JP2010243199A - Method and device for detecting illuminance - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method and a device for detecting illuminance which enable further an improvement of the accuracy of detection of the illuminance of light radiated on an irradiation object surface. <P>SOLUTION: The illuminance detecting device 100 includes an illuminance detection part 10 which is disposed on the irradiation object surface 300 so formed as to be irradiated by the light with an inclination to the normal of the irradiation object surface 300. The illuminance detecting device 100 includes a conversion part 22 which converts the illuminance of the light detected by the illuminance detection part 10 into plane illuminance on a reference plane being almost parallel to the irradiation object surface 300 on the basis of the inclination of the illuminance detection part 10 to the normal of the irradiation object surface 300. <P>COPYRIGHT: (C)2011,JPO&INPIT

Description

  The present invention has an inclination with respect to a normal line of an irradiated surface configured to be irradiated with light, and an illuminance detection unit disposed on the irradiated surface of light irradiated on the irradiated surface. The present invention relates to an illuminance detection method and an illuminance detection device that detect illuminance.

  A technique for measuring the illuminance of light irradiated on a surface to be irradiated is known. Specifically, the illuminance of light irradiated on the irradiated surface is detected by an illuminance detection unit (hereinafter referred to as an illuminance sensor) provided on the irradiated surface.

  Moreover, the technique which improves the detection accuracy of an illumination sensor by providing an illumination sensor in the opening part of a hemispherical dome is proposed (for example, patent document 1). Specifically, a diffusion material is applied to the inner wall of the dome, and the illuminance sensor detects light diffused on the inner wall of the dome.

JP-A-5-231931

  By the way, the detection accuracy of the illuminance sensor depends on the incident angle of light to the illuminance sensor. As described above, when the illuminance sensor detects the light diffused on the inner wall of the dome, the detection accuracy of the illuminance sensor is improved to some extent.

  However, for example, in a projection display apparatus that performs acute oblique projection, the incident angle of light on the irradiated surface (projection surface) is very large. Therefore, the detection accuracy of the illuminance sensor is insufficient.

  Therefore, the present invention has been made to solve the above-described problems, and provides an illuminance detection method and an illuminance detection device that can further improve the detection accuracy of the illuminance of light irradiated on the irradiated surface. The purpose is to provide.

  The illuminance detection method according to the first feature is arranged on the irradiated surface with an inclination with respect to the normal line of the irradiated surface (irradiated surface 300) configured to be irradiated with light. In this method, the illuminance of the light irradiated on the irradiated surface is detected by the illuminance detection unit (illuminance detection unit 10). In the illuminance detection method, the illuminance of the light detected by the illuminance detection unit based on the inclination of the illuminance detection unit with respect to the normal of the irradiated surface is changed to a planar illuminance on a reference plane substantially parallel to the irradiated surface. Converting.

  The illuminance detection device according to the second feature is disposed on the irradiated surface with an inclination with respect to the normal of the irradiated surface (irradiated surface 300) configured to be irradiated with light. An illuminance detection unit (illuminance detection unit 10) is provided. The illuminance detection device converts the illuminance of the light detected by the illuminance detection unit to a plane illuminance on a reference plane substantially parallel to the irradiated surface, based on the inclination of the illuminance detection unit with respect to the normal line of the irradiated surface. A conversion unit (conversion unit 22) for conversion is provided.

  In the second feature, in the illuminance detection device, the inclination of the illuminance detection unit with respect to the normal of the irradiated surface is variable.

  2nd characteristic WHEREIN: An illumination intensity detection apparatus is further provided with the adjustment part (adjustment part 21) which adjusts the inclination of the said illumination intensity detection part with respect to the normal line of the said to-be-irradiated surface. The adjustment unit adjusts the inclination of the illuminance detection unit with respect to the normal of the irradiated surface so that the amount of light incident on the illuminance detection unit is maximized.

  In the second feature, the illuminance detection device includes: an imaging unit (imaging unit 60) that captures an image of a light source device that emits light irradiated on the irradiated surface; and the illuminance detecting unit with respect to a normal line of the irradiated surface. An adjustment unit (adjustment unit 21) for adjusting the inclination is further provided. The adjustment unit specifies a position of the light source device based on a captured image captured by the imaging unit. The adjustment unit adjusts the inclination of the illuminance detection unit with respect to the normal line of the irradiated surface based on the position of the light source device.

  In the second feature, a plurality of illuminance detection units are provided as the illuminance detection unit on the irradiated surface.

  ADVANTAGE OF THE INVENTION According to this invention, the illumination intensity detection method and illumination intensity detection apparatus which make it possible to further improve the detection precision of the illumination intensity of the light irradiated to a to-be-irradiated surface can be provided.

It is a figure showing illuminance detection device 100 concerning a 1st embodiment. It is a figure showing illuminance detection device 100 concerning a 1st embodiment. It is a figure which shows the illumination intensity detection part 10 which concerns on 1st Embodiment. It is a figure which shows the directivity of the illumination intensity detection part 10 which concerns on 1st Embodiment. It is a figure which shows the light-receiving area of the illumination meter probe 14 which concerns on 1st Embodiment. It is a figure which shows inclination adjustment of the illumination intensity detection part 10 which concerns on 1st Embodiment. It is a figure which shows inclination adjustment of the illumination intensity detection part 10 which concerns on 1st Embodiment. It is a figure which shows conversion to the plane illumination intensity which concerns on 1st Embodiment. It is a block diagram which shows the function of the illumination intensity detection apparatus 100 which concerns on 1st Embodiment. It is a flowchart which shows operation | movement of the illumination intensity detection apparatus 100 which concerns on 1st Embodiment. It is a figure which shows the illumination intensity detection apparatus 100 which concerns on the example 1 of a change. It is a block diagram which shows the function of the illumination intensity detection apparatus 100 which concerns on the example 1 of a change. It is a flowchart which shows operation | movement of the illumination intensity detection apparatus 100 which concerns on the example 1 of a change. It is a figure which shows the illumination intensity detection apparatus 100 which concerns on the example 2 of a change. It is a flowchart which shows operation | movement of the illumination intensity detection apparatus 100 which concerns on the example 2 of a change.

  Hereinafter, an illuminance detection device and an illuminance detection method according to an embodiment of the present invention will be described with reference to the drawings. In the following description of the drawings, the same or similar parts are denoted by the same or similar reference numerals.

  However, it should be noted that the drawings are schematic and ratios of dimensions are different from actual ones. Therefore, specific dimensions and the like should be determined in consideration of the following description. Moreover, it is a matter of course that portions having different dimensional relationships and ratios are included between the drawings.

[Outline of Embodiment]
The illuminance detection device according to the embodiment includes an illuminance detection unit disposed on the irradiated surface with an inclination with respect to the normal line of the irradiated surface configured to be irradiated with light. The illuminance detection device converts the illuminance of the light detected by the illuminance detection unit into a plane illuminance on a reference plane substantially parallel to the irradiated surface, based on the inclination of the illuminance detection unit with respect to the normal of the irradiated surface. Is provided.

  The illuminance detection method according to the embodiment has an inclination with respect to the normal line of the irradiated surface configured to be irradiated with light, and the illuminance detection unit disposed on the irradiated surface causes the irradiated surface to be irradiated. This is a method for detecting the illuminance of the irradiated light. The illuminance detection method includes a step of converting the illuminance of the light detected by the illuminance detection unit to a plane illuminance on a reference plane substantially parallel to the irradiated surface based on the inclination of the illuminance detection unit with respect to the normal line of the irradiated surface. Prepare.

  In the embodiment, the illuminance detection unit is arranged on the irradiated surface with an inclination with respect to the normal line of the irradiated surface. Accordingly, the amount of light incident on the illuminance detector increases. Moreover, since the incident angle to the illuminance detection unit approaches 0 °, the detection accuracy of the illuminance detection unit is improved.

  In the embodiment, the illuminance of the light detected by the illuminance detection unit is converted into a planar illuminance on a reference plane substantially parallel to the irradiated surface, based on the inclination of the illuminance detection unit with respect to the normal line of the irradiated surface. In this way, in the state where the detection accuracy of the illuminance detection unit is improved, the illuminance of the light detected by the illuminance detection unit is converted into flat illuminance, so the detection accuracy of the illuminance of light irradiated on the irradiated surface is improved. To do.

  The plane illuminance is a luminous flux per unit area incident on the light receiving surface projected onto the reference plane when the light receiving surface of the illuminance detection unit is projected onto the reference plane substantially parallel to the irradiated surface.

[First Embodiment]
(Illuminance detection device)
Hereinafter, the illuminance detection device according to the first embodiment will be described with reference to the drawings. FIG.1 and FIG.2 is a figure which shows the illumination intensity detection apparatus 100 which concerns on 1st Embodiment.

  As shown in FIGS. 1 and 2, the illuminance detection device 100 includes an illuminance detection unit 10, a control unit 20, a screen housing unit 30, a support body 40, and a screen 50.

  The illuminance detection unit 10 is disposed on the irradiated surface with an inclination with respect to the irradiated surface 300 configured to be irradiated with light. The illuminance detection unit 10 detects the illuminance of light irradiated on the irradiated surface, that is, the luminous flux per unit area. The illuminance detection unit 10 is, for example, an illuminance sensor.

  Here, since the light quantity is represented by the time integration of the light beam, the illuminance detection unit 10 can also detect the light quantity. In the first embodiment, a plurality of illuminance detection units 10 are arranged on the irradiated surface. Details of the illuminance detection unit 10 will be described later (see FIG. 3).

  The control unit 20 controls the illuminance detection device 100. The control unit 20 is connected to the illuminance detection unit 10. The control unit 20 is an arithmetic device such as a personal computer, for example.

  The screen accommodating portion 30 is supported by the support body 40 and accommodates the screen 50. The screen accommodating unit 30 is configured to accommodate the screen 50 by winding the screen 50, for example.

  The support body 40 supports the screen housing portion 30. Moreover, the support body 40 supports the illumination intensity detection part 10 arrange | positioned on a to-be-irradiated surface.

  The screen 50 is configured to cover the illuminance detection unit 10 disposed on the irradiated surface in a state where the screen 50 is pulled out from the screen storage unit 30. On the screen 50, image light emitted from a projection display apparatus 200 described later is irradiated. That is, an image is displayed on the screen 50.

(Illuminance detector)
Hereinafter, the illuminance detection unit according to the first embodiment will be described with reference to the drawings. FIG. 3 is a diagram illustrating the illuminance detection unit 10 according to the first embodiment.

  As shown in FIG. 3, the illuminance detection unit 10 includes a housing 11, a first rotating body 12, a second rotating body 13, and an illuminometer probe 14.

  The housing 11 constitutes an outer frame that houses the first rotating body 12. The housing | casing 11 supports the 1st rotation body 12 so that rotation is possible.

  The first rotating body 12 is rotatably supported by the housing 11. The first rotating body 12 is configured to be rotatable in the β direction. The 1st rotation body 12 supports the 2nd rotation body 13 so that rotation is possible. That is, the inclination of the light receiving surface of the illuminometer probe 14 is variable in the range of 0 ° to 360 ° in the β direction.

  The second rotating body 13 is rotatably supported by the first rotating body 12. The second rotating body 13 is configured to be rotatable in the α direction (latitude direction). The second rotating body 13 supports the illuminometer probe 14. That is, the inclination of the light receiving surface of the illuminometer probe 14 is variable in the range of −90 ° to 90 ° in the α direction.

  The illuminometer probe 14 detects the illuminance of light irradiated on the irradiated surface. The illuminometer probe 14 has a certain degree of directivity as shown in FIG. For example, as shown in FIG. 4, when the incident angle of light on the light receiving surface of the illuminometer probe 14 is 0 ° to 60 °, the illuminance detection accuracy is good. On the other hand, when the incident angle of light on the light receiving surface of the illuminometer probe 14 exceeds 60 °, the illuminance detection accuracy is poor.

  For example, the detection accuracy of a general class A illuminometer defined by the JIS standard is ± 10% at worst when the incident angle is 60 ° or less. On the other hand, the detection accuracy of the general class A illuminometer is ± 30% when the incident angle is 80 °.

  The detection accuracy of the general type AA illuminometer defined by the JIS standard is ± 7% at the worst when the incident angle is 60 ° or less. On the other hand, the detection accuracy of the general type AA class illuminometer is ± 25% when the incident angle is 80 °.

  The detection accuracy of the general precision illuminometer specified by the JIS standard is ± 5% at worst when the incident angle is 60 ° or less. On the other hand, the detection accuracy of the general precision illuminance meter is ± 20% when the incident angle is 80 °.

  Here, it should be noted that the illuminometer probe 14 can be directed in any direction by the rotation of the first rotating body 12 and the second rotating body 13. That is, the rotation angle of the first rotating body 12 and the second rotating body 13 can make the incident angle of light on the light receiving surface of the illuminometer probe 14 close to 0 °.

  Note that the light receiving area of the illuminometer probe 14 increases as the incident angle of light on the light receiving surface of the illuminometer probe 14 approaches 0 °. That is, as the incident angle of light on the light receiving surface of the illuminometer probe 14 approaches 0 °, the amount of light incident on the light receiving surface of the illuminometer probe 14 increases.

Specifically, as illustrated in FIG. 5, a case where light is irradiated from the A direction onto the light receiving surface of the illuminometer probe 14 is illustrated. Angle of incidence of the light on the light receiving surface of the illuminance meter probe 14 is 0 ° in the first state, since the light receiving area S ₁ luminometer probe 14 is maximum, the amount of light incident on the light receiving surface of the illuminance meter probe 14 Is the largest. On the other hand, in the second state where the incident angle of light on the light receiving surface of the illuminometer probe 14 is θ, the light receiving area S ₂ of the illuminometer probe 14 is smaller than the light receiving area S ₁ , and thus the light received by the illuminometer probe 14. The amount of light incident on the surface is smaller than in the first state.

The illuminance of light detected by the illuminometer probe 14 in the first state is represented by “φ ₁ ”, and the illuminance of light detected by the illuminometer probe 14 in the second state is represented by “φ ₂ ”. The relationship φ ₂ = cos θ × φ ₁ ″ is satisfied.

(Inclination adjustment of illuminance detector)
Hereinafter, the inclination adjustment of the illuminance detection unit according to the first embodiment will be described with reference to the drawings. 6 and 7 are diagrams for explaining the inclination adjustment of the illuminance detection unit 10 according to the first embodiment. In the following, it should be noted that the inclination of the illuminance detection unit 10 is synonymous with the inclination of the normal line of the light receiving surface of the illuminometer probe 14.

  As shown in FIGS. 6 and 7, a case where light emitted from the projection display apparatus 200 is irradiated onto the irradiated surface 300 from an obliquely lower direction of the irradiated surface 300 will be described. On the irradiated surface 300, a plurality of illuminance detection units 10 (illuminance detection unit 10A, illuminance detection unit 10B, and illuminance detection unit 10C) are arranged.

  First, each illuminance detection unit 10 (the normal line of the light receiving surface of the illuminometer probe 14) is described as being disposed on the irradiated surface 300 without being inclined with respect to the normal line of the irradiated surface 300. To do.

  In such a case, as shown in FIG. 6, the light receiving surface of the illuminometer probe 14 provided in the illuminance detection unit 10C has an incident angle of light on the light receiving surface of the illuminance probe 14 provided in the illuminance detection unit 10B. It becomes larger than the incident angle of light. In addition, the incident angle of light on the light receiving surface of the illuminometer probe 14 provided in the illuminance detecting unit 10A is larger than the incident angle of light on the light receiving surface of the illuminometer probe 14 provided in the illuminance detecting unit 10B. That is, the illuminance detection accuracy of the illuminance detection unit 10B is worse than the illuminance detection accuracy of the illuminance detection unit 10C, and the illuminance detection accuracy of the illuminance detection unit 10A is worse than the illuminance detection accuracy of the illuminance detection unit 10B.

  Second, each illuminance detection unit 10 (the normal line of the light receiving surface of the illuminometer probe 14) is described as being disposed on the irradiated surface 300 with an inclination with respect to the normal line of the irradiated surface 300. . In the first embodiment, the illuminance detection units 10 are thus arranged with an inclination. For example, the inclination of each illuminance detection unit 10 is determined so that the amount of light incident on the light receiving surface of the illuminance detection unit 10 (illuminance meter probe 14) is maximized.

  In such a case, as shown in FIG. 7, the incident angles of light on the light receiving surfaces of the illuminometer probes 14 provided in each illuminance detector 10 are substantially the same. That is, the incident angle of light on the light receiving surface of the illuminometer probe 14 provided in each illuminance detection unit 10 approaches 0 °.

  Note that the distance (normal distance) between the light receiving surface of the illuminometer probe 14 and the irradiated surface 300 in the normal direction of the irradiated surface 300 differs according to the inclination angle of the illuminometer probe 14. Therefore, a mechanism for adjusting the position of the illuminometer probe 14 in the normal direction of the irradiated surface 300 may be provided.

(Conversion to flat illumination)
In the following, conversion to planar illuminance according to the first embodiment will be described with reference to the drawings. FIG. 8 is a diagram for explaining conversion into planar illuminance according to the first embodiment.

  As described above, in the first embodiment, each illuminance detection unit 10 (illuminometer probe 14) is arranged on the irradiated surface 300 with an inclination with respect to the normal line of the irradiated surface 300.

  Here, since each illuminance detector 10 (illuminometer probe 14) is tilted, the illuminance distribution on the irradiated surface 300 even if the illuminance of light detected by each illuminance detector 10 (illuminometer probe 14) is used. Can not get exactly.

  In the first embodiment, the illuminance of the light detected by each illuminance detection unit 10 (illuminometer probe 14) is converted into a planar illuminance on a reference plane substantially parallel to the irradiated surface 300. The plane illuminance is a luminous flux per unit area incident on the light receiving surface projected onto the reference plane when the light receiving surface of the illuminometer probe 14 is projected onto the reference plane.

As shown in FIG. 8, the normal line of the irradiated surface 300 is represented by “NL ₁ ”, and the normal line of the light receiving surface of the illuminometer probe 14 is represented by “NL ₂ ”. The light receiving surface of the illuminometer probe 14 is represented by “S _a ”, and the projected light receiving surface projected onto the reference plane is represented by “S _b ”. The luminous flux per unit area incident on the light receiving surface “S _a ” is represented by “φ _a ”, and the luminous flux per unit area incident on the projected light receiving surface “S _b ” is represented by “φ _b ”.

In the first embodiment, the inclination of the illuminance detection unit 10 (illuminometer probe 14) is defined by the inclination θ of the normal line “NL ₂ ” with respect to the normal line “NL ₁ ”.

Here, the relationship between “φ _a ” and “φ _b ” is expressed by “φ _b = cos θ × φ _a ”. That is, the plane illuminance (ie, “φ _b ”) is a value obtained by multiplying the illuminance “φ _a ” of the light detected by the illuminometer probe 14 by “cos θ”.

(Function of illuminance detection device)
Hereinafter, functions of the illuminance detection device according to the first embodiment will be described with reference to the drawings. FIG. 9 is a block diagram illustrating functions of the illuminance detection device 100 according to the first embodiment.

  As illustrated in FIG. 9, the illuminance detection device 100 includes an illuminance detection unit 10, an adjustment unit 21, and a conversion unit 22.

  The adjustment unit 21 individually controls the inclination of each illuminance detection unit 10 (illuminance meter probe 14). Specifically, the adjustment unit 21 adjusts the inclination of the illuminance detection unit 10 so that the amount of light incident on the illuminance detection unit 10 (the light receiving surface of the illuminometer probe 14) is maximized. Further, the adjustment unit 21 outputs the inclination of each illuminance detection unit 10 to the conversion unit 22.

  For example, the adjustment unit 21 searches for a gradient that maximizes the amount of light incident on the illuminance detection unit 10 by a scan operation that changes the gradient of the illuminance detection unit 10 little by little.

  The conversion unit 22 converts the illuminance of the light detected by the illuminance detection unit 10 (illuminometer probe 14) into planar illuminance on the reference plane. Specifically, the conversion unit 22 multiplies the illuminance of the light detected by the illuminance detection unit 10 by “cos θ” to obtain the planar illuminance. Note that “θ” is the inclination of the illuminance detection unit 10 as described above.

(Operation of illuminance detection device)
Hereinafter, an operation of the illuminance detection device according to the first embodiment will be described with reference to the drawings. FIG. 10 is a flowchart showing the operation of the illuminance detection device 100 according to the first embodiment.

  As shown in FIG. 10, in step 10, the illuminance detection device 100 adjusts the inclination of the illuminance detection unit 10 to be controlled.

  In Step 20, the illuminance detection device 100 determines whether or not the amount of light incident on the illuminance detection unit 10 to be controlled is the maximum. The illuminance detection apparatus 100 proceeds to the process of step 30 when the amount of light incident on the illuminance detection unit 10 to be controlled is the maximum. The illuminance detection device 100 returns to the process of step 10 when the amount of light incident on the illuminance detection unit 10 to be controlled is not the maximum.

  In step 30, the illuminance detection device 100 detects the illuminance by the illuminance detection unit 10 to be controlled.

  In step 40, the illuminance detection device 100 determines whether or not the illuminance is detected by all the illuminance detection units 10. When the illuminance detection device 100 has not detected the illuminance by all the illuminance detection units 10, the illuminance detection device 100 changes the illuminance detection unit 10 to be controlled, and then proceeds to the process of step 10. When the illuminance detection device 100 detects the illuminance by all the illuminance detection units 10, the illuminance detection apparatus 100 proceeds to the process of step 50.

  In step 50, the illuminance detection device 100 converts the illuminance of the light detected by each illuminance detection unit 10 into a planar illuminance on the reference plane according to the inclination of each illuminance detection unit 10.

(Function and effect)
In the first embodiment, the illuminance detection unit 10 is arranged on the irradiated surface 300 with an inclination with respect to the normal line of the irradiated surface 300. Accordingly, the amount of light incident on the illuminance detector 10 (the light receiving surface of the illuminometer probe 14) increases. Moreover, since the incident angle to the illuminance detection unit 10 (the light receiving surface of the illuminometer probe 14) approaches 0 °, the detection accuracy of the illuminance detection unit 10 is improved.

  In the first embodiment, the illuminance of light detected by the illuminance detection unit 10 based on the inclination of the illuminance detection unit 10 with respect to the normal line of the irradiated surface 300 is a planar illuminance on a reference plane substantially parallel to the irradiated surface 300. Is converted to In this way, in the state where the detection accuracy of the illuminance detection unit 10 is improved, the illuminance of the light detected by the illuminance detection unit 10 is converted into the planar illuminance, so the detection of the illuminance of the light irradiated on the irradiated surface 300 is detected. Accuracy is improved.

  In the first embodiment, the adjustment unit 21 adjusts the inclination of the illuminance detection unit 10 so that the amount of light incident on the illuminance detection unit 10 (the light receiving surface of the illuminometer probe 14) is maximized. Accordingly, the detection accuracy of the illuminance detection unit 10 can be improved while omitting manual adjustment.

[Modification 1]
Hereinafter, Modification Example 1 of the first embodiment will be described with reference to the drawings. In the first modification, differences from the first embodiment will be mainly described.

  Specifically, in the first embodiment, the inclination of the illuminance detection unit 10 is adjusted so that the amount of light incident on the illuminance detection unit 10 is maximized. The inclination that maximizes the amount of light incident on the illuminance detection unit 10 can be found by a scanning operation.

  On the other hand, in the first modification, the inclination of the illuminance detection unit 10 is adjusted by the positional relationship between the projection display apparatus 200 and the irradiated surface 300. The positional relationship between the projection display apparatus 200 and the irradiated surface 300 is specified by the captured image of the projection display apparatus 200.

(Function of illuminance detection device)
Hereinafter, functions of the illuminance detection device according to the first modification will be described with reference to the drawings. FIG. 11 is a block diagram illustrating functions of the illuminance detection device 100 according to the first modification. In FIG. 11, the same reference numerals are given to the same configurations as those in FIG. 1.

  As illustrated in FIG. 11, the illuminance detection device 100 includes an imaging unit 60 in addition to the configuration illustrated in FIG. 1. In FIG. 11, in the irradiated surface 300, the horizontal direction is the x axis and the vertical direction is the y axis. The normal direction of the irradiated surface 300 is the z axis.

  The imaging unit 60 is a camera that images the projection display apparatus 200. The imaging unit 60 is provided on the irradiated surface 300, for example. Note that the position of the imaging unit 60 is defined by the x axis, the y axis, and the z axis. The position of the imaging unit 60 is known.

(Function of illuminance detection device)
Hereinafter, functions of the illuminance detection device according to the first modification will be described with reference to the drawings. FIG. 12 is a block diagram illustrating the illuminance detection device 100 according to the first modification. In FIG. 12, the same reference numerals are given to the same components as those in FIG.

  As illustrated in FIG. 12, the illuminance detection device 100 includes an imaging unit 60 in addition to the configuration illustrated in FIG. 9.

  As described above, the position of the imaging unit 60 is known, and the imaging unit 60 images the projection display apparatus 200.

  The adjustment unit 21 described above identifies the positional relationship between the projection display apparatus 200 and the irradiated surface 300 based on the image captured by the imaging unit 60. Subsequently, the adjustment unit 21 adjusts the inclination of the illuminance detection unit 10 based on the positional relationship between the projection display apparatus 200 and the irradiated surface 300.

  Specifically, the adjustment unit 21 specifies the position where light is emitted from the projection display apparatus 200 based on the image captured by the imaging unit 60. The adjustment unit 21 adjusts the inclination of the illuminance detection unit 10 so that the illuminance detection unit 10 faces a position where light is emitted from the projection display apparatus 200.

(Operation of illuminance detection device)
Hereinafter, the operation of the illuminance detection device according to the modification example 1 will be described with reference to the drawings. FIG. 13 is a flowchart showing the operation of the illuminance detection device 100 according to the first modification.

  As shown in FIG. 13, in step 110, the illuminance detection device 100 images the illuminance detection device 100.

  In step 120, the illuminance detection device 100 adjusts the inclination of each illuminance detection unit 10 based on the captured image of the projection display apparatus 200. Specifically, the illuminance detection device 100 adjusts the inclination of each illuminance detection unit 10 so that each illuminance detection unit 10 faces a position where light is emitted from the projection display apparatus 200.

  In step 130, the illuminance detection device 100 detects illuminance by the illuminance detection unit 10 to be controlled.

  In step 140, the illuminance detection device 100 determines whether or not the illuminance is detected by all the illuminance detection units 10. If the illuminance detection device 100 has not detected the illuminance by all the illuminance detection units 10, the illuminance detection device 100 changes the illuminance detection unit 10 to be controlled, and then returns to the processing of step 130. When the illuminance detection device 100 detects the illuminance by all the illuminance detection units 10, the illuminance detection apparatus 100 proceeds to step 150.

  In step 150, the illuminance detection device 100 converts the illuminance of the light detected by each illuminance detection unit 10 into a planar illuminance on the reference plane according to the inclination of each illuminance detection unit 10.

(Function and effect)
In the first modification, the adjustment unit 21 specifies the positional relationship between the projection display apparatus 200 and the irradiated surface 300 based on the captured image of the projection display apparatus 200. Subsequently, the adjustment unit 21 adjusts the inclination of the illuminance detection unit 10 based on the positional relationship between the projection display apparatus 200 and the irradiated surface 300. Accordingly, the detection accuracy of the illuminance detection unit 10 can be improved while omitting manual adjustment. As a result, the detection accuracy of the illuminance of the light irradiated on the irradiated surface 300 can be improved.

[Modification 2]
Hereinafter, Modification Example 2 of the first embodiment will be described with reference to the drawings. In the following, differences from the first embodiment will be described.

  Specifically, in the first embodiment, the inclination of the illuminance detection unit 10 is adjusted so that the amount of light incident on the illuminance detection unit 10 is maximized. The inclination that maximizes the amount of light incident on the illuminance detection unit 10 can be found by a scanning operation.

  On the other hand, in the modification example 2, the inclination of the illuminance detection unit 10 is adjusted in advance according to the positional relationship between the projection display apparatus 200 and the irradiated surface 300. The positional relationship between the projection display apparatus 200 and the irradiated surface 300 is known.

  In the second modification, a case where a shipping inspection of the projection display apparatus 200 is performed will be exemplified.

(Function of illuminance detection device)
Hereinafter, functions of the illuminance detection device according to the modification example 2 will be described with reference to the drawings. FIG. 14 is a block diagram illustrating functions of the illuminance detection device 100 according to the second modification. In FIG. 14, the same reference numerals are given to the same configurations as those in FIG. 1.

  As shown in FIG. 14, the projection display apparatus 200 is conveyed by a belt conveyor 400. The belt conveyor 400 is configured to stop at a predetermined stop position and resume conveyance of the projection display apparatus 200 after the shipment inspection of the projection display apparatus 200 is completed.

  Here, the positional relationship between the stop position of the belt conveyor 400 and the illuminance detection device 100 is fixed. That is, the positional relationship between the projection display apparatus 200 and the irradiated surface 300 is known.

  Therefore, the inclination of the illuminance detection unit 10 is adjusted in advance according to the positional relationship between the projection display apparatus 200 (stop position) and the irradiated surface 300. Specifically, as in the first modification, the inclination of each illuminance detection unit 10 is adjusted so that each illuminance detection unit 10 faces a position where light is emitted from the projection display apparatus 200.

(Operation of illuminance detection device)
Hereinafter, an operation of the illuminance detection device according to the modification example 2 will be described with reference to the drawings. FIG. 15 is a flowchart illustrating the operation of the illuminance detection device 100 according to the second modification. The flow shown in FIG. 15 shows the operation from the state where the belt conveyor 400 is stopped at the stop position.

  As shown in FIG. 15, in step 210, the projection display apparatus 200 is turned on to start the projection display apparatus 200.

  In step 220, the projection display apparatus 200 is idled. The idling of the projection display apparatus 200 is continued until the amount of light emitted from the projection display apparatus 200 reaches a sufficient amount.

  In step 230, the illuminance detection device 100 detects the illuminance by the illuminance detection unit 10 to be controlled.

  In step 240, the illuminance detection device 100 determines whether or not the illuminance is detected by all the illuminance detection units 10. When the illuminance detection device 100 has not detected the illuminance by all the illuminance detection units 10, the illuminance detection device 100 changes the illuminance detection unit 10 to be controlled and then returns to the processing of step 230. When the illuminance detection device 100 detects the illuminance by all the illuminance detection units 10, the illuminance detection apparatus 100 proceeds to the process of step 250.

  In step 250, the illuminance detection device 100 converts the illuminance of the light detected by each illuminance detection unit 10 into a planar illuminance on the reference plane according to the inclination of each illuminance detection unit 10.

  In step 260, the illuminance detection device 100 determines whether or not the planar illuminance satisfies a predetermined standard. The illuminance detection device 100 proceeds to the process of step 270 when the planar illuminance satisfies a predetermined standard. When the planar illuminance does not satisfy the predetermined standard, the illuminance detection device 100 proceeds to the process of step 280.

  In step 270, the illuminance detection device 100 makes a pass determination as an inspection result of the projection display apparatus 200.

  In step 280, the illuminance detection device 100 makes a failure determination as the inspection result of the projection display apparatus 200.

(Function and effect)
In the second modification, the positional relationship between the projection display apparatus 200 and the irradiated surface 300 is known. Therefore, the detection accuracy of the illuminance detection unit 10 can be improved while omitting the adjustment of the illuminance detection unit 10. As a result, the detection accuracy of the illuminance of the light irradiated on the irradiated surface 300 can be improved.

  By applying the embodiment to the shipping inspection of the projection display apparatus 200 as in the second modification, the accuracy of the pass / fail determination of the shipping inspection is improved.

[Other Embodiments]
Although the present invention has been described with reference to the above-described embodiments, it should not be understood that the descriptions and drawings constituting a part of this disclosure limit the present invention. From this disclosure, various alternative embodiments, examples and operational techniques will be apparent to those skilled in the art.

  In the embodiment, the projection display apparatus 200 is illustrated as an example of a light source device that emits light irradiated on the irradiated surface 300, but the light source device is not limited to this. The light source device only needs to be a device that emits light irradiated to the irradiated surface 300.

  In the embodiment, the inclination of the illuminance detection unit 10 is adjusted by the adjustment unit 21, but the embodiment is not limited to this. The inclination of the illuminance detection unit 10 may be adjusted manually.

  DESCRIPTION OF SYMBOLS 10 ... Illuminance detection part, 11 ... Housing | casing, 12 ... 1st rotation body, 13 ... 2nd rotation body, 14 ... Illuminance meter probe, 20 ... Control unit, 21. ..Adjustment unit, 22 ... conversion unit, 30 ... screen housing unit, 40 ... support, 50 ... screen, 60 ... imaging unit, 100 ... illuminance detection device, 200. ..Projection type image display device, 300 ... irradiated surface, 400 ... belt conveyor

Claims (6)

The illuminance detection unit disposed on the irradiated surface is inclined with respect to the normal of the irradiated surface configured to be irradiated with light, and the illuminance of the light irradiated on the irradiated surface is determined. An illuminance detection method for detecting,
Converting the illuminance of the light detected by the illuminance detection unit based on the inclination of the illuminance detection unit with respect to the normal of the irradiated surface into a planar illuminance on a reference plane substantially parallel to the irradiated surface; An illuminance detection method characterized by that. An illuminance detection device including an illuminance detection unit disposed on the irradiated surface with an inclination with respect to a normal line of the irradiated surface configured to be irradiated with light,
A conversion unit that converts the illuminance of the light detected by the illuminance detection unit into a plane illuminance in a reference plane substantially parallel to the irradiated surface, based on an inclination of the illuminance detection unit with respect to a normal line of the irradiated surface; An illuminance detection device comprising:   The illuminance detection apparatus according to claim 2, wherein an inclination of the illuminance detection unit with respect to a normal line of the irradiated surface is variable. An adjustment unit that adjusts the inclination of the illuminance detection unit with respect to the normal of the irradiated surface;
The illuminance detection according to claim 2, wherein the adjustment unit adjusts an inclination of the illuminance detection unit with respect to a normal line of the irradiated surface so that a light amount incident on the illuminance detection unit is maximized. apparatus. An imaging unit that images a light source device that emits light irradiated on the irradiated surface;
An adjustment unit that adjusts the inclination of the illuminance detection unit with respect to the normal of the irradiated surface;
The adjustment unit specifies a position of the light source device based on a captured image captured by the imaging unit,
The illuminance detection apparatus according to claim 2, wherein the adjustment unit adjusts an inclination of the illuminance detection unit with respect to a normal line of the irradiated surface based on a position of the light source device.   The illuminance detection apparatus according to claim 2, wherein a plurality of illuminance detection units are provided as the illuminance detection unit on the irradiated surface.

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