JP2010071871A5 - - Google Patents
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- JP2010071871A5 JP2010071871A5 JP2008241151A JP2008241151A JP2010071871A5 JP 2010071871 A5 JP2010071871 A5 JP 2010071871A5 JP 2008241151 A JP2008241151 A JP 2008241151A JP 2008241151 A JP2008241151 A JP 2008241151A JP 2010071871 A5 JP2010071871 A5 JP 2010071871A5
- Authority
- JP
- Japan
- Prior art keywords
- signal light
- sample
- signal
- light
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008241151A JP5270280B2 (ja) | 2008-09-19 | 2008-09-19 | 近接場光学顕微鏡の信号光測定システム |
PCT/JP2009/004588 WO2010032429A1 (ja) | 2008-09-19 | 2009-09-15 | 近接場光学顕微鏡の信号光測定システム |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008241151A JP5270280B2 (ja) | 2008-09-19 | 2008-09-19 | 近接場光学顕微鏡の信号光測定システム |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2010071871A JP2010071871A (ja) | 2010-04-02 |
JP2010071871A5 true JP2010071871A5 (es) | 2011-09-15 |
JP5270280B2 JP5270280B2 (ja) | 2013-08-21 |
Family
ID=42039279
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008241151A Active JP5270280B2 (ja) | 2008-09-19 | 2008-09-19 | 近接場光学顕微鏡の信号光測定システム |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5270280B2 (es) |
WO (1) | WO2010032429A1 (es) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101697993B1 (ko) | 2008-11-13 | 2017-01-19 | 브루커 나노, 인코퍼레이션. | 탐침형 원자 현미경 작동 방법 및 장치 |
US8955161B2 (en) | 2008-11-13 | 2015-02-10 | Bruker Nano, Inc. | Peakforce photothermal-based detection of IR nanoabsorption |
US8650660B2 (en) | 2008-11-13 | 2014-02-11 | Bruker Nano, Inc. | Method and apparatus of using peak force tapping mode to measure physical properties of a sample |
EP2507642B1 (en) | 2009-12-01 | 2021-02-24 | Bruker Nano, Inc. | Method and apparatus of operating a scanning probe microscope |
RU2571446C2 (ru) * | 2010-11-29 | 2015-12-20 | Брукер Нано, Инк. | Способ использования полуконтактного режима с фиксированным пиком силы для измерения физических свойств образца |
JP5802417B2 (ja) * | 2011-04-04 | 2015-10-28 | 株式会社日立製作所 | 走査プローブ顕微鏡およびこれを用いた測定方法 |
WO2013051094A1 (ja) * | 2011-10-03 | 2013-04-11 | 株式会社日立製作所 | 走査プローブ顕微鏡 |
US9423416B2 (en) * | 2012-08-28 | 2016-08-23 | Hitachi, Ltd. | Scanning probe microscope and measuring method using same |
FR3001294B1 (fr) * | 2013-01-24 | 2015-03-20 | Ecole Polytech | Microscope a sonde locale multimode, microscope raman exalte par pointe et procede de regulation de la distance entre la sonde locale et l'echantillon |
CN110121644A (zh) | 2016-08-22 | 2019-08-13 | 布鲁克纳米公司 | 使用振荡模式的样本的红外光表征 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3425615B2 (ja) * | 1994-03-24 | 2003-07-14 | 科学技術庁長官官房会計課長 | 走査型近視野原子間力顕微鏡 |
JP4361221B2 (ja) * | 2001-02-15 | 2009-11-11 | エスアイアイ・ナノテクノロジー株式会社 | 走査型近接場顕微鏡におけるイルミネーション反射モードの測定方法 |
EP1616157B1 (en) * | 2003-04-04 | 2012-05-09 | VP Holding, LLC | Method and apparatus for enhanced nano-spectroscopic scanning |
-
2008
- 2008-09-19 JP JP2008241151A patent/JP5270280B2/ja active Active
-
2009
- 2009-09-15 WO PCT/JP2009/004588 patent/WO2010032429A1/ja active Application Filing
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