KR101171598B1 - 투과 방사선의 빔의 방향을 제어하기 위해 제공되는 검사시스템 및 검사방법 - Google Patents

투과 방사선의 빔의 방향을 제어하기 위해 제공되는 검사시스템 및 검사방법 Download PDF

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KR101171598B1
KR101171598B1 KR1020107021508A KR20107021508A KR101171598B1 KR 101171598 B1 KR101171598 B1 KR 101171598B1 KR 1020107021508 A KR1020107021508 A KR 1020107021508A KR 20107021508 A KR20107021508 A KR 20107021508A KR 101171598 B1 KR101171598 B1 KR 101171598B1
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South Korea
Prior art keywords
vehicle
transmitted radiation
inspection system
inspection
radiation
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KR1020107021508A
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English (en)
Korean (ko)
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KR20100119813A (ko
Inventor
윌리엄 아담스
알렉스 찰머스
리 그로드진스
루이스 더블유. 페리치
피터 로쓰칠드
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아메리칸 사이언스 앤 엔지니어링, 인크.
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Priority claimed from US10/330,000 external-priority patent/US20040256565A1/en
Priority claimed from US10/442,687 external-priority patent/US7099434B2/en
Application filed by 아메리칸 사이언스 앤 엔지니어링, 인크. filed Critical 아메리칸 사이언스 앤 엔지니어링, 인크.
Publication of KR20100119813A publication Critical patent/KR20100119813A/ko
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Publication of KR101171598B1 publication Critical patent/KR101171598B1/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T3/00—Measuring neutron radiation
    • G01T3/06—Measuring neutron radiation with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/232—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays having relative motion between the source, detector and object other than by conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/26—Passive interrogation, i.e. by measuring radiation emitted by objects or goods

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  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
KR1020107021508A 2002-11-06 2003-11-03 투과 방사선의 빔의 방향을 제어하기 위해 제공되는 검사시스템 및 검사방법 Expired - Lifetime KR101171598B1 (ko)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US42435702P 2002-11-06 2002-11-06
US60/424,357 2002-11-06
US10/330,000 2002-12-26
US10/330,000 US20040256565A1 (en) 2002-11-06 2002-12-26 X-ray backscatter mobile inspection van
US10/442,687 US7099434B2 (en) 2002-11-06 2003-05-21 X-ray backscatter mobile inspection van
US10/442,687 2003-05-21
PCT/US2003/035232 WO2004043740A2 (en) 2002-11-06 2003-11-03 X-ray backscatter mobile inspection van

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020057007935A Division KR20050071663A (ko) 2002-11-06 2003-11-03 엑스레이 후방 산란식 모바일 검사용 밴

Publications (2)

Publication Number Publication Date
KR20100119813A KR20100119813A (ko) 2010-11-10
KR101171598B1 true KR101171598B1 (ko) 2012-08-10

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KR1020107021508A Expired - Lifetime KR101171598B1 (ko) 2002-11-06 2003-11-03 투과 방사선의 빔의 방향을 제어하기 위해 제공되는 검사시스템 및 검사방법

Country Status (10)

Country Link
EP (1) EP2275839A3 (https=)
JP (2) JP2011017709A (https=)
KR (1) KR101171598B1 (https=)
AT (1) ATE541226T1 (https=)
CY (1) CY1112675T1 (https=)
DK (1) DK1558947T3 (https=)
ES (1) ES2379653T3 (https=)
IL (1) IL168371A (https=)
PT (1) PT1558947E (https=)
SI (1) SI1558947T1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9151721B2 (en) 2011-06-20 2015-10-06 The Boeing Company Integrated backscatter X-ray system
US8761338B2 (en) 2011-06-20 2014-06-24 The Boeing Company Integrated backscatter X-ray system
US8855268B1 (en) 2011-11-01 2014-10-07 The Boeing Company System for inspecting objects underwater
EP2812736A2 (de) * 2012-02-10 2014-12-17 Smiths Heimann GmbH Verfahren und vorrichtung zur überprüfung des laderaums eines lastkraftwagens
CN104950338B (zh) * 2014-03-24 2020-11-24 北京君和信达科技有限公司 对移动目标进行辐射检查的系统和方法
CN109557575A (zh) * 2018-12-17 2019-04-02 中国原子能科学研究院 一种中子多重性测量装置及其使用方法
WO2024056161A1 (de) * 2022-09-14 2024-03-21 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Röntgensystem
KR102894440B1 (ko) * 2022-12-12 2025-12-03 대한민국 화학물질 운송탱크 안전진단 시스템

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000033060A3 (en) * 1998-12-01 2000-11-23 American Science & Eng Inc X-ray back scatter imaging system for undercarriage inspection

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01189551A (ja) * 1988-01-25 1989-07-28 Mitsubishi Atom Power Ind Inc 爆発物検査方法及び装置
US5022062A (en) * 1989-09-13 1991-06-04 American Science And Engineering, Inc. Automatic threat detection based on illumination by penetrating radiant energy using histogram processing
US5764683B1 (en) 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
JPH1186783A (ja) * 1997-09-10 1999-03-30 Nec Corp 電子エネルギ分析装置
JPH11271453A (ja) * 1998-03-25 1999-10-08 Toshiba Corp 放射線弁別測定方法および放射線弁別測定装置
US6094472A (en) * 1998-04-14 2000-07-25 Rapiscan Security Products, Inc. X-ray backscatter imaging system including moving body tracking assembly
US6421420B1 (en) 1998-12-01 2002-07-16 American Science & Engineering, Inc. Method and apparatus for generating sequential beams of penetrating radiation
WO2000037928A2 (en) * 1998-12-22 2000-06-29 American Science And Engineering, Inc. Unilateral hand-held x-ray inspection apparatus
US20030165211A1 (en) 2002-03-01 2003-09-04 Lee Grodzins Detectors for x-rays and neutrons
WO2001073415A2 (en) * 2000-03-28 2001-10-04 American Science And Engineering, Inc. Detection of fissile material
US6671345B2 (en) * 2000-11-14 2003-12-30 Koninklijke Philips Electronics N.V. Data acquisition for computed tomography

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2000033060A3 (en) * 1998-12-01 2000-11-23 American Science & Eng Inc X-ray back scatter imaging system for undercarriage inspection

Also Published As

Publication number Publication date
PT1558947E (pt) 2012-03-05
IL168371A (en) 2011-08-31
KR20100119813A (ko) 2010-11-10
ES2379653T3 (es) 2012-04-30
EP2275839A2 (en) 2011-01-19
ATE541226T1 (de) 2012-01-15
JP2011017709A (ja) 2011-01-27
JP2011085593A (ja) 2011-04-28
EP2275839A3 (en) 2011-11-02
CY1112675T1 (el) 2016-02-10
SI1558947T1 (sl) 2012-05-31
HK1080947A1 (en) 2006-05-04
DK1558947T3 (da) 2012-02-27

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