JP2011038856A - Film thickness measuring device and film thickness measuring method - Google Patents

Film thickness measuring device and film thickness measuring method Download PDF

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JP2011038856A
JP2011038856A JP2009185222A JP2009185222A JP2011038856A JP 2011038856 A JP2011038856 A JP 2011038856A JP 2009185222 A JP2009185222 A JP 2009185222A JP 2009185222 A JP2009185222 A JP 2009185222A JP 2011038856 A JP2011038856 A JP 2011038856A
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film thickness
film
thickness measuring
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test film
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JP5359671B2 (en
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Yutaka Sugie
豊 杉江
Takayuki Ishiguro
敬之 石黒
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Toyota Motor Corp
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y02E60/10Energy storage using batteries

Abstract

<P>PROBLEM TO BE SOLVED: To provide a film thickness measuring device improving the accuracy of on-line measurement, and also to provide a film thickness measuring method. <P>SOLUTION: A film thickness measuring device 100 measures the thickness of a web 20 on-line. For measurement of a film thickness, the film thickness is measured in advance during low speed transportation with a small influence of entraining of air, and the measured value is regarded as a master value (S02). After the transportation speed reaches a production target transportation speed, the difference between a measured value of the film thickness by on-line measurement and the master value, that is, the change amount is determined for measurement during high speed transportation (S05). After calculation of the change amount, the measurement result of the film thickness obtained during the high speed transportation is corrected with the change amount (S06). <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

本発明は,帯状をなす被検膜の厚さを非接触で測定する膜厚測定装置および膜厚測定方法に関する。例えば,電池用の電極板を製造する工程において使用され,オンラインで被検膜の厚さを測定する膜厚測定装置および膜厚測定方法に関するものである。   The present invention relates to a film thickness measuring apparatus and a film thickness measuring method for measuring the thickness of a test film having a strip shape in a non-contact manner. For example, the present invention relates to a film thickness measuring apparatus and a film thickness measuring method that are used in a process of manufacturing an electrode plate for a battery and measure the thickness of a test film online.

例えば,リチウムイオン電池に使用される電極板は,帯状の金属箔の両面に活物質を塗布することによって製造される。具体的に電極板の製造過程では,金属箔の両面に活物質ペーストを塗布し,その活物質ペーストを乾燥し,乾燥した活物質ペーストを金属箔とともにプレスロールにて圧延し,圧延後の薄膜を適切な幅および長さに切断することが行われる。   For example, an electrode plate used for a lithium ion battery is manufactured by applying an active material to both surfaces of a strip-shaped metal foil. Specifically, in the manufacturing process of the electrode plate, an active material paste is applied to both sides of the metal foil, the active material paste is dried, the dried active material paste is rolled with a metal foil with a press roll, and the thin film after rolling Is cut to a suitable width and length.

前記したように,電極板の製造過程においては,金属箔の両面上に活物質ペーストの層が形成された帯状の薄膜が形成される。この薄膜の厚さを測定する膜厚測定方法としては,オフライン時に,圧延後の薄膜の一部を切り出し,接触型膜厚測定装置によって膜厚を計測する方法が知られている。また,オンライン時の測定としては,例えば特許文献1や特許文献2に,レーザ変位計を幅方向に走査することによって幅方向の膜厚分布を計測する膜厚測定装置が開示されている。   As described above, in the manufacturing process of the electrode plate, a strip-shaped thin film in which layers of the active material paste are formed on both surfaces of the metal foil is formed. As a film thickness measuring method for measuring the thickness of the thin film, there is known a method of cutting out a part of the thin film after rolling and measuring the film thickness with a contact-type film thickness measuring device when offline. For online measurement, for example, Patent Document 1 and Patent Document 2 disclose a film thickness measuring apparatus that measures a film thickness distribution in the width direction by scanning a laser displacement meter in the width direction.

特開2002−257506号公報JP 2002-257506 A 特開2009−47665号公報JP 2009-47665 A

しかしながら,前記した従来の膜厚測定技術には,次のような問題があった。すなわち,圧延後の薄膜の厚さは,プレスロールの熱膨張の影響を受けることから,巻き出し先端側よりも後端側の方が薄くなる傾向にある。そのため,先端から後端にかけての搬送方向の膜厚履歴を高精度に検知したいという要求(例えば,プレスロールへのフィードバックするための要求)がある。   However, the conventional film thickness measurement technique described above has the following problems. That is, since the thickness of the thin film after rolling is affected by the thermal expansion of the press roll, the rear end side tends to be thinner than the unwinding front end side. Therefore, there is a request (for example, a request for feedback to the press roll) that the film thickness history in the transport direction from the front end to the rear end should be detected with high accuracy.

そこで,特許文献1等に開示された非接触型の膜厚測定装置を利用し,圧延後の薄膜の厚さをオンライン測定することが考えられる。しかし,オンライン測定では,空気巻き込みによって薄膜が基準ローラから浮上し,測定誤差が生じる。この誤差は,薄膜の搬送を高速化するほど顕著になる傾向にある。   Therefore, it is conceivable to use a non-contact type film thickness measuring device disclosed in Patent Document 1 or the like to measure the thickness of the thin film after rolling on-line. However, in online measurement, the thin film floats from the reference roller due to air entrainment, resulting in measurement errors. This error tends to become more noticeable as the speed of transport of the thin film increases.

本発明は,前記した従来の技術が有する問題点を解決するためになされたものである。すなわちその課題とするところは,オンライン測定の高精度化を図ることができる膜厚測定装置および膜厚測定方法を提供することにある。   The present invention has been made to solve the above-described problems of the prior art. That is, an object of the present invention is to provide a film thickness measuring apparatus and a film thickness measuring method capable of increasing the accuracy of online measurement.

この課題の解決を目的としてなされた膜厚測定装置は,帯状をなす被検膜の厚さを測定する膜厚測定装置であって,被検膜を張架するローラである基準ローラ表面からの距離を測定する第1変位計と,基準ローラに張架された被検膜表面からの距離を測定する第2変位計とを有し,第1変位計および第2変位計の測定結果を基に被検膜の厚さを計算するオンライン計測部と,被検膜の搬送速度が生産の目標速度に達する前に,被検膜の厚さの基準となるマスタ値を取得するマスタ取得部と,マスタ値の取得後であって被検膜の搬送速度が目標速度に達した後に,オンライン計測部での計測値とマスタ値との差分を変化量として計算する変化量計算部と,オンライン計測部での計測値を,変化量計算部で計算した変化量を用いて補正する補正部とを備えることを特徴としている。   A film thickness measuring apparatus for solving this problem is a film thickness measuring apparatus for measuring the thickness of a test film having a strip shape, and is provided from the surface of a reference roller that is a roller for stretching the test film. A first displacement meter for measuring the distance, and a second displacement meter for measuring the distance from the surface of the test film stretched on the reference roller, based on the measurement results of the first displacement meter and the second displacement meter. An online measurement unit that calculates the thickness of the test film, a master acquisition unit that acquires a master value as a reference for the thickness of the test film before the transport speed of the test film reaches the target production speed, A change amount calculation unit that calculates the difference between the measurement value in the online measurement unit and the master value as a change amount after the master value is acquired and the transport speed of the test film reaches the target speed; Correction unit that corrects the measured value in the unit using the variation calculated by the variation calculation unit It is characterized in that it comprises.

本発明の膜厚測定装置は,被検膜の厚さをオンライン測定するものであって,あらかじめ空気巻き込みの影響が少ない状態で,膜厚の基準となるマスタ値を測定しておく。そして,被検膜の搬送速度が生産の目標速度に達した後,その高速搬送での計測を開始するにあたって,オンライン測定による膜厚の計測値とマスタ値との差となる変化量を求める。そして,変化量の計算後,高速搬送中に得た膜厚の計測結果を,その変化量を用いて補正する。   The film thickness measuring apparatus according to the present invention measures the thickness of a film to be measured on-line, and measures in advance a master value serving as a film thickness reference in a state where the influence of air entrainment is small. Then, after the transport speed of the test film reaches the target production speed, the amount of change that is the difference between the measured value of the film thickness by online measurement and the master value is obtained when starting measurement at the high speed transport. Then, after the change amount is calculated, the film thickness measurement result obtained during high-speed conveyance is corrected using the change amount.

すなわち,本発明の膜厚測定装置では,マスタ値を基に高速搬送時の測定誤差となる変化量を求めている。この変化量は,高速搬送時に生じた誤差,すなわち空気巻き込みによる浮上分を含んでいる。そして,本発明の膜厚測定装置では,高速搬送中に得た膜厚の計測結果を,その変化量を用いて補正している。例えば,変化量分の測定誤差をキャンセルする補正を行っている。その結果,測定精度の向上が期待できる。   That is, in the film thickness measuring apparatus of the present invention, the amount of change that is a measurement error during high-speed conveyance is obtained based on the master value. This amount of change includes an error that occurred during high-speed conveyance, that is, a floating part due to air entrainment. And in the film thickness measuring apparatus of this invention, the measurement result of the film thickness obtained during high-speed conveyance is correct | amended using the variation | change_quantity. For example, correction is performed to cancel the measurement error corresponding to the change amount. As a result, improvement in measurement accuracy can be expected.

また,本発明の膜厚測定装置のマスタ取得部は,被検膜の搬送速度が,目標速度に達する前であって目標速度よりも遅い第2目標速度となっている期間内に,オンライン計測部で求めた計測値をマスタ値として取得するとよい。すなわち,第2目標速度による低速搬送期間は,目標速度による高速搬送期間と比較して,空気巻き込みによる被検膜の浮上量が少ない。そのため,この低速搬送期間に測定した値は測定誤差が小さいと推測される。そこで,この低速搬送期間に測定した値をマスタ値とする。これにより,オフラインでの膜厚測定が必要なく,すべてオンラインで行うことができる。そのため,オフライン測定に伴う稼働率の低下は生じない。   In addition, the master acquisition unit of the film thickness measuring apparatus of the present invention performs online measurement within a period in which the transport speed of the film to be measured is a second target speed that is lower than the target speed before reaching the target speed. The measurement value obtained by the section may be acquired as a master value. That is, the amount of floating of the test film due to air entrainment is smaller in the low-speed conveyance period at the second target speed than in the high-speed conveyance period at the target speed. For this reason, the value measured during this low speed conveyance period is estimated to have a small measurement error. Therefore, the value measured during this low speed conveyance period is taken as the master value. This eliminates the need for off-line film thickness measurement and allows all measurements to be performed online. For this reason, there is no reduction in operating rate due to offline measurement.

また,本発明の膜厚測定装置のマスタ取得部は,オフライン時に計測した被検膜の厚さをマスタ値として取得してもよい。すなわち,オフライン時の膜厚測定は,空気巻き込みによる被検膜浮上の影響を受けない。そこで,オフライン時に,同ロットの別の被検膜の一部を切り出し,その膜厚を測定した値をマスタ値とすることで,より高精度に膜厚の補正を行うことが期待できる。   Moreover, the master acquisition part of the film thickness measuring apparatus of this invention may acquire the thickness of the to-be-tested film measured at the time of offline as a master value. In other words, off-line film thickness measurement is not affected by floating of the test film due to air entrainment. Therefore, when off-line, a part of another film to be tested in the same lot is cut out, and the value obtained by measuring the film thickness is used as a master value, so that it can be expected that the film thickness can be corrected with higher accuracy.

また,本発明の膜厚測定装置の変化量計算部は,被検膜の搬送開始後であって被検膜の張力が一定となった後に,変化量を計算するとよい。被検膜の搬送加速時には,被検膜の張力が不安定になり,空気巻き込みが生じやすい。そのため,オンライン測定の測定値も不安定であり,精度が低くなる。そこで,被検膜の張力を測定し,張力が安定したころを見計らって変化量を計算する。これにより,より精度の向上が期待できる。   The change amount calculation unit of the film thickness measuring apparatus of the present invention may calculate the change amount after the start of conveyance of the test film and after the tension of the test film becomes constant. When the transport of the test film is accelerated, the tension of the test film becomes unstable and air entrainment tends to occur. For this reason, the measured value of online measurement is also unstable and the accuracy is lowered. Therefore, the tension of the test film is measured, and the amount of change is calculated by looking at the time when the tension is stable. This can be expected to improve accuracy.

また,上記の膜厚測定装置は,マスタの取得後であって被検膜の張力が一定となるまでの間は,マスタ値を被検膜の厚さとして補正する第2補正部を備えるとよい。張力が不安定の間は,オンライン測定の精度が低く,良品を不良と誤判定する傾向にある。そこで,被検膜の張力が一定となるまではオンライン測定の結果をキャンセルし,良品の値であるマスタ値を出力する補正を行うことで,誤判定を回避する。   In addition, the film thickness measuring apparatus includes a second correction unit that corrects the master value as the thickness of the test film until the tension of the test film becomes constant after acquisition of the master. Good. While the tension is unstable, the accuracy of on-line measurement is low, and good products tend to be misjudged as defective. Therefore, the erroneous determination is avoided by canceling the online measurement result until the tension of the film to be measured becomes constant and performing a correction to output a master value that is a non-defective value.

また,本発明の膜厚測定装置の補正部は,基準ローラの搬送方向の移動量を検出し,被検膜の搬送方向の,基準ローラよりも上流側に位置する上位ローラの加工周期と同期をとって補正するとよい。すなわち,上位ローラの加工周期のばらつき(ローラの偏心等によって生じる,被検膜の周期的な厚さのばらつき)を取得し,補正時に加工周期でのばらつきを反映することで,より精度の向上が期待できる。なお,上位ローラには,例えば,膜厚測定装置が圧延工程後の被検膜の厚さを測定する場合であれば,圧延工程におけるプレスロールが該当する。   The correction unit of the film thickness measuring apparatus of the present invention detects the amount of movement of the reference roller in the conveyance direction, and synchronizes with the machining cycle of the upper roller positioned upstream of the reference roller in the conveyance direction of the test film. It is recommended to correct by taking In other words, by obtaining variations in the processing cycle of the upper roller (periodic thickness variation of the test film caused by roller eccentricity, etc.) and reflecting variations in the processing cycle during correction, the accuracy can be further improved. Can be expected. For example, when the film thickness measuring device measures the thickness of the test film after the rolling process, the upper roller corresponds to a press roll in the rolling process.

また,本発明の膜厚測定装置の第1変位計は,光学式の変位計であり,基準ローラは,表面の鏡面を低減する仕上げ処理がなされているとよい。すなわち,基準ローラ表面の鏡面を低減して正反射成分を減らすことで,測定誤差を小さくすることが期待できる。なお,鏡面を低減する仕上げ処理には,例えば,粗面化して艶を消したり,色を付けたりすることが該当する。   Further, the first displacement meter of the film thickness measuring device of the present invention is an optical displacement meter, and the reference roller is preferably subjected to a finishing process for reducing the mirror surface. That is, it can be expected to reduce the measurement error by reducing the specular reflection component by reducing the mirror surface of the reference roller surface. Note that the finishing process for reducing the mirror surface corresponds to, for example, roughening and matting or coloring.

また,上記の仕上げ処理は,微粒子を前記基準ローラの表面に投射する処理であるとよい。すなわち,微粒子を投射することで,艶を消しつつ面粗度の悪化を防ぐことができる。そして,面粗度の悪化を抑制することから,薄膜への転写傷を低減できる。さらに,基準ローラの表面には無数の凹部が形成されることから,空気の逃げ場が生じ,空気巻き込みによる被検膜の浮上量を低減することも期待できる。   The finishing process may be a process of projecting fine particles onto the surface of the reference roller. That is, by projecting the fine particles, it is possible to prevent the surface roughness from deteriorating while matt. And since the deterioration of surface roughness is suppressed, the transfer damage to a thin film can be reduced. Furthermore, since innumerable recesses are formed on the surface of the reference roller, an air escape field is generated, and it can be expected that the floating amount of the test film due to air entrainment is reduced.

また,本発明は,帯状をなす被検膜の厚さを測定する膜厚測定方法であって,第1変位計にて,被検膜を張架するローラである基準ローラ表面からの距離を測定し,第2変位計にて,基準ローラに張架された被検膜表面からの距離を測定し,第1変位計および第2変位計の測定結果を基に被検膜の厚さを計算するオンライン計測ステップと,被検膜の搬送速度が生産の目標速度に達する前に,被検膜の厚さの基準となるマスタ値を取得するマスタ取得ステップと,マスタ値の取得後であって被検膜の搬送速度が目標速度に達した後に,オンライン計測ステップによる計測値とマスタ値との差分を変化量として計算する変化量計算ステップと,オンライン計測ステップでの計測値を,変化量計算ステップで計算した変化量を用いて補正する補正ステップとを含むことを特徴とする膜厚測定方法を含んでいる。   Further, the present invention is a film thickness measuring method for measuring the thickness of a test film having a band shape, wherein the distance from a reference roller surface, which is a roller for stretching the test film, is measured by a first displacement meter. Measure the distance from the surface of the test film stretched on the reference roller with the second displacement meter, and determine the thickness of the test film based on the measurement results of the first and second displacement meters. An online measurement step to calculate, a master acquisition step to acquire a master value as a reference for the thickness of the test film before the transport speed of the test film reaches the production target speed, and a master acquisition step after the master value is acquired. After the transfer speed of the test film reaches the target speed, the change amount calculation step for calculating the difference between the measurement value in the online measurement step and the master value as the change amount, and the measurement value in the online measurement step Correction to be corrected using the amount of change calculated in the calculation step It includes thickness measuring method which comprises a step.

本発明によれば,オンライン測定の高精度化を図ることができる膜厚測定装置および膜厚測定方法が実現される。   According to the present invention, a film thickness measuring apparatus and a film thickness measuring method capable of increasing the accuracy of online measurement are realized.

実施の形態にかかる電極板製造工程の一部を示すブロック図である。It is a block diagram which shows a part of electrode plate manufacturing process concerning embodiment. 実施の形態にかかる膜厚測定装置の概略構成を示す図である。It is a figure which shows schematic structure of the film thickness measuring apparatus concerning embodiment. 空気巻き込みによる薄膜浮上の概念を示す図である。It is a figure which shows the concept of thin film floating by air entrainment. 実施の形態にかかる膜厚測定装置の測定手順を示すフローチャートである。It is a flowchart which shows the measurement procedure of the film thickness measuring apparatus concerning embodiment. 膜厚測定値と時間との関係および薄膜搬送速度と時間との関係を示すグラフである。It is a graph which shows the relationship between a film thickness measured value and time, and the relationship between a thin film conveyance speed and time. 図5に示した膜厚測定値と時間との関係を示すグラフの拡大である。6 is an enlarged graph showing the relationship between the measured film thickness and the time shown in FIG.

以下,本発明にかかる膜厚測定装置を具体化した実施の形態について,添付図面を参照しつつ詳細に説明する。本形態は,リチウムイオン二次電池の製造工程であって,電極板製造過程で形成される薄膜の厚さを測定する膜厚測定装置に,本発明を適用したものである。   DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of a film thickness measuring apparatus according to the present invention will be described in detail below with reference to the accompanying drawings. In the present embodiment, the present invention is applied to a film thickness measuring device that measures the thickness of a thin film formed in the process of manufacturing an electrode plate, which is a manufacturing process of a lithium ion secondary battery.

製造対象となるリチウムイオン二次電池には,アルミ箔の両面に正極活物質(例えば,ニッケル酸リチウム(LiNiO2 ))を塗布した正極用の電極板や,銅箔の両面に負極活物質(例えば,グラファイト)を塗布した負極用の電極板が用いられる。これらの電極板は,例えば,これらの電極板の間にセパレータ(例えば,ポリエチレン)を挟んで捲回し,電解液とともにケース内で密封することで,捲回タイプの二次電池となる。本形態では,前述したような電極板の製造ラインに組み込まれ,電極板となる薄膜の厚さをオンラインで測定するための膜厚測定装置として説明する。 The lithium ion secondary battery to be manufactured includes a positive electrode plate in which a positive electrode active material (for example, lithium nickelate (LiNiO 2 )) is applied to both sides of an aluminum foil, and a negative electrode active material ( For example, a negative electrode plate coated with graphite is used. These electrode plates are wound, for example, by sandwiching a separator (for example, polyethylene) between these electrode plates, and sealed in a case together with the electrolyte, thereby forming a wound type secondary battery. This embodiment will be described as a film thickness measuring device that is incorporated in the electrode plate production line as described above and measures the thickness of the thin film that becomes the electrode plate online.

[電極板の製造工程]
始めに,正極用の電極板の製造工程のうちの一部を,図1に示すブロック図を参照しつつ説明する。図1に示した各加工処理は,1つの搬送装置によって実現される。そして,その搬送装置に膜厚測定装置が組み込まれている。
[Electrode plate manufacturing process]
First, a part of the manufacturing process of the positive electrode plate will be described with reference to the block diagram shown in FIG. Each processing shown in FIG. 1 is realized by one transport device. A film thickness measuring device is incorporated in the conveying device.

本形態では,あらかじめ,厚さが約15μm,幅が約600mm,長さが約3600mのアルミ箔上に,その長手方向に沿って3条の正極活物質ペーストが幅方向に間隔をあけて塗布され,ロール状に捲回された帯状の薄膜を,巻き出しロールとして用意する。この薄膜が正極用の電極板の基材となる。なお,巻き出しロールの寸法は,一例であってこれに限るものではない。   In this embodiment, three positive electrode active material pastes are applied in advance along the longitudinal direction on an aluminum foil having a thickness of about 15 μm, a width of about 600 mm, and a length of about 3600 m. A strip-shaped thin film wound into a roll is prepared as an unwinding roll. This thin film becomes the base material of the positive electrode plate. In addition, the dimension of the unwinding roll is an example, and is not limited to this.

本形態の搬送装置は,巻き出しロールから帯状の薄膜(以下,「ウエブ」とする)を巻き出し,そのウエブを図1中の矢印方向に示される工程順に搬送する。そして,その搬送過程において各加工処理を行う。加工後のウエブは,巻き取りロールによってロール状に巻き取られる。   The transport device of this embodiment unwinds a strip-like thin film (hereinafter referred to as “web”) from a winding roll, and transports the web in the order of steps shown in the direction of the arrow in FIG. And each processing is performed in the conveyance process. The processed web is wound into a roll by a winding roll.

具体的に,本形態の搬送装置は,図1に示したように,巻き出し部1と,第1スリッタ部2と,リザーバ部3と,プレス部4と,箔部プレス部5と,膜厚測定部6と,CPCユニット部7と,第2スリッタ部8と,超音波クリーナ9と,検査部10と,巻き取り部11とを備えている。   Specifically, as shown in FIG. 1, the transport device of this embodiment includes an unwinding unit 1, a first slitter unit 2, a reservoir unit 3, a press unit 4, a foil unit press unit 5, and a film. A thickness measuring unit 6, a CPC unit unit 7, a second slitter unit 8, an ultrasonic cleaner 9, an inspection unit 10, and a winding unit 11 are provided.

巻き出し部1は,巻き出しロールからウエブを巻き出すものである。
第1スリッタ部2は,切断刃を備え,ウエブを長手方向に連続的に切断するものである。本形態では,2つの切断刃を備え,巻き出し部1から巻き出されたウエブのうち,ペーストが塗布されていない2箇所の隙間箇所を同時に切断する。従って,第1スリッタ部2から出力されるウエブは,3本のウエブになる。3本になった各ウエブは,いずれも幅方向の両側に非塗布部があり,中央部に塗布部がある構成になる。
The unwinding unit 1 unwinds the web from the unwinding roll.
The 1st slitter part 2 is equipped with a cutting blade, and cut | disconnects a web continuously to a longitudinal direction. In this embodiment, two cutting blades are provided, and two gaps where the paste is not applied are simultaneously cut out of the web unwound from the unwinding portion 1. Therefore, the webs output from the first slitter unit 2 are three webs. Each of the three webs has a configuration in which there are non-application portions on both sides in the width direction and an application portion in the center.

リザーバ部3は,第1スリッタ部2によって3本になったウエブの間隔を徐々に拡大するとともに,それぞれのウエブの張力や搬送速度を調整するものである。   The reservoir unit 3 gradually increases the interval between the three webs formed by the first slitter unit 2 and adjusts the tension and conveyance speed of each web.

プレス部4は,3本になった各ウエブをプレスローラによってプレスし,ペースト部分を高密度化するとともに厚さを均一化するものである。箔部プレス部5は,プレス部4でプレスの影響が少ない箇所のアルミ箔,すなわち非塗布部にプレスをかけるものである。これにより,ウエブを構成するアルミ箔は,塗布部と非塗布部とが同程度に圧延され,湾曲が抑制される。   The press section 4 presses each of the three webs with a press roller to increase the density of the paste portion and make the thickness uniform. The foil part press part 5 presses the aluminum foil, ie, the non-coated part, where the press part 4 is less affected by the press. Thereby, as for the aluminum foil which comprises a web, a coating part and a non-application part are rolled to the same extent, and a curve is suppressed.

膜厚測定部6は,圧延後の各ウエブの厚さを測定するものである。ウエブの膜厚は,ウエブを所定のローラ(以下,「基準ローラ」とする)に張架し,光学変位計が基準ローラとの距離とウエブとの距離を測定することによって求められる。膜厚測定部6の詳細については後述する。   The film thickness measuring unit 6 measures the thickness of each web after rolling. The film thickness of the web is obtained by stretching the web on a predetermined roller (hereinafter referred to as “reference roller”) and measuring the distance between the optical displacement meter and the reference roller. Details of the film thickness measuring unit 6 will be described later.

CPCユニット部7は,3本のウェブの張力や搬送速度を揃えるとともに,蛇行を矯正してウエブの幅方向の搬送位置を調節するものである。
第2スリッタ部8は,切断刃を備え,3本のウエブのそれぞれについて塗布部の中心位置で長手方向に連続して切断するものである。本形態では,3本の切断刃を備え,3本のウエブを同時に切断する。従って,第2スリッタ部8から出力されるウエブは,計6本のウエブとなる。また,ウエブは,第2スリッタ部8で切断されることにより,幅方向の片側にのみ非塗布部がある状態となる。
超音波クリーナ部9は,6本になった各ウエブの表面から,超音波によって粉塵等を除去するものである。
The CPC unit 7 adjusts the conveyance position in the width direction of the web by adjusting the tension and conveyance speed of the three webs and correcting the meandering.
The 2nd slitter part 8 is equipped with a cutting blade, and cut | disconnects continuously in a longitudinal direction in the center position of an application part about each of three webs. In this embodiment, three cutting blades are provided, and three webs are cut simultaneously. Accordingly, the total number of webs output from the second slitter unit 8 is six. Further, the web is cut by the second slitter portion 8 so that the non-application portion is present only on one side in the width direction.
The ultrasonic cleaner 9 removes dust and the like from the surface of each of the six webs using ultrasonic waves.

検査部10は,6本になった各ウエブについてそれぞれの欠陥を検査するものである。また,検査部10では,ウエブに対し,これまでの工程において欠陥が生じたと判断された箇所に,欠陥を表示するマークを印刷する。このマークが印刷された箇所は,後の工程において撥ね出され,製品には使用されない。
巻き取り部11は,6本になった各ウエブを別々にロール状に巻き取るものである。
The inspection unit 10 inspects each defect for each of the six webs. In addition, the inspection unit 10 prints a mark for displaying a defect on a location where it is determined that a defect has occurred in the process so far. The portion where this mark is printed is repelled in a later process and is not used in the product.
The winding part 11 winds each of the six webs separately in a roll shape.

[膜厚測定装置]
続いて,膜厚測定部6を構成する膜厚測定装置100について説明する。膜厚測定装置100は,図2に示すように,ウエブ20を張架して搬送する基準ローラ31と,基準ローラ31を回転駆動する駆動装置32と,基準ローラ31の軸方向に沿って並列配置されたレーザ変位計41,42,43,44と,ウエブ20の張力を計測する張力検出器46と,各計測器の計測結果を取得するとともに駆動装置32を制御する制御装置50とを備えている。
[Thickness measuring device]
Then, the film thickness measuring apparatus 100 which comprises the film thickness measurement part 6 is demonstrated. As shown in FIG. 2, the film thickness measuring apparatus 100 includes a reference roller 31 that stretches and conveys the web 20, a drive device 32 that rotationally drives the reference roller 31, and an axial direction of the reference roller 31. The laser displacement meters 41, 42, 43, 44 arranged, a tension detector 46 that measures the tension of the web 20, and a control device 50 that acquires the measurement results of each measuring instrument and controls the driving device 32. ing.

また,膜厚測定装置100では,4のレーザ変位計41,42,43,44を基準ローラ31上に固定し,各レーザ変位計は走査動作を行わない。膜厚測定装置100は,ロールプレス後のウエブ20を被検体としており,ウエブ20の幅方向の厚さは一定と見做すことができる。そのため,ウエブ20の幅方向の膜厚分布の測定を省略できる。   In the film thickness measuring apparatus 100, the four laser displacement meters 41, 42, 43, and 44 are fixed on the reference roller 31, and each laser displacement meter does not perform a scanning operation. The film thickness measuring apparatus 100 uses the web 20 after roll pressing as a specimen, and the thickness of the web 20 in the width direction can be regarded as constant. Therefore, measurement of the film thickness distribution in the width direction of the web 20 can be omitted.

また,被検膜であるウエブ20は,帯状のアルミ箔21と,そのアルミ箔21の両面上に塗布された正極活物質のペースト層22とで構成される。ウエブ20は,基準ローラ31に張架され,基準ローラ31が回転駆動されることに伴って搬送される。   The web 20 as a test film is composed of a strip-shaped aluminum foil 21 and a paste layer 22 of a positive electrode active material applied on both surfaces of the aluminum foil 21. The web 20 is stretched around the reference roller 31 and is conveyed as the reference roller 31 is rotationally driven.

膜厚測定装置100では,次のように測定して得られた値を測定生値とする。まず,レーザ変位計41が,基準ローラ31の一端であってウエブ20が捲回されない箇所に向かって,レーザL1を投射する。これにより,基準ローラ31表面からレーザ変位計41までの距離が得られる。このレーザ変位計41による距離測定と同時に,レーザ変位計42が,レーザ変位計41よりも基準ローラ31の軸方向の中央側であってウエブ20が捲回される箇所(特に,ペースト層22が搬送される位置)に向かって,レーザL2を投射する。これにより,ペースト層22表面からレーザ変位計42までの距離が得られる。このレーザ変位計41の測定値とレーザ変位計42の測定値との差が,ウエブ20の厚さの測定生値となる。   In the film thickness measuring apparatus 100, a value obtained by measurement as follows is used as a measurement raw value. First, the laser displacement meter 41 projects the laser L1 toward the end of the reference roller 31 where the web 20 is not wound. Thereby, the distance from the surface of the reference roller 31 to the laser displacement meter 41 is obtained. Simultaneously with the distance measurement by the laser displacement meter 41, the laser displacement meter 42 is located on the center side in the axial direction of the reference roller 31 with respect to the laser displacement meter 41 (particularly the paste layer 22 is wound). The laser L2 is projected toward the (conveyed position). Thereby, the distance from the paste layer 22 surface to the laser displacement meter 42 is obtained. The difference between the measured value of the laser displacement meter 41 and the measured value of the laser displacement meter 42 becomes a measured raw value of the thickness of the web 20.

また,膜厚測定装置100では,基準ローラ31の他端にも,基準ローラ31表面からの距離を測定するレーザ変位計44を設けている。さらに,ペースト層22の幅方向の他端にも,ペースト層22表面からの距離を測定するレーザ変位計43を設けている。このように,基準ローラ31表面からの距離を測定するレーザ変位計と,ペースト層22表面からの距離を測定するレーザ変位計とを,それぞれ2つ設けることで,基準ローラ31あるいはウエブ20の傾きを求めることができる。なお,本形態のレーザ変位計41,42,43,44は,一般的な光学式の変位計であればよい。   In the film thickness measuring apparatus 100, a laser displacement meter 44 that measures the distance from the surface of the reference roller 31 is also provided at the other end of the reference roller 31. Furthermore, a laser displacement meter 43 that measures the distance from the surface of the paste layer 22 is also provided at the other end in the width direction of the paste layer 22. Thus, by providing two laser displacement meters for measuring the distance from the surface of the reference roller 31 and two laser displacement meters for measuring the distance from the surface of the paste layer 22, the inclination of the reference roller 31 or the web 20 is provided. Can be requested. Note that the laser displacement meters 41, 42, 43, and 44 of this embodiment may be general optical displacement meters.

図2に示したような構成の膜厚測定装置100では,ウエブ20の搬送時,空気巻き込みによるウエブ20浮上の影響を受ける。すなわち,図3に示すように,基準ローラ31の回転に伴って,基準ローラ31とウエブ20との隙間に,空気を少なからず巻き込んでしまう。その結果,その空気がウエブ20を基準ローラ31から離間させ,ウエブ20の浮上を生じさせる。空気の巻き込み量は,高速搬送化するほど多くなることから,このウエブ20の浮上量Aはウエブ20の搬送速度が速いほど大きくなる傾向にある。勿論,浮上量Aが大きくなるほど,塗膜22表面からの距離を測定するレーザ変位計42,43の計測誤差が大きくなる。その空気巻き込みによる測定誤差が,膜厚の測定精度を悪化させる要因の1つとなる。   In the film thickness measuring apparatus 100 configured as shown in FIG. 2, when the web 20 is conveyed, it is affected by the web 20 floating due to air entrainment. That is, as shown in FIG. 3, with the rotation of the reference roller 31, air is caught in the gap between the reference roller 31 and the web 20. As a result, the air separates the web 20 from the reference roller 31 and causes the web 20 to float. Since the air entrainment amount increases as the speed of conveyance increases, the flying height A of the web 20 tends to increase as the conveyance speed of the web 20 increases. Of course, as the flying height A increases, the measurement error of the laser displacement meters 42 and 43 that measure the distance from the surface of the coating film 22 increases. The measurement error due to the air entrainment is one of the factors that deteriorate the film thickness measurement accuracy.

[膜厚測定手順]
続いて,膜厚測定装置100の制御装置50による膜厚測定処理の手順について,図4のフローチャートおよび図5のグラフを参照しつつ説明する。なお,図5は,膜厚測定値と時間との関係(A)および薄膜搬送速度と時間との関係(B)を示している。本膜厚測定処理では,空気巻き込みによるウエブ20の浮上量Aを考慮した処理を行う。なお,本膜厚測定処理は,被検膜であるウエブ20を搬送しながら膜厚測定を行うオンライン測定である。
[Thickness measurement procedure]
Next, the procedure of the film thickness measurement process performed by the control device 50 of the film thickness measurement apparatus 100 will be described with reference to the flowchart of FIG. 4 and the graph of FIG. FIG. 5 shows the relationship (A) between the film thickness measurement value and time and the relationship (B) between the thin film conveyance speed and time. In this film thickness measurement process, a process is performed in consideration of the flying height A of the web 20 by air entrainment. In addition, this film thickness measurement process is an on-line measurement which performs a film thickness measurement, conveying the web 20 which is a test film.

まず,ウエブ20の搬送を開始し,ウエブ20の搬送速度が所定の搬送速度v1(第2目標速度の一例)となるように基準ローラ31を低速回転させる(S01)。搬送速度v1は,ウエブ20の浮上が殆ど生じなく,膜厚測定に与える影響が小さいと判断できる値であればよく,あらかじめ制御装置50に規定されている。本形態では,例えば,搬送速度v1を5m/分とする。この搬送速度v1は,ウエブ20や基準ローラ31の,サイズや材質等によって異なる。   First, the conveyance of the web 20 is started, and the reference roller 31 is rotated at a low speed so that the conveyance speed of the web 20 becomes a predetermined conveyance speed v1 (an example of a second target speed) (S01). The conveyance speed v <b> 1 may be a value that can determine that the web 20 hardly floats and the influence on the film thickness measurement is small, and is defined in the control device 50 in advance. In this embodiment, for example, the conveyance speed v1 is set to 5 m / min. The conveyance speed v1 varies depending on the size and material of the web 20 and the reference roller 31.

ウエブ20の搬送速度がv1に達した後,その搬送速度v1で所定期間搬送し,その低速搬送中にウエブ20の膜厚を測定する。そして,その測定値をマスタ値として記憶する(S02)。低速搬送中は,空気の巻き込み量が少なく,ウエブ20の浮上量が少ない。そのため,計測誤差は極めて小さいと予測される。そこで,低速搬送中に測定した値をマスタ値として採用する。   After the conveyance speed of the web 20 reaches v1, the web 20 is conveyed for a predetermined period at the conveyance speed v1, and the film thickness of the web 20 is measured during the low-speed conveyance. Then, the measured value is stored as a master value (S02). During low-speed conveyance, the amount of air entrained is small, and the flying height of the web 20 is small. Therefore, the measurement error is expected to be extremely small. Therefore, the value measured during low-speed conveyance is adopted as the master value.

マスタ値の取得後,所定の搬送速度v2(目標速度の一例)となるように基準ローラ31を加速する(S03)。本形態では,例えば,搬送速度v2が100m/分となるように基準ローラ31を駆動する。搬送速度v2は,搬送装置の生産の目標速度となる高速搬送速度であり,生産性が高い一方,空気の巻き込み量が多くなる。つまり,測定値(図5中の測定生値)に,空気巻き込みによる浮上分が多く含まれ,その測定値が実際の膜厚よりも大きくなる。   After acquiring the master value, the reference roller 31 is accelerated so as to reach a predetermined transport speed v2 (an example of a target speed) (S03). In this embodiment, for example, the reference roller 31 is driven so that the conveyance speed v2 is 100 m / min. The conveyance speed v2 is a high-speed conveyance speed that is a target speed for production of the conveyance device, and has high productivity, but the amount of air entrainment increases. That is, the measured value (measured raw value in FIG. 5) includes a large amount of floating due to air entrainment, and the measured value is larger than the actual film thickness.

特に,加速中あるいは加速終了からある程度の期間(図5中のt2からt3までの範囲)は,ウエブ20の張力が不安定な状態であり,空気巻き込みによる測定精度の悪化が顕著になる傾向にある。そこで,張力検出器46の検出結果を基に,ウエブ20の張力が安定したか否かを判断する(S04)。張力検出器46は,帯状の被検体の張力を検出できる一般的なものであればよく,例えば歪ゲージが適用可能である。また,張力の安定判断は,例えば,所定の間隔で張力を検出し,今回の検出値と前回の検出値との差が閾値よりも小さい状態が所定期間以上継続したか否かによって判断できる。   In particular, during the acceleration or a certain period from the end of the acceleration (range from t2 to t3 in FIG. 5), the tension of the web 20 is in an unstable state, and the measurement accuracy tends to deteriorate significantly due to air entrainment. is there. Therefore, based on the detection result of the tension detector 46, it is determined whether or not the tension of the web 20 is stabilized (S04). The tension detector 46 may be a general one that can detect the tension of the strip-shaped subject, and for example, a strain gauge is applicable. The tension stability can be determined, for example, by detecting the tension at a predetermined interval and determining whether or not the state where the difference between the current detection value and the previous detection value is smaller than the threshold value continues for a predetermined period or longer.

張力が不安定の期間では,膜厚の測定精度が低いことから,良品を不良と誤判断してしまうことが予想される。そこで,張力が不安定と判断している間は(S04:NO),S02で取得したマスタ値を測定値として代用する(S11)。これにより,誤判断を回避する。   During periods of unstable tension, the film thickness measurement accuracy is low, so it is expected that a good product will be misjudged as defective. Therefore, while it is determined that the tension is unstable (S04: NO), the master value acquired in S02 is used as a measurement value (S11). This avoids misjudgment.

一方,張力が安定したと判断した場合には(S04:YES),高速搬送時の変化量を計算する(S05)。すなわち,張力が不安定状態から安定状態になったと判断したことを契機に(図5中のt3),そのタイミングでの膜厚の測定値とマスタ値との差分を計算する。そして,その差分をオンライン測定時の変化量として記憶する。   On the other hand, if it is determined that the tension is stable (S04: YES), the amount of change during high-speed conveyance is calculated (S05). That is, when it is determined that the tension has changed from an unstable state to a stable state (t3 in FIG. 5), the difference between the measured value of the film thickness at that timing and the master value is calculated. Then, the difference is stored as a change amount at the time of online measurement.

図6は,図5に示した膜厚の測定値と時間との関係を示すグラフの拡大であり,図6中のs1が変化量に該当する。この変化量s1は,高速搬送によって生じた変化量,主として,空気巻き込みよる浮上量と考えられる。なお,この変化量s1には,プレスロールの熱膨張の影響による経時的変化(図5中の測定生値が徐々に小さくなる変化)も含まれるが,張力安定時t3までに生じる経時的変化は空気巻き込みによる浮上量と比較して極僅かであり,算出される変化量には殆ど影響しない。   FIG. 6 is an enlargement of the graph showing the relationship between the measured value of the film thickness shown in FIG. 5 and time, and s1 in FIG. 6 corresponds to the amount of change. This change amount s1 is considered to be a change amount caused by high-speed conveyance, mainly a flying height due to air entrainment. The change amount s1 includes a change over time due to the influence of the thermal expansion of the press roll (change in which the measured raw value in FIG. 5 gradually decreases), but the change over time that occurs until t3 when the tension is stabilized. Is very small compared to the flying height due to air entrainment, and has little effect on the calculated variation.

S05での変化量の計算後,以後に実際に計測される膜厚の測定値を補正する(S06)。つまり,実際に測定して得られた値(図5中の測定生値)から変化量を差し引いて,その変化量に伴う測定誤差をキャンセルした値(図5中の補正値)を出力する。これにより,張力が安定したと判断できるタイミングt3以降は,空気巻き込みによる影響を除いた値を測定値とすることができ,測定誤差が小さくなることが期待できる。   After the change amount is calculated in S05, the measured value of the film thickness actually measured thereafter is corrected (S06). That is, the amount of change is subtracted from the value actually measured (measured raw value in FIG. 5), and the value (corrected value in FIG. 5) obtained by canceling the measurement error associated with the amount of change is output. Thereby, after the timing t3 when it can be determined that the tension is stabilized, a value excluding the influence of air entrainment can be set as the measurement value, and it can be expected that the measurement error is reduced.

また,測定値は,プレス部4でのプレス工程時におけるプレスロールのロール径ばらつきや,ダイ塗工工程におけるバックアップロールのロール径ばらつきによる周期的な変化(図5中の測定生値が波状となる変化)の影響を受ける。そこで,制御装置50は,この周期的な変化量をあらかじめ記憶しておいてもよい。この場合,S06の補正では,この周期的な変化量を,タイミングt3までに取得し,それら加工周期による変化量と同期をとって膜厚を補正してもよい。これにより,加工周期(短距離)での品質ばらつきやロット内(長距離)での品質ばらつきを踏まえて,より適切な膜厚の経時変化を計ることが期待できる。   In addition, the measured value is a cyclic change due to the roll diameter variation of the press roll during the pressing process in the press unit 4 and the roll diameter variation of the backup roll in the die coating process (the measured raw value in FIG. To be affected. Therefore, the control device 50 may store the periodic change amount in advance. In this case, in the correction of S06, the periodic change amount may be acquired by timing t3, and the film thickness may be corrected in synchronization with the change amount due to the machining cycle. As a result, it is expected that a more appropriate change in film thickness over time can be measured based on the quality variation in the processing cycle (short distance) and the quality variation in the lot (long distance).

[基準ローラ]
続いて,測定精度をより高めるための,基準ローラ31の構成について説明する。
[Reference roller]
Next, the configuration of the reference roller 31 for further increasing the measurement accuracy will be described.

レーザ変位計のような光学式の変位計を利用して膜厚を測定するには,基準ローラ31の位置を正確に把握する必要がある。本形態では,基準ローラ31の位置をレーザ変位計41,44によって測定するが,例えば,乱反射成分を受光することによって測定対象物の位置を検出するレーザ変位計を利用する場合には,基準ローラ31の表面が鏡面仕上げされていると,乱反射成分が少なくなって計測誤差が大きくなる傾向にある。   In order to measure the film thickness using an optical displacement meter such as a laser displacement meter, it is necessary to accurately grasp the position of the reference roller 31. In this embodiment, the position of the reference roller 31 is measured by the laser displacement meters 41 and 44. For example, when using a laser displacement meter that detects the position of the measurement object by receiving diffuse reflection components, the reference roller 31 is used. If the surface of 31 is mirror-finished, the irregular reflection component tends to decrease and the measurement error tends to increase.

そこで,基準ローラ31の表面加工として,ローラ表面に鏡面を減らす仕上げ処理を施す。鏡面を減らす仕上げ処理には,例えば,アルミニウムの陽極酸化処理が該当する。この他,粗面化して艶を消したり,色を付けたりすることで,鏡面を減らすことができる。鏡面を減らすことによって乱反射成分が増え,基準ローラ31の位置を高精度に測定できる。   Therefore, as the surface processing of the reference roller 31, a finishing process for reducing the mirror surface is performed on the roller surface. An example of the finishing process for reducing the mirror surface is anodizing of aluminum. In addition, the mirror surface can be reduced by roughening and matting or coloring. By reducing the mirror surface, irregular reflection components increase, and the position of the reference roller 31 can be measured with high accuracy.

また,鏡面を減らす仕上げ処理として,例えば,微粒子によるショットピーニング処理(例えば,WPC処理)を施すとよい。微粒子によるショットピーニング処理では,艶を消しつつ面粗度の悪化を防ぐことができる。そのため,ウエブ20への転写傷を減らすことも期待できる。また,微粒子によるショットピーニング処理では,表面に無数の凹部が形成されることから,その凹部がウエブ20の搬送時に空気の逃げ道となる。そのため,高速搬送時の空気巻き込みによるウエブ20の浮上量も低減できる。従って,基準ローラ31の位置検出とウエブ20の位置検出とがともに高精度になることが期待できる。   Further, as a finishing process for reducing the mirror surface, for example, a shot peening process (for example, WPC process) using fine particles may be performed. The shot peening treatment with fine particles can prevent the surface roughness from deteriorating while matt. Therefore, it can be expected to reduce the transfer scratches on the web 20. Further, in the shot peening process using fine particles, innumerable concave portions are formed on the surface, and the concave portions serve as air escape paths when the web 20 is conveyed. Therefore, the flying height of the web 20 due to air entrainment during high-speed conveyance can also be reduced. Therefore, it can be expected that both the position detection of the reference roller 31 and the position detection of the web 20 are highly accurate.

以上詳細に説明したように本形態の膜厚測定装置100は,ウエブ20(被検膜)の厚さをオンライン測定するものであって,あらかじめ空気巻き込みの影響が少ない搬送速度v1での低速搬送期間中に,マスタ値を測定している。そして,生産目標の搬送速度v2に達した後に,オンライン測定の膜厚の計測値とそのマスタ値との差を変化量として求め,高速搬送中に得た膜厚の計測結果を,その変化量を用いて補正している。すなわち,膜厚測定装置100では,高速搬送中に得た膜厚の測定生値を,その変化量を用いて補正することで,変化量分の測定誤差をキャンセルしている。その結果として,測定精度の向上が期待できる。   As described in detail above, the film thickness measuring apparatus 100 according to the present embodiment measures the thickness of the web 20 (the film to be tested) online, and is transported at a low speed at a transport speed v1 that is less affected by air entrainment in advance. During the period, the master value is measured. Then, after reaching the conveyance speed v2 of the production target, the difference between the measured value of the film thickness of the online measurement and its master value is obtained as a change amount, and the measurement result of the film thickness obtained during the high-speed transfer is obtained as the change amount. It is corrected using. That is, the film thickness measuring apparatus 100 cancels the measurement error corresponding to the change amount by correcting the measurement raw value of the film thickness obtained during the high-speed conveyance by using the change amount. As a result, improvement in measurement accuracy can be expected.

また,本形態の膜厚測定装置100は,低速搬送期間に測定した値をマスタ値とすることで,すべてオンラインで行うことができる。すなわち,オフラインでの膜厚測定が必要ない。そのため,オフライン測定に伴う稼働率の低下は生じない。   Moreover, the film thickness measuring apparatus 100 of this embodiment can perform all on-line by making the value measured in the low-speed conveyance period into a master value. In other words, it is not necessary to measure the film thickness offline. For this reason, there is no reduction in operating rate due to offline measurement.

また,本形態の膜厚測定装置100は,4のレーザ変位計41,42,43,44を基準ローラ31上に固定し,各レーザ変位計は走査動作を行わない。そのため,走査動作に必要な機械構成は不要であり,機械構成がシンプルである。また,走査動作が必要な場合には,走査精度(例えば,走査ラインとローラ軸との平行度)の影響を受けるために高精度化が困難であるが,本形態の膜厚測定装置100にはそのような影響はない。   In the film thickness measuring apparatus 100 of this embodiment, the four laser displacement meters 41, 42, 43, and 44 are fixed on the reference roller 31, and each laser displacement meter does not perform a scanning operation. Therefore, the machine configuration necessary for the scanning operation is unnecessary, and the machine configuration is simple. In addition, when a scanning operation is necessary, it is difficult to achieve high accuracy because it is affected by scanning accuracy (for example, parallelism between a scanning line and a roller shaft). Has no such effect.

なお,本実施の形態は単なる例示にすぎず,本発明を何ら限定するものではない。したがって本発明は当然に,その要旨を逸脱しない範囲内で種々の改良,変形が可能である。例えば,実施の形態では,正極用の電極板の製造工程として説明したが,負極用の電極板であってもよい。また,電池用の電極板の製造工程に限らず,帯状の基材上に形成された薄膜の厚さを測定する用途に広く適用可能である。   Note that this embodiment is merely an example, and does not limit the present invention. Therefore, the present invention can naturally be improved and modified in various ways without departing from the gist thereof. For example, in the embodiment, the manufacturing process of the electrode plate for the positive electrode has been described, but the electrode plate for the negative electrode may be used. Further, the present invention is not limited to the manufacturing process of battery electrode plates, and can be widely applied to the use of measuring the thickness of a thin film formed on a strip-shaped substrate.

また,実施の形態では,マスタ値を低速搬送中のウエブ20のオンライン測定によって取得しているが,これに限るものではない。例えば,オフライン時に測定した膜厚をマスタ値として記憶しておいてもよい。この場合,搬送速度v1での低速搬送期間は不要となる。また,オフライン時の測定では,空気巻き込みによる影響を全く受けないことから,オンライン測定にてマスタ値を取得する実施の形態よりも,より高精度のマスタ値が得られる。   In the embodiment, the master value is acquired by online measurement of the web 20 during low-speed conveyance, but the present invention is not limited to this. For example, the film thickness measured off-line may be stored as a master value. In this case, the low-speed transport period at the transport speed v1 is unnecessary. In addition, since the offline measurement is not affected at all by air entrainment, a master value with higher accuracy can be obtained than in the embodiment in which the master value is acquired by online measurement.

また,実施の形態では,計測開始の加速時において,張力が安定するまでの間,膜厚をマスタ値としているが,計測終了の減速時においても,張力が不安定となることが予想される。そのため,計測終了時,張力が安定状態から不安定状態になったと判断した後,マスタ値を測定値として代用してもよい。   In the embodiment, the film thickness is a master value until the tension stabilizes at the acceleration of measurement start. However, it is expected that the tension becomes unstable even at the time of deceleration after the measurement. . For this reason, at the end of measurement, after determining that the tension has changed from a stable state to an unstable state, the master value may be substituted for the measured value.

6 膜厚測定部
20 ウエブ(被検膜)
21 アルミ箔
22 ペースト層
31 基準ローラ
32 駆動装置
41,44 レーザ変位計(第1変位計)
42,43 レーザ変位計(第2変位計)
46 張力検出器
50 制御装置
100 膜厚測定装置
6 Film thickness measuring unit 20 Web (film to be tested)
21 Aluminum foil 22 Paste layer 31 Reference roller 32 Driving device 41, 44 Laser displacement meter (first displacement meter)
42, 43 Laser displacement meter (second displacement meter)
46 Tension detector 50 Control device 100 Film thickness measuring device

Claims (13)

帯状をなす被検膜の厚さを測定する膜厚測定装置において,
前記被検膜を張架するローラである基準ローラ表面からの距離を測定する第1変位計と,前記基準ローラに張架された前記被検膜表面からの距離を測定する第2変位計とを有し,前記第1変位計および前記第2変位計の測定結果を基に前記被検膜の厚さを計算するオンライン計測部と,
前記被検膜の搬送速度が生産の目標速度に達する前に,前記被検膜の厚さの基準となるマスタ値を取得するマスタ取得部と,
前記マスタ値の取得後であって前記被検膜の搬送速度が前記目標速度に達した後に,前記オンライン計測部での計測値と前記マスタ値との差分を変化量として計算する変化量計算部と,
前記オンライン計測部での計測値を,前記変化量計算部で計算した変化量を用いて補正する補正部と,
を備えることを特徴とする膜厚測定装置。
In a film thickness measuring device that measures the thickness of a strip-shaped test film,
A first displacement meter that measures a distance from a surface of a reference roller that is a roller that stretches the test film; and a second displacement meter that measures a distance from the surface of the test film that is stretched by the reference roller; An on-line measuring unit that calculates the thickness of the test film based on the measurement results of the first displacement meter and the second displacement meter;
A master acquisition unit that acquires a master value serving as a reference for the thickness of the test film before the transport speed of the test film reaches the target production speed;
A change amount calculation unit that calculates the difference between the measurement value in the online measurement unit and the master value as a change amount after the acquisition of the master value and after the conveyance speed of the test film reaches the target speed When,
A correction unit that corrects the measurement value obtained by the online measurement unit using the variation calculated by the variation calculation unit;
A film thickness measuring apparatus comprising:
請求項1に記載する膜厚測定装置において,
前記マスタ取得部は,前記被検膜の搬送速度が,前記目標速度に達する前であって前記目標速度よりも遅い第2目標速度となっている期間内に,前記オンライン計測部で求めた計測値をマスタ値として取得することを特徴とする膜厚測定装置。
In the film thickness measuring device according to claim 1,
The master acquisition unit measures the measurement obtained by the online measurement unit during a period in which the transport speed of the test film reaches the target speed and is a second target speed that is slower than the target speed. A film thickness measuring apparatus for acquiring a value as a master value.
請求項1に記載する膜厚測定装置において,
前記マスタ取得部は,オフライン時に計測した被検膜の厚さをマスタ値として取得することを特徴とする膜厚測定装置。
In the film thickness measuring device according to claim 1,
The master acquisition unit acquires the thickness of the test film measured when offline as a master value.
請求項1から請求項3のいずれか1つに記載する膜厚測定装置において,
前記変化量計算部は,前記被検膜の搬送開始後であって前記被検膜の張力が一定となった後に,前記変化量を計算することを特徴とする膜厚測定装置。
In the film thickness measuring device according to any one of claims 1 to 3,
The change amount calculation unit calculates the change amount after the start of conveyance of the test film and after the tension of the test film becomes constant.
請求項4に記載する膜厚測定装置において,
前記マスタの取得後であって前記被検膜の張力が一定となるまでの間は,前記マスタ値を前記被検膜の厚さとして補正する第2補正部を備えることを特徴とする膜厚測定装置。
In the film thickness measuring device according to claim 4,
After the acquisition of the master, a second correction unit that corrects the master value as the thickness of the test film is provided until the tension of the test film becomes constant. measuring device.
請求項1から請求項5のいずれか1つに記載する膜厚測定装置において,
前記補正部は,前記基準ローラの搬送方向の移動量を検出し,前記被検膜の搬送方向の,前記基準ローラよりも上流側に位置する上位ローラの加工周期と同期をとって補正することを特徴とする膜厚測定装置。
In the film thickness measuring device according to any one of claims 1 to 5,
The correction unit detects the amount of movement of the reference roller in the conveyance direction, and corrects it in synchronization with the processing cycle of the upper roller positioned upstream of the reference roller in the conveyance direction of the film to be tested. A film thickness measuring device characterized by the above.
請求項1から請求項6のいずれか1つに記載する膜厚測定装置において,
前記第1変位計は,光学式の変位計であり,
前記基準ローラは,表面の鏡面を低減する仕上げ処理がなされていることを特徴とする膜厚測定装置。
In the film thickness measuring device according to any one of claims 1 to 6,
The first displacement meter is an optical displacement meter,
The film thickness measuring apparatus according to claim 1, wherein the reference roller is subjected to a finishing process to reduce a mirror surface.
請求項7に記載する膜厚測定装置において,
前記仕上げ処理は,微粒子を前記基準ローラの表面に投射する処理であることを特徴とする膜厚測定装置。
In the film thickness measuring device according to claim 7,
The film thickness measuring apparatus, wherein the finishing process is a process of projecting fine particles onto the surface of the reference roller.
帯状をなす被検膜の厚さを測定する膜厚測定方法において,
第1変位計にて,前記被検膜を張架するローラである基準ローラ表面からの距離を測定し,第2変位計にて,前記基準ローラに張架された前記被検膜表面からの距離を測定し,前記第1変位計および前記第2変位計の測定結果を基に前記被検膜の厚さを計算するオンライン計測ステップと,
前記被検膜の搬送速度が生産の目標速度に達する前に,前記被検膜の厚さの基準となるマスタ値を取得するマスタ取得ステップと,
前記マスタ値の取得後であって前記被検膜の搬送速度が前記目標速度に達した後に,前記オンライン計測ステップによる計測値と前記マスタ値との差分を変化量として計算する変化量計算ステップと,
前記オンライン計測ステップでの計測値を,前記変化量計算ステップで計算した変化量を用いて補正する補正ステップと,
を含むことを特徴とする膜厚測定方法。
In a film thickness measuring method for measuring the thickness of a test film having a strip shape,
The first displacement meter measures the distance from the reference roller surface, which is a roller for stretching the test film, and the second displacement meter measures the distance from the test film surface stretched on the reference roller. An on-line measurement step of measuring a distance and calculating the thickness of the test film based on the measurement results of the first displacement meter and the second displacement meter;
A master acquisition step of acquiring a master value serving as a reference for the thickness of the test film before the transport speed of the test film reaches the target production speed;
A change amount calculating step for calculating a difference between the measured value by the online measuring step and the master value as a change amount after the acquisition of the master value and the transport speed of the test film reaches the target speed; ,
A correction step for correcting the measurement value in the online measurement step using the variation calculated in the variation calculation step;
The film thickness measuring method characterized by including.
請求項9に記載する膜厚測定方法において,
前記マスタ取得ステップでは,前記被検膜の搬送速度が,前記目標速度に達する前であって前記目標速度よりも遅い第2目標速度となっている期間内に,前記オンライン計測ステップにて求めた計測値をマスタ値として取得することを特徴とする膜厚測定方法。
In the film thickness measuring method according to claim 9,
In the master acquisition step, the on-line measurement step was performed during a period in which the transport speed of the test film reached the second target speed that was lower than the target speed before reaching the target speed. A film thickness measuring method, wherein a measured value is acquired as a master value.
請求項9に記載する膜厚測定方法において,
前記マスタ取得ステップでは,オフライン時に計測した被検膜の厚さをマスタ値として取得することを特徴とする膜厚測定方法。
In the film thickness measuring method according to claim 9,
In the master acquisition step, the thickness of the film to be measured measured offline is acquired as a master value.
請求項9から請求項11のいずれか1つに記載する膜厚測定方法において,
前記変化量計算ステップでは,前記被検膜の搬送開始後であって前記被検膜の張力が一定となった後に,前記変化量を計算することを特徴とする膜厚測定方法。
In the film thickness measuring method according to any one of claims 9 to 11,
In the change amount calculating step, the change amount is calculated after the start of conveyance of the test film and after the tension of the test film becomes constant.
請求項12に記載する膜厚測定方法において,
前記マスタの取得後であって前記被検膜の張力が一定となるまでの間は,前記マスタ値を前記被検膜の厚さとして補正する第2補正ステップを含むことを特徴とする膜厚測定方法。
In the film thickness measuring method according to claim 12,
The film thickness includes a second correction step of correcting the master value as the thickness of the test film after the acquisition of the master and until the tension of the test film becomes constant. Measuring method.
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