JP2011058831A5 - - Google Patents

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JP2011058831A5
JP2011058831A5 JP2009205887A JP2009205887A JP2011058831A5 JP 2011058831 A5 JP2011058831 A5 JP 2011058831A5 JP 2009205887 A JP2009205887 A JP 2009205887A JP 2009205887 A JP2009205887 A JP 2009205887A JP 2011058831 A5 JP2011058831 A5 JP 2011058831A5
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moisture
substrate
layer
proof layer
photoelectric conversion
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JP2009205887A
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JP5650898B2 (en
JP2011058831A (en
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Description

上述の目的を達成するため、本発明の放射線検出器は、蛍光を電気信号に変換する光電変換素子を有する基板と、前記光電変換素子上に形成され、放射線を前記蛍光に変換するシンチレータ層と、前記シンチレータ層を覆うように形成される導電性の防湿層と、前記防湿層と前記基板とを接着する接着層を備える放射線検出器において、前記接着層は、無機又は樹脂の材質からなり前記防湿層と前記基板との間隔を規定するスペーサと、無機材質からなり透湿性を抑制するフィラーとを含むことを特徴とする。 In order to achieve the above object, a radiation detector of the present invention includes a substrate having a photoelectric conversion element that converts fluorescence into an electrical signal, and a scintillator layer that is formed on the photoelectric conversion element and converts radiation into the fluorescence. The radiation detector includes a conductive moisture-proof layer formed so as to cover the scintillator layer, and an adhesive layer that adheres the moisture-proof layer and the substrate, and the adhesive layer is made of an inorganic or resin material. It includes a spacer that defines a distance between the moisture-proof layer and the substrate, and a filler that is made of an inorganic material and suppresses moisture permeability.

一方、樹脂スペーサの場合には、重なりが生じても基板への局所的な加圧は樹脂の弾性によって緩和され、基板保護膜の破壊や基板配線へのダメージなど生じ難い。しかし、樹脂スペーサの場合には無機質のスペーサに比較して透湿性は大きく、接着層全体としての湿性能を確保する観点から添加率を抑えるのが望ましい。 On the other hand, in the case of the resin spacer, even if the overlap occurs, the local pressurization to the substrate is alleviated by the elasticity of the resin, so that the substrate protective film is not broken or the substrate wiring is hardly damaged. However, large moisture permeability as compared to the spacer minerals in the case of the resin spacer, to suppress the addition rate in order to ensure the anti-wet performance of the entire adhesive layer is desirable.

(フィラーの体積充填率)
後述する実施例6の図10の結果からも明らかなように、フィラーの体積充填率が30%程度以上になると透湿係数の低下が顕著になる。また、製造上の観点から70%程度以下が好ましい。フィラー材質に関しては、他の一般的な酸化物や窒化物などのセラミック材料系、メタル系などが、実質的に水分を透過しないので同様な効果が得られると考えられる。
(Filler volume filling rate)
As is apparent from the results of FIG. 10 of Example 6 described later, when the volume filling rate of the filler is about 30% or more, the moisture permeability coefficient is significantly reduced . Moreover, about 70% or less is preferable from a viewpoint on manufacture. With regard to the filler material, other general ceramic material systems such as oxides and nitrides, metal systems, and the like do not substantially permeate moisture, and it is considered that the same effect can be obtained.

UV硬化型接着剤を用いてハットの鍔部とアレイ基板12とを接着シールする場合、導電性防湿層15は一般にALなどの金属でUVを反射してしまう為、アレイ基板12の裏面側からUV照射することになる。この場合、アレイ基板12の接着部分には信号線19又は制御線18のリード配線が存在し、この配線の部分が接着剤へのUV照射の影になる。この影の部分が硬化しないとその後の接着部の密着強度や防湿性などの信頼性面で望ましくない。 When the hat collar and the array substrate 12 are bonded and sealed using a UV curable adhesive, the conductive moisture-proof layer 15 generally reflects UV with a metal such as AL. UV irradiation will be performed. In this case, the adhesive portion of the array substrate 12 there is a lead wiring of the signal line 19 or control line 18, the portion of the wiring becomes shadow of UV irradiation to the adhesive. If this shadow portion does not harden, it is not desirable in terms of reliability such as adhesion strength and moisture resistance of the subsequent adhesive portion.

Claims (1)

蛍光を電気信号に変換する光電変換素子を有する基板と、前記光電変換素子上に形成され、放射線を前記蛍光に変換するシンチレータ層と、前記シンチレータ層を覆うように形成される導電性の防湿層と、前記防湿層と前記基板とを接着する接着層を備える放射線検出器において、
前記接着層は、無機又は樹脂の材質からなり前記防湿層と前記基板との間隔を規定するスペーサと、無機材質からなり透湿性を抑制するフィラーとを含むことを特徴とする放射線検出器。
A substrate having a photoelectric conversion element that converts fluorescence into an electrical signal, a scintillator layer that is formed on the photoelectric conversion element and converts radiation into the fluorescence, and a conductive moisture-proof layer formed so as to cover the scintillator layer And in a radiation detector comprising an adhesive layer that bonds the moisture-proof layer and the substrate,
The radiation detector, wherein the adhesive layer is made of an inorganic or resin material, and includes a spacer that defines a distance between the moisture-proof layer and the substrate, and a filler that is made of an inorganic material and suppresses moisture permeability.
JP2009205887A 2009-09-07 2009-09-07 Radiation detector and manufacturing method thereof Active JP5650898B2 (en)

Priority Applications (1)

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JP2009205887A JP5650898B2 (en) 2009-09-07 2009-09-07 Radiation detector and manufacturing method thereof

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JP2009205887A JP5650898B2 (en) 2009-09-07 2009-09-07 Radiation detector and manufacturing method thereof

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JP2011058831A JP2011058831A (en) 2011-03-24
JP2011058831A5 true JP2011058831A5 (en) 2012-10-11
JP5650898B2 JP5650898B2 (en) 2015-01-07

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Publication number Priority date Publication date Assignee Title
JP2013019690A (en) * 2011-07-07 2013-01-31 Toshiba Corp Radiation detector
JP2013019691A (en) * 2011-07-07 2013-01-31 Toshiba Corp Radiation detector
JP5788738B2 (en) * 2011-08-26 2015-10-07 富士フイルム株式会社 Manufacturing method of radiation detector
JP5927873B2 (en) 2011-12-01 2016-06-01 三菱電機株式会社 Image detector
JP6105862B2 (en) * 2012-05-28 2017-03-29 東芝電子管デバイス株式会社 Radiation detector and manufacturing method thereof
JP2014059246A (en) * 2012-09-19 2014-04-03 Toshiba Corp Radiation detector and method for manufacturing the same
JP2015021898A (en) * 2013-07-22 2015-02-02 株式会社東芝 Radiation detector and manufacturing method of the same
JP6334149B2 (en) * 2013-12-04 2018-05-30 東芝電子管デバイス株式会社 Manufacturing method of radiation detector
JP6523620B2 (en) * 2014-06-16 2019-06-05 キヤノン電子管デバイス株式会社 Radiation detector and method of manufacturing the same
JPWO2019244610A1 (en) * 2018-06-22 2021-07-08 富士フイルム株式会社 Radiation detector and radiation imaging device

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JPH11186532A (en) * 1997-12-22 1999-07-09 Canon Inc Photosensor
JP4886245B2 (en) * 2005-08-26 2012-02-29 株式会社東芝 Radiation detector
JP2007071836A (en) * 2005-09-09 2007-03-22 Canon Inc Radiation detector, and radiation imaging system
JP4871629B2 (en) * 2006-04-12 2012-02-08 キヤノン株式会社 Radiation imaging apparatus manufacturing method and radiation imaging system
JP4764407B2 (en) * 2007-11-20 2011-09-07 東芝電子管デバイス株式会社 Radiation detector and manufacturing method thereof

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