JP2011096925A - Removing device and removing method of convex portion in semiconductor wafer - Google Patents

Removing device and removing method of convex portion in semiconductor wafer Download PDF

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JP2011096925A
JP2011096925A JP2009250933A JP2009250933A JP2011096925A JP 2011096925 A JP2011096925 A JP 2011096925A JP 2009250933 A JP2009250933 A JP 2009250933A JP 2009250933 A JP2009250933 A JP 2009250933A JP 2011096925 A JP2011096925 A JP 2011096925A
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convex portion
semiconductor wafer
concave
convex
adhesive sheet
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JP5346774B2 (en
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Yoshiaki Sugishita
芳昭 杉下
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Lintec Corp
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<P>PROBLEM TO BE SOLVED: To provide a removing device and a removing method of a convex portion in a semiconductor wafer which prevents a trouble in an expanding step or the like to be performed afterward by removing the convex portion even if the wafer has the convex portion at an outer edge thereof. <P>SOLUTION: By adsorbing and holding a concave portion bottom surface WB by a concave portion supporting means 4 and lowering it while supporting a convex portion WA of a wafer W by a convex portion supporting means 3, the convex portion WA can be separated from the wafer W and only a wafer W' corresponding to a concave portion WC can be left in a tape T for mounting. Accordingly, in a post process, when the tape T for mounting is extended before bonding (pickup), since the convex portion WA does not obstruct, each chip can be expanded at a proper interval, and the chip expanded at a predetermined position can be certainly picked up and bonded efficiently. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

本発明は、半導体ウェハの凸部除去装置および除去方法に関する。   The present invention relates to an apparatus and method for removing a convex portion of a semiconductor wafer.

従来、半導体製造工程において、半導体ウェハ(以下、単にウェハという場合がある)を所定の形状、所定のサイズに切断して半導体チップに個片化し(ダイシング工程)、個片化したチップ同士の間隔を拡大してから(エキスパンド工程)、各チップをピックアップして基板にボンディングする(ボンディング工程)ことが行われている。このような各工程のうち、ダイシングされたチップをエキスパンドするエキスパンド装置が提案されている(例えば、特許文献1参照)。特許文献1に記載されたエキスパンド装置は、接着シートを介してリングフレームと一体化されたウェハを接着シート側から支持するとともに、ウェハに対して接着シートを外側に引き伸ばしてチップ間隔を拡大するチャックステージを備えて構成されている。   Conventionally, in a semiconductor manufacturing process, a semiconductor wafer (hereinafter sometimes simply referred to as a wafer) is cut into a predetermined shape and a predetermined size and separated into semiconductor chips (dicing process). After expanding (expanding process), each chip is picked up and bonded to the substrate (bonding process). Among these processes, an expanding apparatus that expands a diced chip has been proposed (see, for example, Patent Document 1). The expanding apparatus described in Patent Document 1 supports a wafer integrated with a ring frame via an adhesive sheet from the adhesive sheet side, and extends the adhesive sheet to the outside of the wafer to increase the chip interval. It is configured with a stage.

一方、半導体製造工程における前記ダイシングの工程において、半導体チップを薄型化するためにウェハの裏面を研削することが行われており、この研削工程において、ウェハの内側を外縁部よりも深く研削することで、外縁部よりも内側が薄く形成され、つまり厚さ方向に突出した環状の凸部を外縁部に有するとともに当該凸部で囲まれた内側に凹部を有する半導体ウェハが知られている(例えば、特許文献2参照)。   On the other hand, in the dicing process in the semiconductor manufacturing process, the back surface of the wafer is ground to reduce the thickness of the semiconductor chip. In this grinding process, the inside of the wafer is ground deeper than the outer edge portion. Thus, a semiconductor wafer is known in which the inner side is formed thinner than the outer edge part, that is, the outer edge part has an annular convex part protruding in the thickness direction and the inner part surrounded by the convex part has a concave part (for example, , See Patent Document 2).

特開2005−57158号公報JP 2005-57158 A 特開2007−19461号公報JP 2007-19461 A

ところで、特許文献2に記載されたような外縁部に凸部を有するウェハでは、ダイシング工程において凹部の厚みに合わせて切断されるために、凸部に対しては厚み方向に一部しか切断されず、凸部が環状に連続した状態で残るため、エキスパンド工程において接着シートを外側に引き伸ばしても、凸部が邪魔をしてエキスパンドできないという不都合がある。また、エキスパンド工程において接着シートを外側に引き伸ばした際に、凸部が割れてエキスパンドできる場合もあるが、凸部が均等に割れることは期待できず、不均等な割れ方をしてしまうことから、エキスパンドされたチップの間隔がばらついてしまい、正確にピックアップできずにボンディングに支障をきたすという問題も生じる。   By the way, in the wafer which has a convex part in the outer edge part as described in patent document 2, since it cut | disconnects according to the thickness of a recessed part in a dicing process, only a part is cut | disconnected in the thickness direction with respect to a convex part. However, since the convex portion remains in an annularly continuous state, there is an inconvenience that even if the adhesive sheet is stretched outward in the expanding step, the convex portion interferes with the expansion. Also, when the adhesive sheet is stretched outward in the expanding process, the convex part may crack and expand, but the convex part cannot be expected to crack evenly, and it will be unevenly cracked. Further, there is a problem in that the distance between the expanded chips varies, and the pickup cannot be accurately picked up and the bonding is hindered.

本発明の目的は、外縁部に凸部を有するウェハであっても、この凸部を除去することで、後に行われるエキスパンド工程等で支障を来たさないようにできる半導体ウェハの凸部除去装置および除去方法を提供することにある。   An object of the present invention is to remove a convex portion of a semiconductor wafer that can prevent a hindrance in an expanding process performed later by removing the convex portion even if the wafer has a convex portion on an outer edge portion. It is to provide an apparatus and a removal method.

前記目的を達成するため、本発明の半導体ウェハの凸部除去装置は、厚さ方向の一方に突出した環状の凸部を外縁部に有するとともに当該凸部で囲まれた内側に凹部を有する半導体ウェハから前記凸部を除去する半導体ウェハの凸部除去装置であって、前記半導体ウェハの一方側にて前記凸部および前記凹部全域に貼付された接着シートを介して当該半導体ウェハを保持する保持手段を含み、前記保持手段は、前記凸部を支持する凸部支持手段と、前記凹部底面を保持する凹部支持手段と、前記凸部支持手段と凹部支持手段とを前記半導体ウェハの面に直交する方向に相対移動させて当該半導体ウェハから前記凸部を分離する移動手段とを備える、という構成を採用している。   In order to achieve the above object, a semiconductor wafer convex portion removing apparatus according to the present invention has an annular convex portion protruding to one side in a thickness direction at an outer edge portion and a semiconductor having a concave portion inside surrounded by the convex portion. A device for removing a convex portion of a semiconductor wafer that removes the convex portion from a wafer, wherein the semiconductor wafer is held on one side of the semiconductor wafer via an adhesive sheet affixed to the entire region of the convex portion and the concave portion. The holding means includes a convex portion supporting means for supporting the convex portion, a concave portion supporting means for holding the concave bottom surface, and the convex portion supporting means and the concave portion supporting means orthogonal to the surface of the semiconductor wafer. And a moving means for separating the convex portion from the semiconductor wafer by relative movement in the direction to be adopted.

この際、本発明の半導体ウェハの凸部除去装置は、前記凸部支持手段との間に前記凹部の底面領域を挟み込み、前記移動手段と同期駆動可能な押え手段を備えることが好ましい。
また、本発明の半導体ウェハの凸部除去装置では、前記分離した凸部を回収する回収手段を備えることが好ましい。
さらに、本発明の半導体ウェハの凸部除去装置では、前記接着シートは、エネルギー線硬化型の接着シートであって、前記凸部表面に貼付された接着シートに対向して当該接着シートにエネルギー線を照射するエネルギー線照射手段を備えることが好ましい。
At this time, it is preferable that the convex removing device for a semiconductor wafer of the present invention includes a pressing unit that sandwiches a bottom region of the concave between the convex supporting unit and can be driven synchronously with the moving unit.
In the semiconductor wafer convex portion removing apparatus of the present invention, it is preferable that a recovery means for recovering the separated convex portions is provided.
Furthermore, in the convex part removal apparatus for a semiconductor wafer according to the present invention, the adhesive sheet is an energy ray curable adhesive sheet, and is opposed to the adhesive sheet affixed to the convex part surface, and energy rays are applied to the adhesive sheet. It is preferable to include an energy beam irradiation means for irradiating

また、本発明の半導体ウェハの凸部除去方法は、厚さ方向の一方に突出した環状の凸部を外縁部に有するとともに当該凸部で囲まれた内側に凹部を有する半導体ウェハから前記凸部を除去する半導体ウェハの凸部除去方法であって、前記半導体ウェハの一方側にて前記凸部および前記凹部全域に貼付された接着シートを介して当該凸部を凸部支持手段で保持するとともに、前記接着シートを介して前記凹部底面を凹部支持手段で保持し、前記部支持手段と凹部支持手段とを前記半導体ウェハの面に直交する方向に相対移動させて当該半導体ウェハから前記凸部を分離することを特徴とする。   Further, the method for removing a convex portion of a semiconductor wafer according to the present invention includes an annular convex portion protruding in one of the thickness directions at an outer edge portion and the convex portion from a semiconductor wafer having a concave portion inside surrounded by the convex portion. A method for removing a convex portion of a semiconductor wafer, wherein the convex portion is held by a convex portion supporting means via an adhesive sheet affixed to the entire region of the convex portion and the concave portion on one side of the semiconductor wafer. The concave bottom surface is held by the concave portion supporting means via the adhesive sheet, and the convex portion is moved from the semiconductor wafer by relatively moving the portion supporting means and the concave portion supporting means in a direction perpendicular to the surface of the semiconductor wafer. It is characterized by separating.

以上のような本発明によれば、エキスパンド工程等に先立って凸部を取り除くことができるので、当該エキスパンド工程等で接着シートを引き伸ばした際に、凸部が邪魔になるようなことがなくなり、チップを適正な間隔でエキスパンドすることができる。しかも、半導体ウェハを保持する保持手段を構成する凸部支持手段と凹部支持手段とが、半導体ウェハの面に直交する方向に相対移動するだけで凸部と凹部とを分離することができるので、装置の簡略化と小型化が行える。
さらに、凸部支持手段との間に凹部の底面領域を挟み込んで移動手段と同期駆動可能な押え手段を採用すれば、確実に凹部底面を凸部に対して相対移動させることが可能となる。
また、接着シートがエネルギー線硬化型のシートの場合に、エネルギー線照射手段によって凸部表面に貼付された接着シートにエネルギー線を照射することで、凸部表面の接着シートを硬化させて凸部が剥離しやすくでき、容易かつ確実に凸部を除去することができる。
According to the present invention as described above, since the convex portion can be removed prior to the expanding step or the like, when the adhesive sheet is stretched in the expanding step or the like, the convex portion is not disturbed, Chips can be expanded at appropriate intervals. Moreover, since the convex portion supporting means and the concave portion supporting means constituting the holding means for holding the semiconductor wafer can be separated from the convex portion and the concave portion only by relatively moving in the direction orthogonal to the surface of the semiconductor wafer, The device can be simplified and downsized.
Furthermore, if the pressing means that can be driven synchronously with the moving means by sandwiching the bottom surface area of the concave portion between the convex portion supporting means and the convex portion supporting means, the concave bottom surface can be reliably moved relative to the convex portion.
When the adhesive sheet is an energy ray curable sheet, the adhesive sheet on the surface of the convex portion is cured by irradiating the adhesive sheet affixed to the surface of the convex portion with the energy ray irradiating means, so that the convex portion is cured. Can be easily peeled off, and the convex portion can be easily and reliably removed.

本発明の一実施形態に係る半導体ウェハの凸部除去装置の部分断面図。The fragmentary sectional view of the convex part removal device of the semiconductor wafer concerning one embodiment of the present invention. 図1の凸部除去装置の動作説明図。Operation | movement explanatory drawing of the convex part removal apparatus of FIG. 図1の凸部除去装置の図2に続く動作説明図。Operation | movement explanatory drawing following FIG. 2 of the convex part removal apparatus of FIG.

以下、本発明の一実施形態を図面に基づいて説明する。
本実施形態に係る半導体ウェハの凸部除去装置1は、ウェハW外縁部に形成された凸部WAを除去する装置である。なお、対象となるウェハWは、例えば、前記特許文献2に記載されたように、外縁部以外の内周部が薄く研削されることで、厚さ方向(裏面側)に突出した環状の凸部WAが外縁部に形成され、凸部WAで囲まれた内側に凹部底面WBを有した凹部WCが形成されるとともに、その表面(研削面の反対側であり、図1の上側の面)WDに回路が形成されている。また、ウェハWは、ダイシングによって所定形状のチップに個片化されたものや、レーザによってストリートが脆弱に改質されたものや、ダイシングもレーザによる改質も行われていないものであってよい。そして、このウェハWの裏面には、凸部WAおよび凹部底面WB全域に接着シートであるマウント用テープTが貼付され、このマウント用テープTを介してリングフレームRFと一体化されている。このマウント用テープTは、紫外線等のエネルギー線によって硬化し、接着力が低下するエネルギー線硬化型の接着シートである。
Hereinafter, an embodiment of the present invention will be described with reference to the drawings.
The semiconductor wafer convex portion removing apparatus 1 according to the present embodiment is an apparatus that removes the convex portion WA formed on the outer edge portion of the wafer W. Note that the target wafer W is, for example, as described in Patent Document 2, an annular protrusion protruding in the thickness direction (back surface side) by thinly grinding the inner peripheral portion other than the outer edge portion. A portion WA is formed on the outer edge, and a concave portion WC having a concave bottom surface WB is formed on the inner side surrounded by the convex portion WA, and the surface thereof (the surface opposite to the grinding surface, the upper surface in FIG. 1) A circuit is formed in the WD. Further, the wafer W may be a piece that has been diced into chips of a predetermined shape by dicing, a one whose street has been weakly modified by a laser, or one that has not been modified by dicing or laser. . A mounting tape T, which is an adhesive sheet, is attached to the entire rear surface of the wafer W over the convex portion WA and the concave bottom surface WB, and is integrated with the ring frame RF via the mounting tape T. The mounting tape T is an energy ray curable adhesive sheet that is cured by energy rays such as ultraviolet rays and has a reduced adhesive force.

凸部除去装置1は、マウント用テープTを介してウェハWを保持する保持手段2と、ウェハWを保持手段2側へ押さえ付ける押え手段7と、ウェハWから分離された凸部WAを回収する回収手段8とを備えて構成されている。   The convex removing device 1 collects the holding means 2 for holding the wafer W via the mounting tape T, the pressing means 7 for pressing the wafer W toward the holding means 2, and the convex WA separated from the wafer W. And collecting means 8 to be configured.

保持手段2は、凸部WAの下方に対向してマウント用テープTを介して凸部WAを保持する凸部支持手段3と、ウェハWの凹部底面WBの下方に対向してマウント用テープTを介して凹部底面WBを保持する凹部支持手段4と、凸部支持手段3と凹部支持手段4とをウェハWの面に直交する方向に相対移動させてウェハWから凸部WAを分離する移動手段5とを有して形成されている。   The holding means 2 includes a convex support means 3 that faces the lower portion of the convex portion WA and holds the convex portion WA via the mount tape T, and a mounting tape T that faces the lower portion of the concave bottom surface WB of the wafer W. The concave portion supporting means 4 that holds the concave portion bottom surface WB, and the convex portion supporting means 3 and the concave portion supporting means 4 are moved relative to each other in a direction perpendicular to the surface of the wafer W to separate the convex portion WA from the wafer W. And means 5.

凸部支持手段3は、上方に開口した円筒状の側面部21Aおよび底面部21Bからなる中央凹部21と、中央凹部21の外周に沿って上方に開口した凹溝部41と、凸部WAよりも外側に位置してリングフレームRFまで延びるマウント用テープTを保持する外側支持部61とを有する支持手段本体22により構成されている。凹溝部41の開口には、支持手段本体22の上面とフラットとなる状態で凸部WAの下方に対向するとともに、エネルギー線を透過可能なガラス板等からなる透過部材42が設けられている。そして、凹溝部41内部には、エネルギー線照射手段としての紫外線ランプ6が内蔵されており、この紫外線ランプ6が発光した紫外線が透過部材42を透過することで、凸部WAに貼付されたマウント用テープTを硬化させてその接着力を低下させるように構成されている。外側支持部61は、支持手段本体22の上面によって構成され、この上面には、マウント用テープTを介してリングフレームRFを吸着保持する複数の吸引口51が形成され、これら複数の吸引口51は、支持手段本体22内部に形成されたチャンバー52を介して図示しない吸引装置に接続されている。なお、支持手段本体22の内部には、中央凹部21の外周に沿って加熱手段としてのヒータHが設けられている。   The convex portion support means 3 includes a central concave portion 21 formed of a cylindrical side surface portion 21A and a bottom surface portion 21B opened upward, a concave groove portion 41 opened upward along the outer periphery of the central concave portion 21, and a convex portion WA. The support means main body 22 includes an outer support portion 61 that holds the mounting tape T that is located outside and extends to the ring frame RF. The opening of the concave groove 41 is provided with a transmission member 42 made of a glass plate or the like that faces the lower portion of the convex portion WA in a state of being flat with the upper surface of the support means main body 22 and that can transmit energy rays. And the ultraviolet lamp 6 as an energy ray irradiation means is incorporated in the inside of the concave groove part 41, and the ultraviolet light emitted from the ultraviolet lamp 6 is transmitted through the transmission member 42, so that the mount attached to the convex part WA. The adhesive tape T is cured to reduce its adhesive strength. The outer support portion 61 is constituted by the upper surface of the support means main body 22, and a plurality of suction ports 51 for sucking and holding the ring frame RF via the mounting tape T are formed on the upper surface, and the plurality of suction ports 51. Is connected to a suction device (not shown) through a chamber 52 formed in the support means body 22. A heater H as a heating means is provided along the outer periphery of the central recess 21 inside the support means main body 22.

凹部支持手段4は、凹部底面WBの全域と略同一平面形状に形成されるとともに、中央凹部21に上下スライド案内される内側支持手段23を備え、内側支持手段23は、移動手段5を介して底面部21Bに支持され、移動手段5の動作によって図中上下方向に進退駆動されるようになっている。内側支持手段23の上面には、マウント用テープTを介して凹部底面WBを吸着保持する複数の吸引口31が形成され、これら複数の吸引口31は、内側支持手段23内部に形成されたチャンバー32を介して図示しない吸引装置に接続されている。   The recess support means 4 is formed in substantially the same plane shape as the entire area of the recess bottom surface WB, and includes an inner support means 23 that is slid vertically guided by the central recess 21, and the inner support means 23 is provided via the moving means 5. It is supported by the bottom surface portion 21 </ b> B and is driven to advance and retract in the vertical direction in the drawing by the operation of the moving means 5. On the upper surface of the inner support means 23, a plurality of suction ports 31 for sucking and holding the recess bottom surface WB via the mounting tape T are formed. These suction ports 31 are chambers formed inside the inner support means 23. A suction device (not shown) is connected via 32.

移動手段5は、直動モータ34を備え、そのモータ本体34Aが底面部21Bに固定されるとともに、出力軸34Bが内側支持手段23の図1中下面に連結されている。これにより、支持手段本体22と内側支持手段23とをウェハWの凹部底面WBに直交する方向に相対移動させてウェハWから凸部WAを分離可能となっている。   The moving means 5 includes a linear motor 34, the motor main body 34 </ b> A is fixed to the bottom surface portion 21 </ b> B, and the output shaft 34 </ b> B is coupled to the lower surface of the inner support means 23 in FIG. 1. Thus, the convex portion WA can be separated from the wafer W by relatively moving the support means main body 22 and the inner support means 23 in a direction perpendicular to the concave bottom surface WB of the wafer W.

押え手段7は、ウェハWの凹部底面WBの平面形状に合わせて円盤状に形成された支持体71と、この支持体71の図1中下面外周縁に沿って環状に形成されてウェハWの表面WDに当接可能な当接部材の72と、図示しないフレームに支持されて支持体71を図1中上下方向に昇降させる直動モータ73とを備えている。当接部材72は、特に限定されることはないが、ゴムや樹脂等の弾性部材によって構成され、凸部WAと凹部底面WBとの境界領域であって、凹部底面WBの反対側(表面WD)側に位置して内側支持手段23との間に凹部底面WB領域を挟み込み可能に設けられている。なお、当接部材72は、環状以外に凹部底面WBの平面形状に合わせて円盤状に形成してもよい。   The holding means 7 is formed in a disc shape in accordance with the planar shape of the concave bottom surface WB of the wafer W, and is formed in an annular shape along the outer peripheral edge of the lower surface of FIG. An abutting member 72 capable of abutting on the surface WD and a linear motion motor 73 supported by a frame (not shown) and moving the support 71 up and down in FIG. 1 are provided. Although the contact member 72 is not particularly limited, the contact member 72 is made of an elastic member such as rubber or resin, and is a boundary region between the convex portion WA and the concave bottom surface WB, and is opposite to the concave bottom surface WB (surface WD). ) And the inner support means 23 so as to sandwich the concave bottom surface WB region. In addition, the contact member 72 may be formed in a disk shape in accordance with the planar shape of the bottom surface WB of the recess in addition to the ring shape.

回収手段8は、図1中下面側に接着剤層を有した除去用テープPTを凸部WAに貼付した後、この除去用テープPTを巻き取ることで凸部WAを除去するものであって、保持手段2の上方に図示しないフレームを介して支持されている。この回収手段8は、除去用テープPTをロール状に巻回した状態で支持するとともに、モータ81Aによって回転駆動可能な支持ローラ81と、保持手段2の上方の所定高さに除去用テープPTを案内する2つのガイドローラ82A,82Bと、図示しない駆動手段を介して保持手段2の上面に沿って図1中左右方向に転動可能な押圧ローラ83と、モータ84Aによって回転駆動されるとともに、押圧ローラ83から除去用テープPTを巻き取って回収する回収ローラ84とを有して構成されている。そして、回収手段8は、転動ローラ83が図1中右方向に転動するときに、除去用テープPTを凸部WAに押圧して貼付し、押圧ローラ83図1中左方向に転動するときに、除去用テープPTとともに当該除去用テープPTに接着した凸部WAをマウント用テープTから剥離し、回収するようになっている。   The recovery means 8 removes the convex portion WA by winding the removal tape PT after the removal tape PT having an adhesive layer on the lower surface side in FIG. It is supported above the holding means 2 via a frame (not shown). The collection means 8 supports the removal tape PT in a rolled state, and supports the removal tape PT at a predetermined height above the holding roller 81 and the holding means 2 that can be rotated by a motor 81A. Two guide rollers 82A and 82B for guiding, a pressing roller 83 that can roll in the left-right direction in FIG. 1 along the upper surface of the holding means 2 via a driving means (not shown), and a motor 84A are driven to rotate. And a recovery roller 84 that winds and recovers the removal tape PT from the pressing roller 83. Then, when the rolling roller 83 rolls in the right direction in FIG. 1, the collecting means 8 presses and applies the removal tape PT to the convex portion WA and rolls in the left direction in the pressing roller 83 in FIG. 1. At this time, the convex portion WA adhered to the removal tape PT together with the removal tape PT is peeled off from the mounting tape T and collected.

以上の凸部除去装置1において、ウェハWの凸部WAを除去する手順としては、先ず、マウント用テープTを介してリングフレームRFと一体化されたウェハWを図示しない搬送手段によって搬送し、凹部支持手段4上に凹部WCを位置させるとともに、透過部材42上に凸部WAを位置させ、かつ外側支持部61上にリングフレームRFを位置させた状態で保持手段2上に載置する。次に、保持手段2は、図示しない吸引装置を駆動して複数の吸引口31,51から空気を吸引し、マウント用テープTを介して凹部支持手段4で凹部底面WBを吸着保持するとともに、外側支持部61で凸部WAよりも外側のマウント用テープTおよびリングフレームRFを吸着保持する。そして、紫外線ランプ6からの紫外線を凸部WA部分のマウント用テープTに照射して硬化させる。   In the above-described convex portion removing apparatus 1, as a procedure for removing the convex portion WA of the wafer W, first, the wafer W integrated with the ring frame RF is conveyed by a conveying means (not shown) via the mounting tape T, The concave portion WC is positioned on the concave portion support means 4, the convex portion WA is positioned on the transmission member 42, and the ring frame RF is positioned on the outer side support portion 61. Next, the holding means 2 drives a suction device (not shown) to suck air from the plurality of suction ports 31, 51, and sucks and holds the recess bottom surface WB by the recess support means 4 via the mounting tape T. The outer support portion 61 sucks and holds the mounting tape T and the ring frame RF outside the convex portion WA. Then, the mounting tape T in the convex portion WA is irradiated with ultraviolet rays from the ultraviolet lamp 6 to be cured.

次に、図2に示すように、直動モータ73が駆動して当接部材72をウェハWの表面WDに当接させる。その後、複数の吸引口31,51で凹部底面WBおよびリングフレームRFを吸着保持したままで、直動モータ34と直動モータ73とを同期駆動して内側支持手段23を支持手段本体22に対して下降させる。すなわち、凹部支持手段4と凸部支持手段3とを上下に相対移動させることで、ウェハWから凸部WAが分離する。ウェハWから凸部WAを分離したら、図3に示すように、直動モータ73が駆動して当接部材72をウェハWの表面WDから離間させる。次いで、図3中二点鎖線で示すように、モータ84Aを駆動して回収ローラ84から除去用テープPTを繰り出しつつ、転動ローラ83を図中右方向に転動させて、当該除去用テープPTを凸部WAに押圧して貼付する。凸部WAの上面全体に除去用テープPTを貼付したら、モータ84Aを駆動して回収ローラ84で除去用テープPTを巻き取りつつ、押圧ローラ83を図中左方向に転動させて、凸部WAをマウント用テープTから剥離し、回収ローラ84に巻き取って回収する。凸部WAがマウント用テープTから剥離されると、ヒータHで加熱することによって、凸部WAが除去されたことによって段差のついたマウント用テープTをフラットにする。なお、凸部WAの回収が完了すると、モータ81Aと84Aとが共動して、次の凸部WAの回収に使用する未使用の除去用テープPTを支持ローラ81側から回収ローラ84側へ繰り出しておく動作が行われる。   Next, as shown in FIG. 2, the linear motion motor 73 is driven to bring the contact member 72 into contact with the surface WD of the wafer W. Thereafter, the linear motion motor 34 and the linear motion motor 73 are driven synchronously while the concave bottom surface WB and the ring frame RF are attracted and held by the plurality of suction ports 31, 51, and the inner support means 23 is moved relative to the support means main body 22. To lower. That is, the convex portion WA is separated from the wafer W by relatively moving the concave portion supporting means 4 and the convex portion supporting means 3 up and down. When the convex portion WA is separated from the wafer W, the linear motion motor 73 is driven to separate the contact member 72 from the surface WD of the wafer W as shown in FIG. Next, as shown by a two-dot chain line in FIG. 3, while the motor 84A is driven to feed out the removal tape PT from the collection roller 84, the rolling roller 83 rolls in the right direction in the figure to remove the removal tape. PT is pressed and stuck on the convex part WA. After the removal tape PT is pasted on the entire upper surface of the convex portion WA, the motor 84A is driven to wind the removal tape PT with the collection roller 84, and the pressing roller 83 is rolled in the left direction in the drawing, thereby producing the convex portion. The WA is peeled off from the mounting tape T, wound around the collection roller 84, and collected. When the convex portion WA is peeled off from the mounting tape T, the mounting tape T having a step is flattened by removing the convex portion WA by heating with the heater H. When the recovery of the convex portion WA is completed, the motors 81A and 84A co-operate, and the unused removal tape PT used for recovery of the next convex portion WA is moved from the support roller 81 side to the recovery roller 84 side. The operation of feeding out is performed.

一方、マウント用テープTおよびリングフレームRFとともに凹部支持手段4に残されたウェハW’は、リングフレームRFとともに図示しない搬送手段によってボンディング装置等に搬送されることとなる。   On the other hand, the wafer W ′ left in the recess supporting means 4 together with the mounting tape T and the ring frame RF is transferred to the bonding apparatus or the like by the transfer means (not shown) together with the ring frame RF.

以上のような本実施形態によれば、次のような効果がある。
すなわち、エキスパンド工程の前の段階で凸部WAを除去することができるので、このエキスパンド工程において凸部WAが邪魔になることがなく、各チップを適正な間隔でエキスパンドすることができ、所定位置にエキスパンドされたチップを確実にピックアップして効率よくボンディングを実施することができる。
According to this embodiment as described above, the following effects are obtained.
That is, since the convex portion WA can be removed at the stage before the expanding step, the convex portion WA does not get in the way in the expanding step, and each chip can be expanded at an appropriate interval, and the predetermined position It is possible to reliably pick up the expanded chip and perform bonding efficiently.

以上のように、本発明を実施するための最良の構成、方法等は、前記記載で開示されているが、本発明は、これに限定されるものではない。すなわち、本発明は、主に特定の実施形態に関して特に図示され、かつ説明されているが、本発明の技術的思想および目的の範囲から逸脱することなく、以上述べた実施形態に対し、形状、材質、数量、その他の詳細な構成において、当業者が様々な変形を加えることができるものである。また、上記に開示した形状、材質などを限定した記載は、本発明の理解を容易にするために例示的に記載したものであり、本発明を限定するものではないから、それらの形状、材質などの限定の一部もしくは全部の限定を外した部材の名称での記載は、本発明に含まれるものである。   As described above, the best configuration, method and the like for carrying out the present invention have been disclosed in the above description, but the present invention is not limited to this. That is, the invention has been illustrated and described with particular reference to certain specific embodiments, but without departing from the spirit and scope of the invention, Various modifications can be made by those skilled in the art in terms of material, quantity, and other detailed configurations. In addition, the description of the shape, material, and the like disclosed above is exemplary for ease of understanding of the present invention, and does not limit the present invention. The description by the name of the member which remove | excluded the limitation of one part or all of such restrictions is included in this invention.

例えば、前記実施形態では、凸部支持手段3に対して凹部支持手段4を下降させることで、これらを相対移動させてウェハWから凸部WAを分離するように構成したが、凹部支持手段4に対して凸部支持手段3を上昇させるようにしてもよい。さらに、凹部支持手段4を下降させるとともに凸部支持手段3を上昇させてもよい。すなわち、本発明では、凸部支持手段3と凹部支持手段4とをウェハWの面に直交する方向(実施形態では上下方向)に相対移動させるように移動手段が構成されていればよく、その条件を満足する範囲において、移動対象や移動方向は特に限定されず、移動手段として任意の構成が採用可能である。   For example, in the above-described embodiment, the concave portion supporting means 4 is moved downward to separate the convex portion WA from the wafer W by lowering the concave portion supporting means 4 relative to the convex portion supporting means 3. Alternatively, the convex support means 3 may be raised. Further, the concave portion supporting means 4 may be lowered and the convex portion supporting means 3 may be raised. That is, in the present invention, it is sufficient that the moving means is configured to relatively move the convex portion supporting means 3 and the concave portion supporting means 4 in the direction perpendicular to the surface of the wafer W (the vertical direction in the embodiment). As long as the conditions are satisfied, the moving object and the moving direction are not particularly limited, and any configuration can be adopted as the moving means.

また、前記実施形態におけるエネルギー線照射手段としての紫外線ランプ6や押さえ手段7、回収手段8は、本発明の必須要件ではなく、省略することができる。また、回収手段8としては、前記実施形態のように除去用テープPTを用いて凸部WAを除去するものに限らず、吸着パッド等を用いて凸部WAを吸着保持して除去するものでもよいし、その他適宜な除去方法で除去して回収するものが利用可能である。また、エネルギー線照射手段を保持手段2に設けずに、別体として設けておき、ウェハWを保持手段2に載置する以前に凸部WAに対応したマウント用テープTにエネルギー線を照射するように構成してもよい。
さらに、前記実施形態では、保持手段2において、外側支持部61でマウント用テープTおよびリングフレームRFを吸着保持し、凸部支持手段3では吸着保持せずに下方から凸部WAを支持するのみとしたが、これに限らず、凸部支持手段3においても吸着保持するようにしてもよい。
また、ウェハWは、シリコンウエハや化合物ウェハであってもよい。
また、エネルギー線照射手段は、紫外線を照射するものに限らず、電子線など適宜なエネルギー線を照射して接着シートを硬化させるものであればよい。
Moreover, the ultraviolet lamp 6, the pressing means 7, and the recovery means 8 as the energy beam irradiation means in the embodiment are not essential requirements of the present invention and can be omitted. Further, the collecting means 8 is not limited to removing the convex portion WA using the removal tape PT as in the above-described embodiment, but may also be one that removes the convex portion WA by suction holding using a suction pad or the like. It is also possible to use one that is removed and recovered by other appropriate removal methods. In addition, the energy beam irradiation means is not provided in the holding means 2 but is provided as a separate body, and the mounting tape T corresponding to the convex portion WA is irradiated with the energy rays before the wafer W is placed on the holding means 2. You may comprise as follows.
Further, in the above-described embodiment, the holding means 2 sucks and holds the mounting tape T and the ring frame RF with the outer support portion 61, and the convex portion support means 3 only supports the convex portion WA from below without being sucked and held. However, the present invention is not limited to this, and the convex portion support means 3 may be held by suction.
The wafer W may be a silicon wafer or a compound wafer.
Further, the energy beam irradiation means is not limited to the device that irradiates ultraviolet rays, and any device that irradiates an appropriate energy beam such as an electron beam to cure the adhesive sheet may be used.

1 凸部除去装置
2 保持手段
3 凸部支持手段
4 凹部支持手段
5 移動手段
6 紫外線ランプ(エネルギー線照射手段)
8 回収手段
T マウント用テープ(接着シート)
RF リングフレーム
W,W’ ウェハ(半導体ウェハ)
WA 凸部
WB 凹部底面
WC 凹部
DESCRIPTION OF SYMBOLS 1 Convex part removal apparatus 2 Holding means 3 Convex part support means 4 Concave part support means 5 Moving means 6 Ultraviolet lamp (energy ray irradiation means)
8 Collecting means T Mounting tape (adhesive sheet)
RF ring frame W, W 'wafer (semiconductor wafer)
WA Convex WB Concave bottom WC Concave

Claims (5)

厚さ方向の一方に突出した環状の凸部を外縁部に有するとともに当該凸部で囲まれた内側に凹部を有する半導体ウェハから前記凸部を除去する半導体ウェハの凸部除去装置であって、
前記半導体ウェハの一方側にて前記凸部および前記凹部全域に貼付された接着シートを介して当該半導体ウェハを保持する保持手段を含み、
前記保持手段は、前記凸部を支持する凸部支持手段と、前記凹部底面を保持する凹部支持手段と、前記凸部支持手段と凹部支持手段とを前記半導体ウェハの面に直交する方向に相対移動させて当該半導体ウェハから前記凸部を分離する移動手段とを備えることを特徴とする半導体ウェハの凸部除去装置。
An apparatus for removing a convex portion of a semiconductor wafer having an annular convex portion protruding in one of the thickness directions at an outer edge portion and removing the convex portion from a semiconductor wafer having a concave portion on the inner side surrounded by the convex portion,
Including holding means for holding the semiconductor wafer via an adhesive sheet affixed to the entire convex portion and the concave portion on one side of the semiconductor wafer;
The holding means has a convex portion supporting means for supporting the convex portion, a concave portion supporting means for holding the concave bottom surface, and the convex portion supporting means and the concave portion supporting means in a direction perpendicular to the surface of the semiconductor wafer. A projection removing device for a semiconductor wafer, comprising: moving means for separating the projection from the semiconductor wafer.
前記凸部支持手段との間に前記凹部の底面領域を挟み込み、前記移動手段と同期駆動可能な押え手段を備えることを特徴とする請求項1に記載の半導体ウェハの凸部除去装置。   The apparatus for removing a convex portion of a semiconductor wafer according to claim 1, further comprising a pressing means that sandwiches a bottom area of the concave portion between the convex portion supporting means and can be driven synchronously with the moving means. 前記分離した凸部を回収する回収手段を備えることを特徴とする請求項1または請求項2に記載の半導体ウェハの凸部除去装置。   The apparatus for removing a convex portion of a semiconductor wafer according to claim 1, further comprising a collecting means for collecting the separated convex portion. 前記接着シートは、エネルギー線硬化型の接着シートであって、
前記凸部表面に貼付された接着シートに対向して当該接着シートにエネルギー線を照射するエネルギー線照射手段を備えることを特徴とする請求項1から請求項3のいずれかに記載の半導体ウェハの凸部除去装置。
The adhesive sheet is an energy ray curable adhesive sheet,
The semiconductor wafer according to any one of claims 1 to 3, further comprising energy beam irradiation means for irradiating the adhesive sheet with energy rays facing the adhesive sheet attached to the surface of the convex portion. Convex removal device.
厚さ方向の一方に突出した環状の凸部を外縁部に有するとともに当該凸部で囲まれた内側に凹部を有する半導体ウェハから前記凸部を除去する半導体ウェハの凸部除去方法であって、
前記半導体ウェハの一方側にて前記凸部および前記凹部全域に貼付された接着シートを介して当該凸部を凸部支持手段で保持するとともに、前記接着シートを介して前記凹部底面を凹部支持手段で保持し、
前記凸部支持手段と凹部支持手段とを前記半導体ウェハの面に直交する方向に相対移動させて当該半導体ウェハから前記凸部を分離することを特徴とする半導体ウェハの凸部除去方法。
A method for removing a convex portion of a semiconductor wafer having an annular convex portion protruding in one of the thickness directions at an outer edge portion and removing the convex portion from a semiconductor wafer having a concave portion inside surrounded by the convex portion,
The convex portion is held by the convex portion support means via the adhesive sheet affixed to the entire area of the convex portion and the concave portion on one side of the semiconductor wafer, and the concave portion bottom surface is supported by the concave portion via the adhesive sheet. Hold on,
A method for removing a convex portion of a semiconductor wafer, wherein the convex portion supporting means and the concave portion supporting means are relatively moved in a direction orthogonal to the surface of the semiconductor wafer to separate the convex portion from the semiconductor wafer.
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JP2012156344A (en) * 2011-01-27 2012-08-16 Disco Abrasive Syst Ltd Device and method for removing annular convex portion
JP2014027007A (en) * 2012-07-24 2014-02-06 Disco Abrasive Syst Ltd Method of processing wafer and annular convex part removal device

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JPH0474605A (en) * 1990-07-17 1992-03-10 Mitsubishi Kasei Polytec Co Punching method
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* Cited by examiner, † Cited by third party
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JP2012156344A (en) * 2011-01-27 2012-08-16 Disco Abrasive Syst Ltd Device and method for removing annular convex portion
JP2014027007A (en) * 2012-07-24 2014-02-06 Disco Abrasive Syst Ltd Method of processing wafer and annular convex part removal device

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