JP2009542451A5 - - Google Patents
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- Publication number
- JP2009542451A5 JP2009542451A5 JP2009518606A JP2009518606A JP2009542451A5 JP 2009542451 A5 JP2009542451 A5 JP 2009542451A5 JP 2009518606 A JP2009518606 A JP 2009518606A JP 2009518606 A JP2009518606 A JP 2009518606A JP 2009542451 A5 JP2009542451 A5 JP 2009542451A5
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- layer
- polishing pad
- pad according
- light transmissive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005498 polishing Methods 0.000 claims 26
- 238000000034 method Methods 0.000 claims 5
- 230000005540 biological transmission Effects 0.000 claims 2
- 239000011248 coating agent Substances 0.000 claims 1
- 238000000576 coating method Methods 0.000 claims 1
- 238000009499 grossing Methods 0.000 claims 1
- 239000012705 liquid precursor Substances 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 230000005499 meniscus Effects 0.000 claims 1
- 239000002243 precursor Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US81842306P | 2006-07-03 | 2006-07-03 | |
| US60/818,423 | 2006-07-03 | ||
| PCT/US2007/072690 WO2008005951A2 (en) | 2006-07-03 | 2007-07-02 | Polishing pad with window having multiple portions |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009542451A JP2009542451A (ja) | 2009-12-03 |
| JP2009542451A5 true JP2009542451A5 (https=) | 2010-08-12 |
| JP5277163B2 JP5277163B2 (ja) | 2013-08-28 |
Family
ID=38895428
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009518606A Active JP5277163B2 (ja) | 2006-07-03 | 2007-07-02 | 複数の部分を有する窓をもつ研磨パッド |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US7942724B2 (https=) |
| JP (1) | JP5277163B2 (https=) |
| TW (1) | TWI370039B (https=) |
| WO (1) | WO2008005951A2 (https=) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7967661B2 (en) * | 2008-06-19 | 2011-06-28 | Micron Technology, Inc. | Systems and pads for planarizing microelectronic workpieces and associated methods of use and manufacture |
| US9017140B2 (en) * | 2010-01-13 | 2015-04-28 | Nexplanar Corporation | CMP pad with local area transparency |
| US20110281510A1 (en) * | 2010-05-12 | 2011-11-17 | Applied Materials, Inc. | Pad Window Insert |
| US9156124B2 (en) | 2010-07-08 | 2015-10-13 | Nexplanar Corporation | Soft polishing pad for polishing a semiconductor substrate |
| TWI521625B (zh) * | 2010-07-30 | 2016-02-11 | 應用材料股份有限公司 | 使用光譜監測來偵測層級清除 |
| JP5918254B2 (ja) * | 2010-11-18 | 2016-05-18 | キャボット マイクロエレクトロニクス コーポレイション | 透過性領域を含む研磨パッド |
| US8920219B2 (en) * | 2011-07-15 | 2014-12-30 | Nexplanar Corporation | Polishing pad with alignment aperture |
| JP2014113644A (ja) * | 2012-12-06 | 2014-06-26 | Toyo Tire & Rubber Co Ltd | 研磨パッド |
| US8961266B2 (en) * | 2013-03-15 | 2015-02-24 | Applied Materials, Inc. | Polishing pad with secondary window seal |
| US20160144477A1 (en) * | 2014-11-21 | 2016-05-26 | Diane Scott | Coated compressive subpad for chemical mechanical polishing |
| US9475168B2 (en) * | 2015-03-26 | 2016-10-25 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Polishing pad window |
| SG11201806662WA (en) * | 2016-02-26 | 2018-09-27 | Applied Materials Inc | Window in thin polishing pad |
| US10213894B2 (en) * | 2016-02-26 | 2019-02-26 | Applied Materials, Inc. | Method of placing window in thin polishing pad |
| WO2018045039A1 (en) * | 2016-08-31 | 2018-03-08 | Applied Materials, Inc. | Polishing system with annular platen or polishing pad |
| JP7022647B2 (ja) | 2018-05-08 | 2022-02-18 | 株式会社荏原製作所 | 光透過性部材、研磨パッドおよび基板研磨装置 |
| US11633830B2 (en) * | 2020-06-24 | 2023-04-25 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | CMP polishing pad with uniform window |
| US12275116B2 (en) | 2020-12-29 | 2025-04-15 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | CMP polishing pad with window having transparency at low wavelengths and material useful in such window |
| TWI901193B (zh) * | 2023-05-19 | 2025-10-11 | 智勝科技股份有限公司 | 研磨墊及其製造方法以及研磨方法 |
| US20250303515A1 (en) * | 2024-03-29 | 2025-10-02 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Multifunctional endpoint detection window |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5893796A (en) * | 1995-03-28 | 1999-04-13 | Applied Materials, Inc. | Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
| US6068539A (en) * | 1998-03-10 | 2000-05-30 | Lam Research Corporation | Wafer polishing device with movable window |
| JP3367496B2 (ja) * | 2000-01-20 | 2003-01-14 | 株式会社ニコン | 研磨体、平坦化装置、半導体デバイス製造方法、および半導体デバイス |
| WO2000060650A1 (en) * | 1999-03-31 | 2000-10-12 | Nikon Corporation | Polishing body, polisher, method for adjusting polisher, method for measuring thickness of polished film or end point of polishing, method for producing semiconductor device |
| US6454630B1 (en) * | 1999-09-14 | 2002-09-24 | Applied Materials, Inc. | Rotatable platen having a transparent window for a chemical mechanical polishing apparatus and method of making the same |
| US6685537B1 (en) * | 2000-06-05 | 2004-02-03 | Speedfam-Ipec Corporation | Polishing pad window for a chemical mechanical polishing tool |
| US6641470B1 (en) * | 2001-03-30 | 2003-11-04 | Lam Research Corporation | Apparatus for accurate endpoint detection in supported polishing pads |
| KR100858392B1 (ko) | 2001-04-25 | 2008-09-11 | 제이에스알 가부시끼가이샤 | 반도체 웨이퍼용 연마 패드와, 이를 구비한 반도체웨이퍼용 연마 적층체와, 반도체 웨이퍼의 연마 방법 |
| JP4570286B2 (ja) * | 2001-07-03 | 2010-10-27 | ニッタ・ハース株式会社 | 研磨パッド |
| JP2003133270A (ja) * | 2001-10-26 | 2003-05-09 | Jsr Corp | 化学機械研磨用窓材及び研磨パッド |
| US7175503B2 (en) * | 2002-02-04 | 2007-02-13 | Kla-Tencor Technologies Corp. | Methods and systems for determining a characteristic of polishing within a zone on a specimen from combined output signals of an eddy current device |
| JP2003285259A (ja) * | 2002-03-28 | 2003-10-07 | Toray Ind Inc | 研磨パッド、研磨装置及び半導体デバイスの製造方法 |
| US20040224611A1 (en) * | 2003-04-22 | 2004-11-11 | Jsr Corporation | Polishing pad and method of polishing a semiconductor wafer |
| US6997777B2 (en) * | 2003-06-17 | 2006-02-14 | Cabot Microelectronics Corporation | Ultrasonic welding method for the manufacture of a polishing pad comprising an optically transmissive region |
| US7264536B2 (en) | 2003-09-23 | 2007-09-04 | Applied Materials, Inc. | Polishing pad with window |
| US7258602B2 (en) * | 2003-10-22 | 2007-08-21 | Iv Technologies Co., Ltd. | Polishing pad having grooved window therein and method of forming the same |
| WO2005104199A1 (ja) * | 2004-04-23 | 2005-11-03 | Jsr Corporation | 半導体ウエハ用研磨パッド及びこれを備える半導体ウエハ用研磨複層体並びに半導体ウエハの研磨方法 |
-
2007
- 2007-06-29 US US11/771,765 patent/US7942724B2/en active Active
- 2007-07-02 JP JP2009518606A patent/JP5277163B2/ja active Active
- 2007-07-02 WO PCT/US2007/072690 patent/WO2008005951A2/en not_active Ceased
- 2007-07-03 TW TW096124191A patent/TWI370039B/zh active
-
2011
- 2011-05-12 US US13/106,635 patent/US8475228B2/en not_active Expired - Fee Related
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