JP2011027734A5 - - Google Patents
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- JP2011027734A5 JP2011027734A5 JP2010154432A JP2010154432A JP2011027734A5 JP 2011027734 A5 JP2011027734 A5 JP 2011027734A5 JP 2010154432 A JP2010154432 A JP 2010154432A JP 2010154432 A JP2010154432 A JP 2010154432A JP 2011027734 A5 JP2011027734 A5 JP 2011027734A5
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- JP
- Japan
- Prior art keywords
- characterizing
- feature value
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- determined
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 claims description 4
- 230000005855 radiation Effects 0.000 claims 2
- 238000011156 evaluation Methods 0.000 claims 1
- 238000007689 inspection Methods 0.000 claims 1
- 230000001678 irradiating effect Effects 0.000 claims 1
- 230000003287 optical effect Effects 0.000 claims 1
- 238000001454 recorded image Methods 0.000 claims 1
- 238000002310 reflectometry Methods 0.000 claims 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102009033110A DE102009033110A1 (de) | 2009-07-15 | 2009-07-15 | Vorrichtung zum Untersuchen strukturierter Oberflächen |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2011027734A JP2011027734A (ja) | 2011-02-10 |
| JP2011027734A5 true JP2011027734A5 (https=) | 2013-07-25 |
Family
ID=43402351
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010154432A Pending JP2011027734A (ja) | 2009-07-15 | 2010-07-07 | 肌理のある面の検査のための装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8355141B2 (https=) |
| JP (1) | JP2011027734A (https=) |
| CN (1) | CN101957187B (https=) |
| DE (1) | DE102009033110A1 (https=) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI425196B (zh) * | 2011-01-14 | 2014-02-01 | Chroma Ate Inc | Color and brightness uniform light source with the light source of the color sensor |
| CN102680095A (zh) * | 2011-03-08 | 2012-09-19 | 致茂电子(苏州)有限公司 | 色度及亮度均匀的光源及具该光源的色彩感测仪 |
| DE102011108599A1 (de) | 2011-07-27 | 2013-01-31 | Byk-Gardner Gmbh | Vorrichtung und Verfahren zur Untersuchung von Beschichtungen mit Effektpigmenten |
| US9408540B2 (en) * | 2012-02-27 | 2016-08-09 | Ovio Technologies, Inc. | Rotatable imaging system |
| US10171734B2 (en) | 2012-02-27 | 2019-01-01 | Ovio Technologies, Inc. | Rotatable imaging system |
| KR102037017B1 (ko) * | 2012-02-27 | 2019-11-26 | 오비오 테크놀로지즈, 인크. | 360°비디오 카메라 영상 시스템 |
| WO2013160243A1 (de) * | 2012-04-24 | 2013-10-31 | Basf Coatings Gmbh | Hdr-bilder als grundlage für die effektcharakterisierung |
| JP6452272B2 (ja) | 2013-02-22 | 2019-01-16 | セイコーエプソン株式会社 | 分光カメラ、及び分光画像処理方法 |
| DE102014108789B4 (de) * | 2014-06-24 | 2026-01-29 | Byk-Gardner Gmbh | Mehrstufiges Verfahren zur Untersuchung von Oberflächen sowie entsprechende Vorrichtung |
| DE102015100977A1 (de) * | 2015-01-23 | 2016-07-28 | Vorwerk & Co. Interholding Gmbh | Gerät zur Bearbeitung einer Oberfläche |
| JP6862229B2 (ja) * | 2017-03-15 | 2021-04-21 | キヤノン株式会社 | 解析装置、撮像装置、解析方法、および、プログラム |
| US10429174B2 (en) * | 2017-12-20 | 2019-10-01 | Texas Instruments Incorporated | Single wavelength reflection for leadframe brightness measurement |
| KR102599207B1 (ko) * | 2018-07-20 | 2023-12-15 | 삼성전자 주식회사 | 전자 디바이스의 표면 측정 장치 및 방법 |
| CN111397547A (zh) * | 2020-03-24 | 2020-07-10 | 杭州新汉杰科技有限公司 | 一种用于纺织面料熨烫后平整程度和方位的检测装置 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5155558A (en) * | 1990-09-19 | 1992-10-13 | E. I. Du Pont De Nemours And Company | Method and apparatus for analyzing the appearance features of a surface |
| US5712701A (en) * | 1995-03-06 | 1998-01-27 | Ade Optical Systems Corporation | Surface inspection system and method of inspecting surface of workpiece |
| DE19930688A1 (de) * | 1999-07-02 | 2001-01-04 | Byk Gardner Gmbh | Vorrichtung und Verfahren zur Bestimmung der Qualität von Oberflächen |
| JP2001205327A (ja) * | 2000-01-28 | 2001-07-31 | Sumitomo Metal Ind Ltd | 表面性状判別装置 |
| DE10336493A1 (de) * | 2003-08-08 | 2005-03-03 | Byk-Gardner Gmbh | Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften |
| US7145656B2 (en) * | 2003-12-15 | 2006-12-05 | E. I. Du Pont De Nemours And Company | Computer-implemented method for matching paint |
| DE102004034160A1 (de) * | 2004-07-15 | 2006-02-09 | Byk Gardner Gmbh | Vorrichtung zur Untersuchung optischer Oberflächeneigenschaften |
| WO2006052893A2 (en) * | 2004-11-08 | 2006-05-18 | Allergan, Inc. | Substituted pyrrolidone compounds as ep4 agonists |
| DE102004058408B4 (de) * | 2004-12-03 | 2013-10-31 | Byk Gardner Gmbh | Vorrichtung zur Bestimmung von Oberflächeneigenschaften |
| WO2007022212A2 (en) * | 2005-08-15 | 2007-02-22 | X-Rite, Incorporated | Spectrophotometer with temperatur corrected system response |
| JP2008190872A (ja) * | 2007-01-31 | 2008-08-21 | Toyota Motor Corp | 表面不良検出装置、方法及びプログラム |
| JP5430871B2 (ja) * | 2007-03-22 | 2014-03-05 | ベーユプスィロンカー−ガードネル ゲーエムベーハー | 表面特性の定量測定のための方法および装置 |
| JP2008249397A (ja) * | 2007-03-29 | 2008-10-16 | Toyota Motor Corp | 表面検査装置 |
-
2009
- 2009-07-15 DE DE102009033110A patent/DE102009033110A1/de active Pending
-
2010
- 2010-07-06 CN CN201010230911.5A patent/CN101957187B/zh active Active
- 2010-07-07 JP JP2010154432A patent/JP2011027734A/ja active Pending
- 2010-07-09 US US12/833,709 patent/US8355141B2/en active Active
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