JP2010217085A - Inspection device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an inspection device capable of securing continuity of contactors and an electrode surface in a short time without damaging the electrode surface and the periphery thereof. <P>SOLUTION: The inspection device includes: the contactors each having a tip coming into electric contact with an electric circuit; a support body supporting the contactors; and an inspection machine electrically connected to the contactors. The inspection device further includes a vibration generating means for vibrating the contactors. Before inspection start, the contractors are vibrated to remove dust and rust, so as to securely achieve continuity of the contactors and the electrode surface. Since the contractors and the electrode surface are not physically rubbed with each other, scratches on them can be prevented. Moreover, since time required for the vibration is short, decline in production efficiency can be avoided. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to an inspection apparatus used for inspection of electric characteristics and functions of an electric circuit. This inspection apparatus can be used, for example, for inspection of IC cards having electrodes, so-called contact type IC cards. In addition, it can also be used for inspection of printed wiring boards and the like.

  When inspecting the electrical characteristics and functions of these electrical circuits, contact the tip of the contact for inspection with the electrodes of these electrical circuits to establish conduction, and connect the opposite side of the contact to the inspection machine. In general, the electrical characteristics and functions are evaluated by inspecting a response to a voltage or an electric signal input through a contact. At this time, it is important that the electrode of the electric circuit and the tip of the contact are surely connected. If this connection is insufficient, a good electric circuit is mistakenly determined as a defective product. Result.

  Therefore, various attempts have been made in the past to ensure the contact between the electrode of the electric circuit and the tip of the contact. For example, the contact is pressed against the electrode of the electric circuit using spring pressure, and the conduction between the two is ensured by this pressing. However, even if this method is used, if there is an electrically insulating foreign substance between the contact and the electrode, the two cannot be connected. For example, even if the electrode surface is slightly rusted, conduction cannot be achieved.

  Further, Patent Document 1 uses a spring pressure to press the contact against the electrode of the electric circuit, and slides the contact before or during the inspection to clean the foreign matter interposed therebetween. Is. According to this technique, not only when the dust is between the contact and the electrode, but also when the surface of the electrode is slightly rusted, the contact can be made conductive by removing the rust. .

JP-A-63-301385

  However, according to the technique of Patent Document 1, since the contact and the electrode surface are slid relative to each other, there is a problem that the electrode surface and its surroundings may be damaged.

  Further, since a cleaning process by sliding is required for the inspection, it takes time for the inspection, and the production efficiency is lowered depending on the type of the electric circuit.

  The present invention has been made under such circumstances, and it is possible to ensure the electrical connection between the contact and the electrode surface in a short time without damaging the electrode surface and its surroundings. An object is to provide an apparatus.

That is, the invention described in claim 1 includes an inspection device including a contact that electrically contacts the tip of the electric circuit, a support that supports the contact, and an inspection device that is electrically connected to the contact. In the device
An inspection apparatus comprising vibration generating means for vibrating the contact.

  According to the present invention, since the contact can be brought into contact with the electrode surface and the contact can be vibrated before the inspection is started, dust and rust are removed by this vibration and the two are reliably connected. be able to. In addition, since the two are not physically rubbed together, the damage can be prevented. Further, since the time required for vibration is small, production efficiency is not reduced.

  The vibration generating means may be directly connected to the contact to vibrate the contact, or connected to the support and indirectly vibrate by vibrating the support. It may be made to vibrate. The frequency of vibration may be relatively low, for example, 2 to 100 Hz. From the viewpoint of preventing scratches, the vibration distance is preferably a short distance of 0.01 to 0.5 mm.

  Next, the invention of claim 2 limits the time for which the contact is vibrated in order to prevent a decrease in production efficiency. That is, the invention according to claim 2 is the inspection apparatus according to claim 1, wherein the vibration generating means vibrates in a range of 100 to 500 msec.

  Next, the invention of claim 3 includes means for removing fine foreign matters released from the surface of the contactor or the surface of the electrode by the vibration. That is, the invention according to claim 3 is the inspection apparatus according to claim 1 or 2, further comprising a duct for blowing gas toward the tip of the contact and the periphery thereof.

  In order to reliably remove dust and rust by the vibration of the contact, it is desirable that the contact is pressed against the electrode surface with a certain range of force.

  The inventions of claims 4 and 5 have been made under such circumstances. That is, the invention of claim 4 has an urging means for pressing the contact against the electrode surface. 3. The inspection apparatus according to any one of 3 above. The invention according to claim 5 is the inspection apparatus according to claim 4, wherein the biasing means presses the electrode against the contact with a pressure of 5 to 50 gf.

  As described above, according to the present invention, the contact between the contactor and the electrode surface can be ensured in a short time without damaging the electrode surface and its surroundings.

The front view which shows the test | inspection state which concerns on 1st embodiment of this invention. The side view which shows the test | inspection state which concerns on 1st embodiment of this invention. The flowchart which concerns on 1st embodiment of this invention The front view which shows the test | inspection state which concerns on 2nd embodiment of this invention. The side view which shows the test | inspection state which concerns on 2nd embodiment of this invention. The perspective view which shows the structure of the duct which concerns on 2nd embodiment of this invention. First flowchart according to the second embodiment of the present invention. Second flowchart according to the second embodiment of the present invention. The front view which shows the test | inspection state which concerns on 3rd embodiment of this invention.

  Embodiments of the present invention will be described below with reference to the drawings.

(First embodiment)
FIG. 1 is a front view showing an inspection state according to the first embodiment of the present invention, and FIG. 2 is a side view thereof.

  That is, the inspection apparatus according to this embodiment includes a plurality of contacts, a contact support that supports the contacts aligned in a vertical state, an inspection machine (not shown), and indirectly through the support. And vibration generating means for vibrating the contact. Each contact is connected to an inspection machine.

  Shown below the contact is an inspection object, which is a contact IC card in the illustrated example. That is, in this IC card, an IC module is embedded in a card substrate, and a plurality of electrodes are exposed on the surface. And the front-end | tip of the said several contactor is pressing on the electrode of the test object by the biasing means which is not shown in figure.

  The contact material may be any material as long as it enables electrical connection between the electrode and the inspection machine, but the tip of the contact is preferably a copper-based material such as phosphor bronze. Abraded rhodium plating or gold plating is desirable. The tip of the contact is preferably hemispherical with a radius of curvature of 0.05 to 0.5 mm.

  Next, a known spring can be used as the biasing means. It is desirable to press the electrode with a pressure of 5 to 50 gf by this biasing means. In the case of a pressure lower than this, even if the contact is vibrated, conduction with the electrode may not be obtained. In addition, even when the pressure is higher than this, it may be difficult to remove foreign matter due to vibration, and electrical connection with the electrode may not be obtained.

  For example, a solenoid can be used as the vibration generating means. The solenoid can be directly fixed to a plurality of the contacts, and the plurality of contacts can be directly vibrated. However, in the illustrated example, both the solenoid and the plurality of contacts are supported on the support body. It is fixed to the body, the support is vibrated by a solenoid, and the plurality of contacts are indirectly vibrated through the vibration of the support. And by this contact, the foreign material and rust which intervene between a contact tip and the electrode of a test object can be released, and both can be connected reliably.

  The solenoid is controlled so as to generate the following vibration by switching on. That is, the vibration of the contact has a frequency of 2 to 100 Hz and a vibration distance of 0.01 to 0.5 mm. Further, this vibration may be a short time of 100 to 500 msec when the contact is in contact with the electrode of the inspection object. As a rule of thumb, even if it is vibrated for a longer time, it is not improved, and instead the production efficiency of the IC card is lowered. Moreover, it can also be configured such that the switch is engaged when the contact contacts the electrode of the inspection object. In this case, the vibration and the inspection can be automatically performed only by lowering the contact to the surface of the inspection object.

  Next, FIG. 3 is a flowchart regarding a method of using the inspection apparatus. That is, the inspection object is set at a predetermined position. Next, the contact is lowered to the surface of the inspection object and brought into contact with the electrode of the inspection object. Next, the contact is vibrated for 100 to 500 msec to remove foreign matter between the contact and the electrode. Then, the inspection machine is driven to inspect the electric circuit (in this example, the IC in the IC card). After this inspection, the contact is raised and separated from the inspection object, and the inspection ends.

(Second embodiment)
Next, a second embodiment relates to an inspection apparatus provided with means for removing fine foreign matter generated from the surface of the contactor or the surface of the electrode by the vibration.

  FIG. 4 is a front view showing an inspection state according to the second embodiment, and FIG. 5 is a side view thereof. FIG. 6 shows the structure of the duct.

  This inspection apparatus is the same as that of the first embodiment except that it includes a discharge duct composed of an air discharge means, an air flow path, and an electromagnetic valve. That is, the inspection apparatus includes a plurality of contacts, a contact support that supports the contacts aligned in a vertical state, an inspection machine (not shown), and the contacts indirectly through the support. It comprises vibration generating means for vibrating and the discharge duct. Each contact is connected to an inspection machine. The discharge duct is composed of air discharge means, a flow path for guiding the air generated by the air discharge means to and around the tip of the contact, and an electromagnetic valve for opening or closing the flow path. ing.

  As described above, because of the vibration of the contactor, fine foreign substances are released from the surface of the contactor and the surface of the electrode. After this vibration or while this vibration is occurring, this discharge duct before inspection. The air can be discharged to remove these foreign matters, thereby preventing the foreign matters from adhering to the contactor or the electrode surface. For this reason, even if compared with the test | inspection apparatus which concerns on said 1st embodiment, it becomes possible to aim at conduction | electrical_connection with a contact and an electrode more reliably.

  The discharge duct not only removes fine foreign substances released from the surface of the contactor and the surface of the electrode due to the vibration, but also has a dustproof function for the contactor, the electrode of the inspection object, and the inspection table. For this reason, the release of air can be started before the contact is brought into contact with the electrode of the inspection object, and the release can be continued until after the vibration.

  For this reason, when using the inspection apparatus which concerns on this embodiment, the following two types of usage methods can be employ | adopted. FIG. 7 is a flowchart relating to the first of the two types of usage methods. First, the inspection object is set at a predetermined position. Next, the contact is lowered to the surface of the inspection object and brought into contact with the electrode of the inspection object. Open the solenoid valve and start releasing air. And while continuing this discharge | release of air, a contactor is vibrated and the foreign material between the said contactor and an electrode is removed. After the end of the vibration, the electromagnetic valve is closed to stop the release of air, and then the inspection machine is driven to inspect the electric circuit (in this example, the IC in the IC card). After this inspection, the contact is raised and separated from the inspection object, and the inspection ends.

  Moreover, FIG. 8 is a flowchart regarding the second method of the two types of usage methods, and the difference from the first method is an air discharge start time. That is, in this method, first, the inspection object is set and fixed at a predetermined position. Next, the electromagnetic valve is opened to start releasing air. Then, while continuing to release this air, the contact is lowered to the surface of the inspection object and brought into contact with the electrode of the inspection object, and the contact is vibrated to remove foreign matter between the contact and the electrode. To do. Then, after the end of the vibration, the electromagnetic valve is closed to stop the release of air, and then the inspection machine is driven to inspect the electric circuit (in this example, the IC in the IC card). After this inspection, the contact is raised and separated from the inspection object, and the inspection ends.

(Third embodiment)
Next, a third embodiment relates to an inspection apparatus in which the vibration generating means is directly fixed to a contact. FIG. 9 is a front view showing an inspection state according to the third embodiment. In FIG. 9, only one contact is shown, but it is needless to say that it may have a plurality of contacts. Even in the case of having a plurality of contacts, the plurality of contacts are separately fixed to the vibration generating means. The usage method is the same as the usage method of the inspection apparatus according to the first embodiment.

Claims (5)

In an inspection apparatus comprising a contact that electrically contacts a tip with an electric circuit, a support that supports the contact, and an inspection device that is electrically connected to the contact.
An inspection apparatus comprising vibration generating means for vibrating the contact.   The inspection apparatus according to claim 1, wherein the vibration generating means vibrates in a range of 100 to 500 msec.   The inspection apparatus according to claim 1, further comprising a duct that blows a gas toward a tip of the contact and the periphery thereof.   The inspection apparatus according to claim 1, further comprising an urging unit that presses the contact against the electrode surface.   5. The inspection apparatus according to claim 4, wherein the urging means presses the electrode with a pressure of 5 to 50 gf.

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