JP2009139519A - Stroboscope device and imaging apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a stroboscope device capable of preventing temperature of the stroboscope device from reaching regulated temperature in multiple light emission. <P>SOLUTION: The stroboscope device includes a light emission information acquiring means (S102) acquiring emitted light quantity and the number of light-emitting times which are to be designated, and an calculation means (S103) calculating an upper limit on the number of light-emitting times for preventing the temperature from reaching a regulated value by using information on the emitted light quantity. If the upper limit on the number of light-emitting times is lower than the designated number of light-emitting times, light emission is performed by the arithmetically calculated upper limit on the number of light-emitting times (NO in S106). <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a strobe device and an imaging device including the strobe device.

Conventionally, various techniques relating to mitigating temperature rise of a light emitting unit, a charging circuit, and the like due to continuous light emission of a strobe device have already been proposed. Patent Documents 1 and 2 propose a technique for changing charge control in order to mitigate a temperature rise. Patent Document 3 proposes a technique for prohibiting a light emitting operation.
Japanese Patent Laid-Open No. 5-216096 Japanese Patent Laid-Open No. 10-206941 Japanese Patent Laid-Open No. 2006-58490

  However, the above-described conventional technology does not consider so-called multiple light emission in which light is emitted a plurality of times in one sequence. Therefore, if the conventional technology is applied to the multi-flash as it is, there is a problem that the temperature rise mitigation function works before the predetermined number of flashes are emitted during the multi-flash and the intended flash cannot be performed because the flash is stopped. there were.

  Further, if the conventional technique is applied by combining a plurality of light emissions in a multi-light emission into a single light emission, there is a problem that the temperature rise mitigating function works excessively and misses a photo opportunity.

(Object of invention)
An object of the present invention is to provide a stroboscopic device and an imaging device that can suppress the temperature of the stroboscopic device from reaching a specified temperature during multi-emission.

  In order to achieve the above object, the present invention is a stroboscope device having a temperature rise mitigation function, using emission information acquisition means for acquiring an instructed emission amount and the number of emission times, and information on the emission amount, Calculating means for calculating an upper limit light emission number for preventing the temperature from reaching a specified value, and when the upper limit light emission number is lower than the instructed light emission number, light is emitted at the upper limit light emission number. This is a strobe device.

  Similarly, in order to achieve the above object, the present invention is a strobe device having a temperature rise mitigation function, using emission information acquisition means for acquiring a specified emission amount and the number of times of emission, and information on the emission amount. Calculating means for calculating an upper limit light emission amount for preventing the temperature from reaching a specified value, and when the upper limit light emission amount is lower than the instructed light emission amount, light emission is performed at a value equal to or less than the upper limit light emission amount. This is a strobe device that performs the above.

  Similarly, in order to achieve the above object, the present invention is a strobe device having a temperature rise mitigation function, using emission information acquisition means for acquiring a specified emission amount and the number of times of emission, and information on the emission amount. A calculation means for calculating an upper limit light emission number or upper limit light emission amount for preventing the temperature from reaching a specified value, and selecting whether the upper limit light emission number or the upper limit light emission amount is calculated by the calculation means And the upper limit light emission number or the upper limit light emission amount selected by the calculation selection means is less than the instructed light emission number or upper limit light emission amount, the calculated upper limit light emission number. Alternatively, a strobe device that emits light with an upper limit light emission amount is provided.

  Similarly, in order to achieve the above object, the present invention is an imaging apparatus including the strobe device according to the present invention.

  According to the present invention, it is possible to provide a strobe device or an imaging device that can prevent the temperature of the strobe device from reaching a specified temperature during multi-emission.

  The best mode for carrying out the present invention is as shown in Examples 1 to 3 below.

  FIG. 1 is a diagram illustrating a circuit configuration of a strobe device, an image pickup device to which the strobe device can be attached and detached, and an image pickup lens to be attached to and detached from the image pickup device according to Embodiment 1 of the present invention.

  First, a circuit configuration in the imaging apparatus (hereinafter, camera body) 100 will be described.

  A focus detection circuit 102, a photometric sensor 103, a shutter control circuit 104, a motor control circuit 105, and a liquid crystal display circuit 106 are connected to the camera microcomputer 101. In addition, the camera microcomputer 101 performs signal transmission with the lens microcomputer 111 disposed in the imaging lens 110 via the lens mount contact group 109. In addition, a signal is transmitted to a strobe microcomputer 219 described later with reference to FIG. 2 provided in the strobe device 120 via a strobe contact group 200.

  The focus detection circuit 102 performs accumulation control and readout control of a focus detection line sensor (not shown) according to a signal from the camera microcomputer 101, and outputs each pixel information to the camera microcomputer 101. The camera microcomputer 101 A / D converts this information and detects the focus adjustment state by the phase difference detection method. The camera microcomputer 101 performs focus adjustment control of the imaging lens 110 by exchanging signals with the lens microcomputer 111. Needless to say, the detection of the focus adjustment state is not limited to the phase difference detection method, and a known method may be used.

  The photometric sensor 103 outputs a luminance signal to the camera microcomputer 101 in both a steady state in which strobe light is not preliminarily emitted toward the subject and a preliminarily emitted state. The camera microcomputer 101 performs A / D conversion on the input luminance signal, and calculates the aperture value and shutter speed for adjusting exposure for shooting, and calculates the flash emission amount during exposure. The shutter control circuit 104 controls the energization of the shutter front curtain driving magnet MG-1 and the shutter rear curtain driving magnet MG-2 in accordance with a signal from the camera microcomputer 101, causes the front curtain and rear curtain to travel, and exposure. Perform the action. The motor control circuit 105 controls the motor in accordance with a signal from the camera microcomputer 101 to perform up / down of a main mirror (not shown), shutter charging, and the like.

  SW1 is a switch that is turned on by a first stroke (half-press) operation of a release button (not shown) to start photometry and AF (automatic focus adjustment). SW2 is a switch that is turned on by a second stroke (full press) operation of the release button and starts shutter running, that is, an exposure operation. The camera microcomputer 101 reads the status signals of the switches SW1 and SW2.

  The liquid crystal display circuit 106 controls the in-finder display 107 and the external display 108 according to the signal from the camera microcomputer 101, and displays each setting state and the like.

  Next, a circuit configuration in the imaging lens 110 will be described.

  The camera body 100 and the imaging lens 110 are electrically connected to each other via the lens mount contact group 109 as described above. The lens mount contact group 109 includes a contact L0 that is a power contact for the focus drive motor 115 and the aperture drive motor 116 in the imaging lens 110, a power contact L1 for the lens microcomputer 111, and a clock contact L2 for serial data communication. Have Furthermore, a data transmission contact L3 from the camera body 100 to the imaging lens 110 and a data transmission contact L4 from the imaging lens 110 to the camera body 100 are provided. Furthermore, it has a motor ground contact L5 for the motor power supply and a ground contact L6 for the lens microcomputer 111 power supply.

  The lens microcomputer 111 is connected to the camera microcomputer 101 via the lens mount contact 109. Then, the lens microcomputer 111 operates the focus drive motor 115 and the aperture drive motor 116 in accordance with a signal from the camera microcomputer 101 to control the focus adjustment of the imaging lens 110 and the aperture diameter of the aperture device 117.

  Next, a circuit configuration in the strobe device 120 will be described with reference to FIG.

  In FIG. 2, 201 is a power supply battery. A DC / DC converter 202 boosts the battery voltage to several hundred volts. Reference numeral 203 denotes a main capacitor for accumulating light emission energy. Reference numerals 204 and 205 denote resistors, which divide the voltage of the main capacitor 203 into a predetermined ratio. Reference numeral 206 denotes a coil for limiting the light emission current, and reference numeral 207 denotes a diode for absorbing a counter electromotive voltage generated when light emission is stopped. Reference numeral 208 denotes a diode for flat light emission, 209 denotes a trigger generation circuit, and 210 denotes a light emission control circuit such as an IGBT.

  A data selector 211 selects one of the D0, D1, and D2 terminals according to a combination of two types of inputs from the Y0 and Y1 terminals, and outputs it from the Y terminal. Reference numeral 212 denotes a light emission level control comparator for flat light emission, and reference numeral 213 denotes a light emission amount control comparator for strobe light emission.

  A photometric circuit 214 amplifies a minute current flowing through the second light receiving element 217 and converts the photocurrent into a voltage. Reference numeral 215 denotes an integral photometry circuit for logarithmically compressing the photocurrent flowing through the first light receiving element 218 and compressing and integrating the light emission amount of the xenon tube 216.

  A strobe microcomputer 219 controls the operation of the strobe device 120 as a whole. Reference numeral 220 denotes an input device for inputting a light emission condition such as a light emission mode, a light emission amount, a light emission interval, and the number of times of light emission, and a light emission instruction. Reference numeral 222 denotes a thermometer, which is disposed at a place where temperature information regarding components of the strobe device 120 such as the vicinity of the xenon tube 216 is necessary.

  Next, each terminal of the flash microcomputer 219 will be described.

  CNT is a terminal for controlling the operation of the DC / DC converter 203, AD1 is an A / D conversion terminal for reading a charging voltage, and AD2 is an A / D conversion terminal for reading a battery level. AD3 is a terminal for A / D conversion for reading the temperature of the strobe device 120, AD4 is a terminal for A / D conversion for reading the output from the input device 220, and OUT is a strobe state and light emission conditions to the display device 221. Is a terminal for outputting.

  CLK is a synchronous clock input terminal for performing serial communication with the camera body 100 via the strobe contact group 200. DO is a terminal for serial output for transferring serial data from the strobe device 120 to the camera body 100 via the strobe contact group 200 in synchronization with the synchronization clock. DI is a serial data input terminal for the flash device 120 to receive serial data from the camera body 100 via the flash contact group 200 in synchronization with the synchronization clock. CHG is a terminal for transmitting whether or not the xenon tube can emit light from the strobe device 120 to the camera body 100 via the strobe contact group 200, and X is a strobe light emission command input from the camera body 100 via the strobe contact group 200. Terminal.

  INT is an integration control output terminal of the integral photometry circuit 215, AD0 is an A / D conversion input terminal for reading an integral voltage indicating the light emission amount from the integral photometry circuit 215, and DA0 is a comparator voltage of the comparators 212 and 213. Is a D / A output terminal for outputting. Y0 and Y1 are terminals for outputting the selection state of the data selector 211, and TRIG is a terminal for outputting a light emission trigger signal.

  Next, the light emission processing in the strobe device 120 will be described.

  The strobe microcomputer 219 sets a predetermined voltage (comparative voltage) at the terminal DA0 according to a predetermined light emission level instructed from the camera body 100 or the light emission amount input from the input device 220.

  Next, the flash microcomputer 219 causes the data selector 211 to select one of the terminals D0 to D2 via the terminals Y0 and Y1. Here, the control when the terminal D1 is selected will be described. At this time, since the xenon tube 216 has not yet emitted light, the photocurrent of the first light receiving element 218 hardly flows. Therefore, the output of the integral photometry circuit 215 input to the inverting input terminal of the comparator 213 is not generated. On the other hand, since the output of the comparator 213 is H (meaning high level), the light emission control circuit 210 becomes conductive.

  When a light emission start signal is input from the camera body 100 to the terminal X of the strobe device 120 via the strobe contact group 200 or a light emission start instruction is given from the input device 220, the strobe microcomputer 219 starts the light emission processing.

  First, the flash microcomputer 219 outputs a light emission trigger signal from the output terminal TRIG. Then, the trigger generation circuit 209 generates a high voltage to excite the xenon tube 216, and light emission is started from the xenon tube 216. At substantially the same time, the flash microcomputer 219 sets the output of the terminal INT to H, and instructs the integration photometry circuit 215 to start integration. As a result, the integral photometry circuit 215 starts integrating the logarithmically compressed photoelectric output of the first light receiving element 218.

  The light received by the first light receiving element 218 is integrated by the integrating photometry circuit 215, and when this integrated output becomes higher than the output output to the terminal DA0, the output terminal of the comparator 213 changes from H to L (meaning low level). Invert to. When the signal is input to the light emission control circuit 210 via the data selector 211, the light emission control circuit 210 stops the light emission of the xenon tube 216. After the light emission is completed, the flash microcomputer 219 reads the output of the integrated photometry circuit 215 integrating the light emission amount from the terminal AD0 and performs A / D conversion, and reads the integrated value, that is, the light emission amount at the time of light emission as a digital value.

  Next, the operation at the time of multiple light emission according to Example 1 of the present invention will be described using the flowchart of FIG.

  In step S100, the multi-flash operation is started. First, in step S101, the flash microcomputer 219 clears the light emission number counter N, that is, sets it to zero. In the next step S102, the light emission amount Fout, the light emission interval Δt, and the light emission number Nset, which are input from the input device 220 or transmitted from the camera body 100 via the strobe contact group 200, are acquired. In subsequent step S103, light emission restriction determination 1 (details will be described later with reference to FIG. 4) is performed to obtain an upper limit light emission number Nctrl.

  In the next step S104, the flash microcomputer 219 performs a light emission process with the acquired (instructed) light emission amount Fout. After the light emission process, the process proceeds to step S105, and the light emission number counter N is incremented. Then, in the next step S106, it is determined whether or not the incremented light emission number counter N is equal to the upper limit light emission number Nctrl. As a result, if the light emission number counter N is equal to the upper limit light emission number Nctrl, the process proceeds to step S108, and the multi-light emission ends.

  On the other hand, if the light emission number counter N and the upper limit light emission number Nctrl are not equal, the flash microcomputer 219 proceeds from step S106 to step S107. Then, the process waits until the obtained light emission interval Δt elapses, and thereafter returns to the light emission process of step S104. Hereinafter, the same applies until it is determined in step S106 that the light emission number counter N and the upper limit light emission number Nctrl are equal. Repeat the operation.

  In this way, the multiple light emission process is performed with the light emission amount Fout, the light emission interval Δt, and the upper limit light emission number Nctrl.

  Next, the operation of the light emission restriction determination 1 executed in step S103 of FIG. 3 will be described using the flowchart of FIG.

  The operation of light emission restriction determination 1 is started from step S200. First, in step S201, the flash microcomputer 219 receives the light emission amount Fout, the light emission interval Δt, and the number of times of light emission Nset that are input from the input device 220 or transmitted from the camera body 100 via the flash contact group 200. To get. At this time, the light emission amount Fout, the light emission interval Δt, and the number of times of light emission Nset may be displayed on the display device 221. In the next step S202, the instructed light emission number Nset is stored in the upper limit light emission number Nctrl.

  In the next step S203, the flash microcomputer 219 obtains the temperature Ts from the thermometer 222 from the terminal AD3. Note that the temperature Ts may be obtained by using a known temperature detection means from the past light emission amount and the elapsed time after light emission without using the thermometer 222. In the next step S204, a temperature increase coefficient ΔTa immediately after light emission and a temperature increase coefficient ΔTb after the light emission interval Δt has elapsed after light emission are obtained. The temperature increase coefficients ΔTa and ΔTb are obtained from the tables of FIGS. 6 and 7 using the light emission amount Fout and the light emission interval Δt (seconds), assuming that the change during light emission changes as shown in FIG. The light emission amount Fout is expressed as a ratio of the full light emission amount. Here, although there is only one table for obtaining the temperature increase coefficients ΔTa and ΔTb from the light emission amount Fout and the light emission interval Δt, a method of creating a plurality of tables in advance and selecting the table based on the temperature Ts may be used. . Further, the temperature increase coefficients ΔTa and ΔTb may be obtained by using known temperature estimation means from the initial temperature, the heat generated by light emission, the heat dissipation characteristics after light emission, etc. without using a table.

  In the next step S205, the stroboscopic microcomputer 219 obtains the maximum value Nmax of the natural number N that satisfies the following expression.

Ts + (ΔTa + ΔTb) · Nmax ≦ Tth
Here, the threshold temperature Tth is determined so as to have a value that does not affect even when the user touches the strobe device 120, for example.

  In the next step S206, the stroboscopic microcomputer 219 compares the maximum value Nmax with the upper limit light emission count Nctrl. When the maximum value Nmax is equal to or greater than the upper limit number of light emission times Nctrl, the process proceeds to step S208 described later. On the other hand, when the maximum value Nmax is smaller than the upper limit number of light emission times Nctrl, the process proceeds to step S207, and after setting “Nctrl = Nmax”, the process proceeds to step S208. The value of the upper limit light emission count Nctrl calculated at this time may be displayed on the output device 221.

  In the next step S208, the flash microcomputer 219 determines a light emission command. When a light emission start signal is input from the camera body 100 to the terminal X of the strobe device 120 via the strobe contact group 200 or a light emission start instruction is given from the input device 220, the light emission restriction determination is terminated, and FIG. The process proceeds to the light emission process (step S104). If the light emission start command is not issued, the process returns to step S201 to reacquire the light emission number Nset.

  By performing the processing as described above, the multiple light emission processing is performed with the light emission amount Fout, the light emission interval Δt, and the upper limit light emission number Nctrl. Therefore, the temperature after light emission does not exceed the threshold temperature Tth when multiple light emission is performed under the conditions of the temperature Ts, the light emission amount Fout, the light emission interval Δt, and the upper limit light emission number Nctrl. Further, since the upper limit light emission number Nctrl is sequentially updated until the start of light emission, in the situation where the upper limit light emission number Nctrl is lower than the light emission number Nset, time elapses, and the temperature Ts decreases and the upper limit light emission number Nctrl increases.

The strobe device according to the first embodiment includes a strobe microcomputer 219 that acquires the light emission amount and the number of times of light emission instructed by using the input device 220 or from the camera body 100. Furthermore, a strobe microcomputer 219 (the part that performs the operation of FIG. 4) that calculates the upper limit number of times of light emission (Nctrl) for preventing the temperature from reaching a specified value using the instructed light emission amount information. Have. When the upper limit number of times of light emission is less than the instructed number of times of light emission, the flash device performs multi-flash with the calculated upper limit number of times of light emission. The strobe device 120 does not necessarily have the thermometer 222. For example, after turning on the power of the strobe device 120, the temperature Ts is set to an initial value stored in advance, and in step S203, a value obtained by adding all ΔTa and ΔTb obtained thereafter to the initial value is set as a new temperature Ts. It is good. In step S205, the maximum value Nmax satisfying the following expression may be obtained without using the light emission interval Δt and the temperature increase coefficient ΔTb.
Ts + ΔTa · Nmax ≦ Tth
Further, the calculation of the upper limit light emission number is repeatedly performed until the upper limit light emission number exceeds the instructed light emission number.

  Therefore, the strobe device 120 that suppresses the temperature of the light emitting unit (xenon tube 216) and the charging circuit unit, which are components of the strobe device 120, from reaching the specified temperature by adjusting the number of times of light emission during multi-emission. It can be provided. Furthermore, an imaging apparatus equipped with the strobe device 120 can be provided. In other words, it is possible to provide a strobe device provided with a temperature rise mitigation function suitable for multi-emission and an imaging device including the strobe device 120.

  In the first embodiment, the imaging lens 110 and the flash device 120 are configured to be replaceable, but they may be fixed (integrated) to the camera body 100. In this case, the camera microcomputer 101 functions as the lens microcomputer 111 and the flash microcomputer 219.

  Next, a second embodiment of the present invention will be described. Since the circuit configuration of the imaging device, imaging lens, and strobe device is the same as that of the first embodiment, description thereof is omitted.

  In the multiple light emission operation according to the second embodiment of the present invention, the light emission restriction determination 1 in step S103 of FIG. 3 is only the light emission restriction determination 2, and the other parts are the same. Therefore, here, the operation of the light emission restriction determination 2 corresponding to the light emission restriction determination 1 in step S103 of FIG. 3 will be described using the flowchart of FIG.

  The operation of the light emission restriction determination 2 is started from step S300. First, in step S301, the flash microcomputer 219 acquires the light emission amount Fout, the light emission interval Δt, and the light emission number Nset input from the input device 220 or the camera body 100. . At this time, the light emission amount Fout, the light emission interval Δt, and the number of times of light emission Nset may be displayed on the display device 221. In the next step S302, the light emission amount Fout is stored in the upper limit light emission amount Fctrl. In the subsequent step S303, the temperature Ts is obtained from the thermometer 222 from the terminal AD3. The temperature Ts may be acquired by using a known temperature detection means from the past light emission amount and the elapsed time after light emission without using the thermometer 222.

  In the next step S304, the stroboscopic microcomputer 219 obtains the temperature increase coefficient ΔTa immediately after light emission and the temperature increase coefficient ΔTb after the light emission interval Δt has elapsed since light emission. The temperature increase coefficients ΔTa and ΔTb are obtained from the tables of FIGS. 6 and 7 using the light emission amount Fout and the light emission interval Δt, assuming that the change during light emission changes as shown in FIG. Here, although there is only one table for obtaining the temperature increase coefficients ΔTa and ΔTb from the light emission amount Fout and the light emission interval Δt, a method of creating a plurality of tables in advance and selecting the table based on the temperature Ts may be used. . Further, the temperature increase coefficients ΔTa and ΔTb may be obtained by using known temperature estimation means from the initial temperature, the heat generated by light emission, the heat dissipation characteristics after light emission, etc. without using a table.

  In the next step S305, the stroboscopic microcomputer 219 obtains the maximum value Nmax of the natural number N that satisfies the following expression.

Ts + (ΔTa + ΔTb) · Nmax ≦ Tth
Here, the threshold temperature Tth is determined so as to have a value that does not affect even when the user touches the strobe device 120, for example.

  In the next step S306, the stroboscopic microcomputer 219 compares the maximum value Nmax with the designated number of times of light emission Nset. When the maximum value Nmax is equal to or greater than the number of times of light emission Nset, the process proceeds to step S308 described later. On the other hand, if the maximum value Nmax is smaller than the number of times of light emission Nset, the process proceeds to step S307, the upper limit light emission amount Fctrl is set to a smaller value (in this example, “Fctrl = Fctrl / 2”), the process returns to step S304, and the maximum value is again reached. Nmax is calculated. The same operation is repeated until it is determined in step S306 that the maximum value Nmax is greater than or equal to the number of times of light emission Nset. The value of the upper limit light emission amount Fctrl calculated at this time may be displayed on the display device 221.

  In the next step S308, the flash microcomputer 219 performs a light emission command determination. When a light emission start signal is input from the camera body 100 to the terminal X of the 120 via the strobe contact group 200 or a light emission start instruction is given from the input device 220, the light emission restriction determination is terminated, and in step S104 of FIG. The process proceeds to the light emission process. If the light emission start command is not issued, the process returns to step S301 to reacquire the light emission amount Fout.

  As described above, multi-emission processing is performed with the upper limit light emission amount Fctrl, the light emission interval Δt, and the number of times of light emission Nset. Therefore, the temperature after light emission does not exceed the threshold temperature Tth when multiple light emission is performed under the conditions of the temperature Ts, the upper limit light emission amount Fctrl, the light emission interval Δt, and the number of light emission times Nset. Further, since the upper limit light emission amount Fctrl is sequentially updated until the light emission starts, in the situation where the upper limit light emission amount Fctrl is lower than the light emission amount Fout, time elapses, and the upper limit light emission amount Fctrl increases as the temperature Ts decreases.

  The strobe device according to the second embodiment includes a strobe microcomputer 219 that acquires the light emission amount and the light emission count instructed by using the input device 220 or from the camera body 100. Furthermore, it has a strobe microcomputer 219 (the part that performs the operation of FIG. 8) that calculates an upper limit light emission amount (Fctrl) for preventing the temperature from reaching a specified value by using the light emission amount information. When the upper limit light emission amount is lower than the instructed light emission amount, the flash device performs multi-flash with the calculated upper light emission amount or less.

  The calculation of the upper limit light emission amount is repeatedly performed until the upper limit light emission amount exceeds the designated light emission amount.

  Therefore, the strobe device 120 that suppresses the temperature of the light emitting unit (xenon tube 216), the charging circuit unit, and the like, which are components of the strobe device 120, from reaching the specified temperature by adjusting the amount of light emitted during multi-emission. It can be provided. Furthermore, an imaging apparatus equipped with the strobe device 120 can be provided. In other words, it is possible to provide a strobe device 120 having a temperature rise mitigation function suitable for multi-emission and an imaging device including the strobe device 120.

  Also in the second embodiment, the imaging lens 110 and the strobe device 120 are configured to be interchangeable, but they may be fixed (integrated) to the camera body 100. In this case, the camera microcomputer 101 functions as the lens microcomputer 111 and the flash microcomputer 219.

  Next, Embodiment 3 of the present invention will be described. Since the circuit configuration of the imaging device, imaging lens, and strobe device is the same as that of the first embodiment, description thereof is omitted.

  In the third embodiment, there are two types of light emission restriction processing methods, and an example in which one of the methods is selected and the multi-light emission operation is performed is shown. One of the light emission restriction processing methods is the light emission restriction determination 1 in the embodiment 1 shown in FIG. 4, and the other one is the light emission restriction determination 2 in the embodiment 2 shown in FIG. Hereinafter, a description will be given with reference to the flowchart of FIG.

  The light emission restriction selection process is started from step S400. First, in step S401, the flash microcomputer 219 is input by the input device 220 or transmitted from the camera body 100 via the flash contact group 200. Get the method. In the next step S401, it is determined whether or not the light emission restriction processing method is light emission restriction determination 1. If it is the light emission restriction determination 1, the process proceeds to step S403, the application of the control based on the light emission restriction determination 1 is stored in a storage unit (not shown), and the process ends in step S407. At this time, a light emission restriction processing method applied to the output device 221 may be output.

  If it is not the light emission restriction determination 1 in step S402, the process proceeds to step S404, where it is determined whether or not it is light emission restriction determination 2. If it is the light emission restriction determination 2, the process proceeds to step S405, the application of the control based on the light emission restriction determination 2 is stored in a storage unit (not shown), and the process ends in step S407.

  If it is determined in step S404 that it is not the light emission restriction determination 2, the process proceeds to step S406 to store application of other control in a storage unit (not shown), and the process ends in step S407. The other control means known temperature rise mitigation control. For example, there is a charging time control in which the charging control is not performed until it is determined that the temperature does not reach a specified temperature even when the light is emitted under the light emission condition input by the input device 220.

  In the third embodiment, after the operation of FIG. 9 is performed, the multi-light emission operation of FIG. 3 using the light emission restriction determination of FIG. 4 or FIG. 8 is performed.

  With the above-described configuration, it is possible to provide a strobe device that can obtain the same effects as those of the first and second embodiments and an imaging device including the strobe device. In addition, it is possible to select whether to limit the number of times of light emission or the amount of light emission.

  In the third embodiment as well, the imaging lens 110 and the strobe device 120 are configured to be replaceable, but they may be fixed (integrated) to the camera body 100. In this case, the camera microcomputer 101 functions as the lens microcomputer 111 and the flash microcomputer 219.

(Correspondence between the present invention and the embodiment)
The strobe microcomputer 219 corresponds to the light emission information acquisition means for acquiring the instructed light emission amount and the number of times of light emission of the present invention. 4 or 8 of the stroboscopic microcomputer 219 calculates the upper limit light emission number or the upper limit light emission amount for preventing the temperature from reaching the specified value by using the light emission amount information of the present invention. It corresponds to the calculating means. Further, the portion of the strobe microcomputer 219 that performs the operation of FIG. 9 corresponds to calculation selection means for selecting whether to calculate the upper limit light emission count or the upper limit light emission amount by the calculation means of the present invention.

It is a block diagram which shows the circuit structure of the imaging device, strobe device, and imaging lens concerning Example 1 of this invention. It is a block diagram which shows the circuit structure in the flash device shown in FIG. It is a flowchart which shows the multi light emission operation | movement which concerns on Example 1 of this invention. It is a flowchart which shows operation | movement of the light emission restriction | limiting determination 1 which concerns on Example 1 of this invention. It is a figure which shows the temperature change at the time of the multi light emission which concerns on Example 1 of this invention. It is a figure which shows the table for acquiring temperature rise coefficient (DELTA) Ta which concerns on Example 1 of this invention. It is a figure which shows the table for acquiring temperature rise coefficient (DELTA) Tb which concerns on Example 1 of this invention. It is a flowchart which shows the operation | movement of the light emission restriction | limiting determination 2 which concerns on Example 2 of this invention. It is a flowchart which shows the selection process of the light emission restriction | limiting processing system which concerns on Example 3 of this invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 100 Camera body 101 Camera microcomputer 110 Shooting lens 111 Lens microcomputer 120 Strobe device 210 Light emission control circuit 216 Xenon tube 219 Strobe microcomputer 220 Input device 221 Display device 222 Thermometer

Claims (10)

A strobe device having a temperature rise mitigating function,
Light emission information acquisition means for acquiring the instructed light emission amount and the number of light emission times;
Using the information on the amount of luminescence, and calculating means for calculating the upper limit number of times to prevent the temperature from reaching a specified value;
A strobe device that performs light emission at the upper limit light emission number when the upper limit light emission number is less than the instructed light emission number.   2. The strobe device according to claim 1, wherein the calculation of the upper limit number of times of light emission is repeatedly performed until the upper limit number of times of light emission exceeds the specified number of times of light emission.   3. The strobe device according to claim 1, wherein the calculation unit calculates the upper limit number of times of light emission using information on an instructed light emission interval and the light emission amount. Having temperature detecting means for detecting the temperature of the components of the strobe device;
3. The strobe device according to claim 1, wherein the calculation unit calculates the upper limit number of times of light emission using information on a temperature of a component of the strobe device and the light emission amount. A strobe device having a temperature rise mitigating function,
Light emission information acquisition means for acquiring the instructed light emission amount and the number of light emission times;
Using the information of the light emission amount, and calculating means for calculating an upper limit light emission amount for preventing the temperature from reaching a specified value,
A strobe device that emits light when the upper limit light emission amount is lower than the instructed light emission amount.   The strobe device according to claim 5, wherein the calculation of the upper limit light emission amount is repeatedly performed until the upper limit light emission amount exceeds the designated light emission amount.   7. The strobe device according to claim 5, wherein the calculation unit calculates the upper limit light emission amount using information on the instructed light emission interval and the light emission amount. Having temperature detecting means for detecting the temperature of the components of the strobe device;
7. The strobe device according to claim 5, wherein the calculation unit calculates the upper limit light emission amount by using information on a temperature of a component of the strobe device and the light emission amount. A strobe device having a temperature rise mitigating function,
Light emission information acquisition means for acquiring the instructed light emission amount and the number of light emission times;
Using the information on the light emission amount, a calculation means for calculating the upper limit light emission number or the upper limit light emission amount for preventing the temperature from reaching a specified value;
Calculation selection means for selecting whether the calculation means calculates the upper limit light emission count or the upper limit light emission amount;
When the upper limit light emission number or the upper limit light emission amount selected by the calculation selection means is less than the instructed light emission number or upper limit light emission amount, light emission is performed at the calculated upper limit light emission number or upper limit light emission amount. Strobe device characterized by.   An image pickup apparatus comprising the strobe device according to claim 1.

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