JP2011232070A - 凹部深さの測定方法及び検査装置 - Google Patents

凹部深さの測定方法及び検査装置 Download PDF

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Publication number
JP2011232070A
JP2011232070A JP2010100633A JP2010100633A JP2011232070A JP 2011232070 A JP2011232070 A JP 2011232070A JP 2010100633 A JP2010100633 A JP 2010100633A JP 2010100633 A JP2010100633 A JP 2010100633A JP 2011232070 A JP2011232070 A JP 2011232070A
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Japan
Prior art keywords
depth
image
recess
concave portion
measuring
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JP2010100633A
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Japanese (ja)
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JP2011232070A5 (https=
Inventor
Yosuke Yamakoshi
陽介 山越
Koichi Kojima
広一 小島
Toshio Fujimoto
敏雄 藤本
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Seiko Epson Corp
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Seiko Epson Corp
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Priority to JP2010100633A priority Critical patent/JP2011232070A/ja
Publication of JP2011232070A publication Critical patent/JP2011232070A/ja
Publication of JP2011232070A5 publication Critical patent/JP2011232070A5/ja
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
JP2010100633A 2010-04-26 2010-04-26 凹部深さの測定方法及び検査装置 Pending JP2011232070A (ja)

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JP2010100633A JP2011232070A (ja) 2010-04-26 2010-04-26 凹部深さの測定方法及び検査装置

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JP2010100633A JP2011232070A (ja) 2010-04-26 2010-04-26 凹部深さの測定方法及び検査装置

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JP2011232070A true JP2011232070A (ja) 2011-11-17
JP2011232070A5 JP2011232070A5 (https=) 2013-04-18

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016006039A1 (ja) * 2014-07-08 2016-01-14 日産自動車株式会社 欠陥検査装置及び生産システム
CN115471497A (zh) * 2022-10-10 2022-12-13 深圳市研祥金码科技有限公司 一种缺陷视觉检测方法、装置、设备及存储介质
US20240242364A1 (en) * 2023-01-12 2024-07-18 SK Hynix Inc. Image signal processor

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05307009A (ja) * 1992-04-30 1993-11-19 Kobe Steel Ltd 表面疵自動探傷方法
JPH10221028A (ja) * 1997-01-31 1998-08-21 Toshiba Corp 材料の孔食深さ測定方法およびその測定装置
JPH1123479A (ja) * 1997-07-08 1999-01-29 Nippon Steel Corp 鋼管の溶接部表面疵検査方法
JP2001082931A (ja) * 1999-09-09 2001-03-30 Toshiba Corp 穴深さ測定方法及び穴深さ測定装置
JP2001345358A (ja) * 2000-05-31 2001-12-14 Dainippon Screen Mfg Co Ltd プローブ痕深さ測定装置
JP2006208187A (ja) * 2005-01-27 2006-08-10 Nagoya Electric Works Co Ltd 形状良否判定装置および形状良否判定方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05307009A (ja) * 1992-04-30 1993-11-19 Kobe Steel Ltd 表面疵自動探傷方法
JPH10221028A (ja) * 1997-01-31 1998-08-21 Toshiba Corp 材料の孔食深さ測定方法およびその測定装置
JPH1123479A (ja) * 1997-07-08 1999-01-29 Nippon Steel Corp 鋼管の溶接部表面疵検査方法
JP2001082931A (ja) * 1999-09-09 2001-03-30 Toshiba Corp 穴深さ測定方法及び穴深さ測定装置
JP2001345358A (ja) * 2000-05-31 2001-12-14 Dainippon Screen Mfg Co Ltd プローブ痕深さ測定装置
JP2006208187A (ja) * 2005-01-27 2006-08-10 Nagoya Electric Works Co Ltd 形状良否判定装置および形状良否判定方法

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016006039A1 (ja) * 2014-07-08 2016-01-14 日産自動車株式会社 欠陥検査装置及び生産システム
CN106471333A (zh) * 2014-07-08 2017-03-01 日产自动车株式会社 缺陷检查装置以及生产系统
JPWO2016006039A1 (ja) * 2014-07-08 2017-04-27 日産自動車株式会社 欠陥検査装置及び生産システム
US9805457B2 (en) 2014-07-08 2017-10-31 Nissan Motor Co., Ltd. Defect detection device and production system
CN106471333B (zh) * 2014-07-08 2018-01-23 日产自动车株式会社 缺陷检查装置以及生产系统
US10339645B2 (en) 2014-07-08 2019-07-02 Nissan Motor Co., Ltd. Defect detection device and production system
CN115471497A (zh) * 2022-10-10 2022-12-13 深圳市研祥金码科技有限公司 一种缺陷视觉检测方法、装置、设备及存储介质
US20240242364A1 (en) * 2023-01-12 2024-07-18 SK Hynix Inc. Image signal processor

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