JP5071735B2 - 静電容量型センサーデバイスの容量変化測定回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化測定方法及び電子機器 - Google Patents

静電容量型センサーデバイスの容量変化測定回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化測定方法及び電子機器 Download PDF

Info

Publication number
JP5071735B2
JP5071735B2 JP2008206443A JP2008206443A JP5071735B2 JP 5071735 B2 JP5071735 B2 JP 5071735B2 JP 2008206443 A JP2008206443 A JP 2008206443A JP 2008206443 A JP2008206443 A JP 2008206443A JP 5071735 B2 JP5071735 B2 JP 5071735B2
Authority
JP
Japan
Prior art keywords
pulse signal
input pulse
sensor device
capacitive sensor
potential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008206443A
Other languages
English (en)
Japanese (ja)
Other versions
JP2010044470A (ja
JP2010044470A5 (enExample
Inventor
久門 平坂
修 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP2008206443A priority Critical patent/JP5071735B2/ja
Priority to TW098126609A priority patent/TWI392876B/zh
Priority to US12/537,757 priority patent/US8174271B2/en
Priority to CN2009102214733A priority patent/CN101726669B/zh
Priority to KR1020090073247A priority patent/KR20100019398A/ko
Publication of JP2010044470A publication Critical patent/JP2010044470A/ja
Publication of JP2010044470A5 publication Critical patent/JP2010044470A5/ja
Application granted granted Critical
Publication of JP5071735B2 publication Critical patent/JP5071735B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2008206443A 2008-08-08 2008-08-08 静電容量型センサーデバイスの容量変化測定回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化測定方法及び電子機器 Expired - Fee Related JP5071735B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2008206443A JP5071735B2 (ja) 2008-08-08 2008-08-08 静電容量型センサーデバイスの容量変化測定回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化測定方法及び電子機器
TW098126609A TWI392876B (zh) 2008-08-08 2009-08-06 電容感測器裝置之電容變化測量電路，電容感測器模組，電容感測器裝置之測量電容變化之方法及電子裝置
US12/537,757 US8174271B2 (en) 2008-08-08 2009-08-07 Capacitance change measuring circuit of capacitive sensor device, capacitive sensor module, method of measuring capacitance change of capacitive sensor device, and electronic device
CN2009102214733A CN101726669B (zh) 2008-08-08 2009-08-10 电容变化测量电路和方法、电容性传感器模块和电子设备
KR1020090073247A KR20100019398A (ko) 2008-08-08 2009-08-10 용량형 센서 디바이스의 용량 변화 측정 회로, 용량형 센서 모듈, 용량형 센서 디바이스의 용량 변화 측정 방법 및 전자 기기

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008206443A JP5071735B2 (ja) 2008-08-08 2008-08-08 静電容量型センサーデバイスの容量変化測定回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化測定方法及び電子機器

Publications (3)

Publication Number Publication Date
JP2010044470A JP2010044470A (ja) 2010-02-25
JP2010044470A5 JP2010044470A5 (enExample) 2011-08-25
JP5071735B2 true JP5071735B2 (ja) 2012-11-14

Family

ID=42015825

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008206443A Expired - Fee Related JP5071735B2 (ja) 2008-08-08 2008-08-08 静電容量型センサーデバイスの容量変化測定回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化測定方法及び電子機器

Country Status (1)

Country Link
JP (1) JP5071735B2 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101840294B (zh) * 2010-01-21 2012-01-18 宸鸿科技(厦门)有限公司 一种投射电容式触控面板的扫描方法
JP4727753B1 (ja) * 2010-03-04 2011-07-20 Ｓｍｋ株式会社 静電容量式タッチパネル
JP4727754B1 (ja) * 2010-03-04 2011-07-20 Ｓｍｋ株式会社 静電容量式タッチパネル
JP5531768B2 (ja) * 2010-05-13 2014-06-25 ソニー株式会社 情報入力装置
CN101976147B (zh) * 2010-09-30 2013-03-27 江苏惠通集团有限责任公司 触摸识别方法、触摸键结构及触摸装置
JP4944998B1 (ja) * 2011-04-15 2012-06-06 パナソニック株式会社 タッチパネル装置およびこれを備えたプラズマディスプレイ装置
TWI507951B (zh) * 2011-06-22 2015-11-11 Smk Kk 靜電電容式觸控面板
KR102232111B1 (ko) * 2019-11-18 2021-03-24 송청담 센서용 정전류 회로 및 이를 이용한 정전용량 검출장치
CN112130705B (zh) * 2020-08-25 2024-04-26 业成科技（成都）有限公司 触控结构、电子装置及触控结构的驱动方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04171523A (ja) * 1990-11-06 1992-06-18 Toupure Kk タッチパネルの入力位置判定装置
JP3220405B2 (ja) * 1997-02-20 2001-10-22 アルプス電気株式会社 座標入力装置
JP2003198371A (ja) * 2001-12-26 2003-07-11 Nec Microsystems Ltd Ａ／ｄコンバータ

Also Published As

Publication number Publication date
JP2010044470A (ja) 2010-02-25

Similar Documents

Publication Publication Date Title
JP5071735B2 (ja) 静電容量型センサーデバイスの容量変化測定回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化測定方法及び電子機器
US8174271B2 (en) Capacitance change measuring circuit of capacitive sensor device, capacitive sensor module, method of measuring capacitance change of capacitive sensor device, and electronic device
US10175803B2 (en) Touch sensing device and method for driving the same
TWI469022B (zh) 電容性觸控式螢幕系統以及偵測電容性觸控式螢幕系統上之觸摸的方法
JP5324297B2 (ja) 座標入力装置、およびそれを備える表示装置
US8836666B2 (en) Method and device for reducing noise interference in a capacitive touchscreen system
CN101266348B (zh) 液晶装置、电子仪器和位置确定方法
CN100516988C (zh) 显示器以及其显示系统、电子装置与面板的制造方法
KR101561351B1 (ko) 터치 검출 장치, 터치 검출 기능을 구비한 표시 장치 및 전자 기기
JP5367175B2 (ja) マルチタッチを検知できるタッチパネル及びその装置のマルチタッチ検知方法
JP5885232B2 (ja) タッチセンサパネルコントローラ及び半導体装置
CN110058710A (zh) 触摸显示装置、触摸驱动电路及触摸驱动方法
CN102999212A (zh) 电子装置
JP2010267251A (ja) タッチ式入力装置およびその制御方法
CN111126356A (zh) 具有指纹感测功能的电子装置
JP5642847B2 (ja) 座標入力装置
JP5083144B2 (ja) 静電容量型センサーデバイスの容量変化検出回路、静電容量型センサーモジュール、静電容量型センサーデバイスの容量変化検出方法及び電子機器
US10671211B2 (en) Touch sensing apparatus and common input read method of array signal
JP6034442B2 (ja) 半導体装置
JP5988283B2 (ja) タッチセンサパネルコントローラ及び半導体装置

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110708

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20110708

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120718

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20120726

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20120808

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20150831

Year of fee payment: 3

LAPS Cancellation because of no payment of annual fees