JP2009522810A - 動的処理制御による電気化学処理 - Google Patents
動的処理制御による電気化学処理 Download PDFInfo
- Publication number
- JP2009522810A JP2009522810A JP2008549523A JP2008549523A JP2009522810A JP 2009522810 A JP2009522810 A JP 2009522810A JP 2008549523 A JP2008549523 A JP 2008549523A JP 2008549523 A JP2008549523 A JP 2008549523A JP 2009522810 A JP2009522810 A JP 2009522810A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- processing
- zone
- conductive
- determining
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/18—Electroplating using modulated, pulsed or reversing current
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23H—WORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
- B23H5/00—Combined machining
- B23H5/06—Electrochemical machining combined with mechanical working, e.g. grinding or honing
- B23H5/08—Electrolytic grinding
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
- C25D21/12—Process control or regulation
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/22—Electroplating combined with mechanical treatment during the deposition
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Automation & Control Theory (AREA)
- Weting (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/326,646 US20070158201A1 (en) | 2006-01-06 | 2006-01-06 | Electrochemical processing with dynamic process control |
| PCT/US2006/062476 WO2007120357A2 (en) | 2006-01-06 | 2006-12-21 | Electrochemical processing with dynamic process control |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2009522810A true JP2009522810A (ja) | 2009-06-11 |
| JP2009522810A5 JP2009522810A5 (enExample) | 2009-10-15 |
Family
ID=38231698
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008549523A Pending JP2009522810A (ja) | 2006-01-06 | 2006-12-21 | 動的処理制御による電気化学処理 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20070158201A1 (enExample) |
| JP (1) | JP2009522810A (enExample) |
| TW (1) | TW200733216A (enExample) |
| WO (1) | WO2007120357A2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113430614A (zh) * | 2020-03-23 | 2021-09-24 | 铠侠股份有限公司 | 阳极化装置 |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8192605B2 (en) * | 2009-02-09 | 2012-06-05 | Applied Materials, Inc. | Metrology methods and apparatus for nanomaterial characterization of energy storage electrode structures |
| WO2014149330A1 (en) | 2013-03-15 | 2014-09-25 | Applied Materials, Inc. | Dynamic residue clearing control with in-situ profile control (ispc) |
| US9286930B2 (en) * | 2013-09-04 | 2016-03-15 | Seagate Technology Llc | In-situ lapping plate mapping device |
| CN113622015B (zh) * | 2021-10-12 | 2021-12-24 | 深圳市景星天成科技有限公司 | 在线式电解抛光监测系统 |
| CN115142112A (zh) * | 2022-09-01 | 2022-10-04 | 徐州千帆标识系统工程有限公司 | 一种金属标牌多角度高效电镀装置及方法 |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002093761A (ja) * | 2000-09-19 | 2002-03-29 | Sony Corp | 研磨方法、研磨装置、メッキ方法およびメッキ装置 |
| JP2002110592A (ja) * | 2000-09-27 | 2002-04-12 | Sony Corp | 研磨方法および研磨装置 |
| US20030155255A1 (en) * | 2002-01-22 | 2003-08-21 | Applied Materials, Inc. | Electropolishing of metallic interconnects |
| WO2003080899A1 (fr) * | 2002-03-26 | 2003-10-02 | Sony Corporation | Appareil et procede de polissage electrolytique, procede de fabrication d'un dispositif semi-conducteur |
| US20030230491A1 (en) * | 2001-01-17 | 2003-12-18 | Basol Bulent M. | Method and system monitoring and controlling film thickness profile during plating and electroetching |
| JP2004531885A (ja) * | 2001-04-24 | 2004-10-14 | アプライド マテリアルズ インコーポレイテッド | 電気化学的機械的研磨のための導電性研磨物品 |
| WO2004108358A2 (en) * | 2003-06-06 | 2004-12-16 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| JP2005516383A (ja) * | 2002-01-22 | 2005-06-02 | アプライド マテリアルズ インコーポレイテッド | 電気化学的機械研磨のプロセス制御 |
| JP2005539384A (ja) * | 2002-09-16 | 2005-12-22 | アプライド マテリアルズ インコーポレイテッド | 電気化学的に支援されたcmpにおける除去プロファイルの制御 |
| JP2007123907A (ja) * | 2005-10-28 | 2007-05-17 | Applied Materials Inc | 電圧モード電流制御 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA929891A (en) * | 1968-08-07 | 1973-07-10 | Inoue Kiyoshi | Adaptive ion-control system for electrochemical machining |
| US6848970B2 (en) * | 2002-09-16 | 2005-02-01 | Applied Materials, Inc. | Process control in electrochemically assisted planarization |
| US20040182721A1 (en) * | 2003-03-18 | 2004-09-23 | Applied Materials, Inc. | Process control in electro-chemical mechanical polishing |
| US6991528B2 (en) * | 2000-02-17 | 2006-01-31 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| US6582281B2 (en) * | 2000-03-23 | 2003-06-24 | Micron Technology, Inc. | Semiconductor processing methods of removing conductive material |
| US7134934B2 (en) * | 2000-08-30 | 2006-11-14 | Micron Technology, Inc. | Methods and apparatus for electrically detecting characteristics of a microelectronic substrate and/or polishing medium |
-
2006
- 2006-01-06 US US11/326,646 patent/US20070158201A1/en not_active Abandoned
- 2006-12-21 WO PCT/US2006/062476 patent/WO2007120357A2/en not_active Ceased
- 2006-12-21 JP JP2008549523A patent/JP2009522810A/ja active Pending
- 2006-12-26 TW TW095149050A patent/TW200733216A/zh unknown
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002093761A (ja) * | 2000-09-19 | 2002-03-29 | Sony Corp | 研磨方法、研磨装置、メッキ方法およびメッキ装置 |
| JP2002110592A (ja) * | 2000-09-27 | 2002-04-12 | Sony Corp | 研磨方法および研磨装置 |
| US20030230491A1 (en) * | 2001-01-17 | 2003-12-18 | Basol Bulent M. | Method and system monitoring and controlling film thickness profile during plating and electroetching |
| JP2004531885A (ja) * | 2001-04-24 | 2004-10-14 | アプライド マテリアルズ インコーポレイテッド | 電気化学的機械的研磨のための導電性研磨物品 |
| US20030155255A1 (en) * | 2002-01-22 | 2003-08-21 | Applied Materials, Inc. | Electropolishing of metallic interconnects |
| JP2005516383A (ja) * | 2002-01-22 | 2005-06-02 | アプライド マテリアルズ インコーポレイテッド | 電気化学的機械研磨のプロセス制御 |
| WO2003080899A1 (fr) * | 2002-03-26 | 2003-10-02 | Sony Corporation | Appareil et procede de polissage electrolytique, procede de fabrication d'un dispositif semi-conducteur |
| JP2005539384A (ja) * | 2002-09-16 | 2005-12-22 | アプライド マテリアルズ インコーポレイテッド | 電気化学的に支援されたcmpにおける除去プロファイルの制御 |
| WO2004108358A2 (en) * | 2003-06-06 | 2004-12-16 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| JP2007123907A (ja) * | 2005-10-28 | 2007-05-17 | Applied Materials Inc | 電圧モード電流制御 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113430614A (zh) * | 2020-03-23 | 2021-09-24 | 铠侠股份有限公司 | 阳极化装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2007120357A3 (en) | 2008-01-03 |
| TW200733216A (en) | 2007-09-01 |
| US20070158201A1 (en) | 2007-07-12 |
| WO2007120357A2 (en) | 2007-10-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090826 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20090826 |
|
| RD03 | Notification of appointment of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7423 Effective date: 20101130 |
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| RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20101210 |
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| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120207 |
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| A02 | Decision of refusal |
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