JP2010203845A5 - - Google Patents

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Publication number
JP2010203845A5
JP2010203845A5 JP2009048114A JP2009048114A JP2010203845A5 JP 2010203845 A5 JP2010203845 A5 JP 2010203845A5 JP 2009048114 A JP2009048114 A JP 2009048114A JP 2009048114 A JP2009048114 A JP 2009048114A JP 2010203845 A5 JP2010203845 A5 JP 2010203845A5
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JP
Japan
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image
partial
size
learning
evaluation
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JP2009048114A
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English (en)
Japanese (ja)
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JP5359377B2 (ja
JP2010203845A (ja
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Priority claimed from JP2009048114A external-priority patent/JP5359377B2/ja
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Publication of JP2010203845A5 publication Critical patent/JP2010203845A5/ja
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Publication of JP5359377B2 publication Critical patent/JP5359377B2/ja
Expired - Fee Related legal-status Critical Current
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JP2009048114A 2009-03-02 2009-03-02 欠陥検出装置、欠陥検出方法および欠陥検出プログラム Expired - Fee Related JP5359377B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009048114A JP5359377B2 (ja) 2009-03-02 2009-03-02 欠陥検出装置、欠陥検出方法および欠陥検出プログラム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009048114A JP5359377B2 (ja) 2009-03-02 2009-03-02 欠陥検出装置、欠陥検出方法および欠陥検出プログラム

Publications (3)

Publication Number Publication Date
JP2010203845A JP2010203845A (ja) 2010-09-16
JP2010203845A5 true JP2010203845A5 (cg-RX-API-DMAC10.html) 2012-03-08
JP5359377B2 JP5359377B2 (ja) 2013-12-04

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JP2009048114A Expired - Fee Related JP5359377B2 (ja) 2009-03-02 2009-03-02 欠陥検出装置、欠陥検出方法および欠陥検出プログラム

Country Status (1)

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JP (1) JP5359377B2 (cg-RX-API-DMAC10.html)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012098181A (ja) * 2010-11-02 2012-05-24 Sumitomo Electric Ind Ltd 検出装置及び検出方法
CN108463717B (zh) 2016-01-26 2021-05-25 富士胶片株式会社 龟裂信息检测装置、龟裂信息检测方法及存储介质
US11948292B2 (en) 2019-07-02 2024-04-02 MakinaRocks Co., Ltd. Systems and methods for detecting flaws on panels using images of the panels
KR102450130B1 (ko) * 2019-07-02 2022-10-04 주식회사 마키나락스 패널의 이미지를 이용하여 패널의 결함을 검출하는 방법 및 시스템
JP7435303B2 (ja) 2020-06-23 2024-02-21 オムロン株式会社 検査装置、ユニット選択装置、検査方法、及び検査プログラム
KR102439163B1 (ko) * 2022-06-24 2022-09-01 주식회사 아이브 인공지능 기반의 비지도 학습 모델을 이용한 불량 제품 검출 장치 및 그 제어방법
JP2024135911A (ja) * 2023-03-23 2024-10-04 株式会社東京精密 ワーク外観検査装置及び方法
CN116805204B (zh) * 2023-08-24 2023-12-01 超网实业(成都)股份有限公司 一种智慧厂务监控方法及系统

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05322533A (ja) * 1992-05-25 1993-12-07 Yamatake Honeywell Co Ltd 回路部品の接続状態検出方法
JP3310898B2 (ja) * 1997-03-28 2002-08-05 三菱電機株式会社 画像処理装置
JP3447572B2 (ja) * 1998-07-31 2003-09-16 株式会社山武 部品の接続良否検査方法

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