JP2012079878A5 - - Google Patents

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Publication number
JP2012079878A5
JP2012079878A5 JP2010222957A JP2010222957A JP2012079878A5 JP 2012079878 A5 JP2012079878 A5 JP 2012079878A5 JP 2010222957 A JP2010222957 A JP 2010222957A JP 2010222957 A JP2010222957 A JP 2010222957A JP 2012079878 A5 JP2012079878 A5 JP 2012079878A5
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JP
Japan
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light emission
waveform
plasma processing
unit
timer
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JP2010222957A
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English (en)
Japanese (ja)
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JP5654309B2 (ja
JP2012079878A (ja
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Publication of JP2012079878A5 publication Critical patent/JP2012079878A5/ja
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JP2010222957A 2010-09-30 2010-09-30 エンドポイントモニタ及びプラズマ処理方法 Active JP5654309B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010222957A JP5654309B2 (ja) 2010-09-30 2010-09-30 エンドポイントモニタ及びプラズマ処理方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010222957A JP5654309B2 (ja) 2010-09-30 2010-09-30 エンドポイントモニタ及びプラズマ処理方法

Publications (3)

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JP2012079878A JP2012079878A (ja) 2012-04-19
JP2012079878A5 true JP2012079878A5 (https=) 2013-12-05
JP5654309B2 JP5654309B2 (ja) 2015-01-14

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JP2010222957A Active JP5654309B2 (ja) 2010-09-30 2010-09-30 エンドポイントモニタ及びプラズマ処理方法

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JP (1) JP5654309B2 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9768463B2 (en) 2012-07-27 2017-09-19 Lockheed Martin Advanced Energy Storage, Llc Aqueous redox flow batteries comprising metal ligand coordination compounds
CN104854731B (zh) * 2012-07-27 2018-02-06 洛克希德马丁尖端能量存储有限公司 特征为高开路电压的电化学储能系统
US9559374B2 (en) 2012-07-27 2017-01-31 Lockheed Martin Advanced Energy Storage, Llc Electrochemical energy storage systems and methods featuring large negative half-cell potentials
US9899694B2 (en) 2012-07-27 2018-02-20 Lockheed Martin Advanced Energy Storage, Llc Electrochemical energy storage systems and methods featuring high open circuit potential
US9865893B2 (en) 2012-07-27 2018-01-09 Lockheed Martin Advanced Energy Storage, Llc Electrochemical energy storage systems and methods featuring optimal membrane systems
US12046522B2 (en) 2022-02-18 2024-07-23 Applied Materials, Inc. Endpoint detection in low open area and/or high aspect ratio etch applications

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2611001B2 (ja) * 1989-07-17 1997-05-21 株式会社日立製作所 終点判定方法および装置
JP2002231695A (ja) * 2001-01-31 2002-08-16 Sony Corp プラズマ処理の終点判定方法

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