JP2012238695A - テラヘルツ波発生装置及びこれを備えた測定装置 - Google Patents
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/08—Construction or shape of optical resonators or components thereof
- H01S3/08013—Resonator comprising a fibre, e.g. for modifying dispersion or repetition rate
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/10007—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating in optical amplifiers
- H01S3/10023—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating in optical amplifiers by functional association of additional optical elements, e.g. filters, gratings, reflectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/08—Optical fibres; light guides
Abstract
【解決手段】 励起用のエネルギーを供給することでテラヘルツ波を発生する電磁波利得媒体を、電磁波共振器内に備え、前記テラヘルツ波を、前記電磁波共振器内で増幅させ、該電磁波共振器より取り出すテラヘルツ波発生装置であって、前記電磁波利得媒体が中空ファイバー内に配され、該中空ファイバーの内径を、前記電磁波利得媒体を配した該中空ファイバーにおける前記テラヘルツ波の伝搬モードTE11の遮断周波数を示す内径、の1倍以上10倍以下の大きさとしたテラヘルツ波発生装置。
【選択図】 図1
Description
励起エネルギー源としてCO2 レーザ(炭酸ガスレーザ)を用いて構成した例について図1等を参照しながら説明する。
中空ファイバー内の利得媒体として固体の利得媒体を用いた装置について説明する。
図9を参照して、中空ファイバー内部に液体の利得媒体を配して構成した装置について説明する。本実施例の装置は、励起媒体として液体908が中空ファイバー107内に配されていることが特徴である。液体はアルコール、水等を採用することができる。
発振波長を可変とするテラヘルツ波レーザ装置について説明する。本例の装置では波長を高速に可変とすることができる。
本発明のテラヘルツ波発生装置を測定装置に適用した例について説明する。
104 励起用のエネルギー
106 テラヘルツ波
109 中空ファイバー
Claims (18)
- 励起用のエネルギーを供給することでテラヘルツ波を発生する電磁波利得媒体を、電磁波共振器内に備え、前記テラヘルツ波を、前記電磁波共振器内で増幅させ、該電磁波共振器より取り出すテラヘルツ波発生装置であって、
前記電磁波利得媒体が中空ファイバー内に配され、該中空ファイバーの内径を、前記電磁波利得媒体を配した該中空ファイバーにおける前記テラヘルツ波の伝搬モードTE11の遮断周波数を示す内径、の1倍以上10倍以下の大きさとしたことを特徴とするテラヘルツ波発生装置。 - 前記大きさの内径を備えた前記中空ファイバー内には、TE11、TE01、TM01の何れかの伝搬モードのテラヘルツ波が生起されることを特徴とする請求項1に記載のテラヘルツ波発生装置。
- 前記中空ファイバーは、内壁が金属でコーティングされたプラスチックファイバーであることを特徴とする請求項1乃至2のいずれか1項に記載のテラヘルツ波発生装置。
- 前記金属は、銀であることを特徴とする請求項3に記載のテラヘルツ波発生装置。
- 前記励起用のエネルギーは、電磁波であることを特徴とする請求項1乃至4のいずれか1項に記載のテラヘルツ波発生装置。
- 前記電磁波はレーザ装置より照射される請求項5に記載のテラヘルツ波発生装置。
- 前記レーザ装置は、炭酸ガスレーザであることを特徴とする請求項6に記載のテラヘルツ波発生装置。
- 前記励起用のエネルギーは、電気エネルギーであることを特徴とする請求項1乃至4のいずれか1項に記載のテラヘルツ波発生装置。
- 前記電気エネルギーは、高周波エネルギーであることを特徴とする請求項8に記載のテラヘルツ波発生装置。
- 前記励起用エネルギーは、電子線エネルギーであることを特徴とする請求項1乃至4のいずれか1項に記載のテラヘルツ波発生装置。
- 前記電磁波利得媒体は、気体からなることを特徴とする請求項1乃至10のいずれか1項に記載のテラヘルツ波発生装置。
- 前記気体は、メタノール、エタノール、水蒸気のいずれかであることを特徴とする請求項11に記載のテラヘルツ波発生装置。
- 前記電磁波利得媒体は、固体からなることを特徴とする請求項1乃至11のいずれか1項に記載のテラヘルツ波発生装置。
- 前記固体は、グラフェンであることを特徴とする請求項13に記載のテラヘルツ波発生装置。
- 前記電磁波利得媒体は、液体からなることを特徴とする請求項1乃至10のいずれか1項の記載のテラヘルツ波発生装置。
- 前記液体は、アルコール、水のいずれかである請求項15に記載のテラヘルツ波発生装置。
- 前記電磁波共振器内の前記テラヘルツ波の強度を変調する変調器を備え、該変調器に印加する周波数を変化させることで前記電磁波共振器より取り出すテラヘルツ波の波長を掃引することを特徴とする請求項1乃至16のいずれか1項の記載のテラヘルツ波発生装置。
- 請求項1乃至17の何れか1項に記載のテラヘルツ波発生装置と、該テラヘルツ波発生装置で発生したテラヘルツ波を測定用の検体に照射して得られた反射または透過したテラヘルツ波を検出する検出装置と、該検出装置により検出された検出信号に基づいて前記検体に関する情報を表示する表示部と、を有することを特徴とする測定装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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JP2011106229A JP2012238695A (ja) | 2011-05-11 | 2011-05-11 | テラヘルツ波発生装置及びこれを備えた測定装置 |
US14/116,681 US8963090B2 (en) | 2011-05-11 | 2012-04-23 | Terahertz-wave generating apparatus and measuring unit equipped with the same |
PCT/JP2012/061502 WO2012153666A1 (en) | 2011-05-11 | 2012-04-23 | Terahertz-wave generating apparatus and measuring unit equipped with the same |
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JP2011106229A JP2012238695A (ja) | 2011-05-11 | 2011-05-11 | テラヘルツ波発生装置及びこれを備えた測定装置 |
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US (1) | US8963090B2 (ja) |
JP (1) | JP2012238695A (ja) |
WO (1) | WO2012153666A1 (ja) |
Families Citing this family (8)
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CN102978746B (zh) * | 2012-12-06 | 2014-08-06 | 电子科技大学 | 一种铜锌锡硫微纳纤维材料及其制备方法 |
US9515366B2 (en) * | 2013-03-19 | 2016-12-06 | Texas Instruments Incorporated | Printed circuit board dielectric waveguide core and metallic waveguide end |
US10097281B1 (en) | 2015-11-18 | 2018-10-09 | Hypres, Inc. | System and method for cryogenic optoelectronic data link |
CN108683059B (zh) * | 2018-06-08 | 2023-10-24 | 首都师范大学 | 利用液体柱产生高强度宽带太赫兹波的系统和方法 |
CN110581429B (zh) * | 2018-06-09 | 2023-03-31 | 滨州市腾源电子科技有限公司 | 一种基于石墨烯材料的太赫兹波辐射源 |
FR3115371A1 (fr) | 2020-10-20 | 2022-04-22 | Marc Grosman | Générateur d’ondes électromagnétiques THz commandé par des transistors à effet de champ. |
EP4030151A1 (en) * | 2021-01-18 | 2022-07-20 | Rosemount Tank Radar AB | Waveguide for a radar level gauge |
CN112989684B (zh) * | 2021-04-23 | 2023-08-22 | 昆明理工大学 | 一种液态水介质激发太赫兹辐射的仿真模型的构建方法 |
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- 2011-05-11 JP JP2011106229A patent/JP2012238695A/ja not_active Ceased
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2012
- 2012-04-23 US US14/116,681 patent/US8963090B2/en not_active Expired - Fee Related
- 2012-04-23 WO PCT/JP2012/061502 patent/WO2012153666A1/en active Application Filing
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WO2012153666A1 (en) | 2012-11-15 |
US20140084163A1 (en) | 2014-03-27 |
US8963090B2 (en) | 2015-02-24 |
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