JP2010254810A5 - - Google Patents

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JP2010254810A5
JP2010254810A5 JP2009106618A JP2009106618A JP2010254810A5 JP 2010254810 A5 JP2010254810 A5 JP 2010254810A5 JP 2009106618 A JP2009106618 A JP 2009106618A JP 2009106618 A JP2009106618 A JP 2009106618A JP 2010254810 A5 JP2010254810 A5 JP 2010254810A5
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前記課題を解決するために、本発明の重合体の製造方法は、2種以上の単量体α〜α(ただし、nは2以上の整数を表す。)を重合して、構成単位α’〜α’(ただし、α’〜α’は単量体α〜αからそれぞれ導かれる構成単位を表す。)からなる重合体(P)を製造する方法であって、予め反応器内に、前記単量体α〜αを第1の組成で含有する第1の溶液を仕込む工程と、該反応器内に前記単量体α〜αを第2の組成で含有する第2の溶液を滴下する工程と、前記第2の溶液を滴下する工程が終了した後に重合温度で保持する工程更に有し、前記第2の組成は、重合体(P)における構成単位α’〜α’の含有比率の目標値を表わす設計組成と同じであり、前記第1の組成は、該設計組成と、重合に用いられる各単量体の反応性を加味して予め求められた組成である。

In order to solve the above-mentioned problems, the polymer production method of the present invention polymerizes two or more kinds of monomers α 1 to α n (where n represents an integer of 2 or more) to form a structural unit. It is a method for producing a polymer (P) comprising α ′ 1 to α ′ n (where α ′ 1 to α ′ n represent structural units derived from monomers α 1 to α n , respectively). A step of previously charging the reactor with a first solution containing the monomers α 1 to α n in a first composition, and a second step of charging the monomers α 1 to α n into the reactor. a step of dropping a second solution containing the composition of said second solution further includes a step of maintaining the polymerization temperature after the step of addition was terminated, the second composition, the polymer (P ) is the same as the design composition representing a target value of the content ratio of the constituent unit alpha '1 to?' n in the first composition, and the design composition, et employed in the polymerization It obtained in advance composition in consideration of the reactivity of each monomer that.

Claims (6)

2種以上の単量体α〜α(ただし、nは2以上の整数を表す。)を重合して、構成単位α’〜α’(ただし、α’〜α’は単量体α〜αからそれぞれ導かれる構成単位を表す。)からなる重合体(P)を製造する方法であって、
予め反応器内に、前記単量体α〜αを第1の組成で含有する第1の溶液を仕込む工程と、該反応器内に前記単量体α〜αを第2の組成で含有する第2の溶液を滴下する工程と、前記第2の溶液を滴下する工程が終了した後に重合温度で保持する工程更に有し、
前記第2の組成は、重合体(P)における構成単位α’〜α’の含有比率の目標値を表わす設計組成と同じであり、
前記第1の組成は、該設計組成と、重合に用いられる各単量体の反応性を加味して予め求められた組成である、重合体の製造方法。
Two or more types of monomers α 1 to α n (where n represents an integer of 2 or more) are polymerized to form structural units α ′ 1 to α ′ n (where α ′ 1 to α ′ n are A method for producing a polymer (P) consisting of structural units derived from monomers α 1 to α n .
Advance in the reactor, said a step of charging a first solution containing the monomer alpha 1 to? N in the first composition, the reactor in the monomer alpha 1 to? N of the second further comprising a step of dropping a second solution containing a composition, the process step of dropping said second solution is held at polymerization temperature after completion,
The second composition is the same as the design composition representing the target value of the content ratio of the structural units α ′ 1 to α ′ n in the polymer (P),
The said 1st composition is a manufacturing method of a polymer which is a composition calculated | required previously in consideration of this design composition and the reactivity of each monomer used for superposition | polymerization.
前記重合体(P)における設計組成(単位:モル%)が、α’:α’:…:α’であるとき、第1の組成(単位:モル%)をα:α:…:αで表わし、下記(1)〜(3)の方法で求められるファクターをF、F、…Fで表わすと、α=α’/F、α=α’/F、…α=α’/Fである、請求項1記載の重合体の製造方法。
(1)まず単量体組成が設計組成α’:α’:…:α’と同じである単量体混合物と溶剤を含有する滴下溶液を、溶剤のみを入れた反応器内に一定の滴下速度で滴下し、滴下開始からの経過時間がt、t、t…のときに、それぞれ反応器内に残存している単量体α〜αの組成(単位:モル%)M:M:…:Mと、tからtまでの間、tからtまでの間、…にそれぞれ生成した重合体における構成単位α’〜α’の比率(単位:モル%)P:P:…:Pを求める。
(2)前記P:P:…:Pが、設計組成α’:α’:…:α’に最も近い時間帯「tからtm+1までの間(mは1以上の整数。)」を見つける。
(3)該「tからtm+1までの間」におけるP:P:…:Pの値と、経過時間tにおけるM:M:…:Mの値とから、下記式により、ファクターF、F、…Fを求める。F=P/M、F=P/M、…F=P/M
When the design composition (unit: mol%) in the polymer (P) is α ′ 1 : α ′ 2 :...: Α ′ n , the first composition (unit: mol%) is α 1 : α 2. :...: When expressed by α n and the factors obtained by the following methods (1) to (3) are expressed by F 1 , F 2 ,... F n , α 1 = α ′ 1 / F 1 , α 2 = α The method for producing a polymer according to claim 1, wherein “ 2 / F 2 ,... Α n = α ′ n / F n .
(1) First, a monomer solution whose monomer composition is the same as the design composition α ′ 1 : α ′ 2 :...: Α ′ n and a dropping solution containing a solvent are placed in a reactor containing only the solvent. The composition of the monomers α 1 to α n remaining in the reactor when the elapsed time from the start of dropping is t 1 , t 2 , t 3 . Mol%) M 1 : M 2 :...: M n and constitutional units α ′ 1 to α ′ n in the polymer produced between t 1 and t 2 , t 2 to t 3 , respectively. Ratio (unit: mol%) P 1 : P 2 :...: P n is determined.
(2) the P 1: P 2: ...: P n is, designed composition α '1: α' 2: ...: α ' between the closest time zone n from "t m to t m + 1 (m is 1 or more Find an integer.)
(3) From the value of P 1 : P 2 :...: P n in “between t m and t m + 1 ” and the value of M 1 : M 2 :...: M n at the elapsed time t m , Factors F 1 , F 2 ,... F n are obtained from the equations. F 1 = P 1 / M 1 , F 2 = P 2 / M 2 ,... F n = P n / M n .
前記(1)で用いた滴下溶液に最初に含まれていた単量体の合計量に対する、上記経過時間tにおいて、反応器内に存在する単量体の合計量の割合W(単位:質量%)を求め、前記第1の溶液に含まれる単量体の合計量と、第2の溶液に含まれる単量体の合計量との質量比(第1の溶液:第2の溶液)をW:(100−W)とする、請求項2記載の重合体の製造方法。 The ratio W 0 (unit: total amount of monomers present in the reactor at the elapsed time t m to the total amount of monomers initially contained in the dropping solution used in (1) above. Mass%), and a mass ratio of the total amount of monomers contained in the first solution and the total amount of monomers contained in the second solution (first solution: second solution). the W 0: (100-W 0 ) to method for producing a polymer of claim 2 wherein. 請求項1〜3のいずれか一項に記載の製造方法により得られるレジスト用重合体。   The resist polymer obtained by the manufacturing method as described in any one of Claims 1-3. 請求項4に記載のレジスト用重合体、および活性光線又は放射線の照射により酸を発生する化合物を含有するレジスト組成物。   A resist composition comprising the resist polymer according to claim 4 and a compound capable of generating an acid upon irradiation with actinic rays or radiation. 請求項5に記載のレジスト組成物を、基板の被加工面上に塗布してレジスト膜を形成する工程と、該レジスト膜に対して、露光する工程と、露光されたレジスト膜を現像液を用いて現像する工程とを含む、パターンが形成された基板の製造方法。   A step of applying the resist composition according to claim 5 on a processed surface of a substrate to form a resist film, a step of exposing the resist film, and a step of exposing the exposed resist film to a developer. And a step of developing using the method.
JP2009106618A 2009-04-24 2009-04-24 Method for producing polymer, method for producing resist composition, and method for producing substrate Active JP5394119B2 (en)

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KR20120031053A (en) * 2009-07-07 2012-03-29 미츠비시 레이온 가부시키가이샤 Copolymer for lithography and method for evaluating same
JP5707699B2 (en) * 2009-12-28 2015-04-30 三菱レイヨン株式会社 Method for producing polymer, method for producing resist composition, and method for producing substrate
JP2012109039A (en) 2010-11-15 2012-06-07 Yazaki Corp Terminal connection structure
JP2012145868A (en) * 2011-01-14 2012-08-02 Tokyo Ohka Kogyo Co Ltd Resist composition and method for forming resist pattern
TWI584063B (en) * 2012-03-05 2017-05-21 三菱麗陽股份有限公司 Method for manufacturing copolymer for lithography
JP5942562B2 (en) * 2012-04-18 2016-06-29 三菱レイヨン株式会社 Method for producing polymer, method for producing resist composition, and method for producing substrate on which pattern is formed
JP5942564B2 (en) * 2012-04-18 2016-06-29 三菱レイヨン株式会社 Method for producing polymer, method for producing resist composition, and method for producing substrate on which pattern is formed
WO2015033960A1 (en) * 2013-09-03 2015-03-12 三菱レイヨン株式会社 Copolymer for semiconductor lithography, resist composition, and substrate production method
JP6318937B2 (en) * 2014-07-15 2018-05-09 Jsr株式会社 Radiation-sensitive resin composition and resist pattern forming method

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