JP2010044470A5 - - Google Patents

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Publication number
JP2010044470A5
JP2010044470A5 JP2008206443A JP2008206443A JP2010044470A5 JP 2010044470 A5 JP2010044470 A5 JP 2010044470A5 JP 2008206443 A JP2008206443 A JP 2008206443A JP 2008206443 A JP2008206443 A JP 2008206443A JP 2010044470 A5 JP2010044470 A5 JP 2010044470A5
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JP
Japan
Prior art keywords
pulse signal
input pulse
sensor device
path length
capacitive sensor
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Application number
JP2008206443A
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English (en)
Japanese (ja)
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JP5071735B2 (ja
JP2010044470A (ja
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Priority claimed from JP2008206443A external-priority patent/JP5071735B2/ja
Priority to JP2008206443A priority Critical patent/JP5071735B2/ja
Priority to TW098126609A priority patent/TWI392876B/zh
Priority to US12/537,757 priority patent/US8174271B2/en
Priority to KR1020090073247A priority patent/KR20100019398A/ko
Priority to CN2009102214733A priority patent/CN101726669B/zh
Publication of JP2010044470A publication Critical patent/JP2010044470A/ja
Publication of JP2010044470A5 publication Critical patent/JP2010044470A5/ja
Publication of JP5071735B2 publication Critical patent/JP5071735B2/ja
Application granted granted Critical
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2008206443A 2008-08-08 2008-08-08 静電容量型センサーデバイスの容量変化測定回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化測定方法及び電子機器 Expired - Fee Related JP5071735B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2008206443A JP5071735B2 (ja) 2008-08-08 2008-08-08 静電容量型センサーデバイスの容量変化測定回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化測定方法及び電子機器
TW098126609A TWI392876B (zh) 2008-08-08 2009-08-06 電容感測器裝置之電容變化測量電路，電容感測器模組，電容感測器裝置之測量電容變化之方法及電子裝置
US12/537,757 US8174271B2 (en) 2008-08-08 2009-08-07 Capacitance change measuring circuit of capacitive sensor device, capacitive sensor module, method of measuring capacitance change of capacitive sensor device, and electronic device
CN2009102214733A CN101726669B (zh) 2008-08-08 2009-08-10 电容变化测量电路和方法、电容性传感器模块和电子设备
KR1020090073247A KR20100019398A (ko) 2008-08-08 2009-08-10 용량형 센서 디바이스의 용량 변화 측정 회로, 용량형 센서 모듈, 용량형 센서 디바이스의 용량 변화 측정 방법 및 전자 기기

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008206443A JP5071735B2 (ja) 2008-08-08 2008-08-08 静電容量型センサーデバイスの容量変化測定回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化測定方法及び電子機器

Publications (3)

Publication Number Publication Date
JP2010044470A JP2010044470A (ja) 2010-02-25
JP2010044470A5 true JP2010044470A5 (enExample) 2011-08-25
JP5071735B2 JP5071735B2 (ja) 2012-11-14

Family

ID=42015825

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008206443A Expired - Fee Related JP5071735B2 (ja) 2008-08-08 2008-08-08 静電容量型センサーデバイスの容量変化測定回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化測定方法及び電子機器

Country Status (1)

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JP (1) JP5071735B2 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101840294B (zh) * 2010-01-21 2012-01-18 宸鸿科技(厦门)有限公司 一种投射电容式触控面板的扫描方法
JP4727753B1 (ja) * 2010-03-04 2011-07-20 Ｓｍｋ株式会社 静電容量式タッチパネル
JP4727754B1 (ja) * 2010-03-04 2011-07-20 Ｓｍｋ株式会社 静電容量式タッチパネル
JP5531768B2 (ja) * 2010-05-13 2014-06-25 ソニー株式会社 情報入力装置
CN101976147B (zh) * 2010-09-30 2013-03-27 江苏惠通集团有限责任公司 触摸识别方法、触摸键结构及触摸装置
JP4944998B1 (ja) * 2011-04-15 2012-06-06 パナソニック株式会社 タッチパネル装置およびこれを備えたプラズマディスプレイ装置
TWI507951B (zh) * 2011-06-22 2015-11-11 Smk Kk 靜電電容式觸控面板
KR102232111B1 (ko) * 2019-11-18 2021-03-24 송청담 센서용 정전류 회로 및 이를 이용한 정전용량 검출장치
CN112130705B (zh) * 2020-08-25 2024-04-26 业成科技（成都）有限公司 触控结构、电子装置及触控结构的驱动方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04171523A (ja) * 1990-11-06 1992-06-18 Toupure Kk タッチパネルの入力位置判定装置
JP3220405B2 (ja) * 1997-02-20 2001-10-22 アルプス電気株式会社 座標入力装置
JP2003198371A (ja) * 2001-12-26 2003-07-11 Nec Microsystems Ltd Ａ／ｄコンバータ

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