JP2009147171A - プラズマ処理装置 - Google Patents

プラズマ処理装置 Download PDF

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Publication number
JP2009147171A
JP2009147171A JP2007323872A JP2007323872A JP2009147171A JP 2009147171 A JP2009147171 A JP 2009147171A JP 2007323872 A JP2007323872 A JP 2007323872A JP 2007323872 A JP2007323872 A JP 2007323872A JP 2009147171 A JP2009147171 A JP 2009147171A
Authority
JP
Japan
Prior art keywords
stage
mask
plasma processing
substrate
processing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2007323872A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009147171A5 (https=
Inventor
Satoki Kobayashi
聡樹 小林
Masaki Sugiyama
正樹 杉山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to JP2007323872A priority Critical patent/JP2009147171A/ja
Priority to CN2008101727183A priority patent/CN101459054B/zh
Priority to US12/331,596 priority patent/US20090151638A1/en
Priority to TW097148521A priority patent/TW200931573A/zh
Priority to KR1020080126788A priority patent/KR101048192B1/ko
Publication of JP2009147171A publication Critical patent/JP2009147171A/ja
Publication of JP2009147171A5 publication Critical patent/JP2009147171A5/ja
Ceased legal-status Critical Current

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    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/04—Coating on selected surface areas, e.g. using masks
    • C23C16/042—Coating on selected surface areas, e.g. using masks using masks
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/511—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using microwave discharges
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32532—Electrodes
    • H01J37/32568—Relative arrangement or disposition of electrodes; moving means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32—Gas-filled discharge tubes
    • H01J37/32431—Constructional details of the reactor
    • H01J37/32623—Mechanical discharge control means
    • H01J37/32633—Baffles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
JP2007323872A 2007-12-14 2007-12-14 プラズマ処理装置 Ceased JP2009147171A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2007323872A JP2009147171A (ja) 2007-12-14 2007-12-14 プラズマ処理装置
CN2008101727183A CN101459054B (zh) 2007-12-14 2008-11-11 等离子体处理装置
US12/331,596 US20090151638A1 (en) 2007-12-14 2008-12-10 Plasma processing apparatus
TW097148521A TW200931573A (en) 2007-12-14 2008-12-12 Plasma processing apparatus
KR1020080126788A KR101048192B1 (ko) 2007-12-14 2008-12-12 플라즈마 처리 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007323872A JP2009147171A (ja) 2007-12-14 2007-12-14 プラズマ処理装置

Publications (2)

Publication Number Publication Date
JP2009147171A true JP2009147171A (ja) 2009-07-02
JP2009147171A5 JP2009147171A5 (https=) 2010-12-09

Family

ID=40751566

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007323872A Ceased JP2009147171A (ja) 2007-12-14 2007-12-14 プラズマ処理装置

Country Status (5)

Country Link
US (1) US20090151638A1 (https=)
JP (1) JP2009147171A (https=)
KR (1) KR101048192B1 (https=)
CN (1) CN101459054B (https=)
TW (1) TW200931573A (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012044145A (ja) * 2010-07-20 2012-03-01 Tokyo Electron Ltd シールド部材、その構成部品及びシールド部材を備えた基板載置台
JP2015065472A (ja) * 2014-12-10 2015-04-09 東京エレクトロン株式会社 リング状シールド部材、その構成部品及びリング状シールド部材を備えた基板載置台
WO2017188170A1 (ja) * 2016-04-28 2017-11-02 株式会社アルバック 成膜用マスク及び成膜装置

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI449080B (zh) * 2012-07-25 2014-08-11 Au Optronics Corp 電漿反應機台
CN103132016B (zh) * 2013-02-22 2015-05-13 京东方科技集团股份有限公司 一种膜边调整器
CN103730318B (zh) * 2013-11-15 2016-04-06 中微半导体设备(上海)有限公司 一种晶圆边缘保护环及减少晶圆边缘颗粒的方法
CN104073776A (zh) * 2014-07-04 2014-10-01 深圳市华星光电技术有限公司 一种化学气相沉积设备
JP6054470B2 (ja) * 2015-05-26 2016-12-27 株式会社日本製鋼所 原子層成長装置
CN118382921A (zh) * 2021-11-09 2024-07-23 恩特格里斯公司 包括运动限制特征的光罩盒及其组装方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001274104A (ja) * 1999-12-10 2001-10-05 Applied Materials Inc 自己整列の非接触シャドーリング処理キット
JP2007527628A (ja) * 2004-03-05 2007-09-27 アプライド　マテリアルズ　インコーポレイテッド 傾斜した堆積を低減するためのハードウェア開発

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5803977A (en) * 1992-09-30 1998-09-08 Applied Materials, Inc. Apparatus for full wafer deposition
US5352294A (en) * 1993-01-28 1994-10-04 White John M Alignment of a shadow frame and large flat substrates on a support
US6033480A (en) * 1994-02-23 2000-03-07 Applied Materials, Inc. Wafer edge deposition elimination
US5632873A (en) * 1995-05-22 1997-05-27 Stevens; Joseph J. Two piece anti-stick clamp ring
JP2001525997A (ja) * 1997-05-20 2001-12-11 東京エレクトロン株式会社 処理装置
US6186092B1 (en) * 1997-08-19 2001-02-13 Applied Materials, Inc. Apparatus and method for aligning and controlling edge deposition on a substrate

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001274104A (ja) * 1999-12-10 2001-10-05 Applied Materials Inc 自己整列の非接触シャドーリング処理キット
JP2007527628A (ja) * 2004-03-05 2007-09-27 アプライド　マテリアルズ　インコーポレイテッド 傾斜した堆積を低減するためのハードウェア開発

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012044145A (ja) * 2010-07-20 2012-03-01 Tokyo Electron Ltd シールド部材、その構成部品及びシールド部材を備えた基板載置台
JP2015065472A (ja) * 2014-12-10 2015-04-09 東京エレクトロン株式会社 リング状シールド部材、その構成部品及びリング状シールド部材を備えた基板載置台
WO2017188170A1 (ja) * 2016-04-28 2017-11-02 株式会社アルバック 成膜用マスク及び成膜装置
KR20180126549A (ko) * 2016-04-28 2018-11-27 가부시키가이샤 아루박 성막용 마스크 및 성막 장치
KR102192206B1 (ko) * 2016-04-28 2020-12-16 가부시키가이샤 아루박 성막용 마스크 및 성막 장치

Also Published As

Publication number Publication date
TW200931573A (en) 2009-07-16
KR101048192B1 (ko) 2011-07-08
CN101459054B (zh) 2010-09-22
KR20090064339A (ko) 2009-06-18
US20090151638A1 (en) 2009-06-18
CN101459054A (zh) 2009-06-17

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