JP2010094806A - Surface polishing method, surface polishing device and surface polishing plate - Google Patents

Surface polishing method, surface polishing device and surface polishing plate Download PDF

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JP2010094806A
JP2010094806A JP2010023476A JP2010023476A JP2010094806A JP 2010094806 A JP2010094806 A JP 2010094806A JP 2010023476 A JP2010023476 A JP 2010023476A JP 2010023476 A JP2010023476 A JP 2010023476A JP 2010094806 A JP2010094806 A JP 2010094806A
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porous plate
polishing
abrasive grains
plate
surface polishing
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JP5050064B2 (en
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Tetsuji Yamashita
哲二 山下
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MEZOTEKU DIA KK
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<P>PROBLEM TO BE SOLVED: To carry out mirror finishing without a polishing flaw even on a large-area silicon wafer or the like; to improve the flatness of a working surface 16 by applying uniform pressure on the whole large-area working surface 16 for polishing. <P>SOLUTION: As slurry 26 mixed with diamond abrasive grains 24 is pressed onto one surface 18 toward the other surface 20 of a porous plate 12 having a large number of continuous pores 22 opening from the one surface 18 to the other surface 20, the other surface 20 is pressed against the working surface 16 of a polished material 14 so that the other surface 20 and the working surface 16 are rubbed together, thereby polishing the polished material 14. A lot of the diamond abrasive grains 24 are trapped in the openings 28 of the continuous pores 22 on the other surface 20 of the porous plate 12, thereby exhibiting a favorable and stable polishing function. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、シリコンウエハ等の鏡面加工用研磨処理等に使用される表面研磨方法と表面研磨装置と表面研磨板に関する。   The present invention relates to a surface polishing method, a surface polishing apparatus, and a surface polishing plate used for polishing for mirror surface processing of a silicon wafer or the like.

シリコンウエハの鏡面加工処理に、ダイヤモンド砥石を使用して高精度の加工をするために、装置各部の改良が進められている。(特許文献1参照)(特許文献2参照)。   In order to perform high-precision processing using a diamond grindstone for mirror processing of silicon wafers, improvements have been made to each part of the apparatus. (See Patent Document 1) (See Patent Document 2).

特開平9−168947号公報Japanese Patent Laid-Open No. 9-168947 特開平5−129259号公報JP-A-5-129259

上記の既存技術には、さらに次のような解決すべき課題があった。
1.シリコンウエハの作用面に幅の狭いブロック状の砥石を押し当てて研磨処理をすると、シリコンウエハの作用面に送りマークと呼ばれる研磨痕が残る。
2.作用面に幅の狭い砥石を押し当てて、薄くて硬い大面積の基板の研磨をすると、作用面各部に加わる圧力の変動により、シリコンウエハ基板が破損し易い。作用面の面積が広くなると作用面の平坦度が十分でなくなる。
3.作用面の平坦度はシリコンウエハ基板の機械特性に大きな影響を与える。しかし、平坦度を向上させるには、長時間の研磨作業が必要で、生産性を低下させる。
以上の課題を解決するために、本発明は次のような表面研磨方法等を提供することを目的とする。
1.大面積のシリコンウエハ等であっても、研磨痕の無い鏡面仕上げができる。
2.広い作用面全体に均一な圧力をかけて研磨することができる。
3.短時間で作用面の平坦度が高めることができ、生産性が向上する。
4.長時間安定な研磨性能を維持できる。
The above existing technology has the following problems to be solved.
1. When a polishing process is performed by pressing a narrow block-shaped grindstone on the working surface of the silicon wafer, polishing marks called feed marks remain on the working surface of the silicon wafer.
2. When a thin and hard large-area substrate is polished by pressing a narrow grindstone on the working surface, the silicon wafer substrate is likely to be damaged due to fluctuations in pressure applied to each part of the working surface. When the area of the working surface becomes large, the flatness of the working surface becomes insufficient.
3. The flatness of the working surface greatly affects the mechanical properties of the silicon wafer substrate. However, in order to improve the flatness, a long polishing operation is required, which reduces productivity.
In order to solve the above problems, an object of the present invention is to provide the following surface polishing method and the like.
1. Even a large-area silicon wafer can be mirror-finished without polishing marks.
2. It is possible to polish by applying a uniform pressure to the entire wide working surface.
3. The flatness of the working surface can be increased in a short time, and productivity is improved.
4). Long-term stable polishing performance can be maintained.

本発明の表面研磨板は、一方の面から他方の面に通じる多数の連続気泡を有する多孔質板に、室温で多孔質板の他方の面から重力で自然流下しない程度の粘性を持つ液体であって、砥粒を混入したものを含浸させた表面研磨板である。   The surface polishing plate of the present invention is a liquid having a viscosity that does not naturally flow down from the other surface of the porous plate at room temperature to a porous plate having a large number of open cells leading from one surface to the other surface. A surface polishing plate impregnated with a mixture of abrasive grains.

好ましくは、前記液体は、研磨処理時に発生した熱により軟化して流動性が高まる液体である。   Preferably, the liquid is a liquid that is softened by heat generated during the polishing process to increase fluidity.

また、好ましくは、表面研磨板は、前記多孔質板の前記一方の面側に配置され、前記砥粒を混入した液体を収容する保持容器をさらに備える。   Preferably, the surface polishing plate further includes a holding container that is disposed on the one surface side of the porous plate and stores a liquid mixed with the abrasive grains.

また、好ましくは、前記砥粒はダイヤモンド砥粒であり、前記多孔質板には前記ダイヤモンド砥粒が混入されている。   Preferably, the abrasive grains are diamond abrasive grains, and the diamond abrasive grains are mixed in the porous plate.

本発明の表面研磨方法は、一方の面から他方の面に通じる多数の連続気泡を有する多孔質板に、室温で多孔質板の他方の面から重力で自然流下しない程度の粘性を持つ液体であって、砥粒を混入したものを含浸させた表面研磨板の前記他方の面を被研磨材の作用面に押し付けて、前記他方の面と前記作用面とを摺り合わせて、前記被研磨材を研磨または研削をする表面研磨方法である。   The surface polishing method of the present invention is a liquid having a viscosity that does not naturally flow down by gravity from the other surface of the porous plate to the porous plate having a large number of open cells leading from one surface to the other surface at room temperature. The other surface of the surface polishing plate impregnated with a mixture of abrasive grains is pressed against the working surface of the material to be polished, and the other surface and the working surface are slid together to form the material to be polished. Is a surface polishing method for polishing or grinding.

本発明の表面研磨装置は、一方の面から他方の面に通じる多数の連続気泡を有する多孔質板に、室温で多孔質板の他方の面から重力で自然流下しない程度の粘性を持つ液体であって、砥粒を混入したものを含浸させた表面研磨板の前記他方の面を被研磨材の作用面に押し付けて、前記他方の面と前記作用面とを摺り合わせて、前記被研磨材を研磨または研削する機構を備えた表面研磨装置である。   The surface polishing apparatus of the present invention is a liquid having a viscosity that does not naturally flow down by gravity from the other surface of the porous plate to the porous plate having a large number of open cells leading from one surface to the other surface. The other surface of the surface polishing plate impregnated with a mixture of abrasive grains is pressed against the working surface of the material to be polished, and the other surface and the working surface are slid together to form the material to be polished. It is the surface polishing apparatus provided with the mechanism which grind | polishes or grinds.

好ましくは、表面研磨装置は、前記表面研磨板の前記一方の面に前記砥粒を混入した前記液体を供給する供給手段を備える。   Preferably, the surface polishing apparatus includes supply means for supplying the liquid mixed with the abrasive grains on the one surface of the surface polishing plate.

また、好ましくは、前記表面研磨板は、前記多孔質板の前記一方の面側に配置され、前記砥粒を混入した液体を収容する保持容器をさらに備え、前記保持容器は、前記機構と連結する連結部を備える。   Preferably, the surface polishing plate further includes a holding container that is disposed on the one surface side of the porous plate and contains a liquid mixed with the abrasive grains, and the holding container is connected to the mechanism. The connecting part is provided.

また、以下の構成もそれぞれ上記の課題を解決するための手段である。
〈構成1〉
一方の面から他方の面に通じる多数の連続気泡を有する多孔質板の、上記一方の面から上記他方の面に向かう砥粒を混入したスラリーの流れを形成し、上記他方の面を被研磨材の作用面に押し付けて、上記他方の面と上記作用面とを摺り合わせて、上記被研磨材を研磨することを特徴とする表面研磨方法。
The following configurations are also means for solving the above problems.
<Configuration 1>
A porous plate having a large number of open cells leading from one surface to the other surface is formed with a slurry flow mixed with abrasive grains from the one surface toward the other surface, and the other surface is polished. A surface polishing method characterized by polishing the material to be polished by pressing against the working surface of the material and sliding the other surface and the working surface together.

多孔質板は、例えば、発泡金属板等のポーラス構造の板である。独立気泡ではなくスラリーを通過させるための連続気泡を有する。多孔質板の一方の面から前記他方の面に向かって砥粒を混入したスラリーを供給しながら研磨処理をすると、砥粒が良好で安定な研磨機能を発揮する。   The porous plate is, for example, a plate having a porous structure such as a foam metal plate. It has open cells for passing the slurry instead of closed cells. When the polishing process is performed while supplying the slurry mixed with abrasive grains from one surface of the porous plate toward the other surface, the abrasive grains exhibit a good and stable polishing function.

〈構成2〉
構成1に記載の表面研磨方法において、上記他方の面で上記被研磨材の作用面と接する部分に位置する気泡の開口には、上記砥粒の粒径より大きいものが含まれることを特徴とする表面研磨方法。
<Configuration 2>
In the surface polishing method according to Configuration 1, the bubble opening located at a portion of the other surface in contact with the working surface of the material to be polished contains a particle having a particle size larger than that of the abrasive grains. Surface polishing method.

気泡の開口が砥粒の粒径より大きくて、被研磨材の作用面に存在すると、その部分で砥粒が自由に転がりながら研磨処理が進行する。砥粒を作用面に固定している場合に比べて処理効率が上がり、作用面の仕上がりも良好になる。   When the opening of the bubbles is larger than the grain size of the abrasive grains and exists on the working surface of the material to be polished, the polishing process proceeds while the abrasive grains freely roll in that portion. Compared with the case where the abrasive grains are fixed to the working surface, the processing efficiency is improved, and the working surface is finished well.

〈構成3〉
構成1または2に記載の表面研磨方法において、上記連続気泡には、上記スラリーと共に流入する砥粒の粒径より大きい開口を有し、かつ、当該をトラップする曲折部を有するものが含まれることを特徴とする表面研磨方法。
<Configuration 3>
In the surface polishing method according to Configuration 1 or 2, the open cell includes one having an opening larger than the particle size of the abrasive grains flowing together with the slurry and having a bent portion for trapping the same. A surface polishing method characterized by the above.

連続気泡に曲折部があると、砥粒は、多孔質板のいずれかの連続気泡中にトラップされる。他方の面を被研磨材の作用面に押し付けて研磨処理を続けると、連続気泡中の各部にトラップされた砥粒が、次々に他方の面上の連続気泡開口部分に現れて、良好で安定な研磨機能を発揮する。   When the open cell has a bent portion, the abrasive grains are trapped in any open cell of the porous plate. When the other surface is pressed against the work surface of the material to be polished and the polishing process is continued, the abrasive grains trapped in each part of the open cell appear one after another at the open part of the open cell on the other surface. Exhibits an excellent polishing function.

〈構成4〉
一方の面から他方の面に通じる多数の連続気泡を有する多孔質板と、上記一方の面全面を覆いこれを取り囲む側壁を有し、砥粒を混入したスラリーを所定量収容し、上記一方の面から上記他方の面に向かう砥粒を混入したスラリーの流れを形成するスラリー供給部と、上記多孔質板の他方の面をほぼ水平に保持し、上記多孔質板の他方の面を被研磨材の作用面に押し付けて、上記他方の面と上記作用面とを摺り合わせて、上記被研磨材を研磨する駆動機構とを備えたことを特徴とする表面研磨装置。
<Configuration 4>
A porous plate having a large number of open cells leading from one surface to the other surface, and a side wall covering and enclosing the entire surface of the one surface, containing a predetermined amount of slurry mixed with abrasive grains, A slurry supply unit that forms a slurry flow mixed with abrasive grains from one surface to the other surface and the other surface of the porous plate are held almost horizontally, and the other surface of the porous plate is polished A surface polishing apparatus comprising: a driving mechanism that presses against a working surface of a material and slides the other surface and the working surface together to polish the material to be polished.

多孔質板の一方の面全面を覆いこれを取り囲む側壁を設け、ここに砥粒を混入したスラリーを収容して、スラリーを多孔質板に供給する。これにより、上記の表面研磨方法を実現できる。   A side wall that covers and surrounds the entire surface of one surface of the porous plate is provided, the slurry mixed with abrasive grains is accommodated therein, and the slurry is supplied to the porous plate. Thereby, said surface polishing method is realizable.

〈構成5〉
一方の面から他方の面に通じる多数の連続気泡を有する多孔質板と、上記一方の面全面を覆いこれを取り囲む容器を有し、砥粒を混入したスラリーを所定量収容し、上記一方の面から上記他方の面に向かう砥粒を混入したスラリーの流れを形成するスラリー供給部と、上記多孔質板の他方の面をほぼ垂直に保持し、上記多孔質板の他方の面を被研磨材の作用面に押し付けて、上記他方の面と上記作用面とを摺り合わせて、上記被研磨材を研磨する駆動機構とを備えたことを特徴とする表面研磨装置。
<Configuration 5>
A porous plate having a large number of open cells leading from one surface to the other surface, and a container covering and enclosing the entire surface of the one surface, containing a predetermined amount of slurry mixed with abrasive grains, A slurry supply unit that forms a slurry flow mixed with abrasive grains from one surface to the other surface and the other surface of the porous plate are held almost vertically, and the other surface of the porous plate is polished A surface polishing apparatus comprising: a driving mechanism that presses against a working surface of a material and slides the other surface and the working surface together to polish the material to be polished.

前記多孔質板の他方の面をほぼ垂直に保持した状態で研磨処理をする。スラリーが垂直に流下するので、常に新しいスラリーを連続的に供給して研磨することができる。   Polishing is performed with the other surface of the porous plate held substantially vertically. Since the slurry flows vertically, new slurry can be continuously supplied and polished.

〈構成6〉
一方の面から他方の面に通じる多数の連続気泡を有する多孔質板に、砥粒を混入した常温で非流動性の液体を含浸させたものと、上記多孔質板の一方の面側に配置され、上記砥粒を混入した常温で非流動性の液体を、上記一方の面以外の面を塞いで収容した処理剤封入部と、上記多孔質板の他方の面を被研磨材の作用面に押し付けて、上記他方の面と上記作用面とを摺り合わせて、上記被研磨材を研磨する駆動機構とを備えたことを特徴とする表面研磨装置。
<Configuration 6>
A porous plate having a large number of open cells leading from one surface to the other surface is impregnated with a non-fluid liquid at room temperature mixed with abrasive grains, and disposed on one surface side of the porous plate A processing agent enclosing portion containing a non-flowable liquid mixed with the abrasive grains at room temperature, covering the other surface, and the other surface of the porous plate serving as the working surface of the material to be polished A surface polishing apparatus comprising: a driving mechanism that presses against the second surface and slides the other surface and the working surface together to polish the material to be polished.

常温で非流動性の液体により、砥粒を多孔質板の連続気泡中に保持する。作用面では、気泡内で砥粒が動き廻り、効率のよい研磨ができる。多孔質板に処理剤を予め含浸させておけば、多孔質板の連続気泡中に万遍なく砥粒が分散する。   The abrasive grains are held in the open cells of the porous plate by a non-fluid liquid at room temperature. On the working surface, abrasive grains move around in the bubbles, and efficient polishing can be performed. If the porous plate is impregnated with the treatment agent in advance, the abrasive grains are uniformly dispersed in the open cells of the porous plate.

〈構成7〉
一方の面から他方の面に通じる多数の連続気泡を有する多孔質板に、砥粒を混入した常温で非流動性の液体を含浸させたことを特徴とする表面研磨板。
<Configuration 7>
A surface polishing plate characterized by impregnating a porous plate having a large number of open cells from one surface to the other surface with a non-fluid liquid at room temperature mixed with abrasive grains.

〈構成8〉
一方の面から他方の面に通じる多数の連続気泡を有する多孔質板に、砥粒を混入した常温で非流動性の液体を含浸させたものと、多孔質板の一方の面側に配置され、砥粒を混入した常温で非流動性の液体を、一方の面以外の面を塞いで収容した処理剤封入部とを有することを特徴とする表面研磨板。
<Configuration 8>
A porous plate having a large number of open cells leading from one surface to the other surface is impregnated with a non-fluid liquid at room temperature mixed with abrasive grains, and placed on one surface side of the porous plate A surface polishing plate comprising: a treatment agent enclosure portion containing a non-fluid liquid at room temperature mixed with abrasive grains by closing a surface other than one surface.

実施例1の表面研磨装置を示す縦断面図である。1 is a longitudinal sectional view showing a surface polishing apparatus of Example 1. FIG. 多孔質板12の主要部断面図である。2 is a cross-sectional view of a main part of a porous plate 12. FIG. 実施例3の装置の側面図である。It is a side view of the apparatus of Example 3. 実施例4の装置の縦断面図である。It is a longitudinal cross-sectional view of the apparatus of Example 4. 実施例4の表面研磨板斜視図である。6 is a perspective view of a surface polishing plate of Example 4. FIG.

以下、本発明の実施の形態を実施例毎に詳細に説明する。   Hereinafter, embodiments of the present invention will be described in detail for each example.

図1は実施例1の表面研磨装置を示す縦断面図である。
図の装置は、被研磨材14の例としてシリコンウエハを使用する。これを研磨するために、多孔質板12を使用する。被研磨材14はワークチャック41により水平に固定されている。多孔質板12は被研磨材14の作用面16に押し付けられるように支持されている。この多孔質板12の一方の面18から他方の面20に向かうスラリー26の流れを形成するために、スラリー供給部51が設けられている。なお、以下の実施例では全て研磨と表現するが、この装置で研削も可能であることは言うまでもない。
1 is a longitudinal sectional view showing a surface polishing apparatus of Example 1. FIG.
The apparatus shown in the figure uses a silicon wafer as an example of the material 14 to be polished. In order to polish this, a porous plate 12 is used. The workpiece 14 is fixed horizontally by a work chuck 41. The porous plate 12 is supported so as to be pressed against the working surface 16 of the material 14 to be polished. In order to form a flow of the slurry 26 from one surface 18 of the porous plate 12 toward the other surface 20, a slurry supply unit 51 is provided. In the following examples, all are expressed as polishing, but it goes without saying that grinding is also possible with this apparatus.

スラリー供給部51は、多孔質板12の一方の面18全面を覆いこれを取り囲む側壁を有するスラリータンク45を備える。多孔質板12は予め砥石ホルダ43に一体に固定されており、ビス44によりスラリータンク45の下面に固定される。こうして、スラリー供給部51は、スラリータンク45に包囲された空間に、ダイヤモンド砥粒24を混入したスラリー26を所定量収容する。スラリータンク45の上面には内部点検とスラリー補充用のキャップ47が設けられており、その中心には、外気導入用の吸気孔48が設けられている。   The slurry supply unit 51 includes a slurry tank 45 having a side wall that covers the entire surface of the one surface 18 of the porous plate 12 and surrounds it. The porous plate 12 is fixed integrally to the grindstone holder 43 in advance, and is fixed to the lower surface of the slurry tank 45 by screws 44. Thus, the slurry supply unit 51 stores a predetermined amount of the slurry 26 mixed with the diamond abrasive grains 24 in the space surrounded by the slurry tank 45. A cap 47 for internal inspection and slurry replenishment is provided on the upper surface of the slurry tank 45, and an intake hole 48 for introducing outside air is provided at the center thereof.

なお、実施例では、研磨あるいは研削をするためにダイヤモンド砥粒を使用する。しかし、その他に、セリア、シリカ、アルミナ等の研磨用粉体を単体あるいは混在させて使用することができる。スラリータンク45には回転駆動軸49が固定されており、駆動機構53により矢印54に示す方向に回転駆動される。これにより、多孔質板12の他方の面20をほぼ水平に保持し、多孔質板12の他方の面20を被研磨材14の作用面16に押し付けて、多孔質板12の他方の面20と被研磨材14の作用面16とを摺り合わせて、被研磨材14を研磨する。   In the embodiment, diamond abrasive grains are used for polishing or grinding. However, other powders such as ceria, silica, and alumina can be used alone or in combination. A rotary drive shaft 49 is fixed to the slurry tank 45 and is driven to rotate in the direction indicated by the arrow 54 by the drive mechanism 53. As a result, the other surface 20 of the porous plate 12 is held almost horizontally, the other surface 20 of the porous plate 12 is pressed against the working surface 16 of the material to be polished 14, and the other surface 20 of the porous plate 12. And the work surface 16 of the material to be polished 14 are slid together to polish the material to be polished 14.

図2は、多孔質板12の主要部断面図である。
多孔質板12は、その一方の面18(図1)から他方の面20に通じる多数の連続気泡22を有する。多孔質板12の一方の面18は上方に開放されており、ダイヤモンド砥粒24を混入したスラリー26の供給を受ける。スラリー26は重力により多孔質板12中で下方に移動する。スラリーは、水のような低粘度の液体よりも、高回転で運転したときに急激に流出しない糊状のものが好ましい。例えば、室温で、多孔質板12の他方の面から重力で自然流下しない程度の粘性を持つことが好ましい。この粘性は、スラリー26と多孔質板12との相対的な物性を考慮して選択されるとよい。
FIG. 2 is a cross-sectional view of the main part of the porous plate 12.
The porous plate 12 has a large number of open cells 22 that lead from one surface 18 (FIG. 1) to the other surface 20. One surface 18 of the porous plate 12 is open upward, and is supplied with a slurry 26 mixed with diamond abrasive grains 24. The slurry 26 moves downward in the porous plate 12 by gravity. The slurry is preferably a paste that does not flow out rapidly when operated at a high speed, rather than a low-viscosity liquid such as water. For example, it is preferable to have a viscosity that does not naturally flow down from the other surface of the porous plate 12 at room temperature. This viscosity may be selected in consideration of the relative physical properties of the slurry 26 and the porous plate 12.

多孔質板12は、例えば、発泡金属板等のポーラス構造の板である。独立気泡ではなく、スラリー26を通過させるための連続気泡22を有する。多孔質板12の材料にはステンレスや銅やセラミック材料が適する。また、被研磨材14の機械特性に応じて、フェノール樹脂、ポリウレタン等のプラスチック材料が適する場合もある。木炭等の自然素材も採用できる。なお、当初からダイヤモンド砥粒24を混入したポーラスセラミックも使用できる。   The porous plate 12 is, for example, a porous plate such as a foam metal plate. Not the closed cells but the open cells 22 for allowing the slurry 26 to pass therethrough. For the material of the porous plate 12, stainless steel, copper or ceramic material is suitable. Further, a plastic material such as phenol resin or polyurethane may be suitable depending on the mechanical characteristics of the material 14 to be polished. Natural materials such as charcoal can also be used. It is also possible to use a porous ceramic mixed with diamond abrasive grains 24 from the beginning.

図2に示したように、多孔質板12の他方の面20で、被研磨材14の作用面16と接する部分に位置する気泡の開口28には、ダイヤモンド砥粒24がそれぞれ適当な量だけ存在する。被研磨材の作用面16上に存在する気泡の開口28の口径がダイヤモンド砥粒24の粒径より大きいと、その部分でダイヤモンド砥粒24が自由に転がりながら研磨処理を進行させる。研磨処理の進行と共に、多孔質板12の他方の面20は磨り減っていき、スラリー26によりダイヤモンド砥粒24も押し流されて排出される。しかし、新たなスラリーにより、新たにダイヤモンド砥粒24が供給されるから、被研磨材の作用面16上には常に適量のダイヤモンド砥粒24が存在する。   As shown in FIG. 2, diamond abrasive grains 24 are respectively provided in appropriate amounts in the bubble openings 28 located on the other surface 20 of the porous plate 12 in contact with the working surface 16 of the material 14 to be polished. Exists. When the diameter of the bubble opening 28 existing on the working surface 16 of the material to be polished is larger than the particle diameter of the diamond abrasive grains 24, the polishing process proceeds while the diamond abrasive grains 24 freely roll in that portion. As the polishing process proceeds, the other surface 20 of the porous plate 12 is worn down, and the diamond abrasive grains 24 are also pushed away by the slurry 26 and discharged. However, since new diamond abrasive grains 24 are newly supplied by the new slurry, an appropriate amount of diamond abrasive grains 24 is always present on the working surface 16 of the material to be polished.

上記のような多孔質板12は、ダイヤモンド砥粒24を混入した砥石よりも大サイズで安価なものが容易に製造できる。従って、従来よりも広い作用面を形成でき、作用面全体に均一な圧力をかけて研磨することができる。同時に、大面積のシリコンウエハ等であっても、研磨痕の無い鏡面仕上げができる。また、ダイヤモンド砥粒24が自由に転がりながら研磨処理をするので、短時間で作用面の平坦度が高めることができ、生産性が向上する。さらに、スラリーにより、次々にダイヤモンド砥粒24が供給されるので、長時間安定な研磨性能を維持できる。   The porous plate 12 as described above can be easily manufactured with a large size and a lower price than a grindstone mixed with diamond abrasive grains 24. Therefore, it is possible to form a wider working surface than in the prior art, and to polish by applying a uniform pressure to the entire working surface. At the same time, even a large-area silicon wafer or the like can be mirror-finished without polishing marks. Moreover, since the diamond abrasive grains 24 are polished while freely rolling, the flatness of the working surface can be increased in a short time, and the productivity is improved. Furthermore, since the diamond abrasive grains 24 are successively supplied by the slurry, stable polishing performance can be maintained for a long time.

例えば、従来のダイヤモンド砥粒24を固定した砥石を使用すると、ダイヤモンド砥粒24を作用面16全面に接触させるために砥石の向きを変えながら長時間研磨処理を続ける必要がある。一方、この実施例のように、ダイヤモンド砥粒24を気泡の開口部分に閉じこめて、その部分でダイヤモンド砥粒を自由に転がしながら研磨処理を進行させると、短時間でダイヤモンド砥粒が作用面16全面に接触する。従って、研磨速度を十分に向上させることができる。しかも、固定したダイヤモンド砥粒24を作用面に強く押しつける場合に比べて、ダイヤモンド砥粒24が作用面16に適度な圧力で接触しながら転がって研磨処理が進むので、均一なきめの細かい研磨ができる。   For example, when a conventional grindstone having diamond abrasive grains 24 fixed thereto is used, it is necessary to continue the polishing process for a long time while changing the direction of the grindstone in order to bring the diamond abrasive grains 24 into contact with the entire working surface 16. On the other hand, as in this embodiment, when the diamond abrasive grains 24 are confined in the opening portions of the bubbles and the diamond abrasive grains are freely rolled at the portions, the polishing process proceeds in a short time. Touch the entire surface. Therefore, the polishing rate can be sufficiently improved. In addition, as compared with the case where the fixed diamond abrasive grains 24 are strongly pressed against the working surface, the diamond abrasive grains 24 roll while being in contact with the working surface 16 at an appropriate pressure, so that the polishing process proceeds. it can.

ダイヤモンド砥粒24を混入したスラリーを作用面16に流し込んで砥石で押さえながら研磨をしても、ダイヤモンド砥粒24を転がすことができる。しかし、ダイヤモンド砥粒24の位置が次第に偏り、作用面16全面を均一に研磨することが難しい。また、研磨に寄与するダイヤモンド砥粒24の割合が少なく、大部分は無駄に作用面外に押し流される。この実施例では、ダイヤモンド砥粒24を気泡の開口28の内部に閉じこめて、移動を制限しながら研磨処理をするので、ダイヤモンド砥粒24を作用面16全面に均一に分散させた状態を維持できる。研磨に寄与しないダイヤモンド砥粒24の割合は極少である。   The diamond abrasive grains 24 can be rolled even if the slurry mixed with the diamond abrasive grains 24 is poured into the working surface 16 and polished while being pressed by a grindstone. However, the positions of the diamond abrasive grains 24 are gradually shifted, and it is difficult to uniformly polish the entire working surface 16. Further, the proportion of the diamond abrasive grains 24 contributing to polishing is small, and most of them are washed away out of the working surface. In this embodiment, the diamond abrasive grains 24 are confined inside the bubble openings 28 and the polishing process is performed while restricting the movement, so that the diamond abrasive grains 24 can be uniformly dispersed over the entire working surface 16. . The proportion of diamond abrasive grains 24 that do not contribute to polishing is extremely small.

上記の方法は、シリコンウエハやガリウムヒ素等からなる基板の鏡面加工等に適する。また、例えば、セリアスラリー26(日立化成社製、HS-8005/HS-8102GP)は、ケミカルエッチング機能により酸化物除去処理も同時に行える。スラリー26を供給する際の圧力は、多孔質板12の一方の面18から他方の面20に向かってスラリー26がゆっくりと流れる程度の圧力であって、重力による圧力で十分であり、特別に加圧装置は不要である。   The above method is suitable for mirror processing of a substrate made of a silicon wafer, gallium arsenide, or the like. Further, for example, the ceria slurry 26 (manufactured by Hitachi Chemical Co., Ltd., HS-8005 / HS-8102GP) can be subjected to an oxide removal process simultaneously by a chemical etching function. The pressure for supplying the slurry 26 is such a pressure that the slurry 26 flows slowly from one surface 18 of the porous plate 12 toward the other surface 20, and the pressure by gravity is sufficient. A pressurizing device is not necessary.

上記の装置によれば、ダイヤモンドスラリー26が多孔質板12から染み出して、微粒ダイヤモンドでシリコンウエハ表面を研磨すると同時に、スラリー26によりケミカルエッチングがなされ、シリコンウエハ表面の酸化物の除去等もする。即ち、ケミカルエッチングとメカニカルエッチングを同時に行う。なお、研磨対象としては、シリコンウエハの他に、GaAs,InP等が適する。   According to the above apparatus, the diamond slurry 26 exudes from the porous plate 12 and the silicon wafer surface is polished with fine diamond, and at the same time, chemical etching is performed by the slurry 26 to remove oxide on the silicon wafer surface. . That is, chemical etching and mechanical etching are performed simultaneously. In addition to the silicon wafer, GaAs, InP, or the like is suitable as an object to be polished.

また、以上の装置によれば、シリコンウエハに比べて大面積の多孔質板12を採用することができる。具体的には、半径300mm程度の多孔質板12ならば、容易に安価に製造できる。だから、大面積のシリコンウエハ等であっても、研磨痕の無い鏡面仕上げができる。同時に、広い作用面16全体に均一な圧力をかけて研磨することができる。さらに、作用面16の平坦度を高くすることができる。しかも、有効面積が大きく、これによっても研磨時間を短縮できる。従って、全体として従来よりも高速研磨ができるという効果がある。   Moreover, according to the above apparatus, the porous board 12 of a large area is employable compared with a silicon wafer. Specifically, the porous plate 12 having a radius of about 300 mm can be easily manufactured at a low cost. Therefore, even a large-area silicon wafer or the like can be mirror-finished without polishing marks. At the same time, polishing can be performed by applying a uniform pressure to the entire wide working surface 16. Furthermore, the flatness of the working surface 16 can be increased. In addition, the effective area is large, and this also shortens the polishing time. Therefore, there is an effect that the whole can be polished at a higher speed than conventional.

連続気泡22には、スラリー26と共に流入するダイヤモンド砥粒24の粒径より大きい開口を有し、かつ、当該ダイヤモンド砥粒24をトラップする曲折部30を有するものが含まれることが好ましい。連続気泡22に曲折部30があると、ダイヤモンド砥粒24は、多孔質板12のいずれかの連続気泡22中にトラップされる。従って、一気に作用面16に落下することがない。また、多孔質板12の他方の面を被研磨材の作用面に押し付けて研磨処理を続けると、連続気泡中の各部にトラップされたダイヤモンド砥粒が、次々に他方の面上の連続気泡開口部に現れて、良好で安定な研磨機能を発揮する。   The open cells 22 preferably include those having an opening larger than the particle diameter of the diamond abrasive grains 24 flowing together with the slurry 26 and having a bent portion 30 for trapping the diamond abrasive grains 24. When the bent portion 30 is present in the open cell 22, the diamond abrasive grains 24 are trapped in any open cell 22 of the porous plate 12. Therefore, it does not fall on the working surface 16 at a stretch. Further, when the polishing process is continued by pressing the other surface of the porous plate 12 against the working surface of the material to be polished, the diamond abrasive grains trapped in each part in the open cell are successively opened to the open cell on the other surface. Appears in the area and exhibits a good and stable polishing function.

曲折部30はどこにあってもよい。曲折部30の形状、数量等は、多孔質板12の製造条件により自由に選定できる。通常、曲折部30は多孔質板12の内部に均一に分散して存在するから、ダイヤモンド砥粒24も多孔質板12の内部に分散してトラップされ、全体として均一な研磨機能を発揮する。   The bent portion 30 may be anywhere. The shape, quantity, etc. of the bent portion 30 can be freely selected according to the manufacturing conditions of the porous plate 12. Normally, the bent portions 30 are uniformly dispersed inside the porous plate 12, so that the diamond abrasive grains 24 are also dispersed and trapped inside the porous plate 12, thereby exhibiting a uniform polishing function as a whole.

図3は実施例3の装置の側面図である。
この装置は、図1の装置を縦型にしたものである。被研磨材14の作用面16には、絶えず新しいスラリー26が供給されることが好ましい。そこで、多孔質板12の他方の面20をほぼ垂直に保持した状態で研磨処理をする。スラリータンク45には、その上部にスラリーチューブ32を取り付けて、スラリー26を連続供給する。スラリー26は多孔質板12を通過した後、作用面16に沿って垂直に流下する。従って、新しいスラリー26を連続的に供給して研磨することができる。なお、その他の部分については、図1の装置と同様の構成のため、同一の符号を付して重複する説明を省略する。
FIG. 3 is a side view of the apparatus according to the third embodiment.
This apparatus is a vertical version of the apparatus shown in FIG. It is preferable that new slurry 26 is constantly supplied to the working surface 16 of the workpiece 14. Therefore, the polishing process is performed with the other surface 20 of the porous plate 12 held substantially vertically. A slurry tube 32 is attached to the upper part of the slurry tank 45 to continuously supply the slurry 26. After passing through the porous plate 12, the slurry 26 flows down vertically along the working surface 16. Accordingly, the new slurry 26 can be continuously supplied and polished. In addition, about another part, since it is the same structure as the apparatus of FIG. 1, the same code | symbol is attached | subjected and the overlapping description is abbreviate | omitted.

図4実施例4の装置の縦断面図である。
図のように、この装置は、処理剤封入部60と駆動機構66とを備える。処理剤封入部60は、一方の面18から他方の面20に通じる多数の連続気泡22を有する多孔質板12を備える。この多孔質板12は、ダイヤモンド砥粒24を混入した常温で非流動性の液体62を含浸させたものである。さらに、多孔質板12の一方の面18側に配置され、前記ダイヤモンド砥粒24を混入した常温で非流動性の液体62を、前記一方の面18以外の面を塞いで収容した保持容器61を備える。
4 is a longitudinal sectional view of the apparatus of Example 4.
As shown in the figure, this apparatus includes a processing agent enclosure 60 and a drive mechanism 66. The treatment agent enclosure 60 includes a porous plate 12 having a large number of open cells 22 extending from one surface 18 to the other surface 20. This porous plate 12 is impregnated with a non-flowable liquid 62 mixed with diamond abrasive grains 24 at room temperature. Furthermore, a holding container 61 that is disposed on one surface 18 side of the porous plate 12 and contains a non-flowable liquid 62 mixed with the diamond abrasive grains 24 at a room temperature with the surfaces other than the one surface 18 closed. Is provided.

常温で非流動性の液体62には、被研磨材14に対して化学的な影響の無い各種の油脂が使用できる。これにより、図2等を用いて説明した効果を発揮することができる。なお、保持容器61には、適宜空気抜きの孔を設けてもよい。   Various oils and fats that have no chemical influence on the material to be polished 14 can be used for the liquid 62 that is non-flowable at room temperature. Thereby, the effect demonstrated using FIG. 2 etc. can be exhibited. The holding container 61 may be appropriately provided with a vent hole.

液体62にはワセリンやグリスといった石油系材料のほか、植物油等の使用も可能である。液体62を含浸させる方法には、真空含浸法が採用できる。加熱して流動性を高めた液体62にダイヤモンド砥粒24を攪拌しながら混入させ、真空雰囲気内で多孔質板12に一気に含浸させる。また、液体62は研磨処理時に発生した熱により軟化して、若干流動性が高まることが好ましい。これにより、保持容器61の内部に収容されたダイヤモンド砥粒24入りの非流動性の液体62が熱膨張して流動し、多孔質板12を通じて作用面16に押し出される。また、液体中に炭酸カルシューム等を混入させておけば、ケミカル研磨機能も発揮することができる。即ち、常温で高粘度のスラリを使用することができる。   In addition to petroleum-based materials such as petroleum jelly and grease, vegetable oil or the like can be used for the liquid 62. As a method of impregnating the liquid 62, a vacuum impregnation method can be employed. The diamond abrasive grains 24 are mixed in the liquid 62 that has been heated to improve the fluidity while stirring, and the porous plate 12 is impregnated at once in a vacuum atmosphere. Further, it is preferable that the liquid 62 is softened by heat generated during the polishing process, and the fluidity is slightly increased. As a result, the non-flowable liquid 62 containing the diamond abrasive grains 24 accommodated in the holding container 61 is thermally expanded and flows, and is pushed out to the working surface 16 through the porous plate 12. Further, if calcium carbonate or the like is mixed in the liquid, a chemical polishing function can be exhibited. That is, a slurry having a high viscosity at room temperature can be used.

なお、図4の保持容器61には駆動軸63が固定されており、駆動軸63はモータ回転軸とモータチャック65を介して連結される。こうして、この駆動機構53は、多孔質板12の他方の面20を被研磨材14の作用面16に押し付けて、他方の面20と作用面16とを摺り合わせて、被研磨材14を研磨する。常温で非流動性の液体62により、ダイヤモンド砥粒24を多孔質板12の連続気泡22中に保持する。作用面16では、気泡内でダイヤモンド砥粒24が動き廻り、効率のよい研磨ができる。多孔質板12に処理剤を予め含浸させておけば、多孔質板12の連続気泡22中に万遍なくダイヤモンド砥粒24が分散する。   A driving shaft 63 is fixed to the holding container 61 of FIG. 4, and the driving shaft 63 is connected to the motor rotating shaft via a motor chuck 65. Thus, the driving mechanism 53 presses the other surface 20 of the porous plate 12 against the working surface 16 of the workpiece 14 and slides the other surface 20 and the working surface 16 to polish the workpiece 14. To do. The diamond abrasive grains 24 are held in the open cells 22 of the porous plate 12 by the non-flowable liquid 62 at room temperature. On the working surface 16, the diamond abrasive grains 24 move around in the bubbles, so that efficient polishing can be performed. If the porous plate 12 is impregnated with the treatment agent in advance, the diamond abrasive grains 24 are uniformly dispersed in the open cells 22 of the porous plate 12.

図5は実施例4の表面研磨板斜視図である。
上記の多孔質板12を予め大量に生産しておいて、摩耗したら保持容器61から取り外して新しいものと交換するようにして使用するとよい。図5の(a)は交換用の多孔質板12であって、プラスチックケース等にパッケージして販売するとよい。また、図の(b)に示すように、保持容器61と多孔質板12とを一体化したものをアセンブリとして準備しておき、多孔質板12が摩耗したらモータチャック65からアセンブリ全体を取り外して新しいものと交換するようにして使用するとよい。(c)は、保持容器61を薄い金属やプラスチックにより構成して保持容器61と一体化したものである。これを販売して、従来のパッドと交換すればよい。実施例4によれば、スラリーを流動させる機構を多孔質板12の背面に配置する必要が無いので、装置の構成を簡素化できる。
FIG. 5 is a perspective view of a surface polishing plate of Example 4.
The porous plate 12 may be produced in large quantities in advance, and when worn, it may be used by removing it from the holding container 61 and replacing it with a new one. FIG. 5 (a) shows a replacement porous plate 12, which may be packaged and sold in a plastic case or the like. Also, as shown in FIG. 5B, an assembly in which the holding container 61 and the porous plate 12 are integrated is prepared as an assembly, and when the porous plate 12 is worn, the entire assembly is removed from the motor chuck 65. It should be used as a new one. (C) is one in which the holding container 61 is made of a thin metal or plastic and integrated with the holding container 61. This can be sold and replaced with a conventional pad. According to the fourth embodiment, since it is not necessary to arrange a mechanism for flowing the slurry on the back surface of the porous plate 12, the configuration of the apparatus can be simplified.

半導体素子の高集積化高性能化に伴い、層間絶縁膜の平坦化、金属プラグ形成、埋め込み配線形成などの多層配線工程で、CMP (Chemical Mechanical Polishing )が必要不可欠な技術となっている。上記の各実施例によればその研磨パッドの大幅な機能改善を図ることができる。また、良質な表面研磨により、GaAsなどのウェーハの割れ易さを大幅に改善することができる。   Along with the higher integration and higher performance of semiconductor elements, CMP (Chemical Mechanical Polishing) has become an indispensable technology in multilayer wiring processes such as planarization of interlayer insulating films, metal plug formation, and buried wiring formation. According to each of the above embodiments, the function of the polishing pad can be greatly improved. In addition, high-quality surface polishing can greatly improve the fragility of a wafer such as GaAs.

10 表面研磨装置
12 多孔質板
14 被研磨材
16 作用面
18 一方の面
20 他方の面
22 連続気泡
24 ダイヤモンド砥粒
26 スラリー
28 開口
30 曲折部
32 スラリーチューブ
41 ワークチャック
43 砥石ホルダ
44 ビス
45 スラリータンク
47 キャップ
48 吸気孔
49 回転駆動軸
51 スラリー供給部
53 駆動機構
60 処理材封入部
61 保持容器
62 非流動性の液体
63 駆動軸
65 モータチャック
66 駆動機構
DESCRIPTION OF SYMBOLS 10 Surface polishing apparatus 12 Porous board 14 To-be-polished material 16 Working surface 18 One side 20 The other side 22 Open cell 24 Diamond abrasive grain 26 Slurry 28 Opening 30 Bending part 32 Slurry tube 41 Work chuck 43 Grinding stone holder 44 Screw 45 Slurry Tank 47 Cap 48 Air intake hole 49 Rotation drive shaft 51 Slurry supply unit 53 Drive mechanism 60 Processing material enclosure 61 Holding container 62 Non-fluid liquid 63 Drive shaft 65 Motor chuck 66 Drive mechanism

Claims (8)

一方の面から他方の面に通じる多数の連続気泡を有する多孔質板に、室温で多孔質板の他方の面から重力で自然流下しない程度の粘性を持つ液体であって、砥粒を混入したものを含浸させた表面研磨板。   A porous plate having a large number of open cells leading from one side to the other side is a liquid having a viscosity that does not naturally flow down by gravity from the other side of the porous plate at room temperature. Surface polishing plate impregnated with something. 前記液体は、研磨処理時に発生した熱により軟化して流動性が高まる液体である請求項1記載の表面研磨板。   The surface polishing plate according to claim 1, wherein the liquid is a liquid that is softened by heat generated during the polishing process to increase fluidity. 前記多孔質板の前記一方の面側に配置され、前記砥粒を混入した液体を収容する保持容器をさらに備える請求項1または2記載の表面研磨板。   The surface polishing plate according to claim 1, further comprising a holding container that is disposed on the one surface side of the porous plate and stores a liquid mixed with the abrasive grains. 前記砥粒はダイヤモンド砥粒であり、前記多孔質板には前記ダイヤモンド砥粒が混入されている請求項1〜3のいずれかに記載の表面研磨板。   The surface polishing plate according to any one of claims 1 to 3, wherein the abrasive grains are diamond abrasive grains, and the diamond abrasive grains are mixed in the porous plate. 一方の面から他方の面に通じる多数の連続気泡を有する多孔質板に、室温で多孔質板の他方の面から重力で自然流下しない程度の粘性を持つ液体であって、砥粒を混入したものを含浸させた表面研磨板の前記他方の面を被研磨材の作用面に押し付けて、前記他方の面と前記作用面とを摺り合わせて、前記被研磨材を研磨または研削をする表面研磨方法。   A porous plate having a large number of open cells leading from one side to the other side is a liquid having a viscosity that does not naturally flow down by gravity from the other side of the porous plate at room temperature. Surface polishing for polishing or grinding the material to be polished by pressing the other surface of the surface polishing plate impregnated with the surface against the working surface of the material to be polished and sliding the other surface and the working surface together Method. 一方の面から他方の面に通じる多数の連続気泡を有する多孔質板に、室温で多孔質板の他方の面から重力で自然流下しない程度の粘性を持つ液体であって、砥粒を混入したものを含浸させた表面研磨板の前記他方の面を被研磨材の作用面に押し付けて、前記他方の面と前記作用面とを摺り合わせて、前記被研磨材を研磨または研削する機構を備えた表面研磨装置。   A porous plate having a large number of open cells leading from one side to the other side is a liquid having a viscosity that does not naturally flow down by gravity from the other side of the porous plate at room temperature. There is provided a mechanism for polishing or grinding the material to be polished by pressing the other surface of the surface polishing plate impregnated with the surface against the working surface of the material to be polished and sliding the other surface and the working surface together. Surface polishing equipment. 前記表面研磨板の前記一方の面に前記砥粒を混入した前記液体を供給する供給手段を備える請求項6記載の表面研磨装置。   The surface polishing apparatus according to claim 6, further comprising a supply unit that supplies the liquid mixed with the abrasive grains to the one surface of the surface polishing plate. 前記表面研磨板は、前記多孔質板の前記一方の面側に配置され、前記砥粒を混入した液体を収容する保持容器をさらに備え、
前記保持容器は、前記機構と連結する連結部を備える請求項6記載の表面研磨装置。
The surface polishing plate further includes a holding container that is disposed on the one surface side of the porous plate and contains a liquid mixed with the abrasive grains,
The surface polishing apparatus according to claim 6, wherein the holding container includes a connecting portion that is connected to the mechanism.
JP2010023476A 2010-02-04 2010-02-04 Surface polishing method, surface polishing apparatus and surface polishing plate Expired - Fee Related JP5050064B2 (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009269128A (en) * 2008-05-08 2009-11-19 Disco Abrasive Syst Ltd Grinding device and grinding method
CN101844320A (en) * 2010-06-07 2010-09-29 湖南大学 Precise high-efficiency polishing method and device for curved surface parts
JP2014128877A (en) * 2014-03-03 2014-07-10 Femutekku:Kk Surface processing apparatus and method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0992632A (en) * 1995-09-22 1997-04-04 Nippon Steel Corp Chemical mechanical polishing method
JP2000354950A (en) * 1999-06-15 2000-12-26 Sumitomo Metal Ind Ltd Polishing pad, polishing device and method to manufacture polished body having flat surface

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0992632A (en) * 1995-09-22 1997-04-04 Nippon Steel Corp Chemical mechanical polishing method
JP2000354950A (en) * 1999-06-15 2000-12-26 Sumitomo Metal Ind Ltd Polishing pad, polishing device and method to manufacture polished body having flat surface

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009269128A (en) * 2008-05-08 2009-11-19 Disco Abrasive Syst Ltd Grinding device and grinding method
CN101844320A (en) * 2010-06-07 2010-09-29 湖南大学 Precise high-efficiency polishing method and device for curved surface parts
JP2014128877A (en) * 2014-03-03 2014-07-10 Femutekku:Kk Surface processing apparatus and method

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