JP2011242255A5 - - Google Patents

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JP2011242255A5
JP2011242255A5 JP2010114617A JP2010114617A JP2011242255A5 JP 2011242255 A5 JP2011242255 A5 JP 2011242255A5 JP 2010114617 A JP2010114617 A JP 2010114617A JP 2010114617 A JP2010114617 A JP 2010114617A JP 2011242255 A5 JP2011242255 A5 JP 2011242255A5
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chromatogram
ratio
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JP2010114617A
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JP2011242255A (ja
JP5365579B2 (ja
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JP2010114617A 2010-05-18 2010-05-18 クロマトグラフ質量分析用データ処理装置 Active JP5365579B2 (ja)

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JP2010114617A JP5365579B2 (ja) 2010-05-18 2010-05-18 クロマトグラフ質量分析用データ処理装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010114617A JP5365579B2 (ja) 2010-05-18 2010-05-18 クロマトグラフ質量分析用データ処理装置

Publications (3)

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JP2011242255A JP2011242255A (ja) 2011-12-01
JP2011242255A5 true JP2011242255A5 (https=) 2012-09-13
JP5365579B2 JP5365579B2 (ja) 2013-12-11

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Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5786703B2 (ja) * 2011-12-20 2015-09-30 株式会社島津製作所 クロマトグラフ質量分析装置用データ処理装置
CA2862255A1 (en) * 2011-12-29 2013-07-04 Dh Technologies Development Pte. Ltd. Use of windowed mass spectrometry data for retention time determination or confirmation
JP5811023B2 (ja) 2012-05-07 2015-11-11 株式会社島津製作所 クロマトグラフ質量分析用データ処理装置
CN106062548B (zh) 2014-03-05 2019-09-03 株式会社岛津制作所 质谱分析方法及质谱分析装置
US10473634B2 (en) 2014-06-12 2019-11-12 Shimadzu Corporation Data processing device for mass spectrometry and program for said device
US9869662B2 (en) 2014-06-19 2018-01-16 Shimadzu Corporation Chromatograph/mass spectrometer data processing device
US9754394B2 (en) 2014-12-17 2017-09-05 Shimadzu Corporation Analytical data display processing device
JP6715451B2 (ja) * 2015-04-08 2020-07-01 国立大学法人山梨大学 マススペクトル解析システム，方法およびプログラム
JP6460252B2 (ja) * 2015-09-25 2019-01-30 株式会社島津製作所 定性分析のための質量分析データ処理装置
JP6791373B2 (ja) * 2017-05-08 2020-11-25 株式会社島津製作所 クロマトグラフ質量分析データ処理装置及びクロマトグラフ質量分析データ処理用プログラム
JP7105049B2 (ja) * 2017-10-02 2022-07-22 日本電子株式会社 質量分析データ処理装置、及び質量分析データ処理方法
JP6901376B2 (ja) * 2017-10-16 2021-07-14 日本電子株式会社 質量分析用データ処理装置及び質量分析用データ処理方法
EP3942593A4 (en) * 2019-03-22 2023-01-11 DH Technologies Development Pte. Ltd. DETERMINING THE ELUTION OF AGNOSTIC COMPOUNDS
JP7163874B2 (ja) * 2019-06-11 2022-11-01 株式会社島津製作所 分析装置及びｘ線回折装置
CN115244397B (zh) * 2020-03-16 2025-12-02 豪夫迈·罗氏有限公司 用于lc-ms的质量控制工具
JP2024012951A (ja) * 2022-07-19 2024-01-31 株式会社島津製作所 データ処理システム
JP7607061B2 (ja) * 2023-01-13 2024-12-26 日本電子株式会社 質量分析システム及びピーク評価方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59164954A (ja) * 1983-03-11 1984-09-18 Jeol Ltd 質量分析装置
JP2829052B2 (ja) * 1989-09-20 1998-11-25 株式会社日立製作所 クロマトグラフイー用データ処理方法
JP3509470B2 (ja) * 1997-05-16 2004-03-22 株式会社日立製作所 質量分析方法及び質量分析装置
JP2006189279A (ja) * 2005-01-05 2006-07-20 Shimadzu Corp クロマトグラフ質量分析装置
JP4696876B2 (ja) * 2005-11-29 2011-06-08 株式会社島津製作所 クロマトグラム表示処理装置

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