JP2012141273A5 - - Google Patents

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Publication number
JP2012141273A5
JP2012141273A5 JP2011001302A JP2011001302A JP2012141273A5 JP 2012141273 A5 JP2012141273 A5 JP 2012141273A5 JP 2011001302 A JP2011001302 A JP 2011001302A JP 2011001302 A JP2011001302 A JP 2011001302A JP 2012141273 A5 JP2012141273 A5 JP 2012141273A5
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JP
Japan
Prior art keywords
signal
distance measuring
target
radio wave
phase difference
Prior art date
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Granted
Application number
JP2011001302A
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English (en)
Japanese (ja)
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JP5834409B2 (ja
JP2012141273A (ja
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Priority to JP2011001302A priority Critical patent/JP5834409B2/ja
Priority claimed from JP2011001302A external-priority patent/JP5834409B2/ja
Publication of JP2012141273A publication Critical patent/JP2012141273A/ja
Publication of JP2012141273A5 publication Critical patent/JP2012141273A5/ja
Application granted granted Critical
Publication of JP5834409B2 publication Critical patent/JP5834409B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2011001302A 2011-01-06 2011-01-06 Ｉｃタグの距離測定装置およびｉｃタグ Expired - Fee Related JP5834409B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011001302A JP5834409B2 (ja) 2011-01-06 2011-01-06 Ｉｃタグの距離測定装置およびｉｃタグ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011001302A JP5834409B2 (ja) 2011-01-06 2011-01-06 Ｉｃタグの距離測定装置およびｉｃタグ

Publications (3)

Publication Number Publication Date
JP2012141273A JP2012141273A (ja) 2012-07-26
JP2012141273A5 true JP2012141273A5 (enExample) 2013-12-05
JP5834409B2 JP5834409B2 (ja) 2015-12-24

Family

ID=46677693

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011001302A Expired - Fee Related JP5834409B2 (ja) 2011-01-06 2011-01-06 Ｉｃタグの距離測定装置およびｉｃタグ

Country Status (1)

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JP (1) JP5834409B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2793401A1 (en) * 2013-04-17 2014-10-22 Fujitsu Laboratories of Europe Limited Tracking exposure to electomagnetic fields
JP6398702B2 (ja) * 2014-12-25 2018-10-03 大日本印刷株式会社 用紙残量計測システムおよび用紙残量測定装置
JP7107762B2 (ja) * 2018-06-20 2022-07-27 東芝テック株式会社 通信装置、通信方法及びプログラム

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2840832B2 (ja) * 1997-02-10 1998-12-24 ソニー株式会社 反射型送信装置
US6868073B1 (en) * 2000-06-06 2005-03-15 Battelle Memorial Institute K1-53 Distance/ranging by determination of RF phase delta
JP2003298463A (ja) * 2002-04-04 2003-10-17 Sony Corp 移動体識別システム、移動体識別システムの動作方法および質問器
JP4282965B2 (ja) * 2002-09-13 2009-06-24 パナソニック株式会社 質問器、およびそれを用いた電波到来方向推定装置
US20070023520A1 (en) * 2004-04-22 2007-02-01 Matsushita Electric Industrial Co., Ltd. Contactless reader/writer
JP4645177B2 (ja) * 2004-11-30 2011-03-09 パナソニック電工株式会社 計測装置
JP4414351B2 (ja) * 2005-02-15 2010-02-10 三菱電機株式会社 照合端末
JP5118335B2 (ja) * 2006-11-27 2013-01-16 パナソニック株式会社 通過管理システム

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