Patents

Circuit board Download PDF

Info

Publication number
JP2013004798A
JP2013004798A JP2011135359A JP2011135359A JP2013004798A JP 2013004798 A JP2013004798 A JP 2013004798A JP 2011135359 A JP2011135359 A JP 2011135359A JP 2011135359 A JP2011135359 A JP 2011135359A JP 2013004798 A JP2013004798 A JP 2013004798A
Authority
JP
Japan
Prior art keywords
solder resist
mounting surface
circuit board
resin
chip component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2011135359A
Other languages
Japanese (ja)
Inventor
Naohide Miyata
直秀 宮田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Priority to JP2011135359A priority Critical patent/JP2013004798A/en
Publication of JP2013004798A publication Critical patent/JP2013004798A/en
Pending legal-status Critical Current

Links

Images

Abstract

PROBLEM TO BE SOLVED: To solve the problem in a conventional circuit board that when resin is filled in a bump junction space between the component side and the surface of a board, the resin is not filled at an even permeation speed.SOLUTION: A circuit board 11 has a solder resist 16 formed in shape of a window frame in a plan view on the board surface around lands 15. The solder resist 16 has an opening region 16a shaped like a rectangle in a plan view on the board surface including the lands 15, in which no solder resist material is applied. The solder resist 16 is set in such a way that a region D overlapping a board component side 13a of a chip component 12 has a length of 0 mm to 0.1 mm, both ends inclusive, in the direction toward the opening region 16a. This length is set equally on four sides around the opening region 16a, and the opening region 16a is approximately the same in size as the board component side 13a of the chip component 12. Therefore, the speeds at which resin permeates into a minute gap S and into a space K become almost equal, so that the resin is evenly filled in spaces beneath the chip component 12.

Description

本発明は、チップ部品の基板実装面とこの基板実装面に対向する基板表面との間の空間に樹脂が充填される回路基板に関するものである。   The present invention relates to a circuit board in which resin is filled in a space between a substrate mounting surface of a chip component and a substrate surface facing the substrate mounting surface.

従来、この種の回路基板としては、例えば、図1(a)に平面図、同図(b)に断面図が示された特許文献1に開示されたものがある。   Conventionally, as this type of circuit board, for example, there is one disclosed in Patent Document 1 in which a plan view is shown in FIG. 1A and a cross-sectional view is shown in FIG.

この回路基板1は、ボール・グリッド・アレイ(BGA)2がチップ部品として半田リフロー処理によって実装される。BGA2は基板実装面2aに半田バンプ3が接続端子部としてアレイ状に設けられ、回路基板1は、BGA2を実装するためのパッド4と、当該パッド4および外部端子を接続するための配線5と、ソルダーレジスト6とを含んで構成される。ソルダーレジスト6は、パッド4および配線5を一括的に露出させるための開口部6aを有している。BGA2が実装される箇所の回路基板1には、エッジショートの発生を有効に防止するため、実装領域の外周から内側領域に向かって少なくとも0.1mmの地点に、ソルダーレジスト6またはその端部が存在する。また、外周から内側領域に向かって過度にソルダーレジスト6が存在すると、パッド4や配線5を設計する際に過度に制限を受けるため、ソルダーレジスト6またはその端部は外周から内側領域に向かって0.1mm〜1mmの地点に存在する。   The circuit board 1 is mounted with a ball grid array (BGA) 2 as a chip component by a solder reflow process. The BGA 2 has solder bumps 3 provided as connection terminals on the board mounting surface 2a in an array, and the circuit board 1 has pads 4 for mounting the BGA 2 and wirings 5 for connecting the pads 4 and external terminals. And the solder resist 6. The solder resist 6 has an opening 6a for exposing the pad 4 and the wiring 5 collectively. In the circuit board 1 where the BGA 2 is mounted, in order to effectively prevent the occurrence of an edge short circuit, the solder resist 6 or its end is located at a point of at least 0.1 mm from the outer periphery of the mounting region to the inner region. Exists. Further, if the solder resist 6 is excessively present from the outer periphery toward the inner region, the solder resist 6 or the end thereof is directed from the outer periphery toward the inner region because the pad 4 and the wiring 5 are excessively limited. It exists at a point of 0.1 mm to 1 mm.

特開2004−134648号公報JP 2004-134648 A

しかしながら、上記従来の特許文献1に開示された回路基板1は、製品の高機能・軽薄短小化に対応して接続端子ピッチの狭ピッチ(低背)化がされた部品において、基板実装面2aとこの基板実装面2aに対向する回路基板1の基板表面との間の、BGA2の下部空間に、アンダーフィルと呼ばれる樹脂を充填する際、樹脂が均一の浸透速度で充填されないという問題が生じる。例えば、図1(a)に示すように、同図の白抜き矢印Aの方向からBGA2の下部空間に樹脂を充填する場合には、基板実装面2aの周囲とソルダーレジスト6の上面との間の狭い隙間を浸透する、同図の長い矢印aの長さで示される樹脂の浸透速度は、基板実装面2aと基板表面との間の広い空間を浸透する同図の短い矢印bの長さで示される樹脂の浸透速度よりも速くなる。このため、基板実装面2aとソルダーレジスト6とが重なる領域に先に樹脂が充填され、これに遅れて基板実装面2aと基板表面との間の空間に樹脂が充填される。この結果、上記従来の特許文献1に開示された回路基板1は、狭ピッチ(低背)化がなされたBGA2の下部空間に充填される樹脂にボイドなどが形成されるなどして、樹脂の未充填箇所が生じ、半田バンプ3とパッド4との接続部における熱サイクル試験などで性能確認される接続信頼性が低下するといった不具合を生じる。また、半田バンプ3を再溶融させた際にも不具合を生じる事となる。   However, the circuit board 1 disclosed in the above-mentioned conventional patent document 1 is a board mounting surface 2a in a component in which the connection terminal pitch is narrowed (low profile) corresponding to the high functionality, lightness, and shortening of the product. When the resin called the underfill is filled in the lower space of the BGA 2 between the circuit board 1 and the substrate surface facing the substrate mounting surface 2a, there is a problem that the resin is not filled at a uniform penetration rate. For example, as shown in FIG. 1A, when the resin is filled into the lower space of the BGA 2 from the direction of the white arrow A in the same figure, the space between the periphery of the substrate mounting surface 2a and the upper surface of the solder resist 6 The penetration speed of the resin indicated by the length of the long arrow a in the figure, which penetrates the narrow gap of the figure, is the length of the short arrow b in the figure that penetrates the wide space between the board mounting surface 2a and the board surface. It becomes faster than the penetration rate of the resin indicated by For this reason, the region where the board mounting surface 2a and the solder resist 6 overlap is filled with resin first, and the space between the board mounting surface 2a and the board surface is filled with resin later. As a result, the circuit board 1 disclosed in the above-described conventional patent document 1 has a resin or the like formed in a void or the like in the resin filled in the lower space of the BGA 2 having a narrow pitch (low profile). An unfilled portion is generated, resulting in a problem that the connection reliability of which performance is confirmed by a thermal cycle test or the like at the connection portion between the solder bump 3 and the pad 4 is lowered. In addition, when the solder bump 3 is remelted, a problem occurs.

本発明はこのような課題を解決するためになされたもので、
チップ部品の基板実装面に配列された接続端子部と半田接続される、基板表面に複数形成されたランドと、
半田レジスト材が付されない開口部領域をランドを含む基板表面に有してランドの周囲の基板表面に形成された、開口部領域がチップ部品の基板実装面と略同じ大きさの半田レジスト、例えば、チップ部品の基板実装面と重なる領域の、開口部領域に向かう方向の長さが0mm以上で0.1mm以下の半田レジストとを備えて、
チップ部品の基板実装面とこの基板実装面に対向する基板表面との間の空間に樹脂が均一に充填される回路基板を構成した。
The present invention has been made to solve such problems,
A plurality of lands formed on the substrate surface, which are solder-connected to connection terminal portions arranged on the substrate mounting surface of the chip component;
A solder resist having an opening region to which a solder resist material is not attached and formed on the substrate surface around the land and having an opening region approximately the same size as the substrate mounting surface of the chip component, for example, And a solder resist having a length in the direction toward the opening region of the region overlapping the substrate mounting surface of the chip component of 0 mm or more and 0.1 mm or less,
A circuit board was configured in which the resin was uniformly filled in the space between the substrate mounting surface of the chip component and the substrate surface facing the substrate mounting surface.

本構成によれば、基板表面に形成された半田レジストの、半田レジスト材が付されない開口部領域が、チップ部品の基板実装面と略同じ大きさであるため、基板実装面と半田レジストとが重なる領域は、極僅かになる。チップ部品の基板実装面とこの基板実装面に対向する基板表面との間の空間に充填される樹脂は、毛細管現象によってこの空間に浸透するが、この空間に浸透する際に経由する基板実装面と半田レジストとの間の隙間が極僅かになるので、この隙間による毛細管現象の作用は弱まる。このため、基板実装面と半田レジストとが重なる極僅かな領域に樹脂が浸透する速度と、基板実装面と基板表面との間の空間に樹脂が浸透する速度はほぼ等しくなり、ほぼ均一の浸透速度で樹脂が浸透して行き、チップ部品の下部に樹脂が均等に充填される。この結果、従来の回路基板のように、チップ部品の下部空間に充填される樹脂にボイドなどの未充填箇所が生じなくなり、接続端子部とランドとの接続信頼性を大きく向上させる事が可能となる。また、樹脂の充填硬化後に接続端子部を再溶融させた際の不具合も抑制することが可能となる。   According to this configuration, since the opening region of the solder resist formed on the substrate surface to which the solder resist material is not applied is substantially the same size as the substrate mounting surface of the chip component, the substrate mounting surface and the solder resist are The overlapping area is negligible. Resin filled in the space between the substrate mounting surface of the chip component and the substrate surface facing this substrate mounting surface penetrates into this space by capillary action, but the substrate mounting surface through which this space passes Since the gap between the solder resist and the solder resist becomes extremely small, the action of the capillary phenomenon due to this gap is weakened. For this reason, the speed at which the resin penetrates into a very small area where the board mounting surface and the solder resist overlap, and the speed at which the resin penetrates into the space between the board mounting surface and the board surface are substantially equal, and the uniform penetration. The resin penetrates at a speed, and the resin is evenly filled in the lower part of the chip part. As a result, unlike the conventional circuit board, the resin filled in the lower space of the chip component does not have an unfilled portion such as a void, and the connection reliability between the connection terminal portion and the land can be greatly improved. Become. In addition, it is possible to suppress problems caused when the connection terminal portion is remelted after the resin is filled and cured.

また、本発明は、基板実装面の基板表面からの高さが、基板実装面と半田レジストとの間に形成される隙間を介して前記空間に充填される樹脂の浸透速度が前記隙間と前記空間とで顕著な違いを生じる所定値以下で、チップ部品が実装されることを特徴とする。   Further, according to the present invention, the height of the substrate mounting surface from the substrate surface is such that the penetration rate of the resin filled in the space through the gap formed between the substrate mounting surface and the solder resist is The chip component is mounted at a predetermined value or less that causes a remarkable difference with the space.

基板実装面の基板表面からの高さが所定値以下でチップ部品が実装されると、チップ部品の下部空間に充填される樹脂の浸透速度は、基板実装面と半田レジストとの間に形成される隙間と、基板実装面と基板表面との間の空間とで顕著な違いが生じる。しかし、半田レジストの開口部領域がチップ部品の基板実装面と略同じ大きさをした本構成の回路基板によれば、上記のように、基板実装面と半田レジストとの間の隙間が極僅かになるので、この隙間による毛細管現象の作用は弱まり、チップ部品下面の基板実装面全面においてほぼ均一の浸透速度で樹脂が浸透して、チップ部品の下部に樹脂が均等に充填される本発明の上記効果が顕著に現れる。   When a chip component is mounted with the height of the substrate mounting surface from the substrate surface below a predetermined value, the penetration rate of the resin filled in the lower space of the chip component is formed between the substrate mounting surface and the solder resist. There is a significant difference between the gap and the space between the board mounting surface and the board surface. However, according to the circuit board of this configuration in which the opening area of the solder resist is approximately the same size as the board mounting surface of the chip component, the gap between the board mounting surface and the solder resist is very small as described above. Therefore, the action of the capillary phenomenon due to this gap is weakened, and the resin penetrates at a substantially uniform penetration speed over the entire board mounting surface on the lower surface of the chip component, so that the resin is evenly filled in the lower part of the chip component. The above effect appears remarkably.

また、本発明は、少なくとも1つのランドに接続される開口部領域に形成された配線と、配線を覆う半田レジスト被覆とを備えることを特徴とする。   In addition, the present invention is characterized by comprising a wiring formed in an opening region connected to at least one land, and a solder resist coating covering the wiring.

本構成によれば、半田レジストの開口部領域における、ランドに接続される配線は、半田レジスト被覆によって覆われるため、半田レジストの開口部領域において半田接続される導体は、各ランドのみが露出した状態になり、各ランドの面積は均一化される。このため、チップ部品の基板実装面にほぼ同じ半田体積で設けられた各接続端子部は、配線には半田接続されずに、ほぼ同じ面積で基板表面に形成された各ランドにのみ半田接続され、各ランドにおいてほぼ均一の面積で半田接合する。この結果、チップ部品の回路基板表面への実装時、各接続端子部と各ランドとの半田接合形状も同じ形状に均一化され、各接続端子部と各ランドとの半田接合の安定性が向上し、半田接続の信頼性が向上する。   According to this configuration, since the wiring connected to the land in the opening area of the solder resist is covered with the solder resist coating, only each land is exposed as the conductor to be soldered in the opening area of the solder resist. As a result, the area of each land is made uniform. For this reason, each connection terminal portion provided on the board mounting surface of the chip component with substantially the same solder volume is not solder-connected to the wiring, but is solder-connected only to each land formed on the board surface with substantially the same area. In each land, solder bonding is performed with a substantially uniform area. As a result, when the chip component is mounted on the circuit board surface, the solder joint shape between each connection terminal portion and each land is made uniform, and the stability of the solder joint between each connection terminal portion and each land is improved. In addition, the reliability of solder connection is improved.

本発明の回路基板によれば、上記のように、チップ部品の下部空間に充填される樹脂にボイドなどの未充填箇所が従来の回路基板のように生じなくなり、チップ部品の基板実装面に配列された接続端子部とランドとの接続信頼性を大きく向上させる事が可能となる。また、接続端子部を再溶融させた際にも不具合を抑制することができる。   According to the circuit board of the present invention, as described above, an unfilled portion such as a void does not occur in the resin filled in the lower space of the chip component as in the conventional circuit board, and is arranged on the board mounting surface of the chip component. It is possible to greatly improve the connection reliability between the connected terminal portion and the land. In addition, it is possible to suppress problems even when the connection terminal portion is remelted.

(a)は従来の回路基板の平面図、(b)は断面図である。(A) is a top view of the conventional circuit board, (b) is sectional drawing. (a)は本発明の一実施の形態による回路基板の平面図、(b)は断面図である。(A) is a top view of the circuit board by one embodiment of the present invention, and (b) is a sectional view. (a)はチップ部品が実装されていない状態の一実施の形態による回路基板の平面図、(b)は半田接合面積の相違を説明するための断面図である。(A) is a top view of the circuit board by one Embodiment in which the chip components are not mounted, (b) is sectional drawing for demonstrating the difference in a solder joint area.

次に、本発明による回路基板を実施するための形態について説明する。   Next, the form for implementing the circuit board by this invention is demonstrated.

図2(a)は、本実施形態による回路基板11の平面図、同図(b)は断面図を示す。   2A is a plan view of the circuit board 11 according to the present embodiment, and FIG. 2B is a cross-sectional view.

回路基板11は、ガラスエポキシ樹脂などの電気絶縁性を有する板材等からなり、部品下部に対して樹脂充填を要するチップ部品12が実装されている。チップ部品12は、フリップ・チップ接合したBGAパッケージ構造をしており、ICチップ13の基板実装面13aにボール状の半田バンプ14がファインピッチで格子状に配列されて、構成されている。回路基板11の基板表面には、半田バンプ14のアレイ配列と同じ配列で、平面視円形状のランド15が複数配設されている。半田バンプ14は、チップ部品12の基板実装面に配列された接続端子部を構成しており、基板表面に複数形成されたランド15と半田接続される。   The circuit board 11 is made of an electrically insulating plate material such as glass epoxy resin, and a chip component 12 that requires resin filling is mounted on the lower part of the component. The chip component 12 has a BGA package structure in which flip chip bonding is performed, and ball-shaped solder bumps 14 are arranged on the substrate mounting surface 13a of the IC chip 13 in a grid pattern with a fine pitch. On the substrate surface of the circuit board 11, a plurality of lands 15 having a circular shape in plan view are arranged in the same arrangement as the array arrangement of the solder bumps 14. The solder bumps 14 constitute connection terminal portions arranged on the board mounting surface of the chip component 12 and are solder-connected to a plurality of lands 15 formed on the board surface.

また、回路基板11は、これらランド15の周囲の基板表面に半田レジスト16が平面視窓枠状に形成されている。半田レジスト16は、半田レジスト材が付されない開口部領域16aを、ランド15を含む基板表面に平面視矩形状に有している。半田レジスト16は、チップ部品12の基板実装面13aと重なる領域D(図2(a)参照)の、開口部領域16aに向かう方向、つまり、チップ部品12の外周から内側に向かう方向の長さが、0mm以上で0.1mm以下に設定されている。本実施形態では、この長さは、開口部領域16aの周囲の4辺において均等に設定されており、開口部領域16aは、チップ部品12の基板実装面13aと略同じ大きさをしている。   In the circuit board 11, a solder resist 16 is formed on the surface of the board around the lands 15 in a planar window frame shape. The solder resist 16 has an opening region 16a to which no solder resist material is applied on the surface of the substrate including the land 15 in a rectangular shape in plan view. The length of the solder resist 16 in the direction toward the opening region 16a, that is, the direction from the outer periphery to the inner side of the chip component 12, in the region D (see FIG. 2A) overlapping the substrate mounting surface 13a of the chip component 12 Is set to 0 mm or more and 0.1 mm or less. In the present embodiment, this length is set evenly on the four sides around the opening region 16a, and the opening region 16a has substantially the same size as the board mounting surface 13a of the chip component 12. .

また、複数のランド15のうち、少なくとも1つのランド15には、線状の配線パターン17が接続されている。配線パターン17は、図3(a)の平面図に示すように、ランド15を開口部領域16aの外へ導いたり、ランド15間を接続するが、開口部領域16aの内部に形成された部分は、半田レジスト被覆18によって覆われている。   In addition, a linear wiring pattern 17 is connected to at least one of the lands 15. As shown in the plan view of FIG. 3A, the wiring pattern 17 leads the lands 15 to the outside of the opening region 16a or connects the lands 15 to each other, but is a portion formed inside the opening region 16a. Is covered with a solder resist coating 18.

このような構成において、回路基板11は、チップ部品12の基板実装面13aとこの基板実装面13aに対向する基板表面との間の空間K(図2(b)参照)に、例えば、球形状のシリカ材が混入したエポキシ樹脂などがアンダーフィルとして充填される。本実施形態では、チップ部品12は、基板実装面13aの基板表面からの接合高さh(図2(b)参照)が、基板実装面13aと半田レジスト16との間に形成される隙間S(図2(b)参照)を介して空間Kに充填される樹脂の浸透速度が、隙間Sと空間Kとで顕著な違いを生じる所定値以下、例えば、150μm以下で、実装される   In such a configuration, the circuit board 11 has, for example, a spherical shape in a space K (see FIG. 2B) between the board mounting surface 13a of the chip component 12 and the board surface facing the board mounting surface 13a. An epoxy resin mixed with the silica material is filled as an underfill. In the present embodiment, the chip component 12 has a bonding height h from the substrate surface of the substrate mounting surface 13a (see FIG. 2B) that is a gap S formed between the substrate mounting surface 13a and the solder resist 16. (See FIG. 2 (b).) The resin K is mounted at a penetration rate of the resin filled in the space K below a predetermined value that causes a significant difference between the gap S and the space K, for example, 150 μm or less.

このような本実施形態による回路基板11によれば、基板表面に形成された半田レジスト16の、半田レジスト材が付されない開口部領域16aが、チップ部品12の基板実装面13aと略同じ大きさであるため、基板実装面13aと半田レジスト16とが重なる領域Dは、極僅かになる。チップ部品12の基板実装面13aとこの基板実装面13aに対向する基板表面との間の空間Kに充填される樹脂は、毛細管現象によってこの空間Kに浸透するが、この空間Kに浸透する際に経由する、基板実装面13aと半田レジスト16との間の隙間Sが極僅かになるので、この隙間Sによる毛細管現象の作用は弱まる。このため、例えば、図2(a)に示す白抜き矢印Aの方向から空間Kに樹脂を充填する場合、基板実装面13aと半田レジスト16とが重なる極僅かな領域Dに樹脂が浸透する浸透速度と、基板実装面13aと基板表面との間の空間Kに樹脂が浸透する速度とは、共に同じ長さの矢印cで示されるように、ほぼ等しくなる。この結果、ほぼ均一の浸透速度で樹脂が浸透して行き、チップ部品12の下部に樹脂が均等に充填されて、従来の回路基板のように、チップ部品12の下部空間に充填される樹脂にボイドなどの未充填箇所が生じなくなり、半田バンプ14とランド15との接続部における熱サイクル試験などで性能確認される接続信頼性が低下するといった不具合は生じなくなる。   According to the circuit board 11 according to the present embodiment, the opening region 16a of the solder resist 16 formed on the substrate surface to which the solder resist material is not applied is substantially the same size as the board mounting surface 13a of the chip component 12. Therefore, the region D where the board mounting surface 13a and the solder resist 16 overlap is very small. The resin filled in the space K between the substrate mounting surface 13a of the chip component 12 and the substrate surface facing the substrate mounting surface 13a penetrates into the space K by capillary action. Since the gap S between the board mounting surface 13a and the solder resist 16 that passes through is extremely small, the action of the capillary phenomenon due to the gap S is weakened. Therefore, for example, when the resin is filled into the space K from the direction of the white arrow A shown in FIG. 2A, the resin penetrates into a very small region D where the board mounting surface 13a and the solder resist 16 overlap. The speed and the speed at which the resin penetrates into the space K between the board mounting surface 13a and the board surface are substantially equal, as indicated by the arrow c having the same length. As a result, the resin permeates at a substantially uniform permeation rate, and the resin is evenly filled in the lower part of the chip part 12, so that the resin filled in the lower space of the chip part 12 is filled like a conventional circuit board. Unfilled portions such as voids do not occur, and there is no inconvenience that the connection reliability of which performance is confirmed by a thermal cycle test or the like at the connection portion between the solder bump 14 and the land 15 is lowered.

図1に示すような従来の回路基板1では、チップ部品2が実装された回路基板1を購入したユーザにおいて、回路基板1を再リフロー処理して接続端子部3とパッド4との接合部が再溶融すると、ボイドなどの未充填箇所で、半田金属が例えば10%ほどの体積膨張をする。そして、この体積膨張により生じる応力で、接続端子部3とパッド4との接着界面が剥離してオープン不良を起こしたり、また、ボイドなどの未充填箇所で隣接する半田接合箇所が導通して、ショート不良を起こしたりする。しかし、上記の構成をした本実施形態による回路基板11によれば、チップ部品12が実装された回路基板11を購入したユーザにおいて、回路基板11を再リフロー処理して半田バンプ14とランド15との接合部が再溶融しても、ボイドなどの未充填箇所を生じることなく空間Kに均一に樹脂が充填されているので、上記のような接続の不具合を生じることはない。従って、本実施形態による回路基板11は、所定の湿度中負荷環境試験性能や温度サイクル環境試験性能などを十分に満たすことが可能で、接続信頼性を維持して、製品品質を満足させることが出来る。   In the conventional circuit board 1 as shown in FIG. 1, a user who has purchased the circuit board 1 on which the chip component 2 is mounted reflows the circuit board 1 so that the connection portion between the connection terminal portion 3 and the pad 4 is provided. When remelted, the solder metal expands by, for example, about 10% in an unfilled portion such as a void. And, due to the stress generated by this volume expansion, the adhesive interface between the connection terminal portion 3 and the pad 4 is peeled off to cause an open defect, or the adjacent solder joint location in the unfilled location such as a void is conducted, Cause short circuit. However, according to the circuit board 11 according to the present embodiment having the above-described configuration, a user who has purchased the circuit board 11 on which the chip component 12 is mounted reflows the circuit board 11 to perform the solder bump 14 and the land 15. Even if the joint portion is remelted, the resin is uniformly filled in the space K without generating an unfilled portion such as a void, so that the above-described connection failure does not occur. Therefore, the circuit board 11 according to the present embodiment can sufficiently satisfy predetermined humidity load environment test performance, temperature cycle environment test performance, and the like, maintain connection reliability, and satisfy product quality. I can do it.

また、基板実装面13aの基板表面からの接合高さhが本実施形態のように略150μm以下で、チップ部品12が高密度・狭ピッチで実装されて、重なる領域Dの面積が従来のように大きいと、従来の回路基板1のように200μm以上の接合高さでチップ部品2が実装される場合に比較し、チップ部品12の下部空間Kに充填される樹脂の浸透速度は、基板実装面13aと半田レジスト16との間に形成される隙間Sと、基板実装面13aと基板表面との間の空間Kとで、顕著な違いが生じる。しかし、重なる領域Dの面積が極僅かで、半田レジスト16の開口部領域16aがチップ部品12の基板実装面13aと略同じ大きさをした本実施形態による回路基板11によれば、上記のように、基板実装面13aと半田レジスト16との間の隙間Sが極僅かになるので、この隙間Sによる毛細管現象の作用は弱まり、チップ部品12下面の基板実装面13a全面においてほぼ均一の浸透速度で樹脂が浸透して、チップ部品12の下部に樹脂が均等に充填される本発明の上記効果が顕著に現れる。   Further, the bonding height h of the substrate mounting surface 13a from the substrate surface is approximately 150 μm or less as in the present embodiment, the chip components 12 are mounted at a high density and a narrow pitch, and the area of the overlapping region D is the same as the conventional one. Is larger than the case where the chip component 2 is mounted with a joint height of 200 μm or more as in the conventional circuit board 1, the penetration rate of the resin filled in the lower space K of the chip component 12 is There is a significant difference between the gap S formed between the surface 13a and the solder resist 16 and the space K between the substrate mounting surface 13a and the substrate surface. However, according to the circuit board 11 according to the present embodiment in which the area of the overlapping region D is extremely small and the opening region 16a of the solder resist 16 is substantially the same size as the substrate mounting surface 13a of the chip component 12, as described above. In addition, since the gap S between the board mounting surface 13a and the solder resist 16 becomes extremely small, the action of the capillary phenomenon due to this gap S is weakened, and the substantially uniform penetration rate over the entire board mounting surface 13a on the lower surface of the chip component 12 The above-described effect of the present invention in which the resin penetrates and the resin is evenly filled in the lower part of the chip part 12 appears significantly.

また、本実施形態による回路基板11によれば、半田レジスト16の開口部領域16aにおける、ランド15に接続される配線パターン17は、図3(a)に示すように半田レジスト被覆18によって覆われるため、半田レジスト16の開口部領域16aにおいて半田接続される導体は、各ランド15のみが露出した状態になる。このため、チップ部品12の基板実装面13aにほぼ同じ半田体積で配列された各半田バンプ14は、配線パターン17には半田接続されずに、ほぼ同じ面積で基板表面に形成された各ランド15にのみ半田接続され、各ランド15においてほぼ均一の面積で半田接合する。この結果、チップ部品12の回路基板表面への実装時、アレイ状に設けられた各半田バンプ14と各ランド15との半田接合形状は、図3(b)の断面図の右側の接合箇所J1に例示するようなお椀状の同じ形状に均一化され、各半田バンプ14と各ランド15との半田接合の安定性が向上し、半田接続の信頼性が向上する。   Further, according to the circuit board 11 according to the present embodiment, the wiring pattern 17 connected to the land 15 in the opening region 16a of the solder resist 16 is covered with the solder resist coating 18 as shown in FIG. Therefore, only the lands 15 are exposed in the conductor to be soldered in the opening region 16a of the solder resist 16. For this reason, the solder bumps 14 arranged on the board mounting surface 13a of the chip component 12 with substantially the same solder volume are not solder-connected to the wiring pattern 17, and each land 15 formed on the board surface with substantially the same area. Are soldered to each land 15 and solder-bonded in a substantially uniform area. As a result, when the chip component 12 is mounted on the surface of the circuit board, the solder joint shape between each solder bump 14 and each land 15 provided in an array is the joint J1 on the right side of the cross-sectional view of FIG. The solder bowls 14 and the lands 15 are made uniform in the same bowl-like shape as shown in FIG. 6 to improve the stability of solder joints between the solder bumps 14 and the lands 15 and improve the reliability of solder connection.

一方、配線パターン17が半田レジスト被覆18によって覆われずに、配線パターン17とランド15とが半田接続される導体として基板表面に露出して、半田バンプ14とランド15との半田接合箇所における半田接合面積が広いと、半田バンプ14とランド15との半田接合形状は、図3(b)の断面図の左側の接合箇所J2に例示するような胴が細った鼓状となる。このため、アレイ状に設けられた各半田バンプ14と各ランド15との半田接合形状が不均一となり、オープン不良の要因の一つとなって半田接合の安定性が低下し、半田接続の信頼性が低下する。各ランド15におけるこのような半田接合面積の相違は、開口部領域16aにおけるランド15の面積が小さくなる高密度実装品になるほど、配線パターン17がランド15に形成される箇所と形成されない箇所とで、大きくなる。しかし、本実施形態による上記の回路基板11によれば、半田レジスト被覆18が配線パターン17を覆うことによって各ランド15における半田接合面積がほぼ等しくなり、上記の作用効果が奏される。   On the other hand, the wiring pattern 17 is not covered with the solder resist coating 18 and is exposed to the substrate surface as a conductor to which the wiring pattern 17 and the land 15 are solder-connected, and the solder at the solder joint location between the solder bump 14 and the land 15 is exposed. When the bonding area is large, the solder bonding shape between the solder bump 14 and the land 15 becomes a drum shape with a thin drum as illustrated in the bonding portion J2 on the left side of the cross-sectional view of FIG. For this reason, the solder joint shape between each solder bump 14 and each land 15 provided in an array shape becomes non-uniform, which becomes one of the causes of open defects and the solder joint stability is lowered, and the reliability of solder connection Decreases. The difference in the solder joint area in each land 15 is that the portion where the wiring pattern 17 is formed on the land 15 and the portion where the land 15 is not formed as the area of the land 15 in the opening region 16a becomes smaller. ,growing. However, according to the circuit board 11 according to the present embodiment, the solder resist coating 18 covers the wiring pattern 17 so that the solder joint areas in the lands 15 are substantially equal, and the above-described effects are obtained.

なお、上記実施形態においては、半田レジスト16の開口部領域16aがチップ部品12の基板実装面13aより若干狭く、基板実装面13aと半田レジスト16とが重なる場合について、説明した。しかし、半田レジスト16の開口部領域16aがチップ部品12の基板実装面13aより若干広く、基板実装面13aと半田レジスト16とが重ならずに、これらの間に200〜300μm程度の隙間があいて、開口部領域16aが基板実装面13aと略同じ大きさになるように構成してもよい。この構成によっても、チップ部品12の基板実装面13aとこの基板実装面13aに対向する基板表面との間の空間Kに充填される樹脂は、この空間Kに浸透する際に経由する、基板実装面13aと半田レジスト16との間の隙間Sが極僅かになるので、この隙間Sによる毛細管現象の作用は弱まる。従って、チップ部品12の下部にほぼ均一の浸透速度で樹脂が浸透して行き、チップ部品12の下部に均等に樹脂が充填されて、上記実施形態と同様な作用効果が奏される。   In the above embodiment, the case where the opening region 16a of the solder resist 16 is slightly narrower than the substrate mounting surface 13a of the chip component 12 and the substrate mounting surface 13a and the solder resist 16 overlap each other has been described. However, the opening region 16a of the solder resist 16 is slightly wider than the substrate mounting surface 13a of the chip component 12, and the substrate mounting surface 13a and the solder resist 16 do not overlap with each other, and there is a gap of about 200 to 300 μm between them. Thus, the opening region 16a may be configured to have substantially the same size as the substrate mounting surface 13a. Even with this configuration, the resin that fills the space K between the substrate mounting surface 13a of the chip component 12 and the substrate surface facing the substrate mounting surface 13a passes through the space K when it penetrates into the space K. Since the gap S between the surface 13a and the solder resist 16 becomes very small, the action of the capillary phenomenon due to the gap S is weakened. Accordingly, the resin penetrates into the lower part of the chip part 12 at a substantially uniform penetration speed, and the resin is evenly filled into the lower part of the chip part 12, and the same effects as those of the above-described embodiment are exhibited.

また、上記実施形態においては、半田レジスト16がチップ部品12の基板実装面13aと重なる領域Dの、開口部領域16aに向かう方向の長さが、開口部領域16aの周囲の4辺において均等に短く設定されている場合について、説明した。しかし、この長さは、開口部領域16aの周囲の4辺において必ずしも均等に短く設定される必要はなく、樹脂の充填方向となる辺において短ければよく、樹脂の充填方向と対向する辺では長くなってもよい。例えば、図2(a)に示す白抜き矢印Aの方向から空間Kに樹脂を充填する場合には、同図の左右の辺において重なる領域Dの長さが短ければよく、白抜き矢印Aの方向と対向する同図の上の辺において長くなってもよい。また、樹脂の充填は同図のように1辺からでなく、2辺から同時に行ってもよい。このような構成によれば、空間Kの空気をチップ部品12の下部から均等に追いやりつつ、チップ部品12の下部に均一の浸透速度で樹脂を均等に充填することが出来る。   In the above embodiment, the length of the region D where the solder resist 16 overlaps the substrate mounting surface 13a of the chip component 12 in the direction toward the opening region 16a is even on the four sides around the opening region 16a. The case where the setting is short has been described. However, this length does not necessarily need to be set to be uniformly short on the four sides around the opening region 16a, but may be short on the side in the resin filling direction, and long on the side facing the resin filling direction. It may be. For example, in the case where the space K is filled with resin from the direction of the white arrow A shown in FIG. 2A, the length of the overlapping region D on the left and right sides in FIG. It may be longer on the upper side of the figure opposite the direction. The resin filling may be performed simultaneously from two sides instead of from one side as shown in FIG. According to such a configuration, the air in the space K can be evenly driven from the lower part of the chip part 12, and the resin can be uniformly filled in the lower part of the chip part 12 at a uniform penetration rate.

電子製品の小型化に伴う回路基板への電子部品の実装高密度化により、従来よりも接合高さhの低い樹脂充填が必要とされる電子製品において、本発明による上記の回路基板11を用いることで、従来技術よりも樹脂充填に対し、シビアな設計が可能となる。   The above-described circuit board 11 according to the present invention is used in an electronic product that requires a resin filling with a bonding height h lower than that of a conventional one due to an increase in mounting density of electronic components on a circuit board accompanying the downsizing of the electronic product. Thus, it is possible to design more severely with respect to resin filling than in the prior art.

11…回路基板
12…チップ部品
13…ICチップ
13a…ICチップ13の基板実装面
14…半田バンプ
15…ランド
16…半田レジスト
16a…半田レジスト16の開口部領域
17…配線パターン
18…半田レジスト被覆
A…樹脂の充填方向
c…樹脂の浸透速度
D…基板実装面13aと半田レジスト16とが重なる領域
K…空間
S…隙間
DESCRIPTION OF SYMBOLS 11 ... Circuit board 12 ... Chip component 13 ... IC chip 13a ... Board mounting surface of IC chip 13 14 ... Solder bump 15 ... Land 16 ... Solder resist 16a ... Opening area of solder resist 16 17 ... Wiring pattern 18 ... Solder resist coating A ... Filling direction of resin c ... Permeation speed of resin D ... Area where substrate mounting surface 13a and solder resist 16 overlap K ... Space S ... Gap

Claims (4)

チップ部品の基板実装面に配列された接続端子部と半田接続される、基板表面に複数形成されたランドと、半田レジスト材が付されない開口部領域を前記ランドを含む基板表面に有して前記ランドの周囲の基板表面に形成された、前記開口部領域が前記チップ部品の基板実装面と略同じ大きさの半田レジストとを備え、前記チップ部品の基板実装面とこの基板実装面に対向する基板表面との間の空間に樹脂が充填される回路基板。   A plurality of lands formed on the substrate surface, which are solder-connected to the connection terminal portions arranged on the substrate mounting surface of the chip component, and an opening region to which the solder resist material is not attached is provided on the substrate surface including the lands. The opening region formed on the substrate surface around the land includes a solder resist having substantially the same size as the substrate mounting surface of the chip component, and faces the substrate mounting surface of the chip component and the substrate mounting surface. A circuit board in which resin is filled in the space between the substrate surface. 前記チップ部品は、基板実装面の基板表面からの高さが、基板実装面と前記半田レジストとの間に形成される隙間を介して前記空間に充填される樹脂の浸透速度が前記隙間と前記空間とで顕著な違いを生じる所定値以下で、実装されることを特徴とする請求項1に記載の回路基板。   In the chip component, the height of the substrate mounting surface from the substrate surface is such that the penetration rate of the resin filled in the space through the gap formed between the substrate mounting surface and the solder resist is the gap and the The circuit board according to claim 1, wherein the circuit board is mounted at a predetermined value or less that causes a remarkable difference with the space. 前記半田レジストは、前記チップ部品の基板実装面と重なる領域の、前記開口部領域に向かう方向の長さが0mm以上で0.1mm以下であることを特徴とする請求項1または請求項2に記載の回路基板。   3. The solder resist according to claim 1, wherein a length of a region overlapping the substrate mounting surface of the chip component in a direction toward the opening region is not less than 0 mm and not more than 0.1 mm. Circuit board as described. 少なくとも1つの前記ランドに接続される前記開口部領域に形成された配線と、前記配線を覆う半田レジスト被覆とを備えることを特徴とする請求項1から請求項3のいずれか1項に記載の回路基板。   The wiring according to claim 1, further comprising: a wiring formed in the opening region connected to at least one of the lands; and a solder resist coating that covers the wiring. Circuit board.
JP2011135359A 2011-06-17 2011-06-17 Circuit board Pending JP2013004798A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011135359A JP2013004798A (en) 2011-06-17 2011-06-17 Circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011135359A JP2013004798A (en) 2011-06-17 2011-06-17 Circuit board

Publications (1)

Publication Number Publication Date
JP2013004798A true JP2013004798A (en) 2013-01-07

Family

ID=47673029

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011135359A Pending JP2013004798A (en) 2011-06-17 2011-06-17 Circuit board

Country Status (1)

Country Link
JP (1) JP2013004798A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08293663A (en) * 1995-04-21 1996-11-05 Sony Corp Wiring board and electronic apparatus
JPH11111894A (en) * 1997-10-02 1999-04-23 Fujitsu Ltd Flip-chip mounting board
JP2004134648A (en) * 2002-10-11 2004-04-30 Seiko Epson Corp Circuit board, mounting structure of ball grid array, electro-optical device, and electronic apparatus

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08293663A (en) * 1995-04-21 1996-11-05 Sony Corp Wiring board and electronic apparatus
JPH11111894A (en) * 1997-10-02 1999-04-23 Fujitsu Ltd Flip-chip mounting board
JP2004134648A (en) * 2002-10-11 2004-04-30 Seiko Epson Corp Circuit board, mounting structure of ball grid array, electro-optical device, and electronic apparatus

Similar Documents

Publication Publication Date Title
JP2011077108A (en) Semiconductor device
KR20020065045A (en) Semiconductor chip package comprising enhanced pads
JP5290215B2 (en) Semiconductor device, semiconductor package, interposer, and manufacturing method of interposer
JP4569605B2 (en) Filling method of underfill of semiconductor device
CN105321908A (en) Semiconductor device and manufacturing method of semiconductor device
KR102152041B1 (en) Electronic package structures, circuit boards and devices with high reliability
JP4777692B2 (en) Semiconductor device
JPH10233463A (en) Semiconductor device and its manufacture
JP2008277823A (en) Flip-chip package and manufacturing method for the same
JP2012064991A (en) Flip-chip bonded package
JP2008218932A (en) Semiconductor element mounting substrate and its manufacturing method
JP5466218B2 (en) Semiconductor package
JP2010135501A (en) Method of manufacturing semiconductor device
JP2013004798A (en) Circuit board
JP5229267B2 (en) Electronic equipment
KR20110013902A (en) Package and manufacturing method thereof
JP2009076569A (en) Semiconductor package and mounting substrate, and semiconductor device including same
KR100665288B1 (en) Fabrication method of flip chip package
JP2006237367A (en) Printed wiring board
KR20200014673A (en) Semiconductor package
JP2005101132A (en) Semiconductor device, its manufacturing method, circuit board, and electronic apparatus
JP2011061055A (en) Method of manufacturing semiconductor device
JP2009231467A (en) Board unit, electronic apparatus, and board unit manufacturing method
JP2010232671A (en) Method for filling underfill of semiconductor device
JP2000277564A (en) Semiconductor device and manufacture thereof

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20140306

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20140826

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20150106