JP2009169444A - Method for operating laser light source - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method for operating a laser light source which monitors a damage of nonlinear crystal used for the laser light source with high accuracy to stably supply a laser beam. <P>SOLUTION: The method for operating the laser source includes the nonlinear crystal which is a wavelength conversion element, and a wavelength converter having a heater which holds the nonlinear crystal at fixed temperature, and the method includes a step of measuring supply voltage to the heater; and a step of determining a damage state of the nonlinear crystal by comparing a threshold of the supply power by which it is determined that predetermined crystal is damaged with a measurement value obtained by measurement. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a method for operating a laser light source used for various inspections, measurements, and processing, and more particularly to a method for operating a laser light source in the deep ultraviolet region using a nonlinear crystal.

Laser light generally has a higher frequency than radio waves, so it has a large capacity for information, and has the same wavelength and the same phase, so it has excellent monochromaticity and directivity. It has the characteristics that it can be converged very finely, so that energy can be concentrated in a small area and high temperature and high pressure can be realized locally and customarily. It is applied to various fields such as processing technology and medical applications.
Among the lasers used for various applications described above, lasers in the deep ultraviolet region are used particularly for applications where a short wavelength is required. However, in the deep ultraviolet region, there are limitations on the laser medium and the excitation source, making laser oscillation difficult. Therefore, many of these laser sources in the deep ultraviolet region use a method for converting the wavelength of laser output from the relatively stable near infrared to visible region. That is, it is a method using harmonic generation or sum frequency generation using a nonlinear crystal.
In the case of harmonic generation, by inputting laser light having a frequency ω to the nonlinear optical crystal, λ / 2 or λ with respect to a laser output having an integer multiple frequency such as 2ω or 3ω, that is, an input wavelength λ. A laser output with a wavelength shortened to / 3 can be obtained.
In the case of sum frequency generation, laser light having a frequency of ω3 (= ω1 + ω2) is input by inputting laser light having two different frequencies ω1 and ω2 into the nonlinear crystal, that is, an input wavelength λ1. And λ2, a laser output having a wavelength of λ3 shorter than any of the input wavelengths λ1 and λ2 that satisfies the relationship of 1 / λ3 = 1 / λ1 + 1 / λ2 can be obtained.

However, the BBO crystal (BaB ₂ O ₄ ) and the CLBO crystal (CsLiB ₆ O ₁₀ ), which are nonlinear crystals used for sum frequency generation and harmonic generation in the deep ultraviolet region, are easily damaged by light and surrounding moisture. When the nonlinear crystal is damaged, as a result, the output of the laser beam is reduced and the intensity distribution is changed. If it does so, the problem that a measurement precision and processing quality deteriorate in the test | inspection by laser beam, measurement, and a process arises.

  Therefore, in general, when a nonlinear crystal is operated for a long period of time, a crystal that is large to some extent is used, and when the damage occurs, the nonlinear crystal is moved so as to use an undamaged portion. For this reason, the nonlinear crystal is placed on the fine movement mechanism. The nonlinear crystal is installed in a space where the ambient atmosphere can be purged, and heated to a constant temperature with a heater or the like to prevent damage due to moisture.

As described above, it is indispensable to determine the presence or absence of damage in the operation method in which the nonlinear crystal is moved each time the nonlinear crystal is damaged.
For example, an operation method is adopted in which a certain time is provided based on a separately performed damage evaluation result, and the crystal is moved when the usage time of the laser light source exceeds the time. However, in this operation method, a sufficient margin for damage is usually set, so that the crystal moves in spite of the fact that the laser output is not actually deteriorated, and the lifetime of the expensive non-linear crystal is effective. There is a problem that it cannot be used. As a result, the frequency of maintenance of the laser device increases, and there is a problem that the laser device cannot be efficiently used.

  Therefore, Patent Document 1 discloses a method of monitoring damage to a nonlinear crystal by separating a part of laser light irradiated on a workpiece and observing the separated laser light in a laser apparatus using a nonlinear crystal. It is disclosed. FIG. 8 is a block diagram showing this conventional laser apparatus. In FIG. 8, laser light is output from the laser oscillator 82 by the power supplied from the laser power source 89. The laser light output from the laser oscillator is split by the beam splitter 88. Then, the intensity of one of the separated laser beams is measured by the light receiving sensor 84. By monitoring the change in the laser beam intensity, it is determined whether or not the laser beam intensity is reduced, that is, whether or not the nonlinear crystal is damaged.

  Certainly, according to this prior art, it is possible to monitor the damage of the nonlinear crystal used in the laser oscillator by monitoring the change of the laser beam output simultaneously with the laser processing. However, the output of the laser beam always overlaps with the scattered light generated by damaging the nonlinear crystal. For this reason, if the order of the decrease in the output of the laser beam due to damage to the nonlinear crystal and the increase in the scattered light become equal, they are canceled out, making it difficult to truly determine whether the nonlinear crystal is damaged. There is a problem of coming.

JP 2003-46173 A

  The present invention has been made in consideration of the above-described circumstances, and an object of the present invention is to provide a laser light source capable of accurately monitoring damage of a nonlinear crystal used in a laser light source and stably supplying the laser light. Is to provide a method of operation.

A laser light source operation method according to an aspect of the present invention includes:
A laser light source operation method comprising a nonlinear crystal that is a wavelength conversion element, and a wavelength conversion device having a heater that maintains the nonlinear crystal at a constant temperature,
Measuring power supplied to the heater;
A step of determining a damage state of the nonlinear crystal by comparing a threshold value of power supply for determining that the predetermined crystal is damaged and a measurement value obtained by the measurement. .

In addition, a laser light source operation method according to an aspect of the present invention includes:
A laser light source operation method comprising a nonlinear crystal that is a wavelength conversion element, and a wavelength conversion device having a heater that maintains the nonlinear crystal at a constant temperature,
Measuring power supplied to the heater;
Determining a damage state of the non-linear crystal by comparing a threshold value of power supplied to determine that a predetermined crystal is damaged and a measurement value obtained by the measurement;
A step of automatically moving the nonlinear crystal so that laser light input to the nonlinear crystal is received in an area where the nonlinear crystal is not damaged.

  ADVANTAGE OF THE INVENTION According to this invention, it becomes possible to monitor the damage of the nonlinear crystal used for a laser light source with high precision, and to provide the operation method of the laser light source which can supply a laser beam stably.

It is a conceptual diagram which shows the structure of the laser apparatus provided with the laser light source operated with the operation method of Embodiment 1, and the light source. 5 is a diagram for illustrating an operation method according to Embodiment 1. FIG. It is a conceptual diagram which shows the structure of the laser apparatus provided with the laser light source operated with the operation method of Embodiment 2, and the light source. It is a conceptual diagram which shows the structure of the laser apparatus provided with the laser light source operated with the operation method of Embodiment 3, and the light source. It is a figure which shows the relationship between input light and the electric power supplied to a heater. It is a conceptual diagram which shows the structure of the laser apparatus provided with the laser light source operated with the operation | use method of the modification of Embodiment 3, and the light source. It is a conceptual diagram which shows the structure of the laser apparatus provided with the laser light source operated with the operation method of Embodiment 4, and the light source. It is a conceptual diagram which shows the structure of the laser apparatus of a prior art.

  Hereinafter, a method for operating a laser device according to the present invention will be described with reference to the accompanying drawings.

[Embodiment 1]
First, as Embodiment 1 of the present invention, a laser light source operation method including a wavelength conversion device that inputs laser light of two wavelengths into a nonlinear crystal and outputs a sum frequency wavelength, the steady use of the laser light source is used. A step of interrupting at an arbitrary interval, a step of inputting only one of the two wavelengths of laser light into the nonlinear crystal, and a light reception set on the optical axis of the output light of the sum frequency wavelength Measuring the intensity of the scattered light of the laser light of one wavelength by a sensor;
A method for operating a laser light source, comprising the step of determining a damage state of the nonlinear crystal based on a measurement value obtained by measuring the intensity of scattered light will be described.

(Device configuration)
FIG. 1 is a conceptual diagram showing a configuration of a laser light source operated by the operation method of the first embodiment and a laser apparatus including the light source.
The laser device 100 of this embodiment includes a laser light source 101. The laser light source 101 includes a first laser oscillator 2 that generates laser light having a wavelength of λ1, a second laser oscillator 3 that generates laser light having a wavelength of λ2, and a wavelength λ1 output from the first laser oscillator 2. The first shutter 9 that blocks the laser light, the second shutter 10 that blocks the laser light having the wavelength λ2 output from the second laser oscillator 3, and the sum frequency mixing of the laser light having the wavelengths λ1 and λ2 input thereto. A nonlinear crystal 1 that is a wavelength conversion element for generating laser light with a wavelength λ3, and a fine movement device 7 that moves the crystal when the nonlinear crystal 1 is damaged are provided.
In addition, the laser device 100 according to the present embodiment is configured so that the non-linear crystal is damaged based on the light receiving sensor 4 disposed on the optical axis of the laser light of λ3 output from the laser light source 101 and the measured value obtained by the light receiving sensor 4. The determination circuit 5 for determining the state, the irradiated sample 6 irradiated with the laser light of λ3 output from the laser light source 101, and the movable mirror 8 for changing the optical path when the irradiated sample is irradiated with the laser light are provided. .
In FIG. 1, description of components other than those necessary for describing the first embodiment is omitted. Needless to say, the laser apparatus 100 and the laser light source 101 usually include other necessary configurations.

Here, for example, the first laser oscillator 2 uses a YAG laser oscillator having a wavelength of 1064 nm using neodymium as an active material, and the second laser oscillator 3 uses an argon laser oscillator that generates a second harmonic of 244 nm. Then, a CLBO crystal (CsLiB ₆ O ₁₀ ) is used as the nonlinear crystal 1 of the wavelength conversion element. Then, a laser light output having a wavelength of 198.5 nm (= 1 / (1/1064 + 1/244)) is obtained from the laser light source 101 as the sum frequency. When such laser light in the deep ultraviolet region is used, for example, when the laser apparatus 100 is a defect inspection apparatus that uses the irradiated sample 6 as a mask pattern for semiconductor lithography, a 65 nm design that is a next-generation semiconductor product. Even a rule mask can obtain sufficient resolution characteristics and can be an inspection target.

Here, the first laser oscillator 2 and the second laser oscillator 3 are not limited to YAG lasers and argon laser oscillators, and any ruby can be used as long as they can generate sum frequency laser light by sum frequency mixing. A laser, a titanium sapphire laser, or another laser oscillator may be used. Moreover, without a CLBO crystals for nonlinear crystal 1, as long as the crystal to generate a laser beam of sum frequency, BBO crystal _{(BaB 2} O 4), LBO crystal _{(LiB 3 O} 5), be other crystalline It doesn't matter. The light receiving sensor 4 only needs to be capable of monitoring the intensity of the laser beam. For example, the light receiving sensor 4 may be a power meter that uses a photodiode as a light receiving element and measures the total energy received by the light receiving surface, or two-dimensionally. It may be a beam profiler using a plurality of regularly arranged CCD sensors as light receiving elements. Further, the laser apparatus 100 is not limited to a mask defect inspection apparatus as long as it irradiates the irradiated sample 6 with laser light. For example, a semiconductor exposure apparatus (stepper), an optical disk apparatus, and measurement using laser interference. A long device, a laser processing device, and other devices may be used. Further, here, the movable mirror 8 is provided when the sample to be irradiated is irradiated with the laser beam, and the optical path of the laser beam is changed. However, the present invention is not limited to this configuration. As described above, the laser beam may be separated for sample irradiation and for the light receiving sensor 4 using a fixed half mirror. Alternatively, a movable light receiving sensor may be inserted into the optical path of the laser beam only when monitoring the laser beam.

(Operation method)
FIG. 2 is a diagram for explaining an operation method of the laser light source.
In order to monitor the damage state of the nonlinear crystal 1, the regular use of the laser light source (routine use such as inspection, measurement, and processing by irradiating the irradiated sample 6 with laser output light) is interrupted at an arbitrary interval. For example, the interruption for monitoring may be interrupted for monitoring each time of use, every several to several tens of times, or every certain integration time of using the laser light source.
When the damage state of the nonlinear crystal 1 is monitored, the laser light having the wavelength of λ1 is blocked by the first shutter 9 among the two laser beams having the wavelengths of λ1 and λ2. In this case, even if laser light having a wavelength of λ2 is input to the nonlinear crystal 1, a laser output light having a sum frequency of wavelength λ3 is not generated. Therefore, normally, the light received on the optical axis of the laser output light of λ3. The intensity of light input to the sensor 4 is zero. However, the nonlinear crystal 1 is likely to be damaged by light input and output during use of the laser light source and by surrounding moisture. Crystal damage is distortion of the crystal lattice or amorphization of the crystal. When laser light having a wavelength of λ2 is input to the damaged portion, scattered light is generated around the damaged portion. To do. Therefore, this scattered light is also input to the light receiving sensor 4. The intensity of the scattered light has a positive correlation with the degree of damage of the nonlinear crystal 1. Therefore, the determination circuit 5 can determine the movement time of the nonlinear crystal 1 based on the measured value of the light receiving sensor 4 by determining the intensity of scattered light that indicates the limit of the degree of crystal damage in advance. It becomes possible. If the determination circuit 5 determines that it is time to move the non-linear crystal 1, the fine-movement device 7 is used so that the input two-wavelength laser light is received in an area where the crystal is not damaged. The position of the crystal 1 is moved. When the non-damaged region no longer exists in the nonlinear crystal 1, the nonlinear crystal 1 is replaced.

Here, when the scattered light intensity is monitored only for the laser light of one wavelength, it is preferable to perform the laser light of the short wavelength of the two wavelengths because scattering is likely to occur.
In addition, it is more information amount to detect not only one laser beam but also scattered light of both wavelengths by the light receiving sensor 4 alternately and judge the moving time of the crystal based on both measurement results. It is more desirable because it rises.

(effect)
According to the present embodiment, in the conventional monitor of the laser output light, the operation method of determining damage of the nonlinear crystal, which has not been improved in accuracy due to the influence of the scattered light, based on only the intensity of the scattered light, provides higher accuracy. It will be possible in. Then, by moving the nonlinear crystal by determining damage with high accuracy, it becomes possible to supply laser light more stably than in the past. In general, since the light receiving sensor for monitoring the intensity of the laser light output from the laser light source is provided in the laser device, it is not necessary to provide a new light receiving sensor when applying the operation method of the present embodiment. The apparatus configuration is not complicated.

[Embodiment 2]
Next, as a second embodiment of the present invention, there is provided a method of operating a laser light source including a wavelength conversion device that inputs laser light of two wavelengths into a nonlinear crystal and outputs a sum frequency wavelength, and uses the laser light source constantly Is automatically interrupted at an arbitrary interval, and the step of inputting only one of the two wavelength laser beams to the nonlinear crystal and the optical axis of the output light of the sum frequency wavelength A step of measuring the intensity of the scattered light of the laser light of one wavelength by the light receiving sensor installed above, a step of determining the damage state of the nonlinear crystal based on the measurement value obtained by the measurement of the scattered light; A laser light source operating method including a step of automatically moving the nonlinear crystal so that the input laser beam is received in an area where the nonlinear crystal is not damaged will be described.

(Device configuration)
FIG. 3 is a conceptual diagram showing a configuration of a laser light source operated by the operation method of the second embodiment and a laser apparatus including the light source.
The first embodiment is different from the first embodiment in that it includes a fine movement device control circuit 11 that receives an input from the determination circuit 5 and automatically controls the fine movement device 7, and a shutter shut-off circuit 17 that controls the first shutter 9 and the second shutter 10. Is different.

(Operation method)

In order to monitor the damage state of the nonlinear crystal 1, the regular use of the laser light source (routine use such as inspection, measurement, and processing by irradiating the irradiated sample 6 with laser output light) is interrupted at an arbitrary interval. This interruption is automatically performed at a predetermined interval or timing. When the steady use is automatically interrupted for monitoring, the first shutter 9 is shut off by the shutter shut-off circuit 17. Thereafter, the determination circuit 5 determines the movement timing of the nonlinear crystal 1 based on the measurement value from the light receiving sensor 4 as in the first embodiment. Here, when it is determined by the determination circuit 5 that the crystal is moving, the information is automatically input to the fine movement device control circuit 11. Then, based on the signal output from the fine movement device control device 11, the position of the nonlinear crystal 1 is automatically moved by the fine movement device 7 so that the laser input light is received in an area where the crystal is not damaged. At this time, if there is no remaining undamaged region in the nonlinear crystal 1, it is more preferable that the operation method automatically generates a crystal exchange warning.
(effect)

  In addition to the effects of the first embodiment, the steady use is automatically interrupted and the movement of the crystal is automated when it is determined that the movement time of the nonlinear crystal 1 is automatic. Compared with the case of performing, it is possible to reduce time loss and improve the operating rate of the apparatus.

[Embodiment 3]
Next, as a third embodiment of the present invention, there is provided a laser light source operation method including a nonlinear crystal that is a wavelength conversion element and a wavelength conversion device that includes a heater that maintains the nonlinear crystal at a constant temperature. A method of operating a laser light source, comprising: a step of measuring, and a step of determining a damage state of the nonlinear crystal based on a measurement value obtained by measuring a supply power will be described.

(Device configuration)
FIG. 4 is a conceptual diagram illustrating a configuration of a laser light source operated by the operation method of the third embodiment and a laser apparatus including the light source.
The laser device 100 of this embodiment includes a laser light source 101. The laser light source 101 includes a first laser oscillator 2 that generates laser light having a wavelength of λ1, a second laser oscillator 3 that generates laser light having a wavelength of λ2, and a sum frequency mixing of laser light having wavelengths λ1 and λ2. A nonlinear crystal 1 which is a wavelength conversion element for generating a laser beam of λ3, and a fine movement device 7 for moving the crystal when the nonlinear crystal 1 is damaged are provided. Furthermore, a heater 13 and a temperature sensor 12 are provided for keeping the nonlinear crystal 1 at a constant temperature in order to prevent damage due to moisture absorption of the moisture around the nonlinear crystal 1 and to suppress fluctuations in the characteristics of the laser output light due to temperature. ing.
In addition, the laser device 100 of the present embodiment includes a temperature control circuit 14 that controls the temperature of the heater 13 based on information from the temperature sensor 12 as a temperature holding mechanism of the nonlinear crystal 1 and a power supply source to the heater 13. The power supply 15 is provided. In addition, a wattmeter 16 that monitors the power supplied to the heater 13, a determination circuit 5 that determines the damage state of the nonlinear crystal based on the measured value obtained from the wattmeter 16, and a λ3 laser beam output from the laser light source 101 The sample 8 to be irradiated is provided with a mirror 8 that changes the optical path when the sample 6 is irradiated with laser light.
In FIG. 4, the description is omitted except for the components necessary for explaining the third embodiment. Needless to say, the laser apparatus 100 and the laser light source 101 usually include other necessary configurations.

  Here, for example, if the first laser oscillator 2 is a YAG laser oscillator having a wavelength of 1064 nm using neodymium as an active substance, and an argon laser oscillator that generates a second harmonic of 244 nm is used as the second laser oscillator 3, A laser beam output having a wavelength of 198.5 nm is obtained from the laser light source 101. Then, when such a deep ultraviolet laser beam is used, for example, it is possible to inspect a mask of a 65 nm design rule product, which is a next-generation semiconductor product, as in the first embodiment.

Here, the first laser oscillator 2 and the second laser oscillator 3 are not limited to YAG lasers and argon laser oscillators, and any ruby can be used as long as they can generate sum frequency laser light by sum frequency mixing. A laser, a titanium sapphire laser, or another laser may be used. The nonlinear crystal 1 may be a BBO crystal (BaB ₂ O ₄ ), an LBO crystal (LiB ₃ O ₅ ), or another crystal as long as it is a crystal that generates a sum frequency laser beam, even if it is not a CLBO crystal. It doesn't matter. Although the power supply to the heater 13 is monitored by the power meter 16, if the power supply amount from the power source 15 to the heater 13 can be monitored, it is not necessarily a wattmeter but a measuring device such as an ammeter. It doesn't matter. Further, the laser device 100 is not limited to a mask defect inspection device as long as it is a device that irradiates the irradiated sample 6 with a laser, and is, for example, a length measuring device using laser interference, a laser processing device, or other devices. It doesn't matter. Here, the mirror 8 is provided when the sample to be irradiated is irradiated with the laser beam, and the optical path of the laser beam is changed. However, the present invention is not limited to this configuration. For example, the optical path is not bent. The irradiated sample may be directly irradiated, or the optical path may be changed by a plurality of mirrors.

(Operation method)
Usually, in the nonlinear crystal 1, a part of the input light is converted into heat, so that the power supplied to the heater 15 and the power of the input light have a certain negative correlation. FIG. 5 shows the power of the input light and the heater when the power of one of the two wavelengths of laser light input to the nonlinear crystal 1 is fixed and the power of the laser output light is controlled by changing the other power. It is a schematic diagram which shows the relationship of the supplied electric power. The black circle in the figure shows the relationship between the two when the nonlinear crystal 1 is not damaged. As is apparent from the figure, when the power of the input light is increased, the amount of power supplied to the heater required to keep the temperature of the nonlinear crystal 1 constant decreases. However, when the nonlinear crystal 1 is damaged due to long-term use of the laser light source 101, more light-heat conversion than usual occurs in the damaged portion. Therefore, the power supplied to the heater 13 for keeping the nonlinear crystal 1 at a constant temperature decreases, and deviates from the correlation when the nonlinear crystal 1 is not damaged, as shown by the white circles in FIG.
In the operation method of the present embodiment, the power supplied to the heater 13 necessary for keeping the nonlinear crystal 1 at a constant temperature is calibrated in advance with respect to the power of the laser input light to be used. From the calibration, the threshold value of the power supply for determining that the nonlinear crystal 1 is damaged to the extent that the crystal should be moved, that is, the correlation between the power of the input light and the power supplied to the heater is significantly deviated. Is determined and input to the determination circuit 5 as a determination threshold value.
The power meter 16 monitors the power supplied from the power source 15 to the heater while the laser light source 101 is used, and the determination circuit 5 compares the measured value with a threshold value to determine the movement time of the nonlinear crystal 1. It becomes possible to judge in If the determination circuit 5 determines that it is time to move the nonlinear crystal 1, the position where the input two-wavelength laser light is received in an area where the nonlinear crystal 1 is not damaged using the fine movement device 7. The nonlinear crystal 1 is moved to When the non-damaged region no longer exists in the nonlinear crystal 1, the nonlinear crystal 1 is replaced.
Note that the determination of the movement time of the nonlinear crystal 1 is not necessarily limited to the method based on the deviation of the supplied power from the one-variable correlation function with only the power of the input light as the variable, with the set temperature being fixed. When the set temperature is tuned according to the light receiving position of the crystal, a method based on the deviation of the supplied power from the correlation function of the two variables of the input light power and the set temperature may be used.

(effect)
According to this embodiment, in the conventional laser output light monitor, the non-linear crystal damage determination, which has not been improved due to the influence of scattered light, is determined based on the fluctuation of the power supplied to the heater. It will be possible with high accuracy. Then, by moving the nonlinear crystal by determining damage with high accuracy, it becomes possible to supply laser light more stably than in the past. In addition, since the damage state of the nonlinear crystal 1 can be monitored in a steady use state, it is not necessary to provide a special monitoring time, and the apparatus can be used efficiently. Furthermore, in applying the operation method of the present embodiment, since the temperature holding mechanism provided in the laser device is usually used, changes in the new device configuration such as addition of a wattmeter and change in the configuration of the judgment circuit are limited. It does not complicate the apparatus configuration.

[Modification of Embodiment 3]
Next, as a modification of the third embodiment of the present invention, a case where an operation method for determining nonlinear crystal damage based on fluctuations in power supplied to a heater is applied to a laser light source that generates harmonics will be described. To do.

(Device configuration)
FIG. 6 is a conceptual diagram showing a configuration of a laser light source operated by the operation method of the modification of the third embodiment and a laser device including the light source.
The configuration is the same as that of the third embodiment except that a laser light source that generates harmonics is used instead of a laser light source that generates a sum frequency in the laser light source.
The laser light source 101 includes a first laser oscillator 2 that generates a wavelength of λ1, and a nonlinear crystal 1 that is a wavelength conversion element for generating laser light of a wavelength λ2 that is a harmonic of the wavelength λ1.

  Here, for example, the laser oscillator 2 uses a YAG laser oscillator having a wavelength of 1064 nm using neodymium as an active substance. Then, a CLBO crystal (CsLiB6O10) is used as the nonlinear crystal 1 of the wavelength conversion element. Then, a laser light output with a wavelength of 532 nm (= 1 / (1/1064 + 1/1064)) is obtained from the laser light source 101 as the second harmonic of the laser light with a wavelength of 1064 nm.

The laser oscillator 2 is not limited to a YAG laser oscillator, and may be a ruby laser, a titanium sapphire laser, or another laser as long as it can generate a harmonic laser beam by being incident on a nonlinear crystal. It doesn't matter. In addition, a mode in which a fundamental wave output from the laser oscillator 2 is converted into a harmonic wave may be input to the nonlinear crystal 1 in order to further convert it into a higher wavelength harmonic wave. Even if the nonlinear crystal 1 is not a CLBO crystal, it may be a BBO crystal (BaB ₂ O ₄ ), an LBO crystal (LiB ₃ O ₅ ), or another crystal as long as it is a crystal that generates harmonic laser light. It doesn't matter.
(Operation method)

The operation method in the modification of the present embodiment is the same as that of the third embodiment, except that the laser beam incident on the nonlinear crystal 1 has only one wavelength during calibration.
(effect)

  According to the modification of the present embodiment, in the conventional monitor of laser output light, the damage determination of the nonlinear crystal used for the generation of harmonics whose accuracy has not been improved due to the influence of scattered light is based on fluctuations in the power supplied to the heater. This makes it possible to judge damage with higher accuracy. Then, by moving the nonlinear crystal by determining damage with high accuracy, it becomes possible to supply laser light more stably than in the past. Further, the point that the laser device can be efficiently used and the device configuration is not complicated are the same as in the third embodiment.

[Embodiment 4]
Next, as Embodiment 4 of the present invention, there is provided a laser light source operation method including a nonlinear crystal that is a wavelength conversion element and a wavelength conversion device that has a thermal insulation mechanism that maintains the nonlinear crystal at a constant temperature. The step of measuring the input parameters to the heater, the step of judging the damage state of the nonlinear crystal based on the measurement value obtained by the measurement, and the input laser beam are received in an area where the nonlinear crystal is not damaged. A laser light source operating method including the step of automatically moving the nonlinear crystal will be described.

(Device configuration)
FIG. 7 is a conceptual diagram showing a configuration of a laser light source operated by the operation method of the fourth embodiment and a laser apparatus including the light source.
The third embodiment is different from the third embodiment in that a fine movement device control circuit 11 that receives an input from the determination circuit 5 and automatically controls the fine movement device 7 is provided.
Although the laser light source 101 has a sum frequency in FIG. 7, it does not matter if it uses a sum frequency or a harmonic.

(Operation method)

The point of determining the moving time of the nonlinear crystal 1 by the determination circuit 5 based on the measured value from the wattmeter 16 is the same as in the first embodiment. Here, when it is determined by the determination circuit 5 that the crystal is moving, the information is automatically input to the fine movement device control circuit 11. Then, based on the signal output from the fine movement device control circuit 11, the nonlinear crystal is automatically moved by the fine movement device 7 to a position where the input laser light is received in an area where the nonlinear crystal 1 is not damaged. . At this time, if there is no remaining undamaged region in the nonlinear crystal 1, it is more preferable that the operation method automatically generates a crystal exchange warning.
(effect)

  In addition to the effects of the third embodiment, when the movement time of the nonlinear crystal 1 is determined, the movement of the crystal is automated, so the time loss is reduced compared to the case where the operator manually moves the crystal. It is possible to improve the operating rate of the apparatus.

  The embodiments of the present invention have been described above with reference to specific examples. In the description of the embodiment, the description of the device configuration, control method, etc. that is not directly necessary for the description of the present invention is omitted, but the required device configuration and control method should be appropriately selected and used. Can do.

  In addition, all laser light source operation methods that include elements of the present invention and that can be appropriately modified by those skilled in the art are included in the scope of the present invention.

DESCRIPTION OF SYMBOLS 1 Nonlinear crystal 2 1st laser oscillator 3 2nd laser oscillator 4 Light reception sensor 5 Judgment circuit 6 Irradiated sample 7 Fine movement device 8 Mirror 9 First shutter 10 Second shutter 11 Fine movement device control circuit 12 Temperature sensor 13 Heater 14 Temperature Control Circuit 15 Power Supply 16 Wattmeter 17 Shutter Shutdown Circuit 100 Laser Device 101 Laser Light Source

Claims (4)

A laser light source operation method comprising a nonlinear crystal that is a wavelength conversion element, and a wavelength conversion device having a heater that maintains the nonlinear crystal at a constant temperature,
Measuring power supplied to the heater;
A step of determining a damage state of the nonlinear crystal by comparing a threshold value of power supply for determining that the predetermined crystal is damaged and a measurement value obtained by the measurement. Laser light source operation method. A laser light source operation method comprising a nonlinear crystal that is a wavelength conversion element, and a wavelength conversion device having a heater that maintains the nonlinear crystal at a constant temperature,
Measuring power supplied to the heater;
Determining a damage state of the non-linear crystal by comparing a threshold value of power supplied to determine that a predetermined crystal is damaged and a measurement value obtained by the measurement;
And a step of automatically moving the nonlinear crystal so that laser light input to the nonlinear crystal is received in an area where the nonlinear crystal is not damaged.   3. The laser light source operating method according to claim 1, wherein the wavelength converter is a wavelength converter that inputs laser light of two wavelengths into a nonlinear crystal and outputs a sum frequency wavelength.   3. The laser light source operating method according to claim 1, wherein the wavelength conversion device is a wavelength conversion device that inputs laser light of one wavelength to a nonlinear crystal and outputs a harmonic wavelength.

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