JP2011085593A5 - - Google Patents

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Publication number
JP2011085593A5
JP2011085593A5 JP2010267899A JP2010267899A JP2011085593A5 JP 2011085593 A5 JP2011085593 A5 JP 2011085593A5 JP 2010267899 A JP2010267899 A JP 2010267899A JP 2010267899 A JP2010267899 A JP 2010267899A JP 2011085593 A5 JP2011085593 A5 JP 2011085593A5
Authority
JP
Japan
Prior art keywords
inspection system
transport mechanism
penetrating radiation
enclosed
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2010267899A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011085593A (ja
Filing date
Publication date
Priority claimed from US10/330,000 external-priority patent/US20040256565A1/en
Priority claimed from US10/442,687 external-priority patent/US7099434B2/en
Application filed filed Critical
Publication of JP2011085593A publication Critical patent/JP2011085593A/ja
Publication of JP2011085593A5 publication Critical patent/JP2011085593A5/ja
Pending legal-status Critical Current

Links

JP2010267899A 2002-11-06 2010-11-30 Ｘ線後方散乱モバイル検査バン Pending JP2011085593A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US42435702P 2002-11-06 2002-11-06
US10/330,000 US20040256565A1 (en) 2002-11-06 2002-12-26 X-ray backscatter mobile inspection van
US10/442,687 US7099434B2 (en) 2002-11-06 2003-05-21 X-ray backscatter mobile inspection van

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2010177064A Division JP2011017709A (ja) 2002-11-06 2010-08-06 Ｘ線後方散乱モバイル検査バン

Publications (2)

Publication Number Publication Date
JP2011085593A JP2011085593A (ja) 2011-04-28
JP2011085593A5 true JP2011085593A5 (https=) 2012-01-26

Family

ID=46123517

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2010177064A Pending JP2011017709A (ja) 2002-11-06 2010-08-06 Ｘ線後方散乱モバイル検査バン
JP2010267899A Pending JP2011085593A (ja) 2002-11-06 2010-11-30 Ｘ線後方散乱モバイル検査バン

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2010177064A Pending JP2011017709A (ja) 2002-11-06 2010-08-06 Ｘ線後方散乱モバイル検査バン

Country Status (10)

Country Link
EP (1) EP2275839A3 (https=)
JP (2) JP2011017709A (https=)
KR (1) KR101171598B1 (https=)
AT (1) ATE541226T1 (https=)
CY (1) CY1112675T1 (https=)
DK (1) DK1558947T3 (https=)
ES (1) ES2379653T3 (https=)
IL (1) IL168371A (https=)
PT (1) PT1558947E (https=)
SI (1) SI1558947T1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9151721B2 (en) 2011-06-20 2015-10-06 The Boeing Company Integrated backscatter X-ray system
US8761338B2 (en) 2011-06-20 2014-06-24 The Boeing Company Integrated backscatter X-ray system
US8855268B1 (en) 2011-11-01 2014-10-07 The Boeing Company System for inspecting objects underwater
EP2812736A2 (de) * 2012-02-10 2014-12-17 Smiths Heimann GmbH Verfahren und vorrichtung zur überprüfung des laderaums eines lastkraftwagens
CN104950338B (zh) * 2014-03-24 2020-11-24 北京君和信达科技有限公司 对移动目标进行辐射检查的系统和方法
CN109557575A (zh) * 2018-12-17 2019-04-02 中国原子能科学研究院 一种中子多重性测量装置及其使用方法
WO2024056161A1 (de) * 2022-09-14 2024-03-21 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Röntgensystem
KR102894440B1 (ko) * 2022-12-12 2025-12-03 대한민국 화학물질 운송탱크 안전진단 시스템

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01189551A (ja) * 1988-01-25 1989-07-28 Mitsubishi Atom Power Ind Inc 爆発物検査方法及び装置
US5022062A (en) * 1989-09-13 1991-06-04 American Science And Engineering, Inc. Automatic threat detection based on illumination by penetrating radiant energy using histogram processing
US5764683B1 (en) 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
JPH1186783A (ja) * 1997-09-10 1999-03-30 Nec Corp 電子エネルギ分析装置
JPH11271453A (ja) * 1998-03-25 1999-10-08 Toshiba Corp 放射線弁別測定方法および放射線弁別測定装置
US6094472A (en) * 1998-04-14 2000-07-25 Rapiscan Security Products, Inc. X-ray backscatter imaging system including moving body tracking assembly
US6421420B1 (en) 1998-12-01 2002-07-16 American Science & Engineering, Inc. Method and apparatus for generating sequential beams of penetrating radiation
US6249567B1 (en) * 1998-12-01 2001-06-19 American Science & Engineering, Inc. X-ray back scatter imaging system for undercarriage inspection
WO2000037928A2 (en) * 1998-12-22 2000-06-29 American Science And Engineering, Inc. Unilateral hand-held x-ray inspection apparatus
US20030165211A1 (en) 2002-03-01 2003-09-04 Lee Grodzins Detectors for x-rays and neutrons
WO2001073415A2 (en) * 2000-03-28 2001-10-04 American Science And Engineering, Inc. Detection of fissile material
US6671345B2 (en) * 2000-11-14 2003-12-30 Koninklijke Philips Electronics N.V. Data acquisition for computed tomography

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