JP2010243526A - Electro-optical device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an electro-optical device provided with inspection terminals capable of easily detecting formation defects of various lines. <P>SOLUTION: The electro-optical device 10 includes: a switching element 36 for video signal selection which selectively connects an arbitrary source line 28 to one of a plurality of video signal supply lines 41; a scan signal selection element 35 which selectively connects an arbitrary gate line to one of a plurality of scan signal supply lines 43; a plurality of external signal connection terminals 39; and a plurality of inspection terminals. Inspection switching elements 37 are connected to each of the plurality of video signal supply lines, and the plurality of inspection switching elements 37 have input terminal sides connected in parallel and connected to a first inspection terminal T1 and have control terminal sides connected in parallel and connected to a second inspection terminal T2, and a plurality of color selection signal supply lines 42 are connected to a plurality of third inspection terminals T3, and the plurality of scan signal supply lines 43 are connected to a plurality of fourth inspection terminals T4. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

The present invention relates to an electro-optical device used for a display device of an electronic device such as a personal computer, a mobile phone, and a portable information terminal. Specifically, the present invention relates to an electro-optical device provided with an inspection terminal that can easily detect formation defects of various wirings.

In recent years, electro-optical devices such as liquid crystal display devices, organic EL display devices, and plasma displays are often used as display devices. Thin film transistors (TFTs) as switching elements for driving pixels in conventional electro-optical devices include those using amorphous silicon (hereinafter referred to as “a-Si”) as a semiconductor layer, and polysilicon (hereinafter referred to as “a-Si”). , "P-Si") is known. In addition, TFTs using p-Si include those manufactured at high temperatures and those manufactured at low temperatures.

TFT using p-Si manufactured at a low temperature (hereinafter referred to as “LTPS-TFT”) is manufactured by polycrystallizing a-Si formed on a transparent glass substrate by excimer laser annealing (ELA) or the like. It is what is done. Since this LTPS-TFT can be manufactured at a low temperature of 400 ° C. to 600 ° C., not only a pixel driving TFT but also a driver circuit and the like can be simultaneously formed on a glass substrate. In addition, since p-Si has a property of higher carrier mobility than a-Si, it is possible to reduce the size of the TFT, so that the electro-optic with high response speed and high resolution can be achieved while narrowing the frame. It has the merit that a device can be manufactured.

Among conventional electro-optical devices using LTPS-TFTs, a display device having an external driver IC has scanning line driver ICs built in on both sides of the display area as disclosed in Patent Document 1 below. Therefore, the number of terminals connected to the outside is as small as several tens and the terminal pitch is rough. Therefore, it is relatively easy to inspect the array substrate and the assembled panel. Therefore, in the case of a driver IC mounting model (COG: Chip on glass model), the driver IC
If an inspection terminal is provided next to the connection terminal and an inspection signal and an inspection power supply are input to the inspection terminal, the electro-optical device can be easily inspected (see Patent Documents 2 and 3 below).

An example of a liquid crystal display device as an electro-optical device in which an inspection terminal is formed beside such a conventional driver IC connection terminal will be described with reference to FIG. FIG. 4 is an enlarged plan view of the protruding portion of the array substrate of the liquid crystal display device disclosed in Patent Document 3 below. A signal line 51 and an external signal connection terminal 52 are formed on the protruding portion 50 of the array substrate. Each signal line 51 is defined by a striped color filter layer provided on the opposite color filter substrate side, for example, a red (R) subpixel, a green (G) subpixel, a blue (B) subpixel, or the like. And extends beyond the connection terminal portion 54 to the driver IC 53 to the inside of the mounting region 55. A plurality of signal lines 51
The end positions 56r, 56g, and 56b are different for each corresponding sub-pixel color. For example, in the signal line 51 shown in FIG. 4, the signal line 51R corresponding to the R sub-pixel is extended the longest, and then the signal line 51B corresponding to the B sub-pixel is extended long. The signal line 51G corresponding to the pixel extends the shortest.

Thus, by changing the end position for each corresponding sub-pixel color, the color to be displayed can be changed depending on the contact position of the inspection jig. For example, in the configuration example shown in FIG. 4, when an inspection jig is brought into contact with the end position 56r of the signal line 51R corresponding to the R sub-pixel while supplying current to all the routing wirings, the R sub-pixel Since only the light is on, the display surface is displayed in red. In addition, when current is supplied to all the lead wirings and the inspection jig is brought into contact with the end position 56b of the signal line 51B corresponding to the B sub pixel, the R sub pixel and the B sub pixel are turned on. The display surface is purple. Further, when current is supplied to all the lead wires and the inspection jig is brought into contact with the end position 56g of the signal line 51G corresponding to the G subpixel, all of the R subpixel, the G subpixel, and the B subpixel are all brought into contact with each other. Since is lit, the display surface is white. Therefore, according to the terminal arrangement shown in FIG. 4, it is possible to easily determine the presence or absence of a disconnection or a short in the signal line, and to obtain an effect that a more detailed inspection result can be obtained. is there.

JP 2008-046649 A JP 2007-057641 A JP 2007-147949 A

However, with the recent miniaturization and high definition of the electro-optical device, the width of the connection terminal portion of the driver IC and the pitch between the connection terminal portions are becoming narrower, which increases the cost of the inspection probe. In some cases, high-precision inspection probe alignment may be required. Therefore, the time and cost required for the inspection of the electro-optical device increases, and
There has been a problem that an apparatus for aligning the inspection probe may be required.

The present invention has been made to solve such problems of the prior art, and reduces the number of inspection terminals to widen the width of the inspection terminals, so that the flexible wiring board is inexpensive as an inspection probe. An object of the present invention is to provide an electro-optical device provided with an inspection terminal that enables the use of (FPC: Flexible Printed Circuit) and makes it easy to determine the presence or absence of disconnections or shorts in all signal lines. To do.

In order to achieve the above object, an electro-optical device of the present invention includes:
An array substrate including a plurality of gate lines, a plurality of source lines, and pixel drive switching elements provided corresponding to intersections of the gate lines and the source lines;
A plurality of video signal supply wirings to which external video signals are supplied, and a plurality of color selection signal supply wirings to which external color selection signals are supplied, formed on the periphery of the array substrate;
A plurality of scanning signal supply lines to which scanning signals from the outside are supplied;
A video signal selection switching element that is connected to the plurality of source lines and selectively connects an arbitrary source line to one of the plurality of video signal supply wirings;
A scanning signal selection element that is connected to the plurality of gate lines and selectively connects an arbitrary gate line to one of the plurality of scanning signal supply wirings;
A plurality of external signal connection terminals and a plurality of inspection terminals;
In an electro-optical device comprising:
An inspection switching element is connected to each of the plurality of video signal supply wirings,
The plurality of inspection switching elements are connected to the first inspection terminal on the input terminal side in parallel with each other, connected to the second inspection terminal on the control terminal side in parallel with each other,
The plurality of color selection signal supply wirings are respectively connected to a plurality of third inspection terminals,
The plurality of scanning signal supply wirings are connected to a plurality of fourth inspection terminals, respectively.
It is characterized by that.

In an electro-optical device such as a liquid crystal display device, an EL display device, or a plasma display device, a plurality of video signal supply wirings to which an external video signal is supplied and a plurality of colors to which an external color selection signal is supplied A selection signal supply wiring and a plurality of scanning signal supply wirings to which a scanning signal from the outside is supplied are provided. These wirings are connected to one of arbitrary source lines or one of arbitrary gate lines by video signal selection switching elements or scanning signal selection elements, respectively, thereby performing predetermined image display. The video signal selection switching element may be referred to as a source circuit or horizontal driver circuit, and the scanning signal selection element may be referred to as a gate circuit or vertical driver circuit.

In the electro-optical device, for example, unit pixels (also referred to as one pixel) are formed by sub-pixels (also referred to as sub-pixels) of three colors of red (R), green (G), and blue (B) that are the three primary colors of light. There are a lot of things. Therefore, normally, the plurality of color selection signal supply wirings are composed of three wirings for selecting one of R, G, and B. In addition, since the video signal supply wiring exists at least in the number of unit pixels in the row direction of the electro-optical device, the video signal selection switching element is formed in at least the number of unit pixels in the row direction of the electro-optical device. In addition, there are at least as many gate lines as the number of pixels in the column direction of the electro-optical device. Usually, a scanning signal is selected by a scanning signal selection element composed of a shift register, and scanning signals are supplied. Therefore, the number of scanning signal supply wirings is significantly smaller than the number of gate lines.

In the electro-optical device of the present invention, an inspection switching element is connected to each of the plurality of video signal supply wirings, and the plurality of the inspection switching elements are connected in parallel to each other at the input terminal side to perform the first inspection. The control terminal side is connected in parallel to each other and connected to the second inspection terminal. Therefore, the plurality of inspection switching elements can be uniformly controlled by a control signal input to the second inspection terminal which is one terminal.
Therefore, in the electro-optical device of the present invention, at least the plurality of video signal supply wirings formed by the number of unit pixels in the row direction of the electro-optical device are uniformly determined by the control signal input to the second inspection terminal. It can be connected to or disconnected from the first inspection terminal which is one terminal.

In the electro-optical device according to the aspect of the invention, the plurality of color selection signal supply wirings are connected to the plurality of third inspection terminals, respectively, and the plurality of scanning signal supply wirings are connected to the plurality of fourth inspection terminals, respectively. Therefore, it is possible to select a sub-pixel column of an arbitrary color and a gate line of an arbitrary row by a control signal input to the third inspection terminal and the fourth inspection terminal. Therefore, according to the electro-optical device of the present invention, it is possible to inspect the degree of color development for every arbitrary column, every arbitrary color, and every arbitrary row with only a very small number of inspection terminals. It becomes like this. In addition, it is preferable to supply a power supply and a common signal simultaneously from the inspection terminal.

Moreover, in the electro-optical device of the present invention, since the number of inspection terminals is small, the width of the inspection terminals and the pitch between the inspection terminals can be increased. Therefore, according to the electro-optical device of the present invention, an inexpensive and large FPC can be used as an inspection probe at the time of panel inspection, and the alignment and replacement of the inspection probe are simple and maintenance is easy. In addition, the inspection of the array substrate at the time of manufacture can be performed with a conventional and relatively inexpensive probe. Note that the electro-optical device of the present invention is equally applicable to various matrix display devices such as a liquid crystal display device, an EL display device, a plasma display device, and a field emission display device.

In the electro-optical device according to the aspect of the invention, the plurality of video signal supply lines, the plurality of color selection signal supply lines, and the plurality of scanning signal supply lines may include the external signal connection terminal and the video signal selection switching. It is preferable to be connected to a mounting terminal of a driver IC formed between the elements.

The number of video signal supply lines is particularly large because at least the number of unit pixels in the row direction of the electro-optical device is formed. In addition, a plurality of video signal supply lines include a plurality of color selection signal supply lines and a plurality of scanning signal supply lines. Since the number becomes very large, it is difficult to connect to the outside as it is.
According to the electro-optical device of the present invention, the plurality of video signal supply lines, the plurality of color selection signal supply lines, and the plurality of scanning signal supply lines are connected to the external signal connection terminal via the driver IC. The number of terminals for external connection can be greatly reduced, and connection with the outside becomes easy.

In the electro-optical device according to the aspect of the invention, it is preferable that the plurality of inspection switching elements are disposed between the driver IC and the plurality of video signal selection switching elements in a plan view.

According to the electro-optical device of the present invention, since the plurality of inspection switching elements are present in the same number as the plurality of video signal supply wirings, the driver IC and the plurality of video signal selections are viewed in plan view. Since the number of intersections with other wirings is reduced, the disconnection failure or the short-circuit failure due to the intersection can be suppressed.

In the electro-optical device of the invention, the first inspection terminal and the second inspection terminal are
It is preferable that a corresponding connection terminal is formed adjacent to the external signal connection terminal.

In the electro-optical device of the present invention, since the plurality of inspection switching elements are in a floating state during normal image display, the video signal may leak through the inspection switching element. However, in the electro-optical device of the present invention, the connection terminals corresponding to the first inspection terminal and the second inspection terminal are formed adjacent to the external signal connection terminal, so that the inspection switching element can be used during normal image display. A fixed voltage that is always off can be applied. Therefore, according to the electro-optical device of the present invention, the leakage of the video signal can be reduced, and an electro-optical device with good display image quality can be obtained.

In the electro-optical device according to the aspect of the invention, the pixel driving switching element, the video signal selection switching element, the scanning signal selection element, and the plurality of inspection switching elements may be formed of LTPS-TFTs. preferable.

Since p-Si has a higher carrier mobility than a-Si, the TFT can be miniaturized, so that various switching elements and the like can be formed in a narrow area, and at the same time as the pixel driving switching element. Can be formed. Therefore, according to the electro-optical device of the present invention, it is possible to manufacture an electro-optical device with a high response speed and a high resolution while achieving a narrow frame without increasing the number of steps.

1A is a schematic plan view showing a schematic configuration of a liquid crystal display device according to the present embodiment through a color filter substrate, and FIG. 1B is a schematic cross-sectional view taken along line IB-IB in FIG. 1A. It is a schematic sectional drawing of the display area for 1 sub pixel of the array board | substrate of the liquid crystal display device using LTPS-TFT. It is an enlarged plan view of the liquid crystal display device of this embodiment. FIG. 10 is an enlarged plan view of an overhang portion in an array substrate of a conventional electro-optical device.

Hereinafter, embodiments of the present invention will be described as an example of an electro-optical device with reference to the embodiments and drawings.
A case of a liquid crystal display device using TPS-TFT will be described as an example. The embodiments described below are not intended to limit the present invention to those described herein. The present invention
The present invention can be applied to well-known electro-optical devices such as an EL display device, a plasma display device, and a field emission display device without departing from the technical idea shown in the claims. In each drawing used for the description in this specification, each layer and each member are displayed in different scales so that each layer and each member can be recognized on the drawing. However, it is not necessarily displayed in proportion to the actual dimensions.

The liquid crystal display device 10 of this embodiment is a TN mode transmissive liquid crystal display device using dual top gate LTPS-TFTs, and the configuration of the main part will be described with reference to FIG. 1A is a schematic plan view showing a schematic configuration of the liquid crystal display device according to the present embodiment through a color filter substrate, and FIG. 1B is a schematic cross-sectional view taken along line IB-IB in FIG. 1A.

In the liquid crystal display device 10 of this embodiment, the liquid crystal LC is held between the array substrate AR and the color filter substrate CF. As shown in FIG. 1A, the array substrate AR includes a first transparent substrate 11.
On the surface of the first transparent substrate 11 in FIG. 1A, a display region 12 in which pixel electrodes, TFTs and the like are formed, a peripheral region 13 in which a lead-out wiring is formed around the display region 12 A circuit formation region 14 in which peripheral circuits are formed at the left and right end portions and an external circuit mounting terminal region 15 at the lower end portion of the first transparent substrate 11 are formed.

In the display area 12, a plurality of scanning lines and signal lines arranged in a matrix and partitioning the display area 12 into sub-pixels, or dual as switching elements arranged near the intersection of the scanning lines and the signal lines. A top gate type LTPS-TFT, pixel electrodes electrically connected to the TFT, and the like are stacked. Specific examples of these laminated structures will be described later.
In FIG. 1B, these are schematically shown as the first structures 16. In the peripheral region 13, lead wirings for connecting scanning lines and signal lines to an IC driver circuit or the like formed in the circuit formation region 14 are formed.

On the other hand, as shown in FIG. 1B, the color filter substrate CF has a color filter layer and a light shielding member such as a black matrix on the second transparent substrate 17 made of a transparent material such as glass. The color filter layer is provided with a colored layer corresponding to each sub-pixel, and is disposed so as to face the pixel electrode of the array substrate AR. The light shielding member is disposed at a position corresponding to at least the TFT, scanning line, and signal line of the array substrate AR. A counter electrode (common electrode) made of a transparent conductive material such as ITO or IZO is further arranged on the second transparent substrate 17 so as to face the display region 12 of the array substrate AR. Although a specific configuration of these color filter layers and the like is omitted, these are schematically shown as the second structure 18 in FIG. 1B.

The array substrate AR and the color filter substrate CF are bonded to each other with a sealing material 19 made of, for example, a thermosetting resin such as an epoxy resin or a photocurable resin, and a liquid crystal is supplied between the substrates from a liquid crystal injection port (not shown). LC is injected and the liquid crystal display device 10 of embodiment is obtained. Here, a specific example of one sub-pixel of a liquid crystal display device using a dual top gate LTPS-TFT will be described with reference to FIG. FIG. 2 is a schematic cross-sectional view of a display region for one sub-pixel of an array substrate of a liquid crystal display device using LTPS-TFTs.

The array substrate of the liquid crystal display device 10 includes the first transparent substrate 11, a light shielding film 22 for preventing backlight and stray light from entering the LTPS-TFT, and the light shielding film 22 and the first transparent substrate 11 exposed. Buffer insulating film 23 covering the surface, LTPS layer 24 formed on the surface of buffer insulating film 23, gate insulating film 25 covering the surfaces of LTPS layer 24 and buffer insulating film 23, and the gate insulating film A pair of gate electrodes G formed on the surface of 25,
A source electrode S, a drain electrode D, and a pixel electrode 26 are provided.

The surfaces of the pair of gate electrodes G and the gate insulating film 25 are covered with a pixel electrode 27, and metal wirings such as gate lines (not shown) and source lines 28 are formed on the surface of the gate insulating film 25. These metal wirings are formed of an opaque metal such as aluminum (Al), aluminum alloy, molybdenum (Mo), for example. The pixel electrode 27 and the gate insulating film 25 are provided with a first contact hole 29 that exposes the source region of the LTPS layer 24, and part of the source line 28 passes through the first contact hole 29 and the source region. It is connected. The connection portion of the source line 28 with the source region constitutes the source electrode S. Similarly, a second contact hole 30 is formed in the pixel electrode 27 and the gate insulating film 25 so as to expose the drain region of the LTPS layer 24. The second contact hole 30 is formed of the same material as the source line 28 so as to have an isolated pattern at the same time. The metal wiring is connected to the drain region via the second contact hole 30. The connection portion of the metal wiring with the drain region constitutes the drain electrode D.

Further, the exposed surfaces of the source line 28, the source electrode S, the drain electrode D, and the pixel electrode 27 are further covered with a passivation film 31. This passivation film 31 is
It is provided to protect the metal wiring formed on the surface of the pixel electrode 27 and to guarantee the moisture resistance of the channel region of the LTPS-TFT. As the material, for example, silicon nitride, silicon oxide, or the like is employed, but silicon nitride is particularly often used from the viewpoint of ensuring moisture resistance and the ease of etching.

The surface of the passivation film 31 is further covered with an interlayer resin film 32. The interlayer resin film 32 planarizes the substrate surface before the pixel electrode 26 is formed, and the source line 28 and the pixel electrode 2.
6 is provided to suppress the parasitic capacitance between the first and second electrodes, and is formed of, for example, a photosensitive resin such as acrylic or siloxane. The pixel electrode 26 is formed on the surface of the interlayer resin film 32 by a transparent conductive material such as ITO (Indium Tin Oxide) or IZO (Indium Zinc Oxide). The pixel electrode 26 is formed on the passivation film 31 and the interlayer resin film 32. It is electrically connected to the drain electrode D through the three contact hole 33. Reference numeral 34 denotes a storage capacitor line formed in the same layer as the gate electrode G.

Each sub-pixel of the liquid crystal display device 10 responds by changing the alignment state of the liquid crystal LC by an electric field formed between the pixel electrode 26 and a common electrode formed on the color filter substrate CF (not shown). The color is determined by the color determined by the color filter layer.

At the same time when the LTPS-TFT, the gate line, the source line 28, etc. are formed, a lead-out wiring is provided in the peripheral area 13 around the display area 12, various driver circuits are provided in the circuit forming area 14, and an external circuit. In the mounting terminal area 15, a driver IC terminal, an external signal connection terminal, an inspection terminal, and the like are formed. However, since these manufacturing processes are well known, detailed description thereof is omitted.

Next, the circuit formation region 14 and the external circuit mounting terminal region 1 of the liquid crystal display device 10 of the embodiment.
A specific example of 5 will be described with reference to FIG. FIG. 3 is an enlarged plan view of the liquid crystal display device of this embodiment. In the liquid crystal display device 10 of the present embodiment, each subpixel is arranged in a matrix so as to be opposed to, for example, three color filter layers of R, G, and B formed in a stripe shape in the column direction on the color filter substrate CF. Arranged in a shape. In FIG. 3, R, G, B
The portions to which reference numerals are assigned indicate red subpixels, green subpixels, and blue subpixels, respectively.

A source line 28 is formed along each column of subpixels, and a gate line (not shown) is formed along each row of subpixels. A unit pixel (one pixel) is formed by sub-pixels. In this specification, the column of R sub-pixels, the column of G sub-pixels, and the column of B sub-pixels connected to each source line 28 are referred to as “sub-pixel columns”, and the column of unit pixels is “ This is referred to as a “unit pixel column”.

A scanning signal selection element (vertical driver) 35 for selecting one of arbitrary gate lines is formed in the circuit formation region 14, but in FIG. 3, the scanning signal selection element 35 is provided only on the left side.
The example which provided is shown. The external circuit mounting terminal area 15 includes a video signal selection switching element (horizontal driver) 36, an inspection switching element 37, a driver IC mounting terminal 38, an external signal connection terminal 39, and an inspection terminal. T1 to T4 are formed. The scanning signal selection element 35, the video signal selection switching element 36, and the inspection switching element 37 are all formed by LTPS-TFTs.

The video signal selection switching element 36 includes a plurality of TFTs 40 each having, for example, a drain electrode connected to each source line 28, and the plurality of TFTs 40 have a source electrode connected in parallel for each unit pixel column. Each is connected to a corresponding driver IC mounting terminal 38 by a video signal supply wiring 41. These video signal supply wirings 4
1 exists at least by the number of unit pixels in the row direction of the liquid crystal display device 10.

The plurality of TFTs 40 have gate electrodes connected in parallel for each sub-pixel column of the same color, and are connected to corresponding driver IC mounting terminals 38 by color selection signal supply wirings 42. These color selection signal supply wirings 42 are 3 corresponding to R, G, B here.
Although this is provided, it can be increased or decreased depending on the type of the color filter layer to be used. The source electrode in the TFT 40 corresponds to the input terminal side of the video signal selection switching element 36 of the present invention, and the gate electrode corresponds to the control terminal side.

Further, in the liquid crystal display device 10 of this embodiment, the inspection switching element 37 is connected to each video signal supply wiring 41. These inspection switching elements 37
Is composed of LTPS-TFT, the drain electrode is connected to the video signal supply line 41, and the source electrode is connected in parallel to the first inspection terminal T1,
The gate electrodes are connected in parallel to each other and connected to the second inspection terminal T2. The source electrode in the inspection switching element 37 corresponds to the input terminal side of the inspection switching element 37 of the present invention, and the gate electrode corresponds to the control terminal side. It should be noted that the first inspection terminal T1 and the second inspection terminal T2 are branched and correspond to the external signal connection terminal 39 side as well.
This is because a fixed potential is applied to all the inspection switching elements 37 during normal display to suppress signal leakage.

Further, the plurality of color selection signal supply wirings 42 are branched and connected to the third inspection terminal T3. The common wiring Com is connected to a corresponding terminal of the driver IC mounting terminal 38 and is branched and connected to the common wiring inspection terminal Tcom. Further, a plurality of scanning signal supply wirings 43 for supplying power supply lines and scanning signals are connected to corresponding terminals of the driver IC mounting terminal 38 from the scanning signal selection element 35, and are branched to each of a plurality of scanning signal supply wirings 43. It is connected to the fourth inspection terminal T4.

Inspection during production is performed as follows. It is assumed that no driver IC is arranged on the driver IC mounting terminal 38. First, the first inspection terminal T1 to the fourth inspection terminal T
4 and the common wiring inspection terminal Tcom are connected to the FPC (not shown) connected to the inspection signal supply circuit. Then, a predetermined signal is applied to the power supply line and the common wiring. In this state, a predetermined inspection data signal is input to the first inspection terminal T1, and a signal for turning on all the inspection switching elements 37 is input to the second inspection terminal T2.

Further, a signal for turning on the TFT 40 of the video signal selection switching element 36 connected to the sub-pixel of a predetermined color is input from the third inspection terminal T3, and further, from the fourth inspection terminal T4. A signal for selecting a gate line at a predetermined position is input to the scanning signal selection element 35. Then, a predetermined gate line selected by the scanning signal selection element 35 among the sub pixel columns (for example, R sub pixel columns) of the color selected by the color selection signal input to the third inspection terminal T3. The row of sub-pixels corresponding to the color is colored with the same color (R). In this state, when the row selected by the scanning signal selection element 35 is sequentially changed, the color development state of the R sub-pixels in the entire display region 12 can be inspected.

In this inspection, by changing the color to be inspected by appropriately changing the signal input from the third inspection terminal T3, it is possible to inspect the color development state of all the sub-pixels in the display area 12, and at the same time 2 It is also possible to inspect so that the sub-pixels of three to three colors are colored.

During normal image display, if no signal is applied to the first inspection terminal T1 and the second inspection terminal T2, the inspection switching element 37 enters a floating state, and the potential becomes unstable. A fixed potential that turns off the inspection switching element 37 is applied from the connection terminals t1 and t2. When such a configuration is adopted, the inspection switching element 37 is always in an OFF state, and therefore, deterioration due to leakage of the video signal supplied from the driver IC through the inspection switching element 37 is reduced.

As described above, according to the liquid crystal display device 10 of the present embodiment, the number of inspection terminals for inspecting the color development state of all the sub-pixels can be extremely reduced. The pitch can be increased. Therefore, an inexpensive and large-sized FPC can be used as the inspection probe, and the alignment and replacement of the inspection probe are simplified and maintenance is facilitated. Furthermore, since a special inspection jig is not required at the time of inspection, it can be performed with a relatively inexpensive apparatus as in the prior art.

DESCRIPTION OF SYMBOLS 10 ... Liquid crystal display device 11 ... Transparent substrate 12 ... Display area 13 ... Perimeter area 14 ... Circuit formation area 15 ... External circuit mounting terminal area 16 ... Structure 17 ... Transparent substrate 18 ... Structure 19 ... Sealing material 22 ... Light shielding film 23 ... Buffer insulating film 24 ... LTPS layer 25 ...
Gate insulating film 26 ... Pixel electrode 27 ... Pixel electrode 28 ... Source line 29 ... First contact hole 30 ... Second contact hole 31 ... Passivation film 32 ... Interlayer resin film 33 ... Third contact hole 34 ... Auxiliary capacitance line 35 ... Scanning Signal selection element 36 ... Video signal selection switching element 37 ... Inspection switching element 38 ... Driver I
C mounting terminal 39 ... External signal connection terminal 41 ... Video signal supply wiring 42 ... Color selection signal supply wiring 43 ... Scanning signal supply wiring AR ... Array substrate CF ... Color filter substrate
Com ... Common wiring LC ... Liquid crystal T1-T4 ... First to fourth inspection terminals Tcom ... Common wiring inspection terminals

Claims (5)

An array substrate including a plurality of gate lines, a plurality of source lines, and pixel drive switching elements provided corresponding to intersections of the gate lines and the source lines;
A plurality of video signal supply wirings to which external video signals are supplied, and a plurality of color selection signal supply wirings to which external color selection signals are supplied, formed on the periphery of the array substrate;
A plurality of scanning signal supply lines to which scanning signals from the outside are supplied;
A video signal selection switching element that is connected to the plurality of source lines and selectively connects an arbitrary source line to one of the plurality of video signal supply wirings;
A scanning signal selection element that is connected to the plurality of gate lines and selectively connects an arbitrary gate line to one of the plurality of scanning signal supply wirings;
A plurality of external signal connection terminals and a plurality of inspection terminals;
In an electro-optical device comprising:
An inspection switching element is connected to each of the plurality of video signal supply wirings,
The plurality of inspection switching elements are connected to the first inspection terminal on the input terminal side in parallel with each other, connected to the second inspection terminal on the control terminal side in parallel with each other,
The plurality of color selection signal supply wirings are respectively connected to a plurality of third inspection terminals,
The plurality of scanning signal supply wirings are connected to a plurality of fourth inspection terminals, respectively.
An electro-optical device. The plurality of video signal supply wirings, the plurality of color selection signal supply wirings, and the plurality of scanning signal supply wirings of a driver IC formed between the external signal connection terminal and the video signal selection switching element. The electro-optical device according to claim 1, wherein the electro-optical device is connected to a mounting terminal. 2. The electro-optical device according to claim 1, wherein the plurality of inspection switching elements are disposed between the driver IC and the plurality of video signal selection switching elements in a plan view. 2. The electro-optical device according to claim 1, wherein the first inspection terminal and the second inspection terminal are respectively branched and corresponding connection terminals are formed adjacent to the external signal connection terminals. . 5. The electro-optic according to claim 1, wherein the video signal selection switching element, the scanning signal selection element, and the plurality of inspection switching elements are formed of a low-temperature polysilicon thin film transistor. apparatus.

Images