JP2009075071A5 - - Google Patents

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Publication number
JP2009075071A5
JP2009075071A5 JP2008165175A JP2008165175A JP2009075071A5 JP 2009075071 A5 JP2009075071 A5 JP 2009075071A5 JP 2008165175 A JP2008165175 A JP 2008165175A JP 2008165175 A JP2008165175 A JP 2008165175A JP 2009075071 A5 JP2009075071 A5 JP 2009075071A5
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JP
Japan
Prior art keywords
transmission line
distance
terahertz wave
inspection object
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2008165175A
Other languages
English (en)
Japanese (ja)
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JP2009075071A (ja
JP4859250B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2008165175A priority Critical patent/JP4859250B2/ja
Priority claimed from JP2008165175A external-priority patent/JP4859250B2/ja
Priority to US12/201,745 priority patent/US7737402B2/en
Publication of JP2009075071A publication Critical patent/JP2009075071A/ja
Publication of JP2009075071A5 publication Critical patent/JP2009075071A5/ja
Application granted granted Critical
Publication of JP4859250B2 publication Critical patent/JP4859250B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2008165175A 2007-08-31 2008-06-25 検査物に関する距離調整装置及び方法、検査装置及び方法 Expired - Fee Related JP4859250B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2008165175A JP4859250B2 (ja) 2007-08-31 2008-06-25 検査物に関する距離調整装置及び方法、検査装置及び方法
US12/201,745 US7737402B2 (en) 2007-08-31 2008-08-29 Distance adjusting apparatus and method, and object examining apparatus and method

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2007224942 2007-08-31
JP2007224942 2007-08-31
JP2008165175A JP4859250B2 (ja) 2007-08-31 2008-06-25 検査物に関する距離調整装置及び方法、検査装置及び方法

Publications (3)

Publication Number Publication Date
JP2009075071A JP2009075071A (ja) 2009-04-09
JP2009075071A5 true JP2009075071A5 (enrdf_load_stackoverflow) 2010-03-11
JP4859250B2 JP4859250B2 (ja) 2012-01-25

Family

ID=40610163

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008165175A Expired - Fee Related JP4859250B2 (ja) 2007-08-31 2008-06-25 検査物に関する距離調整装置及び方法、検査装置及び方法

Country Status (1)

Country Link
JP (1) JP4859250B2 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9194829B2 (en) 2012-12-28 2015-11-24 Fei Company Process for performing automated mineralogy
DE102018109250A1 (de) * 2018-04-18 2019-10-24 INOEX GmbH Innovationen und Ausrüstungen für die Extrusionstechnik Verfahren und THz-Messgerät zur Vermessung eines Messobjektes mit elektromagnetischer Strahlung
CN115951221B (zh) * 2022-01-04 2023-07-25 国仪量子(合肥)技术有限公司 电池包漏放电性能的检测方法和检测设备

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3950820B2 (ja) * 2003-06-25 2007-08-01 キヤノン株式会社 高周波電気信号制御装置及びセンシングシステム
JP2006218193A (ja) * 2005-02-14 2006-08-24 Pentax Corp 光学素子
JP4636917B2 (ja) * 2005-03-28 2011-02-23 キヤノン株式会社 検体保持用のデバイス、それを用いた検体検出装置及び検体検出方法
JP2006275910A (ja) * 2005-03-30 2006-10-12 Canon Inc 位置センシング装置及び位置センシング方法

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