JP2009302284A - Resin sealing method and resin sealing device - Google Patents
Resin sealing method and resin sealing device Download PDFInfo
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- JP2009302284A JP2009302284A JP2008155094A JP2008155094A JP2009302284A JP 2009302284 A JP2009302284 A JP 2009302284A JP 2008155094 A JP2008155094 A JP 2008155094A JP 2008155094 A JP2008155094 A JP 2008155094A JP 2009302284 A JP2009302284 A JP 2009302284A
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L2924/01006—Carbon [C]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H01—ELECTRIC ELEMENTS
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
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- Microelectronics & Electronic Packaging (AREA)
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- Casting Or Compression Moulding Of Plastics Or The Like (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
Description
本発明は、半導体チップが搭載された被成形品(基板、リードフレームなど)を、樹脂にて圧縮封止する樹脂封止装置の技術分野に関する。 The present invention relates to a technical field of a resin sealing device that compresses and seals a molded product (a substrate, a lead frame, etc.) on which a semiconductor chip is mounted with a resin.
従来、図4に示したように、基板14上の平面的に異なる位置に複数配列された半導体チップ15を1つのキャビティ5内に配置して、該キャビティ5内に樹脂17を投入した上で圧縮成形する樹脂封止装置1が公知である(特許文献1参照)。この樹脂封止装置1では、数十個の半導体チップを大型基板上にマトリクス状に配列し、一括封止(MAP封止)後に各パッケージにダイシングするという生産方式が前提となっている。
Conventionally, as shown in FIG. 4, a plurality of
また、圧縮成形の場合、樹脂封止後の成形品のサイズ(特に厚み方向のサイズ)は、キャビティ内に供給する樹脂の量によって左右される。そのため、樹脂の供給にあたっては基板上に搭載されている半導体チップの数や積層高さ等を検出した上で、必要量を厳密に計量し供給されている。 In the case of compression molding, the size of the molded product after resin sealing (particularly the size in the thickness direction) depends on the amount of resin supplied into the cavity. For this reason, when the resin is supplied, the required amount is strictly measured and supplied after detecting the number of semiconductor chips mounted on the substrate, the stacking height, and the like.
例えばより上流の工程において半導体チップの積層不良が確認されたような場合には、基板に半導体チップが搭載されない場合や半導体チップの積層が途中で終了している場合があり、このような場合にはキャビティ全体として必要となる樹脂の量が変化し得るからである。 For example, when a semiconductor chip stacking failure is confirmed in the upstream process, the semiconductor chip may not be mounted on the substrate, or the stacking of the semiconductor chip may be terminated halfway. This is because the amount of resin required for the entire cavity can vary.
たとえ如何に樹脂量を調整してキャビティ内に樹脂を供給しても従来の方式では圧縮時に「樹脂流れ」が発生し、ボンディングワイヤ(金線)の切断や短絡を招くことがあった。これは、必要とされる樹脂17の量を正確にキャビティ5に供給した場合でも、その量は「キャビティ全体として」の総量が一致しているというに過ぎず、キャビティ5を区画化した場合に、区画ごとに最適な樹脂量が供給されていないためと考えられる。即ち、ある区画では、半導体チップが全量搭載されているために、他の区画と比べて必要とされる樹脂量が少ないにも関らず、キャビティ全体で均等割りした量に相当する樹脂が供給されていたり、一方、半導体チップが欠損しているために相対的に必要とされる樹脂量が多いにも関らず、キャビティ全体で均等割りした量に相当する樹脂が供給されている結果、圧縮により樹脂17が過剰な区画A(図5参照)から樹脂が不足している区画Bへと流動するためである。
Even if the amount of the resin is adjusted and the resin is supplied into the cavity, in the conventional method, a “resin flow” occurs during compression, which may cause a bonding wire (gold wire) to be cut or short-circuited. This is because even when the required amount of
かかる問題点を解決するべく出願人は、平面的に異なる位置に複数配列された半導体チップを1つのキャビティ内に配置して、該キャビティ内に樹脂を供給した上で圧縮成形する樹脂封止装置であって、前記キャビティが、該キャビティの平面視における所定の区画に仮想的に分割され、前記樹脂が、前記所定の区画に対応するように区分管理され、該区分管理された樹脂の樹脂量を、前記所定の区画毎に所定のパラメータに基づいて決定するという発明を提案済みである(特願2007−152452号:本願出願時未公知)。即ちこの提案済みの発明は、平面視したキャビティを仮想的にいくつかの区画に分割し、当該区画毎に必要な樹脂を供給することで、圧縮時における樹脂の流動を抑えるというものである。 In order to solve such problems, the applicant arranges a plurality of semiconductor chips arranged at different positions in a plane in one cavity, supplies resin into the cavity, and compresses and molds the resin. The cavity is virtually divided into predetermined sections in a plan view of the cavity, and the resin is divided and managed so as to correspond to the predetermined sections, and the resin amount of the divided and managed resin Has been proposed (Japanese Patent Application No. 2007-152452: not known at the time of filing this application). In other words, the proposed invention virtually divides the cavity in plan view into several sections and supplies the necessary resin for each section, thereby suppressing the resin flow during compression.
しかしながら、半導体チップの積層状態の情報(所定のパラメータ)を受けた後に区画毎の樹脂を計量し、更には予備成形する場合、当該計量や予備成形に相当程度の時間を要し、装置全体のサイクルタイムに影響を与えてしまう。 However, when receiving the information (predetermined parameters) of the stacking state of the semiconductor chip and weighing the resin for each section and further pre-molding, it takes a considerable amount of time for the weighing and pre-molding, The cycle time will be affected.
そこで本発明は、かかる問題点を解決するべくなされたものであって、樹脂の計量や予備成形に要する時間が装置のサイクルタイムに与える影響を低減した樹脂封止方法および樹脂封止装置を提供することをその課題とするものである。 Accordingly, the present invention has been made to solve such problems, and provides a resin sealing method and a resin sealing device that reduce the influence of the time required for resin weighing and preforming on the cycle time of the device. The task is to do.
本発明は、平面的に異なる位置に複数配列された半導体チップを1つのキャビティ内に配置して、該キャビティ内に予備成形樹脂を供給した上で圧縮成形する樹脂封止方法であって、平面的に組み合わせることで前記予備成形樹脂とするための樹脂個片の集合であって、少なくとも2種類以上の容量が揃えられた樹脂個片の集合を予め準備する工程と、該準備された樹脂個片の集合の中から、所定の情報に従って特定の樹脂個片群を選択的に抽出して平面的に組み合わせ、仮置きする工程と、該仮置きした前記樹脂個片群をその組み合わせ関係を保ったままで前記キャビティに前記予備成形樹脂として供給する工程と、を経ることにより上記課題を解決するものである。 The present invention relates to a resin sealing method in which a plurality of semiconductor chips arranged at different positions in a plane are arranged in one cavity, and a preformed resin is supplied into the cavity, followed by compression molding. A set of resin pieces for preliminarily forming the resin by combining them in advance, a step of preparing in advance a set of resin pieces having at least two types of capacities, and the prepared resin pieces A specific resin piece group is selectively extracted from a set of pieces according to predetermined information, combined in a plane, and temporarily placed, and the temporarily placed resin piece group is maintained in its combination relationship. The above-mentioned problem is solved by passing the step of supplying the preform as the preformed resin to the cavity.
換言すると、半導体チップの積層情報を受けた後に樹脂を計量して予備成形するのではなく、予め予備成形樹脂を「容量の異なる樹脂個片の集合」として用意しておき、半導体チップの積層情報を受けた後は、この樹脂個片の集合の中から特定の樹脂個片を選択抽出すると同時に平面的な組み合わせをパズル的に並べ替えて「樹脂個片群」を形成し、その樹脂個片群を予備成形樹脂としてキャビティに投入するという手法である。即ち、半導体チップの積層情報を受けてから樹脂の計量、更には予備成形を必要としていない。その結果、迅速に予備成形樹脂をキャビティへと供給することができると同時に、容量の異なる樹脂個片の平面的な組み合せにより圧縮時の樹脂流れを防止することも可能となっている。 In other words, instead of weighing and pre-molding the resin after receiving the semiconductor chip stacking information, the pre-molded resin is prepared in advance as a “collection of resin pieces having different capacities” and the semiconductor chip stacking information is prepared. After receiving, a specific resin piece is selected and extracted from the set of resin pieces, and at the same time, a planar combination is rearranged in a puzzle to form a “resin piece group”. This is a method in which a group is put into a cavity as a preformed resin. That is, no resin weighing or pre-molding is required after receiving the semiconductor chip stacking information. As a result, the preformed resin can be quickly supplied to the cavity, and at the same time, it is possible to prevent the resin flow during compression by a planar combination of resin pieces having different capacities.
また、前記樹脂個片の集合の1個1個を、2辺が共通且つ1辺が容量に応じて変化する直方体によって構成すれば、個々の樹脂個片の(例えば厚み以外の)大きさを共通化でき、樹脂個片単体でのハンドリングはもとより、樹脂個片群としてのハンドリング(例えばローダによる搬送作業)を画一化できる。 If each of the set of resin pieces is constituted by a rectangular parallelepiped having two sides that are common and one side is changed according to the capacity, the size of each resin piece (for example, other than the thickness) can be reduced. In addition to handling with a single resin piece, it is possible to standardize handling as a group of resin pieces (for example, carrying work by a loader).
また、前記キャビティ内に供給された樹脂個片群の1個1個を、前記半導体チップと1対1の対応関係にあるように構成すれば、基板上に多数存在する半導体チップ個々の積層状態に応じて最適容量の(最適樹脂量の)樹脂個片を最適な位置に供給できるため、圧縮時の樹脂流れを最大限に抑制することができる。 In addition, if each of the resin pieces supplied into the cavity has a one-to-one correspondence with the semiconductor chip, a plurality of stacked semiconductor chips existing on the substrate Accordingly, since the resin piece having the optimum capacity (with the optimum resin amount) can be supplied to the optimum position, the resin flow during compression can be suppressed to the maximum.
また、圧縮時の樹脂の流れ方向が、前記半導体チップに接続されるワイヤの配線方向に沿うように前記樹脂個片群を仮置きし、その位置関係を保ったままで前記キャビティに供給すれば、仮に樹脂流れが生じた場合でもワイヤに無理な力が作用する可能性が低くなり、ワイヤの断線や短絡を防止することが可能となる。 Further, if the resin piece group is temporarily placed so that the flow direction of the resin at the time of compression is along the wiring direction of the wire connected to the semiconductor chip, and supplied to the cavity while maintaining its positional relationship, Even if a resin flow occurs, the possibility that an excessive force acts on the wire is reduced, and it is possible to prevent the wire from being disconnected or short-circuited.
なお本発明は、見方を変えると、平面的に異なる位置に複数配列された半導体チップを1つのキャビティ内に配置して、該キャビティ内に予備成形樹脂を供給した上で圧縮成形する樹脂封止装置であって、平面的に組み合せることで前記予備成形樹脂となる樹脂個片の集合であって、少なくとも2種類以上の容量が揃えられた樹脂個片の集合の中から、所定の情報に従って特定の樹脂個片群を選択的に抽出して平面的に組み合わせる整列機構と、該整列機構により抽出された前記樹脂個片群を仮置きする仮置き部と、該仮置きした前記樹脂個片群をその組み合わせ関係を保ったままで前記キャビティに前記予備成形樹脂として供給する供給機構と、を備えることを特徴とする樹脂封止装置として捉えることも可能である。 From a different viewpoint, the present invention is a resin sealing in which a plurality of semiconductor chips arranged at different positions in a plane are arranged in one cavity, and a preformed resin is supplied into the cavity, followed by compression molding. The apparatus is a set of resin pieces that become the pre-molded resin by combining in a planar manner, and is in accordance with predetermined information from a set of resin pieces with at least two kinds of capacities. An alignment mechanism for selectively extracting a specific group of resin pieces and combining them in a plane, a temporary placement section for temporarily placing the resin piece groups extracted by the alignment mechanism, and the temporarily placed resin pieces It is also possible to grasp as a resin sealing device comprising a supply mechanism for supplying the group as the preformed resin to the cavity while maintaining the combination relationship.
本発明を適用することにより、圧縮時の樹脂流れを防止しつつキャビティ内への迅速な予備成形樹脂の供給を実現することができる。 By applying the present invention, it is possible to quickly supply the preformed resin into the cavity while preventing the resin flow during compression.
以下、添付図面を参照しつつ、本発明の実施形態の一例について説明する。 Hereinafter, an example of an embodiment of the present invention will be described with reference to the accompanying drawings.
図1は、樹脂個片の集合の展開、樹脂個片群の仮置き、樹脂個片群がキャビティに投入されるまでの流れを模式的に示した図である。図2は、半導体チップと樹脂個片(群)の位置関係の第1の例を示した図である。図3は、半導体チップと樹脂個片(群)の位置関係の第2の例を示した図である。 FIG. 1 is a diagram schematically showing the flow of development of a set of resin pieces, temporary placement of a group of resin pieces, and insertion of the group of resin pieces into a cavity. FIG. 2 is a diagram showing a first example of the positional relationship between the semiconductor chip and the resin piece (group). FIG. 3 is a diagram showing a second example of the positional relationship between the semiconductor chip and the resin piece (group).
<樹脂封止装置の構成>
樹脂封止装置100は、圧縮封止工程が行われる上型102と下型104とを有している。これらの金型102、104には図示せぬプレス機構が連結されており、所定のタイミングで当接・離反することが可能とされている。その結果、当該上型102と下型104とで基板(被成形品)150をクランプすることが可能とされている。また下型104は、主として、貫通孔104Bを有する枠状金型104Aと当該貫通孔104Bに進退可能に嵌合して配置された圧縮金型104Cとから構成されている。枠状金型104Aの表面(上型102側表面)に対して圧縮金型104Cの表面(上型102側表面)が凹んだ位置に設定され、当該凹みがキャビティ106を形成している。
<Configuration of resin sealing device>
The resin sealing device 100 includes an upper mold 102 and a lower mold 104 on which a compression sealing process is performed. A press mechanism (not shown) is connected to the molds 102 and 104, and can be brought into contact with and separated from each other at a predetermined timing. As a result, the substrate (molded product) 150 can be clamped by the upper mold 102 and the lower mold 104. The lower mold 104 is mainly composed of a frame-shaped mold 104A having a through-
上型102の表面(下型104側表面)には図示せぬ吸着機構(基板保持機構)が設けれており、当該吸着機構によって基板150を上型102の表面に吸着保持することが可能とされている。 An adsorption mechanism (substrate holding mechanism) (not shown) is provided on the surface of the upper mold 102 (surface on the lower mold 104 side), and the substrate 150 can be adsorbed and held on the surface of the upper mold 102 by the adsorption mechanism. Has been.
基板150にはマトリクス状に、即ち平面的に異なる位置に複数の半導体チップ152が配列・搭載されている。この複数の半導体チップ152は全て、下型104の表面に形成される1つのキャビティ106に収まるようになっている。またキャビティ106は、平面視した状態で、8つの区画(区画A〜H)に仮想的に区画されている。当該区画は、本実施形態においては、基板150上に搭載されている各半導体チップ152の搭載位置に略対応した区画とされている(図2参照)。なお、本実施形態では半導体チップ152が基板150に搭載されている例にて説明しているが、その他にも、リードフレーム上に搭載されているような場合も全く同様である。 A plurality of semiconductor chips 152 are arranged and mounted on the substrate 150 in a matrix, that is, at different positions in a plan view. The plurality of semiconductor chips 152 are all accommodated in one cavity 106 formed on the surface of the lower mold 104. The cavity 106 is virtually partitioned into eight sections (sections A to H) in a plan view. In this embodiment, the section is a section that substantially corresponds to the mounting position of each semiconductor chip 152 mounted on the substrate 150 (see FIG. 2). In this embodiment, the example in which the semiconductor chip 152 is mounted on the substrate 150 has been described. However, the same applies to the case where the semiconductor chip 152 is mounted on the lead frame.
また、本実施形態にかかる樹脂封止装置100には、予備成形部140、整列機構130、仮置き部120が設けられている。 In addition, the resin sealing device 100 according to the present embodiment is provided with a preforming portion 140, an alignment mechanism 130, and a temporary placement portion 120.
予備成形部140は、文字通り、金型102、104に投入するための樹脂を所定の形状に予め成形(予備成形、プレ成形、打錠)する役割を有している。ここでは、例えば、所定量の粉状、粒状、液状等の樹脂を予備成形金型にて加熱・圧縮して板状(シート状)の予備成形樹脂を製造する。この予備成形部140の最も特徴的な部分は、キャビティ106に投入する予備成形樹脂を全体として1枚の板状(シート状)の樹脂として予備成形せずに、それを複数に分割した形状の樹脂個片160として予備成形を行う点である。即ち、この樹脂個片160を複数枚(本実施形態では8枚)平面的に(パズル的に)組み合わせることによって、キャビティ106に投入すべき(完全な)予備成形樹脂が形成される。 The preforming part 140 literally has a role of pre-molding (pre-molding, pre-molding, tableting) a resin to be put into the molds 102 and 104 into a predetermined shape. Here, for example, a predetermined amount of powdery, granular, liquid, or other resin is heated and compressed in a preforming mold to produce a plate-shaped (sheet-shaped) preformed resin. The most characteristic part of the preforming portion 140 is that the preforming resin to be put into the cavity 106 is not preformed as a single plate-like (sheet-like) resin as a whole, and is divided into a plurality of parts. The point is that the resin piece 160 is preformed. That is, by combining a plurality (8 in the present embodiment) of the resin pieces 160 in a plane (in a puzzle), a (complete) preformed resin to be put into the cavity 106 is formed.
また、この予備成形部140は、半導体チップ152の積層状態の情報に頼らずに、予め複数種類の容量(樹脂量)の樹脂個片160を予備形成し、準備する(樹脂個片の集合)。より具体的に説明すると、基板150に搭載される半導体チップ152の殆どは正常に積層されたものであるため、この正常に積層された半導体チップ152に対応する容量(樹脂量)の樹脂個片160を標準品として相対的に多く準備しておく。それと同時に、半導体チップ152の積層状態が異常(全く積層されていない場合、途中までしか積層されていない場合等)な場合に対応する容量(樹脂量)の樹脂個片160を非標準品として相対的に少量準備される。なお予備成形部140には、予備成形された樹脂個片160の実際の容量(樹脂量)を事後的に計測する計測機構も備わっている。 In addition, the preforming unit 140 preliminarily forms and prepares resin pieces 160 having a plurality of types of capacities (resin amounts) without relying on information on the stacked state of the semiconductor chips 152 (collection of resin pieces). . More specifically, since most of the semiconductor chips 152 mounted on the substrate 150 are normally stacked, resin pieces having a capacity (resin amount) corresponding to the normally stacked semiconductor chips 152. A relatively large number of 160 are prepared as standard products. At the same time, the resin piece 160 having a capacity (resin amount) corresponding to a case where the stacked state of the semiconductor chip 152 is abnormal (when not stacked at all, or only partially stacked) is used as a non-standard product. A small amount is prepared. Note that the preforming unit 140 is also provided with a measurement mechanism that measures the actual capacity (resin amount) of the pre-molded resin piece 160 afterwards.
整列機構130は、XYステージに装着された吸着部132によって構成されている。吸着部132は、展開ステージ136上に展開されて配置される樹脂個片の集合162の中から特定の樹脂個片160を選択的に抽出して吸着保持し、仮置き部120へと搬送(整列)することが可能とされている。この整列機構130によって選択・抽出されて仮置き部120に仮置きされている複数の樹脂個片160が「樹脂個片群164」を形成する。またこの整列機構130は、基板150に搭載されている半導体チップ152の積層状態の情報を(例えば前工程から)受け取ることが可能な構成とされている。 The alignment mechanism 130 is configured by a suction part 132 attached to an XY stage. The suction part 132 selectively extracts a specific resin piece 160 from the resin piece set 162 deployed and arranged on the development stage 136, holds it, and conveys it to the temporary placement part 120 ( Alignment). A plurality of resin pieces 160 selected and extracted by the alignment mechanism 130 and temporarily placed in the temporary placement portion 120 form a “resin piece group 164”. In addition, the alignment mechanism 130 is configured to be able to receive information on the stacked state of the semiconductor chips 152 mounted on the substrate 150 (for example, from the previous process).
また、図示していないが、仮置き部120に仮置きされた樹脂個片群164をその組み合せ関係を保ったままでキャビティ106へと供給可能な供給機構(例えば8つの吸着パッドを備えており8つの樹脂個片160(即ち樹脂個片群164)を一度に吸着保持可能な供給機構)が備わっている。 Although not shown, a supply mechanism (for example, having eight suction pads 8 that can supply the resin piece group 164 temporarily placed in the temporary placement section 120 to the cavity 106 while maintaining the combined relationship. One resin piece 160 (that is, a supply mechanism capable of adsorbing and holding the resin piece group 164 at a time) is provided.
<樹脂封止装置の作用>
予備成形部140は、予め樹脂個片160を「樹脂個片の集合」として準備する。例えば、少しずつ容量(樹脂量)の異なる樹脂個片160を数パターン予備成形し(少なくとも「標準品」と「非標準品」の2つのパターンが必要であり、必要により更に「非標準品」を複数のパターンとして予備成形し)、展開ステージ136にこれらの樹脂個片の集合162を展開しておく。予備成形された個々の樹脂個片160は、それぞれ計測機構にて実際の容量(樹脂量)が計測され、その計測結果に応じて展開ステージ136上の所定の位置へと載置・展開される。
<Operation of resin sealing device>
The preforming unit 140 prepares the resin pieces 160 in advance as a “collection of resin pieces”. For example, several patterns of resin pieces 160 having different capacities (resin amounts) are preliminarily molded (at least two patterns of “standard product” and “non-standard product” are necessary, and if necessary, further “non-standard product”. Are pre-formed as a plurality of patterns), and a set 162 of these resin pieces is developed on the development stage 136. Each pre-molded individual resin piece 160 has its actual capacity (resin amount) measured by the measurement mechanism, and is placed and deployed to a predetermined position on the deployment stage 136 according to the measurement result. .
一方で、金型(上型102と下型104)が開いている状態で、図示せぬ基板供給機構によって、上型102の表面に基板150が供給される。この基板150は、上型102の表面に備わっている吸着機構によって吸着されて保持される。当該基板150が上型102へと供給されるに当たって、事前に、パラメータ(所定の情報)として当該基板150上に搭載されている半導体チップ152の積層数や位置(半導体チップの積層状態の情報)が検出される。当該検出は、例えば画像処理により検出してもよいし、当該樹脂封止装置100を含めた上位の生産情報システム(例えばCIM)が構築されている場合には当該システムの情報を利用することも可能である。また、1枚1枚の半導体チップの容積は既知であるため、積層数(積層高さ)情報を基に、基板150上に搭載される半導体チップ152全体の体積を求めることができる。その結果、キャビティ106内に投入すべき樹脂の量(全体量)を算出することが可能となる。 On the other hand, the substrate 150 is supplied to the surface of the upper die 102 by a substrate supply mechanism (not shown) with the molds (the upper die 102 and the lower die 104) open. The substrate 150 is sucked and held by a suction mechanism provided on the surface of the upper mold 102. Before the substrate 150 is supplied to the upper mold 102, the number and position of the semiconductor chips 152 mounted on the substrate 150 as parameters (predetermined information) (position information of the semiconductor chips) Is detected. The detection may be detected by image processing, for example, or when a higher-level production information system (for example, CIM) including the resin sealing device 100 is constructed, information on the system may be used. Is possible. Further, since the volume of each semiconductor chip is known, the volume of the entire semiconductor chip 152 mounted on the substrate 150 can be obtained based on the information on the number of stacked layers (stacked height). As a result, it is possible to calculate the amount of resin (total amount) to be put into the cavity 106.
更に、本実施形態においては、キャビティ106を仮想的に区画しているため、当該区画毎に必要となる樹脂量も同時に把握することが可能である。 Further, in the present embodiment, since the cavity 106 is virtually partitioned, it is possible to simultaneously grasp the amount of resin required for each partition.
この区画毎の情報(区画毎の必要樹脂量の情報)は、整列機構130へと伝達される。当該情報を受け取った整列機構130は、当該情報に基づいて区画毎に最適な量の樹脂個片160を展開ステージ136上に展開された樹脂個片の集合162の中から選び出し、仮置き部120へと整列させる(本実施形態では8枚の樹脂個片160が仮置き部120に仮置きされて樹脂個片群164となる)。 The information for each section (information on the required resin amount for each section) is transmitted to the alignment mechanism 130. The alignment mechanism 130 that has received the information selects an optimal amount of resin pieces 160 for each section from the set of resin pieces 162 developed on the development stage 136 based on the information, and temporarily places the temporary placement unit 120. (In this embodiment, eight resin pieces 160 are temporarily placed on the temporary placement portion 120 to form a resin piece group 164).
この整列された樹脂個片群164における個々の樹脂個片160の位置関係とそれぞれの容量は、基板150上に搭載されている半導体チップ152の位置関係と積層数に完全に対応している。例えば、図1を参照して、基板150上に本来搭載されるべき半導体チップ152が8つである場合に、そのうちの1つの半導体チップ152のみが全く積層されていない(半導体チップ欠損部154)場合であれば、当該半導体チップ欠損部154に対応する位置に所謂「非標準品β」の樹脂個片160が対応し、それ以外の位置に所謂「標準品α」の樹脂個片160が対応する。
The positional relationship and the respective capacities of the individual resin pieces 160 in the aligned resin piece group 164 completely correspond to the positional relationship and the number of stacked layers of the semiconductor chips 152 mounted on the substrate 150. For example, referring to FIG. 1, when there are eight semiconductor chips 152 to be originally mounted on the substrate 150, only one of the semiconductor chips 152 is not stacked at all (semiconductor chip defect portion 154). If so, the so-called “non-standard product β” resin piece 160 corresponds to the position corresponding to the semiconductor
その後、仮置き部120に仮置きされた樹脂個片群164(8枚の樹脂個片160)は、その位置関係を保ったままで、供給機構によってキャビティ106へと供給(投入)される。 Thereafter, the resin piece group 164 (eight resin pieces 160) temporarily placed on the temporary placement unit 120 is supplied (introduced) to the cavity 106 by the supply mechanism while maintaining the positional relationship.
このように、樹脂封止装置100では、半導体チップ152の積層情報を受けた後に樹脂を計量して予備成形するのではなく、予め予備成形樹脂を「容量の異なる樹脂個片160の集合162」として用意しておき、半導体チップ152の積層情報を受けた後は、この樹脂個片160の集合162の中から特定の樹脂個片160を選択・抽出すると同時に平面的な組み合わせをパズル的に並べ替えて「樹脂個片群164」を形成し、その樹脂個片群164を予備成形樹脂としてキャビティ106に投入している。即ち、半導体チップ152の積層情報を受けてから樹脂の計量、更には予備成形をする必要がないため、迅速に予備成形樹脂(樹脂個片群164:8枚の樹脂個片160)をキャビティ106へと供給することができる。また同時に、各区画毎に最適な容量(樹脂量)の樹脂が供給されるため、圧縮時の樹脂流れを最大限防止することが可能となっている。 Thus, in the resin sealing device 100, after receiving the stacking information of the semiconductor chip 152, the resin is not measured and preformed, but the preformed resin is preliminarily “collected 162 of resin pieces 160 having different capacities”. After receiving the stacking information of the semiconductor chip 152, a specific resin piece 160 is selected and extracted from the set 162 of the resin pieces 160, and at the same time, planar combinations are arranged in a puzzle. Instead, a “resin piece group 164” is formed, and the resin piece group 164 is put into the cavity 106 as a preformed resin. That is, since it is not necessary to measure the resin and further perform preforming after receiving the stacking information of the semiconductor chip 152, the preformed resin (resin piece group 164: eight resin pieces 160) can be quickly transferred to the cavity 106. Can be supplied to. At the same time, since an optimal volume (resin amount) of resin is supplied for each section, it is possible to prevent the resin flow during compression to the maximum.
また上記説明した樹脂個片160の集合162に含まれる1個1個の樹脂個片160は、2辺が共通且つ1辺が容量に応じて変化する直方体で構成されている。即ち、容量に応じて厚みだけが異なり、縦×横の大きさ(幅×長さ)は全て共通とされている。その結果、樹脂個片160を整列機構130にて整列させたり、樹脂個片群164を供給機構によって仮置き部120からキャビティ106へと供給する際のハンドリングを画一化できる。 Each of the resin pieces 160 included in the set 162 of the resin pieces 160 described above is formed of a rectangular parallelepiped having two sides that are common and one side changes according to the capacity. That is, only the thickness differs depending on the capacity, and the vertical size and the horizontal size (width × length) are all common. As a result, the resin pieces 160 can be aligned by the alignment mechanism 130, and handling when the resin piece group 164 is supplied from the temporary placement unit 120 to the cavity 106 by the supply mechanism can be made uniform.
また上記では、キャビティ106内に供給された樹脂個片群164を構成する1個1個樹脂個片160が、基板150上に搭載された半導体チップ152と1対1の対応関係となっていた。このような対応関係とすれば、基板150上に多数存在する半導体チップ152それぞれの積層状態に応じて最適容量の(最適樹脂量の)樹脂個片160を最適な位置に供給できるため、圧縮時の樹脂流れを最大限に抑制することができる。ただしこのような「1対1の対応関係」が必須ではなく、必要に応じてその対応関係を変化させることはもちろん可能である。例えば、圧縮時の樹脂の流れ方向を考慮した対応関係としてもよい。より具体的には、圧縮時の樹脂流れが半導体チップ152に接続されるワイヤ(ボンディングワイヤ:金線)の配線方向に沿うように樹脂個片160を配置すれば、仮に圧縮時に樹脂流れが生じた場合でもワイヤに無理な力が作用する可能性が低くなり、ワイヤの断線や短絡を防止することが可能となる。例えば図3に示したように、半導体チップ152から配線されるワイヤが、半導体チップ152の左右方向(図3において左右方向:基板150の長手方向)にのみ存在する場合には、上下に位置する半導体チップ152(区画Aと区画Eに位置する半導体チップ、区画Bと区画Fに位置する半導体チップ…)を跨ぐように1つの樹脂個片160を対応付けるような構成であってもよい。 Further, in the above, the individual resin piece 160 constituting the resin piece group 164 supplied into the cavity 106 has a one-to-one correspondence with the semiconductor chip 152 mounted on the substrate 150. . With such a correspondence, the resin piece 160 having the optimum capacity (the optimum resin amount) can be supplied to the optimum position according to the stacked state of each of the semiconductor chips 152 existing on the substrate 150. The resin flow can be suppressed to the maximum. However, such a “one-to-one correspondence” is not indispensable, and it is of course possible to change the correspondence as necessary. For example, it is good also as the correspondence which considered the flow direction of the resin at the time of compression. More specifically, if the resin pieces 160 are arranged so that the resin flow during compression is along the wiring direction of a wire (bonding wire: gold wire) connected to the semiconductor chip 152, the resin flow is temporarily generated during compression. Even in such a case, the possibility that an excessive force acts on the wire is reduced, and it becomes possible to prevent the wire from being disconnected or short-circuited. For example, as shown in FIG. 3, when wires wired from the semiconductor chip 152 exist only in the left-right direction of the semiconductor chip 152 (left-right direction in FIG. 3: the longitudinal direction of the substrate 150), they are positioned up and down. The configuration may be such that one resin piece 160 is associated with the semiconductor chip 152 (semiconductor chips positioned in the sections A and E, semiconductor chips positioned in the sections B and F).
このような状態で上型102と下型104とを閉じ圧縮成形することにより、区画A〜Hを超えて大きく樹脂の流れが生じることはない。仮に樹脂流れが生じた場合でも、理論的には各区画内における僅かなものとなる。なお、区画の大きさや数、形は特に制限されるものではなく、自由に最適な設計が可能である。区画を細かく設定することによる圧縮時の樹脂流れの防止と、区画を大きく設定することによるより迅速な樹脂供給とのトレードオフ関係から最適値を設定すればよい。 In such a state, the upper mold 102 and the lower mold 104 are closed and compression-molded, so that the resin does not flow greatly beyond the sections A to H. Even if a resin flow occurs, it is theoretically small in each compartment. The size, number, and shape of the sections are not particularly limited, and an optimum design can be freely made. The optimum value may be set based on a trade-off relationship between prevention of resin flow at the time of compression by finely setting the compartments and faster resin supply by setting the compartments large.
また、上記説明した実施形態においては、予備成形部140が樹脂封止装置100の一部として構成されていたが、例えば、予備成形部140が独立した構成とされ、トレーやカセットなどにて樹脂個片160が供給されてもよい。 In the above-described embodiment, the preforming part 140 is configured as a part of the resin sealing device 100. For example, the preforming part 140 is configured to be independent, and the resin is formed by a tray or a cassette. Pieces 160 may be supplied.
また本実施形態のように、樹脂が予備成形された所謂「板状の予備成形樹脂」である場合には、予備成形樹脂を複数に分割された樹脂個片160としてキャビティ106内に供給することによって、キャビティ106への載置時に、樹脂下に空気を巻き込む等の可能性を低減できる。 Further, when the resin is a so-called “plate-shaped preformed resin” in which the resin is preformed as in the present embodiment, the preformed resin is supplied into the cavity 106 as resin pieces 160 divided into a plurality of parts. Therefore, the possibility of air being entrained under the resin when placed in the cavity 106 can be reduced.
本発明は、半導体チップを搭載した基板やリードフレーム等の被成形品を樹脂にて圧縮封止する樹脂封止装置に広く適用することが可能である。 The present invention can be widely applied to a resin sealing apparatus that compresses and seals a molded product such as a substrate or a lead frame on which a semiconductor chip is mounted with a resin.
100…樹脂封止装置
102…上型
104…下型
104A…枠状金型
104B…貫通孔
104C…圧縮金型
106…キャビティ
120…仮置き部
130…整列機構
132…吸着部
136…展開ステージ
140…予備成形部
150…基板
152…半導体チップ
154…半導体チップ欠損部
160…樹脂個片
162…樹脂個片の集合
164…樹脂個片群
DESCRIPTION OF SYMBOLS 100 ... Resin sealing apparatus 102 ... Upper mold 104 ... Lower mold 104A ... Frame-shaped
Claims (5)
平面的に組み合わせることで前記予備成形樹脂とするための樹脂個片の集合であって、少なくとも2種類以上の容量が揃えられた樹脂個片の集合を予め準備する工程と、
該準備された樹脂個片の集合の中から、所定の情報に従って特定の樹脂個片群を選択的に抽出して平面的に組み合わせ、仮置きする工程と、
該仮置きした前記樹脂個片群をその組み合わせ関係を保ったままで前記キャビティに前記予備成形樹脂として供給する工程と、を含む
ことを特徴とする樹脂封止方法。 A resin sealing method in which a plurality of semiconductor chips arranged at different positions in a plane are arranged in one cavity, and a preformed resin is supplied into the cavity and then compression molded,
A set of resin pieces for making the preformed resin by combining in a planar manner, and preparing in advance a set of resin pieces with at least two kinds of capacities aligned;
A step of selectively extracting a specific group of resin pieces according to predetermined information from the set of prepared resin pieces, combining them in a plane, and temporarily placing;
Supplying the temporarily placed resin piece group to the cavity as the preformed resin while maintaining the combination relationship.
前記樹脂個片の集合の1個1個が、2辺が共通且つ1辺が容量に応じて変化する直方体によって構成されている
ことを特徴とする樹脂封止方法。 In claim 1,
A resin sealing method, wherein each one of the set of resin pieces is constituted by a rectangular parallelepiped having two sides in common and one side changing according to a capacity.
前記キャビティ内に供給された樹脂個片群の1個1個が、前記半導体チップと1対1の対応関係にある
ことを特徴とする樹脂封止方法。 In claim 1 or 2,
A resin sealing method, wherein each of the resin piece groups supplied into the cavity has a one-to-one correspondence with the semiconductor chip.
圧縮時の樹脂の流れ方向が、前記半導体チップに接続されるワイヤの配線方向に沿うように前記樹脂個片群を仮置きし、その位置関係を保ったままで前記キャビティに供給する
ことを特徴とする樹脂封止方法。 In any one of Claims 1 thru | or 3,
The resin piece group is temporarily placed so that the flow direction of the resin during compression is along the wiring direction of the wire connected to the semiconductor chip, and the positional relationship is maintained, and the resin is supplied to the cavity. Resin sealing method.
平面的に組み合せることで前記予備成形樹脂となる樹脂個片の集合であって、少なくとも2種類以上の容量が揃えられた樹脂個片の集合の中から、所定の情報に従って特定の樹脂個片群を選択的に抽出して平面的に組み合わせる整列機構と、
該整列機構により抽出された前記樹脂個片群を仮置きする仮置き部と、
該仮置きした前記樹脂個片群をその組み合わせ関係を保ったままで前記キャビティに前記予備成形樹脂として供給する供給機構と、を備える
ことを特徴とする樹脂封止装置。 A resin sealing device in which a plurality of semiconductor chips arranged at different positions in a plane are arranged in one cavity, and a preformed resin is supplied into the cavity and then compression molded,
A specific resin piece according to predetermined information from a set of resin pieces that become the pre-molded resin by combining in a planar manner and have at least two types of capacity. An alignment mechanism for selectively extracting groups and combining them in a plane;
A temporary placement section for temporarily placing the resin piece group extracted by the alignment mechanism;
A resin sealing device, comprising: a supply mechanism that supplies the temporarily placed resin piece group to the cavity as the preformed resin while maintaining the combination.
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JP2004174801A (en) * | 2002-11-26 | 2004-06-24 | Towa Corp | Resin sealing device |
JP2008028189A (en) * | 2006-07-21 | 2008-02-07 | Renesas Technology Corp | Method for manufacturing semiconductor device |
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JP2004174801A (en) * | 2002-11-26 | 2004-06-24 | Towa Corp | Resin sealing device |
JP2008028189A (en) * | 2006-07-21 | 2008-02-07 | Renesas Technology Corp | Method for manufacturing semiconductor device |
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