JP2011017709A - Ｘ線後方散乱モバイル検査バン - Google Patents

Ｘ線後方散乱モバイル検査バン Download PDF

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Publication number
JP2011017709A
JP2011017709A JP2010177064A JP2010177064A JP2011017709A JP 2011017709 A JP2011017709 A JP 2011017709A JP 2010177064 A JP2010177064 A JP 2010177064A JP 2010177064 A JP2010177064 A JP 2010177064A JP 2011017709 A JP2011017709 A JP 2011017709A
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JP
Japan
Prior art keywords
inspection system
enclosure
transport mechanism
penetrating radiation
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2010177064A
Other languages
English (en)
Japanese (ja)
Inventor
William Adams
アダムス、ウィリアム
Alex Chalmers
チャーマズ、アレックス
Lee Grodzins
グロジンズ、リー
Louis W Perich
ぺリク、ルイス・ダブリュー
Peter Rothschild
ロスチャイルド、ピーター
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
American Science and Engineering Inc
Original Assignee
American Science and Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/330,000 external-priority patent/US20040256565A1/en
Priority claimed from US10/442,687 external-priority patent/US7099434B2/en
Application filed by American Science and Engineering Inc filed Critical American Science and Engineering Inc
Publication of JP2011017709A publication Critical patent/JP2011017709A/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T3/00—Measuring neutron radiation
    • G01T3/06—Measuring neutron radiation with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/232—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays having relative motion between the source, detector and object other than by conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/26—Passive interrogation, i.e. by measuring radiation emitted by objects or goods

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  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2010177064A 2002-11-06 2010-08-06 Ｘ線後方散乱モバイル検査バン Pending JP2011017709A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US42435702P 2002-11-06 2002-11-06
US10/330,000 US20040256565A1 (en) 2002-11-06 2002-12-26 X-ray backscatter mobile inspection van
US10/442,687 US7099434B2 (en) 2002-11-06 2003-05-21 X-ray backscatter mobile inspection van

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2005507094A Division JP2006505805A (ja) 2002-11-06 2003-11-03 Ｘ線後方散乱モバイル検査バン

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2010267899A Division JP2011085593A (ja) 2002-11-06 2010-11-30 Ｘ線後方散乱モバイル検査バン

Publications (1)

Publication Number Publication Date
JP2011017709A true JP2011017709A (ja) 2011-01-27

Family

ID=46123517

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2010177064A Pending JP2011017709A (ja) 2002-11-06 2010-08-06 Ｘ線後方散乱モバイル検査バン
JP2010267899A Pending JP2011085593A (ja) 2002-11-06 2010-11-30 Ｘ線後方散乱モバイル検査バン

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2010267899A Pending JP2011085593A (ja) 2002-11-06 2010-11-30 Ｘ線後方散乱モバイル検査バン

Country Status (10)

Country Link
EP (1) EP2275839A3 (https=)
JP (2) JP2011017709A (https=)
KR (1) KR101171598B1 (https=)
AT (1) ATE541226T1 (https=)
CY (1) CY1112675T1 (https=)
DK (1) DK1558947T3 (https=)
ES (1) ES2379653T3 (https=)
IL (1) IL168371A (https=)
PT (1) PT1558947E (https=)
SI (1) SI1558947T1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9151721B2 (en) 2011-06-20 2015-10-06 The Boeing Company Integrated backscatter X-ray system
US8761338B2 (en) 2011-06-20 2014-06-24 The Boeing Company Integrated backscatter X-ray system
US8855268B1 (en) 2011-11-01 2014-10-07 The Boeing Company System for inspecting objects underwater
EP2812736A2 (de) * 2012-02-10 2014-12-17 Smiths Heimann GmbH Verfahren und vorrichtung zur überprüfung des laderaums eines lastkraftwagens
CN104950338B (zh) * 2014-03-24 2020-11-24 北京君和信达科技有限公司 对移动目标进行辐射检查的系统和方法
CN109557575A (zh) * 2018-12-17 2019-04-02 中国原子能科学研究院 一种中子多重性测量装置及其使用方法
WO2024056161A1 (de) * 2022-09-14 2024-03-21 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Röntgensystem
KR102894440B1 (ko) * 2022-12-12 2025-12-03 대한민국 화학물질 운송탱크 안전진단 시스템

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01189551A (ja) * 1988-01-25 1989-07-28 Mitsubishi Atom Power Ind Inc 爆発物検査方法及び装置
US5764683A (en) * 1996-02-12 1998-06-09 American Science And Engineering, Inc. Mobile X-ray inspection system for large objects
JPH11271453A (ja) * 1998-03-25 1999-10-08 Toshiba Corp 放射線弁別測定方法および放射線弁別測定装置
WO2000033060A2 (en) * 1998-12-01 2000-06-08 American Science And Engineering, Inc. X-ray back scatter imaging system for undercarriage inspection
US6094472A (en) * 1998-04-14 2000-07-25 Rapiscan Security Products, Inc. X-ray backscatter imaging system including moving body tracking assembly
US6424695B1 (en) * 1998-12-22 2002-07-23 American Science And Engineering, Inc. Separate lateral processing of backscatter signals

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5022062A (en) * 1989-09-13 1991-06-04 American Science And Engineering, Inc. Automatic threat detection based on illumination by penetrating radiant energy using histogram processing
JPH1186783A (ja) * 1997-09-10 1999-03-30 Nec Corp 電子エネルギ分析装置
US6421420B1 (en) 1998-12-01 2002-07-16 American Science & Engineering, Inc. Method and apparatus for generating sequential beams of penetrating radiation
US20030165211A1 (en) 2002-03-01 2003-09-04 Lee Grodzins Detectors for x-rays and neutrons
WO2001073415A2 (en) * 2000-03-28 2001-10-04 American Science And Engineering, Inc. Detection of fissile material
US6671345B2 (en) * 2000-11-14 2003-12-30 Koninklijke Philips Electronics N.V. Data acquisition for computed tomography

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01189551A (ja) * 1988-01-25 1989-07-28 Mitsubishi Atom Power Ind Inc 爆発物検査方法及び装置
US5764683A (en) * 1996-02-12 1998-06-09 American Science And Engineering, Inc. Mobile X-ray inspection system for large objects
US5764683B1 (en) * 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
JPH11271453A (ja) * 1998-03-25 1999-10-08 Toshiba Corp 放射線弁別測定方法および放射線弁別測定装置
US6094472A (en) * 1998-04-14 2000-07-25 Rapiscan Security Products, Inc. X-ray backscatter imaging system including moving body tracking assembly
WO2000033060A2 (en) * 1998-12-01 2000-06-08 American Science And Engineering, Inc. X-ray back scatter imaging system for undercarriage inspection
US6424695B1 (en) * 1998-12-22 2002-07-23 American Science And Engineering, Inc. Separate lateral processing of backscatter signals

Also Published As

Publication number Publication date
PT1558947E (pt) 2012-03-05
IL168371A (en) 2011-08-31
KR20100119813A (ko) 2010-11-10
ES2379653T3 (es) 2012-04-30
EP2275839A2 (en) 2011-01-19
ATE541226T1 (de) 2012-01-15
JP2011085593A (ja) 2011-04-28
EP2275839A3 (en) 2011-11-02
CY1112675T1 (el) 2016-02-10
SI1558947T1 (sl) 2012-05-31
KR101171598B1 (ko) 2012-08-10
HK1080947A1 (en) 2006-05-04
DK1558947T3 (da) 2012-02-27

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