JP2010539732A - 無極性および半極性の窒化物基板の面積を増加させる方法 - Google Patents
無極性および半極性の窒化物基板の面積を増加させる方法 Download PDFInfo
- Publication number
- JP2010539732A JP2010539732A JP2010526010A JP2010526010A JP2010539732A JP 2010539732 A JP2010539732 A JP 2010539732A JP 2010526010 A JP2010526010 A JP 2010526010A JP 2010526010 A JP2010526010 A JP 2010526010A JP 2010539732 A JP2010539732 A JP 2010539732A
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- Prior art keywords
- nitride
- semipolar
- nonpolar
- substrate
- gan
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Classifications
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
- H10D62/8503—Nitride Group III-V materials, e.g. AlN or GaN
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- H10P14/2908—
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- H10P14/2926—
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- H10P14/3416—
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- H10P14/36—
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Recrystallisation Techniques (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US97365607P | 2007-09-19 | 2007-09-19 | |
| PCT/US2008/077072 WO2009039408A1 (en) | 2007-09-19 | 2008-09-19 | Method for increasing the area of non-polar and semi-polar nitride substrates |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2010539732A true JP2010539732A (ja) | 2010-12-16 |
| JP2010539732A5 JP2010539732A5 (enExample) | 2012-11-01 |
Family
ID=40453547
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010526010A Pending JP2010539732A (ja) | 2007-09-19 | 2008-09-19 | 無極性および半極性の窒化物基板の面積を増加させる方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US8080469B2 (enExample) |
| JP (1) | JP2010539732A (enExample) |
| KR (1) | KR20100067114A (enExample) |
| WO (1) | WO2009039408A1 (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9130119B2 (en) * | 2006-12-11 | 2015-09-08 | The Regents Of The University Of California | Non-polar and semi-polar light emitting devices |
| JP5743127B2 (ja) * | 2005-06-01 | 2015-07-01 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | 半極性(Ga,Al,In,B)N薄膜、ヘテロ構造およびデバイスの成長と作製のための方法及び装置 |
| WO2008073385A1 (en) | 2006-12-11 | 2008-06-19 | The Regents Of The University Of California | Metalorganic chemical vapor deposition (mocvd) growth of high performance non-polar iii-nitride optical devices |
| KR20100067114A (ko) * | 2007-09-19 | 2010-06-18 | 더 리전츠 오브 더 유니버시티 오브 캘리포니아 | 비극성 및 반극성 질화물 기판들의 면적을 증가하기 위한 방법 |
| KR101502195B1 (ko) * | 2007-11-21 | 2015-03-12 | 미쓰비시 가가꾸 가부시키가이샤 | 질화물 반도체 및 질화물 반도체의 결정 성장 방법 그리고 질화물 반도체 발광 소자 |
| JP5573225B2 (ja) * | 2010-02-26 | 2014-08-20 | 三菱化学株式会社 | 第13族金属窒化物結晶の製造方法、該製造方法により得られる第13族金属窒化物結晶および半導体デバイスの製造方法 |
| WO2011109754A1 (en) * | 2010-03-04 | 2011-09-09 | The Regents Of The University Of California | Semi-polar iii-nitride optoelectronic devices on m-plane substrates with miscuts less than +/-15 degrees in the c-direction |
| JP2012136418A (ja) * | 2010-12-01 | 2012-07-19 | Mitsubishi Chemicals Corp | Iii族窒化物半導体基板とその製造方法 |
| JP5830973B2 (ja) * | 2010-12-01 | 2015-12-09 | 三菱化学株式会社 | GaN自立基板および半導体発光デバイスの製造方法 |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002029897A (ja) * | 2000-07-10 | 2002-01-29 | Sumitomo Electric Ind Ltd | 単結晶GaN基板の製造方法と単結晶GaN基板 |
| JP2003112999A (ja) * | 2001-10-03 | 2003-04-18 | Matsushita Electric Ind Co Ltd | 半導体基板、半導体装置及びそれらの製造方法並びに結晶成長方法 |
| JP2005522889A (ja) * | 2002-04-15 | 2005-07-28 | ザ リージェント オブ ザ ユニバーシティ オブ カリフォルニア | 金属・有機化学気相成長によって成長した非極性a平面窒化ガリウム薄膜 |
| JP2005320237A (ja) * | 2004-05-07 | 2005-11-17 | Samsung Corning Co Ltd | 非極性a面窒化物半導体単結晶基板およびその製造方法 |
| WO2006099138A2 (en) * | 2005-03-10 | 2006-09-21 | The Regents Of The University Of California | Technique for the growth of planar semi-polar gallium nitride |
| WO2006130696A2 (en) * | 2005-06-01 | 2006-12-07 | The Regents Of The University Of California | Technique for the growth and fabrication of semipolar (ga,al,in,b)n thin films, heterostructures, and devices |
| WO2007029655A1 (ja) * | 2005-09-05 | 2007-03-15 | Matsushita Electric Industrial Co., Ltd. | 六方晶系窒化物単結晶の製造方法、六方晶系窒化物半導体結晶及び六方晶系窒化物単結晶ウエハの製造方法 |
| WO2007084782A2 (en) * | 2006-01-20 | 2007-07-26 | The Regents Of The University Of California | Method for improved growth of semipolar (al,in,ga,b)n |
| WO2007095137A2 (en) * | 2006-02-10 | 2007-08-23 | The Regents Of The University Of California | Method for conductivity control of (al,in,ga,b)n |
| JP2007524983A (ja) * | 2003-04-15 | 2007-08-30 | ザ・レジェンツ・オブ・ザ・ユニバーシティ・オブ・カリフォルニア | 非極性(Al、B、In、Ga)N量子井戸 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6218280B1 (en) * | 1998-06-18 | 2001-04-17 | University Of Florida | Method and apparatus for producing group-III nitrides |
| JP3592553B2 (ja) * | 1998-10-15 | 2004-11-24 | 株式会社東芝 | 窒化ガリウム系半導体装置 |
| US20010047751A1 (en) * | 1998-11-24 | 2001-12-06 | Andrew Y. Kim | Method of producing device quality (a1) ingap alloys on lattice-mismatched substrates |
| JP3761418B2 (ja) * | 2001-05-10 | 2006-03-29 | Hoya株式会社 | 化合物結晶およびその製造法 |
| US7501023B2 (en) * | 2001-07-06 | 2009-03-10 | Technologies And Devices, International, Inc. | Method and apparatus for fabricating crack-free Group III nitride semiconductor materials |
| US7105865B2 (en) * | 2001-09-19 | 2006-09-12 | Sumitomo Electric Industries, Ltd. | AlxInyGa1−x−yN mixture crystal substrate |
| US7118813B2 (en) * | 2003-11-14 | 2006-10-10 | Cree, Inc. | Vicinal gallium nitride substrate for high quality homoepitaxy |
| US7432142B2 (en) * | 2004-05-20 | 2008-10-07 | Cree, Inc. | Methods of fabricating nitride-based transistors having regrown ohmic contact regions |
| US7342642B2 (en) * | 2005-06-20 | 2008-03-11 | Asml Netherlands B.V. | Pre-aligning a substrate in a lithographic apparatus, device manufacturing method, and device manufactured by the manufacturing method |
| WO2009035648A1 (en) * | 2007-09-14 | 2009-03-19 | Kyma Technologies, Inc. | Non-polar and semi-polar gan substrates, devices, and methods for making them |
| KR20100067114A (ko) * | 2007-09-19 | 2010-06-18 | 더 리전츠 오브 더 유니버시티 오브 캘리포니아 | 비극성 및 반극성 질화물 기판들의 면적을 증가하기 위한 방법 |
-
2008
- 2008-09-19 KR KR1020107008223A patent/KR20100067114A/ko not_active Ceased
- 2008-09-19 WO PCT/US2008/077072 patent/WO2009039408A1/en not_active Ceased
- 2008-09-19 JP JP2010526010A patent/JP2010539732A/ja active Pending
- 2008-09-19 US US12/234,340 patent/US8080469B2/en active Active
-
2011
- 2011-12-15 US US13/327,521 patent/US8729671B2/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002029897A (ja) * | 2000-07-10 | 2002-01-29 | Sumitomo Electric Ind Ltd | 単結晶GaN基板の製造方法と単結晶GaN基板 |
| JP2003112999A (ja) * | 2001-10-03 | 2003-04-18 | Matsushita Electric Ind Co Ltd | 半導体基板、半導体装置及びそれらの製造方法並びに結晶成長方法 |
| JP2005522889A (ja) * | 2002-04-15 | 2005-07-28 | ザ リージェント オブ ザ ユニバーシティ オブ カリフォルニア | 金属・有機化学気相成長によって成長した非極性a平面窒化ガリウム薄膜 |
| JP2007524983A (ja) * | 2003-04-15 | 2007-08-30 | ザ・レジェンツ・オブ・ザ・ユニバーシティ・オブ・カリフォルニア | 非極性(Al、B、In、Ga)N量子井戸 |
| JP2005320237A (ja) * | 2004-05-07 | 2005-11-17 | Samsung Corning Co Ltd | 非極性a面窒化物半導体単結晶基板およびその製造方法 |
| WO2006099138A2 (en) * | 2005-03-10 | 2006-09-21 | The Regents Of The University Of California | Technique for the growth of planar semi-polar gallium nitride |
| WO2006130696A2 (en) * | 2005-06-01 | 2006-12-07 | The Regents Of The University Of California | Technique for the growth and fabrication of semipolar (ga,al,in,b)n thin films, heterostructures, and devices |
| JP2008543089A (ja) * | 2005-06-01 | 2008-11-27 | ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア | 半極性(Ga,Al,In,B)N薄膜、ヘテロ構造およびデバイスの成長と作製のための方法及び装置 |
| WO2007029655A1 (ja) * | 2005-09-05 | 2007-03-15 | Matsushita Electric Industrial Co., Ltd. | 六方晶系窒化物単結晶の製造方法、六方晶系窒化物半導体結晶及び六方晶系窒化物単結晶ウエハの製造方法 |
| WO2007084782A2 (en) * | 2006-01-20 | 2007-07-26 | The Regents Of The University Of California | Method for improved growth of semipolar (al,in,ga,b)n |
| WO2007095137A2 (en) * | 2006-02-10 | 2007-08-23 | The Regents Of The University Of California | Method for conductivity control of (al,in,ga,b)n |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20100067114A (ko) | 2010-06-18 |
| US8080469B2 (en) | 2011-12-20 |
| US20120086106A1 (en) | 2012-04-12 |
| US8729671B2 (en) | 2014-05-20 |
| WO2009039408A1 (en) | 2009-03-26 |
| US20090072353A1 (en) | 2009-03-19 |
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