JP2011232070A - 凹部深さの測定方法及び検査装置 - Google Patents
凹部深さの測定方法及び検査装置 Download PDFInfo
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- JP2011232070A JP2011232070A JP2010100633A JP2010100633A JP2011232070A JP 2011232070 A JP2011232070 A JP 2011232070A JP 2010100633 A JP2010100633 A JP 2010100633A JP 2010100633 A JP2010100633 A JP 2010100633A JP 2011232070 A JP2011232070 A JP 2011232070A
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- 238000000034 method Methods 0.000 title claims abstract description 38
- 238000007689 inspection Methods 0.000 title claims abstract description 20
- 238000005259 measurement Methods 0.000 claims abstract description 45
- 238000004364 calculation method Methods 0.000 claims abstract description 39
- 238000003384 imaging method Methods 0.000 claims description 11
- 238000012937 correction Methods 0.000 claims description 10
- 238000012546 transfer Methods 0.000 claims description 9
- 238000013459 approach Methods 0.000 claims description 3
- 230000001678 irradiating effect Effects 0.000 claims 1
- 230000002093 peripheral effect Effects 0.000 abstract description 12
- 238000012545 processing Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 5
- 238000000691 measurement method Methods 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 238000000605 extraction Methods 0.000 description 4
- 238000005286 illumination Methods 0.000 description 4
- 239000000523 sample Substances 0.000 description 4
- 239000011521 glass Substances 0.000 description 3
- 238000009499 grossing Methods 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000000284 extract Substances 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010100633A JP2011232070A (ja) | 2010-04-26 | 2010-04-26 | 凹部深さの測定方法及び検査装置 |
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| Application Number | Priority Date | Filing Date | Title |
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| JP2010100633A JP2011232070A (ja) | 2010-04-26 | 2010-04-26 | 凹部深さの測定方法及び検査装置 |
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| Publication Number | Publication Date |
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| JP2011232070A true JP2011232070A (ja) | 2011-11-17 |
| JP2011232070A5 JP2011232070A5 (https=) | 2013-04-18 |
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| JP2010100633A Pending JP2011232070A (ja) | 2010-04-26 | 2010-04-26 | 凹部深さの測定方法及び検査装置 |
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| JP (1) | JP2011232070A (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016006039A1 (ja) * | 2014-07-08 | 2016-01-14 | 日産自動車株式会社 | 欠陥検査装置及び生産システム |
| CN115471497A (zh) * | 2022-10-10 | 2022-12-13 | 深圳市研祥金码科技有限公司 | 一种缺陷视觉检测方法、装置、设备及存储介质 |
| US20240242364A1 (en) * | 2023-01-12 | 2024-07-18 | SK Hynix Inc. | Image signal processor |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05307009A (ja) * | 1992-04-30 | 1993-11-19 | Kobe Steel Ltd | 表面疵自動探傷方法 |
| JPH10221028A (ja) * | 1997-01-31 | 1998-08-21 | Toshiba Corp | 材料の孔食深さ測定方法およびその測定装置 |
| JPH1123479A (ja) * | 1997-07-08 | 1999-01-29 | Nippon Steel Corp | 鋼管の溶接部表面疵検査方法 |
| JP2001082931A (ja) * | 1999-09-09 | 2001-03-30 | Toshiba Corp | 穴深さ測定方法及び穴深さ測定装置 |
| JP2001345358A (ja) * | 2000-05-31 | 2001-12-14 | Dainippon Screen Mfg Co Ltd | プローブ痕深さ測定装置 |
| JP2006208187A (ja) * | 2005-01-27 | 2006-08-10 | Nagoya Electric Works Co Ltd | 形状良否判定装置および形状良否判定方法 |
-
2010
- 2010-04-26 JP JP2010100633A patent/JP2011232070A/ja active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05307009A (ja) * | 1992-04-30 | 1993-11-19 | Kobe Steel Ltd | 表面疵自動探傷方法 |
| JPH10221028A (ja) * | 1997-01-31 | 1998-08-21 | Toshiba Corp | 材料の孔食深さ測定方法およびその測定装置 |
| JPH1123479A (ja) * | 1997-07-08 | 1999-01-29 | Nippon Steel Corp | 鋼管の溶接部表面疵検査方法 |
| JP2001082931A (ja) * | 1999-09-09 | 2001-03-30 | Toshiba Corp | 穴深さ測定方法及び穴深さ測定装置 |
| JP2001345358A (ja) * | 2000-05-31 | 2001-12-14 | Dainippon Screen Mfg Co Ltd | プローブ痕深さ測定装置 |
| JP2006208187A (ja) * | 2005-01-27 | 2006-08-10 | Nagoya Electric Works Co Ltd | 形状良否判定装置および形状良否判定方法 |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016006039A1 (ja) * | 2014-07-08 | 2016-01-14 | 日産自動車株式会社 | 欠陥検査装置及び生産システム |
| CN106471333A (zh) * | 2014-07-08 | 2017-03-01 | 日产自动车株式会社 | 缺陷检查装置以及生产系统 |
| JPWO2016006039A1 (ja) * | 2014-07-08 | 2017-04-27 | 日産自動車株式会社 | 欠陥検査装置及び生産システム |
| US9805457B2 (en) | 2014-07-08 | 2017-10-31 | Nissan Motor Co., Ltd. | Defect detection device and production system |
| CN106471333B (zh) * | 2014-07-08 | 2018-01-23 | 日产自动车株式会社 | 缺陷检查装置以及生产系统 |
| US10339645B2 (en) | 2014-07-08 | 2019-07-02 | Nissan Motor Co., Ltd. | Defect detection device and production system |
| CN115471497A (zh) * | 2022-10-10 | 2022-12-13 | 深圳市研祥金码科技有限公司 | 一种缺陷视觉检测方法、装置、设备及存储介质 |
| US20240242364A1 (en) * | 2023-01-12 | 2024-07-18 | SK Hynix Inc. | Image signal processor |
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