JP2011089989A - 元素組成検出システム及び方法 - Google Patents

元素組成検出システム及び方法 Download PDF

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Publication number
JP2011089989A
JP2011089989A JP2010236056A JP2010236056A JP2011089989A JP 2011089989 A JP2011089989 A JP 2011089989A JP 2010236056 A JP2010236056 A JP 2010236056A JP 2010236056 A JP2010236056 A JP 2010236056A JP 2011089989 A JP2011089989 A JP 2011089989A
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Japan
Prior art keywords
fuel
photon
sample
gas turbine
crystal
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Withdrawn
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JP2010236056A
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Japanese (ja)
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JP2011089989A5 (cg-RX-API-DMAC7.html
Inventor
Vamshi Krishna Reddy Kommareddy
ヴァムシ・クリシュナ・レディ・コンマレディ
Paul Joseph Martin
ポール・ジョセフ・マーティン
Saratchandra Shanmukh
サラッチャンドラ・シャンムク
Paul Burchell Glaser
ポール・バーチェル・グレイサー
Susanne Madeline Lee
スザンヌ・マデリン・リー
Ramakrishna Rao
ラマクリシュナ・ラオ
Manoharan Venugopal
マノハラン・ヴェヌゴパル
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General Electric Co
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General Electric Co
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Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2011089989A publication Critical patent/JP2011089989A/ja
Publication of JP2011089989A5 publication Critical patent/JP2011089989A5/ja
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/22—Fuels; Explosives
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/637—Specific applications or type of materials liquid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/12—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluid; of a solid body in dependence upon reaction with a fluid, for detecting components in the fluid
    • G01N27/125—Composition of the body, e.g. the composition of its sensitive layer
    • G01N27/127—Composition of the body, e.g. the composition of its sensitive layer comprising nanoparticles

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2010236056A 2009-10-26 2010-10-21 元素組成検出システム及び方法 Withdrawn JP2011089989A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/605,391 US8058621B2 (en) 2009-10-26 2009-10-26 Elemental composition detection system and method

Publications (2)

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JP2011089989A true JP2011089989A (ja) 2011-05-06
JP2011089989A5 JP2011089989A5 (cg-RX-API-DMAC7.html) 2013-11-28

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JP2010236056A Withdrawn JP2011089989A (ja) 2009-10-26 2010-10-21 元素組成検出システム及び方法

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US (1) US8058621B2 (cg-RX-API-DMAC7.html)
JP (1) JP2011089989A (cg-RX-API-DMAC7.html)
CN (2) CN102053095A (cg-RX-API-DMAC7.html)
CH (1) CH702055A2 (cg-RX-API-DMAC7.html)
DE (1) DE102010038133A1 (cg-RX-API-DMAC7.html)

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JP2013113782A (ja) * 2011-11-30 2013-06-10 Rigaku Corp 蛍光ｘ線分析装置
KR102026983B1 (ko) * 2018-03-29 2019-09-30 두산중공업 주식회사 가스터빈 내 파이프를 통과하는 유체의 오염물을 모니터링 하는 시스템 및 그 방법
WO2019230376A1 (ja) * 2018-05-31 2019-12-05 キヤノン株式会社 識別装置

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US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
US10519800B2 (en) 2015-12-08 2019-12-31 Pratt & Whitney Canada Corp. Method and system for diagnosing a condition of an engine using lubricating fluid analysis
US10151739B2 (en) 2016-04-25 2018-12-11 Pratt & Whitney Canada Corp. Method and system for evaluation of engine condition
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DE112019004433B4 (de) 2018-09-04 2024-09-12 Sigray, Inc. System und verfahren für röntgenstrahlfluoreszenz mit filterung
DE112019004478T5 (de) 2018-09-07 2021-07-08 Sigray, Inc. System und verfahren zur röntgenanalyse mit wählbarer tiefe
CN112639452A (zh) * 2018-09-07 2021-04-09 深圳帧观德芯科技有限公司 电镀控制系统和方法
US11143605B2 (en) 2019-09-03 2021-10-12 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
JP7395775B2 (ja) 2020-05-18 2023-12-11 シグレイ、インコーポレイテッド 結晶解析装置及び複数の検出器素子を使用するｘ線吸収分光法のためのシステム及び方法
CN111678600B (zh) * 2020-08-10 2020-10-30 中国工程物理研究院激光聚变研究中心 一种平响应的霍尔晶体
WO2022061347A1 (en) 2020-09-17 2022-03-24 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
WO2022117112A1 (zh) * 2020-12-04 2022-06-09 北京霍里思特科技有限公司 检测机构及带检测机构的矿产分选机
DE112021006348T5 (de) 2020-12-07 2023-09-21 Sigray, Inc. 3d-röntgenbildgebungssystem mit hohem durchsatz, das eine transmissionsröntgenquelle verwendet
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
US11874239B2 (en) * 2022-03-11 2024-01-16 Uchicago Argonne, Llc Advanced X-ray emission spectrometers
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
DE112023002079T5 (de) 2022-05-02 2025-02-27 Sigray, Inc. Sequenzielles wellenlängendispersives röntgenspektrometer
CN115326854B (zh) * 2022-09-16 2024-12-17 中国科学院上海高等研究院 一种用于同步辐射光束线光子能量标定的系统及方法
CN115825131B (zh) * 2022-10-11 2025-05-16 中国核电工程有限公司 一种用于微量放射性元素同时测量的x射线荧光分析系统
CN116106339A (zh) * 2022-12-30 2023-05-12 安徽创谱仪器科技有限公司 一种x射线吸收谱仪
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CN118169158B (zh) * 2024-02-07 2025-01-28 中国铁道科学研究院集团有限公司铁道建筑研究所 铁路路基填料含硫量检测装置及方法
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Publication number Priority date Publication date Assignee Title
JP2013113782A (ja) * 2011-11-30 2013-06-10 Rigaku Corp 蛍光ｘ線分析装置
KR102026983B1 (ko) * 2018-03-29 2019-09-30 두산중공업 주식회사 가스터빈 내 파이프를 통과하는 유체의 오염물을 모니터링 하는 시스템 및 그 방법
WO2019230376A1 (ja) * 2018-05-31 2019-12-05 キヤノン株式会社 識別装置
JP2019211252A (ja) * 2018-05-31 2019-12-12 キヤノン株式会社 識別装置

Also Published As

Publication number Publication date
CN102053095A (zh) 2011-05-11
DE102010038133A1 (de) 2011-04-28
US20110095190A1 (en) 2011-04-28
CN105203573A (zh) 2015-12-30
US8058621B2 (en) 2011-11-15
CH702055A2 (de) 2011-04-29

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