JP2012143822A - Polishing apparatus - Google Patents

Polishing apparatus Download PDF

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JP2012143822A
JP2012143822A JP2011002329A JP2011002329A JP2012143822A JP 2012143822 A JP2012143822 A JP 2012143822A JP 2011002329 A JP2011002329 A JP 2011002329A JP 2011002329 A JP2011002329 A JP 2011002329A JP 2012143822 A JP2012143822 A JP 2012143822A
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polishing
polished
polishing pad
polishing apparatus
rotating
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JP5614723B2 (en
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Yoshiyuki Funayama
吉幸 舟山
Junya Morishita
順也 森下
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AGC Inc
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Asahi Glass Co Ltd
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  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a polishing apparatus which relaxes a polishing trace generated by the transfer of grooves of a polishing pad to the polishing surface of a polished object.SOLUTION: The polishing apparatus 10, makes a polishing pad 16 revolve (and/or rotate), makes the polished object 12 rotate around the center and continuously polishes the polishing surface of the polished object 12 with a large number of polishing pads 16, 16, ... while transporting a feeding table 14. According to the polishing apparatus 10, since the polished object 12 is rotated, the groove 17 of the polishing pad 16 are abutted at random on the polishing surface of the polished object 12. Consequently, the polishing trace generated in a conventional polishing apparatus can be relaxed.

Description

本発明は、研磨装置に関する。   The present invention relates to a polishing apparatus.

液晶用ディスプレイ、及びプラズマ用ディスプレイ等のFPD(Flat Panel Display)用ガラス板、半導体用途のガラス板は、ガラスリボン成形装置によって帯状に成形されたガラスリボンを、所定の矩形状サイズのガラス板に切り折り加工することにより、所定の外形寸法のガラス板に製造される。また、ウェーハ用のガラス板は、シリコンの単結晶棒(インゴット)を、切断装置で切断することにより、所定の外形寸法のガラス板に製造される。そして、これらのガラス板は、洗浄工程、及び検査工程を経て研磨工程に搬送される。そして、研磨工程でガラス板の表面(研磨面)の微小な凹凸やうねりが研磨装置によって研磨除去されることにより、製品基板に要求される平坦度を満足したガラス板に製造される。   For glass plates for FPD (Flat Panel Display) such as liquid crystal displays and plasma displays, and glass plates for semiconductor applications, a glass ribbon formed into a strip shape by a glass ribbon molding device is converted into a glass plate of a predetermined rectangular size. By cutting and folding, a glass plate having a predetermined outer dimension is manufactured. Further, a glass plate for a wafer is manufactured into a glass plate having a predetermined outer dimension by cutting a silicon single crystal rod (ingot) with a cutting device. And these glass plates are conveyed to a grinding | polishing process through a washing | cleaning process and an inspection process. And the fine unevenness | corrugation and waviness of the surface (polishing surface) of a glass plate are grind | polished by a grinding | polishing apparatus at a grinding | polishing process, and it manufactures to the glass plate which satisfied the flatness requested | required of a product substrate.

特許文献1には、ガラス板を送りテーブルによって連続的に搬送しながら多数の研磨パッドによってガラス板の研磨面を研磨する連続式の研磨装置が開示されている。各研磨パッドは、ガラス板の研磨面に押し当てられてガラス板の搬送方向に対して直交する方向に揺動するとともに、公転軸によってガラス板に対し公転運動を行い、かつ隣り合う研磨具同士の回転位相が反転するように構成されている。   Patent Document 1 discloses a continuous polishing apparatus that polishes a polishing surface of a glass plate with a number of polishing pads while the glass plate is continuously conveyed by a feed table. Each polishing pad is pressed against the polishing surface of the glass plate and swings in a direction perpendicular to the conveying direction of the glass plate. The rotation phase is reversed.

一方、特許文献2の研磨装置は、研磨定盤にスラリ(研磨液)を供給し、このスラリを研磨パッドの表面から滲み出させてガラス板を研磨する。また、特許文献2に開示された溝付きの研磨パッドは、その表面に幅が2〜6mm、深さが1〜5mmの複数の溝が5〜10mmのピッチで一方向に沿って形成されている。この研磨パッドによれば、前記溝の研磨作用によって研磨レートが向上するとともに、研磨に使用したスラリを、前記溝を介して研磨パッドの外部に排出することができるので、研磨パッドに目詰まりが生じ難く、研磨力が安定化するという利点がある。   On the other hand, the polishing apparatus of Patent Document 2 supplies slurry (polishing liquid) to a polishing surface plate, and exudes this slurry from the surface of the polishing pad to polish the glass plate. Further, the grooved polishing pad disclosed in Patent Document 2 has a plurality of grooves having a width of 2 to 6 mm and a depth of 1 to 5 mm formed on the surface thereof along one direction at a pitch of 5 to 10 mm. Yes. According to this polishing pad, the polishing rate is improved by the polishing action of the groove, and the slurry used for polishing can be discharged to the outside of the polishing pad through the groove, so that the polishing pad is clogged. It is difficult to occur, and there is an advantage that the polishing power is stabilized.

特開平6−246623号公報JP-A-6-246623 特開2004−122351号公報JP 2004-122351 A

しかしながら、特許文献1の研磨パッドに特許文献2の溝付き研磨パッドを使用すると、ガラス板の研磨面に研磨パッドの溝が転写して、研磨面に筋状の研磨痕が発生するという問題があった。このため、ガラス板の研磨面を高い平坦度に研磨することが難しいという問題があった。   However, when the grooved polishing pad of Patent Document 2 is used as the polishing pad of Patent Document 1, the groove of the polishing pad is transferred to the polishing surface of the glass plate, and a streak-like polishing mark is generated on the polishing surface. there were. For this reason, there is a problem that it is difficult to polish the polished surface of the glass plate with high flatness.

本発明は、このような事情に鑑みてなされたもので、被研磨物の研磨面に研磨パッドの溝が転写することにより発生する研磨痕を緩和することができる研磨装置を提供することを目的とする。   The present invention has been made in view of such circumstances, and an object of the present invention is to provide a polishing apparatus capable of alleviating polishing marks generated by transferring a groove of a polishing pad to a polishing surface of an object to be polished. And

本発明は、前記目的を達成するために、被研磨物と、該被研磨物の研磨面に当接される複数本の溝を備えた研磨パッドとを相対的に押し付けて、前記被研磨物の研磨面を研磨する研磨装置であって、前記被研磨物の非研磨面を保持するとともに該被研磨物を所定の軸を中心に回転させる回転手段と、前記研磨パッドを前記被研磨物の研磨面に対して平行移動させる動作手段とを備えることを特徴とする研磨装置を提供する。   In order to achieve the above object, the present invention relates to the object to be polished by relatively pressing the object to be polished and a polishing pad having a plurality of grooves in contact with the polishing surface of the object to be polished. A polishing apparatus that polishes the polishing surface of the polishing object, the rotating means for holding the non-polishing surface of the object to be polished and rotating the object to be polished around a predetermined axis, and the polishing pad of the object to be polished There is provided a polishing apparatus characterized by comprising an operation means for parallel movement with respect to a polishing surface.

従来の研磨装置の如く、移動する研磨パッドによって静止した被研磨物を研磨すると、研磨パッドの溝が被研磨物の研磨面に規則的に当たるため、前記研磨痕が発生する。本発明は、被研磨物を回転させることによって、研磨パッドの溝が被研磨物の研磨面に無作為に当たるようになるため、前記研磨痕を緩和することができる。   When a stationary object is polished by a moving polishing pad as in a conventional polishing apparatus, the groove of the polishing pad regularly hits the polishing surface of the object to be polished, so that the polishing mark is generated. In the present invention, by rotating the object to be polished, the grooves of the polishing pad come into random contact with the polishing surface of the object to be polished, so that the polishing marks can be alleviated.

本発明の前記動作手段は、前記研磨パッドを、公転軸によって公転、及び/又は自転軸によって自転させることが好ましい。   The operation means of the present invention preferably revolves the polishing pad by a revolving axis and / or rotates by a revolving axis.

本発明によれば、研磨パッドを公転、及び/又は自転させて、研磨パッドを被研磨物の研磨面に対して平行移動させる。研磨パッドを公転させるだけで、研磨パッドの溝が被研磨物の研磨面に無作為に当たり、また、公転と自転とを組み合わせれば、より一層無作為に当たるようになるので、研磨面の平坦度が向上する。   According to the present invention, the polishing pad is revolved and / or rotated to translate the polishing pad relative to the polishing surface of the object to be polished. By simply revolving the polishing pad, the groove of the polishing pad randomly hits the polishing surface of the workpiece, and if the combination of revolution and rotation becomes even more random, the flatness of the polishing surface Will improve.

本発明は、前記被研磨物の前記回転手段による回転方向と、前記動作手段による前記研磨パッドの公転方向、及び/又は自転方向とが逆方向に設定されていることが好ましい。   In the present invention, it is preferable that the rotating direction of the object to be polished by the rotating unit and the revolution direction and / or the rotating direction of the polishing pad by the operating unit are set in opposite directions.

被研磨物の回転方向と研磨パッドの公転方向、及び/又は自転方向とが同方向に設定された研磨装置と、本発明の研磨装置とを比較すると、本発明の研磨装置は、研磨面の任意の一点を通過する研磨パッドの相対速度が、前者の研磨装置と比較して速くなるので、研磨効率が向上し、研磨時間を短縮することができる。   When the polishing apparatus in which the rotation direction of the workpiece and the revolution direction of the polishing pad and / or the rotation direction are set in the same direction is compared with the polishing apparatus of the present invention, the polishing apparatus of the present invention Since the relative speed of the polishing pad passing through one arbitrary point becomes faster than that of the former polishing apparatus, the polishing efficiency can be improved and the polishing time can be shortened.

本発明は、前記被研磨物を前記回転手段とともに所定の方向に搬送する搬送手段を備え、前記研磨パッドは、前記搬送手段による前記被研磨物の搬送経路に所定の間隔を持って複数台配置されていることが好ましい。   The present invention includes a conveying means for conveying the object to be polished in a predetermined direction together with the rotating means, and a plurality of the polishing pads are arranged with a predetermined interval in a conveying path of the object to be polished by the conveying means. It is preferable that

本発明は、被研磨物を送りテーブルによって連続的に搬送しながら多数の研磨パッドによって被研磨物の研磨面を研磨する連続式の研磨装置に、被研磨物を回転させる回転手段を適用したものである。   The present invention applies a rotating means for rotating an object to be polished to a continuous polishing apparatus that polishes the polishing surface of an object to be polished by a number of polishing pads while the object to be polished is continuously conveyed by a feed table. It is.

被研磨物を搬送させない研磨装置によって研磨される被研磨物は、研磨量に応じてスループットが変わり、生産効率が低下する恐れがある。本発明によれば、連続式の研磨装置で被研磨物を研磨するため、研磨量に応じてスループットは変わらず、生産効率の低下を抑えることができる。   For a workpiece to be polished by a polishing apparatus that does not convey the workpiece, the throughput varies depending on the amount of polishing, which may reduce the production efficiency. According to the present invention, since the object to be polished is polished by the continuous polishing apparatus, the throughput does not change according to the polishing amount, and a reduction in production efficiency can be suppressed.

本発明の前記研磨パッドは、隣接する研磨パッドと回転位相差を持って公転されることが好ましい。   The polishing pad of the present invention is preferably revolved with an adjacent polishing pad having a rotational phase difference.

本発明によれば、各研磨パッドの回転運動によって被研磨物に作用する負荷を相殺することができるので、被研磨物を均一に研磨することができる。   According to the present invention, since the load acting on the object to be polished can be offset by the rotational movement of each polishing pad, the object to be polished can be uniformly polished.

本発明の前記回転手段は、円盤状の前記被研磨物を、その質量重心を中心に回転させることが好ましい。   The rotating means of the present invention preferably rotates the disk-shaped object to be polished around its mass center of gravity.

矩形状の被研磨物を連続式の研磨装置に適用した場合、隣接する被研磨物との干渉を防止するために間隔を広げて被研磨物を送りテーブルに搭載しなければならない。これによって、送りテーブルに対する被研磨物の搭載枚数が少なくなるので、生産効率が低下する。これに対して円盤状の被研磨物であって、被研磨物の質量重心を中心に回転させる回転手段は、干渉を防止するために間隔を広げる必要はない。これにより、送りテーブルに対する被研磨物の搭載枚数が矩形状の被研磨物と比較して多くなるので、生産効率が向上する。   When a rectangular object to be polished is applied to a continuous polishing apparatus, the object to be polished must be mounted on a feed table with a wide interval in order to prevent interference with adjacent objects to be polished. As a result, the number of objects to be polished mounted on the feed table is reduced, so that the production efficiency is lowered. On the other hand, a rotating means that is a disk-shaped object to be rotated around the center of mass of the object to be polished does not need to increase the interval in order to prevent interference. As a result, the number of objects to be polished mounted on the feed table is increased as compared with a rectangular object to be polished, so that the production efficiency is improved.

本発明の研磨装置によれば、被研磨物を回転させるとともに研磨パッドを被研磨物の研磨面に対して平行移動させたので、被研磨物の研磨面に研磨パッドの溝が転写することにより発生する研磨痕を緩和することができる。   According to the polishing apparatus of the present invention, since the object to be polished is rotated and the polishing pad is moved in parallel with the polishing surface of the object to be polished, the groove of the polishing pad is transferred to the polishing surface of the object to be polished. The generated polishing marks can be reduced.

実施の形態の研磨装置の要部平面図Plan view of main part of polishing apparatus according to embodiment 図1に示した研磨装置の側面図Side view of the polishing apparatus shown in FIG. 研磨パッドの要部拡大斜視図Enlarged perspective view of the main part of the polishing pad 回転テーブルの回転機構部を示した平面図The top view which showed the rotation mechanism part of the turntable 被研磨物をその中心を中心に回転させた例を示す被研磨物の平面図Plan view of an object to be polished showing an example of rotating the object to be polished around its center 1枚の被研磨物の中心を回転テーブルの回転中心に対してオフセットして被研磨物を公転させた例を示す被研磨物の平面図The top view of a to-be-polished object which shows the example which revolved the to-be-polished object by offsetting the center of one to-be-polished object with respect to the rotation center of a rotary table 3枚又は4枚の被研磨物の中心を回転テーブルの回転中心に対してオフセットして被研磨物を公転させた例を示す被研磨物の平面図The top view of the to-be-polished object which shows the example which revolved the to-be-polished object by offsetting the center of 3 or 4 to-be-polished object with respect to the rotation center of a rotary table 送りテーブルに搭載された被研磨物の形状を示した説明図Explanatory drawing showing the shape of the workpiece mounted on the feed table

以下、添付図面に従って本発明に係る研磨装置の好ましい実施の形態を詳説する。   Hereinafter, preferred embodiments of a polishing apparatus according to the present invention will be described in detail with reference to the accompanying drawings.

図1は、実施の形態の研磨装置10の要部平面図、図2はその側面図である。   FIG. 1 is a plan view of an essential part of a polishing apparatus 10 according to an embodiment, and FIG. 2 is a side view thereof.

実施の形態の研磨装置10は、円盤状の被研磨物12を送りテーブル14によって矢印Aで示す方向に連続的に搬送しながら、送りテーブル14の上方に配置された複数の研磨パッド16、16…によって被研磨物12の研磨面を研磨する連続式の研磨装置である。   The polishing apparatus 10 according to the embodiment includes a plurality of polishing pads 16 and 16 disposed above the feed table 14 while continuously transporting the disk-shaped workpiece 12 in the direction indicated by the arrow A by the feed table 14. This is a continuous polishing apparatus that polishes the polishing surface of the workpiece 12 by.

なお、図1、図2には4枚の研磨パッド16、16…が示されているが、連続式の研磨装置の場合には、数十枚の研磨パッド16が矢印Aで示す搬送方向に沿って配置されている。また、本発明の研磨装置は、連続式の研磨装置10に限定されず、ガラス板を搬送しない枚葉式の研磨装置にも適用することができる。   1 and 2 show four polishing pads 16, 16,... In the case of a continuous polishing apparatus, several tens of polishing pads 16 are arranged in the transport direction indicated by an arrow A. Are arranged along. Further, the polishing apparatus of the present invention is not limited to the continuous polishing apparatus 10 and can be applied to a single wafer polishing apparatus that does not convey a glass plate.

研磨装置10は図2の如く、搬送方向に沿ってレール18が敷設され、このレール18に送りテーブル14が走行自在に載置されている。被研磨物12は、送りテーブル14の上面に配置された吸着シート20にその非研磨面が着脱自在に吸着保持されている。また、送りテーブル14の下面には、レール18に平行なラック22が設けられており、このラック22にピニオン(搬送手段)24が噛合されている。ピニオン24は、レール18側に回転自在に取り付けられるとともに、不図示の駆動モータの回転軸にピニオン24の回転軸25が連結されている。したがって、前記駆動モータの駆動力によりピニオン24が図2の時計周り方向に回転されると、その動力がラック22を介して送りテーブル14に伝達され、送りテーブル14が矢印A方向に所定の速度で搬送される。これにより、被研磨物12と、この被研磨物12を回転させる後述の回転手段とが送りテーブル14とともに矢印A方向に搬送される。   As shown in FIG. 2, the polishing apparatus 10 has rails 18 laid along the conveying direction, and the feed table 14 is placed on the rails 18 so as to be able to run. The non-polished surface of the workpiece 12 is adsorbed and held on the suction sheet 20 disposed on the upper surface of the feed table 14 so as to be detachable. A rack 22 parallel to the rail 18 is provided on the lower surface of the feed table 14, and a pinion (conveying means) 24 is engaged with the rack 22. The pinion 24 is rotatably attached to the rail 18 side, and the rotation shaft 25 of the pinion 24 is connected to the rotation shaft of a drive motor (not shown). Accordingly, when the pinion 24 is rotated in the clockwise direction in FIG. 2 by the driving force of the drive motor, the power is transmitted to the feed table 14 via the rack 22, and the feed table 14 is moved at a predetermined speed in the direction of arrow A. It is conveyed by. As a result, the object to be polished 12 and a rotating means to be described later for rotating the object to be polished 12 are conveyed together with the feed table 14 in the direction of arrow A.

なお、レール18の終端位置に送りテーブル14が到着すると、その位置で研磨終了した被研磨物12が吸着シート20から剥がされる。そして、送りテーブル14は、レール18と平行に配設された不図示のローラーコンベアの始端位置に移載され、ローラーコンベアによる返送中に、次に研磨する被研磨物がその吸着シート20に貼り付けられる。その後、送りテーブル14は、ローラーコンベアの終端位置からレール18の始端位置に再移載され、矢印A方向に移動される。   When the feed table 14 arrives at the end position of the rail 18, the workpiece 12 that has been polished at that position is peeled off from the suction sheet 20. Then, the feed table 14 is transferred to a starting end position of a roller conveyor (not shown) arranged in parallel with the rail 18, and an object to be polished next is attached to the suction sheet 20 during the return by the roller conveyor. Attached. Thereafter, the feed table 14 is transferred again from the end position of the roller conveyor to the start end position of the rail 18 and moved in the direction of arrow A.

図3は、研磨パッド16の要部拡大斜視図である。研磨パッド16の形状は、板状体である。研磨パッド16の材料は特に限定されず、ポリウレタン樹脂、尿素樹脂、メラミン樹脂、フェノール樹脂、エポキシ樹脂、不飽和ポリエステル樹脂、アルキド樹脂、オレフィン系樹脂が例示される。また、被研磨物12の研磨面に当接される研磨パッド16の面には、図3の如く複数本の溝17、17…が備えられている。これらの溝17、17…は平行であり、また、図1の送りテーブル14の移動方向Aに対して直交する方向となるように図2の研磨ヘッド26の下面に取り付けられている。   FIG. 3 is an enlarged perspective view of a main part of the polishing pad 16. The shape of the polishing pad 16 is a plate-like body. The material of the polishing pad 16 is not particularly limited, and examples thereof include polyurethane resin, urea resin, melamine resin, phenol resin, epoxy resin, unsaturated polyester resin, alkyd resin, and olefin resin. Further, the surface of the polishing pad 16 that comes into contact with the polishing surface of the workpiece 12 is provided with a plurality of grooves 17, 17... As shown in FIG. These grooves 17 are parallel to each other, and are attached to the lower surface of the polishing head 26 in FIG. 2 so as to be in a direction orthogonal to the moving direction A of the feed table 14 in FIG.

図2に示すように、研磨ヘッド26は、遊星ギヤ機構等の公知の公転運動機構部(動作手段)28の出力軸に連結されている。また、公転運動機構部28には駆動モータ(不図示)が搭載され、この駆動モータによって公転運動機構部28が駆動されることにより、前記出力軸が公転運動を行う。これによって、研磨ヘッド26に取り付けられた研磨パッド16は、研磨パッド16の質量重心O点が、公転軸P点を中心に、矢印Bで示す軌跡に沿って移動するように公転駆動される。研磨パッド16の公転動作によって、研磨パッド16が被研磨物12の研磨面に対して平行移動される。なお、公転運動機構部28の前記出力軸に回転を与えるように公転運動機構部28を構成すれば、研磨パッド16は、矢印Bの軌跡に沿って公転しながら自転することができる。   As shown in FIG. 2, the polishing head 26 is connected to an output shaft of a known revolving motion mechanism (operation means) 28 such as a planetary gear mechanism. The revolution motion mechanism unit 28 is equipped with a drive motor (not shown), and the revolution motion mechanism unit 28 is driven by the drive motor, whereby the output shaft performs a revolution motion. As a result, the polishing pad 16 attached to the polishing head 26 is driven to revolve so that the mass center of gravity O point of the polishing pad 16 moves along the locus indicated by the arrow B around the revolution axis P point. By the revolution operation of the polishing pad 16, the polishing pad 16 is translated with respect to the polishing surface of the workpiece 12. In addition, if the revolution motion mechanism part 28 is comprised so that rotation may be given to the said output shaft of the revolution motion mechanism part 28, the polishing pad 16 can rotate, revolving along the locus | trajectory of the arrow B.

一方、被研磨物12を吸着保持する図2の吸着シート20は、回転テーブル(回転手段)30の上面に貼り付けられている。この回転テーブル30は円盤状に構成されており、その下面中央には回転軸32が連結されている。   On the other hand, the suction sheet 20 shown in FIG. 2 that holds the object to be polished 12 by suction is attached to the upper surface of the rotary table (rotating means) 30. The rotary table 30 is formed in a disk shape, and a rotary shaft 32 is connected to the center of the lower surface thereof.

図4は、回転テーブル30の回転機構部を示した平面図である。図4に示すように、回転軸32は、周面にギヤ34が刻設された円盤36の中央部に立設されている。円盤36は送りテーブル14に回転自在に取り付けられており、また、ギヤ34にはギヤ38が噛合されている。このギヤ34とギヤ38とによってベベルギヤが構成され、ギヤ38の軸40に不図示のモータの出力軸が連結されている。したがって、前記モータが駆動されることにより、その動力がギヤ38からギヤ34を介して円盤36に伝達され、そして円盤36から回転軸32を介して回転テーブル30に伝達されることにより、回転テーブル30が中心軸Qを中心に回転する。これにより、吸着シート20に吸着保持された被研磨物12が中心軸Qを中心に矢印Cで示す反時計周り方向に回転する。   FIG. 4 is a plan view showing a rotation mechanism portion of the turntable 30. As shown in FIG. 4, the rotary shaft 32 is erected at the center of a disk 36 in which a gear 34 is engraved on the peripheral surface. The disk 36 is rotatably attached to the feed table 14, and a gear 38 is engaged with the gear 34. The gear 34 and the gear 38 form a bevel gear, and an output shaft of a motor (not shown) is connected to the shaft 40 of the gear 38. Therefore, when the motor is driven, the power is transmitted from the gear 38 to the disk 36 via the gear 34 and from the disk 36 to the rotary table 30 via the rotary shaft 32, so that the rotary table is transmitted. 30 rotates about the central axis Q. As a result, the workpiece 12 attracted and held by the suction sheet 20 rotates in the counterclockwise direction indicated by the arrow C about the central axis Q.

次に、実施の形態の研磨装置10の作用について説明する。   Next, the operation of the polishing apparatus 10 according to the embodiment will be described.

実施の形態の研磨装置10は、ラック22とピニオン24の送り動作によって送りテーブル14を矢印A方向に搬送しながら、研磨パッド16を公転(及び/又は自転)させるとともに被研磨物12をその中心に回転させて、被研磨物12の研磨面を多数の研磨パッド16、16…によって連続的に研磨する。   The polishing apparatus 10 according to the embodiment causes the polishing pad 16 to revolve (and / or rotate) while the feed table 14 is conveyed in the direction of arrow A by the feed operation of the rack 22 and the pinion 24, and the workpiece 12 is centered on the polishing pad 10. The polishing surface of the workpiece 12 is continuously polished by a number of polishing pads 16, 16.

従来の研磨装置のように、公転及び/又は自転する研磨パッドによって静止した被研磨物を研磨すると、研磨パッドの溝が被研磨物の研磨面に規則的に当たる。換言すると、研磨パッドは、被研磨物の研磨面全体を均一に研磨せず、研磨面の特定の箇所に偏って研磨する。このため、従来の研磨装置では、被研磨物の研磨面に研磨痕が発生する。   When a stationary object is polished by a revolving and / or rotating polishing pad as in a conventional polishing apparatus, the groove of the polishing pad regularly hits the polishing surface of the object. In other words, the polishing pad does not uniformly polish the entire polishing surface of the object to be polished, but is biased to a specific portion of the polishing surface. For this reason, in the conventional polishing apparatus, polishing marks are generated on the polishing surface of the object to be polished.

これに対して、実施の形態の研磨装置10は、被研磨物12を回転させたので、研磨パッド16の溝17は、被研磨物12の研磨面に無作為に当たるようになる。これにより、実施の形態の研磨装置10は、従来の研磨装置で発生する前記研磨痕を緩和することができる。   On the other hand, since the polishing apparatus 10 according to the embodiment rotates the object to be polished 12, the groove 17 of the polishing pad 16 comes into contact with the polishing surface of the object 12 at random. Thereby, the polishing apparatus 10 according to the embodiment can relieve the polishing marks generated in the conventional polishing apparatus.

また、実施の形態の研磨装置10は、研磨パッド16を公転させるだけで、研磨パッド16の溝17が被研磨物12の研磨面に無作為に当たり、また、公転と自転とを組み合わせれば、より一層無作為に当たるようになるので、被研磨物12の研磨面の平坦度が向上する。   In addition, the polishing apparatus 10 of the embodiment merely revolves the polishing pad 16 so that the groove 17 of the polishing pad 16 randomly hits the polishing surface of the workpiece 12, and if the revolution and rotation are combined, Since the contact is more random, the flatness of the polished surface of the workpiece 12 is improved.

なお、上記実施の形態では、図5Aの如く被研磨物12の中心と回転テーブル30の中心軸Qとを合致させて、被研磨物12をその中心に回転させるようにしたが、この限りではない。例えば図5Bに示すように、1枚の被研磨物12Aの中心Pを回転テーブル30の回転中心Qに対してオフセットして被研磨物12を公転させてもよく、また、図5Cに示すように、3枚又は4枚の被研磨物12B、12B…の各中心Pを回転テーブル30の回転中心Qに対してオフセットして3枚の被研磨物12B、12B…を公転させてもよい。 In the above embodiment, as shown in FIG. 5A, the center of the workpiece 12 and the center axis Q of the rotary table 30 are matched to rotate the workpiece 12 to the center. Absent. For example, as shown in FIG. 5B, the center P1 of one workpiece 12A may be offset with respect to the rotation center Q of the rotary table 30, and the workpiece 12 may be revolved. as such, three or four workpiece 12B, 12B ... 3 sheets of workpiece 12B each center P 2 is offset with respect to the rotation center Q of the rotary table 30, and also be revolved 12B ... Good.

図5B、図5Cの如く被研磨物12A、12Bを公転させることにより、図5Aで示した自転型のものと比較して、研磨パッド16の溝17が被研磨物12の研磨面に当たる無作為性が増すので、被研磨物12の研磨面の平坦度がより一層向上する。   By rotating the objects 12A and 12B to be polished as shown in FIG. 5B and FIG. 5C, the grooves 17 of the polishing pad 16 are randomly contacted with the polishing surface of the object 12 as compared with the rotation type shown in FIG. 5A. Therefore, the flatness of the polished surface of the workpiece 12 is further improved.

更に、実施の形態の研磨装置10では、図1の如く、被研磨物12の矢印Bで示す時計周りの公転方向と、研磨パッド16の矢印Cで示す反時計周りの回転方向(及び/又は自転方向)とが逆方向に設定されている。   Furthermore, in the polishing apparatus 10 of the embodiment, as shown in FIG. 1, the clockwise revolution direction indicated by the arrow B of the workpiece 12 and the counterclockwise rotation direction indicated by the arrow C of the polishing pad 16 (and / or Rotation direction) is set in the opposite direction.

ここで、被研磨物の自転方向と研磨パッドの公転方向(及び/又は自転方向)とが同方向に設定された研磨装置と、実施の形態の研磨装置10とを比較する。実施の形態の研磨装置10は、被研磨物12の研磨面の任意の一点を通過する研磨パッド16の相対速度が、前者の研磨装置と比較して速くなる。これにより、実施の形態の研磨装置10は、前者の研磨装置よりも研磨効率が向上し、研磨時間を短縮することができる。   Here, the polishing apparatus in which the rotation direction of the object to be polished and the revolution direction (and / or rotation direction) of the polishing pad are set in the same direction will be compared with the polishing apparatus 10 of the embodiment. In the polishing apparatus 10 of the embodiment, the relative speed of the polishing pad 16 passing through any one point on the polishing surface of the workpiece 12 is higher than that of the former polishing apparatus. Thereby, the polishing apparatus 10 according to the embodiment can improve the polishing efficiency and shorten the polishing time as compared with the former polishing apparatus.

一方で、連続式の研磨装置であって被研磨物が回転しない特許文献1の研磨装置では、被研磨物に対する研磨パッドの接触面積が大きくなるに従って研磨圧力が低くなり、前記接触面積が小さくなるに従って研磨圧力が高くなる傾向がある。このため、特許文献1の研磨装置では、被研磨物の内側の研磨代が外側よりも小さくなるので、研磨面に研磨代の分布が発生する。   On the other hand, in the polishing apparatus of Patent Document 1 which is a continuous polishing apparatus and the object to be polished does not rotate, the polishing pressure decreases as the contact area of the polishing pad with the object to be polished increases, and the contact area decreases. Accordingly, the polishing pressure tends to increase. For this reason, in the polishing apparatus of Patent Document 1, the polishing allowance on the inner side of the object to be polished is smaller than that on the outer side, so that the distribution of the polishing allowance occurs on the polishing surface.

これに対して実施の形態の研磨装置10は、被研磨物12を回転させるとともに研磨パッド16を平行移動させるため、研磨代の分布を緩和できるという利点がある。   On the other hand, the polishing apparatus 10 according to the embodiment has an advantage that the distribution of the polishing allowance can be relaxed because the workpiece 12 is rotated and the polishing pad 16 is translated.

また、実施の形態の研磨パッド16、16…は、隣接する研磨パッド16と回転位相差を持って公転されている。   Further, the polishing pads 16, 16... Of the embodiment are revolved with an adjacent polishing pad 16 with a rotational phase difference.

つまり、図1の如く、被研磨物12の搬送中に1枚の被研磨物12に対して2台の研磨パッド16、16が当接して研磨を行う場合には、各研磨パッド16、16の質量重心Oの回転位相差を180度に設定する。また、1枚の被研磨物12に対して4台の研磨パッド16、16…が当接して研磨を行う場合には、各研磨パッド16、16…の質量重心Oの回転位相差を90度に設定する。これにより、各研磨パッド16、16…の回転運動によって被研磨物12に作用する負荷を相殺することができるので、被研磨物12を均一に研磨することができる。   That is, as shown in FIG. 1, when polishing is performed with two polishing pads 16, 16 coming into contact with one object 12 during the conveyance of the object 12, each polishing pad 16, 16 The rotational phase difference of the mass center of gravity O is set to 180 degrees. When four polishing pads 16, 16... Are in contact with one object to be polished 12 for polishing, the rotational phase difference of the mass center of gravity O of each polishing pad 16, 16. Set to. Thus, the load acting on the object to be polished 12 can be offset by the rotational movement of each of the polishing pads 16, 16,..., So that the object to be polished 12 can be uniformly polished.

なお、実施の形態では形状が円盤状の被研磨物12を例示したが、被研磨物12の形状は円盤状に限定されるものではなく矩形状であってもよい。   In the embodiment, the disk-shaped workpiece 12 is illustrated, but the shape of the workpiece 12 is not limited to the disk shape, and may be a rectangular shape.

しかしながら、図6(A)に示すように、矩形状の被研磨物12Cを連続式の研磨装置に適用した場合、送りテーブル14に対する被研磨物12Cの搭載枚数が少なくなるので、生産効率が低下する。つまり、矩形状の被研磨物12Cをその質量重心を中心に回転させた場合(図中の一点鎖線は被研磨物12Cのエッジの回転軌跡を示す)、隣接する被研磨物12Cとの干渉を防止するために隣接する被研磨物12Cの間隔を広げて被研磨物12Cを送りテーブル14に搭載しなければならない。これにより、送りテーブル14に対する被研磨物12Cの搭載枚数が少なくなるので、生産効率が低下する。   However, as shown in FIG. 6A, when the rectangular object 12C is applied to a continuous polishing apparatus, the number of objects to be polished 12C mounted on the feed table 14 is reduced, resulting in a decrease in production efficiency. To do. That is, when the rectangular object 12C is rotated around its center of mass (the dashed line in the figure indicates the rotation trajectory of the edge of the object 12C), interference with the adjacent object 12C is caused. In order to prevent this, the object to be polished 12C must be mounted on the feed table 14 with the interval between adjacent objects to be polished 12C widened. As a result, the number of objects to be polished 12C mounted on the feed table 14 is reduced, so that the production efficiency is lowered.

これに対して図6(B)に示すように、円盤状の被研磨物12であって、被研磨物12の質量重心を中心に回転させる回転テーブル30(図2参照)を有する連続式の研磨装置10では、干渉を防止するために隣接する被研磨物12の間隔を広げる必要はない。これにより、送りテーブル14に対する被研磨物12の搭載枚数が、矩形状の被研磨物12Cと比較して多くなるので、生産効率が向上する。   On the other hand, as shown in FIG. 6B, the disk-shaped object 12 is a continuous type having a rotary table 30 (see FIG. 2) that rotates around the center of mass of the object 12. In the polishing apparatus 10, it is not necessary to widen the interval between adjacent objects 12 to prevent interference. As a result, the number of objects to be polished 12 mounted on the feed table 14 is increased as compared with the rectangular object to be polished 12C, so that the production efficiency is improved.

10…研磨装置、12…被研磨物、12A、12B、12C…被研磨物、14…送りテーブル、16…研磨パッド、17…溝、18…レール、20…吸着シート、22…ラック、24…ピニオン、25…回転軸、26…研磨ヘッド、28…公転運動機構部、30…回転テーブル、32…回転軸、34…ギヤ、36…円盤、38…ギヤ、40…軸   DESCRIPTION OF SYMBOLS 10 ... Polishing apparatus, 12 ... Object to be polished, 12A, 12B, 12C ... Object to be polished, 14 ... Feed table, 16 ... Polishing pad, 17 ... Groove, 18 ... Rail, 20 ... Adsorption sheet, 22 ... Rack, 24 ... Pinion, 25 ... rotating shaft, 26 ... polishing head, 28 ... revolving motion mechanism, 30 ... rotating table, 32 ... rotating shaft, 34 ... gear, 36 ... disk, 38 ... gear, 40 ... shaft

Claims (6)

被研磨物と、該被研磨物の研磨面に当接される複数本の溝を備えた研磨パッドとを相対的に押し付けて、前記被研磨物の研磨面を研磨する研磨装置であって、
前記被研磨物の非研磨面を保持するとともに該被研磨物を所定の軸を中心に回転させる回転手段と、前記研磨パッドを前記被研磨物の研磨面に対して平行移動させる動作手段とを備えることを特徴とする研磨装置。
A polishing apparatus that relatively presses an object to be polished and a polishing pad having a plurality of grooves in contact with the polishing surface of the object to be polished, and polishes the polishing surface of the object to be polished,
Rotating means for holding the non-polished surface of the object to be polished and rotating the object to be polished around a predetermined axis; and operating means for translating the polishing pad with respect to the polishing surface of the object to be polished A polishing apparatus comprising:
前記動作手段は、前記研磨パッドを、公転軸によって公転、及び/又は自転軸によって自転させる請求項1に記載の研磨装置。   The polishing apparatus according to claim 1, wherein the operating unit revolves the polishing pad by a revolving axis and / or rotates by a revolving axis. 前記被研磨物の前記回転手段による回転方向と、前記動作手段による前記研磨パッドの公転方向、及び/又は自転方向とが逆方向に設定されている請求項2に記載の研磨装置。   The polishing apparatus according to claim 2, wherein a rotating direction of the object to be polished by the rotating unit and a revolution direction and / or a rotating direction of the polishing pad by the operating unit are set in opposite directions. 前記被研磨物を前記回転手段とともに所定の方向に搬送する搬送手段を備え、前記研磨パッドは、前記搬送手段による前記被研磨物の搬送経路に所定の間隔を持って複数台配置されている請求項1、2、又は3に記載の研磨装置。   A conveying means for conveying the object to be polished together with the rotating means in a predetermined direction is provided, and a plurality of the polishing pads are arranged at a predetermined interval on a conveying path of the object to be polished by the conveying means. Item 4. The polishing apparatus according to Item 1, 2, or 3. 前記研磨パッドは、隣接する研磨パッドと回転位相差を持って公転される請求項4に記載の研磨装置。   The polishing apparatus according to claim 4, wherein the polishing pad is revolved with an adjacent polishing pad with a rotational phase difference. 前記回転手段は、円盤状の前記被研磨物を、その質量重心を中心に回転させる請求項4又は5に記載の研磨装置。   The polishing apparatus according to claim 4 or 5, wherein the rotating means rotates the disk-shaped object to be polished around its center of mass.
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CN107234510A (en) * 2017-08-03 2017-10-10 合肥念萍电子商务有限公司 Burnishing device for glassware

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