JP2011174886A5 - - Google Patents

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JP2011174886A5
JP2011174886A5 JP2010040859A JP2010040859A JP2011174886A5 JP 2011174886 A5 JP2011174886 A5 JP 2011174886A5 JP 2010040859 A JP2010040859 A JP 2010040859A JP 2010040859 A JP2010040859 A JP 2010040859A JP 2011174886 A5 JP2011174886 A5 JP 2011174886A5
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JP2010040859A
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JP2011174886A (ja
JP5499767B2 (ja
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JP2010040859A 2010-02-25 2010-02-25 画像特性計測方法、画像特性計測装置、画像評価装置、及び画像形成装置 Expired - Fee Related JP5499767B2 (ja)

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JP2010040859A JP5499767B2 (ja) 2010-02-25 2010-02-25 画像特性計測方法、画像特性計測装置、画像評価装置、及び画像形成装置

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Application Number Priority Date Filing Date Title
JP2010040859A JP5499767B2 (ja) 2010-02-25 2010-02-25 画像特性計測方法、画像特性計測装置、画像評価装置、及び画像形成装置

Publications (3)

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JP2011174886A JP2011174886A (ja) 2011-09-08
JP2011174886A5 true JP2011174886A5 (enrdf_load_stackoverflow) 2013-01-24
JP5499767B2 JP5499767B2 (ja) 2014-05-21

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JP2010040859A Expired - Fee Related JP5499767B2 (ja) 2010-02-25 2010-02-25 画像特性計測方法、画像特性計測装置、画像評価装置、及び画像形成装置

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JP (1) JP5499767B2 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5910989B2 (ja) * 2012-03-09 2016-04-27 株式会社リコー 分光計測装置、画像評価装置及び画像形成装置
JP6398374B2 (ja) * 2014-06-27 2018-10-03 コニカミノルタ株式会社 画像検査装置、及び画像形成装置
WO2018134861A1 (ja) * 2017-01-17 2018-07-26 ギガフォトン株式会社 トムソン散乱計測システム、及びeuv光生成システム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5276321A (en) * 1991-04-15 1994-01-04 Geophysical & Environmental Research Corp. Airborne multiband imaging spectrometer
JPH06241897A (ja) * 1993-02-12 1994-09-02 Mitsubishi Heavy Ind Ltd 分光装置
JP2003091220A (ja) * 2001-09-18 2003-03-28 Fuji Xerox Co Ltd 画像形成装置
JP2005189704A (ja) * 2003-12-26 2005-07-14 Canon Inc 画像形成装置
JP4559347B2 (ja) * 2005-11-24 2010-10-06 シャープ株式会社 印刷物情報測定装置および印刷装置
JP4478669B2 (ja) * 2005-08-31 2010-06-09 キヤノン株式会社 センサおよびそれを用いた記録装置

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