JP2012519773A - 圧気輸送の間の粒子への原子又は分子層堆積のための装置及び方法 - Google Patents
圧気輸送の間の粒子への原子又は分子層堆積のための装置及び方法 Download PDFInfo
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Abstract
【選択図】図1
Description
(1)第一の反応物(反応物A)が固体基質の表面と自己停止する反応
(2)反応されなかった反応物A及びいかなる気体状の反応副生物を除去するためのパージ又は排出
(3)第二の反応物(反応物B)の自己停止する反応又は反応物Aとの反応のために再び基質の表面を活性化する別の処理
(4)過剰の反応物及び段階(3)において生成された気体状の反応生成物のパージ又は排出。
(i)入口及び出口を有するチューブを用意する段階、
(ii)該チューブの入口において又は入口の近くにおいて、粒子を運んでいるキャリアガスをチューブの中へと供給して、チューブを通る粒子の流れを作る段階、及び
該粒子の流れの中の粒子との反応のために、チューブの入口から下流の少なくとも1の注入点を介してチューブの中へと自己停止する第一の反応物を注入する段階
を含む。これらの粒子との反応のためにチューブにおける粒子の流れの中へと反応物を注入することは、粒子上への層堆積の連続方法を可能にする。
(i)入口及び出口を有するチューブ、
(ii)粒子を運んでいるキャリアガスをチューブの中へと供給する供給デバイス、及び
(iii)反応物をチューブの中へと導入するための入口から下流にある少なくとも1の注入点
を含み、該装置は上記の方法を実行するように構成されている。
10:粒子
11:不活性ガス
12A〜16A:第一の注入点
12B〜16B:第二の注入点
12C〜16C:フラッシュポイント
12D〜16D:フラッシュポイント
17:ガスの流れ
18:粒子
21〜22:温度制御ユニット
23:前処理ユニット
100:流動化装置
200:分離デバイス
該図は模式的なものであることが理解される。注入点のペアの表現された数(図1におけるナンバリング5)は、実際はたったの1つから数百又は数千までの範囲を変動し得る複数の注入点のペアを表わす。
Claims (34)
- チューブの中を圧気輸送されている粒子にコーティングを堆積するための方法において、
(i)入口及び出口を有するチューブを用意する段階、
(ii)該チューブの入口において又は入口の近くにおいて、粒子を運んでいるキャリアガスをチューブの中へと供給して、チューブを通る粒子の流れを作る段階、及び
(iii)該粒子の流れの中の粒子との反応のために、チューブの入口から下流の少なくとも1の注入点を介してチューブの中へと自己停止する第一の反応物を注入する段階
を含む前記方法。 - 粒子がより小さな粒子の凝集体を含む、請求項1に記載の方法。
- 第一の反応物が、チューブの入口から下流にある複数の注入点を介してチューブの中へと注入され、かつ1つの注入点から下流にある別の注入点がキャリアガスの速度を上げるように配置されている、請求項1又は2に記載の方法。
- 複数の注入点がチューブの長さの少なくとも一部に沿って間隔をあけて配置されている、請求項3に記載の方法。
- 複数の注入点が実質的にチューブの長さに沿って間隔をあけて配置されている、請求項4に記載の方法。
- 注入点の上流でチューブの中の粒子を前処理することをさらに含む、請求項1〜5のいずれか1項に記載の方法。
- 粒子の流れの中の粒子との反応のために、少なくとも1の注入点から下流にある少なくとも1のさらなる注入点を介して、チューブの中へと自己停止する第二の反応物を注入することをさらに含む、請求項1〜6のいずれか1項に記載の方法。
- 第一の反応物が第二の反応物のための前駆体である、請求項7に記載の方法。
- さらなる注入点がキャリアガスの速度を上げるように配置されている、請求項7又は8に記載の方法。
- キャリアガスの速度が粒子の流れの中の粒子の速度より速くなるような速度でキャリアガスが供給される、請求項1〜9のいずれか1項に記載の方法。
- 粒子の流れがプラグフローの形をとる、請求項1〜10のいずれか1項に記載の方法。
- 少なくとも1のフラッシュポイントにおいてチューブから反応副生物を除去することをさらに含む、請求項1〜11のいずれか1項に記載の方法。
- 該反応副生物が、チューブの長さに沿って間隔をあけて配置されている複数のフラッシュポイントにおいてチューブから除去される、請求項12に記載の方法。
- チューブの異なる部分を異なる温度に保つことをさらに含む、請求項1〜13のいずれか1項に記載の方法。
- チューブが、チューブの入口から逐次的に番号を付与された複数の注入点を備えられており、自己停止する第一の反応物は奇数の番号を付与された注入点の中へと注入され、かつ自己停止する第二の反応物は偶数の番号を付与された注入点の中へと注入される、請求項1〜14のいずれか1項に記載の方法。
- 自己停止する反応物が複数の注入点の間で実質的に自己停止するように、該複数の注入点が間隔をあけて配置されている、請求項15に記載の方法。
- −奇数の番号を付与された注入点から下流でありかつ偶数の番号を付与された注入点に対して上流のチューブ部分を第一の温度に保ち、かつ
−偶数の番号を付与された注入点から下流でありかつ奇数の番号を付与された注入点に対して上流のチューブ部分を第二の温度に保つことをさらに含む、請求項15又は16に記載の方法。 - キャリアガスが不活性ガスである、請求項1〜17のいずれか1項に記載の方法。
- キャリアガスが、0.02〜30m/秒、好ましくは0.1〜10m/秒の直線速度においてチューブの中を進む、請求項1〜18のいずれか1項に記載の方法。
- コーティングされる粒子の粒径が2nm〜1mmの範囲である、請求項1〜19のいずれか1項に記載の方法。
- (i)入口及び出口を有するチューブ、
(ii)粒子を運んでいるキャリアガスをチューブの中へと供給する供給デバイス、及び
(iii)反応物をチューブの中へと導入するための入口から下流にある少なくとも1の注入点
を含む装置において、該装置が請求項1〜20のいずれか1項に記載の方法を行うように配置されている前記装置。 - 装置が、チューブの長さの少なくとも一部に沿って間隔をあけて配置された複数の注入点を含む、請求項21に記載の装置。
- チューブがチューブの入口から逐次的に番号を付与された複数の注入点を備えられ、奇数の番号を付与された注入点は自己停止する第一の反応物の注入のために配置されており、かつ偶数の番号を付与された注入点は自己停止する第二の反応物の注入のために配置されている、請求項21又は22に記載の装置。
- チューブから反応副生物を除去するための少なくとも1のフラッシュポイントをさらに含む、請求項21〜23のいずれか1項に記載の装置。
- チューブの長さの少なくとも一部に沿って複数のフラッシュポイントを含む、請求項24に記載の装置。
- チューブが0.02mm〜300mmの範囲、好ましくは1mm〜20mmの範囲の内径を有する、請求項21〜25のいずれか1項に記載の装置。
- チューブが1mm〜20mmの範囲の内径を有する、請求項26に記載の装置。
- チューブが0.1m〜500mの長さを有する、請求項21〜27のいずれか1項に記載の装置。
- チューブが5m〜50mの長さを有する、請求項28に記載の装置。
- チューブが折りかえされている又はコイル状である、請求項21〜29のいずれか1項に記載の装置。
- チューブが、加熱のための手段及び/又は冷却のための手段を備えられたチャンバーに収容されている、請求項21〜30のいずれか1項に記載の装置。
- チャンバーが、0℃〜1000℃の範囲の温度に保たれることができる、請求項31に記載の装置。
- チューブの異なる部分が異なる温度に保たれている、請求項31に記載の装置。
- 奇数の番号を付与された注入点から下流でありかつ偶数の番号を付与された注入点に対して上流のチューブの部分が、第一の温度に保たれるように配置されており、並びに偶数の番号を付与された注入点から下流でありかつ奇数の番号を付与された注入点に対して上流のチューブ部分は第二の温度に保たれるように配置されている、請求項23に記載の装置。
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NL2002590 | 2009-03-04 | ||
NL2002590A NL2002590C2 (en) | 2009-03-04 | 2009-03-04 | Apparatus and process for atomic or molecular layer deposition onto particles during pneumatic transport. |
PCT/EP2010/052769 WO2010100235A1 (en) | 2009-03-04 | 2010-03-04 | Apparatus and process for atomic or molecular layer deposition onto particles during pneumatic transport |
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JP2012519773A5 JP2012519773A5 (ja) | 2013-04-18 |
JP5438779B2 JP5438779B2 (ja) | 2014-03-12 |
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JP2011552450A Active JP5438779B2 (ja) | 2009-03-04 | 2010-03-04 | 圧気輸送の間の粒子への原子又は分子層堆積のための装置及び方法 |
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US (4) | US9845532B2 (ja) |
EP (1) | EP2403976B1 (ja) |
JP (1) | JP5438779B2 (ja) |
KR (1) | KR101696946B1 (ja) |
CN (1) | CN102414342B (ja) |
CA (1) | CA2754093C (ja) |
DK (1) | DK2403976T3 (ja) |
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KR101550500B1 (ko) | 2013-02-28 | 2015-09-04 | 고려대학교 산학협력단 | 파우더 이송형 원자층 증착 장치 |
JP2018510141A (ja) * | 2015-02-25 | 2018-04-12 | テクニシュ ユニベルシテイト デルフトTechnische Universiteit Delft | 分子層堆積によってカプセル化された粒子からの制御放出 |
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FI20095307A0 (fi) * | 2009-03-25 | 2009-03-25 | Beneq Oy | Päällystysmenetelmä ja -laitteisto |
JP2016508544A (ja) | 2013-01-23 | 2016-03-22 | ピコサン オーワイPicosun Oy | 粒子材料の処理のための方法及び装置 |
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WO2016205242A1 (en) | 2015-06-15 | 2016-12-22 | Ald Nanosolutions, Inc. | Continuous spatial atomic layer deposition process and apparatus for applying films on particles |
KR20230117636A (ko) | 2016-09-16 | 2023-08-08 | 피코순 오와이 | 원자층 증착에 의한 입자 코팅 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101550500B1 (ko) | 2013-02-28 | 2015-09-04 | 고려대학교 산학협력단 | 파우더 이송형 원자층 증착 장치 |
JP2018510141A (ja) * | 2015-02-25 | 2018-04-12 | テクニシュ ユニベルシテイト デルフトTechnische Universiteit Delft | 分子層堆積によってカプセル化された粒子からの制御放出 |
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KR101696946B1 (ko) | 2017-01-16 |
EP2403976A1 (en) | 2012-01-11 |
US20120009343A1 (en) | 2012-01-12 |
NL2002590C2 (en) | 2010-09-07 |
JP5438779B2 (ja) | 2014-03-12 |
CA2754093C (en) | 2017-04-04 |
US20230340665A1 (en) | 2023-10-26 |
EP2403976B1 (en) | 2013-07-10 |
CN102414342A (zh) | 2012-04-11 |
DK2403976T3 (da) | 2013-10-14 |
US20180073138A1 (en) | 2018-03-15 |
US9845532B2 (en) | 2017-12-19 |
WO2010100235A1 (en) | 2010-09-10 |
CA2754093A1 (en) | 2010-09-10 |
CN102414342B (zh) | 2014-05-21 |
KR20110139241A (ko) | 2011-12-28 |
US20210102288A1 (en) | 2021-04-08 |
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